Download Workshop on "X-ray Science with Coherent Radiation"

X-ray Coherence
2003
Satellite Meeting of SRI'03
August 22-23
Berkeley
California
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International Workshop on
X-ray Science with Coherent Radiation
-- Satellite Meeting of SRI 2003
August 22-23, 2003
Building 50 Auditorium
Lawrence Berkeley National Laboratory
1 Cyclotron Road, Berkeley, CA 94720, USA
Workshop Chairs
Qun Shen (CHESS, Cornell)
John Spence (Arizona State/LBNL)
John Arthur (SSRL, Stanford)
International Committee
Local Coordinators
Donald Bilderback (Cornell)
Steve Dierker (BNL)
Sol Gruner (Cornell)
Tetsuya Ishikawa (SPring-8)
Janos Kirz (SUNY, Stony Brook)
Bruno Lengeler (Aachen)
Andreas Magerl (Erlangen)
Gerhard Materlik (Diamond)
Ian McNulty (APS)
Keith Nugent (Melbourne)
Howard Padmore (ALS)
Jean Susini (ESRF)
Mark Sutton (McGill)
Edgar Weckert (Hasylab)
Virginia Bizzell (CHESS, Cornell)
Cathy Cooper (LBNL)
Laura Brown (CHESS, Cornell)
Financial Support
by US National Science Foundation
through
CHESS, Cornell University
and
by US Department of Energy
through
Lawrence Berkeley National Lab
Argonne National Lab
Workshop Proceedings: http://erl.chess.cornell.edu/
Cover: View from Cyclotron Road. Photograph provided by Lawrence Berkeley National Lab.
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Table of Contents
Workshop Program ..................................................................................................................
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Friday, August 22 ...............................................................................................................
Saturday, August 23 ..........................................................................................................
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Invited Talk Abstracts .............................................................................................................
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Energy recovery linac source properties ...........................................................................
Linac based x-ray sources: temporal & spatial coherence ...............................................
Tutorial: Coherence in x-ray physics ................................................................................
X-ray intensity correlation spectroscopy ...........................................................................
Dynamic SAXS with coherent x-rays ................................................................................
Soft x-ray coherent magnetic scattering experiments .......................................................
Inversion of coherent diffraction images of nanocrystals ..................................................
Ptychography and diffractive imaging with x-rays & electrons ..........................................
Coherence preserving reflecting and crystal optics ..........................................................
Shaping x-rays by diffractive coded nano-optics ..............................................................
X-ray coherence measurements .......................................................................................
Nanometer imaging with high brightness source ..............................................................
Coherence and x-ray microscopy .....................................................................................
Recovering phase and correlations from x-ray fields ........................................................
3D phase tomography ......................................................................................................
X-ray vortices in coherent wavefield .................................................................................
Diffractive optics and shearing interferometry ..................................................................
Fourier transform holography ...........................................................................................
Two-photon interferometry ................................................................................................
Diffraction Imaging of the general particle ........................................................................
Diffraction imaging with coherent x-rays ...........................................................................
3D X-ray microscopy by phasing diffraction patterns ........................................................
Hydrodynamic models of x-ray irradiated bio-molecules ...................................................
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Poster Abstracts ...................................................................................................................... 22
Focusing x-ray beams to nanometer dimensions ...........................................................
Magnetic speckles from nanostructures ..........................................................................
Single-element elliptical hard x-ray micro-optics ..........................................................
A fast CCD camera for x-ray photon correlation spectroscopy and
time-resolved x-ray scattering and imaging ................................................................
Some consequences of focusing in coherent diffraction ...............................................
Lessons from an experiment of high resolution fourier transform
holography with coherent soft x-rays .......................................................................
Time-resolved phase contrast radiography and DEI with
partial coherent hard x-ray at BSRF .......................................................................
Invalidity of low-pass filtering in atom-resolving x-ray holography ...................................
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Table of Contents
Measurements of spatial coherence of x-ray laser
from recombining Al plasma .....................................................................................
Avoidance and removal of phase vortices in reconstruction
of noisy coherent x-ray diffraction patterns ..............................................................
Pushing the limits of coherent x-ray diffraction: Imaging
single sub-micrometer silver nanocubes ..................................................................
Coherent soft x-ray branchline at the Advanced Light Source ........................................
Near-diffraction limited coherent X-ray focusing using planar
refractive lenses made in epoxy resist SU8 ................................................................
Quantum-deceleration self-modulation of high energy electron beam
and the problem of optimization of coherent photon collider ...................................
Coherent hard x-ray scattering experiments at large diffraction angles ............................
Multilayer x-ray optics: Progress in coherence preservation .........................................
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Attendees List ........................................................................................................................... 33
Area Map ........................................................................................................................ Last Page
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Program:
Friday, 22 August, 2003
7:30 - 8:30 Continental breakfast, registration, poster set-up.
8:30
Qun Shen (Cornell)
Welcome
Session 1: New Sources and Tutorial
Janos Kirz (SUNY-SB) - Chair
8:35
8:55
Sol Gruner (Cornell)
Jerry Hastings (Stanford)
Energy recovery linac source properties
Linac based X-ray sources: temporal & spatial coherence
9:15
Bruno Lengeler (Aachen)
Tutorial: Coherence in X-ray physics
10:05
Coffee Break and Poster Viewing (25 min.)
Session 2: Coherent Diffuse Scattering
Sunil Sinha (UCSD) - Discussion Leader
10:30
11:00
11:30
12:00
Mark Sutton (McGill)
X-ray intensity correlation spectroscopy
Gerhard Grübel (ESRF)
Dynamic SAXS with coherent x-rays
Jeroen Goedkoop
Soft x-ray coherent magnetic scattering experiments
(Amsterdam)
Discussion on coherent diffuse scattering
12:15
Lunch: no-host (LBNL cafeteria), and Poster Viewing
Session 3: Coherent Diffraction on Nanocrystals
Steve Wilkins (CSIRO) - Discussion Leader
14:00
14:30
Ian Robinson (UIUC)
John Spence (ASU)
Inversion of coherent diffraction images of nanocrystals
Ptychography and diffractive imaging with x-rays & electrons
15:00
Discussion on coherent diffraction on nanocrystals
15:15
Coffee Break and Poster Viewing (25 min.)
Session 4: X-ray Optics for Coherence
Don Bilderback (Cornell) - Discussion Leader
15:40
16:10
16:40
17:00
Tetsuya Ishikawa (SPring8)
Enzo Di Fabrizio (Eletra)
David Paterson (APS)
Wenbing Yun (Xradia)
Coherence preserving reflecting and crystal optics
Shaping x-rays by diffractive coded nano-optics
X-ray coherence measurements
Nanometer imaging with high brightness source
17:20
Discussion on x-ray optics for coherence
17:35
Adjourn for the day
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Program:
Saturday, 23 August, 2003
7:30 - 8:20 Continental breakfast.
Session 5: Phase Contrast Microscopy
Ian McNulty (APS) - Discussion Leader
8:20
8:50
9:20
9:50
Chris Jacobsen (SUNY-SB)
Keith Nugent (Melbourne)
Peter Cloetens (ESRF)
Andrew Peele (Melbourne)
Coherence and x-ray microscopy
Recovering phase and correlations from x-ray fields
3D phase tomography
X-ray vortices in coherent wavefield
10:10
Discussion on phase contrast microscopy
10:25
Coffee Break and Poster Viewing (20 min.)
Session 6: Holography and Interferometry
Ken Finkelstein (Cornell) - Discussion Leader
10:45
11:15
11:45
Christian David (PSI)
Anatoly Snigirev (ESRF)
Makina Yabashi (SPring8)
Diffractive optics and shearing interferometry
Fourier transform holography
Two-photon interferometry
12:15
Discussion on holography and interferometry
12:30
Lunch: brown-bag (Bldg.50 Auditorium), and Poster Viewing
Session 7: Coherent Diffraction Imaging
John Spence (ASU) - Discussion Leader
14:00
14:30
15:00
David Sayre (SUNY-SB)
John Miao (Stanford)
Diffraction Imaging of the general particle
Diffraction imaging with coherent x-rays
Coffee Break and Poster Viewing (20 min.)
15:20
15:50
Malcolm Howells (LBNL)
Stefan Hau-Riege (LLNL)
16:10
Discussion on coherent diffraction imaging
16:25
John Arthur (Stanford)
16:40
3D X-ray microscopy by phasing diffraction patterns
Hydrodynamic models of x-ray irradiated bio-molecules
Workshop summary
End of Workshop
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Invited Talks
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Invited Abstracts:
Friday Morning
Energy Recovery Linac (ERL) Source Properties
Sol M. Gruner
Physics Dept. & Cornell High Energy Synchrotron Source (CHESS)
Cornell University, 162 Clark Hall, Ithaca, NY 14853-2501
Energy Recovery Linacs are being explored as next generation synchrotron light
sources. The fundamental x-ray beam properties from storage ring sources, such as the source
size, brilliance, and pulse duration are limited by the dynamic equilibrium characteristic of the
magnetic lattice that is the storage ring. Importantly, the characteristic equilibration time is
long, involving thousands of orbits around the ring. Advances in laser-driven photoelectron
sources allow the generation of electron bunches with superior properties for synchrotron
radiation. ERLs preserve these properties by acceleration with a superconducting linac,
followed by transport through a return loop hosting insertion devices, similar to that of a 3rd
generation storage ring. The loop returns bunches to the linac 180° out of accelerating phase
for deceleration through the linac and disposal. Thus, the electron beam energy is recycled
back into the linac RF field for acceleration of new bunches and the equilibrium degradation
of bunches never occurs. The superior properties of ERLs beams include extraordinary
brilliance and small source size, with concomitant high tranverse coherence, x-ray pulse
durations down to ~100 femtoseconds, and flexibility of operation. The source properties will
be discussed in terms of coherent applications.
Linear Accelerator Based X-Ray Sources: Temporal and Spatial Coherence
J. B. Hastings
SSRL
Stanford Linear Accelerator Center
Accelerator based synchrotron radiation (SR) sources are now commonplace in the
world with the USA (APS), Japan (Spring-8) and Europe (ESRF) each operating storage ring
sources in the hard x-ray energy range that provide unique radiation for studies in the
chemical, biological and materials sciences. These sources are critical to the understanding of
complex static structures and through inelastic x-ray scattering the dynamics. They have also
been applied to time resolved diffraction on the scale of the photon pulse length ~100 psec.
Photon beams with all the properties of SR but with pulse lengths of ~100 fsec are now
available from linear accelerator based sources, for example the Sub-Picosecond Pulse
Source (SPPS) at the Stanford Linear Accelerator Center (SLAC). X-ray free electron lasers
providing unprecedented pulse intensities, full transverse coherence, and pulse lengths of ~
100 fsec. are operating in the 100nm wavelength range and are in various stages of planning
to reach the 0.1 nm range. The FEL process and the unique properties of these sources will be
discussed.
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Invited Abstracts:
Friday Morning
Tutorial: Coherence in X-ray Physics
B. Lengeler
Aachen University
The concept of coherence is used in quantum mechanics, optics, x-ray and neuron
scattering, mesoscopic electron transport. It will first be discussed what interferes in a
physical event and what destroys interference. Then we treat chaotic light sources and onemode lasers and the description of that light in terms of coherence functions of first and
second order. The influence of the sample on coherence will be treated in a third part. The
uncertainty in the momentum transfer defines a generalized coherence volume. When its size
is larger than the illuminated volume speckle can be observed. Differences in x-ray, neutron
and electron transport will be addressed. A few examples will illustrate the concepts.
X-ray Intensity Fluctuation Spectroscopy
Mark Sutton
McGill University
Intensity fluctuation spectroscopy (IFS) is an ideal way to study the kinetics of
fluctuations in a system provided that the scattering intensity is sufficient for the time scales
of the system under study. For the last three to four decades, it has been extensively used
with light scattering to study a large variety of systems. With the extension of the technique
into the x-ray region, one has the advantage of accessing opaque materials, probing much
shorter length scales and being less affected by multiple scattering. The prime disadvantage of
x-rays over visible light is the much lower intensity levels of x-ray sources. This talk will
summarize some of the recent results using the technique and then discuss current limitations
with respect to new sources, new optics and new detector developments.
