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Microscopy Overview
Microscopy Overview

... For S = 0 the illumination is purely coherent, while for S → ∞ imaging becomes purely incoherent, thus corresponding to the Rayleigh criterion. (So S should really be called an incoherence parameter.) An important in-between case is when S = 1, when the apertures of objective and condenser are equal ...
Total internal reflection photonic crystal prism
Total internal reflection photonic crystal prism

... devices without transverse confinement is that they can support several parallel channels that can pass through one another similar to a free space optical device [16]. Because the total internal reflection occurs in the second photonic band where slow or negative diffraction also occurs, the PC TIR ...
Construction and Validation of a White Light Interferometer
Construction and Validation of a White Light Interferometer

... source. In contrast, if the light was ideally monochromatic, the wave would be a perfect sinusoid with an infinite coherence length [2]. Temporal coherence is a strong correlation between the disturbances at one location but at different times. In white light interferometry the temporal coherence of ...
Mid Infrared digital holography and Terahertz imaging
Mid Infrared digital holography and Terahertz imaging

... realization of the latter technique was made in 1967 by Goodman and Lawrence [22] who managed to numerically reconstruct, in about 5 minutes, a digital hologram obtained from a real hologram recorded on a photographic film. The decisive step towards the complete digitalization of the holographic pro ...
Light Scattering
Light Scattering

... of the scattered radiation is a superposition of this secondary radiation with the primary beam in the same direction. In a homogeneous medium all scattering intensity which is not parallel to the incident beam (i. e.  and 0)is annihilated by destructive interference. In order to observe scatte ...
Generation and Application of Bessel Beams in Electron Microscopy
Generation and Application of Bessel Beams in Electron Microscopy

... function immediately after the holographic mask, it can be shown (see Appendix I and ref [23]) to take on Bessel character within a range of propagation distances 2g given by  ≪  f 92 . In this region, we have for the transverse wavefunction Y ...
Fresnel Diffraction Geometrical optics… …light can`t turn a corner. I
Fresnel Diffraction Geometrical optics… …light can`t turn a corner. I

... both incident and diffracted waves may be considered to be planar (i.e. both S and P are far from the aperture) ...
The real structure of Na3BiO4 by electron microscopy, HR
The real structure of Na3BiO4 by electron microscopy, HR

... detector distance of 159.88 mm. Lead shielding before the goniometer with a small opening for the incident beam was used to reduce the background. All raw data were integrated using the software Fit2D [38, 39] and converted to intensity versus 2q. The integrated data were normalized with respect to ...
Two-color cross-correlation in small-angle static light
Two-color cross-correlation in small-angle static light

... r 2 , while it depends on the azimuthal angles f 1 and f 2 only through the angular lag D f , as evidenced in writing Eq. ~1!. In practice, for a given radius r 1 , we restrict the calculation of g I to those values of Dr and D f for which a significant degree of correlation is expected, i.e., when ...
Diffraction of light by a single slit and gratings
Diffraction of light by a single slit and gratings

... If the /N is an integer number, the denominator of IG in equation (7) also vanishes. A mathematical consideration leads to the result that in this case the intensity must be N2IS. These maxima occur at angles in accordance with equation (7), and they are much stronger as compared to the intensity o ...
High-efficiency light coupling in a submicrometric
High-efficiency light coupling in a submicrometric

... coupler characterized by the decoupling length LC, as the beam parameters and position are varied. It is found that the optimum coupling of ⬃80% is obtained for a beam waist w0 ⫽ 1.37 LC cos ⌰r and when the distance d between the beam center and the coupler edge is approximately equal to LC. For a h ...
First in situ X-ray identification of coesite and retrograde quartz on a
First in situ X-ray identification of coesite and retrograde quartz on a

... beam intensity before the beam irradiates the rock thin section, depending on the path length associated with the angle of the slide to the beam. The X-ray intensity reduction was measured as a function of the path length of the X-ray beam in the slide glass as shown in Figure 6, which yielded the l ...
P - University of South Florida
P - University of South Florida

... tilted angles θ up to ±60 degrees, according to numerical analysis for this case. Theoretically, the Fresnel approximate conditions will impose a restriction to the extent of the titled plane, which is related to the tilted angle. Furthermore, bigger tilted angle will induce a larger reconstructed p ...
Combining Photonic Crystal and Optical Monte
Combining Photonic Crystal and Optical Monte

