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Quantum Conductance A Major Qualifying Project Report submitted to the Faculty of WORCESTER POLYTECHNIC INSTITUTE in partial fulfillment of the requirements for the Degree of Bachelor of Science By _______________________________ Christopher Bruner Date: April 24th, 2008 Project number: NAB MQP8 _______________________ Professor Nancy Burnham ________________________ Professor Rafael Garcia 1 Abstract Quantum conductance is the observed change, in discrete steps, of the electrical conductance in an electrical element. The purposes of the project are to build a circuit similar to Foley et al. to show quantum conductance, to build a display for the circuit to show future students quantum conductance, and to design a laboratory experiment for PH 2651 so that students can repeat the experiment for themselves. The histogram of the conductance steps showed that majority occurred in integral multiples of the quantum conductance, which is 2e 2 7.75 *105 siemens, h but half and quarter multiple steps were also seen. Due to time constraints, the designing of the PH 2651 laboratory experiment was not done. 2 Introduction Electrical conductance is a measure of how easily electricity flows along a certain path through an electrical element. It is the inverse of electrical resistance, which is a measure of the degree to which an object opposes an electrical current. Quantum conductance is an observed change, in discrete steps, of how well a material can pass electrons. The conduction steps are thought to be caused by one of two ways. The first idea is that the discrete nature of the contact of a few atoms in a nano-sized contact and the rearrangement of the atoms caused by that contact makes a change in the force in the contact, and thus the conductance steps are related to the force change. The second idea is that the contact acts as a waveguide for electrons to travel through and as the size of contact changes, the number of allowed modes jumps in integral steps. It has not been confirmed which idea is the correct one and there is much controversy among physicists on what the true cause is. But which ever is the correct idea, this phenomenon is fundamental in that it is a property of nanostructures that can be observed at room temperature. An ideal graph of quantum conductance is shown in figure 1. 3 Figure 1: This is the idealized pattern of the conductance steps There were three goals in my project. First was to build a circuit to show Quantum Conductance using a setup done by a group at the University of Massachusetts at Amherst (Foley 1999). Second was to put my circuit into a display in order for people to see quantum conductance in action. The third goal was to design a laboratory experiment for PH 2651 so that future students could build circuits to show quantum conductance. Classical conductance was formalized from the idea of an electric current made from a voltage potential, making the conductance equal to the current divided by the applied voltage. This formula has no bearing on the dimensions of the electrical element. However, when the size of the electrical element approaches nano-sized, the conductance becomes dependent upon the dimensions of the element and the classical formula is replaced by the Landauer Formula. The Landauer Formula is G G0 2 Nc t n , m 1 (1) mn (Tao, 2005) with G being the conductance, Nc the total number of channels, and tmn the transmission coefficient of channel m with respect to n, and G0 is 2e 2 7.75 *105 siemens. h 4 The value of G0 comes from the fact that the electron wave can only pass through the constriction if it interferes constructively, which for a given size of constriction only happens for a certain number of modes N. The current carried by such a quantum state is, I 2 * e * v Fn * g n E n * ( 1 2 ) (2) where e is the electric charge, vFn is the group velocity at the Fermi level n, gn(Ef) is the density of the state n, which equal 1 , and (μ1 – μ2) is the chemical potential energy across the h * v Fn contact (Ott, 1998). Then by dividing by the voltage across the circuit which equals (μ1 – μ2) / e, we get the value of G0 from above. 