Dynamic Small Angle Scattering with Coherent X-Rays
G. Grübel
European Synchrotron Radiation Facility, BP 220, 38043 Grenoble, France
Complex relaxations in disordered systems have been studied successfully by
scattering of both visible light and neutrons. Neutron based techniques can probe the dynamic
properties of matter at high frequencies from  typically equal to 1014 Hz down to about 107
Hz and achieve atomic resolution. Photon Correlation Spectroscopy (PCS) with visible light
can cover low frequency dynamics (<106 Hz), but probes only the long wavelength Q<
4*10-3 Å-1 region in materials not absorbing visible light. Coherent x-ray beams from third
generation synchrotron radiation sources provide the possibility for correlation spectroscopy
experiments with coherent x-rays (XPCS) capable of probing the low frequency dynamics
(106 Hz to 10-3 Hz) in a Q range from 1.10-3 Å-1 up to several Å-1. XPCS can thus provide
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Invited Abstracts:
Friday Morning
atomic resolution, but has proven to be particularly powerful in the small angle scattering
regime and for the study of complex fluids. XPCS can operate in optically opague materials
and is not subject to multiple-scattering effects. We will review the status of XPCS in the
SAXS regime by discussing the properties of static x-ray speckle as well as its applications
for the study of dynamical phenomena in soft condensed matter systems (suspensions of
colloidal particles, polymer micelles, surface dynamics on complex liquids).
Soft X-Ray Coherent Magnetic Scattering Experiments
J.B. Goedkoop, M.A. de Vries, J.F. Peters, J.Miguel
Van der Waals –Zeeman Institute
University of Amsterdam
Valckenierstraat 65, NL1018 XE Amsterdam
[email protected]
N.B. Brookes, S.S. Dhesi
ESRF, B.P. 220, F-38034 Grenoble Cedex
The increased coherence of third generation synchrotron sources allows us to port
laser techniques such as holography and dynamical light scattering from the visible to the xray spectral range. In addition to the obvious improvement in resolution, the x-ray range may
allow for new variants that are not possible in the visible, as exemplified by techniques that
use the strong magnetic contrast at soft x-ray resonances.
In this talk I will report on soft x-ray coherent magnetic scattering experiments
performed on stripe magnetic domain systems as occurring in amorphous GdFe thin films
with perpendicular anisotropy. This system was chosen in order to have maximum magnetic
contrast, negligible charge scattering and minor multiple scattering.
These experiments were performed at the ESRF on a spectroscopy beam line using a
phosphor screen + visible CCD detector. A careful Kramers Kronig analysis of the magnetic
cross section was made at 10 m beam
both the Gd M5 and the Fe Gd M resonance
40 nm GdFe
L3
resonances,
which
180 nm period
(MFM)
matches
experimentally
observed scattering cross
sections remarkably well
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and is in agreement with
atomic calculations.
Despite non-ideal
conditions we were able to
obtain very high resolution
speckle patterns both of
ordered and disordered
stripe systems from which the local magnetic correlation function can be obtained
straightforwardly. Attempts at speckle inversion of these data have been foiled by lack of qrange.
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Invited Abstracts:
Friday Afternoon
We will discuss the field and energy dependence of the speckle patterns. We show that
the scattered intensity in our experiment do not show energy-dependent anomalous
interference between the magnetic and charge scattering contributions.
Finally, first attempts at critical scattering at the Gd M5 edge of epitaxial Gd (0001)
layers on W are reported. Despite mK temperature resolution and stability no such scattering
could be observed, explainable by sample imperfections, lack of sufficient flux and detector
insensitivity.
Inversion of Coherent Diffraction Images of Nanocrystals
Ian Robinson
University of Illinois, Urbana, IL.
In this talk, I will present the progress we have made towards reconstruction of real
space images by inversion of coherent X-ray diffraction from small crystals. We have found
that iterative Fourier transform methods based on the Fienup/Gerchberg/Saxton method can
be successful under some circumstances. These methods work because the diffraction pattern
can be oversampled with respect to the spatial Nyquist frequency. A strong real-space
constraint in the form of a "support" region surrounding the object appears to be sufficient,
but some anti-stagnation strategy is also necessary. The resulting images of gold nanocrystals
are interesting in that internal striations are present [1]. The striations probably arise because
of stresses present during the growth of the crystals. I will discuss the merits of possible
enhancements to the technique enabled by the introduction of focusing optics in front of the
sample.
[1] "Three-dimensional Imaging of Microstructure in Gold Nanocrystals", G. J. Williams, M. A. Pfeifer, I. A.
Vartanyants and I. K. Robinson, Physical Review Letters 90, 175501-1 (2003).
Ptychography and Coherent Diffractive Imaging - X-rays and Electrons
John Spence
Arizona State Univerisyt, Physics, and LBNL
[email protected]
Several ideas, developed over half a century, have now converged to provide a
working solution to the non-crystallographic phase problem. These include Sayre's 1952
observation that Bragg diffraction undersamples diffracted intensity relative to Shannon's
theorem, that iterative ("HiO") algorithms with feedback rarely stagnate (Gerchberg-SaxtonFeinup), producing an astonishingly successful optimization method, and that these iterations
are Bregman Projections in Hilbert space. Modern algorithms based on these ideas have
recently produced the first spectacular atomic-resolution image of a double-walled nanotube
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Invited Abstracts:
Friday Afternoon
from experimental electron diffraction patterns (Zuo et al, Science, 300, 1419 (2003) ), and
lensless X-ray images at 20nm resolution (Miao et al Nature, 400, p. 342 (199), He et al Phys
Rev B. 67, p. 174114 (2003) ). In this talk two new ideas will be presented. First, recent
experimental application of the "Shrinkwrap" HiO algorithm (Marchesini et al, (2003) in
press) will be given. This algorithm inverts X-ray speckle patterns to images without
knowledge of the object boundary. Experimental results are given with 20nm resolution.
Secondly, the use of compact support along the beam direction in the transmission geometry
for a thin diffracting slab will be described as a phasing method. Simulations for cryo-TEM
tomography of protein monolayers shows that this use of the HiO algorithm greatly reduces
the number of TEM images needed to provide known phases for the three-dimensional
diffraction data (Spence et al, J.Struct Biol, in press, also Weierstall et al, Ultramic 90, 171
(2001). Finally, a conceptual connection between the HiO "oversampling" method (which
requires diffracted intensity measurements at half the "Bragg" angle) and Ptychography
(which uses interference between adjacent coherent diffraction orders) will be suggested.
Coherence Preserving Reflecting and Crystal Optics
Tetsuya Ishikawa
SPring-8/RIKEN
Kouto 1-1-1, Mikazuki-cho, Sayo-gun, Hyogo 679-5148; e-mail: [email protected]
Perfect preservation of x-ray coherence requires x-ray mirrors with atomic scale
smoothness. The SPring-8 is collaborating with the Osaka group for producing better x-ray
mirror. Image profiles of the reflected x-ray beam with coherent illumination are well
reproduced by combining a calculation based on numerical Fresnel-Kirchhof integration with
surface figure data measured with micro-stitching interferometry. Since figuring methods
developed by the Osaka group are numerically controllable, we can correct the surface figure
to a limit posed by the metrology. An elliptical mirror gave a nearly diffraction-limited focus
line of 200 nm width. Kirkpatric-Baes combination of two elliptical mirrors gave a point
focus of 200×200 nm2. After making some figure correction, the focal spot size was reduced
to 90×180 nm2. Up to now, we do not make any coating on mirror surface. If we can coat
heavy metals to increase the numerical aperture without degrading the surface figure, the
calculated focal size in ideal case will be down to 30×60 nm2.
We have given an integral-form solution of time-dependent Takagi-Taupin equation
for perfect crystal, and discussed propagation of coherence through dynamical x-ray
diffraction. This has led to a simple method of measuring the modulus of mutual coherence
function. One important conclusion is that we cannot always longitudinal and transverse
coherence components. We will report the present status of synthetic diamond crystals in
Japan and discuss some issues on diamond crystals in view of coherence preservation.
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Invited Abstracts:
Friday Afternoon
Shaping X-Rays by Diffractive Coded Nano-Optics
E. Di Fabrizio
TASC-NNL-INFM (National Institute for the Physics of Matter) Elettra Synchrotron Light Source
- Lilit Beam-line S.S.14 Km 163.5, Area Science Park, 34012 Basovizza - Trieste (Italy)
The current intense interest in extreme ultraviolet and x-ray microscopy is mainly due
to the availability of a nearly ideal optical source for nano-optics based on diffraction, that is,
a source with low divergence whose wavelength can be tuned over a range of several keV and
whose spectrum can be monochromatised with a band pass  of less than 10-4.
Synchrotrons of the latest generation and free electron lasers (in the near future) are devices
that produce x-rays with these characteristics. When a source of electromagnetic radiation is
bright enough, that is, point-like and monochromatic, a new world opens for the designer of
optical instruments and for a wider community of experimenters and theorists. This happened
with the invention of the optical microscope and is still happening with x-ray microscopes of
the latest generation. Although available x-ray sources have coherence characteristics very
close to those of lasers at visible wavelengths, up to now the design of new optical devices
has not proceeded much beyond simple focusing optical elements. In fact the zone plate, that
can be now considered a well established focusing element for x-rays, was invented more than
hundred years ago but due to technological difficulties, they have been implemented only in
the last two decades.
In this article we show that it is possible to design, fabricate and easily use new optical
elements that, beyond focusing, can perform new optical functions. In particular, the intensity
(and polarization for extreme ultraviolet wavelength ) of light in the space beyond the optical
elements can be redistributed with almost complete freedom. In other words, already available
extreme ultraviolet and x-ray sources are suitable as ideal sources for diffractive optical
elements designed to perform new optical functions that can conveniently be summarized
under the expression .of. “beam shaping”. To our knowledge this is the first example of
design, fabrication and application of novel x-ray optical elements that can perform multifocusing in a single or multiple focal plane, beam shaping of a generic monochromatic beam
into a well defined geometrical and “artistic” shape. These new optical functions, can be used
for many applications ranging from microscopy, such as differential interference contrast
microscopy, bio-imaging, maskless lithography and chemical vapour deposition induced by
extreme ultraviolet and x-ray radiation.
X-ray spatial coherence measurements
David Paterson, Advanced Photon Source
Conventional spatial coherence measurement techniques rely upon a sequential series
of measurements to completely map the coherence function of a source. Typically, the
separation of slits – for example in a Young’s slits experiment – pinholes or mirrors must be
varied. This is time consuming, limiting the parameter space that can be explored in an
experiment and makes measurements of pulsed sources very difficult.
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Invited Abstracts:
Friday Afternoon
A technique that uses a diffracting mask to achieve the measurement of the entire
coherence function with a single recording of a diffraction pattern will be described. The
technique is directly applicable to measurement of sources with pulsed or DC nature. The
mask is a class of coded apertures called a uniformly redundant array (URA). The technique
can be performed with the URA as an absorption diffraction mask or a phase-shifting mask to
measure harder x-ray sources. The analysis method and spatial coherence function
measurements of 1.1–1.8 keV and 7.9 keV undulator radiation at the Advanced Photon
Source will be described.
Uniformly redundant array design
Nanometer Imaging with a High Brightness Source
Wenbing Yun
Xradia, Inc., 4075A Sprig Drive, Concord, CA 94520
The future high brightness synchrotron sources will permit development of x-ray
imaging techniques with sub-10 nm resolution and unprecedented capabilities, including 3D
tomography for imaging biological specimens and studying crack initiation and propagation
in materials science, spectromicroscopy for chemical state mapping of soil and environmental
samples, and microdiffraction for mapping of crystallography phases and textures. As in the
optical spectrum, the development of suitable lenses with the required optical property is of
critical importance to realize these capabilities.
