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Physics Based Reliability Qualification Yizhak Bot, BQR Reliability Engoineering Ltd, Prof. Joseph B. Bernstein, Center for Reliability Physics and Failure Analysis, Department of Electrical Engineering, Ariel University Physics of failure studies have demonstrated that multiple failure causes occur during normal operation of electronics. Most modern advanced devices will fail after only a few years of operation, exhibiting a random end-of-life behavior that can occur far more frequently than published expectations. Our new initiative is dedicated to understanding reliability physics and performing advanced life testing of the multiple mechanisms and their interactions that limit the useful life and results in failures of commercial electronic systems. Our goal is to develop application specific reliability qualifications used in design for reliability and to develop a tool for designers to incorporate reliability together with performance as part of the system qualification. The standard industrial approach to accelerated testing continues to be based on the assumption of a single failure mechanism. In an ideal case, where only one mechanism overwhelms other competing mechanisms, this methodology is well founded. However today, in our push to faster and more complex systems on a chip designs, we have found that this methodology falls far short of expectations for reliability qualification. Hence, our reliability assessment must be more sophisticated and consider all the root cause mechanisms of failure simultaneously. Our new approach to lifetime and reliability calculations is through modeling failure mechanisms as proven by accelerated testing of commercial parts. We analyze failures of the components and compare the mechanisms that we model in the laboratory to be sure that our models accurately reflect the true physics of failure responsible for unreliability in order to better control their effects. We isolate the mechanisms using specific accelerated tests and incorporate these models into a system reliability matrix. We perform a trade-off analysis as part of the design parameters where we can tailor the reliability of a system to meet the performance and reliability specifications before the system is built and in the field. The result will be a more accurate and correct reliability assessment compared to the current approach for building in reliability.