5 Literature Review: Quantum Conductance Quantum conductance was first observed in an experiment measuring the electron properties of a two dimensional electron gas (van Wees, 1988). After the initial discovery, research has continued on quantum conductance in various materials and using different methods and continues to be an important topic in the areas of quantum mechanics, nanochemistry, and electrochemistry. It could even lead to a method for finding contaminants in materials (Li, 2000), and for molecular electronics (Yoon, 2003). Quantum conductance has also been observed in carbon nanotubes. Many papers, both theoretical (Lu, 200) (Lu, 2005) (Sanvito, 2000) (Yoon, 2003) and experimental (Frank, 2007) (Urbina, 2003), have been submitted. The theoretical papers show that the conductance through a nanotube is dependant only on the boundary of the nanotube with the voltage source or the boundary with another nanotube with a different configuration. The experimental papers show the conductance steps at integer values of G0 or at half G0. In fact, there are still arguments on whether or not quantum conductance is an actual physical phenomenon or a consequence of the atomic arrangement and rearrangement of the contact where the conductance is being measured. This chapter examines literature on research in quantum conductance. There are various methods for measuring quantum conductance in many different materials, each with advantages, disadvantages, costs, and conclusions. This review will describe in detail each method, and the materials that can be used for each method. Two Dimensional Electron Gas 6 As mentioned above, the first system for showing quantum conductance is the two dimensional electron gas. Electron leads were put onto a material, namely GaAs-AlGaAs, at 0.6K, the voltage between the leads was varied, and the conductance was measured (van Wees, 1988). It was found that the conductance varied as nearly discrete jumps of G0 as the voltage changed. At the time, it was hypothesized that that discrete jumps were seen as a special case of the Landauer formula, see equation 1, with no mixing of electron transmission channels. Being the first system to show quantum conductance, it has no real advantages in either showing the cause of quantum conductance, or in the cost of setting up the experiment, because the experiment is done at 0.6K: all it shows is the conductance steps can be seen. Wire to Wire Contact The next method to measure quantum conductance is the wire contact method. It consists of setting a voltage potential between two wires and bringing them in and out of contact with each other (Foley, 1999) (Costa-Kramer, 1995) (Ott, 1998, 1) (Ott, 1998, 2). See Figure 1 below. Figure 2: Experimental setup of wire to wire contact system (Foley, 1999) As the macroscopic wires come into contact, a nanowire is formed between them, and as they move apart, the nanowire stretches as the atoms that make up the nanowire rearrange themselves until a single chain of electrons forms and then the nanowire breaks. While the rearrangement occurs, the conductance was shown to vary in steps of G0. As with the 2-D 7 electron gas system, there is little that can be drawn from this method in terms of cause of quantum conductance; the movement of the wires is not on the microscopic level which would be needed to see if the conductance jumps are due to atomic rearrangements or if it is a unique phenomenon entirely. However, this method is highly cost effective, especially if you use a manual method for bringing the wires in and out of contact and use batteries as the voltage source (Foley, 1999). The setup is also relatively easy to construct (Ott, 1998, 2). The most important and noteworthy feature of this method, however, is that it can be done at room temperature. This is one of the few quantum mechanical properties that can be observed at room temperature. Compression and Elongation The next method is the compression/elongation method. It consists of setting a voltage potential through a tip and pressing the tip into a substrate and then pulling it away (CostaKramer, 1997) (Cuevas, 1998) (Landman, 1996) (Krans, 1995) (Rubio, 1996) (Urbina, 2003). See Figure 2 below. 