Zone plate lens has demonstrated 20-nm resolution, which is the highest spatial
resolution achieved over the whole electromagnetic spectrum. The inherent high fabrication
accuracy by advanced lithography technology means that it has a high degree of the source
coherence preservation, as manifested by its diffraction limited focusing demonstrated by
many researchers at high spatial resolution. Fabricating high-resolution zone plates for
multikeV x-rays is very challenging because it requires producing precise nanometer scale
structures with a high aspect ration (defined as thickness/feature-size). The challenge
increases with x-ray energy because the aspect ratio required for maintaining a reasonable
focusing efficiency increases with x-ray energy. Currently, Xradia is producing some of the
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Invited Abstracts:
Friday Afternoon
best performing x-ray zone plates for multikeV x-rays. With a focusing efficiency exceeding
10% for 3-10 keV x-rays, Xradia’s zone plate has an outermost zone width of 50-nm. This
zone plate has a spatial resolution of 60-nm using its first order diffraction and 20-nm with a
reduced efficiency using its third order diffraction. In principle, there is no fundamental limit
to the resolution of a zone plate and the practical limitation is the fabrication of precise and
accurate nanostructures with extreme high aspect ratio. While the challenge is substantial to
develop zone plates with improving spatial resolution, the available resources are limited for
research labs as well as companies like Xradia.
We will discuss some exciting possibilities of some synchrotron-based x-ray imaging
techniques, including high spatial resolution sub-10 nm resolution and spectromicroscopy
capable of chemical state mapping and elemental specific imaging at high spatial resolution.
We will also present the development of zone plate lenses for coherent hard x-ray
applications.
Dr. Wenbing Yun
Xradia, Inc., 4075A Sprig Drive, Concord, CA 94520, Phone 925-288-1818, Fax 925-2880310. E-mail [email protected].
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Invited Abstracts:
Saturday Morning
Coherence and x-ray microscopy
Chris Jacobsen
Department of Physics & Astronomy, Stony Brook University
Microscopy with coherent x-ray beams can take many forms.
The coherent beam can be focused to a diffraction-limited spot which is then scanned
through a specimen. If a large area detector is used, the resulting imaging process is
incoherent, whereas if a spatially segmented detector is used one can carry out partially
coherent imaging. With Brookhaven Lab and MPI Garching, our group has developed a
segmented detector (1) that can be used for delivering both amplitude and phase contrast
images from a single scan of the specimen (2). Absorption contrast is particularly favorable
for soft x-ray spectromicroscopy studies of chemical heterogeneities in biological and
environmental science specimens (in particular when clustering or pattern matching
approaches are used for data analysis (3)), but efforts to extend chemical analysis to phase
contrast imaging will also be discussed.
The coherent beam can also directly illuminate the specimen, with the exit wave
carrying information about the specimen. X-ray holography provides one means for
recording and reconstructing this exit wave (4, 5), and this can be extended to three
dimensions using diffraction tomography (6-8), as will be discussed by Cloetens. The
characteristics of holography will be compared with other approaches such as far-field
diffraction reconstruction and transport of intensity equation reconstruction.
With any of these methods, the information that can be obtained about the specimen is
ultimately limited by radiation damage. The effects of radiation damage can be minimized by
maintaining the specimen at cryogenic temperatures. This approach works very well for
preserving specimen mass and structure at larger spatial scales (9); however, it appears to
provide less protection to near-edge absorption resonances used for chemical state imaging
(10).
1.
M. Feser et al., in X-ray micro- and nano-focusing: applications and techniques II I. McNulty, Ed. (SPIE,
Bellingham, WA, 2001), vol. 4499, pp. 117-125.
2. M. Feser, C. Jacobsen, P. Rehak, G. De Geronimo, Journal de Physique IV 104, 529-534 (2003).
3. C. Jacobsen et al., Journal de Physique IV 104, 623-626 (2003).
4. M. Howells et al., Science 238, 514--517 (1987).
5. I. McNulty et al., Science 256, 1009--1012 (1992).
6. A. J. Devaney, IEEE Transactions on Image Processing 1, 221--228 (1992).
7. W. Leitenberger, T. Weitkamp, M. Drakopoulos, I. Snigireva, A. Snigirev, Optics Communications 180,
233-238 (2000).
8. T. Beetz, C. Jacobsen, A. Stein, Journal de Physique IV 104, 31-34 (2003).
9. J. Maser et al., Journal Of Microscopy 197, 68-79 (2000).
10. T. Beetz, C. Jacobsen, Journal of Synchrotron Radiation 10, 280-283 (2003).
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Invited Abstracts:
Saturday Morning
Recovering Phase and Correlations from X-ray Fields
Keith A Nugent1, Andrew G Peele1, Chanh Tran1, Ann Roberts1, Henry N Chapman2, Adrian
P Mancuso1 and David Paterson3
1
School of Physics, The University of Melbourne, Vic., 3010, Australia
2
Lawrence Livermore National University, PO Box 808, Livermore, CA., 94550, USA
3
Advanced Photon Source, Argonne National Laboratory, 9700 South Cass Ave, Argonne, Ill,
60439, USA
The development of x-ray free-election lasers promises the acquisition of diffraction
data from very small crystals, or even single molecules. Recent work has demonstrated the
reconstruction of such non-crystallographic specimens from diffraction data, although the
uniqueness of the reconstruction cannot be guaranteed. Successful unique real-space phase
recovery methods, such as the transport of intensity approach, have been demonstrated and
successfully applied but have hitherto been thought to fail in the far-field limit.
In this talk we consider the real-space ideas in the context of the diffraction of fields
containing phase curvature, which we term astigmatic fields. We show that astigmatic
diffraction patterns allow unique recovery of structural information from diffracted intensities
in reciprocal space. We demonstrate an algorithm that allows the phase to be recovered
uniquely and reliably.
We then go on to consider the next level of complexity, which is the recovery of the
correlations in the wavefield. We outline a technique by which complete coherence
information may be recovered from a beam and we present some experimental results recently
obtained at the Advanced Photon Source.
3D Phase Contrast Tomography
P. Cloetensa, J.P. Guigaya, O.Hignettea, W. Ludwigb, R. Moksoa, M. Schlenkerc and S. Zablera
(Email: [email protected])
a
European Synchrotron Radiation Facility, BP 220, F-38043 Grenoble
b
GEMPPM, INSA de Lyon, F-69621 Villeurbanne, France.
c
Laboratoire Louis Néel du CNRS, F-38042 Grenoble, France
Phase imaging can be instrumentally very simple at third generation synchrotrons due
to the spatial coherence of the X-ray beam, provided by the small cross-section of the source
and, on the imaging beamline ID19, to the large source-to-specimen distance of 145 m. Phase
images can be understood as resulting from Fresnel diffraction, i.e. simple propagation. They
can be used in two distinct modes. When the specimen-to-detector distance D is 'small', the
phase discontinuities are revealed through fine fringes. These can be used as the input for
approximate three-dimensional reconstruction. On the other hand, the Fresnel fringe systems
that turn the images into an in-line hologram can be used to retrieve the phase distribution,
through a holographic reconstruction process, based on the use of a series of images, taken at
different distances from the sample. The phase maps are used as the input for tomographic
reconstruction, yielding quantitatively the 3D distribution of the electron density (holotomo17
Invited Abstracts:
Saturday Morning
graphy). In order to overcome in an efficient way the resolution limit of hard X-ray detectors
(of the order of one micron) image magnification can be obtained in a projection microscope
by focusing the beam upstream of the sample. Using a Kirkpatrick-Baez mirror system, beams
with diameter below 90 nm have been obtained at 20 keV. A very high flux (up to 1012 ph/s)
is obtained by using the first multilayer coated mirror to select a given undulator harmonic.
The magnification allows to improve very significantly the spatial and time resolution of
phase contrast imaging. Putting the object in the focus and through a scanning procedure
micro-fluorescence maps of selected portions of the specimen are obtained. This gives, at a
very fine scale, element specific information complementary to the micro-structural
information obtained by phase imaging. Future needs in the field of coherent 3D imaging
with respect to source properties, X-ray optics and detector technology will be considered.
X-ray Vortices in Coherent X-ray Wavefields
Andrew G Peele
School of Physics, The University of Melbourne, Vic., 3010, Australia
Undergraduate optics courses treat waves as if they are completely coherent and have
a well-defined and continuous phase. It is now well accepted that most waves are not coherent
and so it is necessary to take partial coherence effects into account. It is less well-established
that phase distributions are rarely continuous. Indeed, the visible coherent optics community
is only now coming to terms with the phenomena associated with phase discontinuities
through the new field of “singular optics”. It is to be anticipated that x-ray “singular optics” is
also an area of potential importance to the coherent x-ray optics community.
Singularities in the phase of a wavefield arise whenever the field amplitude is zero. In
particular, these discontinuities in the phase can always be analysed in terms of a combination
of edge discontinuities and vortex discontinuities (where the phase spirals around a point
singularity with an integer multiple of 2 increase in the phase for each turn). In the optics
community, singular optics has found application in the development of optical vortex
solitons and in optical trapping (the optical spanner). It is also interesting to note that a wave
structure containing a phase vortex carries orbital angular momentum in addition to the spin
angular momentum associated with polarization.
The role of singular optics in coherent x-ray optics is not yet clear. At the University
of Melbourne, we are interested in these structures in the context of phase recovery, where
discontinuities play a critical role. It can be shown that propagation-based phase recovery is
only able to yield a unique solution when it is known that phase singularities are absent. We
speculate that singularities also play a significant, but not yet understood, role in methods to
recover correlations in the wavefield. Techniques that use only measurements of intensity will
fail when there is a rotational symmetry in the phase. The key issue being that the intensity
distribution of a vortex wave structure is independent of the direction of rotation of the vortex.
In this context, we have recently begun an exploration of vortex phenomena at x-ray
wavelengths. While vortices are expected to be ubiquitous at all wavelengths, we have
recently demonstrated the surprising fact that it is particularly easy to create these objects in a
controlled way at x-ray wavelengths. I will describe these experimental results and discuss the
concepts and role of phase discontinuities in phase recovery methods, as well as in
measurements of the phase space properties of a wave.
18
Invited Abstracts:
Saturday Morning
Diffractive Optics and Shearing Interferometry
C. David a, T. Weitkamp a, B. Nöhammer a, H.H. Solak a, A. Diaz a, M. Stampanoni b, E. Ziegler c, J.F. v.d. Veen
a
Laboratory for Micro- and Nanotechnology, Paul Scherrer Institut, CH-5232 Villigen-PSI, Switzerland
b
Swiss Light Source, Paul Scherrer Institut, CH-5232 Villigen-PSI, Switzerland
c
European Synchrotron Radiation Facility, B.P. 220, F-38043 Grenoble Cedex, France
The dramatical increase of coherence that will be available from the planned fourth
generation x-ray sources gives rise to the question as to what extend optical elements in the
beam can preserve this high level of coherence. The deformations of the x-ray wave fronts
should be much below one wavelength. In the case of diffractive x-ray optics operated in
transmission, this directly translates into a placement accuracy of the diffractive structures of
much better than one structure width. State-of-the-art lithography tools are capable of
placement accuracies in the range of nanometers, meaning that the above condition can be
met in most practical cases. In consequence, diffractive optics have a significant advantage
over refractive or reflective x-ray optics in terms of aberrations that may deteriorate the
degree of coherence of an x-ray beam. This is of special importance in context with future
hard x-ray sources with transverse coherence lengths in the millimeter scale. To make
effective use of such a beam, optical elements should be of similar size and simultaneously
control the wave fronts with sufficient precision.
At the Laboratory for Micro and Nanotechnology we have been developing a large
number of diffractive x-ray optics for a wide range of photon energies and applications. The
areas of these elements cover, in some cases, many square millimeters. In addition to Fresnel
lenses for micro-focusing applications, we have recently developed diffractive hard x-ray
optical elements made by wet chemical etching of single crystal silicon. These elements serve
as beam splitters and analysers in interferometer set-ups. The applications of such
interferometers include phase contrast imaging, wave front sensing and metrology of x-ray
mirrors. Although the above-mentioned devices are at the moment optimised for use with
radiation from third generation sources, the majority of the developed technological processes
could be applied to produce optical elements tailored to the requirements of fourth generation
sources. Furthermore, the presented interferometry techniques could be used in interesting
novel applications taking advantage of the dramatically increased coherence lengths and flux
levels.
Left: Silicon diffraction grating for interferometry applications. Right: Hard x-ray interferogram of polymer spheres.
