* Your assessment is very important for improving the workof artificial intelligence, which forms the content of this project
Download Design of Ultra Low Power Tri-CAM with45nm
Electrical substation wikipedia , lookup
Opto-isolator wikipedia , lookup
History of electric power transmission wikipedia , lookup
Power over Ethernet wikipedia , lookup
Power engineering wikipedia , lookup
Stray voltage wikipedia , lookup
Immunity-aware programming wikipedia , lookup
Surge protector wikipedia , lookup
Distribution management system wikipedia , lookup
Power electronics wikipedia , lookup
Buck converter wikipedia , lookup
Rectiverter wikipedia , lookup
Power MOSFET wikipedia , lookup
Shockley–Queisser limit wikipedia , lookup
Switched-mode power supply wikipedia , lookup
Voltage optimisation wikipedia , lookup
International Journal of Applied Engineering Research ISSN 0973-4562 Volume 11, Number 12 (2016) pp 7603-7608 © Research India Publications. http://www.ripublication.com Design of Ultra Low Power Tri-CAM with45nm Dr. Sreenivasa Rao Ijjada1 and Raviteja Patnala2 1,2 Department of ECE, GITAM University, Visakhapatnam, AP, India. Abstract Technology advancement leads to the fast growth rate in the emerging fields of communication, space and information technologies. The SOCs used in these fields are mostly battery operated portable devices. Improving battery life, performance and the density of the chip become the major challenges for the VLSI design engineers. Major portion of the SOC is occupied by the semiconductor memories. The design of low voltage operated bit cell architectures may improve the battery life of the devices. In this paper, ultra low voltage concept based new 10T SRAM cell with body biasing technique is proposed to design a new content addressable memory (CAM) bit cell architecture for the high speed searching applications. To enhance the speed further, tri-CAM cell is preferred than bi-CAM cell and owing to the new structure with the 24-transistor tag cell for accommodating the one-step hit/miss, a small hit access time. To achieve low power and good expansion capability without sacrificing speeds, 45nm CMOS technology used in this design. Cadence Virtuoso® tools are used for simulations. Figure 1: content-addressable memory with w words Match-lines are fed to an encoder, generates a binary match location corresponding to the match-line is the match state. An encoder is used to expect only a single match. In addition, there is often a hit signal that flags the case in which there is no matching [4]. A search operation begins with loading the search-data word into the search-data register followed by pre-charging. The search-line drivers broadcast the search word onto the differential search-lines, and each CAM cell compares its stored bit against the bit on its corresponding search-lines [5]. Match-lines with all bits matches remain in the high state. Match-lines that have at least one bit that misses discharged to ground. Bit cell serves two functions, bit storage and bit comparison. The speed of cell comes at the cost of increased area and power, two design parameters that designers strive to reduce. As its applications grow, demanding larger CAM sizes, the power problem is further exacerbated. Reducing power, without sacrificing speed, is the main thread of recent research in large-capacity CAMs. In order to achieve powerful data searching, comparison circuit architecture is implemented in parallel. All valid data stored in the CAM compared with the input data simultaneously and the address from those matches of comparison is the output. It requires greater amount of the power and much hardware [6-7]. To reduce the search current NAND-type match-line circuit proposed rather than the NORtype [8]. Selective pre-charge technique was proposed to reduce the power in the large memories with the cost of delay [9]. Noise margin, charge sharing and other problems