8 Figure 2: Experimental setup of compression and elongation system (Costa-Kramer, 1997) As the tip separates from the substrate, a nanowire is formed the same way as in the wire to wire contact method. This is usually done with a scanning tunneling microscope (STM) so that the motion of the tip can be controlled to within an error of a few hundred femtometers. The advantage of this method is that you can begin to tackle the question of whether or not atomic rearrangements are the cause of quantum conductance because the motion of the tip into the substrate can be controlled; the question of atomic rearrangements is especially questioned in (Costa-Kramer, 1997) as a Bi tip is displaced 80 nm, much larger than the average electron spacing, and the conductance remained constant at G0. However, this method uses some expensive equipment, such as the tunneling microscope, and these experiments are usually done at near 0 K temperatures. Mechanically Controlled Break Junction The next method is the mechanically controlled break junction. It consists of mechanically breaking a nanowire and measuring the conductance as it stretches (Waraich, 2006) (Krans, 1994) (Rodrigues, 2002) (Scheer, 1997) (Yanson, 1997) ((Zhou, 1995)). See Figure 3 below. Figure 3: Experimental setup mechanically controlled break junction system (Zhou, 1995) 9 A voltage potential is set across a wire that is placed onto a substrate and is then mechanically bent at the center. As the wire stretches, the conductance is measured. It has the advantage of being more accurate than any previously mentioned method because the stretch of the nanowire can be controlled better than the compression and elongation method. This improvement showed that there is mixing of conductance channels in the breaking, but the sum was at integer values of G0 (Scheer, 1997). It was also the method used in (Rodrigues, 2002) that showed for silver, the conductance was in agreement with theoretical predictions of the relationship of conductance to atomic structure. The materials needed are much less expensive than an STM, but more than the wire to wire method. Electrochemical The next method is the electrochemical method. This was the first method discovered by chemists, not physicists. There are several ways of setting up this system (Tao, 2005). The first way was to place an STM tip into a CuSO4 ion solution and vary the voltage potential to build the copper nanowire (Tao, 1998); see Figure 5 below. Figure 5: Experimental setup of electrochemical system number 1 (Tao, 1998) The immediate advantage of this method was that there was considerably less motion of the tip involved, making precise measurement taking easier. Also a specific nanowire formation 10 could be held for a long time. But soon after a second method was found that is even better. This approach consisted of placing a wire in an ion solution, only exposed at the center of the wire, and then electrochemically etching the wire (Bogozi, 1999) (Li, 2000) (Li, 2002) (Tao, 2005), as seen in Figure 6. Figure 6: The second electrochemical setup Tao, 2005) This approach eliminates the need for an STM tip and there is no motion of the contact. One discovery found by this approach was that the placement of different impurities onto the wire caused a shift in the conductance (Li, 2000). Soon after a third approach was discovered. This one had the advantage of a self-terminating mechanism (Boussaad, 2002) (Tao, 2005) as in Figure 7. Figure 7: The third electrochemical setup (Boussaad, 2002) 11 This approach puts an electrode connected to an external resistor into an electrolyte and placing a voltage potential across the electrode. This builds a specifically sized nanowire dependant on the external resistor. This makes the wire making much easier. Material Dependence Each method can use various materials for the wires. The 2-D electron gas method must use a material with one valence electron in order to make the electron gas. The wire to wire contact method has been shown to work for metals, metallic glass, and metallic oxides. This method can be made to work even on a frugal budget. The compression and elongation method works best with metals because they compress and elongate better than most other materials. The mechanically controlled break junction method also works best with metals for the same reason, unless you want to see the change in conductance due to the actual break of the material (Ott, 1998, 1). The electrochemical method must use metals because it requires an ion solution. Conclusion In summary, recent research in quantum conductance is that it is a quantum mechanical property that can be seen in various materials, at room temperature, and with macroscopic substances. The debate of whether it is a true phenomenon or a consequence of atomic configurations still goes on even today. 