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Transcript
Low Cost ±1.2 g Dual
Axis Accelerometer
ADXL213
FEATURES
GENERAL DESCRIPTION
Dual axis accelerometer on a single IC chip
5 mm × 5 mm × 2 mm LCC package
1 mg resolution at 60 Hz
Low power: 700 µA at VS = 5 V (typical)
High zero g bias stability
High sensitivity accuracy
Pulse width modulated digital outputs
X and Y axes aligned to within 0.1° (typical)
BW adjustment with a single capacitor
Single-supply operation
3500 g shock survival
The ADXL213 is a low cost, low power, complete dual axis
accelerometer with signal conditioned, duty cycle modulated
outputs, all on a single monolithic IC. The ADXL213 measures
acceleration with a full-scale range of ±1.2 g (typical). The
ADXL213 can measure both dynamic acceleration (e.g.,
vibration) and static acceleration (e.g., gravity).
The outputs are digital signals whose duty cycles (ratio of pulse
width to period) are proportional to acceleration (30%/g). The
duty cycle outputs can be directly measured by a microcontroller without an A/D converter or glue logic.
Innovative design techniques are used to ensure high zero g bias
stability (typically better than 0.25 mg/°C), as well as tight sensitivity stability (typically better than 50 ppm/°C).
APPLICATIONS
Automotive tilt alarms
Data projectors
Navigation
Platform stabilization/leveling
Alarms and motion detectors
High accuracy, 2-axis tilt sensing
The typical noise floor is 160 µg/√Hz, allowing signals below
1 mg (0.06° of inclination) to be resolved in tilt sensing applications using narrow bandwidths (<60 Hz).
www.BDTIC.com/ADI
The user selects the bandwidth of the accelerometer using
capacitors CX and CY at the XFILT and YFILT pins. Bandwidths of
0.5 Hz to 250 Hz may be selected to suit the application.
The ADXL213 is available in a 5 mm × 5 mm × 2 mm, 8-pad
hermetic LCC package.
FUNCTIONAL BLOCK DIAGRAM
+VS
CY
YFILT
+VS
ADXL213
CDC
AC
AMP
OUTPUT
AMP
YOUT
DEMOD
DCM
OUTPUT
AMP
32kΩ
SENSOR
COM
32kΩ
ST
XOUT
XFILT
T2
CX
RSET
T2
A(g) = (T1/T2 – 0.5)/30%
0g = 50% DUTY CYCLE
T2(s) = RSET/125MΩ
04742-0-001
T1
Figure 1.
Rev. 0
Information furnished by Analog Devices is believed to be accurate and reliable.
However, no responsibility is assumed by Analog Devices for its use, nor for any
infringements of patents or other rights of third parties that may result from its use.
Specifications subject to change without notice. No license is granted by implication
or otherwise under any patent or patent rights of Analog Devices. Trademarks and
registered trademarks are the property of their respective owners.
One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A.
Tel: 781.329.4700
www.analog.com
Fax: 781.326.8703
© 2004 Analog Devices, Inc. All rights reserved.
ADXL213
TABLE OF CONTENTS
Specifications..................................................................................... 3
Absolute Maximum Ratings............................................................ 4
Design Trade-Offs for Selecting Filter Characteristics:
The Noise/BW Trade-Off........................................................9
Typical Performance Characteristics ............................................. 5
Using the ADXL213 with Operating Voltages Other
than 5 V................................................................................... 10
Theory of Operation ........................................................................ 8
Using the ADXL213 as a Dual-Axis Tilt Sensor..................... 10
Performance .................................................................................. 8
Pin Configurations and Functional Descriptions ...................... 11
Applications....................................................................................... 9
Outline Dimensions ....................................................................... 12
Power Supply Decoupling ........................................................... 9
ESD Caution................................................................................ 12
Setting the Bandwidth Using CX and CY.................................... 9
Ordering Guide .......................................................................... 12
Self Test .......................................................................................... 9
REVISION HISTORY
Revision 0: Initial Version
www.BDTIC.com/ADI
Rev. 0 | Page 2 of 12
ADXL213
SPECIFICATIONS
TA = –40°C to +85°C, VS = 5 V, CX = CY = 0.1 μF, Acceleration = 0 g, unless otherwise noted. All minimum and maximum specifications
are guaranteed. Typical specifications are not guaranteed.