in the dynamic CMOS circuit design in the achievement of low power CAM cell architectures were explained [10]. To convince OC-48 ATM requirements, proposed a new design with a search access time of 26n sec, cycle time of 32n sec and dissipates an average power of 5.2W when performing the search operations at 25 MHz. At 65 nm technology, it consumes 4.021 mW power compared to the traditional CAM consumes-12.538 mW at 800 MHz [11]. To limit the voltage swing of match lines thereby reduce the Keywords: Ultra low voltage, SRAM,CAM, Tri-CAM INTRODUCTION CAM is a special type of memory used in very high speed searching applications. It is fully associative memory with a search time of only one clock cycle unlike the traditional SRAMs requires two or more clock cycles for a search operation and allows access of data instead of physical address as in the case of SRAM and DRAM. CAM consumes less energy for a search compared to RAM. The primary commercial application of CAM is the forward Internet protocol (IP) packets in network routers [1]. The two types CAMs are Bi- CAM and Tri-CAM. In networks like Internet, a message(e-mail or Web page) is transferred by first breaking up the message into small data packets of a few hundred bytes, and then, sending each data packet individually through the network. It is a good choice for implementing lookup table operation due to its fast search capabilities [2]. The CAM with w words is shown in the Figure1. Here the input is the search word and is broadcast onto the search-lines to the table of stored data. The number of bits in a CAM word is usually ranging from 36 to 144 bits. A typical CAM employs a table size ranging between a few hundred entries to 32K entries, corresponding to an address space ranging from 7 bits to 15 bits[3]. Each stored word has a match-line that indicates whether the search word and stored word are identical (the match case) or are different (a mismatch case, or miss). 7603 International Journal of Applied Engineering Research ISSN 0973-4562 Volume 11, Number 12 (2016) pp 7603-7608 © Research India Publications. http://www.ripublication.com power in match lines proposed a new technique [12]. Here, a PMOS match line driver used to enable the match line discharge level and sustain at the deeply back gate biased transistor’s threshold voltage above the ground level. The voltage swing of match line reduced further by reducing precharged level with deeply back gate biased NMOS isolation. A pre-computation based CAM is proposed to eliminate most of the comparison operations to reduce majority parts of the power in the parallel comparison process and achieves low power, low cost, and low voltage features [13]. It results that the data searching speed of the chip achieves 100 MHz with power consumption less than 33 mW at 3.3V. Moreover, the experimental results indicate that the minimum operating voltage of the chip is 1.5V. A low-power self-disable sensing technique for CAM has been proposed in the papers [14]-[16]. These methods reduce the unnecessary dc currents. Moreover, the comparison process has been accelerated by a positive loop to reduce the unwanted power dissipation. The word match line structure of low power Bi-CAM employs static pseudo CMOS logic. HSPICE simulations for 32x32 and 128x32 CAM were performed under 180 nm technologies for different cell structures results the power dissipation of 3.94 mW with the delay of 2.02n sec @ 1.8 V [18]. A 1V 128KB 4-way set-associative CMOS cache memory with word lineoriented tag-compare structure in a 180 nm CMOS technology for low supply voltage and low power VLSI applications implemented [17]. It results an access time of 3.5n sec, and power of 4.1 mW at 50 MHz. Demand of ultra-low-power circuits for the WSNs forces the importance of circuit designs in the sub-threshold regime [19]. In sub-threshold, the current density is very low and the ratio of the