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Lecture 4 OUTLINE • PN Junction Diodes – Electrostatics – Capacitance – I/V – Reverse Breakdown – Large and Small signal models Reading: Chapter 2.2-2.3,3.2-3.4 EE105 Fall 2010 Lecture 4, Slide 1 Prof. Salahuddin, UC Berkeley Energy Band Description EE105 Fall 2011 Lecture 4, Slide 2 Prof. Salahuddin, UC Berkeley PN Junction under Reverse Bias • A reverse bias increases the potential drop across the junction. As a result, the magnitude of the electric field in the depletion region increases and the width of the depletion region widens. EE105 Fall 2011 Lecture 4, Slide 3 Prof. Salahuddin, UC Berkeley Energy Band Description EE105 Fall 2011 Lecture 4, Slide 4 Prof. Salahuddin, UC Berkeley I-V characteristic from energy band description EE105 Fall 2011 Lecture 4, Slide 5 Prof. Salahuddin, UC Berkeley Mathematical description of current flow in a p-n junction diode EE105 Fall 2011 Lecture 4, Slide 6 Prof. Salahuddin, UC Berkeley Minority Carrier Injection under Forward Bias • The potential barrier to carrier diffusion is decreased by a forward bias; thus, carriers diffuse across the junction. – The carriers which diffuse across the junction become minority carriers in the quasi-neutral regions; they recombine with majority carriers, “dying out” with distance. np(x) np0 edge of depletion region x' 0 EE105 Fall 2011 x' Equilbrium concentration n of electrons on the P side: p 0 Lecture 4, Slide 7 ni2 NA Prof. Salahuddin, UC Berkeley Minority Carrier Concentrations at the Edges of the Depletion Region • The minority-carrier concentrations at the edges of qV / kT V e e the depletion region are changed by the factor D D / VT – There is an excess concentration (Dpn, Dnp) of minority carriers in the quasi-neutral regions, under forward bias. • Within the quasi-neutral regions, the excess minoritycarrier concentrations decay exponentially with distance from the depletion region, to zero: n p ( x) n p 0 Dn p ( x) Dn p ( x) 2 i VD / VT n e NA e 1 Notation: Ln electron diffusion length (cm) x / Ln J n,diff dn p qDn ni2 VD /VT qDn e 1 e x / Ln dx N A Ln x' EE105 Fall 2011 Lecture 4, Slide 8 Prof. Salahuddin, UC Berkeley Diode Current under Forward Bias • The current flowing across the junction is comprised of hole diffusion and electron diffusion components: J tot J p,drift x 0 J n,drift x 0 J p,diff x 0 J n,diff x 0 • Assuming that the diffusion current components are constant within the depletion region (i.e. no recombination occurs in the depletion region): J n,diff x 0 J tot J S e EE105 Fall 2011 qDn ni2 VD /VT e 1 N A Ln VD / VT J p ,diff x 0 qDp ni2 N D Lp e VD / VT 1 Dn Dp 1 where J S qn N L N L D p A n 2 i Lecture 4, Slide 9 Prof. Salahuddin, UC Berkeley Current Components under Forward Bias • For a fixed bias voltage, Jtot is constant throughout the diode, but Jn(x) and Jp(x) vary with position. Jtot -b EE105 Fall 2011 Lecture 4, Slide 10 0 a x Prof. Salahuddin, UC Berkeley I-V Characteristic of a PN Junction • Current increases exponentially with applied forward bias voltage, and “saturates” at a relatively small negative current level for reverse bias voltages. “Ideal diode” equation: I D I S eVD / VT 1 Dn Dp I S AJ S Aqn N L N L D p A n 2 i EE105 Fall 2011 Lecture 4, Slide 11 Prof. Salahuddin, UC Berkeley Practical PN Junctions • Typically, pn junctions in IC devices are formed by counter-doping. The equations provided in class (and in the textbook) can be readily applied to such diodes if – NA net acceptor doping on p-side (NA-ND)p-side – ND net donor doping on n-side (ND-NA)n-side I D I S (e qVD kT 1) ID (A) Dn Dp I S Aqni L N L N n A p D 2 VD (V) EE105 Fall 2011 Lecture 4, Slide 12 Prof. Salahuddin, UC Berkeley Parallel PN Junctions • Since the current flowing across a PN junction is proportional to its cross-sectional area, two identical PN junctions connected in parallel act effectively as a single PN junction with twice the cross-sectional area, hence twice the current. EE105 Fall 2011 Lecture 4, Slide 13 Prof. Salahuddin, UC Berkeley Diode Saturation Current IS Dn Dp I S Aqni L N L N n A p D 2 • IS can vary by orders of magnitude, depending on the