Download Analog Measurement Test Types

Chapter 22
Test Descriptions
Test Type Descriptions
Overview
The descriptions in this chapter provide detailed information about each of the test types that
can be used in a test program. These test types are entered with the Edit screen described in
Entering Test Steps. Writing Test Programs also gives general information about how many of
these test types are used in a program. This table includes test step descriptions that apply to
the Model TR-8 system, and also for options that can be added to the test system, such as the
Model TR-8-PWR/PWR-2, SMT-2, G-80, DIG-1, and the Model TR-6/FUNC-2 Functional
test system. In most cases, notes are included that show which steps apply to optional modules
that you may or may not have in your System.
Get HELP Fast: To access the test type help page quickly, type in the test type, press the
Enter key, and press the F1 function key.
The following list shows all of the test step types that are available and where to find them:
Analog Measurement Test Types on page 22-4
Resistance Test
RES on page 22-7
Low Resistance Test
LORES on page 22-33
Capacitance Test
CAP on page 22-8
Diode Junction Test
DIODE on page 22-8
Zener Diode Test
ZENER on page 22-9
IC Test
ICS on page 22-10
Set IC Test Range Limits
ICRNG on page 22-11
Inductance Test
INDUC on page 22-11
Voltage Test
VOLT on page 22-12
Continuity (Opens/Shorts) Test
CONT on page 22-12
Discharge Point
DISCH on page 22-14
Pause a Specified Time
PAUSE on page 22-15
Set Measurement Retry Parameters
RETRY on page 22-16
Set Low-Level Measurement Parameters
RESRG on page 22-16
Adjust Potentiometer
POTR / POTU / POTD on page 22-18
Install/Remove UUT Jumpers
JMPER on page 22-19
UUT Switch Test
SWCHR / SWCHD on page 22-19
Test Descriptions
Test Type Descriptions
Model TR-8 Instruction Manual
Make Cable Connection
DMM Measurement Test
Universal Counter/Timer Measurement Test
UCT Trigger Setup
Dynamic Measurement Calibration
TestJet - SMT Opens Test
Capacitor Polarity Test
Transistor/FET Beta
Transformer Polarity Test
High-Voltage Test
WIRE on page 22-20
DMM on page 22-21
UCT on page 22-22
UCTTR on page 22-25
ZERO / GAIN on page 22-25
TESTJ on page 22-26
TJETC on page 22-27
BETA on page 22-27
XFMR on page 22-28
HIPOT / HP1 on page 22-29
Analog Stimulus Test Types on page 22-35
Source Sine Wave
Source Square Wave
Source DC Voltage
Monitor TR-8-PWR/PWR-2 Output
External Signal Input/Output
SINEV on page 22-36
SQRV on page 22-37
DCV on page 22-37
PWRMN on page 22-38
EXTIO on page 22-38
Digital Test Types on page 22-39
Digital Input Test
Digital Output
Digital I/O Configuration
DIG-1 Control
Digital Hardware Test
PC Port Input Test
PC Port Output
Boundary-Scan Test
In System Programming
DIGI on page 22-46
DIGO on page 22-47
DIGA on page 22-48
DIGR on page 22-49
LOGIC on page 22-51
PORTI on page 22-52
PORTO on page 22-52
BSCAN on page 22-52
ISP on page 22-53
Transfer of Control Test Types on page 22-54
Specify Label
LABEL on page 22-55
Jump Unconditionally
JMP on page 22-55
Jump Based on Resistance Measurement
JMPR on page 22-56
Jump Based on Capacitance Measurement
JMPC on page 22-56
Jump Based on Diode Measurement
JMPD on page 22-56
Jump Based on Inductance Measurement
JMPI on page 22-57
Jump Based on Voltage Measurement
JMPV on page 22-57
Jump Based on PWR Measurement
JMPWR on page 22-57
Jump Based on DMM Measurement
JMPDM on page 22-58
Jump Based on UCT Measurement
JMPU on page 22-58
Jump Based on Result of Digital Input
JMPDI on page 22-59
Jump Based on Result of Port Input
JMPPI on page 22-59
Jump Based on Result of Key Input
JMPK on page 22-60
Set Error Counter Used for JMPE
ERROR on page 22-60
Jump Based on Number of Errors
JMPE on page 22-61
Jump Based on Zener Measurement
JMPZ on page 22-61
Jump Based on Self-test
JSTST on page 22-62
Jump Based on Fixture ID
JFXID on page 22-62
Call a Subroutine
CALL on page 22-63
Return from a Subroutine
RET on page 22-63
22-2
Model TR-8 Instruction Manual
Load and Run a Test Program
Load and Run a Test Sub-Program
Return from a Test Sub-Program
Test Descriptions
Test Type Descriptions
RUN on page 22-63
RUNT on page 22-64
RETT on page 22-65
Operator Message Test Types on page 22-65
Display a Short Message to the Operator
DISPL on page 22-66
Display a Message to the Operator
DISP on page 22-66
Erase an Operator Message
DISPE on page 22-66
Display a Picture Image
PICT on page 22-67
Wait for a Key to be Pressed
WAITK on page 22-68
PCB Number Being Tested
PCB on page 22-69
Screen Test Type Table
SCRN on page 22-70
User-Defined Tests on page 22-72
Generate Test Result
Execute User-Written Routine
EVAL on page 22-72
EXEC on page 22-72
Memory Manipulation Test Types on page 22-74
Memory Manipulation (Integer)
MEMI on page 22-75
Memory Manipulation (Real)
MEMR on page 22-78
Memory Manipulation (String)
MEMS on page 22-80
General Purpose Interface Bus (GPIB) I/O on page 22-83
GPIB (IEEE-488) Control
GPIB on page 22-83
RS232 Serial Interface I/O on page 22-86
RS232 Control
RS232 on page 22-86
Miscellaneous Tests on page 22-89
Turn Fixture Vacuum On and Off
Fixture Control
Fixture Identification
Control Relays
Self-test Module
BreakPoint
Fixture-Check
Print Test Results
Sound PC's Beeper
Set Test Conditions
Put a Remark in the Test Program
Conditional Test Report Output
VACUM on page 22-90
FIXCT on page 22-90
FIXID on page 22-91
RELAY on page 22-92
STST on page 22-94
BRKPT on page 22-95
FIXCH on page 22-96
RPRTS on page 22-97
BEEP on page 22-99
FLAGS on page 22-99
REM on page 22-100
RSLTS on page 22-100
The following list shows the general test types that are available and where to find them in this
section:
•
Analog Measurement Test Types on page 22-4
•
Analog Stimulus Test Types on page 22-35
•
Digital Test Types on page 22-39
22-3
Test Descriptions
Analog Measurement Test Types
•
Transfer of Control Test Types on page 22-54
•
Message Test Types on page 22-65
•
User-Defined Tests on page 22-72
•
Memory Manipulation Test Types on page 22-74
•
General Purpose Interface Bus (GPIB) I/O on page 22-83
•
RS232 Serial Interface I/O on page 22-86
•
Miscellaneous Tests on page 22-89
Analog Measurement Test Types
Analog Measurement Test Types
•
Test Step Range Values on page 22-5
•
Resistance Test on page 22-7
•
Low Resistance Test on page 22-33
•
Capacitance Test on page 22-8
•
Diode Test on page 22-8
•
Zener Diode Test on page 22-9
•
IC Test on page 22-10
•
IC Test Range Limiting on page 22-11
•
Inductor Test on page 22-11
•
Voltage Test on page 22-12
•
Continuity Test on page 22-12
•
Discharge Point on page 22-14
•
Pause a Specified Time on page 22-15
•
Set Measurement Retry Parameters on page 22-16
•
Set Low-Level Measurement Parameters on page 22-16
•
Adjust Potentiometer on page 22-18
•
Install/Remove Jumpers on page 22-19
•
Set Switch on page 22-19
•
Make Cable Connection on page 22-20
•
DMM Measurement Test on page 22-21
•
Universal Counter/Timer Measurement Test on page 22-22
•
UCT Trigger Setup on page 22-25
•
Dynamic Measurement Calibration on page 22-25
•
Test for SMT Opens on page 22-26
•
Test for Capacitor Polarity on page 22-27
22-4
Model TR-8 Instruction Manual
Model TR-8 Instruction Manual
•
Test for Transistor/FET Beta on page 22-27
•
Test for Transformer Polarity on page 22-28
•
High-Voltage Test on page 22-29
Test Descriptions
Analog Measurement Test Types
Test Step Range Values
For most analog measurements (resistance, capacitance and inductance) the range column in
the test program specifies the measurement range, whether guarding is used, and so on. In
most cases, the System automatically generates the range value used for each analog test step
in the test program for you. As a result, you normally don't have any reason to be concerned
about specifics of the range value.
However, you may be interested in how the actual range value is derived or create your own
range and then type it in. The following table shows the specifics of the range as it applies for
most of the TR-8 analog measurement test types. The System chooses the appropriate value
from each section of the table and adds them all together to form the final range value. For
example, the test step range for a CAPacitance test using 200mV output stimulus at 1kHz
would be 49.
Resistance DCI Auto-Range Note
Res range values with the six least significant bits set to 0 cause the system
to take auto-range resistance DCI measurements. See ResRg range 106 on
page 22-16 for additional Res DCI auto-range control.
22-5
Test Descriptions
Analog Measurement Test Types
Model TR-8 Instruction Manual
Test Step Range for RES/CAP/INDUCT
Parameter
Value
Description
Voltage/Current Range
0-12
For Current Mode measurements, see the range
value in the test type description
0
2V output range for Voltage Mode
1
200mV output range for Voltage Mode
Frequency/Function
Bias
(AC Voltage Mode Only)
Guarding
2
20mV output range for Voltage Mode
0
DCI
16
DCV
32
100Hz
48
1kHz
20
10kHz
24
100kHz
0
No Bias
64
Positive Bias
128
Negative Bias
0
No Guarding
256
Guarding Active
External Sense
0
No External Sense
512
External Sense Active
Initial Current Meas Range
0
12mA
(Voltage Mode Only)
1024
1.2mA
2048
120µA
3072
12µA
4096
1.2µA
Initial Voltage Meas Range
0
4.8V
(Voltage Mode Only)
8192
0.48V
16384
48mV
24576
4.8mV
Swap Calculation Model
0
Normal Calculation Model
(Voltage Mode Only)
32768
Swap Calculation Model
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Model TR-8 Instruction Manual
Test Descriptions
Analog Measurement Test Types
Resistance Test
Measures the resistance value between two test points and generates a result.
Range Note
The ranges shown in the table below apply to the DC-Current measurement
method. If the voltage measurement mode is used, see the test step range
value table on page 22-5 at the beginning of this section. The nominal
ranges shown below are usable to 90% over-range (minus about 15Ω when
not externally sensed). For example, the 1kΩ range can be used for
readings up to 1.9kΩ.
Also see the RETRY and RESRG test types for further specification of how the measurements
are taken.
O_Rng Note
To enter a value higher than the system can measure, type in 20M or
O_Rng. This value, displayed as > 19 M, is greater than any normally
measured value, and will never cause a failure on the high side. An overrange measurement is shown as O_Rng in the measured value.
The menu selection Measure > Step Analysis (or press the F6 function key) in the edit test
program window opens the analysis window. The analysis window allows you to specify
certain measurement parameters such as range, settling delay time, external sense points,
polarity, offset, and gain.
Parameters
Description
Test Type
RES
Title
Description of measured component (e.g., R234)
Range
1 = 100Ω (0.2V/1mA)
2 = 1kΩ (2V/1mA)
3 = 10kΩ (2V/0.1mA)
4 = 100kΩ (2V/10µA)
5 = 1MΩ (2V/1µA)
6 = 10MΩ (2V/0.1µA)
7 = 1kΩ (0.2V/0.1mA)
8 = 10kΩ (0.2V/10µA)
9 = 100kΩ (0.2V/1µA)
10 = 1MΩ (0.2V/0.1µA)
11 = 100Ω (2V/10mA)
12 = 10Ω (0.2V/10mA)
17 = Default entry (see Range Note above)
From (-) Point
Negative polarity test point
To (+) Point
Positive polarity test point
Low Limit
Low test limit in ohms
High Limit
High test limit in ohms
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Test Descriptions
Analog Measurement Test Types
Model TR-8 Instruction Manual
Capacitance Test
Measures capacitance between two test points and generates a test result.
The ranges shown in the following table apply to the DC-Current measurement method. If the
AC voltage measurement mode is used, see the test step range table on page 22-5 at the
beginning of this section.
Also see the RETRY test type for further specification of how the measurements are taken.
O_Rng Note
To enter a value higher than the system can measure, type in 20M or
O_Rng. This value, displayed as > 50 m, is greater than any normally
measured value, and will never cause a failure on the high side. An overrange measurement is shown as O_Rng in the measured value.
Parameter
Description
Test Type
CAP
Title
Description of measured component (e.g., C31)
Range
1 = 5,000µF (0.2V/1mA)
2 = 500µF (2V/1mA)
3 = 50µF (2V/0.1mA)
4 = 5µF (2V/10µA)
5 = 0.5µF (2V/1µA)
6 = .05µF (2V/0.1µA)
8 = 500µF (0.2V/0.1mA)
9 = 50µF (0.2V/10µA)
10 = 5µF (0.2/1µA)
11 = 0.5µF (0.2V/0.1µA)
13 = 5,000µF (2V/10mA)
14 = 50,000µF (0.2V/10mA)
49 = Default entry (see Test Step Range Values on page 22-5)
From (-) Point
Negative polarity test point
To (+) Point
Positive polarity test point
Low Limit
Low test limit in farads
High Limit
High test limit in farads
Diode Test
Applies a constant current across the semiconductor junction, measures the voltage drop and
generates a test result.
