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Solid State Detectors- 3 T. Bowcock Schedule 1 2 3 4 5 6 Position Sensors Principles of Operation of Solid State Detectors Techniques for High Performance Operation Environmental Design Measurement of time New Detector Technologies 2 Techniques for High Performance Operation • Strip Detectors – Design and Fabrication Issues • What to avoid! 3 Review... • In the p-strip in n-bulk (“p-in-n”) Al -V detectors Si -+ • Vdep=100V • Energy to create electron hole pair is – 3.6eV ( not 1.1eV-why? ) • Average energy lost/mm – 39keV (108eh/ mm) 4 1.2 1 Drift 0.8 250V Irrad 0.6 250v Unirrad 60V Unirrad 0.4 0.2 97 89 81 73 65 57 49 41 33 25 9 17 1 0 • Electric field in Depleted region linear – 300mm detector – at 100V E=3.0keV/cm • Diffusion/Drift by multiple collisions • Takes 7ns for e’s, 20ns for holes x2 dN dx exp N 4 Dt D kT m q Higher diffusion at low temps! 5 Ballistic Deficit Charge lost is known as the ballistic deficit 1.2 1 0.8 250V Irrad 0.6 250v Unirrad 60V Unirrad 0.4 0.2 Collection time 97 89 81 73 65 57 49 41 33 25 17 9 1 0 6 Strip Pitch and Readout Pitch and resolution • Select it: d Single strip has d/12 d/10 7 Choosing the Pitch • Why not make it infinitely small – transverse diffusion • 10-20 microns – construction – readout electronics! • Readout pitch – not necessarily the same as diode pitch (cost$$$) 75mm readout (25mm diode) 8 Intermediate Strips • Work by capacitive coupling – induced current/charge is that seen by the electrons and holes (not a post-facto charge sharing!) • Why no broader strips ? – Interstrip capacitance <1pF Need field map! 9 Intermediate Strips? • Loose signal • An option if – limited by resources – little noise in electronics (slow e’s) • Optimal choice is – readout each strip • pitch and width evaluated by FEA – pitch between 20 microns and 100 microns 10 Performance Resolution 12 microns 10 50 mm with intermediate strip 8 Series1 6 Series2 4 25mm readout 2 0 0 10 20 30 Signal/noise 11 Resolution • Test your resolution – series of particles of known position • testbeam telescope • cosmic telescope • longwavelength laser 12 Checking Resolution • Tests – laser Optical fiber Focus to 5 mm • problems? • transparancy – cosmics • slower – testbeam • expensive • labour intensive 1064nm Si transparent 13 Two Track Resolution • Reconstruction position as a function of proximity of one track to another 14 Occupancy • Best to reduce occupancy – 1% considered the benchmark • 10% too high • Reduce the length of strips – usually about 6cm – reduce to 1cm for example 15 AC Coupling Revisited • e=0.34pF/cm • 200nm oxide – 10pF/cm • Greater than Interstrip capacitance • Electronics at ground! 16 Double Sided -V -- ++ -- ++ • Needs AC coupling! • Correlation of signals • Strips can run opposite directions 0V – 2D style r/o 17 Double Sided Detector • Would like electronics at one end • Can get correlated measurement (E) giving x/y measurement • Reduces fakes • Punchthrough 18 Double Metal • Add another routing layer • more processing via • • Expense can double Built in stresses in SiO2 can warp Si wafer badly 19 Double Metal Can also use to route on single sided detectors 20 Strips 21 Example of Double Metal Detectors • LHCb prototypes 22 Bond Pads • Structure you will often see Typically 80 by 200 microns 23 n-strip detectors • We can make single sided n-strip detectors (note depletion!) 24 Field Plates • MOS structures 25 p-stops • Individual p-stops 26 Operating Voltage • High (overvoltage is desirable) – 250V – reduced ballistic deficit • BUT – introduces very high field regions? • Avalanche will set in if field exceeds 30V/m 27 Analysis of structure 28 Electric Field Sample field map 29 Guard Rings • Reduce fields at edge 30 Micro-Discharges • Discharges may be seen as in increase in the noise with voltage 31 Si Choices • Resistivity • n-type – p-strips – n-strips – double sided • p-type • Crystal orientation 32 Benchmark measures • Charge Collection Efficiency • Partial Depletion • Ballistic Deficit 33 Fabrication • Control of all steps critical • Of special interest – resistor values – implantation – oxide quality for breakdown – quality of lithography 34 Quality Assurance • Job of the physicist is to measure all the key parameters of the detectors – IV and CV – interstrip capacitance – resistor values – lightspot response 35 Readout Chain 36 F/E Electronics • Binary vs Analog • Amplifier Characteristics – rise time and falltime – undershoot • Digital Performance – pipeline & logic • Noise 37 Hybrid Design 38 Noise • Hybrid is often a source of noise – bad grounding for electronics – bad grounding for supplies to detector – sensor,analog and digital all connected • The detector, f/e electronics and the hybrid should be regarded as one unit or MODULE 39 Module and Mounting 40 Material Budget • Ideally should be as low as possible – avoid high mass materials • gold • Good detector about 1% of a radiation length 41 Example: DELPHI barrel 42 Offline Analysis • Can give improvement in resolution w L R w PR A x 2 w PL A x 2 P d PL d Adx d x' R x PR PL Aw w Only true if charge uniform and if the width of the cluster matches the strip width d x In general we have a Gaussian distribution of width determined by the diffusion coefficient (for normal incidence) 43 Offline • Corrections for the angle of the track and the known (measured) charge sharing can give great improvement – 20 to 30% in the case of 25 microns pitch detectors • Good software must accompany good hardware • Removal of deltas 44 7 things to avoid • • • • • • • Picking the wrong technology Picking the wrong manufacturer($) Not enough Quality Control Bad design limiting operation Noise in system Treating sensor and hybrid separately Bad analysis 45 Summary • We have all the elements now to think about real detectors in real environments – design issues – noise problems • See how we design a detector for LHCb 46