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Program Method
of NOR Flash
Version 1.0, Apr-2009
Samsung Electronics
Copyright ⓒ 2009 Samsung Electronics Co.,LTD.
Copyright © 2009 Samsung Electronics Co, Ltd. All Rights Reserved.
Though every care has been taken to ensure the accuracy of this document, Samsung
Electronics Co, Ltd. cannot accept responsibility for any errors or omissions or for any
loss occurred to any person, whether legal or natural, from acting, or refraining from
action, as a result of the information contained herein. Information in this document is
subject to change at any time without obligation to notify any person of such changes.
Samsung Electronics Co, Ltd. may have patents or patent pending applications,
trademarks copyrights or other intellectual property rights covering subject matter in this
document. The furnishing of this document does not give the recipient or reader any
license to these patents, trademarks copyrights or other intellectual property rights.
No part of this document may be communicated, distributed, reproduced or transmitted
in any form or by any means, electronic or mechanical or otherwise, for any purpose,
without the prior written permission of Samsung Electronics Co, Ltd.
The document is subject to revision without further notice.
All brand names and product names mentioned in this document are trademarks or
registered trademarks of their respective owners.
Contact Information
Application Engineering Group
Memory Division, Semiconductor Business
Samsung Electronics Co., Ltd
Address : San #16, Banwol-Ri, Taean-Eup,
Hwasung-City,
Gyeonggi-Do, Korea, 445-701
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Purpose
This application note will guide you to variable method of NOR flash and performance
comparison. This is helpful for mobile software engineer.
Definitions and Acronyms
Definitions and Acronyms
Description
VID
Voltage for Accelerated program (typical 9.0V)
Amax
Maximum address bit
References
- Samsung NOR Flash Data sheet
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Table of Contents
1. Variable program method of NOR Flash
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2. Performance comparison of each program method
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1. Variable program method of NOR Flash.
Samsung NOR flash devices provide variable program method for manufacturer of mobile
goods. Normally SLC type NOR flash provides Quadruple word program in factory mode, and
MLC type NOR flash provides Writer buffer program in both user and factory mode.
Normal Program (Both SLC & MLC)
NOR flash can be programmed in units of a word by using normal program method.
Programming is writing 0's into the memory array by executing the Internal Program Routine.
In order to perform the Internal Program Routine, a four-cycle command sequence is
necessary. The first two cycles are unlock cycles. The third cycle is assigned for the
program setup command. In the last cycle, the address of the memory location and the data
to be programmed at that location are written. The device automatically generates
adequate program pulses and verifies the programmed cell margin by the Internal Program
Routine. During the execution of the Routine, the system is not required to provide further
controls or timings. During the Internal Program Routine, commands written to the device
will be ignored. Note that a hardware reset during a program operation will cause data
corruption at the corresponding location.
Accelerated Program (Both SLC & MLC)
The device provides accelerated program operations through the Vpp input. Using this mode,
faster manufacturing throughput at the factory is possible. When VID is asserted on the Vpp
input, the device automatically enters the Unlock Bypass mode, temporarily unprotects any
protected blocks, and uses the higher voltage on the input to reduce the time required for
program operations. In accelerated program mode, the system would use a two-cycle
program command sequence for only a word program. By removing VID returns the device
to normal operation mode.
Note that Read While Accelerated Program (Erase) and Program suspend (Erase suspend)
mode are not guaranteed in MLC devices.
Quadruple word accelerated program operation (SLC Only)
Quadruple word accelerated program operation allows the system write to a maximum of 4
words in one programming operation. As well as Single word accelerated program, the
system would use five-cycle program sequence (One-cycle (XXX - A5H) is for quadruple word
program command, and four cycles are for program address and data). By using Quadruple
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word accelerated program operation, only four words programming is possible, and each
program address must have the same Amax~A2 address. The device automatically generates
adequate program pulses and ignores other command after program command.
Note that Read while Quadruple word accelerated program is not guaranteed
Writer Buffer Programming (MLC only)
Write Buffer Programming allows the system write to a maximum of 32 or 64 words in one
programming operation. This results in faster effective programming time than the standard
programming algorithms. The Write Buffer Programming command sequence is initiated by
first writing two unlock cycles. This is followed by a third write cycle containing the Write
Buffer Load command written at the block address in which programming will occur. The
fourth cycle writes the block address and the number of word locations, minus one, to be
programmed. For example, if the system will program 19 unique address locations, then 12h
should be written to the device. This tells the device how many write buffer addresses will
be loaded with data. The number of locations to program cannot exceed the size of the
write buffer or the operation will abort. The fifth cycle writes the first address location and
data to be programmed. In case that the device supports maximum 32 words program in one
programming operation, he write-buffer-page is selected by address bits Amax. ~ A5
entered at fifth cycle. All subsequent address/data pairs must fall within the selected
write-buffer-page, so that all subsequent addresses must have the same address bit Amax ~
A5 as those entered at fifth cycle. Write buffer locations may be loaded in any order.
Once the specified number of write buffer locations have been loaded, the system must
then write the "Program Buffer to Flash" command at the block address. Any other
command address/data combination aborts the Write Buffer Programming operation. The
device then begins programming. Data polling should be used while monitoring the last
address location loaded into the write buffer. DQ7, DQ6, DQ5, and DQ1 should be monitored
to determine the device status during Write Buffer Programming. The write-buffer
programming operation can be suspended using the standard program suspend/resume
commands. Upon successful completion of the Write Buffer Programming operation, the
device is ready to execute the next command. Note also that an address location cannot be
loaded more than once into the write-buffer-page.
Accelerated Write Buffer Programming (MLC Only)
The device provides accelerated Write Buffer Program operations through the Vpp input.
Using this mode, faster manufacturing throughput at the factory is possible. When VID is
asserted on the Vpp input, the device temporarily unprotects any protected blocks, and
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uses the higher voltage on the input to reduce the time required for program operations. In
accelerated Write Buffer Program mode, the system must enter "Write to Buffer" and
"Program Buffer to Flash" command sequence to be same as them of normal Write Buffer
Programming and only can reduce the program time. Note that the third cycle of "Write to
Buffer Abort Reset" command sequence is required in an Accelerated mode.
Note that Read While Accelerated Write Buffer Program and Program suspend mode are not
guaranteed.
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2. Performance comparison of each program method
Table below indicates program time for one unit word. (not one unit operation)
Program
Normal PGM
Buffer
Accelerated
Method
MLC / SLC
PGM
Buffer PGM
VCC
VCC
VID
VID
Mode
User
User
Factory
Factory
Applied Product
MLC / SLC
MLC
MLC
SLC
80us/11.5us
10us
4us
1.6us
Vpp Input
Voltage
PGM Time
(tPGM/Word)
[us]
Quad Word PGM
11.5us
(Normal PGM)
10us
(32Words Buffered PGM)
Word Program Time
10
User Mode
Program
7.5
4us
(32Words Buffered PGM)
5
1.6us
2.5
4us
(Quadruple PGM)
(64Words Buffered PGM)
Factory Mode
Program with Vpp
2us
(64Words Buffered PGM)
2004
B-die, SLC
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M-die, MLC
2006
2007
A-die, MLC
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