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HCF4014B SYNCHRONOUS PARALLEL OR SERIAL IN/SERIAL OUT 8 - STAGE STATIC SHIFT REGISTER ■ ■ ■ ■ ■ ■ ■ ■ MEDIUM SPEED OPERATION : 12 MHz (Typ.) At VDD = 10V FULLY STATIC OPERATION 8 MASTER-SLAVE FLIP-FLOPS PLUS OUTPUT BUFFERING AND CONTROL GATING QUIESCENT CURRENT SPECIFIED UP TO 20V 5V, 10V AND 15V PARAMETRIC RATINGS INPUT LEAKAGE CURRENT II = 100nA (MAX) AT VDD = 18V TA = 25°C 100% TESTED FOR QUIESCENT CURRENT MEETS ALL REQUIREMENTS OF JEDEC JESD13B " STANDARD SPECIFICATIONS FOR DESCRIPTION OF B SERIES CMOS DEVICES" DESCRIPTION The HCF4014B is a monolithic integrated circuit fabricated in Metal Oxide Semiconductor technology available in DIP and SOP packages. This device is an 8-stage parallel or serial input/ serial output register having common CLOCK and PARALLEL/SERIAL CONTROL inputs, a single SERIAL data input, and individual parallel "JAM" inputs to each register stage. Each register stage is a D-type, master-slave flip-flop in addition to an output from stage 8, "Q" outputs are also available ) (s t c u d o r P e t e l o ) s ( ct DIP SOP PACKAGE TUBE t e l o DIP SOP u d o r P e ORDER CODES HCF4014BEY HCF4014BM1 T&R HCF4014M013TR s b O from stages 6 and 7. Parallel as well as serial entry is made into the register synchronously with the positive clock line transition. In this device, entry is controlled by the PARALLEL/SERIAL CONTROL input. When the PARALLEL/SERIAL CONTROL input is low, data is serially shifted into the 8-stage register synchronously with the positive transition of he clock line. When the PARALLEL/SERIAL CONTROL input is high, data is jammed into the 8-stage register via the parallel input lines and synchronous with the positive transition of the clock line. s b O PIN CONNECTION October 2002 1/10 HCF4014B IINPUT EQUIVALENT CIRCUIT PIN DESCRIPTION PIN No SYMBOL 7, 6, 5, 4, 13, 14, 15, 1 11 PI1 to PI8 NAME AND FUNCTION 8 SERIAL IN PARALLEL/ SERIAL CONTROL CLOCK Q6, Q7, Q8 VSS 16 VDD 9 10 2, 3, 12 Parallel Input Serial Input Parallel/Serial Input Control Clock Input Buffered Outputs Negative Supply Voltage u d o TRUTH TABLE CLOCK SERIAL INPUT PARALLEL/ SERIAL CONTROL PI - 1 X 1 0 X 1 X 1 X 1 0 0 1 ct 0 du X LOGIC DIAGRAM e t e ol s b O 2/10 o r P X r P e Q1 (INTERNAL) Qn 0 0 0 1 0 1 0 1 1 1 1 1 X X 0 Qn - 1 X X 1 Qn - 1 X X Q1 Qn PI - n t e l o s b O 1 0 ) (s ) s ( ct Positive Supply Voltage 0 HCF4014B ABSOLUTE MAXIMUM RATINGS Symbol VDD Parameter Value Supply Voltage VI DC Input Voltage II DC Input Current Unit -0.5 to +22 V -0.5 to VDD + 0.5 ± 10 V mA 200 100 mW mW Top Power Dissipation per Package Power Dissipation per Output Transistor Operating Temperature -55 to +125 °C Tstg Storage Temperature -65 to +150 °C PD Absolute Maximum Ratings are those values beyond which damage to the device may occur. Functional operation under these conditions is not implied. All voltage values are referred to VSS pin voltage. ) s ( ct RECOMMENDED OPERATING CONDITIONS Symbol VDD u d o Parameter Supply Voltage VI Input Voltage Top Operating Temperature tr, tf Input Rise and Fall Time (PI-1 ... PI-8) e t e l VDD = 5V o s b Pr Value Unit 3 to 20 V 0 to VDD V -55 to 125 °C 0 to 1000 µs O ) s ( t c u d o r P e t e l o s b O 3/10 HCF4014B DC SPECIFICATIONS Test Condition Symbol IL Parameter Quiescent Current VOH 0/5 0/10 0/15 0/20 0/5 0/10 0/15 5/0 10/0 15/0 High Level Output Voltage VOL Low Level Output Voltage VIH High Level Input Voltage VIL Low Level Input Voltage IOH Output Drive Current IOL Output Sink Current II CI Input Leakage Current Input Capacitance 0/5 0/5 0/10 0/15 0/5 0/10 0/15 0.5/4.5 1/9 1.5/13.5 4.5/0.5 9/1 13.5/1.5 2.5 4.6 9.5 13.5 0.4 0.5 1.5 0/18 |IO| VDD (µA) (V) <1 <1 <1 <1 <1 <1 <1 <1 <1 <1 <1 <1 <1 <1 <1 <1 <1 <1 <1 ) s ( ct u d o r P e t e l o VO (V) VI (V) Value Any Input Any Input 5 10 15 20 5 10 15 5 10 15 5 10 15 5 10 15 5 5 10 15 5 10 15 TA = 25°C Min. Max. 0.04 0.04 0.04 0.08 5 10 20 100 4.95 9.95 14.95 -55 to 125°C Min. Min. 4.95 9.95 14.95 3.5 7 11 1.5 3 4 -3.2 -1 -2.6 -6.8 1 2.6 6.8 3.5 7 11 4.95 9.95 14.95 ±10-5 ±0.1 