19
Invited Abstracts:
Saturday Morning
Fourier Transform Holography
Anatoly Snigerev
European Synchrotron Radiation Facility, B.P. 220, F-38043 Grenoble Cedex, France
(Abstract missing)
Two-photon interferometry
Makina Yabashi
SPring-8/JASRI
Characterization of x-ray coherence is very important for performing a number of
applications based on coherence, as well as for diagnosing high-quality synchrotron sources.
Two-photon interferometry originally introduced by Hanbury-Brown and Twiss [1] has a
potential to determine spatial and temporal coherence (first-order coherence) and the photon
statistics (higher-order coherence) with a very fast resolution. For present synchrotron
sources, twophoton interference can be measured as an enhancement of coincidence
probability of photoelectric pulses from a single bunch. A high-resolution monochromator
must be used in order to get a reasonable enhancement of the coincidence probability [2]. We
have developed a system for two-photon interferometry at SPring-8. As a key optics a highresolution monochromator (HRM) based on 4-bounced asymmetric diffractions has been
developed. The device enables to produce monochromatic x-rays with an extremely small
bandwidth E = 120 µeV at E = 14.41 keV [3]. First we have measured a spatial coherence
profile, particularly along the vertical direction, at the 27-m undulator beamline (19LXU) of
SPring-8. Enhancement of coincidence probability was measured as a function of vertical slit
width. The large enhancement (~ 30% max.) allowed us to determine spatial coherence profile
with high accuracy [4]. Recently we have performed a similar experiment at the beamline
29XU of SPring-8, equipped with a 4.5-m undulator called a SPring-8 standard undulator.
From the coherence length and the betatron function, we have determined a vertical source
size and emittance, which are in good agreement with estimation by the accelerator group. We
have also proved that the method can be applied to diagnose coherence propagation by optical
elements. For temporal domain, we have succeeded in determination of pulse width (32 ps in
FWHM) from measurement of the coincidence probability as a function of energy bandwidth
[5]. The method will provide an essential information for ultrafast synchrotron sources which
are currently developed.
[1] R. Hanbury-Brown and R. Q. Twiss, Nature (London), 177, 27 (1956).
[2] E. Ikonen, Phys. Rev. Lett., 68, 2759 (1992); Y. Kunimune et al., J. Syn. Rad., 4, 199 (1997).
[3] M. Yabashi, K. Tamasaku, S. Kikuta, and T. Ishikawa, Rev. Sci. Instrum., 72, 4080 (2001).
[4] M. Yabashi, K. Tamasaku, and T. Ishikawa, Phys. Rev. Lett., 87, 140801 (2001).
[5] M. Yabashi, K. Tamasaku, and T. Ishikawa, Phys. Rev. Lett., 88, 244801 (2002).
20
Invited Abstracts:
Saturday Afternoon
Diffraction Imaging of the General Particle
D. Sayre, J. Kirz, C. Jacobsen, D. Shapiro, and E. Lima
Dept. of Physics and Astronomy
SUNY at Stony Brook, NY 11794
For many years crystallographers have been performing high-resolution lensless
imaging of the unit cells of crystals by x-ray diffraction. With the arrival of more powerful xray sources it now appears probable that the technique can be successfully extended to general
small structures. Assuming that this is so, a result will be a large increase in the consumption
of photons, as well as in the range of structures which can be imaged. The subject, including
imaging resolution issues, will be briefly reviewed.
Diffraction Imaging with Coherent X-rays
John Miao (SSRL)
When a coherent diffraction pattern of a finite sample is sampled at a spacing finer
than the Nyquist frequency (i.e. the inverse of the sample size), the phase information is
embedded inside the diffraction pattern itself and can be directly retrieved by using an
iterative process. In combination of this oversampling phasing method with coherent X-rays,
a new imaging methodology (i.e. coherent imaging) has recently been developed to determine
the electron density of nano-crystals, non-crystalline materials and biological samples. In this
talk, I will discuss the principle of the oversampling method and present some recent
experimental results.
3D X-ray microscopy by phasing diffraction patterns: prospects and
limitations
M. R. Howells1, H. Chapman2, R. M. Glaeser1, S. Hau-Riege2, H. He1, J. Kirz1,3,
S. Marchesini1, H. A. Padmore1, J. C. H. Spence4,1, U. Weierstall4.
1
Lawrence Berkeley National Laboratory, Berkeley, CA 94720, USA.
2
Lawrence Livermore National Laboratory, Livermore, CA 94550, USA.
3
State University of New York, Stony Brook, NY 11794, USA.
4
Arizona State University, Tempe, AZ 85287, USA.
Corresponding author: [email protected]
This presentation addresses the questions of what performance can we expect from a
3D diffraction microscope and what will set the limits. In particular we make a quantitative
calculation of the dose required for imaging at any given resolution and statistical accuracy
with a model sample consisting of protein against a background of water. We derive the dose
21
Invited Abstracts:
Saturday Afternoon
needed for 3D imaging by use of the dose-fractionation theorem of Hergel and Hoppe and
determine that for 3D imaging, the dose scales inversely as the fourth power of the resolution.
Thus far the calculation has made no reference to the amount of dose that the sample can
tolerate. The critical dose for destruction of features of a given size in a protein sample has
been fairly widely investigated by various interested communities (spot-fading experiments
etc) and we have assembled a body of information from the literature of both x-ray and
electron imaging. When the dose required for imaging a feature according to the Rose
criterion and the critical dose for destruction of features is displayed on a common plot of the
dose against feature-size, one can see that imaging life science samples with a resolution of
about 10 nm should be possible. For the more radiation-resistant samples investigated in
material science research, significantly better resolution of about 2-4 nm is expected. Another
requirement for these experiments to be useful is that the exposure time should be not more
than a few hours for a complete tilt series. We address this question in a similar way to the
dose and find that (a) the required coherent flux also scales with the inverse fourth power of
the resolution and (b) the exposure times are reasonable even for present-day synchrotron
sources provided that optimally chosen undulators and optical systems achieving their design
performance are used.
Acknowledgements
This work was supported by the Director, Office of Energy Research, Office of Basics Energy
Sciences, Material Sciences Division of the U. S. Department of Energy, under Contract No.
DE-AC03-76SF00098.
Hydrodynamic Model of X-Ray Irradiated Biological Molecules
Stefan P. Hau-Riege, Richard A. London, and Abraham Szöke
Lawrence Livermore National Laboratory, Livermore, CA 94550, USA
X-ray free electron laser (XFEL) synchrotron radiation sources can produce extremely
short and intense X-ray pulses that potentially allow the three-dimensional structure
determination through single-molecule diffraction imaging. One of the critical issues is the
deterioration of a molecule induced by X-ray irradiation.
Recently, molecular-dynamics calculations of the damage dynamics of biological
molecules have been presented by Neutze et al. (Nature 406, 752 (2000)). In contrast, we
have developed a simpler hydrodynamic model, but added several physical effects that
strongly affect the dynamics. Most important is the effect of trapped electrons that have been
stripped from the atoms but that are trapped by the electrostatic field of the molecule.
In this paper, we will present a simple dynamics model that includes an approximate
description of the dominant physical effects. We used this model to survey a wide range of
parameters to obtain the image resolution as a function of molecule size, particle composition,
and beam parameters. Classification of individual diffraction images according to the
molecule orientation constrains the beam parameters further (G. Huldt et al., to be submitted).
We determined the optimum resolution as a function of beam and molecule parameters
considering both radiation damage and image classification.
This work was performed under the auspices of the U. S. DOE by LLNL under Contract No.
W-7405-ENG-48.
22
Poster Abstracts
23
Poster Abstracts
Focusing X-ray Beams to Nanometer Dimensions
1
C. Bergemann1,*, H. Keymeulen2, and J.F. van der Veen2
Laboratorium für Festkörperphysik, ETH-Hönggerberg, CH-8093 Zürich, Switzerland
2
Paul Scherrer Institut, CH-5232 Villigen, and ETH-Zürich, Switzerland
We address the question: what is the smallest spot size to which an X-ray beam can be
focused? We show that confinement of the beam within a narrowly tapered waveguide leads
to a theoretical minimum beam size on the order of 10 nm (FWHM), the exact value
depending only on the electron density of the confining material. This limit appears to apply
to all X-ray focusing devices. Mode mixing and interference can help to achieve this spot size
without the need for ultra-small apertures.
*
Present address: Cavendish Laboratory, University of Cambridge, Madingley Road,
Cambridge CB3 OHE, UK.
Magnetic Speckles from Nanostructures
K. Chesnel, M. Belakhosky, G. van der Laan, G. Beutier, A. Marty, F. Livet
ALS, LBNL
1 Cyclotron road, MS 7R0100, Berkeley, CA 94709
Ph: 510-495-2830; Fax: 510-486-4229; [email protected]
The recent development of Resonant Magnetic Scattering (XRMS) in the soft X-ray
range provides increasing opportunities to study magnetic order and reversal processes in
nanostructures. Indeed, besides the chemical selectivity and the polarization sensitivity, this
technique gives the possibility to penetrate thin layer in depth and study the magnetic ordering
at the nanoscopic scale. Moreover, the use of coherent light and 2D detection provides
remarkable speckle patterns that are related to the local magnetic topology. Magnetic speckles
have been recorded in a reflection geometry on two types of systems with perpendicular
magnetic anisotropy: thin epitaxied FePd films with striped magnetic domains [1] and etched
lines grating covered by Co/Pt multilayer [2]. The resulted images from FePd layers exhibit
magnetic speckles with a strong intensity contrast, evidencing the high coherence of the
incident light [3]. This coherence degree, close to 90%, results from the excellent beam
quality and the use of a pinhole placed very close to the sample, thus opening possibilities to
perform real space reconstruction. In case of CoPt lines, the scattering pattern presents a serial
of sharp peaks related to the grating periodicity. In some specific demagnetized state,
remarkable magnetic satellites appear in between the structural peaks, evidencing a tendency
to antiferromagnetic order [2]. This scattering pattern is significantly modified when a
magnetic field is applied on the system, perpendicularly to its surface. By following the
signal variations through the whole magnetization loop, starting from the demagnetized point,
one can observe antiferromagnetic satellites disappearing at the saturated state, then a wider
magnetic signal appearing at the coercive point. This magnetic signal evolution gives
information about the ordering and switching processes. In conclusion, these coherent XRMS
results performed with in situ magnetic field show rich possibilities to study local magnetic
behavior in nanostructures and open the door to dynamic studies.
24
Poster Abstracts
[1] H.A. Durr and al., Science 284, 2166 (1999)
[2] K.Chesnel and al., Phys. Rev. B 66, 024435 (2002)
[3] K.Chesnel end al., Phys. Rev. B 66, 172404 (2002)
Single-Element Elliptical Hard X-Ray Micro-Optics
K. Evans-Lutterodt
Brookhaven National Laboratory
Using micro-fabrication techniques, we have manufactured two optics; a single
element kinoform lens in single-crystal silicon with an elliptical profile for 12.4 keV (1Å) xrays, and a Fresnel prism. By choosing to fabricate an optic optimized at a fixed wavelength,
absorption in the optic can be significantly reduced by removing 2π phase-shifting regions,
while maintaining phase coherence across the optic. This permits short focal length devices to
be fabricated with small radii of curvatures, allowing one to obtain a high demagnification of
a finite synchrotron electron source size. We present our first results from experiments at the
National Synchrotron Light Source X13B beamline.
Research carried out at the National Synchrotron Light Source under DOE Contract No. DEAC02-98CH10886.