trans-conductance to bias current is maximum. Exponential relation between drain current and gate voltage makes it more suitable for wide range of applications. Conventional CMOS circuits utilize sub-threshold operation with a very low power, which is mainly due to the dynamic power and is quadratically dependent to the supply voltage [20]. Reduced supply voltage will result in reduction of power and output logic swing but increases the delay in each gate. 6TSRAM cell. The CAM cell uses SRAM cell to store the data and for comparison purpose, three more transistors (TN1, TN2 and TN3) are employed. The comparison circuitry varies depending on the design and the implementation. The sense amplifiers and latches provide an interface to give the result of the search. A CAM cell has four different states of operation [21]. i) Standby: where the circuit is inactive ii) Reading: when the data has been requested iii) Writing: when revising the contents iv) Comparing: comparing the data that is stored. The standby, reading and writing operations of CAM is similar to SRAM. Bit comparison logic is an equivalent to XOR of stored and search bits. The comparison mode begins with pre-charging the ML to ‘VDD’, then the complementary search data is loaded into the bit lines and this is compared with the storage cell contents. Figure 3: Conventional Bi-CAM cell The cell compares its stored bit with the bit on its corresponding search line. If it mismatches, the word match line will be pulled down only when bit match, otherwise state will be kept as pre-charged. Analysis: When Vin = 0, transistor TP2 is ‘ON’ and is in the saturation then the voltage at the source node of TP2 is 1.8V, since, VDD=1.8V and out = ‘VDD’. Since the transistor TN7 source terminal is grounded i.e., Vg = 0, its drain to source voltage CAM DESIGN METHODOLOGY The two basic forms of CAMs are binary and ternary. BiCAM stores and searches binary bits, zero or one (0,1), while Tri-CAM supports additionally don't care bit (0,1,X) also as shown in the fig 2. Tri-CAMs presently the dominants since longest-prefix routing are the Internet standard. VDS > VGS − VTH 7 VD − VS > VG − VS − VTH 7 VD = Vout > 0 − VTH 7 ∴Vout = 1.3V (becauseVTH 7 = 0.3V ) As BLbar is high and VS = Vin = 0 , the transistor TN3 is in cutoff and is ‘OFF’ since the gate voltage of the transistor TN1 is the drain voltage of the transistor TN3, the output for matchline (ML) = 0. Therefore, it is observed that when the stored bit is logic‘0’ and is compared with the March line driver (MDL) =1, it satisfies the mismatch condition. Figure 2: Bi-CAM and Tri-CAM search tables Basic CAM cell architecture is shown in the fig 3. Its structure (TP1, TN6-TP2, TN7-TN4, and TN5) is similar to the 7604 International Journal of Applied Engineering Research ISSN 0973-4562 Volume 11, Number 12 (2016) pp 7603-7608 © Research India Publications. http://www.ripublication.com Hence the power consumption is less. DTMOS cell offers more supply voltage scaling to decrease the power in ultra low power applications. In addition, it improves the SNM in hold/read compared to 6T-SRAM cell. This circuit enables the SRAM to work properly with a supply voltage below 135mV for wireless applications. A new 10T SRAM cell has been proposed as shown in Figure 5 to improve the SNM in hold/read modes compared to other SRAM cells. TRI-CAM DESIGN METHODOLOGY The binary CAM cells stores either logic “0” or logic “1”, in addition to that ternary cells stores an “X” (don’t c are) value[22]. A ternary symbol can be encoded into two bits, ternary storage requires only three states, the state where BL1c and BL2c are both zeros case is not allowed. To store a ternary value in a cell, second SRAM cell added as shown in Figure 4. An “X” can be store by setting both BL1c and BL2c equal to logic “1”, which disables both pull-down paths and forces the cell to match regardless in the inputs. Logic “1” ഥ =0 and store