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MonolithIC 3D ICs November 2012 MonolithIC 3D Inc. , Patents Pending MonolithIC 3D Inc. , Patents Pending 1 Monolithic 3D RC-JLT (Recessed-Channel Junction-Less Transistor) MonolithIC 3D Inc. Patents Pending 2 Technology Monolithic 3D IC technology is applied to producing monolithically stacked low leakage Recessed Channel Junction-Less Transistors (RC-JLTs). Junction-less (gated resistor) transistors are very simple to manufacture, and they scale easily to devices below 20nm: • Bulk Device, not surface • Fully Depleted channel • Simple alternative to FinFET Superior contact resistance is achieved with the heavier doped top layer. The RCAT style transistor structure provides ultra-low leakage. Monolithic 3D IC provides a path to reduce logic, SOC, and memory costs without investing in expensive scaling down. MonolithIC 3D Inc. Patents Pending 3 RCJLT – a monolithic process flow Using a new wafer, construct dopant regions in top ~100nm and activate at ~1000ºC Oxide ~100nm Wafer, ~700µm N+ N++ P- MonolithIC 3D Inc. , Patents Pending 4 Implant Hydrogen for Ion-Cut H+ Oxide ~100nm N+ N++ Wafer, ~700µm P- MonolithIC 3D Inc. Patents Pending 5 Hydrogen cleave plane for Ion-Cut formed in donor wafer Oxide N+ ~100nm N++ Wafer, ~700µm H+ ~10nm P- MonolithIC 3D Inc. Patents Pending 6 Flip over and bond the donor wafer to the base (acceptor) wafer Donor Wafer, ~700µm P- ~100nm N++ N+ Oxide H+ 1µ Top Portion of Base Wafer Base Wafer, ~700µm MonolithIC 3D Inc. Patents Pending 7 Perform Ion-Cut Cleave N++ ~100nm N+ Oxide 1µ Top Portion of Base Wafer MonolithIC 3D Inc. Patents Pending Base Wafer ~700µm 8 Complete Ion-Cut ~100nm N++ N+ Oxide 1µ Top Portion of Base Wafer MonolithIC 3D Inc. Patents Pending Base Wafer ~700µm 9 Etch Isolation regions as the first step to define RCAT transistors ~100nm N++ N+ Oxide 1µ Top Portion of Base Wafer MonolithIC 3D Inc. Patents Pending Base Wafer ~700µm 10 Fill isolation regions (STI-Shallow Trench Isolation) with Oxide, and CMP ~100nm N++ N+ Oxide 1µ Top Portion of Base Wafer MonolithIC 3D Inc. Patents Pending Base Wafer ~700µm 11 Etch RCAT Gate Regions Gate region ~100nm N++ N+ Oxide 1µ Top Portion of Base Wafer MonolithIC 3D Inc. Patents Pending Base Wafer ~700µm 12 Form Gate Oxide ~100nm N++ N+ Oxide 1µ Top Portion of Base Wafer MonolithIC 3D Inc. Patents Pending Base Wafer ~700µm 13 Form Gate Electrode ~100nm N++ N+ Oxide 1µ Top Portion of Base Wafer MonolithIC 3D Inc. Patents Pending Base Wafer ~700µm 14 Add Dielectric and CMP ~100nm N++ N+ Oxide 1µ Top Portion of Base Wafer MonolithIC 3D Inc. Patents Pending Base Wafer ~700µm 15 Etch Thru-Layer-Via and RCJLT Transistor Contacts ~100nm N++ N+ Oxide 1µ Top Portion of Base Wafer MonolithIC 3D Inc. Patents Pending Base Wafer ~700µm 16 Fill in Copper ~100nm N++ N+ Oxide 1µ Top Portion of Base Wafer MonolithIC 3D Inc. Patents Pending Base Wafer ~700µm 17 Add more layers monolithically ~100nm ~100nm N++ N+ Oxide N++ N+ Oxide 1µ Top Portion of Base (acceptor) Wafer Base Wafer ~700µm MonolithIC 3D Inc. Patents Pending 18 Benefits for RCJLT • 2x lower power • 2x smaller silicon area • 4x smaller footprint • Layer to layer interconnect density at close to full lithographic resolution and alignment • Performance of single crystal silicon transistors on all layers in the 3D IC • Scalable: scales naturally with equipment capability • Forestalls next gen litho-tool risk • Also useful as Anti-Fuse FPGA programming transistors: programmable interconnect is 10x-50x smaller & lower power than SRAM FPGA • Base logic circuits could be UT-BBOX, FinFET, or JLT CMOS logic devices MonolithIC 3D Inc. Patents Pending 19 RC-JLT flow: Summary Create a layer of Recessed Channel Junction-Less Transistors (RC-JLTs), a junction-less version of the RCAT used in DRAMs, by activating dopants at ~1000°C before wafer bonding to the CMOS substrate and cleaving, thereby leaving a very thin doped stack layer from which transistors are completed, utilizing less than 400°C etch and deposition processes. MonolithIC 3D Inc. Patents Pending 20