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Transcript
EXPERIMENTS IN
MODERN PHYSICS
Second Edition
Adrian C. Melissinos
UNIVERSITY OF ROCHESTER
Jim Napolitano
RENSSELAER POLYTECHNIC INSTIT UTE
@
ACADEMIC PRESS
An imprint of Elsevier Science
Amsterdam Boston London New York Oxford
San Francisco Singapore Sydney Tokyo
Paris
San Diego
2.3 Experiment on the Hall Eff e ct
63
The main source of systematic uncertainty is likely to come from the
times over which the decaying voltage signal is fitted. At short times, the
decay is not a pure exponential because the transient terms have not all
died away, so we want to exclude these times when we fit. At long times,
there may be some left over voltage level that is a constant added to the
exponential , and aga in, a pure exponential fit will be wrong. Varying the
upper and lower fit limits until we get a set that gives the same answer as
a set that is a little bit larger on both ends is one approach. One should be
convinced that the resu lts are consistent. For example, use aluminum alloy
rods of the same composition but different radii, and check to make sure
that the decay lifetimes t E scale like r 2 . This should certainly be the case
to within the estimated experimental uncertainty.
Having learned how to take and analyze data on resistivity, we can now
investigate the temperature dependence. It is best to start simply by comparing the two samples of ! -in. diameter aluminum rods, one an alloy and
the other a (relatively) pure metal. Vary the temperature by immersing the
samples in baths of ice water, dry ice and alcohol, and liquid nitrogen.
Boiling water or hot oil can also be used. These measurements are tricky.
One must remove the sample from the bath and measure the eddy current
decay before the temperature changes very much. Probably the best way to
do this is to take a single trace right after inserting the sample, stop the oscilloscope, and store the trace. Then one analyzes the trace offline to get the
decay constant. One might also try to estimate how fast the bar warms up by
making additional measurements after waiting several seconds, e.g., after
saving the trace . This would best be done with a sample whose resistivity,
and therefore t E , can be expected to change a lot with temperature. Pure
aluminum is a good choice. Remember that the temperature dependence
will be much different for the pure metal than for the alloy. Try to estimate
the contribution to the mean free path of the electrons due to the impurities.
2.3. EXPERIMENT ON THE HALL EFFECT
In Section 2.2 we saw how collisions of electrons with the crystal lattice
lead to an electrical resistance, when those electrons are forced to move
under an electric field. If one also applies a magnetic field, in a direction
perpendicular to the electric field, then the electrons (and other current
carriers) will be deflected sideways. As a result an electric field appears in
this direction, and therefore also a potential difference. This phenomenon
64
2 Electrons in Solids
is called the Hall effect, and has important applications both in identifying
the current carriers in a material and for practical use as a technique for
measuring magnetic fields.
Let us rewrite the microscopic formula for Ohm's law, but this time
taking care to indicate current density and electric fields as vectors, and
to also note the negative sign of the charge on the electron. Following
Eqs. (2 .12) and (2.13) we write
(2.18)
or
mVd
- - = -eE.
r
(2.19)
It is clear that in Eq. (2.19) we have made an approximation, replacing
the time rate of change of momentum, i.e., dp/dt = mdv Idt ; with an
expression that uses the average acceleration v d/r. This is how we have
taken into account collisions with the crystal lattice.
It is straightforward to modify Eq. (2.19) to take into account the effect
of a magnetic field B. We have
-mVd = -e(E+vd
r
x B).
If we assume that the magnetic field lies in the z direction, and define the
cyclotron frequency We == e Bf m, then we can rewrite this equation as
er
Vd
x
= --Ex
m
Vd y =
Vd z
=
WerVd y
er
- - E y + WerVdx
m
er
- - Ez ·
m
(2.20)
Consider now a long rectangular section of a conductor, as shown in
Fig. 2.13. A longitudinal electric field Ex is applied, leading to a current
density flowing in the x direction. As this electric field is initially turned
on, the magnetic field deflects electrons along the y direction. This leads to
a buildup of charge on the faces parallel to the xz plane, and therefore an
electric field E y within the conductor. In the steady state, this electric field
cancels the force due to the magnetic field, and the current density is strictly
2.3
Experiment on the Hall Effect
65
z
Magnetic field 8 2
t t t t t
~x
(a)
Section
perpendicular
to z axis ;
drift velocity
just starting up.
L..-_=-
.......:....::::l:......
.!IIC.................l
(b)
+
Section
perpendicular
to z axis;
+
+
- Ex
+
+
+
+
+
drift velocity I _:::::::..:::...........!:~~=:!.~.:::l.....J::...:.:!~!:::!:.~
in steady state . ...