For typical diode measurements, the 'From(-)' test point is connected to the cathode of the
diode and the 'To(+)' test point is connected to the anode of the diode. The voltage drop of
typical diodes is approximately .6 V. The measured voltage is expected to be between the Low
and High Limits. The voltage range is 0 through 9.9 volts. Measurements taken on the 2V
range can be guarded. Guarding can also be used on adjacent circuit points to apply more
current across the diode being measured.
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Model TR-8 Instruction Manual
Test Descriptions
Analog Measurement Test Types
Also see the RETRY test type for further specification of how the measurements are taken.
See the ZENER test type for diode measurements that need additional current or higher
voltages.
O_Rng Note
To enter a value higher than the system can measure, type in 20M or
O_Rng. This value, displayed as O_Rng, is greater than any normally
measured value, and will never cause a failure on the high side. An overrange measurement is shown as O_Rng in the measured value.
Parameter
Description
Test Type
DIODE
Title
Description of measured component (e.g., D101)
Range
1, 2 = Source 1mA, measure up to 2V
3 = Source 0.1mA, measure up to 2V
4 = Source .01mA, measure up to 2V
5 = Source 1µA, measure up to 2V
6 = Source 0.1µA, measure up to 2V
7 = Source 1mA, measure up to 10V
8 = Source 0.1mA, measure up to 10V
9 = Source .01mA, measure up to 10V
10 = Source 1µA, measure up to 10V
11 = Source 0.1µA, measure up to 10V
12 = Source 10mA, measure up to 2V
13 = Source 10mA, measure up to 10V
From (-) Point
Cathode (-) test point for diode
To (+) Point
Anode (+) test point for diode
Low Limit
Low test limit in volts (typically 0.4 V)
High Limit
High test limit in volts (typically 0.9 V)
Zener Diode Test
Applies approximately 10mA of DC constant-current through the diode and measures a
voltage of up to 18 VDC using the solid-state test points (MPX modules). If the TR-8PWR/PWR-2 source is specified (by using test point numbers between 1631 and 1646), the
source current is 100mA and voltages up to 12V can be measured.
The ZENER test can be used in place of the DIODE test type when current greater than 1mA is
necessary or when voltages greater than 10 volts need to be measured.
O_Rng Note
To enter a value higher than the system can measure, type in 20M or
O_Rng. This value, displayed as > 18, is greater than any normally
measured value, and will never cause a failure on the high side. An overrange measurement is shown as > 18 in the measured value.
The menu selection Measure > Step Analysis (or press the F6 function key) in the edit test
program window opens the analysis window. The analysis window allows you to specify
measurement parameters such as the settling delay time and power source.
22-9
Test Descriptions
Analog Measurement Test Types
Model TR-8 Instruction Manual
Parameters
Description
Test Type
ZENER
Title
Description of measurement (e.g., CR3)
Range
Time, in mSec, to wait after applying the current and before
beginning the voltage measurement. This can be used to allow
time for parallel capacitances to charge.
From (-) Point
Negative polarity test point
To (+) Point
Positive polarity test point
Low Limit
Low test limit in volts
High Limit
High test limit in volts
IC Test
Allow for measurement of diode junctions at the pins of ICs. These diodes are typically
present at the inputs and outputs of ICs to protect the IC from damage by clamping the input
voltage between the power supply rails (e.g., VCC and GND for typical logic ICs).
This test type can measure from two power supply rails (e.g., VCC and GND) to all other pins
on the assembly. The system measures by applying a constant current, then measuring the
voltage drop and ensuring that it falls between the high and low test limits.
The measurement points for this test step type are programmed by using the Edit/Enter IC Test
Data window. The menu selection Measure > Step Analysis F6 in the edit test program
window opens the Edit/Enter IC Test Data window.
By using four different ICs test steps in a program (each with its own range value of 1, 2, 3, or
4), UUTs with up to eight power supply rails can be verified to each point. Under normal
circumstances, the System uses 1mA as the measurement current, but this can be reduced in
decade values by specifying special range values. Also see the ICRNG test type for
information on bounding the test point ranges to accommodate multi-PCB panels.
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Model TR-8 Instruction Manual
Test Descriptions
Analog Measurement Test Types
Parameter
Description
Test Type
ICS
Title
Description of measured component (e.g., IC Tests)
Range
Sum of the following:
1 = Use first set of test data
2 = Use second set of test data
3 = Use third set of test data
4 = Use fourth set of test data
0 = Use 1mA measurement current
16 = Use 0.1mA measurement current
32 = Use 10µA measurement current
64 = Use 1µA measurement current
From (-) Point
More negative (-) power supply rail to test from
(e.g., GND)
To (+) Point
More positive (+) power supply rail to test from
(e.g., VCC)
Low Limit
Low test limit in volts (typically 0.4V)
High Limit
High test limit in volts (typically 0.9V)
IC Test Range Limiting
Allow for limiting the range of test points that are used when executing the next ICS test step.
This test type can be used to separate a single range of IC test data (range = 1, 2, 3 or 4) into
several distinct sections, such as when testing multiple PCB panels. When non-overlapping
ICRngs are used, the to and from pins of ICS test steps using the same range of data can be
different.
Parameter
Description
Test Type
ICRNG
Title
Description (typically not used)
Range
Not used
From (-) Point
Beginning test point
To (+) Point
Ending test point
Low Limit
Not used
High Limit
Not used
Inductor Test
Measures inductance between two test points and generates a test result.
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Test Descriptions
Analog Measurement Test Types
Model TR-8 Instruction Manual
Parameter
Description
Test Type
INDUC
Title
Description of measured component (e.g., L302)
Range
See the test step range table on page 22-5 at the beginning of
this section. Measurements use 100Hz, 1kHz, 10kHz, or 100kHz
stimulus.
From (-) Point
Negative polarity test point
To (+) Point
Positive polarity test point
Low Limit
Low test limit in henrys
High Limit
High test limit in henrys
Voltage Test
Measures a DC voltage and generates a test result. This test can be used to test on-board
batteries or to test for charged capacitors. The usable voltage range is 0 through +9.9 volts
referenced to ground potential. See the DMM test type (available with optional Model TR6/FUNC-2) for more general voltage measurements.
Parameter
Description
Test Type
VOLT
Title
Description of measured component (e.g., BT101)
Range
1 = Measure up to 200mV
2 = Measure up to 2V
0, 3 = Measure up to 10V
Range
Not used
From (-) Point
Most negative test point for voltage
To (+) Point
Most positive test point for voltage
Low Limit
Low test limit in volts
High Limit
High test limit in volts
Continuity Test
Measures all combinations of solid-state test points between the `From (-) Point' and `To (+)
Point', and TR-6/FUNC-2/TR-6-1 relay test points between the Low Limit and High Limit for
opens and shorts. There are 2 data sets that can contain unique continuity connections. There
can be multiple CONT tests in a single test program using one data set, but the range of tested
points cannot overlap between any of the individual CONT tests since there is only one failure
database for the data set. Using the 2 data sets with separate threshold limits allows testing for
low resistance for connected test points and high resistance for non-connected test points.
To use the Model HP-1, High Voltage Testing on page 22-29 with the CONTinuity test type,
the range of points specified in the `From (-) Point' and `To (+) Point' columns will be from
1951 to 1998. The `From (-) Point' must be 1951 or higher and the `To (+) Point' must be
1998 or lower.
To automatically learn or specify the expected outcome of individual CONT tests, select the
CONT test step in the Edit Test Program window, and then select 'Step Analysis'. The menu
selection Measure > Step Analysis F6 in the edit test program window opens the Continuity
22-12
Model TR-8 Instruction Manual
Test Descriptions
Analog Measurement Test Types
/ No Care Information window. Each CONT test step uses one set of resistance thresholds.
The test program contains four sets of resistance thresholds. In the Continuity / No Care
Information window, use the menu item Setup > Set Threshold to select and/or edit the set of
thresholds used by the CONT test step. Also see Assigning Continuity Thresholds on page 928 setup.
The Continuity Failure Analysis on page 9-28 can often provide additional information to help
isolate the failure.
22-13
Test Descriptions
Analog Measurement Test Types
Model TR-8 Instruction Manual
Parameter
Description
Test Type
CONT
Title
Description (typically not used, or 'Opens/Shorts')
Range
0 = Normal test using the first continuity data set
1 = The test will ignore inactive points in the first continuity data set during
continuity testing optimizations. Any point that is inactive is not included in any
continuity measurements and is not connected to any other points during a
continuity test. This slows test execution, but can be used to help prevent continuity
errors on points connected to batteries on the UUT. For reliable test results on
assemblies with batteries or large capacitors, set at least one point connected to
the voltage as inactive and set the CONT test step Range to 1 (or 3). Remember
to relearn the CONT map (Measure > Self-Learn All) after making the points
inactive and setting the Range to 1 (or 3).
2 = Normal test using the second continuity data set
3 = Same as Range 1 using the second continuity data set
Advanced features:
Add 256 = Test for opens is not performed
Add 512 = Test for shorts is not performed
256 = Test only to verify non-connected points using the first continuity data set.
Connected points are not verified.
257 = Test only to verify non-connected points and ignore inactive points in
the first continuity data set during continuity testing optimizations.
Connected points are not verified.
258 = Test only to verify non-connected points using the second continuity
data set. Connected points are not verified.
259 = Test only to verify non-connected points and ignore inactive points in the
second continuity data set during continuity testing optimizations.
Connected points are not verified.
512 = Test only to verify connected points using the first continuity data set.
Non-connected points are not verified.
513 = Test only to verify connected points and ignore inactive points in
the first continuity data set during continuity testing optimizations.
Non-connected points are not verified.
514 = Test only to verify connected points using the second continuity
data set. Non-connected points are not verified.
515 = Test only to verify connected points and ignore inactive points in the
second continuity data set during continuity testing optimizations.
Non-connected points are not verified.
From (-) Point
Lowest test point number of continuity test for solid-state test points (1-1600 or
2001-8400). Specify 1951-1998 for the HP-1.
To (+) Point
Highest test point number of continuity test for solid-state test points (1-1600 or
2001-8400). Specify 1951-1998 for the HP-1.
Low Limit
If non-zero, lowest test point number for continuity test of relay test points (16011950).
High Limit
If non-zero, highest test point number for continuity test of relay test points (16011950).
Discharge Point
The specified test points are both connected to ground potential for a specified time. The
ground path (with range = 0) is approximately 400 Ω resistance (or about 600 Ω between the
two points through ground).
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Model TR-8 Instruction Manual
Test Descriptions
Analog Measurement Test Types
If the Low Limit is 1 through 6, the System uses the System's current source to charge the two
test points in the specified polarity. The Low Limit indicates the current range to use. This
function can be used to discharge caps or reverse the charge between two points. The System's
current source can source, but not sink, current.
If the Low Limit is 7, the System connects all of the test points in the System together,
effectively discharging everything.
Note
If Low Limit = 7 is used, the discharge impedance is low (about 50 Ω), so
caution must be taken that the current through the discharge path does not
exceed 15mA. Doing so can damage the MDA System. Consequently
there should not be more than about .75V present between any two points.
Parameter
Description
Test Type
DISCH
Title
Not used
Range
Time to pause in milliseconds
From (-) Point
Point to discharge or charge (-)
To (+) Point
Point to discharge or charge (+)
Low Limit
0 = Discharge Points
1, 2 = Charge points at 1mA
3 = Charge points at 0.1mA
4 = Charge points at .01mA
5 = Charge points at 1µA
6 = Charge points at 0.1µA
11 = Charge points at 10mA
7 = Discharge all test points (see note above)
High Limit
Not used
Pause a Specified Time
Parameter
Description
Test Type
PAUSE
Title
Not used
Range
Time to pause in milliseconds (0-32000 mSec)
From (-) Point
Not used
To (+) Point
Not used
Low Limit
Not used
High Limit
Not used
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Test Descriptions
Analog Measurement Test Types
Model TR-8 Instruction Manual
Set Measurement Retry Parameters
Specifies re-measurement actions the System takes if a test step failure occurs for RES, CAP
and DIODE test types.
Also affected by these settings are the associated JMP for each analog test, i.e., JMPR, JMPC,
JMPI, and JMPD.
This test type allows modification, at program execution-time, of the measurement parameters
set in the 'Setup' menu in the Edit screen. This test type can be used to increase the values for
problem points, or to increase the speed of failures when executing JMP-type analog
measurements.
Parameter
Description
Test Type
RETRY
Title
Normally not used, but if the title is RESET, the other fields are ignored and the
default retry characteristics (as present when beginning the test) are restored.
Range
The maximum time, in mSec, to retry a DIODE test before reporting a failure. Can
be used when capacitors in parallel with the diode need to charge.
From (-) Point
The maximum number of retries before reporting a RES failure.
To (+) Point
The maximum number of retries before reporting a CAP failure.
Low Limit
The maximum time, in mSec, to wait for the test points used in a RES test to
discharge before beginning a measurement (when using Current Mode). If this
parameter is set to 0, no checking for charged test points is made prior to RES
measurements.
High Limit
Maximum time, in mSec, to wait between repeating a RES measurement. During
this time, the System endeavors to charge or discharge the measurement to the
correct value. Used for Current Mode measurements only.