a logic can be stored by setting BL1c =1 and ܦ “0” by setting D=0 and BL2c=1. In addition to storing an “X”, the cell allows searching for an “X” by setting both SL and to logic “0”. This is an external don’t care that forces a match of a bit regardless of the stored bit. Although storing an “X” is possible only in ternary CAMs, an external “X” symbol possible in both binary and ternary CAMs. The conventional Tri-CAM structure has an advantage that it has less number of transistors (means less area) compared to proposed structures. It can operate upto 0.25 v supply voltage. The Conventional Tri-CAM has less stability as it is very affected by the process variations. The threshold voltage has its highest importance in the subthreshold operation. Figure 5: Proposed body biased SRAM for Tri CAM design The proposed design takes more area compared to 6T-SRAM cell but its operation down to supply voltages of 250mV. Hence it decreases the dynamic power more and facilitates more supply voltage scaling for ultra low power needs. For all designs, upsizing is used to work in sub-Vth region, properly. Anyway, upsizing method in sub-Vth has not significant effect on static noise margin (SNM) improvement as much as super-threshold design. Figure 4: Conventional Tri-CAM cell Due to lower frequency rate, the supply voltage may be reduced below the threshold voltage. This operation is referred as sub-threshold design that uses the sub-threshold current as drive current to evaluate the inputs. Lowering the supply voltage reduces the subthreshold current, exponentially. Due to the effect of Vth variation on subthreshold current, working in this region causes more sensitivity to process variations. The effect of process variation is more important in circuits such as memories, that causing data loss on storage nodes in memories. Due to minimum size transistors in SRAM memories, the sensitivity to inter-die as well as intra-die process variations is significant. Failure in SRAM such as Read and Write are caused by process variations in ultra low supply voltage applications. Figure 6: Proposed Tri- CAM cell The new Tri-CAM cell can be formed by the combination of two proposed SRAM cells, search transistors and match line transistor. The proposed Tri-CAM cell is shown in the fig 6. The proposed Tri-CAM cell has an advantage of that it has read margin compared to conventional Tri-CAMs. The area of the cell is increased due to the extra transistors are used to body bias the structure. So overall power consumption and delay also increased with respect to conventional one, but not to a significant value. It can operate up to 0.22 v. The Proposed TCAM The 5T, 8T, and 10T SRAM cells employs single ended reading, 6T and 7T SRAM cells utilizes differential read operation. 8T and 10T SRAM cells uses separate read line to read data, so these designs improve Read SNM compared to 6T-SRAM cell. This design uses more area but works at lower supply voltages. 7605 International Journal of Applied Engineering Research ISSN 0973-4562 Volume 11, Number 12 (2016) pp 7603-7608 © Research India Publications. http://www.ripublication.com following table gives the information about power, delay and SNM of the conventional TRICAM cell. The Write SNM of the Tri-CAM is degraded when compared to the Conventional one but the Read SNM is improved up to 17% – 20% RESULTS The conventional Tri-CAM structure has an advantage that it has less number of transistors (16)compared to the Proposed Tri CAM Transistor count 24. But the Conventional Tri-CAM can be efficently works upto 0.25 v supply. The following table-1 gives the information about power, delay and SNM of the conventional Tri-CAM cell. The Conventional Tri-CAM has less stability as it is very affected by the process variations. The threshold voltage has its highest importance in the subthreshold operation. The values of Read and Write SNM reflects the stability of a cell. The hold SNM of a cell does not vary with the process, voltage or temperature variations. Therefore the hold margin does not have particular importance. 