A 200-MHz 64-bit Dual-issue CMOS Microprocessor 1 Abstract A
... designed and tested that operates up to 200 megahertz (MHz). The chip implements a new 64-bit architecture, designed to provide a huge linear address space and to be devoid of bottlenecks that would impede highly concurrent implementations. Fully pipelined and capable of issuing two instructions per ...
... designed and tested that operates up to 200 megahertz (MHz). The chip implements a new 64-bit architecture, designed to provide a huge linear address space and to be devoid of bottlenecks that would impede highly concurrent implementations. Fully pipelined and capable of issuing two instructions per ...
Battery monitor IC with Coulomb counter/gas gauge
... charge flowing from/to the battery. The STC3100 can operate from an internal oscillator, or use an external RTC signal for highest accuracy. ...
... charge flowing from/to the battery. The STC3100 can operate from an internal oscillator, or use an external RTC signal for highest accuracy. ...
ABSTRACT transmission line aspects of windings yields attenuation and
... 4 ON-LINE PD TESTING There are two very critical differences that distinguish online PD tests from off-line tests. In the on-line situation 1. most of the coils are not operating at full voltage. This greatly reduces the PD activity in most coils. 2. the stator winding PD is superimposed on the elec ...
... 4 ON-LINE PD TESTING There are two very critical differences that distinguish online PD tests from off-line tests. In the on-line situation 1. most of the coils are not operating at full voltage. This greatly reduces the PD activity in most coils. 2. the stator winding PD is superimposed on the elec ...
AN-653: Improving Temperature, Stability, and Linearity of High Dynamic Range RMS RF Power Detectors
... feed this signal back to the VGA gain control input with the noise intact, the rms voltage going to the external measurement node can be filtered using a simple filter to yield a largely noise-free rms voltage. Figure 6 shows the resulting reduction in transfer function ripple of the rms-to-dc conve ...
... feed this signal back to the VGA gain control input with the noise intact, the rms voltage going to the external measurement node can be filtered using a simple filter to yield a largely noise-free rms voltage. Figure 6 shows the resulting reduction in transfer function ripple of the rms-to-dc conve ...
Rabi Oscillations in a Large Josephson-Junction
... spectroscopically [2]. Figure 3 shows the measured escape rate as a function of the qubit bias current I in the presence of a microwave signal at a fixed frequency !=2 6:80 GHz. A resonance is observed because !10 varies with current bias. The temperature T ’ 25 mK is low enough so that without m ...
... spectroscopically [2]. Figure 3 shows the measured escape rate as a function of the qubit bias current I in the presence of a microwave signal at a fixed frequency !=2 6:80 GHz. A resonance is observed because !10 varies with current bias. The temperature T ’ 25 mK is low enough so that without m ...
ADF4360-3 数据手册DataSheet 下载
... The dual-modulus prescaler (P/P + 1), along with the A and B counters, enables the large division ratio, N, to be realized (N = BP + A). The dual-modulus prescaler, operating at CML levels, takes the clock from the VCO and divides it down to a manageable frequency for the CMOS A and B counters. The ...
... The dual-modulus prescaler (P/P + 1), along with the A and B counters, enables the large division ratio, N, to be realized (N = BP + A). The dual-modulus prescaler, operating at CML levels, takes the clock from the VCO and divides it down to a manageable frequency for the CMOS A and B counters. The ...
IXLD02SI Data Sheet
... FIN frequency in this figure is held constant. At T0 the IPW and the IOP signals are near zero, both begin to ramp up at T1 and reach their maximums at T2. As illustrated, the output current rises in amplitude with the increasing IOP and the pulse width widens with the IPW ramp. An additional mode o ...
... FIN frequency in this figure is held constant. At T0 the IPW and the IOP signals are near zero, both begin to ramp up at T1 and reach their maximums at T2. As illustrated, the output current rises in amplitude with the increasing IOP and the pulse width widens with the IPW ramp. An additional mode o ...
A Self-Clocked ASIC Interface for MEMS Gyroscope with 1m°/s√Hz
... self-clocking scheme is mandatory for the CT feedback of the sense loop. The self-clocking scheme also permits an automatic synchronization of the zeros of the BPmodulators used in both sense and drive loops. This scheme helps achieving superior noise performance with floor lower than 1m˚/s/ Hz. The ...
... self-clocking scheme is mandatory for the CT feedback of the sense loop. The self-clocking scheme also permits an automatic synchronization of the zeros of the BPmodulators used in both sense and drive loops. This scheme helps achieving superior noise performance with floor lower than 1m˚/s/ Hz. The ...