Table 1.
Parameter
SENSOR INPUT
Measurement Range1
Nonlinearity
Package Alignment Error
Alignment Error
Cross Axis Sensitivity
SENSITIVITY (Ratiometric)2
Sensitivity at XOUT, YOUT
Sensitivity Change due to Temperature3
ZERO g BIAS LEVEL (Ratiometric)
0 g Voltage at XOUT, YOUT
Initial 0 g Output Deviation from Ideal
0 g Offset vs. Temperature
NOISE PERFORMANCE
Noise Density
FREQUENCY RESPONSE4
CX, CY Range5
RFILT Tolerance
Sensor Resonant Frequency
SELF TEST6
Logic Input Low
Logic Input High
ST Input Resistance to Ground
Output Change at XOUT, YOUT
PWM Output
FSET
T2 Drift versus Temperature
POWER SUPPLY
Operating Voltage Range
Quiescent Supply Current
Turn-On Time7
Conditions
Each axis
Min
X sensor to Y sensor
27
@25°C
0.002
22
30
±0.3
4
30
Self test 0 to 1
RSET = 125 kΩ
Unit
g
%
Degrees
Degrees
%
33
%/g
%
±50
±2
±0.25
%
%
mg/°C
160
µg/√Hz rms
4.7
42
µF
kΩ
kHz
1
50
23
V
V
kΩ
%
1
±0.3
kHz
%
32
5.5
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3
0.7
20
1
Max
±1.2
±0.5
±1
±0.1
±2
% of full scale
Each axis
VS = 5 V
VS = 5 V
Each axis
VS = 5 V
VS = 5 V, 25°C
Typ
6
1.1
V
mA
ms
Guaranteed by measurement of initial offset and sensitivity.
Sensitivity varies with VS. At VS = 3 V, sensitivity is typically 28%/g.
3
Defined as the output change from ambient-to-maximum temperature or ambient-to-minimum temperature.
4
Actual frequency response controlled by user-supplied external capacitor (CX, CY).
5
Bandwidth = 1/(2 × π × 32 kΩ × C). For CX, CY = 0.002 µF, Bandwidth = 2500 Hz. For CX, CY = 4.7 µF, Bandwidth = 1 Hz. Minimum/maximum values are not tested.
6
Self-test response changes with VS. At VS = 3 V, self-test output is typically 8%.
7
Larger values of CX, CY increase turn-on time. Turn-on time is approximately 160 × CX or CY + 4 ms, where CX, CY are in µF.
2
Rev. 0 | Page 3 of 12
ADXL213
ABSOLUTE MAXIMUM RATINGS
Table 2. ADXL213 Stress Ratings
Table 3. Package Characteristics
Parameter
Acceleration (Any Axis, Unpowered)
Acceleration (Any Axis, Powered)
Drop Test (Concrete Surface)
VS
All Other Pins
Rating
3,500 g
3,500 g
1.2 m
–0.3 V to +7.0 V
(COM – 0.3 V) to
(VS + 0.3 V)
Output Short-Circuit Duration
(Any Pin to Common)
Operating Temperature Range
Storage Temperature
Package Type
8-Lead CLCC
θJA
120°C/W
θJC
20°C/W
Indefinite
–55°C to +125°C
–65°C to +150°C
Stresses above those listed under Absolute Maximum Ratings
may cause permanent damage to the device. This is a stress
rating only; functional operation of the device at these or any
other conditions above those indicated in the operational
section of this specification is not implied. Exposure to absolute
maximum rating conditions for extended periods may affect
device reliability.