A fast CCD camera for x-ray photon correlation spectroscopy and
time-resolved x-ray scattering and imaging
Peter Falus, Matthew A. Borthwick
Department of Physics, Massachusetts Institute of Technology, Cambridge, MA 02139
Simon G. J. Mochrie
Departments of Physics and Applied Physics, Yale University, New Haven, CT 06520
It was widely recognized at the beamline proposal stage that one of the most exciting
scientific opportunities o®ered by coherent X-ray sources is the possibility of carrying out xray photon correlation spectroscopy (XPCS) experiments. As increasingly challenging
experiments are attempted and the demand for synchrotron beam time grows, in order to
collect the most meaningful data most e±ciently, it is also essential to optimize the beam line
optics, and the x-ray detection scheme. However, in contrast to the intensive e®ort to increase
source brilliance and improve beam line optics, with a few notable exceptions, the
development of x-ray detectors has often seemed a relatively neglected area. The purpose of
this poster is to describe a new, inexpensive, fast, charge-coupled device (CCD)-based, x-ray
area detector – the SMD1M60 – which we have implemented in the context of a research
e®ort at beam line 8-ID at the Advanced Photon Source to carry out x-ray photon correlation
spectroscopy (XPCS) experiments. The key feature of the SMD1M60 detector for XPCS
experiments is that it permits us to continuously acquire images at full-frame data rates of up
to 60 Hz and one-sixteenth-frame data rates of up to 500 Hz. While very fast the detector is
photon counting, suppressing any detector noise. Thus, it is straightforward to acquire data
with a time resolution of as little as 2 ms, and data from a considerably larger solid angle can
25
Poster Abstracts
be collected if a time resolution of 17 ms is acceptable. The much greater data rate possible
with the SMD1M60 permits a 100 fold increase in the XPCS Signal to Noise Ratio in cases
where sub-second time steps are called for. In addition, the SMD1M60 is based on an
inexpensive, commercially-available CCD camera. It is also lightweight and conveniently
transportable to the synchrotron. Beyond XPCS, because of the superior data rates possible,
we expect that this detector may find application in time-resolved x-ray scattering
experiments of all sorts, especially where the scattering is weak and diffuse. In addition, we
have found it capable of collecting superior small angle x-ray scattering (SAXS) data.
Some Consequences of Focusing in Coherent Diffraction
K. D. Finkelstein
CHESS Wilson Lab, Cornell University, Ithaca, New York 14853
A quantitative understanding of incident beam angle and energy spread, and similar
information about the detector are needed to understand the resolution in an x-ray scattering
experiment. Are the consequences of these considerations different when the incident beam is
a coherent wave front? We report on simulations made to explore the influence on the
diffraction pattern of very simple systems, when the incident beam is focused on the
specimen. The results offer some guidance on when concentrating optics may be useful, and
how sensitive the scattering pattern is to phase variation in the incident beam.
Lessons from an Experiment of High Resolution Fourier Transform
Holography with Coherent Soft X-rays
H. He, S. Marchesini, M. Howells, U. Weierstall, G. Hembree, and J. C. H. Spence
Lawrence Berkeley Nation Lab. and Arizona State University
A well separated reference wave and an unknown object together with the coherence
of the beam source are the basic needs to do a Fourier transform holography (FTH)
experiment. Holograms from a 2D random array of 50 nm gold balls that fulfill such
conditions has been recorded accidently in beamline 9.0.1 in Adavanced Light Source using
coherent soft X-rays at 2.1 nm wavelength. Reconstruction using direct numerical Fourier
transform is readily obtainable and features better than 50 nm is resolvable. Attempt of higher
resolution reconstruction with deconvolution will be reported. Various experimental
approaches that satisfy FTH conditions will be discussed. Comparison of FTH to other
reconstruction methods will be made.
26
Poster Abstracts
Time-Resolved Phase Contrast Radiography and DEI with Partial
Coherent Hard X-Ray at BSRF
G. Li, Z Y Wu
Beijing Synchrotron Radiation Facility, IHEP, Beijing 10039, China
Continuously nice phase contrast images of different specimens, characterized by a
negligible absorption contrast, have been obtained at Beijing Synchrotron Radiation Facility
(BSRF), using the wiggler source of one of the last first-generation synchrotron ring still in
operation. These phase contrast images shows details of the specimens and some interesting
change related to the inner physiological and chemistry process of the specimens, when the
object-film distance is between 5 and 100 cm, which can not be observed in any conventional
radiographic images, that appear such as the defocused images of those recorded using the
phase contrast method. These experiments at BSRF demonstrates that phase contrast
radiographic methods, although limited by the partial coherence of the source, can achieve
significant improvements in image quality and that this technique may have a wide range of
applications in life science, biology, biomedicine and of course materials science.
Invalidity of low-pass filtering in atom-resolving x-ray holography
1
D. V. Novikov 1, S. S. Fanchenko2, A. Schley1, M.Tolkiehn1, G. Materlik3
Hamburger Synchrotronstrahlungslabor HASYLAB am Deutschen Elektronen-Synchrotron
DESY, D-22607 Hamburg, Germany
2
Institute of Information Technologies, RRC Kurchatov Institute, Kurchatov square 1,
Moscow 123182, Russia
3
Diamond Light Source Limited, Rutherford Appleton Laboratory, Chilton, Didcot,
Oxfordshire OX11 0QX, United Kingdom
Atom-resolving x-ray holography is a recently developed method for direct imaging of
local three-dimensional structures at the atomic level. We investigate analytically and
numerically additional effects arising from the long-range order in an object. It is shown that
they are not correctly taken into account by existing image reconstruction procedures used
commonly in the analysis of experimental data. We prove that low-pass filtering may lead to
strong artefacts and cannot be used for extracting information about the short-range order in
crystalline samples. Possible ways for solving the problem are discussed.
27
Poster Abstracts
Measurements of Spatial Coherence of X-ray Laser
from Recombining Al Plasma
Yuuji Okamoto, Naohiro Yamaguchi, Hideki Yamaguchi, and Tamio Hara
Toyota Technological Institute, 2-12-1 Hisakata, Tempaku, Nagoya 468-8511, Japan
Tabletop x-ray lasers which operate at wavelengths shorter than 20 nm are promising
tools for many important applications such as x-ray photoelectron spectroscopy, x-ray
microscopy, x-ray holography and x-ray lithography. The x-ray lasers are characterized by its
high brightness, high coherence and monochromatic radiation. Especially, the degree of
coherence of radiation plays a critical role in many of novel applications.
We measured the spatial coherence of the soft x-ray laser from the recombining Al
plasma under various x-ray amplification configurations for the first time. A theoretical
calculation model which was based on two-beam interference with partially coherent and
quasimonochromatic light was developed to analyze the observed fringe patterns. The x-ray
source was assumed to have a Gaussian intensity distribution, and a deviation of x-ray source
from the optical axis of the Young’s interference experiment was introduced. Then we can
reproduce a fringe pattern, numerically which fits to an observed fringe pattern, though it has
an asymmetric pattern. In the experiments, the fringe pattern representing the interference
from the pair of Young’s slits has been observed for the Al XI 3d-4f line (15.47 nm), while
there has not been observed the fringe visibility for the other non-lasing lines. It is clarified
that spatial coherence of the Al XI 3d-4f line is developed in accordance with its
amplification.
Avoidance and Removal of Phase Vortices in Reconstruction of Noisy
Coherent X-ray Diffraction Patterns
Mark Pfeifer, University of Illinois at Urbana-Champaign
Phasing the oversampled X-ray diffraction from a coherently illuminated crystal
provides sufficient information to reconstruct the density function of the diffracting crystal.
This phasing, which is accomplished through use of an error reduction or hybrid input-output
algorithm, can result in non-physical phase vortices in the reciprocal space reconstruction if
the noise level of the data is too high. These vortices can cause significant error in the
reconstructed image and are very difficult to remove since they are global defects in the
phase- two vortices of opposite chirality must annihilate each other to be removed. While
acquiring data with low levels of noise is preferable, it is sometimes not possible in
experiments with time dependence or very small particles. Patching the amplitude and phase
around vortices with random values can sometimes remove them from two-dimensional
patterns, but this procedure is not feasible in three dimensions. Attempts are being made to
avoid vortices or drive them by selection of starting conditions or modification of the input
data.
28
Poster Abstracts
Pushing the Limits of Coherent X-Ray Diffraction: Imaging Single SubMicrometer Silver Nanocubes
F. Pfeiffera, Yugang Sunb, Younan Xiab, and I.K. Robinsonc
Swiss Light Source, Paul Scherrer Institut, CH-5232 Villigen PSI, Switzerland.
b
Department of Chemistry, University of Washington, Seattle, WA 98195-1700, USA.
c
Department of Physics, University of Illinois, Urbana, Illinois, 61801, USA.
a
X-ray crystallography has been proven to be an extremely efficient investigation
method to solve the structure of matter at the atomic scale. Although several methods have
been employed to circumvent the intrinsic phase problem, other limitations do exist for
classical x-ray crystallographic methods.
In particular, disordered materials, single
nanostructures, or noncrystalline and/or nonrepetitive biological structures (e.g. some
important viruses or proteins) cannot be accessed by this approach.
As first considered by Sayre et al. [1], a combination of coherent x-ray diffraction
with a so-called oversampling phasing method can overcome these limitations. In a first
demonstration experiment, Miao et al. used that method to invert the soft x-ray forwardscattering pattern measured from a fabricated object [2]. More recently, the reconstruction of
2D and 3D crystalline and non-crystalline (!) structures has been reported [3, 4]. Particularly
the latest results from Williams et al. [5], where the complete 3D phase and shape information
of a micrometer-sized gold crystal could be retrieved, impressively demonstrate the high
potential of this nondestructive method. With the work presented in this poster we
particularly focus on the feasibility of pushing the limits of imaging small crystals by using
coherent x-ray diffraction into the nanometer range.
As demonstration samples we have used chemically synthesized, single crystalline
silver nanocubes with an average typical size of 175 nm [6]. The coherent x-ray diffraction
experiments have been carried out at the ID34/UNICAT beamline at the Advanced Photon
Source (Argonne) using monochromatic x-rays with an energy of 8.5 keV.
In order to have both sufficient flux and the opportunity to select single nanocrystals a
Kirk Patrick-Baez (KB) mirror system has been used to focus the x-ray beam to typically 1.0
x 1.5 m 2 at the position of the sample. The diffraction data was recorded using a CCD
placed at a position corresponding to the 111 Bragg reflection of the silver crystal lattice.
The following major conclusions could be drawn from the experimental results:
Firstly and most importantly, the high-resolution reciprocal diffraction patterns clearly
demonstrate the feasibility of carrying out such measurements on single nanocrystals with a
size in the nanometer range. Depending on the orientation of the individual nanocrystals the
measured diffraction patterns showed a nice three- and fourfold symmetry and up to typically
5-10 high contrast interference fringes in directions corresponding to the facets of the cubic
structure. Furthermore we have not found any negative effects on the trasverse coherence by
using the experimentally crucially important KB focusing optics. Finally, the obtained results
agree well with model calculations based on a simple Fourier transform of two-dimensionally
projected single silver nanocube.
Encouraged by this successful first demonstration experiment of coherent x-ray
diffraction on sub-micrometer single crystalline nano-objects we are currently working on the
direct reconstruction of a full 3D diffraction data by using the oversampling phasing method.
29
Poster Abstracts
[1]
[2]
[3]
[4]
[5]
[6]
D. SAYRE, Imaging Processes and Coherence in Physics, Springer Lecture Notes in Physics Vol. 112,
229 (1980).
J. MIAO, P. CHARALAMBOUS, J. KIRZ, and D. SAYRE, Extending the Methodology of X-ray
Crystallography to allow Imaging of Micrometer-sized Non-crystalline Specimens, Nature 4000, 342
(1999).
J. MIAO, T. ISHIKAWA, B. JOHNSON, E.H. ANDERSON, B. LAI, and K.O. HODGSON, High
Resolution 3D X-ray Diffraction Microscopy, Phys. Rev. Lett. 89 (2002).
I.K. ROBINSON, I.A. VARTANYANTS, G.J. WILLIAMS, M.A. PFEIFER, and J.A. PITNEY,
Reconstruction of the Shapes of Gold Nanocrystals using Coherent X-ray Diffraction, Phys. Rec. Lett. 87,
19 (2001).
G.J. WILLIAMS, M.A. PFEIFER, I.A. VARTANYANTS, and I.K. ROBINSON, Three-dimensional
Imaging of Microstructure in Gold Nanocrystals, Phys. Rev. Lett. 90, 17 (2003).
YUGANG SUN and YOUNAN XIA, Shape-Controlled Synthesis of Gold and Silver Nanoparticles,
Science 298, 2176 (2002).