12 Experimental Chapter One of the two main parts of this project was to build a display of a circuit that shows quantum conductance. This display is similar to an experiment done by a group at the University of Massachusetts at Amherst (Foley 1999). Figure 2 shows a diagram of the setup and figures 3a through 3f are photos and diagrams of the display. The display that I made does not have the voltmeter or the computer because the display is not to take measurements from, but just to show the conductance jumps. The circuit was built from a standard breadboard (see figure 3a). Figure 3a: The display setup of the wire to wire contact system. The oscilloscope is not present in this picture. 13 A 9V battery was used with a 10kΩ variable resistor, a 3.9 kΩ resistor, and a 50Ω resistor to generate a voltage up to 100mV( see figures 3b and 3c) Figure 3b: The voltage source. The black square is the variable resistor, the brown, striped cylinder is the 3.9kΩ resistor, the blue cylinder is the 47Ω resistor, and the red and black wires are the positive and negative sides of the battery respectively. Figure 3c: The variable resistor consists of a metal track with a lead on each end and a third lead with a metal connector that can slide along the metal track. The track has a total resistance of a certain value and the metal connector varies how much of the track’s resistance is used. The current through the resistors and the gold wire setup (see figure 3d) was sent through the LM358N operational amplifier where the current was converted to a voltage signal (see figures 3e and 3f) that was then seen on the Tektronic TDS 210 digital oscilloscope. 14 Figure 3d: The gold wire is soldered to the copper wire split so there is no noise at the copper-gold interface. Figure3e: The current to voltage converter. The black square is the operational amplifier, the brown, striped cylinder on top of the op-amp is the 100kΩ resistor, the yellow wire in pin 7 connects to the oscilloscope probe, the blue wire on the left grounds the op-amp, and the red and black wires on the right are the positive and negative sides of the battery respectively. The yellow wire in pin 6 leads to the gold qire. The negaive lead of the battery must be grounded for the op-amp to work. The pin numbers are in figure 3f; the top of the opamp in figure 3f is the left side of the op-amp in this figure 15 Figure 3f: The LM358N operational amplifier receives current from the inverting input where a voltage potential is made on the non-inverting input and this voltage is then amplified and sent out the output. It is powered by a 9V battery connected at the Vcc+ and Vcc-. (http://www.datasheetcatalog.org/datasheet/stmicroelectronics/2163.pdf) There were several problems that were encountered in the making of this display that anyone wanting to reproduce this circuit would run into. The first problem is connecting the fine gold wire to the much thicker copper wire used in the circuit. The connection must be clean in order to minimize voltage noise at the gold-copper boundary. I split the copper wire in half long ways about 1cm, placed the gold wire in the slit, and soldered the split closed, as seen in Figure 4. This was successful in making a clean interface. The second problem was a faulty operational amplifier. The results can be seen in figure 5. 16 Figure 5: Results from faulty amplifier. There is a shift from positive current to negative current that should not be there because the current can vary only between 0 amps and a positive value, and there is also a linear increase back to the positive side that could not be accounted for. The third problem was shielding the circuit. By placing a cardboard box wrapped in aluminum foil around my circuit and a sheet of aluminum foil grounded to the oscilloscope under my circuit, the amount of external electrical noise in the circuit was greatly reduced. See figures 6a and 6b for the comparison of before and after the box was put into place. 17 Figure 6a: Circuit noise before shielding Figure 6b: Circuit noise after shielding The last problem was making the wires come in and out of contact. By placing the gold wires very close to each other, tapping the table the circuit was on made the wire go in and out of contact. This may need to be adjusted if the circuit is moved to a different surface. This display can show quantum conductance, one of the few quantum mechanical effects that can be seen at room temperature. If made like mine or the one in (Foley, 1999), it is an inexpensive and effective way for undergraduates to show and begin to understand quantum conductance. 