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Instructions - Physics Internal Website
Instructions - Physics Internal Website

A depolarization criterion in Mueller matrices
A depolarization criterion in Mueller matrices

... elements of a Mueller matrix have been the subject of a number of previous papers [1, 2]. Abhyankar and Fymat [3] proved some relationships between the elements of the matrix that describes a non-depolarizing system in several matricial representations of polarization phenomena. Fry and Kattawar [4] ...
Chapter 23: Electromagnetic waves What will we learn in this chapter?
Chapter 23: Electromagnetic waves What will we learn in this chapter?

... The wave is transverse, i.e., both E and B are perpendicular to the direction of propagation and to each other. There is a definite ratio between the magnitudes: E = cB The wave travels in vacuum with a constant speed c. The wave does not need a medium to propagate. The fields oscillate. Modified ri ...
Chapter 23: Electromagnetic waves What will we learn in this chapter?
Chapter 23: Electromagnetic waves What will we learn in this chapter?

... The wave is transverse, i.e., both E and B are perpendicular to the direction of propagation and to each other. There is a definite ratio between the magnitudes: E = cB The wave travels in vacuum with a constant speed c. The wave does not need a medium to propagate. The fields oscillate. Modified ri ...
(k) and Refractive Index
(k) and Refractive Index

... Baseline and the 0%T/Blocked Beam Baseline are checked, but the option Use internal attenuator is left unchecked, as shown in Figure 4. Using this setup, when the correction prompt is given “Block the beam and press OK to perform a 0%T/Blocked Beam correction” the user will not actually block the be ...
Polarization Optics Tutorial: Polarizers, Waveplates, Rotators, and
Polarization Optics Tutorial: Polarizers, Waveplates, Rotators, and

... work well only within a limited spectral and angular range. Crystal polarizers either reflect or refract the rejected portion, without significant absorption of either portion, and can achieve extinction ratios of 10-6:1 over a broad spectral range, but only over a small range of incident angles. Cr ...
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Presentation PPT

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Semiconductor Devices

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Refractive indexes of (Al,Ga,In)As epilayers on InP for optoelectronic

... in Fig. 2. As can be seen in the Figure, the refractive index values from their measurement are all slightly greater than corresponding values from our fitted curves. These discrepancies, however, can be accounted for in part by the difference in the InP refractive index used in the index calculatio ...
Winter 2008 exam 1 - BYU Physics and Astronomy
Winter 2008 exam 1 - BYU Physics and Astronomy

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Electricity and Magnetism Experiment

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Soleil-Babinet Compensator

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Approximate Theory of Rectangular Optical Waveguides

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Polymer Based Photonic Crystals

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... properties of our fabricated structures and the incident field. A needs to be maximized to make efficient detectors; however, there are many ways an incident photon can remain unabsorbed. For example, the photon can pass through open gaps between the nanowires or be transmitted through the subwavele ...
Physics 316 B2 1 Revised 3/7/08 Experiment B2: Monochromatic
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... The wave nature of light was established in the early part of the 19th century, although many interference and diffraction phenomena had long been known. Fresnel's experiment with the biprism was one of the earliest experiments to yield values for the wavelength of light. As you will find, accurate ...
cw3cb_WK8_HW1 - East Penn School District
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... simulation? If so, record them here. Self-Test Questions – The simulation may be helpful in answering some of these questions. 1. There are two cases in which the angle of refraction is the same as the angle of incidence. What are they? 2. The situation where n2 = n1 is a special case. What happens ...
3-D wave structuring and applications
3-D wave structuring and applications

... information with 3D capabilities employing optical architectures in free space and containing bulk optical components. The main attribute of light is that it solves the Maxwell equations in 3D space, at the speed of light. HOWEVER , the solution is uniquely determined by a set of boundary conditions ...


... AbstractID: 9348 Title: Dose sensitivity modification in polymer gel dosimeters improves the accuracy of optical CT scanning for gel dosimetry Optical CT scanning is a convenient, bench-top method of imaging 3D dose distributions in gel dosimeters such as BANG®. These scanners offer medical physicis ...
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Ellipsometry

Ellipsometry is an optical technique for investigating the dielectric properties (complex refractive index or dielectric function) of thin films. Ellipsometry can be used to characterize composition, roughness, thickness (depth), crystalline nature, doping concentration, electrical conductivity and other material properties. It is very sensitive to the change in the optical response of incident radiation that interacts with the material being investigated.Typically, the measured signal is the change in polarization as the incident radiation (in a known state) interacts with the material structure of interest (reflected, absorbed, scattered, or transmitted). The polarization change is quantified by the amplitude ratio, Ψ, and the phase difference, Δ (defined below). Because the signal depends on the thickness as well as the materials properties, ellipsometry can be a universal tool for contact free determination of thickness and optical constants of films of all kinds.This technique has found applications in many different fields, from semiconductor physics to microelectronics and biology, from basic research to industrial applications. Ellipsometry is a very sensitive measurement technique and provides unequaled capabilities for thin film metrology. As an optical technique, spectroscopic ellipsometry is non-destructive and contactless. Because the incident radiation can be focused, small sample sizes can be imaged and desired characteristics can be mapped over a larger area (m^2).The one weakness of ellipsometry is the need to model the data. Entire courses are taught in the modeling of the raw data. Models can be physically based on energy transitions or simply free parameters used to fit the data.Upon the analysis of the change of polarization of light, ellipsometry can yield information about layers that are thinner than the wavelength of the probing light itself, even down to a single atomic layer. Ellipsometry can probe the complex refractive index or dielectric function tensor, which gives access to fundamental physical parameters like those listed above. It is commonly used to characterize film thickness for single layers or complex multilayer stacks ranging from a few angstroms or tenths of a nanometer to several micrometers with an excellent accuracy.The name ""ellipsometry"" stems from the fact that Elliptical polarization of light is used. The term ""spectroscopic"" relates to the fact that the information gained is a function of the light's wavelength or energy (spectra). The technique has been known at least since 1888 by the work of Paul Drude, (the term ""ellipsometry"" being first used probably in 1945 ) and has many applications today. A spectroscopic ellipsometer can be found in most thin film analytical labs. Ellipsometry is also becoming more interesting to researchers in other disciplines such as biology and medicine. These areas pose new challenges to the technique, such as measurements on unstable liquid surfaces and microscopic imaging.
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