CRITICAL ZONE
TL TO TP
tP
TP
RAMP-UP
tL
TSMAX
TSMIN
tS
RAMP-DOWN
PREHEAT
03757-0-002
TEMPERATURE
www.BDTIC.com/ADI
TL
t25°C TO PEAK
TIME
Condition
Sn63/Pb37
Pb Free
3°C/second max
Profile Feature
Average Ramp Rate (TL to TP)
Preheat
•
Minimum Temperature (TSMIN)
100°C
150°C
•
Minimum Temperature (TSMAX)
150°C
200°C
60–120 seconds
60–150 seconds
•
Time (TSMIN to TSMAX) (tS)
TSMAX to TL
•
Ramp-Up Rate
Time Maintained above Liquidous (TL)
•
3°C/second
183°C
217°C
60–150 seconds
60–150 seconds
Liquidous Temperature (TL)
•
Time (tL)
Peak Temperature (TP)
Time within 5°C of Actual Peak Temperature (tP)
Ramp-Down Rate
Time 25°C to Peak Temperature
240°C +0°C/–5°C 260°C +0°C/–5°C
10–30 seconds
20–40 seconds
6°C/second max
6 minutes max
8 minutes max
Figure 2. Recommended Soldering Profile
Rev. 0 | Page 4 of 12
Device Weight
<1.0 gram
ADXL213
TYPICAL PERFORMANCE CHARACTERISTICS
25.0
20.0
20.0
Figure 3. X Axis Zero g Bias Deviation from Ideal at 25°C
57
56
55
54
53
52
51
35.0
PERCENT OF POPULATION (%)
20.0
30.0
www.BDTIC.com/ADI
15.0
10.0
0
TEMPCO (mg/°C)
TEMPCO (mg/°C)
Figure 4. X Axis Zero g Bias Tempco
Figure 7. Y Axis Zero g Bias Tempco
30.0
25.0
25.0
DUTY CYCLE OUTPUT (% per g)
DUTY CYCLE OUTPUT (% per g)
Figure 5. X Axis Sensitivity at 25°C
Figure 8. Y Axis Sensitivity at 25°C
Rev. 0 | Page 5 of 12
32.0
31.6
31.2
30.8
30.4
30.0
29.6
04742-0-007
5.0
0
32.0
31.6
31.2
30.8
30.4
30.0
29.6
29.2
28.8
28.4
04742-0-004
5.0
10.0
29.2
10.0
15.0
28.8
15.0
20.0
28.4
20.0
28.0
PERCENT OF POPULATION (%)
30.0
28.0
0
0.1
0.2
0.3
0.4
0.5
0.6
0.7
0.8
0.9
1.0
5.0
0
0.1
0.2
0.3
0.4
0.5
0.6
0.7
0.8
0.9
1.0
–0.3
–0.2
–0.1
04742-0-003
5.0
20.0
04742-0-006
10.0
25.0
–1.0
–0.9
–0.8
–0.7
–0.6
–0.5
–0.4
–0.3
–0.2
–0.1
15.0
–1.0
–0.9
–0.8
–0.7
–0.6
–0.5
–0.4
PERCENT OF POPULATION (%)
50
40.0
25.0
PERCENT OF POPULATION (%)
49
Figure 6. Y Axis Zero g Bias Deviation from Ideal at 25°C
30.0
0
48
DUTY CYCLE OUTPUT (%)
DUTY CYCLE OUTPUT (%)
0
47
46
04742-0-005
5.0
0
57
56
55
54
53
52
51
50
49
48
47
46
45
44
0
04742-0-002
5.0
10.0
45
10.0
15.0
44
15.0
43
PERCENT OF POPULATION (%)
25.0
43
PERCENT OF POPULATION (%)
(VS = 5 V for all graphs, unless otherwise noted.)
