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Scanning Tunneling Microscope
Scanning Tunneling Microscope

ARPES experiments on 3D topological insulators
ARPES experiments on 3D topological insulators

... change in reflectivity or absorption) • THz (measures changes in optical conductivity at low frequencies) • ARPES (measures changes in band structure) • Many others ...
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Energy Diagrams II
Energy Diagrams II

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quiz questions chapters 1

... At one atmosphere pressure, mercury solidifies at -38.0 F. Express this temperature in degrees Celsius and Kelvin. A) -126 oC and 147 K B) -39 oC and 234 K C) -21 oC and 252 K D) 39 oC and 312 K E) -68 oC and 205 K ...
The Bohr model depicts atoms as small, positively
The Bohr model depicts atoms as small, positively

... explaining the Rydberg formula for the spectral emission lines of atomic hydrogen. While the Rydberg formula had been known experimentally, it did not gain a theoretical underpinning until the Bohr model was introduced. Not only did the Bohr model explain the reason for the structure of the Rydberg ...
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Effect of the Spin-Spin Interaction on the Coulomb`s Law
Effect of the Spin-Spin Interaction on the Coulomb`s Law

atomic physics
atomic physics

... (called the "stationary orbits”) at a certain discrete set of distances from the nucleus. These orbits are associated with definite energies and are also called energy shells or energy levels. In these orbits, the electron's acceleration does not result in radiation and energy loss as required by cl ...
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CHAP3

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Lecture 2 Physics Classifications: Classical and Quantum

... surface upon exposure to, and absorption of, electromagnetic radiation. The importance of this experiment comes from the fact that there exists a threshold energy, the material work function which is related to the atomic bond strengths, below which electrons can not be emitted. The previous belief ...
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... chemical property of a substance? A. Placing the substance in a flame to see if it will burn B. Measuring the volume of the substance C. Heating the substance until it melts D. Calculating the density of the substance ...
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X-ray photoelectron spectroscopy



X-ray photoelectron spectroscopy (XPS) is a surface-sensitive quantitative spectroscopic technique that measures the elemental composition at the parts per thousand range, empirical formula, chemical state and electronic state of the elements that exist within a material. XPS spectra are obtained by irradiating a material with a beam of X-rays while simultaneously measuring the kinetic energy and number of electrons that escape from the top 0 to 10 nm of the material being analyzed. XPS requires high vacuum (P ~ 10−8 millibar) or ultra-high vacuum (UHV; P < 10−9 millibar) conditions, although a current area of development is ambient-pressure XPS, in which samples are analyzed at pressures of a few tens of millibar.XPS is a surface chemical analysis technique that can be used to analyze the surface chemistry of a material in its as-received state, or after some treatment, for example: fracturing, cutting or scraping in air or UHV to expose the bulk chemistry, ion beam etching to clean off some or all of the surface contamination (with mild ion etching) or to intentionally expose deeper layers of the sample (with more extensive ion etching) in depth-profiling XPS, exposure to heat to study the changes due to heating, exposure to reactive gases or solutions, exposure to ion beam implant, exposure to ultraviolet light.XPS is also known as ESCA (Electron Spectroscopy for Chemical Analysis), an abbreviation introduced by Kai Siegbahn's research group to emphasize the chemical (rather than merely elemental) information that the technique provides.In principle XPS detects all elements. In practice, using typical laboratory-scale X-ray sources, XPS detects all elements with an atomic number (Z) of 3 (lithium) and above. It cannot easily detect hydrogen (Z = 1) or helium (Z = 2).Detection limits for most of the elements (on a modern instrument) are in the parts per thousand range. Detection limits of parts per million (ppm) are possible, but require special conditions: concentration at top surface or very long collection time (overnight).XPS is routinely used to analyze inorganic compounds, metal alloys, semiconductors, polymers, elements, catalysts, glasses, ceramics, paints, papers, inks, woods, plant parts, make-up, teeth, bones, medical implants, bio-materials, viscous oils, glues, ion-modified materials and many others.XPS is less routinely used to analyze the hydrated forms of some of the above materials by freezing the samples in their hydrated state in an ultra pure environment, and allowing or causing multilayers of ice to sublime away prior to analysis. Such hydrated XPS analysis allows hydrated sample structures, which may be different from vacuum-dehydrated sample structures, to be studied in their more relevant as-used hydrated structure. Many bio-materials such as hydrogels are examples of such samples.
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