... coplanar and light scattering through electrical connections or mechanical fixations. The statistical error of the MC simulations was estimated through the standard deviation of the results from 10 repeated computations. It was found to be less than 0.1%, since 105 photons were simulated per inciden ...
Session 10 Wave Optics
Session 10 Wave Optics

... we’ll look at in the next section. ...
Experimental demonstration of a narrowband, angular tolerant
Experimental demonstration of a narrowband, angular tolerant

... represented by its angular spectrum components [9], and the Fourier modal method [10] is used to calculate the transmittivity for each plane wave. Both © 2007 Optical Society of America ...
Coherent x-rays: overview
Coherent x-rays: overview

... • When wave amplitudes are added in a coherent sum it is possible for them to either reinforce or cancel. Thus it is possible for a coherent sum to lead to interference fringes. • On the other hand the wave intensities that are added in an incoherent sum are always positive and can never cancel. Thu ...
Final Exam Review Slides
Final Exam Review Slides

... Unpolarized light that goes through a series of 4 polarizers, each 30 degrees offset will have zero intensity after the fourth polarizer since the first and last polarizing axes are perpendicular. ...
Applications of Random Nonlinear Photonic Crystals Based
Applications of Random Nonlinear Photonic Crystals Based

... inverse wave mismatch for the specific nonlinear optical conversion process. The spatial modulation can be fitted in order to enhance certain nonlinear optical conversion process, as described in the very first paper on nonlinear optics [3]. One can imagine more complex material with simultaneously ...
Fiber Optic Cable Beam Delivery Systems
Fiber Optic Cable Beam Delivery Systems

... cable features a high-purity silica glass core available in diameters from 200 m to 1000 m. Core size is determined by the desired laser beam power throughput, with the largest size used to handle the multiple-hundred Watt levels of our most powerful Series 800 Lasers. Lee Laser high-purity FFO cabl ...
Biomedical imaging in the undergraduate physics curriculum
Biomedical imaging in the undergraduate physics curriculum

... physics of this case is relevant to interference-based forms of optical microscopy, such as phase-contrast microscopy, with the arc lamp acting as a source of partially coherent illumination.9 The concept of the response function also applies to coherent imaging. In this case, however, the field amp ...
Specifying a quartz crystal for a VCXO
Specifying a quartz crystal for a VCXO

... part only, which is called the crystal’s reactance curve and is depicted in Figure 3. In Figure 3, the point marked as fs is where the motional capacitance C1 resonates and cancels the motional inductance L1. A crystal calibrated to the desired frequency at fs is called a series crystal. A crystal c ...
SRON presentation
SRON presentation

... components much larger than λ. In sub- /mm range diffraction is important, and quasi-optics handles this in a theorectical way. ...
Numerical simulation of diffraction grating alignment and phase noise
Numerical simulation of diffraction grating alignment and phase noise

...  Choosing dimensions depends on the problem  Need balance between accuracy and computation speed  Major limitation is computational requirements, they increase very rapidly with finer grid sizes ...
PDF
PDF

... In principle, the polarization direction in FCPM or Fast FCPM can be changed by mechanical rotation of a polarizer which is inserted in the common path for excitation and emission light. However, despite its simplicity, this approach has some disadvantages: 1) the excitation intensity may vary with ...
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Diffraction topography

Diffraction topography (short: ""topography"") is an quantum beam imaging technique based on Bragg diffraction.Diffraction topographic images (""topographies"") record the intensity profile of a beam of X-rays (or, sometimes, neutrons) diffracted by a crystal.A topography thus represents a two-dimensional spatial intensity mapping of reflected X-rays, i.e. the spatial fine structure of a Laue reflection.This intensity mapping reflects the distribution of scattering power inside the crystal; topographs therefore reveal the irregularities in a non-ideal crystal lattice.X-ray diffraction topography is one variant of X-ray imaging, making use of diffraction contrast rather than absorption contrast which is usually used in radiography and computed tomography (CT). Topography is exploited to a lesser extends with neutrons and other quantum beams. In the electron microscope community, such technique is called dark field imaging or diffraction contrast imaging.Topography is used for monitoring crystal quality and visualizing defects in many different crystalline materials.It has proved helpful e.g. when developing new crystal growth methods, for monitoring growth and the crystal quality achieved, and for iteratively optimizing growth conditions.In many cases, topography can be applied without preparing or otherwise damaging the sample; it is therefore one variant of non-destructive testing.
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