0.8 0.6 0.5 0.3 0.29 0.28 0.27 0.26 Power (nW) 25.66 15.01 4.275 1.533 1.470 1.394 1.289 1.216 Delay (ps) 4.10 11.3 32.7 64.5 80.3 108.2 117.6 127.3 Write SNM (mV) 272.8 198.35 181.75 170.45 140.26 121.42 115.73 109.39 1.227 192.6 154.27 73.276 0.23 1.121 206.1 147.15 68.045 0.22 0.972 223.4 139.41 62.176 Figure 7: Power comparisons of both tri-CAMs Table. 1: Conventional Tri-CAM performance parameters Vdd (V) 0.24 From the Figure7, it is obseved that the power of newcell had been increased by 3-5% with respect to conventional for the operating voltage more than 0.26V. But at voltages lower than 0.26 its power is drastically decrease. From the Figure8, it is clear that the delay of the proposed cell slightly increased due to the extra circuitry that causes extra parasitic capacitances. Read SNM (mV) 130.67 121.21 102.730 86.731 72.934 67.876 63.921 61.281 Where as the proposed Tri-CAM cell with the new SRAM cell Architecture designed is shown in the Figure5. This new Tri-CAM effectively designed for ultra low votage operation i.e upto 0.22V which is fao below the threshold voltage of transistor at 45nm. The following table 2 shows the power,delay, read and write static noise margines.The convenional Tri-CAM works with less power when compared to new structure,but its operation seases below0.26V. Table. 2: Proposed Tri-CAM performance parameters Vdd (V) 0.8 Power (nW) 27.92 Delay (ps) 4.32 Write SNM (mV) 282.69 Read SNM (mV) 167.588 0.6 18.37 12.13 260.76 140.642 0.5 6.92 34.5 242.53 134.977 0.3 3.02 69.7 231.34 121.617 0.29 2.16 81.76 224.47 114.268 0.28 1.95 116.2 219.63 102.930 0.27 1.76 121.3 203.46 97.526 0.26 1.529 132.5 189.66 89.833 0.25 1.316 138.7 167.59 79.937 Figure 8: Delay comparisons of both tri-CAMs The delay of the proposed circuit has been increased upto 7% with respect to conventional one hence the speed is little bit reduces. In the whole cell design the important parameter is SNM in both read and write modes. From the fig 9 & 10, it is clear that the write and read SNMs are more even at 0.22V also. 7606 International Journal of Applied Engineering Research ISSN 0973-4562 Volume 11, Number 12 (2016) pp 7603-7608 © Research India Publications. http://www.ripublication.com search-line driver”, IEEE J. Solid-State Circuits, vol. 40, no. 8, pp. 736–1744, 2005. [2] H. Miyatake, M. Tanaka, and Y. Mori, “A design for high-speed l ow po wer CMOS f ully parallel c ontentaddressable m emory m acros”, IEEE Journal of Solid-State Circuits, vol. 36, pp. 956–968, 2001. [3] P. F. Lin and J. B. Kuo, “A 1-V 128-kb four-way setassociative CMOS cache memory using wordlineoriented tag-compare (WOTC) structure with the content-addressable-memory (CAM) 10-transistor tag cell,” IEEE J. S olid-State Circuits, vol. 36, pp. 666–675, Apr. 2001. [4] Kun-Jin Lin and Cheng-Wen Wu, “ A L ow-Power CAM D esign for LZ Da ta Compression”, IEEE transactions on computers, vol. 49, no.10, 2000. [5] P. Manikandan Bjorn B. L. Einar J. Aas, “Design of Novel C AM C ore C ell S tructures fo r a n E fficient Implementation of L ow P ower B CAM System”,GLSVLSI,2009. [6] G. Thirugnanam, N.Vijaykrishnan, M. J. Irwin, “A novel l ow-power CA M de sign”, IEEE ASIC/SOC Conf., pp. 198–202, 2001. [7] H. Miyatake, M. Tanaka, and Y. Mori, “A design for high-speed l ow po wer CMOS f ully parallel c ontentaddressable m emory m acros”, IEEE Journal of Solid-State Circuits, vol. 36, pp. 956–968, 2001. [8] T. Matsuda and K. Matsuda, “A n ew pr otocol processing architecture for high-speed networks”, in Proc. IEEE, Global Tele com Conf, pp. 798-803, 1996. [9] C. A. Zukowski and S. Y. Wang, “Use o f se lective precharge f or l ow-power on t he m atch l ines of content-addressable m emories”, IEEE Int Symp on Circuits and Systems, pp. 1788–1791, 