HMC856LC5 数据资料DataSheet下载
... 5-bit digital control designed for timing compensation or clock skew management applications. The time delay provides nearly 100 ps of delay range with 3 ps resolution and supports 28 Gbps data. The monotonic delay is compensated for stable operation over both power supply and temperature variation. ...
... 5-bit digital control designed for timing compensation or clock skew management applications. The time delay provides nearly 100 ps of delay range with 3 ps resolution and supports 28 Gbps data. The monotonic delay is compensated for stable operation over both power supply and temperature variation. ...
Digital-Pixel Focal Plane Array Technology
... unit cell (pixel) circuit diagram and example ROIC layout are presented in Figure 3. The circuit consists of a low-noise input amplifier—primarily used to isolate the detector bias from the following unit cell circuits—that feeds an integrating capacitor. Simple switching and buffer circuits are use ...
... unit cell (pixel) circuit diagram and example ROIC layout are presented in Figure 3. The circuit consists of a low-noise input amplifier—primarily used to isolate the detector bias from the following unit cell circuits—that feeds an integrating capacitor. Simple switching and buffer circuits are use ...
Measurement and Error - Gopalan College of Engineering
... It is the measure of consistency or repeatability of measurements. Let us see the basic difference between accuracy and precision. Consider an instrument on which, readings upto 1/1000th of unit can be measured. But the instrument has large zero adjustment error. Now every time reading is taken, it ...
... It is the measure of consistency or repeatability of measurements. Let us see the basic difference between accuracy and precision. Consider an instrument on which, readings upto 1/1000th of unit can be measured. But the instrument has large zero adjustment error. Now every time reading is taken, it ...
UNIT 4 BASIC CIRCUIT DESIGN CONCEPTS
... • Final expression we may deduce that: τr / τf = ßn / ßp • Raise time is slower by factor of 2.5 when both ‘n’ and ‘p’ are in same size • In order to achive symmetrical operation need to make Wp=2.5 Wn • The factors which affect rise-time and fall-time as follows: 1) τr and τf are proportional to 1/ ...
... • Final expression we may deduce that: τr / τf = ßn / ßp • Raise time is slower by factor of 2.5 when both ‘n’ and ‘p’ are in same size • In order to achive symmetrical operation need to make Wp=2.5 Wn • The factors which affect rise-time and fall-time as follows: 1) τr and τf are proportional to 1/ ...
ADF4360-0 数据手册DataSheet 下载
... Programmable dual-modulus prescaler 16/17, 32/33 Programmable output power level 3-wire serial interface Analog and digital lock detect Hardware and software power-down mode ...
... Programmable dual-modulus prescaler 16/17, 32/33 Programmable output power level 3-wire serial interface Analog and digital lock detect Hardware and software power-down mode ...
here
... direction to the charging current, and through the resistor as the capacitor DISCHARGES. b) Since I =V/R, I is 6/5600 = 1.1 x 10-3 A c) Time constant = RC = 4700 x 10-6 x 5.6 x 103 = 26.3 s. d) After 2 x RC seconds, I will be 1.1mA/e2 = 1.1/7.29 = 0.15 mA. ...
... direction to the charging current, and through the resistor as the capacitor DISCHARGES. b) Since I =V/R, I is 6/5600 = 1.1 x 10-3 A c) Time constant = RC = 4700 x 10-6 x 5.6 x 103 = 26.3 s. d) After 2 x RC seconds, I will be 1.1mA/e2 = 1.1/7.29 = 0.15 mA. ...
E48074751
... Multi-phase machines and drives is a topic of growing relevance in recent years, and it presents many challenging issues that still need further research. This is the case of multi-phase space vector pulse width modulation (SVPWM), which shows not only more space vectors than the standard three-phas ...
... Multi-phase machines and drives is a topic of growing relevance in recent years, and it presents many challenging issues that still need further research. This is the case of multi-phase space vector pulse width modulation (SVPWM), which shows not only more space vectors than the standard three-phas ...
Time-to-digital converter
In electronic instrumentation and signal processing, a time to digital converter (abbreviated TDC) is a device for recognizing events and providing a digital representation of the time they occurred. For example, a TDC might output the time of arrival for each incoming pulse. Some applications wish to measure the time interval between two events rather than some notion of an absolute time.In electronics time-to-digital converters (TDCs) or time digitizers are devices commonly used to measure a time interval and convert it into digital (binary) output. In some cases interpolating TDCs are also called time counters (TCs).TDCs are used in many different applications, where the time interval between two signal pulses (start and stop pulse) should be determined. Measurement is started and stopped, when either the rising or the falling edge of a signal pulse crosses a set threshold. These requirements are fulfilled in many physical experiments, like time-of-flight and lifetime measurements in atomic and high energy physics, experiments that involve laser ranging and electronic research involving the testing of integrated circuits and high-speed data transfer.