Coherent Soft X-ray Branchline at the Advanced Light Source
Kristine Rosfjord1,2, Charles Kemp1, Paul Denham1, Eric Gullikson1, Phillip Batson1,
Senajith Rekawa1, David Attwood1,2
1
Center for X-ray Optics, Lawrence Berkeley National Laboratory, Berkeley, CA 94720
2
Electrical Engineering & Computer Science Department, UC Berkeley, Berkeley, CA 94720
A new coherent soft X-ray branchline at the advanced light source has begun
operation. Using the third harmonic from an 8cm period undulator, this branch delivers
coherent soft x-rays ranging from 200eV to 1000eV. There are two sub-branches, one with
8x demagnification and optimized for 800eV and the other with 14x demagnification and
optimized for 500eV. The monochromator consists of a variable-line-spacing grating and an
exit slit, enabling a bandwidth of 0.1%. Soft X-rays have been propagated through the exit
slit of the monochromator, matching spectral features of nitrogen (410eV) and titanium
(454eV). We are currently working to characterize the spatial coherence properties of this
radiation. We have shown single pinhole Airy patterns, and by the time of the workshop we
expect to have performed two-pinhole interference measurements of the transverse coherence
length.
Near-diffraction limited coherent X-ray focusing using planar refractive
lenses made in epoxy resist SU8.
I. Snigireva*, A. Snigirev*, V. Nazmov**, E. Reznikova**, M. Drakopoulos*, J.Mohr**,
V.Saile**, V. Kohn***
* ESRF, BP-220, 38043 Grenoble Cedex, France
** Institut für Mikrostrukturtechnik, FZK, 76021 Karlsruhe, Germany
*** Russian Research Centre “Kurachatov Institute“, 123182 Moscow, Russia.
We present results on optical properties of high resolution planar refractive lenses
studied with hard X-ray coherent radiation. Large aperture (up to 1mm) and high aspect ratio
planar parabolic lenses were manufactured in epoxy type SU8 resist using deep synchrotron
lithography. Resolution of about 250 nm was measured for the Su8 lens consisting of 62
30
Poster Abstracts
individual lenses at 14 keV in a distance of 58 m from the source. In-line holography of Bfibber was realized in imaging and projection mode with a magnification of 3 and 20
respectively. Submicron features of the fiber were clearly resolved. Coherent properties of the
set-up allow to resolve near-focus fine structure in scanning and imaging mode with lens
defocusing. This fine structure is determined by the tiny aberrations caused by lens
imperfections close to the parabola apex.
Quantum-Deceleration Self-Modulation of High Energy Electron Beam
and the Problem of Optimization of Coherent Photon Collider
Vladimir I. Vysotskii, Mickle V. Vysotskii
Kiev Shevchenko University, Radiophysical Faculty, 01033, Kiev, Ukraine
The problems of creation of a sources of coherent hard radiation and high energy photon
colliders optimization were studied. It is well known that low efficiency of gamma-gamma
colliders is the result of very low cross-section of laser quanta scattering on relativistic
electrons. The method of controlled non-threshold quantum-deceleration self-modulation of
high energy electron beam in space (space period of self-modulation equals ) and time
(frequency of modulation equals  = 2v/) with effectiveness about 1 for photon-electron
scattering is discussed. The result of colliding resonant interaction of this modulated electron
beam and optical laser beam with intensity J0, wave-length  and frequency 0 is generation
of intensive gamma-beam with frequency of gamma-radiation =420 and intensity J=KJ0.
The method of self-modulation of electron beam is the following. The total wave function of
each electron of the nonmodulated beam after passing of this beam through thin periodical
diaphragm with thickness L0 and period D0+D1 (see fig.) has the form of coherent
superposition
( r, z>L0,t)=0(r, z, t) + 1(r, z,t) = 0(r) exp[-i2(E0t-p0z)/]+1(r)exp[-i2(E1tp1z)/].
Here 0(r,z,t) is the wave function of an
electron which has passed through one of
E ,p
L
E ,p
microholes (with size D0) in diaphragm;
Electron beam
Gamma-beam
(E , p )
( /4 )
1(r,z,t) is the wave function of an electron
which has passed through one of the absorptive
D
parts (size D1) of this diaphragm and has
D
Laser beam
Thin periodical L

L
( )
reduced
energy
E1=E0-E(L0).
Here
diaphragm
c
c
E(L0)=E0L0/L rad; L rad<< Lrad is a coherent
radiation length of diaphragm crystal; E1=E0-E(L0) and p1=p0-p(L0) are longitudinal energy
and impulse of each electron in the state 1; E0=mc2, p0=mv; p(L0) = p0 - {[E0-E(L0)]2 m2c4}1/2/c  E(L0)/c(2-1)1/2.
The phenomenon of non-threshold quantum-deceleration self-modulation of electron beam
takes place in the region of mutual coherence Liz Lcoh of electron eigenfunctions 0,1((r,
z,t).
Here Li  (D0+D1)/d = 2mv(D0+D1)2/; Lcoh  2Q = Q.
1
1
0
0
0
2
0
0
0
1
0
i
coh
0
31
Poster Abstracts
For this region the electron concentration and current density of electron beam have the
forms of relativistic electron quasicrystal and n(z,t)=|0(r,z,t)+1(r,z,t)|2;
jz(r,z,t)=(ie/4m){d*/dz-*d/dz}=j0{1+gexp[i(t-kz)]+g*exp[-i(t-kz)]}.
Here j0= (ep0/2m)[|0|2+|1|2]; g =10*/(|0|2+|1|2),  = 2E(L0)/,
k=2-1=2p(L0)/, Q=E0/[<(E0)2>+<(E1)2>]1/2 is the quality of the electron beam,
Ei is a fluctuation of energy Ei.
For the optimal case of symmetric diaphragm (D1=D0, <|0(r)|2>r=<|1(r)|2>r) we have
the phenomenon of total electron beam self-modulation and formation of “running electron
periodical lattice” n(z,t) = n0{1+cos (t - kz)}; jz(z,t) = j0{1+cos (t - kz)}; n0  |(z=0)|2.
For realization of a requirement of a Bragg interaction (Bragg diffraction) of laser beam with
wave lengh 0=42=42/p(L0) and this electron beam with period of modulation  the
condition of Bragg diffraction L0=4Lñrad/0mc in back direction = is necessary. For the
case of periodical diaphragm made of zeolite-like crystal (Lcrad<<1 cm, D0D120 A) and at
laser wave-length 0=1m we need L010-5 Lcrad  cm. The total cross-section  of diffraction
of laser beam on this modulated beam and the total coefficient K of reflection (coefficient of
diffraction) of laser beam with cross-section S equal K=/S,
max=(d/do)do=2(e2/mc2)2n02S(Lcoh-Li)22S(e22n0Q/mc2)2.
For the laser beam with total cross-section S=10-4 cm2 and wave-lengh 0=1m and for the
case of relativistic electron beam with electron density n0=1014 cm-3 and quality Q=104 we
have Lcoh   cm, Li10-3  cm, max10-5 S and Kmax=10-5 that by many order of magnitude
more that in the case of usual non Bragg-like gamma-gamma colliders.
Coherent hard x-ray scattering experiments at large diffraction angles
F. Yakhoua, F. Livetb, M. de Boissieub, F. Bleyb
a
ESRF, BP 220 F-38043 Grenoble, FRANCE
b
LTPCM-ENSEEG,BP 75 F-38402 St Martin d’Hères, FRANCE
In the promising framework of coherent x-ray scattering, the use of hard x-rays of
energy in the few keV range has not been developed as far as its soft x-rays counterpart, in
particular at large diffraction angles. The increased difficulty compared to soft x-rays and
small angle scattering arises mainly from a smaller coherence volume at higher energies and a
rapid smearing of the contrast at large diffraction angle because of an optical path length
difference that increases beyond the longitudinal coherence length.
A special setup was developed on the ID20 Magnetic Scattering beamline at ESRF to
perform coherent scattering experiments at large diffraction angles up to 75° in Special
care was taken to lessen the number of windows in the x-ray path. A secondary source was
defined by means of a set of slits placed 3 meters away from the collimating pinhole. The size
of the source was adjusted so that the transverse coherence length would match the size of the
pinhole. A monochromatic undulator beam from a double Si111 monochromator was used
and a total coherent flux of 3109 ph/s at 190 mA ring current through a 10 m pinhole was
obtained at 8 keV.
32
Poster Abstracts
Promising examples will be given of the study of speckle patterns from
antiferromagnetic domains in UAs [1], manganite charge and orbitally ordered domains [2]
and phasons in quasicrystals.
[1] F.Yakhou, A. Létoublon, F. Livet, M. de Boissieu and F. Bley, Journal of Magnetism and
Magnetic Materials 233 (2001) 119-122
[2] C.S. Nelson, J. P. Hill, D. Gibbs, F. Yakhou, F. Livet, Y. Tomioka, T. Kimura and Y.
Tokura, Physical Review B 66 (2002) 134412
Multilayer X-Ray Optics: Progress in Coherence Preservation
E. Ziegler, T. Bigault, P. Cloetens, C. Morawe
European Synchrotron Radiation Facility, B.P. 220, F-38043 Grenoble Cedex, France
C. David
Laboratory for Micro- and Nanotechnology, Paul Scherrer Institut, CH-5232 Villigen-PSI,
Switzerland
The recent development of experiments taking advantage of the partial coherence of
the x-ray beams produced by high-brilliance low-emittance x-ray sources has naturally
stimulated the development of new optics. For techniques based on phase contrast imaging,
severe requirements on the wavefront distortion are indeed necessary for being able to retrieve
information on the sample under study. In the case of tomography, it was shown1 that, a
multilayer with an energy resolution one to two order of magnitude that of a perfect crystal
would make an ideal optics, providing it could conserve the homogeneity and the coherence
of the beam.
In this presentation we report on our effort to improve the quality of multilayer mirrors
in terms of coherence preservation. The quality of the mirror substrate turned out to be the key
factor since multilayer coatings would generally mimic the substrate surface. In principle, the
mirror surface slope errors should be smaller than /2,  representing the angular source
rror technology is constantly challenged by the advent of
better sources. For a substrate with a given shape error the phase distortion of the wavefront
increases with the beam incidence angle. This was demonstrated by imaging a series of
multilayer coatings (W/B4C, Ru/B4C) with different d-spacing made on substrates of same
quality. Recent results on a 300-mm long silicon mirror coated with a 4nm (Ru/B4C)80
multilayer are also presented. The slope error was measured to be around 0.2 µrad. The
quality of the bare substrate and of the multilayer-coated substrate was assessed by a number
of means, including the Talbot imaging and hard x-ray shearing interferometry2 techniques.