ADXL213
31.50
54.0
53.5
53.0
31.25
31.00
SENSITIVITY (%/g)
30.75
51.0
50.5
50.0
49.5
49.0
48.5
48.0
30.50
30.25
30.00
29.75
29.50
29.25
04742-0-010
04742-0-008
29.00
90
80
70
60
50
40
30
20
Figure 12. Sensitivity vs. Temperature – Parts Soldered to PCB
40.0
40.0
35.0
35.0
PERCENT OF POPULATION (%)
Figure 9. Zero g Bias vs. Temperature – Parts Soldered to PCB
30.0
25.0
20.0
15.0
25.0
20.0
15.0
35
35
30
25
20
15
03757-0-005
10
250
240
230
220
210
200
190
180
25
20
15
10
PERCENT SENSITIVITY (%)
PERCENT SENSITIVITY (%)
Figure 11. Z vs. X Cross-Axis Sensitivity
Figure 14. Z vs. Y Cross-Axis Sensitivity
Rev. 0 | Page 6 of 12
5.0
4.0
3.0
2.0
1.0
0
–1.0
–2.0
–3.0
–4.0
0
–5.0
5
5.0
4.0
3.0
2.0
1.0
0
–1.0
–2.0
5
30
03757-0-006
PERCENT OF POPULATION (%)
40
–3.0
170
Figure 13. Y Axis Noise Density at 25°C
40
–4.0
160
NOISE DENSITY (µg√Hz)
Figure 10. X Axis Noise Density at 25°C
–5.0
150
140
130
120
110
100
0
NOISE DENSITY (µg√Hz)
0
04742-0-011
10.0
5.0
250
240
230
220
210
200
190
180
170
160
150
140
130
120
110
100
0
30.0
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10.0
5.0
PERCENT OF POPULATION (%)
10
TEMPERATURE (°C)
04742-0-009
PERCENT OF POPULATION (%)
TEMPERATURE (°C)
0
–10
–20
–30
–40
28.50
–50
28.75
90
80
70
60
50
40
30
20
10
0
–10
–20
–30
47.5
47.0
46.5
46.0
–40
DUTY CYCLE (%)
52.5
52.0
51.5
ADXL213
0.9
100
90
VS = 5V
0.6
0.5
VS = 3V
03757-0-020
30
20
1000
900
0
150
800
10
700
100
40
600
50
TEMPERATURE (°C)
50
500
0
60
400
0.3
–50
3V
70
300
0.4
80
200
CURRENT (mA)
0.7
5V
03757-0-018
PERCENT OF POPULATION (%)
0.8
µA
Figure 18. Supply Current at 25°C
16.0
14.0
14.0
PERCENT OF POPULATION (%)
16.0
12.0
10.0
8.0
10.0
8.0
04742-0-014
4.0
DELTA IN DUTY CYCLE (%)
–18
–19
–20
–21
–22
–23
–24
–25
–26
–27
–28
–29
0
–30
2.0
–18
–19
–20
–21
–22
–23
–24
–25
–26
–27
–28
–29
–30
–31
2.0
6.0
–31
4.0
0
12.0
www.BDTIC.com/ADI
6.0
04742-0-012
PERCENT OF POPULATION (%)
Figure 15. Supply Current vs. Temperature
DELTA IN DUTY CYCLE (%)
Figure 16. X Axis Self Test Response at 25°C
Figure 19. Y Axis Self Test Response at 25°C
26
24
23
22
03757-0-009
90
80
70
60
50
40
30
20
10
0
–10
–20
–30
–50
20
04742-0-013
21
–40
SELF TEST OUTPUT (%)
25
TEMPERATURE (°C)
Figure 17. Self Test Response vs. Temperature
Figure 20. Turn-On Time – CX, CY = 0.1 µF, Time Scale = 2 ms/div
Rev. 0 | Page 7 of 12
ADXL213
THEORY OF OPERATION
PIN 8
XOUT = 80%
YOUT = 50%
PIN 8
XOUT = 50%
YOUT = 80%
TOP VIEW
(Not to Scale)
XOUT = 50%
YOUT = 50%
PIN 8
XOUT = 20%
YOUT = 50%
EARTH'S SURFACE
04742-0-015
PIN 8
XOUT = 50%
YOUT = 20%
Figure 21. Output Response vs. Orientation
The ADXL213 is a complete dual axis acceleration measurement system on a single monolithic IC. It contains a polysilicon
surface-micromachined sensor and signal conditioning
circuitry to implement an open-loop acceleration measurement
architecture. The output signals are duty cycle modulated digital
signals proportional to acceleration. The ADXL213 is capable of
measuring both positive and negative accelerations to ±1.2 g.