Set Low-Level Measurement Parameters
Specifies measurement parameters such as delay time and number of samples averaged on
analog measurements such as RES, JMPR, VOLT, CAP and INDUC. This test-type can be
used to modify some of the analog measurement parameters during a test sequence to optimize
measurements. Many of these values are the same as those set in the Resistance Measurement
Characteristics screen and replace those values for the remainder of the test.
When range values of 1-10 are specified, current-mode measurements are modified. When
range values of 11-14 are specified, voltage mode measurements are modified. Range values
of 17-22 modify VOLT test-type measurements.
This test type can be used to increase the values for problem measurements or to increase
accuracy. The menu selection Measure > Step Analysis F6 in the editor provides an easy to
use, push button method, to setup this test step.
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Test Descriptions
Analog Measurement Test Types
Parameter
Description
Test Type
RESRG
Title
Normally not used, but if the title is RESET, the other fields are ignored and
the default measurement characteristics (as present when beginning the
test) are restored.
Range
1 = 100Ω (0.2V/1mA)
2 = 1kΩ (2V/1mA)
3 = 10kΩ (2V/0.1mA)
4 = 100kΩ (2V/10µA)
5 = 1MΩ (2V/1µA)
6 = 10MΩ (2V/0.1µA)
7 = 1kΩ (0.2V/0.1mA)
8 = 10kΩ (0.2V/10µA)
9 = 100kΩ (0.2V/1µA)
10 = 1MΩ (0.2V/0.1µA)
11 = Samples averaged for voltage-mode RES readings
12 = Samples averaged for voltage-mode CAP readings
13 = Samples averaged for voltage-mode INDUC readings
14 = Re-measures reference voltages to which voltage
measurements are calibrated.
15 = 100Ω (2V/10mA)
16 = 10Ω (.2V/10mA)
17 = Samples averaged for each VOLT reading group
19 = High Limit contains number of groups averaged for
VOLT readings (default = 1, maximum = 1000)
20 = High Limit contains discard value for VOLT readings if groups
averaged is greater than one. Any group readings above specified
percentage greater than reading average are discarded (default = 0).
For example, if High Limit is 50, group samples greater than 50%
above the average are discarded. Low Limit is similar, but discards
readings specified percentage below the average. For example, if
Low Limit is 50 (default = 0), group samples less than 50% of the
average are discarded.
21 = High Limit contains time, in mSec, after switching, but before taking
a VOLT reading (default = 0).
22 = High Limit contains scale factor for VOLT readings (default = 1).
24 = Sets the logic low and high thresholds to the Low Limit and High
Limit values respectively. See the command line parameters for
/loglo (logic low) and /loghi (logic high).
99 = Samples averaged and delay for TESTJ readings.
105 = Updates the current test program from the ASCII file named
in the Test Title. The directory of this ASCII file is the same as
the Visual MDA executable, normally "C:\checksum".
106 = Sets the maximum Res DCI range used during an auto-range
measurement. The Low Limit controls the maximum range and
sequence.
From (-) Point
Not used
To (+) Point
Not used
Low Limit
For range values 10 or less (and 15, 16), the delay, in mSec, after applying
the constant-current source and before beginning the measurement. For
range value 20, specifies low discard range for VOLT readings.
For range value 106, set the Low Limit to 0 to use the default auto-ranging
(starting range is 12 then 1, 2, 3, 4, 5, 6). Set the Low Limit to 12, 11, 2, 3,
4, 5, or 6 and the highest auto-range will be set in this sequential order. See
the Res test type on page 22-7 for the meaning of the range values 2
through 12. The measured value is determined by the first measurement
that is not over-range (O_Rng).
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Analog Measurement Test Types
High Limit
Model TR-8 Instruction Manual
For range values 17 or less, the number of samples averaged for the
measurement. For other range values, see specific range description for
assignment.
Adjust Potentiometer
Allow operator adjustment of a potentiometer on the UUT using resistance, voltage or
counter/timer measurements. The System first measures the two test points. If the
measurement falls between the test limits, a result is logged (just as with a RES, UCT or DMM
test), and the next test step is executed (uses TR-8 for POTR, TR-6/FUNC-2 for POTU and
POTD).
If the initial reading is not within limits, the System displays the name of the component (taken
from the test title), the upper and lower limits (taken from the test limits), an analog meter
representation, and a request to the operator to make an adjustment. The System then displays
an updated measurement value, both graphically and numerically, to allow the operator to
make the adjustment. When the operator is done with the adjustment, any key can be pressed
to continue, after which the System makes a pass/fail evaluation based on the last reading
taken.
If a different adjustment criteria is required, you can create alternatives to this routine by using
several discrete test types as shown in the Test Program Examples section.
If the test title contains an up-arrow (^), the System will not display the analog meter on the
screen. If the test title contains an at-sign (@), the System requests that the operator adjust the
pot regardless of whether the initial reading is in-limits or not. If the test title contains an
ampersand (&), the analog meter movement polarity is reversed. This can be used to give the
operator a better sense for the direction to turn the pot during the adjustment.
O_Rng Note
To enter a value higher than the system can measure, type in 20M or
O_Rng. This value, displayed as > 19 M (for POTR) or > 250 (for POTD),
is greater than any normally measured value, and will never cause a failure
on the high side. An over-range measurement is shown as O_Rng in the
measured value.
Parameter
Description
Test Type
POTR (measuring TR-8 resistance)
POTU (measuring with UCT)
POTD (measuring with DMM)
Title
Description of measured component (e.g., R234). Also see the
description above for more detailed information about modifying
operation of the POTx test with the test title.
Range
From (-) Point
To (+) Point
Low Limit
High Limit
All of these fields are
the same as:
See test type RES for POTR
See test type UCT for POTU
See test type DMM for POTD
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Test Descriptions
Analog Measurement Test Types
Install/Remove Jumpers
Allow operator installation or removal of missing or additional jumpers on the UUT. The
System first measures the resistance of the two test points. If the measurement falls between
the test limits, a result is logged (just as with a RES test) and the next test step is executed.
If the initial reading is not within limits, the System displays the name of the jumper (taken
from the test title) to remove or install. If the Low Limit is zero, the operator is instructed to
install the jumper. If the Low Limit is not zero, the operator is instructed to remove the
jumper. Once the test passes (such as when the operator corrects the jumpers), the next test is
executed. The operator can abort the test step (causing a failure) by pressing the F1 key.
If different operator interaction criteria is required, you can create alternatives to this routine
by using several discrete test types as shown in the Test Program Examples section. The
System generates two lines on the monitor when using this test type, then erases them when
completed.
Typical Low and High Limits for an installed jumper are 0 and 100Ω. Typical limits for an
open jumper are 100Ω and 20MΩ (which is displayed as > 19M).
O_Rng Note
To enter a value higher than the system can measure, type in 20M or
O_Rng. This value, displayed as > 19 M, is greater than any normally
measured value, and will never cause a failure on the high side. An overrange measurement is shown as O_Rng in the measured value.
Parameter
Description
Test Type
JMPER
Title
Description of measured component (e.g., JP3-4)
Range
same as RES test type
From (-) Point
same as RES test type
To (+) Point
same as RES test type
Low Limit
same as RES test type
High Limit
same as RES test type
Set Switch
Allows testing for correct switch settings on the UUT. The System first measures the between
the two test points (TR-8 resistance for SWCHR or a TR-6/FUNC-2 DMM measurement with
SWCHD). If the measurement falls between the test limits, a result is logged (just as with a
RES or DMM test) and the next test step is executed.
If the initial reading is not within limits, the System asks the operator to toggle the switch (the
name of which is taken from the test title).
Once the test passes (such as when the operator corrects the switch setting), the next test is
executed. The operator can abort the test step (causing a failure) by pressing the [F1] key.
If different operator interaction criteria is required, you can create alternatives to this routine
by using several discrete test types as shown in the Test Program Examples section. The
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Analog Measurement Test Types
Model TR-8 Instruction Manual
System generates two lines on the monitor when using this test type, then erases them when
completed.
When using SWCHR, typical Low and High Limits for a switch to be closed are 0 and 100Ω.
Typical limits for a switch that is to be open are 100Ω and 20MΩ (which is displayed as >
19M).
O_Rng Note
To enter a value higher than the system can measure, type in 20M or O_Rng. This value,
displayed as > 19 M, is greater than any normally measured value, and will never cause a
failure on the high side. An over-range measurement is shown as O_Rng in the measured
value
Parameter
Description
Test Type
SWCHR (for resistance measurement)
SWCHD (for DMM measurement)
Title
Description of measured component (e.g., SW3-c)
Range
From (-) Point
To (+) Point
Low Limit
High Limit
All of these fields are the same as:
RES for SWCHR, or
DMM for SWCHD
Make Cable Connection
Allows specification of a connection to be made when building a cable or harness. The
System measures between the two test points, compares the reading to the high and low test
limits, and generates a pass or fail based on the result.
If the "From (-) Point" is probed, the system displays a message to the operator:
Connect from <From-point name> to <To-point name>
Press [F1] to fail test...
If the test title is not blank, it can be used to provide a customized message to the operator. In
this case, the System replaces the text after "Connect from" with the contents of the test title.
The first up-arrow (^) found in the test title is replaced with the From (-) Point name. The
second up-arrow found in the test title is replaced with the To (+) Point name. When used in
this mode, the test title that would be the equivalent of the standard message would be "^ to ^".
After presenting the message, the System waits for the connection to be completed, another
point to be probed, or the [F1] key to be pressed. When any of these events occur, the System
beeps and then erases the above message from the CRT. In order to optimize speed, when
performing this test the System always uses the 100 Ω current mode range to perform the
measurements. As such, expected measurements should be less than 160 Ω.
An example test program to build a simple cable with four connections is shown below. When
this test program is executed, the System will wait until all the connections are made before
ending execution. The number of connections not made is shown in the upper right corner of
the display as the number of errors. The operator can either make each connection without
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Test Descriptions
Analog Measurement Test Types
instructions, or probe a point shown as a "From (-) Point", then receive the message about how
to make the connection.
Parameter
Description
Test Type
WIRE
Title
If used, contains a custom description of connection to be made if
the "From (-) Point" is probed (e.g., Red to J2-2)
Range
not used (System always uses 100Ω DC Current range)
From (-) Point
same as RES test type
To (+) Point
same as RES test type
Low Limit
same as RES test type
High Limit
same as RES test type
Example Test Program for Building a Cable
DMM Measurement Test
Measures the AC (true-RMS), DC voltage, or resistance value between two test points and
generates a result. The measurement is made and compared against the high and low test
limits. Requires that you have the optional Model TR-6/FUNC-2 for use of this test type.
DMM AC and DC voltage measurements can be made from either TR-8-1 MPX test points or
TR-6(-1) relay test points. DMM Resistance measurements can only be made through the
back panel or TR-6/FUNC-2 relay test points since the Model TR-8 solid state test points
cannot accommodate the 100mA source current. If resistance measurements are to be made to
Model TR-8 test points, use the Model TR-8 RESistance test type.
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Test Descriptions
Analog Measurement Test Types
Parameters
Description
Test Type
DMM
Title
Description of measurement (e.g., VCC)
Range
Sum of the following:
Model TR-8 Instruction Manual
0 = DC V function
64 = AC V rms function
128 = Resistance function
0 = autorange
1 = 200mV, 2Ω
2 = 600mV, 6Ω
3 = 2V, 20Ω
4 = 6V
5 = 20V
6 = 60V
7 = 200V
8 = 600V (usable to 250V)
256 = AC Coupling for ACV, DC Filter for DCV/RES
512 = Measurement delay divided by 2
1024 = Measurement delay times 2
2048 = Measurement delay times 10
4096 = Samples averaged times 10
8192 = Samples averaged times 100
16384 = 'Three Point' measurement is used
32768 = The FUNC-2 will take floating voltage measurements for
ranges above 6V. Otherwise, readings on ranges above 6V are
made with the low test point connected to ground through
approximately 1KΩ.
From (-) Point
Negative polarity test point (1625 if back panel only)
To (+) Point
Positive polarity test point
Low Limit
Low test limit in volts or ohms
High Limit
High test limit in volts or ohms
Universal Counter/Timer Measurement Test
Measures frequency, period, or counts between two test points and generates a result. In the
case of Period measurements a separate channel can be used to determine the pulse end
condition. The measurement is made, compared against the high and low test limits, and a
pass or fail result generated. This test step requires that you have an optional Model TR6/FUNC-2 installed in your system.
The input can be measured from the TR-6/FUNC-2 back panel, a TR-8 MPX point, or a TR6/FUNC-2 relay test point. The source is typically taken with Chan 1, but can be routed
through Chan 2 (back panel only) or taken through the DMM input divider. Inputs of up to 5
volts can be accommodated through Chan 1 and Chan 2 inputs. The DMM input is usable up
to 50kHz and offers differential input in conjunction with amplification or attenuation of the
input signal, depending on the range. When the DMM input is used, you should use the fullrange DMM value that is closest to the amplitude of the signal that you are measuring.
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Test Descriptions
Analog Measurement Test Types
The trigger level is zero volts unless otherwise specified. The trigger levels are usable with
Chan 1 and Chan 2 inputs and can range from -2.2V to +2.2V in approximately 100mV steps.
The input is normally AC coupled, but can be DC coupled when used with low frequency
signals (e.g., < 30Hz). The time constant of AC coupled Chan 1 and Chan 2 inputs is
approximately 63 mSec., while that of the DMM is 1.6 sec.
The Model TR-6-2 Fixture Interface can be used to buffer and frequency-divide signals in the
proximity of the UUT. This allows measurement of high frequency signals (up to about
50MHz) or at circuit locations that are sensitive to capacitance or loading.
