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Dissociation energy of the Ar-HN complex
Dissociation energy of the Ar-HN complex

... state combination differences were weighted according to the respective band intensities and averaged. This procedure provided data for J ranging from 1 to 70 and fitting them to a standard linear molecule expression gave the rotational constants B " = 0.080862(15) c m - I and D" = 5.25(20) × 10 -8 ...
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...  Write out the electron distribution for the elementPhosphorus according to Hund’s rule. Use arrows to represent electrons. 1s2 ____ 2s2 _____ 2p6 _____ _____ ____ 3s2 _____ 3p6 _____ _____ _____  Write the electron configuration for the following elements: Calcium Iodine Vandium Emission (or brig ...
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... ______________ properties are characteristics that describe how a substance ______________ with other substance to produce different substances. Elements _______________ a substance that cannot be _____________ or _______________ into simpler substances by chemical means; all atoms of an element hav ...
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Chemical Reactions - Northside Middle School

...  Count the number of atoms of each type appearing on both sides  Balance the elements one at a time by adding coefficients (the numbers in front) - save H and O until LAST!  Check to make sure it is balanced. ...
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... (ii) … there is an energy level in helium that has almost the same energy as an energy level in neon. (iii) … the difference between two energy levels in helium is almost the same as the difference between two energy levels in neon. Exercises 13 – 18 involve line spectra. 13. Two energy levels in a ...
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... •  for higher frequencies, the electron absorbs more energy than is necessary to escape •  this excess energy becomes kinetic energy of the ejected electron Kinetic Energy = Ephoton – Ebinding KE = hν - φ ...
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... state. However, at such high temperatures, one typically has that most of the hydrogen will be ionized (unless the electron density is unrealistically high). This somewhat unintuitive result arises from the fact that there are many more possible states available for a free electron than for a bound ...
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... of the element to attract electrons when they are chemically combined with atoms of another element • Note: Noble gases don’t have values for electronegativity because their outer orbitals are full and they do not need to gain or lose electrons to be stable. • Trend: electronegativity increases from ...
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... where i is the unit imaginary number, is Planck's constant divided by 2π, and the Hamiltonian H(t) is a self-adjoint operator acting on the state space. The Hamiltonian describes the total energy of the system. As with the force occurring in Newton's second law, its exact form is not provided by the ...
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< 1 ... 131 132 133 134 135 136 137 138 139 ... 276 >

X-ray photoelectron spectroscopy



X-ray photoelectron spectroscopy (XPS) is a surface-sensitive quantitative spectroscopic technique that measures the elemental composition at the parts per thousand range, empirical formula, chemical state and electronic state of the elements that exist within a material. XPS spectra are obtained by irradiating a material with a beam of X-rays while simultaneously measuring the kinetic energy and number of electrons that escape from the top 0 to 10 nm of the material being analyzed. XPS requires high vacuum (P ~ 10−8 millibar) or ultra-high vacuum (UHV; P < 10−9 millibar) conditions, although a current area of development is ambient-pressure XPS, in which samples are analyzed at pressures of a few tens of millibar.XPS is a surface chemical analysis technique that can be used to analyze the surface chemistry of a material in its as-received state, or after some treatment, for example: fracturing, cutting or scraping in air or UHV to expose the bulk chemistry, ion beam etching to clean off some or all of the surface contamination (with mild ion etching) or to intentionally expose deeper layers of the sample (with more extensive ion etching) in depth-profiling XPS, exposure to heat to study the changes due to heating, exposure to reactive gases or solutions, exposure to ion beam implant, exposure to ultraviolet light.XPS is also known as ESCA (Electron Spectroscopy for Chemical Analysis), an abbreviation introduced by Kai Siegbahn's research group to emphasize the chemical (rather than merely elemental) information that the technique provides.In principle XPS detects all elements. In practice, using typical laboratory-scale X-ray sources, XPS detects all elements with an atomic number (Z) of 3 (lithium) and above. It cannot easily detect hydrogen (Z = 1) or helium (Z = 2).Detection limits for most of the elements (on a modern instrument) are in the parts per thousand range. Detection limits of parts per million (ppm) are possible, but require special conditions: concentration at top surface or very long collection time (overnight).XPS is routinely used to analyze inorganic compounds, metal alloys, semiconductors, polymers, elements, catalysts, glasses, ceramics, paints, papers, inks, woods, plant parts, make-up, teeth, bones, medical implants, bio-materials, viscous oils, glues, ion-modified materials and many others.XPS is less routinely used to analyze the hydrated forms of some of the above materials by freezing the samples in their hydrated state in an ultra pure environment, and allowing or causing multilayers of ice to sublime away prior to analysis. Such hydrated XPS analysis allows hydrated sample structures, which may be different from vacuum-dehydrated sample structures, to be studied in their more relevant as-used hydrated structure. Many bio-materials such as hydrogels are examples of such samples.
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