The accelerometer can measure static acceleration forces such
as gravity, allowing the ADXL213 to be used as a tilt sensor.
After being low-pass filtered, the duty cycle modulator converts
the analog signals to duty cycle modulated outputs that can be
read by a counter. A single resistor (RSET) sets the period for a
complete cycle. A 0 g acceleration produces a 50% nominal duty
cycle. The acceleration can be determined by measuring the
length of the positive pulse width (t1) and the period (t2). The
nominal transfer function of the ADXL213 is
The sensor is a surface-micromachined polysilicon structure
built on top of the silicon wafer. Polysilicon springs suspend the
structure over the surface of the wafer and provide a resistance
against acceleration forces. Deflection of the structure is measured using a differential capacitor that consists of independent
fixed plates and plates attached to the moving mass. The fixed
plates are driven by 180° out-of-phase square waves. Acceleration deflects the beam and unbalances the differential capacitor,
resulting in an output square wave whose amplitude is proportional to acceleration. Phase sensitive demodulation techniques
are then used to rectify the signal and determine the direction
of the acceleration.
Where in the case of the ADXL213
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The output of the demodulator is amplified and brought offchip through a 32 kΩ resistor. At this point, the user can set the
signal bandwidth of the device by adding a capacitor. This
filtering improves measurement resolution and helps prevent
aliasing.
Acceleration = ((t1/t2) – Zero g Bias)/Sensitivity
Zero g Bias = 50% nominal
Sensitivity = 30%/g nominal
t2 = RSET/125 MΩ
PERFORMANCE
Rather than using additional temperature compensation
circuitry, innovative design techniques have been used to ensure
that high performance is built in. As a result, there is essentially
no quantization error or nonmonotonic behavior, and
temperature hysteresis is very low (typically less than 10 mg
over the –40°C to +85°C temperature range).
Figure 9 shows the zero g output performance of eight parts (X
and Y axis) over a –40°C to +85°C temperature range.
Figure 12 demonstrates the typical sensitivity shift over
temperature for VS = 5 V. Sensitivity stability is optimized for
VS = 5 V, but is still very good over the specified range; it is
typically better than ±2% over temperature at VS = 3 V.
Rev. 0 | Page 8 of 12
ADXL213
APPLICATIONS
POWER SUPPLY DECOUPLING
For most applications, a single 0.1 µF capacitor, CDC, adequately
decouples the accelerometer from noise on the power supply.
However, in some cases, particularly where noise is present at
the 140 kHz internal clock frequency (or any harmonic
thereof), noise on the supply may cause interference on the
ADXL213’s output. If additional decoupling is needed, a 100 Ω
(or smaller) resistor or ferrite beads may be inserted in the
supply line of the ADXL213. Additionally, a larger bulk bypass
capacitor (in the range of 1 µF to 22 µF) may be added in
parallel to CDC.
SETTING THE BANDWIDTH USING CX AND CY
The ADXL213 has provisions for bandlimiting the XOUT and
YOUT pins. Capacitors must be added at these pins to implement
low-pass filtering for antialiasing and noise reduction. The
equation for the –3 dB bandwidth is
F–3 dB = 1/(2π(32 kΩ) × C(X, Y))
or more simply,
F–3 dB = 5 µF/C(X, Y)
DESIGN TRADE-OFFS FOR SELECTING FILTER
CHARACTERISTICS: THE NOISE/BW TRADE-OFF
The accelerometer bandwidth selected ultimately determines
the measurement resolution (smallest detectable acceleration).