18 Results Figures 7a and 7b show representative samples of the conductance for copper and gold respectively, all of the traces can be seen in the appendix. To get the conductance change relative to G0 from the voltage change seen on the oscilloscope, divide the voltage change by the resistance connected to the op-amp to get the current, and then divide that value by the driving voltage of the voltage source to get the actual conductance change, finally divide that value by G0 to get the relative conductance change. For example, for a measured voltage of 0.8V, a driving voltage for 0.1V and resistance of 100kΩ, you would get a relative conductance change of 1.04. Figure 8 shows a histogram of the conductance jumps. The histogram shows that the majority of the jumps occur near the quantum conductance, but there are also half and quarter integer jumps as well. Due to an error in Microsoft Excel, all of my histogram points are shifted up by 0.3 G0. Figure 7a: Representative sample of gold Figure 7a: Representative sample of copper 19 180 140 120 100 80 60 40 20 4 4. 2 3. 8 3. 6 3. 4 3 3. 2 2. 8 2. 6 2. 4 2 2. 2 1. 8 1. 6 1. 4 1 1. 2 0. 8 0. 6 0. 4 0 0 0. 2 Frequency of Value Seen 160 Conductance Value (G/G0) Figure 8: Conductance Histogram 20 Conclusion With the addition of a working op-amp, my circuit showed that most of the conductance occurred in steps of the quantum conductance. Also with the addition of a more permanent shielding box, the display will be complete. Due to time constraints, the designing of the PH 2651 laboratory experiment was not done. Acknowledgements I would like to thank Professor Mark Tuominen from the University of Massachusetts at Amherst for showing me his circuit design, Professors Nancy Burnham and Rafael Garcia for advising me during the project, and the DeGraf family for funding my project. 21 References Boussaad, S., Tao, N. J. (2002). Atom-size gaps and contacts between electrodes fabricated with a self-terminated electrochemical method, Applied Physics Letters, 80, 2398-2400. Costa-Kramer, J. L., Garcia, N., Garcia-Mochales, P., Serena, P. A. (1995). Nanowire formation in macroscopic metallic contacts: quantum mechanical conductance tapping a table top, Surface Science, 342, 1144-1149 Costa-Kramer, J. L., Garcia, N., Olin, H. (1997). Conductance quantization in bismuth nanowires at 4 K, Physical Review Letters, 78, 4990-4993. Cuevas, J. C., Yeyati, A. L., Martin-Rodero, A., Bollinger, G. R., Untiedt, C., Agrait, N. (1998). Evolution of conducting channels in metallic atomic contacts under elastic deformation, Physical Review Letters, 81, 2990-2993. Foley, E. L., Candela, D., Martini, K. M., Tuominen, M. T. (1999). An undergraduate laboratory experiment on quantized conductance in nanocontacts, American Journal of Physics, 67, 389-393. Frank, S., Poncharal, P., Wang, Z. L., de Heer, W. A. (1998). Carbon nanotube quantum resistors, Science, 280, 1774-1746. Garcia-Mochales, P., Serena, P. A. (1997). Disorder as origin of residual resistance in nanowires, Physical Review Letters, 79, 2316-2319. Krans, J. M., van Rutienbeek, J. M. (1994). Sub quantum conductance steps in atom-sized contacts of the semimetal Sb, Physical Review B, 50. 17659-17661. Krans, J. M., van Rutienbeek, J. M., Fisun, V.V., Yanson, I.K., de Jongh, L. J. (1995). The signature of conductance quantization in metallic point contacts, Nature, 375, 767-769. 22 Landman, U., Luedtke, W. D., Salisbury, B. E., Whetten, R. L. (1996). Reversible manipulations of room temperature mechanical and quantum transport properties in nanowire junctions, Physical Review Letters, 77, 1362-1365. Li, C. Z., Bogozi, A., Huang, W., Tao, N. J. (1999). Fabrication of stable metallic nanowires with quantized conductance, Nanotechnology, 10, 221-223. Li, C. Z., He, H. X., Bogozi, A., Bunch, J. S., Tao, N. J. (2000). Molecular detection based on conductance quantization of nanowires, Applied Physics Letters, 76, 1333-1335. Li, C. Z., Tao, N. J. (1998). Quantum transport in metallic nanowires fabricated by electrochemical deposition/dissolution, Applied Physics Letters, 81, 894-896. Li, J., Kanzaki, T., Murakoshi, K., Nakato, Y. (2002). Metal-dependent conductance quantization of nanocontacts in solution, Applied Physics Letters, 81, 123-125. 1. Ott, F., Barberan, S., Lunney, J. G., Coey, J. M. D., Berthet, P., de Leon-Gevara, A. M., Revcolevschi, A. (1998). Quantized conductance in a contact between metallic oxide crystals, Physical Review B, 58, 4656-4659. 