See also the UCTTr test type for triggering during measurements.
Frequency Measurement Note: The higher the frequency range, the faster the measurement is
made. Even low frequency measurements can be made on a high frequency range. The
following shows the minimum frequency measurement on each range:
Frequency
Minimum Frequency
Range Code
FUNC-2
TR-6
20
153Hz
79Hz
16
77Hz
39Hz
12
10Hz
4Hz
8
2Hz
0.4Hz
4
0.2Hz
0.04Hz
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Test Descriptions
Analog Measurement Test Types
Model TR-8 Instruction Manual
Parameters
Description
Test Type
UCT
Title
Description of measurement (e.g., Osc X2)
Range
Function:
0 = Frequency function
1 = Period function
2 = Count function
Range:
Period
4 = 12.8 uSec (1000 period avg)
8 = 128 uSec (100 period avg)
12 = 1.28 mSec (10 period avg)
16 = 12.8 mSec (1 period)
20 = 128 mSec (1 period)
24 = 1.28 Sec (1 period)
28 = 12.8 Sec (1 period)
32 = 128 Sec (1 period)
Frequency
5kHz
50kHz
500kHz
5MHz
10MHz
Coupling:
00 = AC Coupling
64 = DC Coupling
Input Selection:
000 = Chan 1
128 = Chan 2
256 = DMM Input
384 = Chan 1 to Chan 2
512 = Chan 2 to Chan 1
Trigger Slope (period/count only):
0000 = Start Slope +
1024 = Start Slope 0000 = Stop Slope +
2048 = Stop Slope Settled measurement:
0000 = Use first reading
4096 = Ignore first reading
Input Range (DMM Only):
0000 = 600V
8192 = 200V
16384= 60V
24576= 20V
32768= 6V
40960= 2V
49152= 600mV
57344= 200mV
From (-) Point
Negative polarity test point (1625 if back panel)
To (+) Point
Positive polarity test point
Low Limit
Low test limit in Hertz/Sec/Counts
High Limit
High test limit in Hertz/Sec/Counts
22-24
Count
12.8 Sec
1.28 Sec
128 mSec
12.8 mSec
Model TR-8 Instruction Manual
Test Descriptions
Analog Measurement Test Types
UCT Trigger Setup
Allows change of a source signal from the optional Model TR-6/FUNC-2 during a UCT
measurement. This can be used to initiate a non-repetitive signal from the UUT after the UCT
is armed for period or count measurements.
With this capability, you can specify the following sequence of events:
1. Set up an initial source value from the TR-6/FUNC-2 with use of the DCV, SINEV,
SQRV, RELAY or DIGO test steps,
2. Use the UCTTR test step to save a pointer to the source test step and specify a new
stimulus value,
3. During execution of the next UCT test step, once the UCT is armed for a measurement, the
specified source is reprogrammed to the new high limit value (contained in the UCTTR
High Limit), then the UCT measurement taken, and
4. The UCTTR setup is automatically disabled until the next UCTTR is executed. The
stimulus is left at the value programmed by the UCTTR step.
Parameters
Description
Test Type
UCTTR
Title
Typically not used.
Range
If non-zero, indicates which subsequent step number (relative to
present step) that is used as type of stimulus. For example, a
range of 1 points to the next test step.
From (-) Point
Not used
To (+) Point
Not used
Low Limit
Not used
High Limit
Stimulus value that the specified source is reprogrammed to during
the UCT measurement. This value is used as the High-Limit
program value for the test step specified in the range.
As an example, the following three test steps will program 0.5 volts to test point 5, arm the
UCT for a period measurement, reprogram the stimulus at test point 5 to 4.5 volts, then take a
period measurement at test point 10:
UCTTr
1
4.5
3
GND
5
R3-3
DCV
1
0
0.5
3
GND
10
P2-2
UCT
21
10u
20u
Dynamic Measurement Calibration
Allows test-time measurement of an external value, after which the System adjusts the gain
and/or the zero offset of similar test steps to reflect the error of the measured value.
These test step types allow you to measure a known-good component value, then calibrate
similar measurements so that they are corrected to match. For example, if you are going to
measure some resistors that are more accurate than the System specification, you can measure
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Test Descriptions
Analog Measurement Test Types
Model TR-8 Instruction Manual
a known-good value resistor in the fixture, then correct the subsequent measurements to match.
This technique allows you to use the short-term stability of the System rather than the longterm accuracy.
When a ZERO or GAIN test type is executed, the System uses the measured value of the most
recent analog measurement (e.g., a RES or DMM test) as the reference. This test step is found
by searching back from the present test step until the first analog measurement is found. Next,
the system searches the range of test steps specified by the Low Limit and High Limit, and for
each test step that matches the reference test type (e.g. if the last analog measurement was a
CAP test type, it processes all of the CAP test types in the range), it replaces the existing
GAIN or ZERO value with that determined by the reference measurement.
Parameters
Description
Test Type
ZERO, GAIN
Title
Typically not used.
Range
Not used
From (-) Point
Not used
To (+) Point
Not used
Low Limit
The first step number in the range of test step to modify if the test
types match. If 1000 is added to the step number, the value is
forward-relative to the present step (e.g., 1002 refers to the
second step ahead of the present step). If 2000 is added to the
step number, the value is backwards-relative to the step number
(e.g., 2002 refers to 2 steps before the present step).
High Limit
The last step number to consider for modification. Uses the same
conventions as the 'Low Limit'.
Nominal Val
For GAIN, this value specifies the numerator when determining
the new gain factor. Typically, it will be the actual (nominal) value
of the component measured in the last step. For ZERO, this value
is typically 0, but it can be a non-zero value if you are offsetting for
a non-zero measurement.
Test for SMT Opens
Allows testing for open connections to ICs and connectors using the optional SMT-2 or TR-8SMT module. This test is normally used on surface mount technology (SMT) parts since they
have more of a tendency to have open connections than through-hole technology.
The test step shown here has underlying data that is entered in the Enter/Edit TestJet Data
window on page 12-8. Also, see TestJet Technology on page 12-1 for more information.
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Test Descriptions
Analog Measurement Test Types
Parameters
Description
Test Type
TESTJ
Title
Name of part being testing (e.g., U101).
Range
0 = Connect pin #1 on the SMT-2 module to the test system
ground during the test. Use Range 0 if you have made a
connection from the UUT ground to pin #1 on the SMT-2 module.
1 = Connect pin #1 on the module to +12Vdc power during the
test. Use Range 1 if you have installed a grounding relay in the
fixture and need to power the relay to connect UUT ground to
system ground.
This switched ground (Range 0) or switched power (Range 1) is
only connected during the execution of the TestJet test step.
Note: The TR-8-SMT and TR-8-SMT-CAP require Range 1.
From (-) Point
Test point number that is UUT ground.
To (+) Point
TestJet probe number.
Low Limit
Not used
High Limit
Not used
Nominal Val
Not used
Test for Capacitor Polarity
Allows testing for capacitor polarity using the optional SMT-2 or TR-8-SMT-CAP module.
This test is used on aluminum and tantalum polarized capacitors in axial and SMT packages up
to about 200 µF.
The test step shown here has underlying data that is entered in the TestJet Capacitance
measurement analysis screen. See TestJet Technology on page 12-12 for more information.
Parameter
Description
Test Type
TJETC
Title
Name of Capacitor Being Tested for Polarity (e.g. C101)
Range
Measurement Range:
0 = 300 fF range
2 = 3000 fF range
4 = 300 fF range
8 = 50 fF range
10 = 1600 fF range
16 = 1000 fF range
From (-) Point
Test-Point on Negative Polarity of Capacitor
To (+) Point
Test-Point on Positive Polarity of Capacitor
Low Limit
Front-to-Back Minimum Ratio for Proper Polarity
High Limit
Not used
Nominal
Typical Front-to-Back Ratio
Test for Transistor/FET Beta
FET/transistor testing is performed with the Beta test-type. The Beta test type is entered using
the Edit screen like any other standard test, with additional information entered in a lower-
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Analog Measurement Test Types
Model TR-8 Instruction Manual
level screen. See the section Entering Test Steps, Transistor and FET Testing on page 9-18
for more details about entering Beta tests.
The parameters entered from the Edit screen are shown below:
Parameter
Description
Test Type
BETA
From (-) Point
The more-negative current terminal of the device:
PNP Transistor = Collector
NPN Transistor = Emitter
P-FET = Drain
N-FET = Source
To (+) Point
The more-positive current terminal of the device:
PNP Transistor = Emitter
NPN Transistor = Collector
P-FET = Source
N-FET = Drain
Range
The type of component being tested:
1 = NPN Transistor (add 8 to this to do a fast mode sweep)
2 = PNP Transistor (add 8 to this to do a fast mode sweep)
3 = N-FET
4 = P-FET
Title
Used to describe the component being tested, such as Q203 or
Q1003.
Low Limit
Most negative acceptable bias current (or for FETs, gate voltage).
For transistors, the lowest measurable bias current is -1mA. For
FETs, the minimum measurable gate voltage is -10V. PNP
transistors will typically have negative values. NPN transistors will
typically be positive values.
High Limit
Most positive acceptable bias current (or for FETs, gate switch-on
voltage). For transistors, the highest measurable bias current is
+1mA. For FETs, the highest measured gate voltage is +10V. To
enter a value higher than the system can measure, type in 20M or
0_Rng. This value, displayed as O_Rng, is greater than any
normally measured value, and will never cause a failure on the
high side.
Test for Transformer Polarity
Transformer polarity is performed with the XFMR test-type. The XFMR test type is entered
using the Edit screen like any other standard test. See the section in Entering Test Steps,
Transformer Testing on page 9-33, for more information about entering XFMR test steps.
The menu selection Measure > Step Analysis F6 in the edit window provides an easy to
use, fill-in the form method, to select the test setup. The parameters entered from the Edit
screen are shown below:
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Model TR-8 Instruction Manual
Parameter
Description
Test Type
XFMR
From (-) Point
Primary Winding Low Test Point
Test Descriptions
Analog Measurement Test Types
To (+) Point
Primary Winding High Test Point
Range
The frequency used for the measurement (default is 1kHz):
32 = 100Hz
48 = 1kHz
20 = 10kHz
24 = 100kHz
Title
Used to describe the component being tested, such as L103 or T345.
Low Limit
Secondary Winding Low Test Point
High Limit
Secondary Winding High Test Point
HP-1 High-Voltage Tests
The CheckSum Model HP-1 is used to test cables, harnesses and circuit assemblies for
continuity and high-voltage leakage and breakdown. The Model HP-1 can make
measurements for continuity using as low as a 1kΩ threshold, and measurements for leakage
and breakdown for values as high as 500MΩ using stimulus of 500 volts dc.
Note
The Model HP-1 can be controlled by the same software as CheckSum
MDA test systems. If you have both MDA and HP-1 modules installed in
the same System, take extreme care that high-voltages from the HP-1
cannot feed back into the MDA modules. Doing so will damage the MDA
modules.
CAUTION
The safety shield must be interlocked with the high-voltage electronics to provide
double protection to the operator. Ensure that the operator cannot touch any
points with high -voltage with the safety shield in place.
Programming tests using the Model HP-1 can be done with several different types of test steps
in the test program: Continuity Testing, High-voltage Testing, Resistance Testing, Breakdown
Testing, and Checking Status.
After the test type, HP1, is entered, the Measure > Step Analysis (F6) screen can be used to
setup the measurement:
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Test Descriptions
Analog Measurement Test Types
Model TR-8 Instruction Manual
The "Select Measurement Module" selects the HP-1 module that is connected to the "From (-)
Point" as the module which both sources and senses the measurement result. For high-voltage
measurements, the interlock is checked on the measurement module as well as the module
connected to the "From (-) Point" and the "To (+) Point". Measurement module selection
allows the option of connecting separate fixtures to separate HP-1 modules within the same
test controller.
HP-1 Continuity Testing
A continuity test is used to ensure that the cable is wired correctly. This test is performed
using the CONTinuity test type. To use the Model HP-1 with the CONTinuity test type, the
range of points specified in the `From (-) Point' and `To (+) Point' columns will be from 1951
to 1998. The ` From (-) Point' must be 1951 or higher and the ` To (+) Point' must be 1998 or
lower. The system measures continuity using a 12VDC maximum stimulus, with maximum
current of 6mA.
Normally you should specify a measurement range of 10mA, which is the default. With the
10mA measurement range, the System tests for opens and shorts using a default threshold of
approximately 1kΩ. There is some hysteresis (about 10%) in the measurement to prevent false
failures. In the editor menu, Measure > Step Analysis (F6) > Setup > Set Thresholds, you can
select from measurement ranges of:
Default Test Threshold
Measurement Range
1kΩ
10mA
20kΩ
1mA
200kΩ
100µA
2MΩ
10µA
Low-Voltage CONT Ranges
HP-1 High-Voltage Testing
High-voltage testing ensures that the assembly does not have any high resistance shorts, or
specifically shorts caused by the application of up to 500VDC to each circuit.
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Model TR-8 Instruction Manual
Test Descriptions
Analog Measurement Test Types
Programming for a high-voltage test is just like programming a CONTinuity test, except the
test type is HIPOT. The other screens appear the same. The ` From (-) Point' must be 1951 or
higher and the ` To (+) Point' must be 1998 or lower. The default measurement range is 1mA,
which provides a threshold of approximately 1MΩ. In the editor menu, Measure > Step
Analysis (F6) > Setup > Set Thresholds, you can select from measurement ranges of:
Default Test Threshold
Measurement Range
100kΩ
10mA
1MΩ
1mA
10MΩ
100µA
100MΩ
10µA
High-Voltage CONT Ranges
Following are the parameters for the HIPOT test-type:
Parameter
Description
Test Type
HIPOT
Title
Description (typically not used, or 'HiPot Shorts')
Range
Normally 0. If 1, instructs the System to ignore inactive pins during continuity
testing optimizations.