1. See P. Cloetens, Session 5 of this workshop.
2. See C. David, Session 6 of this workshop.
33
Attendees List
34
As of 8/20/03 - Total of 1223 = 119
Adams, Bernhard
APS / ANL
Argonne, IL 60439
Email: [email protected]
Email: [email protected]
Phone: 631-632-8056
Fax: 253-541-9489
Amemiya, Yoshiyuki
Univ of Tokyo
Advanced Materials Science
5-1-5 Kashiwanoha
Kashiwa, Chiba, Japan 277-8561
Email: [email protected]
Phone: 81 4 7136 3750
Fax: 81 4 7136 3750
Beckmann, Felix
GUSS
Institute for Materials Research
C/O DESY
Notkestr. 85
Hamburg, Germany 22607
Email: [email protected]
Phone: ++49 40 8998 4535
Fax: ++49 40 8998 2787
Arfelli, Fulvia
University of Trieste
Dept. of Physics
Via Valerio 2
Trieste, Italy 34100
Email: [email protected]
Ph:
39 040 3758688
Fax: 39 040 3758776
Bilderback, Donald
Cornell University
CHESS
281 Wilson Lab
Ithaca, NY 14853
Email: [email protected]
Phone: 607 255 0916
Fax: 607 255 9001
Arthur, John
SSRL/SLAC
2575 Sand Hill Rd.
Menlo Park, CA 94025
Phone: 650 926 3169
Fax: 650 926 4100
email: [email protected]
Bizzell, Virginia
CHESS
Wilson Lab
Email: [email protected]
Borthwick, Matthew
MIT
77 Mass Ave, Rm 13-2925
Cambridge, MA 02139
Email: [email protected]
Ph:
617 253 8928
Bazarov, Ivan
Cornell University
Wilson Lab
Ithaca, NY 14853
Email: [email protected]
Phone: 607 254 8933
Chesnel, Karine
LBNL
ALS
1 Cyclotron Road, MS 7R0100
Berkeley, CA 94709
Email: [email protected]
Phone: 510 495 2830
Fax: 510 486 2830
Becker, Michael
Brookhaven National Lab
Biology
Bldg. 463, PO Box 5000
Upton, NY 11973
Email: [email protected]
Phone: 631 344 4739
FAX: 631 344 3407
Cinque, Gianfelice
INFN-Laboratori di Frascati
Lab DAFNE-Light
Via E. Fermi 40
Frascati (Roma) ITALY
Email: [email protected]
Phone: 39 06 9403 2282/2218
Fax: 39 06 9403 2597
Beetz , Tobias
Stony Brook University
Physics & Astronomy
Dept. of Physics
Stony Brook, NY 11794-3800
35
Hamburg, Germany 22607
Email: [email protected]
Phone: ++49 40 8998 4528
Fax: ++49 40 8998 2787
Cloetens, Peter
ESRF
BP220
Grenoble, FRANCE 38063
Email: [email protected]
Phone: 33 4 76 88 25 50
Fax: 33 4 76 88 22 52
Drakopoulos, Michael
ESRF
Micro-Fluorescence-Imaging-Diffraction
Group
BP 220
F-38043 Grenoble Cedex FRANCE
Email: [email protected]
Ph: 33 4 7688 2127
Fax: 33 3 7688 2785
Dadamukhamedov, Turgun
Tashkent State Automobile & Road Institute
Physics
Tashkent Sebzar House 30, Apt. 36
Tashkent 700019 Uzbekistan
Phone: 998712 405775
Dufresne, Eric
University of Michigan
Physics Dept.
MHATT-CAT.
APS, Sec 7, ANL Bldg 432D
9700 S Cass Ave
Argonne, IL 60439
Email: [email protected]
Phone: 630 252 0274
Fax: 630 252 0279
Dale, Darren
Department of Applied Engineering Physics
Cornell University
Ithaca, NY 14853
Email: [email protected]
David, Christian
Paul Scherrer Institute
Lab for Micro & Nanotechnolgy
Villigen Switzerland CH-5232
Email: [email protected]
Phone: 91-56 310 3753
Fax: 91 56 310 2646
Evans-Lutterodt, Kenneth
Brookhaven National Lab
Building 725D, Rm –162
Upton, NY 11973
Email: [email protected]
Phone: 631 344 2095
Fax: 631 344 3238
Dierker, Steven
Brookhaven National Lab
NSLS
PO Box 5000
Bldg., 725B
Upton, NY 11973
Email: [email protected]
Phone: 631 344 4966
Fax: 631 344 5842
Falus, Peter
NIT – Physics
Yale University – SPL 29
217 Prospect St.
New Haven, CT
Email: [email protected]
Phone 203 432 4086
Fax: 203 432 9710
Di Fabrizio, Enzo
National Institute for the Physics of Matter
TASC Laboratory
S.S. 14 km 163,5 – Basovi22A
Trieste, Italy 34012
Email: [email protected]
Phone: 39 040 375 8417
FAX: 39 040 226767
Fan, Lixin
Argonne National Lab
APS
9700 S. Cass Ave
Argonne, IL 60439
Email: [email protected]
Phone: 630 252 1628
Fax: 630 252 9303
Donath, Tilman
GUSS
Institute for Materials Research
C/O DESY
Notkestr. 85
Feng, Renfei
Alberta Synchrotron Institute
36
X-ray
University of Alberta
Research Transition Facility
8308-114 St., Suite 2080
Edmonton, AB, Canada T6G 2E1
Email: [email protected]
Phone: 780 492 5464
Fax: 780 492 6160
Hau-Riege, Stefan
LLNL
Physics and Applied Technical
PO Box 808, L-395
Livermore, CA 94539
Email: [email protected]
Phone: 925 422 5892
Fax: 925 422 8761
Finkelstein, Kenneth
Cornell University
CHESS, 285 Wilson Lab
Ithaca, NY 14853
Email: [email protected]
Phone: 607 255 0914
Fax: 607 255 9001
He, Haifeng
LBNL
Advanced Light Source
1 Cyclotron Road, MS 7-222
Berkeley, CA 94720
Email: [email protected]
Phone: 510 495 2270
FAX: 510 486 7588
Fontes, Ernest
CHESS
Cornell University
Ithaca, NY 14853
Email: [email protected]
Hermes, Christoph
EMBL
Notkestr. 85
Hamburg, Germany D-22067
Email: [email protected]
Phone: +49 40 8990 2117
Fax: +49 40 8990 2149
Goedkoop, Jeroen
University of Amsterdam
Van der Waals Zeeman Institute
Vsalckenierstraat 65
Amsterdam, The Netherlands HL1018 XI
Email: [email protected]
Phone: 31 20 525 6362
Fax: 31 20 525 5102
Hirano, Keiichi
KEK
Photon Factory
1-1, Oho
Tsukuba, Ibaraki
305-0801 JAPAN
Email: [email protected]
Phone: +81 29 864 5649
Fax: +81 29 864 2801
Gruebel, Gerhard
ESRF
Experiments Division
Avenue Jules Horowitz, BP220
Grenoble, France 38043
Email: [email protected]
Phone: 04 76 88 23 57
Fax: 04 76 88 2160
Hirano, Musatsugu
Osaka Univ Grad School of Medicine
Interdisciplinary Image Analysis
D11.2.2 Yamadaoka
Suita, Osaka, Japan 565 0871
Email: [email protected]
Phone: 81 6 6879 3564
Fax: 81 6 6879 3569
Gruner, Sol
Cornell University
Physics – 162 Clark Hall
Ithaca, NY 14853
Email: [email protected]
Phone: 607 255 3441
Fax: 607 255 8751
Hornberger, Benjamin
Stony Brook University
Dept. Physics & Astronomy
Stony Brook, NY 11794-3800
Email: [email protected]
Phone: 631-632-8056
Fax: 419-828-8145
Hastings, Jerome
SSRL/SLAC
Email: [email protected]
Phone: 650 926 3107
Fax: 650 926 4100
37
Howells, Malcolm
LBNL
ALS MS2-400
1 Cyclotron Road
Berkeley, CA 94720
Email: [email protected]
Ph: 510 486 4949
Stony Brook University
Dept. of Physics & Astronomy
Stony Brook, NY 11794-3800
Email: [email protected]
Ph:
631 821 0360
Kaznatcheeva, Konstantine
Canadian Light Source
101 Perimeter Road
Saskatoon, Canada 57N0X4
Email: [email protected]
Phone: 306 657 3546
Fax: 306 657 3535
Hu, Zhengwei
Marshall Space Flight Center (MSFC)
BAE – Biological and Physical Space Research
SD-46, NASA
Huntsville, AL 35812
Email: [email protected]
Phone: 256 544 3805
Fax: 256 544 2102
Kazimirov, Alexander
Cornell University
CHESS
277 Wilson Lab.
Ithaca, NY 14853
Email: [email protected]
Phone: 607 255 2538
Fax: 607 255 9001
Huang, Yu-Shan
National Synchrotron Radiation Research Ctr
101 Hsin-Ann Road
Science Based Industrial Park
Hsinchu, Taiwan 300
Email: [email protected]
Phone: 886 3 5780281 X7320
Fax: 886 3 5783813
Kincaid, Brian
Advanced Light Source
915 Cole Street #378
San Francisco, CA 94117
Email: BMK
Phone: 415 355 0330
Fax: 415 355 1755
Ilinski, Petr P
Argonne National Lab
APS
9700 S Cass Ave
Argonne, IL
60439
Email: [email protected]
Phone: 630 252 0145
Fax: 630 252 0161
Kirz, Janos
Stony Brook University
Physics & Astronomy
Dept. of Physics
Stony Brook, NY 11794-3800
Email: [email protected]
Phone: 631-632-8181
Ishikawa, Tetsuya
Spring-8/Riken
Coherent X-Ray Optics Laboratory
Kouto 1-1-1
Mikazuki, Hyogo, 679 5148 Japan
Email: [email protected]
Phone: 81 791 58 2805
Fax: 81 791 58 2807
Kitamura, Hideo
Spring-8/RIKEN
Harima Institute
Kouto, Mikazuki
Sayo, Hyogo, Japan 679-5148
Email: [email protected]
Phone: 791 58 2809
Fax: 791 58 2810
Ito, Kazuki
Stanford University
SSRL/SLAC, Building 274 MS99
2575 Sand Hill Road
Menlo Park, CA 94035
Email: [email protected]
Phone: 650 926 4078
Fax: 650 926 2258
Kleineberg, Ulf
University of Bielebeld
Faculty of Physics
Universitactsstr.25
Bielefeld, Germany
Email: [email protected]
Jacobsen, Chris
38
Phone: 49 521 106 5456
Fax: 49 521 106 6001
Email: [email protected]
Ph:
33476882452
Fax: 33476882624
Koyama, Ichiro
University of Tokyo
Graduate School of Frontier Science
Dept. of Advanced Materials
7-3-1. Hango Bunkyo-kn
Tokyo 113-003 Japan
Email: [email protected]
Ph:
81 3 5841 6842
Fax: 81 3 5841 6803
Li, Gang
Institute of High Energy Physics
Chinese Academy of Science P.R. China
Beijing Synchrotron Radiation Facility
No. 19 Yuquan Rd.
PO Box 918 2-7
Beijing, P.R. CHINA 100039
Email: [email protected]
Phone: 86 10 882335993
Fax: 88 10 68186229
Krasnicki, Felix (Szcsesny)
Argonne National Lab
Experimental Facilities Division
9700 S. Cass Ave., Bldg. 401
Argonne,IL 60439
Email: [email protected]
Phone: 630 252 9186
Fax: 630 252 9303
Liang, Keng
National Synchrotron Radiation Research Ctr
101 Hsin-an Road
Science Based Industrial Park
Hsinchu, Taiwan 300
Email: [email protected]
Phone 886 3 5780281 ext 2203
Fax: 886 3 5783813
Laundy, David
Daresbury Lab
S.R.
Keckwick Lane
Warrington, Cheshire, U.K. WA6 7LZ
Email: [email protected]
Phone: 44 1925 603238
Fax: 44 1925 603124
Lin, Binhua
University of Chicago
James Frank Inst & CARS
5640 S. Ellis Ave.
Chicago, IL 60637
Email: [email protected]
Ph:
630 252 0463
Fax: 630 252 0460
Lengeler, Bruno
RWTH Aachen University
Physics
Huyskensweg Turm 28
Aachen, NRW, Germany
Email: [email protected]
Tel: 49 241 80 17075
Fax: 49 242 80 22306
Lindau, Ingolf
Stanford University
SSRL/SLAC, MS 69
2575 Sand Hill kRoad
Menlo Park, CA 94025
Email: [email protected]
Phone: 650 926 3456
FAX: 650 926 4100
Lerotic, Mirna
Stony Brook University
Dept. of Physics & Astronomy
SUNY Stony Brook
Stony Brook, NY 11734-3800
Email: [email protected]