diode area, semiconductor material, and net dopant concentrations. – typical range of values for Si PN diodes: 10-14 to 10-17 A/mm2 • In an asymmetrically doped PN junction, the term associated with the more heavily doped side is negligible: Dp – If the P side is much more heavily doped, I S Aqni L N p D 2 Dn – If the N side is much more heavily doped, I S Aqni Ln N A 2 EE105 Fall 2011 Lecture 4, Slide 14 Prof. Salahuddin, UC Berkeley PN Junction under Reverse Bias • A reverse bias increases the potential drop across the junction. As a result, the magnitude of the electric field in the depletion region increases and the width of the depletion region widens. Wdep 2 si 1 1 V0 VR q N A ND EE105 Fall 2011 Lecture 4, Slide 15 Prof. Salahuddin, UC Berkeley PN Junction Small-Signal Capacitance • A reverse-biased PN junction can be viewed as a capacitor, for incremental changes in applied voltage. Cj EE105 Fall 2011 Lecture 4, Slide 16 si Wdep Prof. Salahuddin, UC Berkeley Voltage-Dependent Capacitance • The depletion width (Wdep) and hence the junction capacitance (Cj) varies with VR. Cj VD C j0 C j0 VR 1 V0 si q N A N D 1 2 N A N D V0 si 10-12 F/cm is the permittivity of silicon. EE105 Fall 2011 Lecture 4, Slide 17 Prof. Salahuddin, UC Berkeley Reverse-Biased Diode Application • A very important application of a reverse-biased PN junction is in a voltage controlled oscillator (VCO), which uses an LC tank. By changing VR, we can change C, which changes the oscillation frequency. f res EE105 Fall 2011 Lecture 4, Slide 18 1 2 1 LC Prof. Salahuddin, UC Berkeley Reverse Breakdown • As the reverse bias voltage increases, the electric field in the depletion region increases. Eventually, it can become large enough to cause the junction to break down so that a large reverse current flows: breakdown voltage EE105 Fall 2011 Lecture 4, Slide 19 Prof. Salahuddin, UC Berkeley Reverse Breakdown Mechanisms a) Zener breakdown occurs when the electric field is sufficiently high to pull an electron out of a covalent bond (to generate an electron-hole pair). b) Avalanche breakdown occurs when electrons and holes gain sufficient kinetic energy (due to acceleration by the E-field) in-between scattering events to cause electronhole pair generation upon colliding with the lattice. EE105 Fall 2011 Lecture 4, Slide 20 Prof. Salahuddin, UC Berkeley Constant-Voltage Diode Model for Large-Signal Analysis • If VD < VD,on: The diode operates as an open circuit. • If VD VD,on: The diode operates as a constant voltage source with value VD,on. EE105 Fall 2011 Lecture 4, Slide 21 Prof. Salahuddin, UC Berkeley Example: Diode DC Bias Calculations IX VX I X R1 VD I X R1 VT ln IS I X 2.2mA for VX 3V I X 0.2mA for VX 1V • This example shows the simplicity provided by a constant-voltage model over an exponential model. • Using an exponential model, iteration is needed to solve for current. Using a constant-voltage model, only linear equations need to be solved. EE105 Fall 2011 Lecture 4, Slide 22 Prof. Salahuddin, UC Berkeley Small-Signal Analysis • Small-signal analysis is performed at a DC bias point by perturbing the voltage by a small amount and observing the resulting linear current perturbation. – If two points on the I-V curve are very close, the curve inbetween these points is well approximated by a straight line: DI D dI D DVD dVD 2 3 x x ex 1 x 2! 3! EE105 Fall 2011 Lecture 4, Slide 23 VD VD1 I s VD1 / VT I D1 e VT VT Prof. Salahuddin, UC Berkeley Diode Model for Small-Signal Analysis • Since there is a linear relationship between the small-signal current and small-signal voltage of a diode, the diode can be viewed as a linear resistor when only small changes in voltage are of interest. Small-Signal Resistance (or Dynamic Resistance) EE105 Fall 2011 Lecture 4, Slide 24 VT rd ID Prof. Salahuddin, UC Berkeley Small Sinusoidal Analysis • If a sinusoidal voltage with small amplitude is applied in addition to a DC bias voltage, the current is also a sinusoid that varies about the DC bias current value. V D(t ) V0 V p cos t V0 I D (t ) I 0 I p cos t I s exp VT EE105 Fall 2011 Lecture 4, Slide 25 V p cos t VT / I 0 Prof. Salahuddin, UC Berkeley