From (-) Point
Lowest test point number of test, must be 1951 or higher
To (+) Point
Highest test point number of test, must be 1998 or lower
Low Limit
Not used
High Limit
Not used
HP-1 Resistance Testing
In some cases, you may wish to make an individual measurement between two points. To do
so, use the HP1 test-type. You have the choice of measuring resistance using low-voltage or
high-voltage.
Low-voltage measurements are made at approximately 12 volts (with 2 kΩ source impedance)
into an open circuit. High-voltage measurements are made at approximately up to 500 volts
(with 64 kΩ source impedance or up to 250 volts maximum with 32kΩ source impedance on
HP-1 boards marked "40-250").
Remember that the safety switch must be closed (pin 50 connected to pin 49) in order to make
high-voltage measurements.
Following are the parameters for the HP1 test-type for resistance:
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Test Descriptions
Analog Measurement Test Types
Model TR-8 Instruction Manual
Parameters
Description
Test Title
HP1
Title
Description of measurement (for example, Lo/Hi Ohms)
Range
Value
From (-) Point
Maximum
Source
Current
Voltage
(Vdc)
Minimum
R
Maximum
Usable R
1
2
3
4
6mA
1mA
100µA
10µA
12
12
12
12
0Ω
10kΩ
118kΩ
1.2MΩ
10kΩ
118kΩ
1.2MΩ
12MΩ
9
10
11
12
8mA
1mA
100µA
10µA
500
500
500
500
0kΩ
436kΩ
4.936MΩ
50MΩ
436kΩ
4.936MΩ
50MΩ
500MΩ
Negative polarity test point (ranges from 1951-1998)
To (+) Point
Positive polarity test point (ranges from 1951-1998)
Low Limit
Low test limit in (kΩ for high-voltage, Ω for low-voltage)
High Limit
High test limit in (kΩ for high-voltage, Ω for low-voltage)
HP-1 Breakdown Testing
In some cases, you may wish to make a breakdown measurement between two points. To do
so, use the HP1 test-type. Breakdown measurements use up to 500VDC. In the Step Analysis,
Details screen, you can specify a delay time that occurs between sweep samples while
measuring breakdown. The delay time is specified in mSec. A small delay may help make
more effective measurements if significant parallel capacitance is present between any of the
device leads. If you specify a negative delay time, only the first measurement is delayed by
the specified time.
Remember that the safety switch must be closed (pin 50 connected to pin 49) in order to make
these measurements.
Following are the parameters for the HP1 test-type for breakdown:
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Model TR-8 Instruction Manual
Test Descriptions
Analog Measurement Test Types
Parameters
Description
Test Title
HP1
Title
Description of measurement (for example, Breakdown)
Range
Value
Maximum
Source
Current
25
From (-) Point
8mA
Maximum
Voltage
(Vdc)
500
Negative polarity test point (ranges from 1951-1998)
To (+) Point
Positive polarity test point (ranges from 1951-1998)
Low Limit
Low test limit in volts
High Limit
High test limit in volts
HP-1 Checking Safety Interlock Status
In some cases, you may wish to see if the switch connected to the safety interlock is open or
closed. With this capability, for example, you can see if the fixture safety door is closed before
you start the test, or ensure that it is open to see if the UUT is removed.
Following are the parameters for the HP1 test-type when checking the interlock status:
Parameters
Description
Test Title
HP1
Title
Description (for example, Door Open?)
Range
32 = normal execution, set Pass/Fail
33 = do not generate or report results, does not set Pass/Fail
From (-) Point
Indicates which HP-1 card to check. For example, the first HP-1 is a
point between 1951-1974, the second HP-1 1975-1998.
To (+) Point
Not used
Low Limit
0 = passes if switch open (disengaged)
1 = passes if switch closed (engaged)
High Limit
Not used
Low Resistance Test
This test requires the Model CR-2 module. This module makes low resistance measurements
with 24 test points per module (see the CR-2 Connector on page 14-13 for back panel
connections). This test measures the resistance between two test points with external sense test
points and generates a result. This type of measurement is called a 4-wire Kelvin test with 2
source and 2 sense test points required. Both the source test point and the external sense test
point must be connected. Special test point numbers are used for this test step. For example,
TP1 (pin 1) on the module is test point number 30001 and the external sense point for TP1,
labeled TP 2 (pin 2), is test point number 30002.
Also see the RETRY and RESRG test types for further specification of how the measurements
are taken.
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Test Descriptions
Analog Measurement Test Types
Model TR-8 Instruction Manual
O_Rng Note
To enter a value higher than the system can measure, type in 20M or
O_Rng.
The menu selection Measure > Step Analysis F6 in the edit window provides an easy to
use, fill-in the form method, to select the test setup. The parameters entered from the Edit
screen are shown below:
Parameters
Description
Test Type
LORES
Title
Description of measured component (e.g., Shunt #1)
Range
1 = 2Ω (2V/1A)
2 = 200mΩ (0.2V/1A)
3 = 20mΩ (0.02V/1A)
From (-) Point
Negative polarity test point
To (+) Point
Positive polarity test point
Low Limit
Low test limit in ohms
High Limit
High test limit in ohms
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Model TR-8 Instruction Manual
Test Descriptions
Analog Stimulus Test Types
Analog Stimulus Test Types
The optional Model TR-6 or FUNC-2 provides the capability to source AC and DC voltages to
the UUT. All test types in this section apply only if you have a Model TR-6 or FUNC-2
installed in your test system.
The Model TR-6/FUNC-2 has internal sources for generating sine waves (SINEV), square
waves (SQRV) and dc voltages (DCV). In addition, there are provisions for switching an
external signal (EXTIO) for sourcing or measuring with an external device. These sources are
available at the TR-6/FUNC-2 back panel, or they can be switched into the Model TR-8 solid
state switching. They are not available at the Model TR-6(-1) relay switching. If it is
necessary to apply one of these sources to a test point that cannot be wired into the Model TR8-1 test points, you can provide wiring for the source to the UUT point through one of the
Model TR- 6/FUNC- 2's undedicated relays.
The Model TR-6/FUNC-2 sources are ground referenced. The ground is ultimately connected
to the chassis of the controller (PC). The "From (-)" test point used for supplying sources are
connected back to this ground.
System sources are disconnected when the source test title is specified as RESET (in either
upper or lower case). The sources are all reset when the system is powered up, when a CONT
or ICS test is performed, and before and after each test program is executed.
The Model TR-8 allows up to six guard points at one time, each of which can be remotely
sensed. When one or more sources are programmed (and not reset), only three guard points
can be active simultaneously. The software automatically ignores the last three guard points if
present.
The Model TR-6/FUNC-2 has the ability to provide simultaneous stimulus channels, however,
there are some interdependencies. In the case of interdependencies, the last programmed value
has priority. These include:
1. With the TR-6, if a square wave (SQRV) is specified with a non-zero Low Limit, the DC
voltage (DCV) output is used. Therefore, the stimulus value for the first voltage of the
square wave and the DCV output will be the same. If the alternate DCV output (range =
2) is used, it disables the square wave output entirely and replaces it with the specified DC
voltage signal.
2. The sine and square wave generation (SINEV/SQRV) use the same frequency generation
circuitry, therefore the frequency must be the same for both if they are used
simultaneously.
When a step is executed in the Edit Test window, the selected frequency is replaced by the
nearest achievable frequency. During test program execution, the nearest achievable
frequency for the installed module, TR-6 or FUNC-2, is used. The actual FUNC-2 frequency
is within ±1Hz in the range of 1Hz to 50kHz.
The following frequencies are available using the TR-6 when generating sine and square
waves:
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Test Descriptions
Analog Stimulus Test Types
Model TR-8 Instruction Manual
40kHz, 20kHz, 13.3kHz, 10kHz, 8kHz, 6.67kHz, 5.71kHz, 5kHz, 4.44kHz, 4kHz, 3.64kHz,
3.33kHz, 3.08kHz, 2.85kHz, 2.67kHz, 2.5kHz, 2kHz, 1.33kHz, 1kHz, 800Hz, 667Hz, 571Hz,
500Hz, 444Hz, 400Hz, 364Hz, 333Hz, 308Hz, 285Hz, 267Hz, 250Hz, 200Hz, 133Hz, 100Hz,
80Hz, 67Hz, 57Hz, 50Hz, 44Hz, 40Hz, 36Hz, 33Hz, 31Hz, 29Hz, 27Hz, 25Hz, 20Hz, 13Hz,
10Hz, 8Hz, 7Hz, 6Hz 5Hz, 4Hz, 3Hz.
In most cases the stimulus is used from the Model TR-8 test points. It also comes
simultaneously from the hardwired TR-6/FUNC-2 back panel connector. If stimulus from the
TR-6/FUNC-2 back panel only is to be used, the TR-8 test point stimulus can be eliminated by
using a 'From (-) Point' of 1625.
The analog stimulus test types are:
•
Sine Wave Output below
•
Square Wave Output on page 22-37
•
DC Voltage Output on page 22-37
•
Monitor TR-8-PWR/PWR-2 Output on page 22-38
•
External Signal Input/Output on page 22-38
Sine Wave Output
Provides sine wave stimulus from the Model TR-6/FUNC-2 module. This stimulus is
available at the Model TR-6/FUNC-2 back panel or via the Model TR-8 test points. The sine
wave stimulus is referenced to a non-floating analog ground which is switched to the UUT
with the "From (-)" test point.
Parameters
Description
Test Type
SINEV
Title
If 'RESET' is entered, the sine wave source is disconnected from
the matrix and set to high impedance output.
Range
Frequency in Hertz. Discrete frequencies from 3Hz to 40kHz on
the TR-6 and 1Hz to 50kHz on the FUNC-2 are available. A list of
the TR-6 frequencies is included at the beginning of this section
on page 22-35. When a step is executed in the Edit Test window,
it is replaced by the nearest achievable frequency. During test
program execution, the nearest achievable frequency for the
module in use, TR-6 or FUNC-2, is used.
From (-) Point
Negative polarity source point (1625 if back panel only)
To (+) Point
Positive polarity source point.
Low Limit
Not used
High Limit
Sine wave amplitude in volts peak-to-peak (Vpp). The range is
100mV to 20V peak-to-peak (in 0.1 dB steps for the TR-6 and
0.03% of range steps on the 2 and 20 Vpp ranges for the FUNC2). When the step is executed in the Editor window, it is replaced
by the nearest achievable amplitude. During test program
execution, the nearest achievable amplitude for the module in use,
TR-6 or FUNC-2, is used.
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Model TR-8 Instruction Manual
Test Descriptions
Analog Stimulus Test Types
Square Wave Output
Provides square wave stimulus from the Model TR-6/FUNC-2 module. This stimulus is
available at the Model TR-6/FUNC-2 back panel or via the Model TR-8 test points. The
square wave stimulus is referenced to a non-floating analog ground which is switched to the
UUT with the "From (-)" test point.
Parameters
Description
Test Type
SQRV
Title
If 'RESET' is entered, the square wave source is disconnected
from the matrix.
Range
Frequency in Hertz. Discrete frequencies from 3Hz to 40kHz on
the TR-6 and 1Hz to 50kHz on the FUNC-2 are available. A list of
the TR-6 frequencies is included at the beginning of this section
on page 22-35. When a step is executed in the Edit Test window,
it is replaced by the nearest achievable frequency. During test
program execution, the nearest achievable frequency for the
module in use, TR-6 or FUNC-2, is used.
From (-) Point
Negative polarity source point (1625 if back panel only)
To (+) Point
Positive polarity source point.
Low Limit
One of the amplitude levels of the square wave. Normally this
value is zero, but it can range from -10 to +10 volts in 5mV steps
on the TR-6 and 6mV steps on the FUNC-2.
High Limit
One of the amplitude levels of the square wave. This value can
range from -10 to +10 volts in 5mV steps on the TR-6 and 6mV
steps on the FUNC-2.
DC Voltage Output
Provides DC voltage stimulus from the Model TR-6/FUNC-2 module and the Model TR-8PWR/PWR-2 Module.
The TR-6/FUNC-2 DCV D/A converters (DAC) provides stimulus in the range of -10V to
+10V in 5mV steps. The output can provide up to 10mA current. The output is available at
the back panel or through the Model TR-8 switching. The DC stimulus is referenced to a nonfloating analog ground which is switched to the UUT with the "From (-)" test point. An
alternate Model TR-6/FUNC-2 DCV output is available by specifying a range of 2. In this
case, the SQRV source is used to generate a DC voltage.
With the TR-6, if a non-zero Low Limit on the SQRV output is specified, the DCV source is
used for this purpose and the amplitude specified for the SQRV output will reprogram the
DCV output.
If the TR-8-PWR/PWR-2 is used to provide the stimulus, the stimulus is available at the TR-8PWR/PWR-2 back panel via test points 1631-1646. The available stimulus is from -12V to
+12V in 5mV steps.
Multiple source connections are available by setting the multiple stimulus flag using the
FLAGS command.