Phone: 631 632 8097
Fax: 631 632 8101
Lowney, Donnacha
LBL
Experimental Systems Group
1 Cyclotron Rd.
Berkeley, CA 04702
Email: [email protected]
PH:
510 495 2760
Leupold, Olaf
ESRF
Experiments Division
6 rue Jules Horowitz
Grenoble, France F-38043
Luning, Jan
Stanford University
SSRL
2575 Sand Hill Road,. Mailstop 69
39
Menlo Park, CA 94025
Email: [email protected]
Phone: 650 926 4539
Fax: 650 926 4100
Fax: 0039 040 9380905
Miao, John
SSRL/SLAC
2575 Sand Hill Road, MS 69
Menlo Park, CA 94025
Email: [email protected]
Phone: 650 926 5168
Fax: 650 926 4100
Luning, Katharina
Stanford University
SSRL
2575 Sand Hill Road., MS 69
Menlo Park, CA 94025
Email: [email protected]
Phone: 650 926 2098
Fax: 650 926 4100
Nefedov, Alexei
Ruhr University Biochemistry
Institute of Experimental Physics
University Str 150
Bochum Germany D-44780
Email: [email protected]
Phone: 49 234 322 3620
Fax: 49 234 321 4173
Macrander, Albert
Argonne National Lab
APS – Experimental Facilities Division
9700 S. Cass Ave, Bldg 401
Argonne, IL 60439
Email: [email protected]
Phone: 630 252 5672
Fax: 630 252 9303
Nelson, Art
Lawrence Livermore Nat Lab
7000 East Avenue – L-350
Livermore, CA 94550
Email: [email protected]
Phone: 925 422 6488
Matsushita, Tadashi
Institute of Materials Structure Science
Photon Factory
1-1 oho
Tsukuba, Ibaraki, Japan 305 0801
Email: [email protected]
Phone: 81 29 879 6020
Fax: 81 29 864-3202
Niebuhr, Marc
EMBL
Hamburg Outstation
C/O DESY
Notkestrasse 85
Hamburg, Germany 22603
Email: [email protected]
Phone: +49 40 8990 2171
Fax: +49 40 8990 2149
Matyi, Richard
Nat’l Inst of Standards & Technolgy
Physics Lab
100 Bureau Drive, Stop 8422
Gaithersburg, MD 20899
Email: [email protected]
Ph:
301 975 4272
Fax: 301 975 3038
Nishino, Yoshinori
Spring –8 Riken
1-1-1 Kouto
Mikazuki, Sayo, Hyngo, Japan 679-5148
Email: [email protected]
Phone: 81-791-58-0802, ext 3406
Fax: 81-791-58-2807
McNulty, Ian
Argonne National Lab
APS
Building 401, 9700 S. Cass Ave
Argonne, IL 60437
Phone: 630 252 2882
Fax: 630 252 9303
Email: [email protected]
Novikov, Dmitri
DESY
HASYLAB
Notkostr.85
Hamburg, Germany D-22607
Email: [email protected]
Phone: 49 40 8998 3124
Fax: 49 40 8998 2487
Menk, Ralf
Sincrotrone Trieste
S.S. 14 KM 163.5
Trieste, Italia 34012
40
Nugent, Keith
Univ of Melbourne
Melbourne, Australia
Email: [email protected]
Email: [email protected]
Phone: 217 333 6322
Fax: 217 244 2278
Pfeiffer, Franz
Paul Sherrer Institute
Swiss Light Source
WPGA 12, CH-5232 Villigen PSI
Switzerland
Email: [email protected]
Phone: 41 56 310 5262
Fax: 41 56 310 3171
Oka, Toshihiko
Spring-8/JASRI
Life & Environmental Science Division
1-1-1 Kouto, Mikazuki
Sayo, Hyogo Japan 679-5198
Email: [email protected]
Phone: 81 791 58 0833
Fax: 81 791 58 2512
Quinn, Frances
Daresbury Lab.
Synchrotron Radiation Dept.
Keckwick Lane
Warrington, Cheshire, UK WA4 4AD
Email: [email protected]
Phone: 44 1925 603589
Fax: 44 1925 603124
Okamoto, Yuuji
Toyota Technological Institute
X-ray Laser-Plasma Engineering Lab.
Hisakata 2-12-1, Tempaku
Email: [email protected]
Phone: +81 52 809 1837
Fax: +81 52 809 1837
Nagoya, Aichi Japan 468-0034
Rah, Seuna Yu
Postech
Pohang Accelerator Laboratory
Hyoja-dong San 31 Nanaku
Pohang, Kyung buk, Korea
Email. [email protected]
Ph:
82 54 279 1533
Fax: 82 54 278 1599
Padmore, Howard
LBNL
ALS
MS 2-400 LBL
Berkeley, CA 94720
Email: [email protected]
Phone: 510 486 5787
Fax: 510 486 7696
Revesz, Peter
Cornell University
CHESS
Wilson Lab.
Ithaca, NY 14853
Email: [email protected]
Phone: 607 255 0915
Fax: 607 255 9001
Paterson, David
APS
ANL
Experimental Facilities Division
9700 South Cass Avenue
Argonne, IL 60439
Email: [email protected]
Phone: 630 252 8005
Fax: 630 252 0161
Robinson, Ian
University of Illinois
1110 West Green
Urbana, IL 61801
Email: [email protected]
Peele, Andrew
University of Melbourne
School of Physics
Parkville, Victoria Australia 3010
Email: [email protected]
Phone: 613 8344 5458
Fax: 613 9347 4783
Rosfjord, Kristine
UC Berkeley
Electrical Engineering & Computer Science
1 Cyclotron Rd., MS 2-400
Lawrence Berkeley Lab
Berkeley, CA 94720
Email: [email protected]
Phone: 510 486 4079
Pfeifer, Mark
U of Illinois at Urbana-Champaign
Physics – MC704
Urbana, IL 61801
41
Fax:
510 486 4550
2575 Sand Hill Road
Menlo Park, CA 94025
Email: [email protected]
Phone: 650 926 5103
FAX: 650 926 2258
Sayre, David
State University of New York
Physics & Astronomy
Stony Brook, NY 11794
Email: [email protected]
Phone: 908 595 6854
Snigirev, Anatoly
(withdrew)
ESRF
Experiments
6 Ave Jules Horowitz
BP 220
Grenoble, FRANCE 38043
Email: [email protected]
Phone: 33 4 76 88 26 27
FAX: 22 4 76 88 25 42
Schlotter, William
Stanford Linear Accelerator Center
SLAC
2675 Sand Hill Road MS69
Menlo Park, CA 94025
Email: [email protected]
Ph:
650 926 2345
Fax: 650 926 4100
Snigireva, Irina
(withdrew)
ESRF
Experiments
6 Ave Jules Horowitz
BP 220
Grenoble, France 38043
Email: [email protected]
Phone: 33 4 76 88 23 60
Fax: 33 4 76 88 25 42
Shapiro, David
SUNY at Stony Brook
Physics & Astronomy
Nichols Road
Stony Brook, NY 11794-3800
Email: [email protected]
Ph:
631 632 8097
Fax: 631 632 8101
Sorensen, Larry
University of Washington
Physics Dept.
Box 351560
Seattle, WA 98195
Email: [email protected]
Ph:
206 543 0360
Fax: 206 525 6924
Shen, Qun
Cornell University
CHESS, Wilson Lab
Ithaca, NY 14853
Email: [email protected]
Phone: 607 255 0923
Fax: 607 255 9001
Shintake, Tsumoru
Riken/Spring8
RIKEN Harima Institute
1-1-1 Kouto
Hyogo, Japan 679-5143
Email: [email protected]
PH:
81 791 58 2929
Fax: 81 791 58 2810
Spence, John
Arizona State University
Physics Department
Tempe, AZ 85287-1504
Email: [email protected]
Phone: 480 965 6486
Sinha, Sunil
Univ of Calif San Diego
9500 Gilman Drive
LaJolla, CA 92093
Email: [email protected]
PH:
858 822 5637
Stewart, Andrew
Cornell University
CHESS
Wilson Lab
Ithaca, NY 14850, USA
Email: [email protected]
Phone: 607 255 9894
Fax: 607 255 9001
Smolsky, Igor
Stanford University
SLAC
Sutton, Mark
McGill University
Physics
42
3600 University St.
Montreal, QC, Canada H3A-2T8
Email: [email protected]
Phone: 514 398 6523
Fax: 514 398 8434
Sayo, Hyogo, Japan 679 5198
Email: [email protected]
Phone: 81 791 58 0833
FAX: 81 791 58 0830
Van der Veen, Friso
Paul Scherrer Institute
Synchrotron Radiation
WSLA/117
Villigen, Switzerland 5232
Email: [email protected]
Phone: 41 56 310 5118
Fax: 41 56 310 3151
Suzuki, Yoshio
Spring-8
Mikazuki, Hyogo, Japan 679 5198
Email: [email protected]
Phone: 81 791 58 0831
Fax: 81 791 58 0830
Takeuchi, Akihisa
JASRI/Spring-8
Life and Environment Division
Kouto 1-1-1, Mikaduki
Sayo, Hyogo, JAPAN 679-5198
Email: [email protected]
Phone: 81 791 58 0833
FAX: 81 791 58 0830
Vogt, Thomas
Brookhaven National Lab
Physics, Bldg. 510A
PO Box 5000
Upton, NY 11973-5000
Email: [email protected]
Phone: 631 344 3731
Fax: 631 344 2918
Tamasaku, Kenji
RIKEN
Coherent X-ray Optics Lab.
1-1-1 Kouto, Mikazuki-cho
Sayo-gun, Hyogo, Japan 670-5148
Email: [email protected]
Phone: 81 791 58 0802, ext 3821
FAX: 81 791 58 2907
Vysotskii, Mickle
Kiev Shevchenko University
Vladimirskaya St. 64,
Radio Physical Dept.
Kieve, Ukraine 01033
Email: [email protected]
Weckert, Edgar
DESY
HASYLAB
Notkestrasse 85
Hamburg, Germany D-22603
Email: [email protected]
Phone: +49 40 8998 4509
Fax: +49 40 8998 4475
Tang, Mau-Tsu
National Synchrotron Radiation Research
Center
Research Division
101 Hsin-an Road
Hsinchu, Taiwan 30077
Email: [email protected]
Phone: 886 03 5780281
Fax: 886 03 5783892
White, Jeffrey
Cornell University
CHESS – 181 Wilson Lab.
Ithaca, NY 14853
Email: [email protected]
Phone: 607 255 0913
Fax: 607 255 9001
Uaji, Yoshinori
University of Tokyo
Graduate School of Frontier Sciences
5-1-5 Kashiwanoha
Kashinon, Chiba, Japan 277 8561
Email: [email protected]
Phone: 81 4 7136 3751
Fax: 81 4 7136 3751
Wilkins, Steve
CSIRO, Mfg. & Infrastructure Technology
PB33 Clyaton Sth, Vic 3169 Australia
Email: [email protected]
Phone: 61 (0)3-9545-2918
Fax: 61 (0)3-9544-1128
Uesugi, Kentaro
JASRI/Spring-8
Life and Environment Div
Kouto 1-1-1, Mikaduki
43
Woll, Arthur
(withdrew)
Cornell University
CHESS – 200L Wilson Lab.
Ithaca, NY 14853
Email: [email protected]
Phone: 607 255 3617
Fax: 607 255 9001
Email: [email protected]
Phone: 81 791 58 2806
Fax: 81 791 58 2806
Youn, Hwa Shik
Postech
Pohang Light Source
31 San, Hyoja-dong
Pohang, Korea 79-784
Email: [email protected]
PH:
82 54 279 1532
Fax: 82 54 279 1599
Yabashi, Makina
Spring-8/JASRI
Beamline Division
Kouto 1-1-1, Mikazuki-cho
Sayo-gun, Hyogo, Japan 679 5198
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Phone: 81 791 58 0831
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Yun, Wenbing
Xradia, Inc.
4075 A Spring Drive
Concord, CA 94520
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Phone: 925 288 1818
Fax: 925 288 0310
Yakhou-Harris, Flora
ESRF
BP 220, 38043 Grenoble Cedex 9
France
Email: [email protected]
Phone: 33 476882491
Fax: 33 476992542
Zhong, Yuncheng
Argonne National Lab
APS
9700 S Cass Ave., Bldg. 401
Argonne, IL 60439
Email: [email protected]
Phone: 630 252 9748
Fax: 630 252 9303
Yamagucki, Naohiro
Toyota Technological Institute
2-1 2-1 Hisakata, Tempaku
Nagoya, Japan 468 8511
Email: [email protected]
Phone: 81 52 809 1836
Fax: 81 52 809 1837
Ziegler, Eric
ESRF
BP 220
Grenoble Cedex 38043
France
Email: [email protected]
Phone: 33 47688 2170
FAX: 33 47688 2957
Yamamoto, Masaki
Spring-8/RIKEN
Coherent X-ray Optics Laboratory
1-1-1 Kouto, Mikazuki
Sayo, Hyogo, Japan 679-5148
44