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WG3-6-7-11-05-003 San Diego 11/5/16 Cover page for contributions to the PC62.36 revision PC62.36 Clause 8.# ECL Trigger Current Test Number and Title Comment Submitted By Arnaud Moser Proposal Summary Add additional material that deals with the trigger current of electronically activated devices Technical Rational for Proposal The existing description of the test conditions and procedure are applicable to thermally-activated devices. Additional material is needed to deal with electronically activated devices.. Proposed Change or New Material WG Resolution See following pages Accept/ Reject / Accept with Modifications 8.# Trigger Current Test 8.#.1 Background Current limiting or interrupting devices all have a transition current rating. In the case of Electronic Current Limiters (ECL), the transition current is better described as the trigger current because the change in impedance state is an instantaneous electronic action rather than a material change of state. The trigger current is the current which causes the device to transit from a lowimpedance state to a high-impedance state. Generally the time taken to trigger an ECL is in the order of microseconds. The trigger current of ECL is only somewhat affected by temperature. Temperature does not affect the time to trigger. 8.#.2 Purpose The purpose of this test is to verify the current level required to cause an ECL in a surge protector to change state at a given ambient temperature. 8.#.3 Equipment (1) An 80V DC power source capable of delivering 10Amps for 1 second. (2) A system for displaying and measuring the current through the DUT as measured by a current probe, as a function of time. Digital equipment is WG3-6-7-11-05-003 San Diego 11/5/16 suggested, for ease in storing and transferring information. Suitable systems include digital oscilloscopes, A/D converters, and computer-controlled multimeters. The instrument chosen shall have a capability of resolving time intervals from 0.1 microseconds to 1 second. (3) Current probe with range 0 – 2 amps and response time <1mSecond. (4) Pulse Capacitor C1 (Ref Figure 8.#-1), 1500uF, maximum voltage > 80V. (5) Test waveform shaping resistors R1 (8), and R3 (40), (Ref Figure 8.#-1). These resistors shall have low inductance. Carbon film recommended. (6) Safety bleed Resistor R2 (1k) (Ref Figure 8.#-1). 8.#.4 Protector States Subject To Test Unbiased 8.#.5 Procedures (1) The surge protector, mounted as intended to be used, shall be placed in a chamber maintained at the specified test temperature. The air flow shall be controlled to provide a free-convection heat-transfer environment with the protector shielded from direct flow of forced air. The surge protector shall be allowed to stabilize at the test temperature. (2) The specified terminals of the test ECL device shall be connected in series with the power supply and test circuit as shown in Figure 8.#-1. (4) When the DUT’s temperature has stabilized, the test switch shall be closed. The current measurement and recording system shall be configured to record the trigger of the ECL (where the current reaches a maximum and then quickly reduced to its normal triggered level (given the specifications of the ECL). 8.#.6 Alternative Methods None. 8.#.7 Suggested Test Data (1) Temperature of the chamber in which the DUT is mounted (2) Source voltage WG3-6-7-11-05-003 San Diego 11/5/16 (3) Current immediately before the DUT triggers (4) Current after the DUT triggers (5) The time required for the transition to occur (from the time of maximum current to the time of stable minimum current) 8.#.8 Requirement The DUT shall transition at a current level in accordance with specification. The DUT shall transition in less than 100us. 8.#.9 Comments None ECL = ECL device under test Figure 8.#-1. Test circuits for the ECL Trigger current test