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Test Descriptions
Analog Stimulus Test Types
Model TR-8 Instruction Manual
Parameters
Description
Test Type
DCV
Title
If 'RESET' is entered, the specified DCV output is set to 0 volts and
disconnected from the matrix. If "REMOVE PTS" is entered when
multiple sourcing is on, one or two points can be disconnected.
Range
DC source being programmed:
1 = TR-6/FUNC-2 DCV output
2 = TR-6/FUNC-2 SQRV output
3 = TR-8-PWR/PWR-2 output 1
4 = TR-8-PWR/PWR-2 output 2
From (-) Point
Negative polarity source point. If the range is 1 or 2, this point must
be in the range of 1-1600 or 2001-8400. If the range is 3 or 4, this
point must be in the range of 1631-1646. In all cases, test point 1625
specifies no matrix connection.
To (+) Point
Positive polarity source point. If the range is 1 or 2, this point must be
in the range of 1-1600 or 2001-8400. If the range is 3 or 4, this point
must be in the range of 1631-1646. In all cases, test point 1625
specifies no matrix connection.
Low Limit
Not used
High Limit
Amplitude in volts. The range is -10V to +10V in 5mV steps for
ranges 1 and 2, and -12V to +12V in 5mV steps for ranges 3 and 4.
Monitor POWER Module Output
Allows measurement of TR-8-PWR/PWR-2 Module Voltage and Current output. See the
section TR-8 Power Option on page 11-1 for more details.
Parameters
Description
Test Type
PWRMN
Title
Normally not used.
Range
DC source being monitored, and type of monitor. Sum of:
3 = Monitor TR-8-PWR/PWR-2 power output 1, or
4 = Monitor TR-8-PWR/PWR-2 power output 2, and
16 = Measure Voltage, or
32 = Measure Current
From (-) Point
Not used
To (+) Point
Not used
Low Limit
Low limit for pass in volts if range bit 16 is set, or current in Amps
if range bit 32 is set.
High Limit
High limit for pass in volts if range bit 16 is set, or current in Amps
if range bit 32 is set.
External Signal Input/Output
Allows connection of external instrumentation to the Model TR-8 solid-state switching. The
switched signal is connected to the "To (+)" test point. Ground (connected to the controller
chassis) is switched to the UUT "From (-)" point. Signals of up to plus and minus 12 volts
(with respect to the controller chassis) and up to 15mA can be accommodated. The signal is
applied until a RESET is issued (via the title of this test type). The external signal is connected
to the back panel connector on the TR-6/FUNC-2 System Module.
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Model TR-8 Instruction Manual
Test Descriptions
Digital Test Types
Parameters
Description
Test Type
EXTIO
Title
If 'RESET' is entered, the external signal is disconnected from the matrix.
Range
Not used
From (-) Point
Negative polarity source point (connected to chassis ground)
To (+) Point
Positive polarity source point.
Low Limit
Not used
High Limit
Not used
Digital Test Types
Digital Test Types
Overview
The digital test types allow you to input and output digital data from within a test program
(TR- 8 and TR-6/FUNC-2).
•
TR-8/G-80/DIG-1 Characteristics below
•
FUNC-2/TR-6 System Module Digital I/O on page 22-40
•
TR-8-1 Digital I/O on page 22-40
•
Other Digital Methods (TR-6/FUNC-2) on page 22-41
•
General Digital I/O Programming on page 22-41
•
Digital Control Programming on page 22-41
•
DIGx Test Types on page 22-46
•
Digital Input Test on page 22-46
•
Digital Output on page 22-47
•
Digital Active on page 22-48
•
DIG-1 Control on page 22-49
•
Digital Hardware Testing with the LOGIC Test Type on page 22-51
•
PORTx Test Types on page 22-52
•
Port Input Test on page 22-52
•
Port Output on page 22-52
•
Boundary Scan Testing on page 22-52
•
In System Programming (ISP) on page 22-53
TR-8/G-80/DIG-1 Characteristics
On the Model G-80 Digital IO Module, each bit is an individually bi-directional digital TTL
I/O line that can source 2.5mA or sink up to 24mA. Since a pull-up resistor is in place (10kΩ),
22-39
Test Descriptions
Digital Test Types
Model TR-8 Instruction Manual
the bits are also compatible with most CMOS logic families. On the TR-8 System Module, the
outputs are totem-pole CMOS with 10kΩ pull-ups.
On the DIG-1 Digital I/O Module, each digital I/O bit is an individually bi-directional digital
TTL I/O line. The digital I/O bits are also compatible with most CMOS logic families with a
10kΩ pull-up resistor in place. The DIG-1 can be programmed to use 5V or 3.3V for digital
input/output. When set to use 5V I/O, the pull-up resistor is tied to 5V and the each bit can
source 4mA or sink up to 24mA. When set to use 3.3V I/O, the pull-up resistor is tied to 3.3V
and the each bit can source 3.2mA or sink up to 10mA.
Note
Reset Conditions: Between test program executions, the relays on the DIG1 disconnect the digital bits from the UUT. The TR-8, G-80, and DIG-1
digital bits are all set to high impedance (tri-state). Since each line has a
10kΩ resistor, this results in a TTL one. Each line that you would like to
use for output from the System needs to be set active using the DIGA test
type. In the reset mode, the outputs are set to tri-stated zeros, so that when
you activate an output it will immediately go to a zero. You can first
perform a DIGO to set the bits to ones prior to activating the outputs with
the DIGA test type if you so desire.
FUNC-2/TR-6 System Module Digital I/O
The Model FUNC-2/TR-6 directly accommodates eight bits of digital I/O via its System
Module. The eight bits consist of open-collector drivers that can be used to control external
relays requiring currents of up to 100mA. The module supports the installation of on-board
pull-up resistors that make the digital byte appear as 5V or 12V digital logic. Input signals of
up to 12 volts can also be read back (at TTL logic thresholds).
The TR-6 System is shipped with a 10kΩ pull-up resistor network connected to +5V. This
resistor network can also be jumpered on the Model TR-6/FUNC-2 Module to +12V. On the
FUNC-2 module, with the jumper (JP1) removed, the 10kΩ pull-up resistor network is
connected to +3V. The resistor network (socketed) can be removed to eliminate inter-bit
impedance or to allow connection to external pull-up sources such as when you are directly
driving external relays with the System. The digital input always uses TTL-level inputs,
although it can be used with inputs of up to +12 volts without damage.
Model TR-8-1 Digital I/O
With the Model TR-8-1 MPX modules, you can multiplex 16 test points per module between
standard analog I/O and digital I/O under software control. These points can be wired into
digital nodes on the UUT to supply digital testing.
On each Model TR-8-1, the first 16 test points can be changed to digital I/O points. The points
can be set as input or output on a byte-by-byte basis. When these points are used, they should
be specially wired to the test points on the UUT requiring digital control. As a general rule,
use test points 1-8 as output or input/output points and test points 9-16 as inputs (although
these points can also be configured as outputs, but only when points 1-8 are also configured as
outputs.)
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Model TR-8 Instruction Manual
Test Descriptions
Digital Test Types
To use the digital capabilities on the Model TR-8-1 modules, after completion of MDA testing
and application of power to the UUT, first connect the digital bytes to the test points and
configure them as inputs or outputs as necessary with the DIGA command. Then use DIGO to
do output or DIGI to do input. These digital bytes are accessed by test range values that apply
to a byte on each module.
The MPX-3-200 module does not provide digital I/O.
Other Digital Methods (FUNC-2/TR-6)
The Model FUNC-2/TR-6 DCV command can be used to provide logic levels to several test
points simultaneously. The (-) test point serves as a digital low and the (+) test point, when
programmed to +5V, serves as a digital high level. Up to 16 simultaneous source points can be
used.
The System does interrupt these analog voltages during reset operations so DCV sourcing
should only be used on level-sensitive digital bits.
Under normal circumstances, the System disconnects previous test points connected to the
same source (e.g., DCV) when a new stimulus is applied. However, with use of the FLAGS
test step, you can have the System allow multiple stimulus points from the same source
(FLAGS range = 8). The source can be disconnected with a RESET of the desired source.
General Digital I/O Programming
The numbers used with the digital test types (DIGI, DIGO, DIGA, DIGR, PORTI, PORTO,
LOGIC) are all decimal. As such, if you would like to send a byte of all ones, you would
specify 255. A byte of all zeros is 0. Individual bits (which can be added) are 128 (MSB), 64,
32, 16, 8, 4, 2, and 1 (LSB).
Masks are used to specify inactive bits during input. Any one in the mask is used to mask out
the specified bits. For example, if you want to mask out the two least significant bits, specify a
3. Test results are presented after the masking operation.
The System programs the bits in byte increments. Byte number 0 refers to the Model TR-8
bits, bytes 1-12 refer to the Model G-80 bits, byte 13 refers to the Model TR-6/FUNC-2
System Module bits, bytes 14-29 refer to the Model TR-8-1 bits, and byte 30 refers to the
Model TR-8-PWR/PWR-2.
Digital Control Programming
Digital Relay Setup Screen
Selection of Measure > Step Analysis F6, from the Edit window while a DIGR test type is
highlighted allows you to interactively control the digital relay setup. The Digital Relay Setup
(DIGR) Interactive Display Screen is shown in the following figure:
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Test Descriptions
Digital Test Types
Model TR-8 Instruction Manual
Digital Relay Setup (DIGR) Interactive Control
The Digital Relay Setup (DIGR) Interactive Display Screen is used to set the relay state for the
DIG-1 Module. These relays specify whether the digital bits of the system are connected to
the UUT, the logic voltage, enabling power/ground output, and how boundary-scan is
configured.
To use the Digital Relay Setup (DIGR) Interactive Display Screen, first select the DIG-1
module to be controlled. Bytes 1-6 specify the first DIG-1 device, and bytes 7-12 specify the
second DIG-1 device.
Next, select the function to be controlled:
3. If you select DIG-1 relays, you can use the bottom of the screen to select which bytes of
the DIG-1 module are to be connected to the UUT. The relays isolate the DIG-1
electronics from the UUT when you are doing power-down testing. Unless you tell the
system otherwise, the DIG-1 points are isolated.
4. Selecting DIG-1 I/O voltage allows to select between standard 5V logic and 3.3V logic.
5. Selecting DIG-1 Fused +5VDC and Ground Outputs allows you to enable Ground and
VCC at the DIG-1 backpanel. Note that even if you have selected 3.3V logic, the system
still outputs +5VDC for this output. There is a 1A fuse on the module protecting the
+5VDC output.
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Model TR-8 Instruction Manual
Test Descriptions
Digital Test Types
6. Selecting DIG-1 Boundary Scan allows you to configure the DIG-1 for use with boundary-
scan. There is a boundary scan header (JP-3) on the DIG-1 module for connection of
boundary scan controller electronics. On this header, you can wire an input tap and output
tap. The input tap would be connected to boundary-scan controller electronics, and the
output tap would be wired to the boundary scan input tap on the UUT.
If DIG-1 Boundary Scan connection to UUT is connected, the input tap and output tap are
connected. This allows the boundary-scan controller to be connected directly to the UUT.
If DIG-1 Boundary Scan pass through is set to Include DIG-1 in scan path, then the boundary
scan path goes through the DIG-1 module, adding the DIG-1 digital I/O bits to the boundaryscan path. With this connection, you can control the DIG-1 bits, or read back the status of the
DIG-1 bits. Since the UUT would typically be connected to some of the bits on the DIG-1,
this gives you access to the status of these bits on the UUT in your boundary-scan path. If
DIG-1 Boundary Scan pass through is set to Exclude DIG-1 from scan path, then the
boundary-scan is direct from input to output.
Digital Active Screen
Selection of Measure > Step Analysis F6, from the Edit window while a DIGA test type is
highlighted allows you to interactively control the digital active output setup. The Digital
Active (DIGA) Interactive Display Screen is shown in the following figure:
Digital Active (DIGA) Interactive Control Screen
The Digital Active (DIGA) Interactive Display Screen is used to set the direction of digital I/O.
If a tester digital bit is tri-stated (high-impedance), it is set for doing input to the test system. If
the tester digital bit is not tri-stated (i.e., active), it is low-impedance and able to send out highs
and lows to the UUT. Bits that are tri-stated are in the logic high state when the controller is
turned on. The default for digital output (see DIGO) is low for each pin. Because of this, as
soon as you make the pin active for output, it will go low. You can precede the DIGA
command with a DIGO command to set the pin high if you want it to stay in the high state.
22-43
Test Descriptions
Digital Test Types
Model TR-8 Instruction Manual
Note
The TR-6/FUNC-2 Module has open-collector output so it does not need to
be set active for output. However, to be active for input, it's output bits
need to be set to the high state so that they can assume a logic high, or be
pulled down to the low state by the UUT.
To use the Digital Active (DIGA) Interactive Display Screen:
•
Select the output device to be used. To do this, use the Hardware list box. Select the
hardware module to be used for output.
•
Select the byte (8-bits) to be controlled. To do this, use the Range list box. The range
values will be different for each byte that you will be controlling with this test step. When
you have selected a byte, the screen shows you the bit numbers being controlled.
•
For each bit to be set active for output, click on the corresponding box. When the box is
selected, the associated bit will be set low-impedance (non-tri-stated) in preparation to do
output to the UUT.
You can select to enter the byte data in binary (the default), hex (base 16), or Decimal (base
10). When you read a test program, you will see the active byte specified in decimal.
The 'Execute' button can be selected to cause the test type to be executed with the hardware.
This causes the same action as when the when the program is later run. This can be helpful
for interactive debugging.
