Download Skin Metrology Raj Chhibber

Special guest lecture presented by the Stanford Optical Society
Skin Metrology
Raj Chhibber
CEO BrighTex Bio-Photonics LLC, USA
Thursday, November 18, 2010, 4:15 PM, Hewlett 102 (Refreshments at 4 PM)
Skin metrology for clinical research with optics and image processing is a new and
emerging field for diagnostic studies of a patient’s skin health. The quantification of skin
analysis is important for accurately measuring skin conditions such as UV damage for
early cancer detection, skin topology for aging, and sebum distribution for acne. We have
built an instrument which can give a patient a customized report of his skin health based
on a few quick pictures of the face. Analysis of the data can very readily provide
information about a person’s susceptibility to sun damage or melanoma scoring among
other things and return instant feedback to help patients take preventative measures. The
cosmetic industry is a $10 billion a year industry in America alone. Carrying out product
studies for efficacy and safety by independent research laboratories with our technology
can help verify treatment options and formulate customized cosmetics for skin health.
About the speaker:
Raj Chhibber, CEO, BrighTex Bio-Photonics LLC, San Jose, California, US has 25 years
of experience working in the Silicon Valley area developing metrology equipment for the
semiconductor industry. He has held senior management positions including engineering,
research, and development at Nanometrics, Phase-Metrics, Therma-Wave, Micro
Lithography, Eastman Kodak. He is the founder of many start-up companies in the
semiconductor metrology technology sector In 2002, he founded RCA Metrology, where
he served as CEO until 2003. Soon afterward, he became the CTO of TwinStar Sys. Inc.
And in 2004, he founded BrighTex Bio-Photonics (BTBP) and is currently serving as its
CEO. BTBP is the leader in skin diagnostics for the cosmetic industry, providing
metrology for early cancer detection and skin aging conditions. Raj earned a BSc and MS
in Applied Physics from University of Essex, UK. He also received a Diploma in applied
Physics from the Institute of Physics, UK.