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Problem 1 Differentiate between a) Chemical vapor deposition (CVD) and Electrodeposition CVD Chemical process in gas Precursor gases react or decompose and precipitate on the substrate to form the coating Sometimes precursor gases can react with the substrate as well to form a coating Mostly metal compounds, Si compounds and carbon nanotubes are deposited Chemical vapor deposition Electrodeposition Chemical process in solution The anode and cathode are connected to an external supply of direct current, and immersed in a solution called an electrolyte. Metals or conductive polymers are deposited on the cathode plate. Electrodeposition 1 Problem 1 Differentiate between b) Wet etching and dry etching Wet etching The etch reactants come from a liquid source The etching is purely a chemical reaction Dry etching The etch reactants are in a gas or vapor phase and mostly ionized The etching is due to both physical and chemical processes The ions being high energy particles are able to physically knock off the material without having to react with it 2 Problem 1 Differentiate between c) Electrophoresis and Dielectrophoresis (DEP) Electrophoresis A dispersed charged particle in a fluid moves and migrates under the action of a uniform electric field towards the electrode of opposite charge. Electrophoresis Dielectrophoresis (DEP) If the electric field is not uniform, the interaction between the induced dipole and the non-uniform electric field generates a force. Due to presence of the electric field gradient, these forces are not equal in magnitude and generate net movement of the charged particle. Dielectrophoresis 3 Problem 2 Although in theory it is possible to obtain features in the size range of a few angstroms using ebeam lithography, why is it not possible to obtain them in practice? Proximity Effect of E-Beam Lithography (A) Electron scattering in the resist and the substrate limit the theoretical resolution Back scattered and secondary electrons also expose the resist This effect results in beam spreading and reduces the resolution 100 Å e-beam become 0.2 µm line (B) A) Scattering of the e-beam in the resist and on the substrate resulting in forward scattered, back scattered and secondary electrons. B) Spreading of forward- and back scattered electrons 4 Problem 3 Is it possible to apply the technique of Dip-Pen Lithography in a vacuum environment? Why? No, it is not possible In Dip-Pen lithography, an AFM tip is “inked” by dipping the tip in a solution containing a small concentration of the molecules of interest The water meniscus that naturally forms between the tip and the surface enables the diffusion and transport of the molecules to the surface. At low pressure (or vacuum) the water would immediately evaporate. Principle of dip-pen nanolithography using a AFM tip wetted with the molecules of interest The phase diagram of water 5 Problem 4 The fabrication steps for elliptical shapes are given below. The wafer is electrodeposited with iron from a solution containing iron sulfate by applying a current density J of 60 mA∙cm -2, calculate the time necessary to obtain elliptical shapes (a = 3 mm, b = 2 mm) of 50 μm thickness. with 𝑚: Mass of the deposited solid metal 𝑄: Total electric charge used in the deposition process (𝑄 = I∙t = J∙A∙t) 𝑀: Molar mass of the substance being deposited = 55.845 g∙mol-1 𝑧: Number of electrons per metal ion 𝐹: Faraday constant = 96487 C∙mol-1 Area of ellipse is given by A = 𝜋𝑎𝑏 Density of iron (𝐹𝑒) is 7.874 g∙cm-3 6 Problem 4 Given the Faraday’s law of electrodeposition: 𝑚= 𝑄∙𝑀 𝐹∙𝑧 (Electrochemical reaction: 𝐹𝑒2+ + 2𝑒− → 𝐹𝑒) With the total deposited mass: 𝑚 = 𝜌𝐹𝑒 ∙ 𝐴 ∙ ℎ (where 𝜌𝐹𝑒 is to the density, 𝐴 the area of the ellipse and ℎ is the thickness) 𝑄 =𝐽∙𝐴∙𝑡 (where 𝐽 is to the current density, 𝐴 the area of the ellipse and 𝑡 is the time) And with the total Charge: Combining these three formula gives: 𝐽∙𝐴∙𝑡∙𝑀 𝜌𝐹𝑒 ∙ 𝐴 ∙ ℎ = 𝐹∙𝑧 𝜌𝐹𝑒 ∙ ℎ ∙ 𝐹 ∙ 𝑧 →𝑡= 𝐽∙𝑀 with 𝜌𝐹𝑒 = 7.874 g∙cm-3, ℎ = 50 μm, 𝐹 = 96487 C∙mol-1, 𝑧 = 2, 𝐽 = 60 mA∙cm-2 and 𝑀 = 55.845 g∙mol-1 → 𝑡 = 37.8 𝑚𝑖𝑛 7