Digital Output Screen
Selection of Measure > Step Analysis F6, from the Edit window while a DIGO test type is
highlighted allows you to interactively control the digital output setup. The Digital Output
(DIGO) Interactive Display Screen is shown in the following figure:
Digital Output (DIGO) Interactive Control Screen
22-44
Model TR-8 Instruction Manual
Test Descriptions
Digital Test Types
The Digital Output (DIGO) Interactive Display Screen is used to send a logic state to the
UUT. Before you use this command, you need to use the DIGA command to prepare the test
system to do output.
To use the Digital Output (DIGO) Interactive Display Screen:
•
Select the output device to be used. To do this, use the Hardware list box. Select the
hardware module to be used for output.
•
Select the byte (8-bits) to be controlled. To do this, use the Range list box. The range
values will be different for each byte that you will be controlling with this test step. When
you have selected a byte, the screen shows you the bit numbers being controlled.
•
For each bit to be set as a logic high for output, click on the corresponding box. When the
box is selected, the associated bit will be set high.
You can select to enter the byte data in binary (the default), hex (base 16), or Decimal (base
10). When you read a test program, you will see the output byte specified in decimal.
The 'Execute' button can be selected to cause the test type to be executed with the hardware.
This causes the same action as when the when the program is later run. This can be helpful
for interactive debugging.
Digital Input Screen
Selection of Measure > Step Analysis F6, from the Edit window while a DIGI test type is
highlighted allows you to interactively control the digital input setup. The Digital Input
(DIGI) Interactive Display Screen is shown in the following figure:
22-45
Test Descriptions
Digital Test Types
Model TR-8 Instruction Manual
Digital Input (DIGI) Interactive Control Screen
The Digital Input (DIGI) Interactive Display Screen is used to read a logic state from the
UUT.
To use the Digital Output (DIGO) Interactive Display Screen:
•
Select the output device to be used. To do this, use the Hardware list box. Select the
hardware module to be used for input.
•
Select the byte (8-bits) to be read. To do this, use the Range list box. The range values
will be different for each byte that you will be controlling with this test step. When you
have selected a byte, the screen shows you the bit numbers being controlled.
•
For each bit that you expect to be a logic high after input, click on the corresponding box
for Expected Data.
•
For each bit that you want to ignore (you don't care whether it is a one or zero), click on
the corresponding box for Bit Mask.
You can select to enter the byte data in binary (the default), hex (base 16), or Decimal (base
10). When you read a test program, you will see the expected data and mask bits specified in
decimal.
The 'Measure' button can be selected to cause the test type to be executed with the hardware.
This causes the same action as when the when the program is later run. This can be helpful
for interactive debugging. After pressing 'Measure', the data read from the hardware is
displayed on the screen.
You can opt to not generate pass or fail test result while doing a DIGI test. To do so, select the
'Do not set pass/fail' box. This allows you to read patterns, then make decisions later in the test
program with use of the MEMI test type.
DIGx Test Types
The DIGx (DIGI, DIGO, DIGA, DIGR) test types perform input and output via the CheckSum
Model TR-8 System Module (8 bits), Model TR-6/FUNC-2 System Module (8 bits), Model
TR-8-1 MPX Modules (16 bits each), Model TR-8-PWR/PWR-2 Power Module (8 bits), and a
CheckSum Model G- 80 Digital I/O or DIG-1 Module that can provide an additional 96 bits.
If a DIG-1 Module is selected (range 1-12) for DIGI or DIGA, the relays to the bytes are
automatically connected, see the DIGR on page 22-49 test type.
The MPX-3-200 module does not support the DIGA, DIGI or DIGO test types.
Digital Input Test
Reads a byte of digital data from a CheckSum Model TR-8, G-80/DIG-1, TR-6/FUNC-2, TR8-1, or TR-8-PWR/PWR-2 module and generates a test result. The MPX-3-200 module does
not support the DIGI test type. If a DIG-1 Module is selected (range 1-12), the relays to the
bytes are automatically connected, see the DIGR on page 22-49 test type. The menu selection
Measure > Step Analysis F6 in the edit window provides an easy to use, fill-in the form
method, to select these settings.
22-46
Model TR-8 Instruction Manual
Test Descriptions
Digital Test Types
Parameter
Description
Test Type
DIGI
Title
Name of test step (e.g., U234 Out)
Range
Input byte number:
0 = TR-8 bits 1-8
1 = G-80 or first DIG-1 bits 1-8
2 = G-80 or first DIG-1 bits 9-16
...
6 = G-80 or first DIG-1 bits 41-48
7 = G-80 or second DIG-1 bits 49-56
...
...
12 = G-80 or second DIG-1 bits 89-96
13 = TR-6/FUNC-2 bits 1-8
14 = TR-8-1 points 1-8
15 = TR-8-1 points 9-16
16 = TR-8-1 points 201-208
17 = TR-8-1 points 209-216
...
28 = TR-8-1 points 1401-1408
29 = TR-8-1 points 1409-1416
30 = TR-8-PWR/PWR-2 bits 1-8
From (-) Point
Not used
To (+) Point
0 = normal execution, set Pass/Fail
1 = do not report results, do not set Pass/Fail
Low Limit
Input mask: Data read is ignored for any bit set as one in this
field (e.g., if input mask is 5, the LSB and 2nd bit from the LSB
are ignored).
High Limit
Expected data
Digital Output
Write a byte of digital data from the Model TR-8, G-80/DIG-1 Module, TR-6/FUNC-2, TR-81, or TR-8-PWR/PWR-2 to the UUT. The MPX-3-200 module does not support the DIGO test
type. If a DIG-1 module is selected (range 1-12), be sure to connect the relay bytes with the
DIGR on page 22-49 test type otherwise the outputs may not be connected to the UUT.
The menu selection Measure > Step Analysis F6 in the edit window provides an easy to
use, fill-in the form method, to select these settings.
22-47
Test Descriptions
Digital Test Types
Model TR-8 Instruction Manual
Parameter
Description
Test Type
DIGO
Title
Not used
Range
Output byte number:
0 = TR-8 bits 1-8
1 = G-80 or first DIG-1 bits 1-8
2 = G-80 or first DIG-1 bits 9-16
...
6 = G-80 or first DIG-1 bits 41-48
7 = G-80 or second DIG-1 bits 49-56
...
...
12 = G-80 or second DIG-1 bits 89-96
13 = TR-6/FUNC-2 bits 1-8
14 = TR-8-1 points 1-8
15 = TR-8-1 points 9-16
16 = TR-8-1 points 201-208
17 = TR-8-1 points 209-216
...
28 = TR-8-1 points 1401-1408
29 = TR-8-1 points 1409-1416
30 = TR-8-PWR/PWR-2 bits 1-8
From (-) Point
Not used
To (+) Point
Not used
Low Limit
Not used
High Limit
Data byte to output
Digital Active
Set selected bits on a Model TR-8 System Module or Model G-80/DIG-1 Digital I/O Module
to active. Sets specified one-bits as active and zero-bits as tri-state in the selected byte. All
bits are tri-stated as a default. For the Model TR-8-1 MPX Modules, connect or disconnect the
16 digital bits to the test points and configure the bytes as inputs or outputs as necessary. The
digital bits on the TR-6/FUNC-2 and TR-8-PWR/PWR-2 use open-collector circuits. The
DIGA (digital active) test type does not apply with open-collector circuits. The MPX-3-200
module does not support the DIGA test type. If a DIG-1 Module is selected (range 1-12), the
relays to the bytes are automatically connected, see the DIGR on page 22-49 test type.
The menu selection Measure > Step Analysis F6 in the edit window provides an easy to
use, fill-in the form method, to select these settings.
22-48
Model TR-8 Instruction Manual
Parameter
Description
Test Type
DIGA
Title
Not used
Range
Output byte number:
0 = TR-8 bits 1-8
1 = G-80 or first DIG-1 bits 1-8
2 = G-80 or first DIG-1 bits 9-16
...
6 = G-80 or first DIG-1 bits 41-48
7 = G-80 or second DIG-1 bits 49-56
...
...
12 = G-80 or second DIG-1 bits 89-96
14 or 15 = TR-8-1 points 1-16
16 or 17 = TR-8-1 points 201-216
...
28 or 29 = TR-8-1 points 1401-1416
From (-) Point
Not used
To (+) Point
Not used
Low Limit
Not used
High Limit
Tri-state data information. Each bit set as one is activated.
Test Descriptions
Digital Test Types
For Model TR-8-1 programming, the High Limit is assigned as:
0 = disconnect all digital test points on module
1 = connect all digital test points on module
configure points 1-8 on module as inputs
configure points 9-16 on module as inputs
2 = connect all digital test points on module
configure points 1-8 on module as outputs
configure points 9-16 on module as inputs
3 = connect all digital test points on module
configure points 1-8 on module as outputs
configure points 9-16 on module as outputs
DIGR (DIG-1 Digital Module Switching/Control)
The DIGR test step controls the DIG-1 module relays, I/O voltage levels, switched power
outputs, Boundary-Scan pass through, and Boundary-Scan switching to the UUT. The digital
I/O bytes on the DIG-1 module use relay connections to isolate the digital signals from the
UUT. Use the DIGR range 1 and 2, to close (connect) or open (disconnect) these bytes. Refer
to the DIG-1 section of the Wiring Diagram on page 14-7 for additional connection
information.
The menu selection Measure > Step Analysis F6 in the edit window provides an easy to
use, fill-in the form method, to select these settings.
22-49
Test Descriptions
Digital Test Types
Model TR-8 Instruction Manual
Parameter
Description
Test Type
DIGR
Title
Normally not used
Range
Range = 1
To close the relays for bytes 1 to 6, set the Low Limit to the sum of
the following:
1 = byte 1 (bits 1-8)
2 = byte 2 (bits 9-16)
4 = byte 3 (bits 17-24)
8 = byte 4 (bits 25-32)
16 = byte 5 (bits 33-40)
32 = byte 6 (bits 41-48)
See the High Limit to leave relays in the previous position (open or
closed).
Range = 2
To close the relays for bytes 7 to 12, set the Low Limit to the sum
of the following:
1 = byte 7 (bits 49-56)
2 = byte 8 (bits 57-64)
4 = byte 9 (bits 65-72)
8 = byte 10 (bits 73-80)
16 = byte 11 (bits 81-88)
32 = byte 12 (bits 89-96)
See the High Limit to leave relays in the previous position (open or
closed).
Range = 3
Set the I/O voltage for the DIG-1 bytes. A Low Limit value of 0 sets
the I/O voltage for 3.3V, a value of 1 sets the I/O voltage for 5.0V.
The default is 5.0V. The High Limit value identifies the DIG-1
module controlled.
Range = 4
Open or close the relay switched +5VDC power on pin 50 (and
GND on pin 49) on the DIG-1 rear panel connector. A Low Limit
value of 0 disconnects power, and a value of 1 connects power.
The High Limit value identifies the DIG-1 module controlled.
Range = 5
Control the pass through of Boundary Scan signals on the DIG-1
module in the scan path. A Low Limit value of 0 will exclude the
DIG-1 bytes, a value of 1 will include all of the DIG-1 bytes. The
default is to exclude. Including a module in the scan path allows
the DIG-1 bits to be part of the boundary scan path. The High Limit
value identifies the DIG-1 module controlled.
Range = 6
Controls the Boundary Scan connector signals of the DIG-1 module
to the UUT. Set the Low Limit as follows:
0 = disconnect TMS, TCK, TDI, TDO and Ground (Switched GND)
1 = connect TMS, TCK, TDI, TDO and Ground (Switched GND)
The default is disconnect all. The High Limit value identifies the
DIG-1 module controlled.
From (-) Point
Not used
To (+) Point
Not used
22-50
Model TR-8 Instruction Manual
Test Descriptions
Digital Test Types
Low Limit
Refer to the Range selection
High Limit
If Range = 1, sum of the following to leave relays in the previous
position (open or closed):
1 = byte 1
2 = byte 2
4 = byte 3
8 = byte 4
16 = byte 5
32 = byte 6
If Range = 2, sum of the following to leave relays in the previous
position (open or closed):
1 = byte 7
2 = byte 8
4 = byte 9
8 = byte 10
16 = byte 11
32 = byte 12
If Range = 3, 4, 5, or 6
1 = controls the module for DIG-1 bytes 1-6
2 = controls the module for DIG-1 bytes 7-12
Digital Hardware Testing with the LOGIC Test Type
For digital I/O, the LOGIC test type can use one or more types of CheckSum modules,
including the Model TR-8 System Module, the MPX modules, Model TR- 6/FUNC- 2
Functional Test Module, Model G-80 Digital I/O Module and/or Model G-80 Overdrive
Module. The MPX-3-200 module does not provide digital I/O stimulus bytes for the LOGIC
test type. This combined software/hardware can be used to do in-circuit testing of digital
hardware combinational logic and transceivers. Refer to the TR-6/FUNC-2 manual for more
details and examples of LOGIC test use.
Test digital hardware power-on behavior according to functional behavior defined in a test file.
Parameter
Description
Test Type
LOGIC
Title
Name of test file (assuming .TST extension) optionally followed
by name of a sub-test within the file to execute.
Range
Normally 0, but additional test coverage can by obtained by
using a range value of 32 which causes all test steps in each
sub-test to be performed regardless of any previous failures.
Adding an offset of 64 causes test execution from the Edit
screen to single step through the lines of the sub-test. A
keyboard key must be pressed for the executive to proceed to
the next sub-test line. The offset of 64 has no effect on
execution outside the Edit screen.