2. Ott, F., Lunney, J. (1998). Quantum conductance: A step-by-step guide, Europhysics News, 13-16. Rodrigues, V., Bettini, J., Rocha, A. R., Rego, L. G. C., Ugarte, D. (2002). Quantum conductance in silver nanowires: Correlation between atomic structure and transport properties, Physical Review B, 65, 153402-1 through 153402-4. Rubio, G., Agraite, N., Vieira, S. (1996). Atomic-sized metallic contacts: Mechanical properties and electronic transport, Physical Review Letters, 76, 2302-2305. Scheer, E., Joye, P., Esteve, D., Urbina, C., Devoret, M. H. (1997). Conduction channel transmissions of atomic-size aluminum contacts, Physical Review Letters, 78, 3535-3538. 23 Sanvito, S., Kwon, Y-K., Tomanek, D., Lambert, C. J. (2000). Fractional quantum conductance in carbon nanotubes, Physical Review Letters, 28, 1974-1977. Tao, N. (2005). Electrochemical fabrication of metallic quantum wires, Journal of Chemical Education, 82, 720-726. Urbina, A., Echeverria, I., Perez-Garrido, A., Diaz-Sanchez, A., Abelian, J. (2003). Quantum conductance steps in solutions of multiwalled carbon nanotubes, Physical Review Letters, 90, 106603-1 through 1006603-4. Waraich, S. S., Gordeev, S. N. (2006). Realization of nanowires using break junctions at room temperature, Nanoscience and Nanotechnology. van Wees, B. J., van Houten, H., Beenakker, C. W. J., Williamson, J. G. (1988). Quantized conductance of point contacts in a two-dimensional electron gas, Physical Review Letters, 60, 848-850. Wengang, L. (2005). Quantum conductance of a helically coiled carbon nanotube, Science and Technology of Advanced Materials, 6, 809-813. Wengang, L., Wang, E. G., Guo, H. (2003). Quantum conductance of a carbon nanotube superlattice, Physical Review B, 68, 075407-1 through 075407-4. Yanson, A. I., van Ruitenbeek, J. M. (1997) Do Histograms constitute a proof for conductance quantization?, Physical Review Letters, 79, 2157. Yoon, Y-G., Mazzoni, M. S. C., Louie, S. G. (2003). Quantum conductance of carbon nanotube peapods, Applied Physics Letters, 83, 5217-5219. Zhou, C., Muller, C. J., Deshpande, M. R., Sleight, J. W., Reed M. A. (1995). Microfabrication of a mechanically controllable break junction in silicon, Applied Physical Letters, 67, 11601162. 24 Appendix Copper Traces Voltage change (V) 1.6 0.8 Current Change (μA) 16 8 Conductance Change (μS) 160 80 Relative Change 2.07 1.04 Voltage change (V) 0.8 1.6 Current Change (μA) 8 16 Conductance Change (μS) 80 160 Relative Change 1.04 2.07 25 Voltage change (V) 0.8 1.6 0.4 0.8 Current Change (μA) 8 8 4 8 Conductance Change (μS) 80 160 40 80 Relative Change 1.04 2.07 .52 1.04 Voltage change (V) 0.6 1.0 Current Change (μA) 6 10 Conductance Change (μS) 60 100 Relative Change 0.77 1.29 26 Voltage change (V) 1.4 0.8 1.0 Current Change (μA) 14 8 10 Conductance Change (μS) 140 80 100 Relative Change 1.81 1.04 1.29 Voltage change (V) 0.8 0.8 Current Change (μA) 8 8 Conductance Change (μS) 80 80 Relative Change 1.04 1.04 27 Voltage change (V) 0.8 0.6 0.8 0.8 Current Change (μA) 8 6 8 8 Conductance Change (μS) 80 60 80 80 Relative Change 1.04 .77 1.04 1.04 Voltage change (V) 0.8 1.2 0.8 Current Change (μA) 8 12 8 Conductance Change (μS) 80 120 80 Relative Change 1.04 1.55 1.04 28 Voltage change (V) 0.8 0.4 0.6 0.8 0.8 Current Change (μA) 8 4 6 8 8 Conductance Change (μS) 80 40 60 80 80 Relative Change 1.04 0.52 0.77 1.04 1.04 Voltage change (V) 1.0 1.2 0.8 0.8 0.8 Current Change (μA) 8 12 8 8 8 Conductance Change (μS) 80 120 80 80 80 Relative Change 1.29 1.55 1.04 1.04 1.04 29 Voltage change (V) 0.8 Current Change (μA) 8 Conductance Change (μS) 80 Relative Change 1.04 Voltage change (V) 1.2 1.2 0.4 1.0 0.8 Current Change (μA) 12 12 4 10 8 Conductance Change (μS) 120 120 40 100 80 Relative Change 1.55 1.55 0.52 1.29 1.04 30 Voltage change (V) 0.8 1.2 0.6 0.6 0.8 Current Change (μA) 8 12 6 6 8 Conductance Change (μS) 80 120 60 60 80 Relative Change 1.04 1.55 0.77 0.77 1.04 Voltage change (V) 2.0 0.8 Current Change (μA) 20 8 Conductance Change (μS) 200 80 Relative Change 2.58 1.04 31 Voltage change (V) 0.8 1.6 Current Change (μA) 8 8 Conductance Change (μS) 80 160 Relative Change 1.04 2.07 Voltage change (V) 0.8 0.8 0.8 Current Change (μA) 8 8 8 Conductance Change (μS) 80 80 80 Relative Change 1.04 1.04 1.04 32 Voltage change (V) 0.8 0.6 0.6 0.8 Current Change (μA) 8 6 6 8 Conductance Change (μS) 80 60 60 80 Relative Change 1.04 0.77 0.77 1.04 Voltage change (V) 0.4 1.2 0.4 Current Change (μA) 4 12 4 Conductance Change (μS) 40 120 40 Relative Change 0.52 1.55 0.52 33 Voltage change (V) 1.6 Current Change (μA) 16 Conductance Change (μS) 160 Relative Change 2.07 Voltage