Filtering can be used to lower the noise floor, which improves
the resolution of the accelerometer. Resolution is dependent on
the analog filter bandwidth at XFILT and YFILT.
The output of the ADXL213 has a typical bandwidth of 2.5 kHz.
The user must filter the signal at this point to limit aliasing
errors. The analog bandwidth must be no more than one-fifth
the PWM frequency to minimize aliasing. The analog
bandwidth may be further decreased to reduce noise and
improve resolution.
The ADXL213 noise has the characteristics of white Gaussian
noise, which contributes equally at all frequencies and is
described in terms of µg/√Hz (i.e., the noise is proportional to
the square root of the accelerometer’s bandwidth). The user
should limit bandwidth to the lowest frequency needed by the
application in order to maximize the resolution and dynamic
range of the accelerometer.
With the single pole roll-off characteristic, the typical noise of
the ADXL213 is determined by
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The tolerance of the internal resistor (RFILT) can vary typically as
much as ±25% of its nominal value (32 kΩ); thus, the bandwidth varies accordingly. A minimum capacitance of 2000 pF
for CX and CY is required in all cases.
At 100 Hz the noise is
Table 4. Filter Capacitor Selection, CX and CY
Bandwidth (Hz)
1
10
50
100
200
500
rmsNoise = (160 µg / Hz ) × ( BW × 1.6 )
rmsNoise = (160 µg / Hz ) × ( 100 ×1.6 ) = 2 mg
Capacitor (µF)
4.7
0.47
0.10
0.05
0.027
0.01
Often, the peak value of the noise is desired. Peak-to-peak noise
can only be estimated by statistical methods. Table 5 is useful
for estimating the probabilities of exceeding various peak
values, given the rms value.
Table 5. Estimation of Peak-to-Peak Noise
SELF TEST
The ST pin controls the self-test feature. When this pin is set to
VS, an electrostatic force is exerted on the beam of the accelerometer. The resulting movement of the beam allows the user to
test if the accelerometer is functional. The typical change in
output is 750 mg (corresponding to 23%). This pin may be left
open circuit, or may be connected to common in normal use.
Peak-to-Peak Value
2 × RMS
4 × RMS
6 × RMS
8 × RMS
The ST pin should never be exposed to voltages greater than
VS + 0.3 V. If the system design is such that this condition
cannot be guaranteed (i.e., multiple supply voltages present), a
low VF clamping diode between ST and VS is recommended.
Rev. 0 | Page 9 of 12
% of Time that Noise Will Exceed
Nominal Peak-to-Peak Value
32
4.6
0.27
0.006
ADXL213
Peak-to-peak noise values give the best estimate of the
uncertainty in a single measurement. Table 6 gives the typical
noise output of the ADXL213 for various CX and CY values.
Table 6. Filter Capacitor Selection (CX, CY)
Bandwidth(Hz)
10
50
100
500
CX, CY
(µF)
0.47
0.1
0.047
0.01
RMS Noise
(mg)
0.64
1.4
2
4.5
Peak-to-Peak Noise
Estimate (mg)
3.8
8.6
12
27.2
USING THE ADXL213 WITH OPERATING
VOLTAGES OTHER THAN 5 V
The ADXL213 is tested and specified at VS = 5 V; however, it can
be powered with VS as low as 3 V or as high as 6 V. Some performance parameters will change as the supply voltage is varied.
The ADXL213 output varies proportionally to supply voltage. At
VS = 3 V, the output sensitivity is typically 28%/g.
The zero g bias output is ratiometric, so the zero g output is
nominally equal to 50% at all supply voltages.
The output noise also varies with supply voltage. At VS = 3 V, the
noise density is typically 200 µg/√Hz.