(c)
FIGURE 2.13 The standard geometry for discussing the Hall effect (after Kittel).
in the x direction, hence
Ey
=
mco;
e
--Vd
x
Vd y
= O. From Eqs. (2.20) we therefore have
mwc (er
)
e Bx
=- --Ex
= -wcrEx = ---Ex.
e
m
m
The appearance of the electric field E y is the Hall effect.
Aconvenient experimental quantity is the Hall coefficient RH, defined as
Ey
(2.21 )
RH=-
ix B
The quantities E y , i «. and B are all straightforward to measure, and in our
simple approximation for electrons in conductors we have (from Eq. (2.18))
i x = ne 2r Ex/m ; therefore,
ne
(2.22)
66
2 Electrons in Solids
That is, the Hall coefficient is the inverse of the carrier charge density. In
fact, the Hall effect is a useful way to measure the concentration of charge
carriers in a conductor. It is also convenient to define the Hall resistivity as
the ratio of the transverse electric field to the longitudinal current density,
that is,
PH == Ey/jx = BRH,
(2.23)
which depends (in our approximation) only on the material and the applied
magnetic field.
2.3.1. Measurements
In order to measure the Hall effect, one needs a sample of a conductor,
but not an especially good conductor. This is because one also needs a
relativ ely low carrier density ne in order to get a sizable effect ; this of
course leads to a relati vely high resistivity. As seen in Table 2.1, bismuth
is a good candidate metal, and we describe such an experiment here. 11
The setup uses a bismuth sample with rectan gular cross section, mounted
on a probe with attached leads for measuring current and voltage. A thermocouple is also attached to the sample so that temperature measurements
can be carried out. The magnetic field is provided by an electromagnet
capable of delivering a field up to "'5 kG over a volume roughly 1 crrr'.
The bismuth sample probe is shown in Fig. 2.14. The width of the bismuth
sample is w = 6.5 mm and its thickness, measured with a micrometer,
is t = 1.65 x 10- 4 m. The effective length of the sample is the distance
between the leads used to measure the current ("white" and "brown," as
shown in Fig. 2.14). In our case, this distance is f. = 7 mm. Current is
supplied by a DC power supply, connected to the sample through the "red"
and "black" leads. The Hall voltage is measured with a digital multimeter,
using the "green" lead and the output of a potentiometer used to balance
the voltage on the "white" and "brown" leads. A separate bundle of wires
are connected to leads that carry current to the heating resistor, and to a
thermo couple that measure s the temperature of the bismuth sample.
Begin by determining the Hall coefficient at room temperature and for a
relatively high magneti c field. Tum on the electrom agnet power supply to
11 Sem iconductors also make good candidates, with a very low carrier density compared
to a metal. For a description of such a setup, see A. Melissinos, Exper iments in Modem
Physics, First ed., Academic Press, New York, 1966.
' - - - - - - - --
-
-
-
-
-
-
-
-
-
-
-
-
-
-
-
2.3 Experiment on the Hall Effect
67
While
Brown
Cu
While
AI
AI
•
~f--"";_Slor--------t~:;-~
Black
FIGURE 2.14 Schematic of the probe used to make measurements of the Hall effect
in bismuth . Electric al connect ions are made to the bismuth sample using copper leads. A
thermocouple, as well as a resistor which acts as a heat source, is also attached to the sample.
Two separate bundles of wires emerge from the probe, one of which is used exclusively for
heating the sample and for measuring its temperature .
around 4 kG. It will likely need an hour or so to stabilize. In the meantime,
with the sample probe removed from the magnetic field, run about 3 A
through the bismuth sample, and adjust the potentiometer so that the Hall
voltage is zero. Return the current through the sample to zero. The sample
can get quite hot while it is conducting so much current. Be caref ul not to
touch it, or to touch it to anything else.
When the electromagnet is stabilized, measure and record the magnetic
field using a gaussmeter, or by some other technique. Now, place the sample
probe in the center of the magnetic field. Quickly raise the current I through
the sample to 3.0 A, and record the Hall voltage VH. Then, quickly, reduce
the current by 0.25 A, and record the Hall voltage again. You should carry
this series of measurements out rather rapidly to avoid leaving the bismuth
sample at high temperature for any extended period of time. When you
have reduced the current to near zero, and recorded the final value of the
68
2 Electrons in Solids
4
3.5
3
;;-
.s
OJ
Cl
g
Slope = 1.23 mV/A
2.5
2
"0
>
co
I
1.5
0.5
1
0.5
1.5
2
2.5
3
Current through sample (A)
FIGURE 2.15 Sample of Hall effect data, taken at room temperature and with a magnetic
field B = 4.42 kG
Hall voltage, remove the probe and recheck the value of the magnetic
field.