change (V) 2.0 2.0 0.6 0.6 0.8 Current Change (μA) 20 20 6 6 8 Conductance Change (μS) 200 200 60 60 80 Relative Change 2.58 2.58 0.77 0.77 1.04 34 Voltage change (V) 0.8 0.8 1.2 Current Change (μA) 8 8 12 Conductance Change (μS) 80 80 120 Relative Change 1.04 1.04 1.55 Voltage change (V) 0.4 0.4 0.8 0.8 1.2 0.8 Current Change (μA) 4 4 8 8 12 8 Conductance Change (μS) 40 40 80 80 120 80 Relative Change 0.52 0.52 1.04 1.04 1.55 1.04 35 Voltage change (V) 1.2 1.2 0.4 0.4 0.4 0.4 Current Change (μA) 12 12 4 4 4 4 Conductance Change (μS) 120 120 40 40 40 40 Relative Change 1.55 1.55 0.52 0.52 0.52 0.52 Voltage change (V) 1.2 0.8 Current Change (μA) 12 8 Conductance Change (μS) 120 80 Relative Change 1.55 1.04 36 Voltage change (V) 0.8 0.8 0.8 0.6 Current Change (μA) 8 8 8 6 Conductance Change (μS) 80 80 80 60 Relative Change 1.04 1.04 1.04 0.77 Voltage change (V) 2.0 0.4 0.4 0.4 0.4 0.4 Current Change (μA) 20 4 4 4 4 4 Conductance Change (μS) 200 40 40 40 40 40 Relative Change 2.58 0.52 0.52 0.52 0.52 0.52 37 Voltage change (V) 1.2 0.4 0.8 Current Change (μA) 12 4 8 Conductance Change (μS) 120 40 80 Relative Change 1.55 0.52 1.04 Voltage change (V) 0.8 0.4 0.4 0.4 Current Change (μA) 8 4 4 4 Conductance Change (μS) 80 40 40 40 Relative Change 1.04 0.52 0.52 0.52 38 Voltage change (V) 1.6 0.6 Current Change (μA) 16 6 Conductance Change (μS) 160 60 Relative Change 2.07 0.77 Voltage change (V) 0.8 1.2 0.8 Current Change (μA) 8 12 8 Conductance Change (μS) 80 120 80 Relative Change 1.04 1.55 1.04 39 Voltage change (V) 1.2 0.8 Current Change (μA) 12 8 Conductance Change (μS) 120 80 Relative Change 1.55 1.04 Voltage change (V) 1.6 0.8 0.8 Current Change (μA) 16 8 8 Conductance Change (μS) 160 80 80 Relative Change 2.07 1.04 1.04 40 Voltage change (V) 0.4 0.8 0.4 0.8 0.4 Current Change (μA) 4 8 4 8 4 Conductance Change (μS) 40 80 40 80 40 Relative Change 0.52 1.04 0.52 1.04 0.52 Voltage change (V) 0.8 0.8 1.2 Current Change (μA) 8 8 12 Conductance Change (μS) 80 80 120 Relative Change 1.04 1.04 1.55 41 Voltage change (V) 0.8 0.8 0.4 0.8 0.4 Current Change (μA) 8 8 4 8 4 Conductance Change (μS) 80 80 40 80 40 Relative Change 1.04 1.04 0.52 1.04 0.52 Voltage change (V) 0.4 0.8 0.8 Current Change (μA) 4 8 8 Conductance Change (μS) 40 80 80 Relative Change 0.52 1.04 1.04 42 Voltage change (V) 2.0 1.2 0.8 0.8 Current Change (μA) 20 12 8 8 Conductance Change (μS) 200 120 80 80 Relative Change 2.58 1.55 1.04 1.04 Voltage change (V) 1.2 1.2 0.8 Current Change (μA) 12 12 8 Conductance Change (μS) 120 120 80 Relative Change 1.55 1.55 1.04 43 Voltage change (V) 2.4 1.2 0.8 0.8 Current Change (μA) 24 12 8 8 Conductance Change (μS) 240 120 80 80 Relative Change 3.10 1.55 1.04 1.04 Voltage change (V) 0.8 0.8 Current Change (μA) 8 8 Conductance Change (μS) 80 80 Relative Change 1.04 1.04 44 Voltage change (V) 1.2 1.2 0.8 0.8 0.4 0.4 Current Change (μA) 12 12 8 8 4 4 Conductance Change (μS) 120 120 80 80 40 40 Relative Change 1.55 1.55 1.04 1.04 0.52 0.52 Voltage change (V) 1.2 1.2 0.8 0.8 0.8 0.8 Current Change (μA) 12 12 8 8 8 8 Conductance Change (μS) 120 120 80 80 80 80 Relative Change 1.55 1.55 1.04 1.04 1.04 1.04 45 Voltage change (V) 1.2 0.8 0.8 Current Change (μA) 12 8 8 Conductance Change (μS) 120 80 80 Relative Change 1.55 1.04 1.04 Voltage change (V) 1.2 0.8 0.8 0.8 Current Change (μA) 12 8 8 8 Conductance Change (μS) 120 80 80 80 Relative Change 1.55 1.04 1.04 1.04 46 Voltage change (V) 0.8 0.8 0.6 Current Change (μA) 8 8 6 Conductance Change (μS) 80 80 60 Relative Change 1.04 1.04 0.77 Voltage change (V) 0.8 1.2 0.8 0.2 0.2 0.4 Current Change (μA) 8 12 8 2 2 4 Conductance Change (μS) 80 120 80 20 20 40 Relative Change 1.04 1.55 1.04 .26 .26 .52 47 Voltage change (V) 1.6 0.8 0.4 0.8 Current Change (μA) 16 8 4 8 Conductance Change (μS) 160 80 40 80 Relative Change 2.07 1.04 .52 1.04 Voltage change (V) 1.6 0.8 0.6 0.8 Current Change (μA) 16 8 6 8 Conductance Change (μS) 160 80 60 80 Relative Change 2.07 1.04 0.77 1.04 48 Voltage change (V) 1.2 0.8 0.8 Current Change (μA) 12 8 8 Conductance Change (μS) 120 80 80 Relative Change 1.55 1.04 1.04 Voltage change (V) 2.0 0.8 Current Change (μA) 20 8 Conductance Change (μS) 200 80 Relative Change 2.58 1.04 49 Voltage change (V) 0.8 0.8 Current Change (μA) 8 8 Conductance Change (μS) 80 80 Relative Change 1.04 1.04 Voltage change (V) 2.0 1.6 0.8 0.8 0.8 1.6 Current Change (μA) 20 16 8 8 8 16 Conductance Change (μS) 200 160 80 80 80 160 Relative Change 2.58 2.07 1.04 1.04 1.04 2.07 50 Voltage change (V) 1.6 0.6 