USING THE ADXL213 AS A DUAL-AXIS TILT
SENSOR
One of the most popular applications of the ADXL213 is tilt
measurement. An accelerometer uses the force of gravity as an
input vector to determine the orientation of an object in space.
An accelerometer is most sensitive to tilt when its sensitive axis
is perpendicular to the force of gravity, i.e., parallel to the earth’s
surface. At this orientation, its sensitivity to changes in tilt is
highest. When the accelerometer is oriented on axis to gravity,
i.e., near its +1 g or –1 g reading, the change in output acceleration per degree of tilt is negligible. When the accelerometer is
perpendicular to gravity, its output changes nearly 17.5 mg per
degree of tilt. At 45°, its output changes at only 12.2 mg per
degree and resolution declines.
Dual-Axis Tilt Sensor: Converting Acceleration to Tilt
When the accelerometer is oriented so both its X and Y axes are
parallel to the earth’s surface, it can be used as a 2-axis tilt
sensor with a roll axis and a pitch axis. Once the output signal
from the accelerometer has been converted to an acceleration
that varies between –1 g and +1 g, the output tilt in degrees is
calculated as follows:
PITCH = ASIN(AX/1 g)
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Self-test response in g is roughly proportional to the square of
the supply voltage. So at VS = 3 V, the self-test response is
equivalent to approximately 270 mg (typical), or 8%.
The supply current decreases as the supply voltage decreases.
Typical current consumption at VDD = 3 V is 450 µA.
ROLL = ASIN(AY/1 g)
Be sure to account for overranges. It is possible for the
accelerometers to output a signal greater than ±1 g due to
vibration, shock, or other accelerations.
Rev. 0 | Page 10 of 12
ADXL213
PIN CONFIGURATIONS AND FUNCTIONAL DESCRIPTIONS
ADXL213E
TOP VIEW
(Not to Scale)
VS
7
XFILT
T2 2
6
YFILT
COM 3
5
XOUT
4
YOUT
04742-0-016
8
ST 1
Figure 22. ADXL213 8-Lead CLCC
Table 7. ADXL213 8-Lead CLCC Pin Function Descriptions
Pin No.
1
2
3
4
5
6
7
8
Mnemonic
ST
T2
COM
YOUT
XOUT
YFILT
XFILT
VS
Description
Self Test
RSET Resistor to Common
Common
Y Channel Output
X Channel Output
Y Channel Filter Pin
X Channel Filter Pin
3 V to 6 V
www.BDTIC.com/ADI
Rev. 0 | Page 11 of 12
ADXL213
OUTLINE DIMENSIONS
5.00
SQ
1.27
1.78
1.27
4.50
SQ
7
0.50 DIAMETER
1
1.90
2.50
TOP VIEW
1.27
R 0.38
0.15
5
3
0.64 2.50
0.38 DIAMETER
R 0.20
BOTTOM VIEW
Figure 23. 8-Terminal Ceramic Leadless Chip Carrier [LCC]
(E-8)
Dimensions shown in millimeters
ESD CAUTION
ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on the
human body and test equipment and can discharge without detection. Although this product features
proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy
electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance
degradation or loss of functionality.
ORDERING GUIDE
ADXL213 Products
ADXL213AE1
ADXL213AE–REEL1
ADXL213EB
1
Number
of Axes
1
1
Specified
Voltage (V)
5
5
Temperature
Range
–40°C to +85°C
–40°C to +85°C
Package Description
8-Lead Ceramic Leadless Chip Carrier
8-Lead Ceramic Leadless Chip Carrier
Evaluation Board
www.BDTIC.com/ADI
Lead Finish—Gold over Nickel over Tungsten.
© 2004 Analog Devices, Inc. All rights reserved. Trademarks and
registered trademarks are the property of their respective owners.
D04742–0–4/04(0)
Rev. 0 | Page 12 of 12
Package
Option
E-8
E-8