University of Groningen Designing molecular nano
... does not measure necessarily a tunneling current. AFM instead measures the interaction force between the tip and the sample and in general does not have any voltage applied to the tip. The force can be detected indirectly by recording the deflection of a cantilever of known elastic modulus on which a ...
... does not measure necessarily a tunneling current. AFM instead measures the interaction force between the tip and the sample and in general does not have any voltage applied to the tip. The force can be detected indirectly by recording the deflection of a cantilever of known elastic modulus on which a ...
Nano-optical Imaging using Scattering Scanning Near-Field Optical Microscopy
... beyond the diffraction limit. The scanning probe tip’s optical antenna properties and the local near-field coupling between its apex and the sample allows for few nanometer optical spatial resolution (Atkin, Berweger, Jones, and Raschke 2012). We investigate a nano-imaging technique, known as scatte ...
... beyond the diffraction limit. The scanning probe tip’s optical antenna properties and the local near-field coupling between its apex and the sample allows for few nanometer optical spatial resolution (Atkin, Berweger, Jones, and Raschke 2012). We investigate a nano-imaging technique, known as scatte ...
Atomic Force Microscope (AFM)
... application of a voltage between them then electrons can tunnel between the two, provided the separation of the tip and surface is sufficiently small - this gives rise to a tunnelling current. • The direction of current flow is determined by the polarity of the bias. If the sample is biased -ve with ...
... application of a voltage between them then electrons can tunnel between the two, provided the separation of the tip and surface is sufficiently small - this gives rise to a tunnelling current. • The direction of current flow is determined by the polarity of the bias. If the sample is biased -ve with ...
Midterm Exam
... Instructions: Work through the following problem neatly and professionally, and without collaboration of any kind. You may consult your own notes, and any published textbook. Please be neat and professional in your presentation. Include plots and words to expand on your results. A perfect score on t ...
... Instructions: Work through the following problem neatly and professionally, and without collaboration of any kind. You may consult your own notes, and any published textbook. Please be neat and professional in your presentation. Include plots and words to expand on your results. A perfect score on t ...
Document
... developed for special applications, some of them targeted far beyond microscopy. The Scanning Tunneling Microscope (STM) developed by Dr.Gerd Binnig and his colleagues in 1981 at the IBM Zurich Research Laboratory, Rueschlikon, Switzerland, is the first instrument capable of directly obtaining three ...
... developed for special applications, some of them targeted far beyond microscopy. The Scanning Tunneling Microscope (STM) developed by Dr.Gerd Binnig and his colleagues in 1981 at the IBM Zurich Research Laboratory, Rueschlikon, Switzerland, is the first instrument capable of directly obtaining three ...
ieee-icra-2005
... patterning by the AFM tip is a non-damaging process with higher precision of alignment and narrower width of lithography than those obtained by the use of photon, electron and scanning probe lithography. In contact mode, the probe is in contact with the surface and the AFM uses various forces that o ...
... patterning by the AFM tip is a non-damaging process with higher precision of alignment and narrower width of lithography than those obtained by the use of photon, electron and scanning probe lithography. In contact mode, the probe is in contact with the surface and the AFM uses various forces that o ...
Document
... Cold Cathode X-ray machine The potential advantages of the future CNT X-ray devices are fast response time, programmable xray intensity, programmable spatial distribution (Figure 3), ultra-fine focal spot, rapid pulsation capacity, long lifetime, low energy consumption, miniaturization, and low cost ...
... Cold Cathode X-ray machine The potential advantages of the future CNT X-ray devices are fast response time, programmable xray intensity, programmable spatial distribution (Figure 3), ultra-fine focal spot, rapid pulsation capacity, long lifetime, low energy consumption, miniaturization, and low cost ...
Lec 2014 09 23
... air” amplitude, typically greater than 20nm) when the tip is not in contact with the surface. The oscillating tip is then moved toward the surface until it begins to lightly touch, or “tap” the surface. During scanning, the vertically oscillating tip alternately contacts the surface and lifts off, g ...
... air” amplitude, typically greater than 20nm) when the tip is not in contact with the surface. The oscillating tip is then moved toward the surface until it begins to lightly touch, or “tap” the surface. During scanning, the vertically oscillating tip alternately contacts the surface and lifts off, g ...
Scanning Probe MicroScopy History of Scanning Probe Microscopy
... look something like Figure 8. The measurements are carried out at an extremely low temperature to improve the resolution. AFM ...
... look something like Figure 8. The measurements are carried out at an extremely low temperature to improve the resolution. AFM ...
unit - i principles of dynamics (9)
... to develop molecularly precise fabrication of diamondoid structures using machine-phase nanotechnology. We will also need a theoretical and experimental program to develop methods for massive parallelization of these newly developed machine-phase techniques for molecularly precise fabrication. This ...
... to develop molecularly precise fabrication of diamondoid structures using machine-phase nanotechnology. We will also need a theoretical and experimental program to develop methods for massive parallelization of these newly developed machine-phase techniques for molecularly precise fabrication. This ...
Principles of Nanometrology
... stiffness of the lever must be lower than the interatomic forces at the sample surface (1 - 10 nN/nm). For topological recordings. Lateral Force Microscopy (LFM): The twisting of the cantilever is a function of the friction levels in different areas of the sample surface. Force Modulation (FM): ...
... stiffness of the lever must be lower than the interatomic forces at the sample surface (1 - 10 nN/nm). For topological recordings. Lateral Force Microscopy (LFM): The twisting of the cantilever is a function of the friction levels in different areas of the sample surface. Force Modulation (FM): ...
Photoconductive atomic force microscopy
Photoconductive atomic force microscopy (PC-AFM) is a variant of atomic force microscopy that measures photoconductivity in addition to surface forces.