5 7.5 1.5 3 4 -1.1 -0.36 -0.9 -2.4 0.36 0.9 2.4 ±1 4/10 V V V 1.5 3 4 The Noise Margin for both "1" and "0" level is: 1V min. with VDD=5V, 2V min. with VDD=10V, 2.5V min. with VDD=15V s b O 0.05 0.05 0.05 3.5 7 11 -1.1 -0.36 -0.9 -2.4 0.36 0.9 2.4 µA ) s ( ct u d o Pr Unit Max. 150 300 600 3000 0.05 0.05 0.05 e t e l o s b -1.36 -0.44 -1.1 -3.0 0.44 1.1 3.0 Max. 150 300 600 3000 0.05 0.05 0.05 -O 18 Typ. -40 to 85°C V mA mA ±1 µA pF HCF4014B DYNAMIC ELECTRICAL CHARACTERISTICS (Tamb = 25°C, C L = 50pF, RL = 200KΩ, tr = tf = 20 ns) Test Condition Symbol Value (*) Unit Parameter VDD (V) Min. Typ. Max. 320 160 120 200 100 80 3 6 8.5 180 80 50 160 80 60 100 50 40 6 12 17 90 40 25 CLOCKED OPERATION tPLH tPHL Propagation Delay Time tTHL tTLH Transition Time fCL (1) tW Maximum Clock Input Frequency Clock Pulse Width tr , tf tsetup tsetup tsetup thold Clock Input Rise or Fall Time Setup Time, serial Input (ref to CL) Setup Time, Parallel Inputs (ref to CL) Setup Time, Parallel/Serial Control (ref to CL) r P e t e l o r P e t e l o O ) bs 120 80 60 80 50 40 180 80 60 0 0 0 ns ns ) s ( ct u d o s ( t c u d o Hold Time, serial in, parallel in, parallel /serial control 5 10 15 5 10 15 5 10 15 5 10 15 5 10 15 5 10 15 5 10 15 5 10 15 5 10 15 60 40 30 40 25 20 90 40 30 MHz ns 15 15 15 µs ns ns ns ns (*) Typical temperature coefficient for all VDD value is 0.3 %/°C. (1) If more than one unit is cascaded trCL should be made less than or equal to the sum of the transition time and the fixed propagation delay of the output of the driving stage of the estimated capacitive load. s b O 5/10 HCF4014B TEST CIRCUIT ) s ( ct u d o r P e CL = 50pF or equivalent (includes jig and probe capacitance) RL = 200KΩ RT = ZOUT of pulse generator (typically 50Ω) t e l o WAVEFORM 1 : PROPAGATION DELAY TIMES, CLOCK PULSE WIDTH (f=1MHz; 50% duty cycle) ) (s t c u d o r P e t e l o s b O 6/10 s b O HCF4014B WAVEFORM 2 : SETUP AND HOLD TIMES (SI TO CLOCK) (f=1MHz; 50% duty cycle) ) s ( ct u d o r P e t e l o ) (s s b O WAVEFORM 3 : SETUP AND HOLD TIME (PI TO P/S) (f=1MHz; 50% duty cycle) t c u d o r P e t e l o s b O 7/10 HCF4014B Plastic DIP-16 (0.25) MECHANICAL DATA mm. inch DIM. MIN. a1 0.51 B 0.77 TYP MAX. MIN. TYP. MAX. 0.020 1.65 0.030 0.065 b 0.5 0.020 b1 0.25 0.010 D ) s ( ct 20 E 8.5 e 2.54 e3 17.78 u d o 0.335 7.1 I 5.1 s ( t c 1.27 e t e ol bs O ) 3.3 Z Pr 0.100 F L 0.787 0.700 0.280 0.201 0.130 0.050 u d o r P e t e l o s b O P001C 8/10 HCF4014B SO-16 MECHANICAL DATA mm. DIM. MIN. TYP A inch MAX. MIN. TYP. a1 1.75 MAX. 0.1 0.068 0.2 a2 0.003 0.007 1.65 0.064 b 0.35 0.46 0.013 0.018 b1 0.19 0.25 0.007 0.010 C 0.5 c1 45˚ (typ.) D 9.8 E 5.8 ) s ( ct 0.019 e 1.27 e3 8.89 10 0.385 6.2 0.228 4.0 G 4.6 L 0.5 s b O 5.3 1.27 ) (s ete ol 3.8 S Pr 0.393 0.244 0.050 F M u d o 0.62 0.350 0.149 0.157 0.181 0.208 0.019 0.050 0.024 8 ˚ (max.) t c u d o r P e t e l o s b O PO13H 9/10 HCF4014B ) s ( ct u d o r P e t e l o ) (s s b O t c u d o r P e t e l o s b O Information furnished is believed to be accurate and reliable. However, STMicroelectronics assumes no responsibility for the consequences of use of such information nor for any infringement of patents or other rights of third parties which may result from its use. No license is granted by implication or otherwise under any patent or patent rights of STMicroelectronics. Specifications mentioned in this publication are subject to change without notice. This publication supersedes and replaces all information previously supplied. STMicroelectronics products are not authorized for use as critical components in life support devices or systems without express written approval of STMicroelectronics. © The ST logo is a registered trademark of STMicroelectronics © 2002 STMicroelectronics - Printed in Italy - All Rights Reserved STMicroelectronics GROUP OF COMPANIES Australia - Brazil - Canada - China - Finland - France - Germany - Hong Kong - India - Israel - Italy - Japan - Malaysia - Malta - Morocco Singapore - Spain - Sweden - Switzerland - United Kingdom - United States. © http://www.st.com 10/10