0.8 Current Change (μA) 16 6 8 Conductance Change (μS) 160 60 80 Relative Change 2.07 0.77 1.04 Voltage change (V) 0.8 0.8 Current Change (μA) 8 8 Conductance Change (μS) 80 80 Relative Change 1.04 1.04 51 Voltage change (V) 1.6 0.8 0.4 0.8 Current Change (μA) 16 8 4 8 Conductance Change (μS) 160 80 40 80 Relative Change 2.07 1.04 .52 1.04 Voltage change (V) 0.8 0.8 0.8 0.8 0.8 Current Change (μA) 8 8 8 8 8 Conductance Change (μS) 80 80 80 80 80 Relative Change 1.04 1.04 1.04 1.04 1.04 52 Voltage change (V) 0.8 1.2 Current Change (μA) 8 12 Conductance Change (μS) 80 120 Relative Change 1.04 1.55 53 Gold Traces Voltage change (V) 2.0 0.8 Current Change (μA) 20 8 Conductance Change (μS) 200 80 Relative Change 2.58 1.04 Voltage change (V) 0.8 1.2 Current Change (μA) 8 12 Conductance Change (μS) 80 120 Relative Change 1.04 1.55 54 Voltage change (V) 1.2 1.2 Current Change (μA) 12 12 Conductance Change (μS) 120 120 Relative Change 1.55 1.55 Voltage change (V) 0.8 0.8 Current Change (μA) 8 8 Conductance Change (μS) 80 80 Relative Change 1.04 1.04 55 Voltage change (V) 0.8 1.4 Current Change (μA) 8 14 Conductance Change (μS) 80 140 Relative Change 1.04 1.81 Voltage change (V) 0.8 0.8 1.6 Current Change (μA) 8 8 16 Conductance Change (μS) 80 80 160 Relative Change 1.04 1.04 2.07 56 Voltage change (V) 0.8 0.8 Current Change (μA) 8 8 Conductance Change (μS) 80 80 Relative Change 1.04 1.04 Voltage change (V) 0.6 0.8 0.4 0.6 Current Change (μA) 6 8 4 6 Conductance Change (μS) 60 80 40 60 Relative Change 0.77 1.04 0.53 0.77 57 Voltage change (V) 1.2 1.6 0.8 Current Change (μA) 12 16 8 Conductance Change (μS) 120 160 80 Relative Change 1.55 2.07 1.04 Voltage change (V) 0.8 0.8 1.6 Current Change (μA) 8 8 16 Conductance Change (μS) 80 80 160 Relative Change 1.04 1.04 2.07 58 Voltage change (V) 0.8 Current Change (μA) 8 Conductance Change (μS) 80 Relative Change 1.04 Voltage change (V) 0.8 Current Change (μA) 8 Conductance Change (μS) 80 Relative Change 1.04 59 Voltage change (V) 0.8 Current Change (μA) 8 Conductance Change (μS) 80 Relative Change 1.04 Voltage change (V) 0.8 0.8 0.8 0.4 0.8 Current Change (μA) 8 8 8 4 8 Conductance Change (μS) 80 80 80 40 80 Relative Change 1.04 1.04 1.04 .53 1.04 60 Voltage change (V) 0.4 0.8 0.4 0.4 0.8 Current Change (μA) 4 8 4 4 8 Conductance Change (μS) 40 80 40 40 80 Relative Change .53 1.04 .53 .53 1.04 Voltage change (V) 1.2 0.8 Current Change (μA) 12 8 Conductance Change (μS) 120 80 Relative Change 1.55 1.04 61 Voltage change (V) 0.8 1.6 Current Change (μA) 8 16 Conductance Change (μS) 80 160 Relative Change 1.04 2.07 Voltage change (V) 1.2 2.0 Current Change (μA) 12 20 Conductance Change (μS) 120 200 Relative Change 1.55 2.58 62 Voltage change (V) 0.8 0.6 0.6 0.8 0.8 Current Change (μA) 8 6 6 8 8 Conductance Change (μS) 80 60 60 80 80 Relative Change 1.04 0.77 0.77 1.04 1.04 Voltage change (V) 1.2 0.8 Current Change (μA) 12 8 Conductance Change (μS) 120 80 Relative Change 1.55 1.04 63 Voltage change (V) 2.4 0.8 Current Change (μA) 24 8 Conductance Change (μS) 240 80 Relative Change 3.10 1.04 Voltage change (V) 1.6 0.8 0.8 Current Change (μA) 16 8 8 Conductance Change (μS) 160 80 80 Relative Change 2.07 1.04 1.04 64 Voltage change (V) 1.6 0.8 0.8 0.4 1.2 Current Change (μA) 16 8 8 4 12 Conductance Change (μS) 160 80 80 40 120 Relative Change 2.07 1.04 1.04 0.52 1.55 Voltage change (V) 2.0 0.8 2.4 Current Change (μA) 20 8 24 Conductance Change (μS) 200 80 240 Relative Change 2.58 1.04 3.10 65 Voltage change (V) 3.2 0.4 0.8 0.8 Current Change (μA) 32 4 8 8 Conductance Change (μS) 320 40 80 80 Relative Change 4.13 0.52 1.04 1.04 Voltage change (V) 0.8 0.4 0.8 0.4 0.8 Current Change (μA) 8 4 8 4 8 Conductance Change (μS) 80 40 80 40 80 Relative Change 1.04 0.52 1.04 0.52 1.04 66 Voltage change (V) 1.4 0.8 0.8 Current Change (μA) 14 8 8 Conductance Change (μS) 140 80 80 Relative Change 1.81 1.04 1.04 Voltage change (V) 0.8 0.8 1.2 0.8 0.4 Current Change (μA) 8 8 12 8 4 Conductance Change (μS) 80 80 120 80 40 Relative Change 1.04 1.04 1.55 1.04 0.52 67 Voltage change (V) 0.8 0.8 0.4 0.4 0.8 0.8 0.4 Current Change (μA) 8 8 4 4 8 8 4 Conductance Change (μS) 80 80 40 40 80 80 40 Relative Change 1.04 1.04 0.52 0.52 1.04 1.04 0.52 Voltage change (V) 0.8 0.8 1.2 0.8 0.8 Current Change (μA) 8 8 12 8 8 Conductance Change (μS) 80 80 120 80 80 Relative Change 1.04 1.04 1.55 1.04 1.04 68 Voltage change (V) 1.2 0.8 0.8 0.8 Current Change (μA) 12 8 8 8 Conductance Change (μS) 120 80 80 80 Relative Change 1.55 1.04 1.04 1.04 69