1997. [10] S. C. Liu, F. A. Wu, and J. B. Kuo, “A n ovel lo wvoltage c ontent-addressable- m emory ( CAM) c ell with a f ast t ag-compare capability us ing p artially depleted ( PD) SO I CMO S dy namic-threshold (DTMOS) techniques”, IEEE J. Solid-State Circuits, vol. 36, pp. 712–716, 2001 [11] N. Mohan et al., “Match line sense amplifiers with positive feedback for low power content addressable memories”, in Proc. IEEE Custom Integrated Circuits Conf., pp. 297–300, 2006. [12] H. Miyatake, M. Tanaka, and Y. Mori, “A design for high-speed l ow po wer CMOS f ully parallel c ontentaddressable m emory m acros”, IEEE Journal of Solid-State Circuits, vol. 36, pp. 956–968, 2001 [13] C. S. Lin, J. C. Chang, B. D. Liu, “A low-power precomputation-based fully parallel content addressable memory”, IEEE J. Solid-State Circuits, vol. 38, no. 4, pp. 654-662, 2003. [14] T. Oliver, L. Y. Yeow, and B. Schmidt, “High performance da tabase s earching w ith H MMer on FPGAs”, in Proceedings of IEEE International Parallel Distributing Process symposium, pp. 1–7, 2007. [15] M. El Baraji, V. Javerliac, and G. Prenat, “Towards an ul tra-low po wer, hi gh de nsity and no n-volatile ternary C AM”, 9th Annual Non-Volatile Memory Figure 9: Write SNM comparisons of both tri-CAMs 27% of Write SNM and 18% of read SNMs are improved when compared to conventional Tri-CAM for the Ultra low voltage range. Figure 10: Read SNM comparisons of both tri-CAMs CONCLUSIONS From the results, it is observed that both Bi-CAM and TriCAM cells can operate ultra low voltage 260mV. Tri-CAM cells offers very low power and they are high speed compared to Bi-CAM cells but the stability of Bi-CAM is high compare to Tri-CAM cells. New TRICAM topologies based on body biasing technique are proposed. SNM in read/write/hold have been improved compared to other conventional TRICAM cells. Using body-biasing technique in TRICAM cells increases the area but improves the effect of upsizing on SNM and improves the SNM in read/hold/write modes. The proposed circuit occupies larger areas due to using separate NWell but they are only choice for ultra low voltage operated wireless applications. All the simulations are done using CADENCE software in 45nm technology. Cadence Virtuoso® is trademark tool. REFERENCES [1] B. D. Yang and L. S. Kim, “A low-power CAM using pulsed NAND-NOR match-line and charge-recycling 7607 International Journal of Applied Engineering Research ISSN 0973-4562 Volume 11, Number 12 (2016) pp 7603-7608 © Research India Publications. http://www.ripublication.com [16] [17] [18] [19] [20] [21] [22] Technol. Symposium, pp. 1–7, 2008. Chua-Chin Wang, Chia-Hao Hsu, Chi-Chun Huang, and Jun-Han Wu, “A Se lf-Disabled S ensing Technique f or C ontent-Addressable M emories”, IEEE Transactions on circuits and systems-II, vol. 57, no. 1, 2010. Anis F, David T, Jean-Christophe L and Lorenzo C, “Ultra L ow L eakage 10T Subt hreshold SR AM Bitcell”, IEEE international solid state circuits, vol.32,2008 P. Manikandan Bjorn B. L. Einar J. Aas, “Design of Novel CAM Core Cell Structures for an Efficient Implementation of Low Power BCAM System”,GLSVLSI,2009. Sreenivasa Rao. Ijjada, Dr.V. Malleswara Rao, et al., “Design of H igh E fficient an d L ow P ower B asic Gates in Subthreshold region”, International Journal of Advances in Engineering and Technology, vol. 1, no. 2, pp. 215-220, 2011. B.H.Calboun and A.P.Chandrakasan “A 256kb 65nm subthreshold SRAM Design for ultra-Low-Voltage Operation” in solid state circuits, IEEE Journal of Volume 42.issue-3 March 2007 pp680-688. Sreenivasa Rao. Ijjada, Dr.V. Malleswara Rao, et al., “Design and Im plementation o f L ow P ower Cam Cell”, International Journal of Communication Engineering Applications-IJCEA, vol. 2, no. 2, 2011. Shun-Hsun Yang, “Design o f Lo w-Power TC AMs using D ouble P ai-Sigma Ma tch L ines”, IEEE International Symposium on Performance Analysis of Systems (ISPASS), vol. 3, 2007. 7608