A sample of data taken in this way, at room temperature and with B =
4.42 kG, is shown in Fig. 2.15. A free linear straight line fit gives a slope
of 1.23 mVI A, with an intercept very close to zero. In terms of quantities
related to our measurement, the Hall coefficient (Eq. (2.21» is expressed by
e,
VH/w
RH=jxB=/I (w xf)B
VHf
dVH f
/B=nB'
where we note that our data yields a very good direct proportional
relationship between VH and I. Using SI units, this yields
RH
= (1.23
x10-
3 V)
A
4
(1.65 X 100.442 T
m) = 4.59 x10-
7 m 3 /C
This is quite close to an accepted room temperature value of R H = 5.4 x
10- 7 m3/C for pure bismuth metal. The uncertainties in measuring the
dimensions of the sample can easily account for the discrepancy.
Of course , this sample and this setup can be used to determine the
resistivity of bismuth. Outside of the magnetic field, measure the voltage
2.3 Experiment on the Hall Effect
69
TABLE 2.2 Sample data , taken by a student, for the resi stivity p of
bismuth as a function of temperature, using the Hall effect appar atu s
T (K)
-80
-60
-40
-20
193
213
233
253
273
293
313
333
o
20
40
60
70
85
96
110
121
134
150
163
drop along the length e of the bismuth sample, as a function of the applied
current, and determine the resistivity p from the ratio
The temperature dependence of each of these quantities can be determined
by heating (and cooling) the probe, and recording values as a function of
temperature using readings from the thermocouple.
Table 2.2 lists some results for the resistivity p in ( ~ Q -c m) as a function
of temperature. To examine the temperature dependence it is best to make
a log-log plot of the data vs T since we expect a power law dependence.
This is shown in Fig. 2.16 and when fitted gives
p ex T 1.52 .
Note that at room temperature (T
= 25°C)
p = 1.4 X 10- 4 Q-cm
in reasonable agreement with the data of Table 2.1.
Indeed, one expects a T 3 / 2 dependence of the resistivity on the temperature because of the following argument. From Eq. (2.14) the resistivity is
inversely proportional to the mean time between collisions, as long as the
carrier density remains constant. Now the mean time between collisions is
given by
r
= A/v,
70
2 Electrons in Solids
p
(25°C) =139
(~n-cm)
10 2.4
Temperature T (K)
FIGURE 2.16 The resistivity of bismuth as a function of temperature, taken with the Hall
effect apparatus (data from Table 2.2.) The data are fitted to a power law form .
where A is the mean free path for scattering, and v the thermal velocity of
the electrons. For v we can use
3
1 2
-mv = -kT
2
2
or
v = J3kT/m .
The mean free path, A, decreases as the collision cross section increases,
namely as the lattice vibrations increase with temperature. It is found that
A is inversely proportional to the temperature, and therefore
r ex I/T 3/ 2
or using Eq. (2.14),
pexT 3/ 2 .
We can also examine the temperature dependence of the Hall coefficient. In this case it is best to plot RH on a semi-log plot vs 1/ T . The
reason is that the Hall coefficient (see Eq. (2.22)) is directly inversely proportional to the carrier density, and we expect the carrier density to depend
on the temperature by an exponential factor, such as for instance shown
in Eq. (2.28) . The data are plotted in this way in Fig. 2.17, and we recog nize two distinct slopes. As expected, RH falls with increasing temperature
2.4 Semiconductors
71
::c
E 10°·8
0
"S
0
o
e;;E
....I
....0
10°·7
rl
2.5
2
3.5
3
4
1/T(K)
FIGURE 2.17
4.5
X
5
10- 3
Measurements of the Hall coefficient as a function of temperature.
because the carrier density increa ses. By fitting the data to the form
n ex exp(-Ej2kT) ,
we find for the two region s
low T ,
high T,
E = 0.029 eV
E = 0.120 eV .
Such energy differences are typical of the excitation of impurities. It is
also relevant to note that the carrier density at room temperature is
n
=
I j eRH
=
1.35 x 10 19 cm - 3 .
This is quite high and typical of a conductor.
2.4. SEMIC ONDUCTORS
2.4.1. General Properties of Semiconductors
We have seen in the first section how a free-electron gas behaves, and what
can be expected for the band structure of a crystalline solid. In the second