From (-) Point
Not used
To (+) Point
Not used
Low Limit
Not used
High Limit
Not used
22-51
Test Descriptions
Digital Test Types
Model TR-8 Instruction Manual
PORTx Test Types
The PORTx (PORTI, PORTO) test types perform I/O to the PC's input and output ports
allowing you to communicate with peripherals and other I/O-mapped devices such as the
Model RM-1.
Port Input Test
Read a byte of digital data from the PC's I/O bus and then generate a test result.
Parameter
Description
Test Type
PORTI
Title
Name of test step (e.g., Data In)
Range
Input port address
From (-) Point
Not used
To (+) Point
0 = normal execution
1 = do not generate or report results
Low Limit
Input mask: Data read from port is ignored for any bit set as
one in this field (e.g., if the input mask is 5, the 1-bit (LSB) and
4-bit are ignored).
High Limit
Expected data
Port Output
Write a byte of digital data to the PC's I/O bus.
Parameter
Description
Test Type
PORTO
Title
Not used
Range
Output port address
From (-) Point
Not used
To (+) Point
Not used
Low Limit
Not used
High Limit
Data byte to write
Boundary Scan Testing
Boundary scan testing can be performed with the CheckSum Model TR-8 if it is ordered with
the optional Model TR-8-BST module and software. The BSCAN test-type supports lowerlevel data that is described in detail in the section Boundary Scan Testing on page 13-1 and
the manufacturer's instruction manual.
The parameters entered from the Edit screen are shown below:
22-52
Model TR-8 Instruction Manual
Parameter
Description
Test Type
BSCAN
From (-) Point
Not used
To (+) Point
Not used
Range
Test step in BSCAN lower-level data to execute.
Title
Used to describe the component being tested, such as U103.
Low Limit
Not used
High Limit
Not used
Test Descriptions
Digital Test Types
In System Programming (ISP)
The ISP test step is used to control and test programmable parts. The step has multiple uses
and can control numerous programmable parts. For example, this test step can be used to
erase, program and verify a programmable component. The type of protocol (e.g. JTAG, IIC,
SPI) and the actual hardware used to communicate with the component is defined in the test
step setup window. The menu selection Measure > Step Analysis F6 in the edit window
opens the easy to use, fill-in the form setup window to select these settings.
The ISP Setup window will expand to allow you to enter attributes depending on the ISP type
selected. For example, if you select the ISP type "JTAG", the window will expand to allow
you to enter attributes about the JTAG scan path. Use the Add button to insert components in
the order of the scan path. Select the manufacturer, device part number, type of operation
(Bypass, Program, etc), and, if needed, the input file (SVF format). Check the CF (Chained
file) box if appropriate. The ISP Setup # allows you to use setups created in one ISP test step
to another ISP test step. You can also export the step in one program and import the step in
another test program. The Do not Set Pass/Fail check box allows you to control the results of
the test. You can use the Execute button to see if the step will Pass or Fail. The View button
lets you review the input and output files while you work on the test step. The Find button is
used to locate other ISP test steps that include the manufacturer or device part number for both
standard devices and user supplied devices (in this test program).
In the ISP Device setup window, if you check the box labeled Check Device ID, this window
will expand to allow you to specify other data. For example, Identification Opcode,
Manufacturer ID, Part Number, and Version may be entered, if they are not already known to
the system.
The ISP test type is available for Windows 95/98 only. On TR-8 systems, the ISP test step can
use the DIG-1 or G-80 module. On TR-10 systems, the ISP test step uses the DIG-1 module.
For fixtures used for both MDA and ISP, a switch-over module can be used to isolate the ISP
interface signals from the UUT during MDA testing. This is provided automatically on the
DIG- 1 module. The ISP step assumes that the UUT has been powered-up and is ready to
receive ISP programming commands.
22-53
Test Descriptions
Transfer of Control Test Types
Parameter
Description
Test Type
ISP
From (-) Point
Not used
Model TR-8 Instruction Manual
To (+) Point
Not used
Range
Test step in ISP lower-level data to execute.
Title
Used to describe the component being programmed, such as
U103.
Low Limit
Not used
High Limit
Not used
Transfer of Control Test Types
Transfer of Control Test Types
Overview
The following test types are used for transfer of control within the test program. A label is first
specified that can be used as the destination of JMPs and CALLs. Labels can be up to twelve
characters long and are not case-sensitive (differences in upper and lower case are ignored).
Note
The measurement parameters set in the Special Features menu, such as
failure retries and discharge times, also affect the speed and accuracy of the
analog JMP test types, i.e., JMPR, JMPC, JMPZ and JMPD. To enhance
testing speed, you can use the RETRY and RESRG test types to modify
these measurement parameters during a test.
•
Specify Label on page 22-55
•
Jump Unconditionally on page 22-55
•
Jump Based on Resistance Measurement on page 22-56
•
Jump Based on Capacitance Measurement on page 22-56
•
Jump Based on Diode Measurement on page 22-56
•
Jump Based on Inductance Measurement on page 22-57
•
Jump Based on Voltage Measurement on page 22-57
•
Jump Based on PWR Measurement on page 22-57
•
Jump Based on DMM Measurement on page 22-58
•
Jump Based on UCT Measurement on page 22-58
•
Jump Based on Result of Digital Input on page 22-59
•
Jump Based on Result of Port Input on page 22-59
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Model TR-8 Instruction Manual
•
Jump Based on Result of Key Input on page 22-60
•
Set Error Counter Used for JMPE on page 22-60
•
Jump Based on Number of Errors on page 22-61
•
Jump Based on Zener Measurement on page 22-61
•
Jump Based on Self-test on page 22-62
•
Jump Based on Fixture Identification on page 22-62
•
Call a Subroutine on page 22-63
•
Return from Subroutine on page 22-63
•
Load and Run a Test Program on page 22-63
•
Load and Run a Test Sub-Program on page 22-64
•
Return from Test Sub-Program on page 22-65
Test Descriptions
Transfer of Control Test Types
Specify Label
Specify a label to be used as the destination of transfer of control commands. If the label is
'SHUT DOWN', the test steps following it are executed, even if the test is aborted (see Exiting
the Program on page 9-38). This can serve as a power-down sequence at the end of the
program. If the label is 'REPEAT', next time the [F2] Repeat key is pressed when the System
is paused between steps, the repeat will occur to this point. This repeat action can be canceled
and returned to normal with a label of 'CLEAR REPEAT.'
If the title begins with TRY, this step specifies the start of a TRY block. The TRY block ends
at the matching ERROR TRY test step. The enclosed block is executed up to the number of
times specified by the matching ERROR TRY as long as the block generates at least one jump
error. You can have up to five nested TRY blocks at a time. Each TRY block needs to have a
unique title (e.g. TRY1, TRY2, TRY3).
Parameter
Description
Test Type
LABEL
Title
Label Name: The labels SHUT DOWN, REPEAT,
CLEAR REPEAT, and TRY (case insensitive) are
special, see above.
Range
Not used
From (-) Point
Not used
To (+) Point
Not used
Low Limit
Not used
High Limit
Not used
Jump Unconditionally
Unconditionally transfer control to a specified label.
22-55
Test Descriptions
Transfer of Control Test Types
Parameter
Description
Test Type
JMP
Title
Destination label
Range
Not used
From (-) Point
Not used
To (+) Point
Not used
Low Limit
Not used
High Limit
Not used
Model TR-8 Instruction Manual
Jump Based on Resistance Measurement
The System measures the resistance, and if test passes, a jump to the specified destination
occurs. No results are logged. Excluding test type and title, all fields are the same as for RES
test type.
Parameter
Description
Test Type
JMPR
Title
Destination label
Range
Same as RES test type
From (-) Point
Negative polarity test point
To (+) Point
Positive polarity test point
Low Limit
Low test limit in ohms
High Limit
High test limit in ohms
Jump Based on Capacitance Measurement
The System measures the capacitance, and if the test passes, a jump to the specified destination
occurs. No results are logged. With the exception of the test type and title, all the fields are
the same as the CAP test type.
Parameter
Description
Test Type
JMPC
Title
Destination label
Range
Same as CAP test type
From (-) Point
Negative polarity test point
To (+) Point
Positive polarity test point
Low Limit
Low test limit in farads
High Limit
High test limit in farads
Jump Based on Diode Measurement
The System measures the diode junction, and if the test passes, a jump to the specified
destination occurs. No results are logged. With the exception of the test type and title, all the
fields are the same as the DIODE test type.
22-56
Model TR-8 Instruction Manual
Parameter
Description
Test Type
JMPD
Title
Destination label
Range
Same as DIODE test type
From (-) Point
Cathode (-) test point for diode
To (+) Point
Anode (+) test point for diode
Low Limit
Low test limit (typically 0.4V)
High Limit
High test limit (typically 0.8V)
Test Descriptions
Transfer of Control Test Types
Jump Based on Inductance Measurement
The System measures the inductance, and if the test passes, a jump to the specified destination
occurs. No results are logged. With the exception of the test type and title, all the fields are
the same as the INDUC test type.
Parameter
Description
Test Type
JMPI
Title
Destination label
Range
Same as INDUC test type
From (-) Point
Negative polarity test point
To (+) Point
Positive polarity test point
Low Limit
Low test limit in henrys
High Limit
High test limit in henrys
Jump Based on Voltage Measurement
The System measures the DC voltage, and if the test passes, a jump to the specified destination
occurs. No results are logged. With the exception of the test type and title, all the fields are
the same as the VOLT test type.
Parameter
Description
Test Type
JMPV
Title
Destination label
Range
Same as VOLT test type
From (-) Point
Most negative polarity test point for measurement
To (+) Point
Most positive test point for measurement
Low Limit
Low test limit in volts
High Limit
High test limit in volts
Jump Based on PWR Measurement
The System measures the current or voltage output of the Model TR-8-PWR/PWR-2 module,
then jumps to the specified label if the test passes. No results are logged. With the exception
of the test type and title, all the fields are the same as the PWRMN test type. This test step
requires use of the Model TR-8-PWR/PWR-2 module in your system.
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Parameters
Description
Test Type
JMPWR
Title
Destination of jump if monitored voltage/current is between
the low and high test limits. Must match the title of a
LABEL test type in the test program.
Range
DC source being monitored, and type of monitor. Sum of:
3 = Monitor TR-8-PWR/PWR-2 power output 1, or
4 = Monitor TR-8-PWR/PWR-2 power output 2, and
16 = Measure Voltage, or
32 = Measure Current
From (-) Point
Not used
To (+) Point
Not used
Low Limit
Low limit for pass (and jump) in volts if range bit 16 is set,
or current in Amps if range bit 32 is set.
High Limit
High limit for pass (and jump) in volts if range bit 16 is set,
or current in Amps if range bit 32 is set.
Jump Based on DMM Measurement
The System makes the specified DMM measurement, and if the test passes, a jump to the
specified destination occurs. No results are logged. With the exception of the test type and
title, all the fields are the same as the DMM test type. This test step requires use of the Model
TR-6/FUNC-2 module in your system.
Parameter
Description
Test Type
JMPDM
Title
Destination label
Range
Same as DMM test type
From (-) Point
Most negative polarity test point for measurement
To (+) Point
Most positive test point for measurement
Low Limit
Low test limit in volts/Ω
High Limit
High test limit in volts/Ω
Jump Based on UCT Measurement
The System makes the specified Counter/Timer measurement, and if the test passes, a jump to
the specified destination occurs. No results are logged. With the exception of the test type and
title, all the fields are the same as the UCT test type. This test step requires use of the Model
TR-6/FUNC-2 module in your system.
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Test Descriptions
Transfer of Control Test Types
Parameter
Description
Test Type
JMPU
Title
Destination label
Range
Same as UCT test type
From (-) Point
Most negative polarity test point for measurement
To (+) Point
Most positive test point for measurement
Low Limit
Low test limit in Hz, Sec, Counts
High Limit
High test limit in Hz, Sec, Counts
Jump Based on Result of Digital Input
The System inputs the digital data, and if the test passes, a jump to the specified destination
occurs. No results are logged. With the exception of the test type and title, all the fields are
the same as the DIGI test type.
Parameter
Description
Test Type
JMPDI
Title
Destination label
Range
Same as DIGI test type
From (-) Point
Not used
To (+) Point
Not used
Low Limit
Input mask: Data read from TR-8, DIG-1, or G-80 digital
input is ignored for any bit set as one in this field (e.g., if
input mask is 5, the LSB and 2nd bit from the LSB are
ignored).
High Limit
Expected data
Jump Based on Result of Port Input
The System inputs digital data from the PC's I/O port, and if the test passes, a jump to the
specified destination occurs. No results are logged. With the exception of the test type and
title, all the fields are the same as the PORTI test type.
Parameter
Description
Test Type
JMPPI
Title
Destination label
Range
Input port address
From (-) Point
Not used
To (+) Point
Not used
Low Limit
Input mask: Data read from port is ignored for any bit
set as one in this field (e.g., if the input mask is 5, the 1bit (LSB) and 4-bit are ignored).
High Limit
Expected data
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Jump Based on Result of Key Input
The System checks to see if the operator has pressed a key on the PC's keyboard. If so, and if
the key matches the specified key, the System performs the jump. Otherwise, if no key or the
wrong key is pressed, the System performs the next test step.
Parameter
Description
Test Type
JMPK
Title
Destination label
Range
Decimal ASCII value of key. For example, 65 is A and
48 is 0. F1-F10 are 131-140. If 0 is specified, the
System accepts any key as true. If a lower-case key is
pressed on the keyboard, it is converted to upper case
before making the comparison. If the comparison is
true, the key stroke is removed from the key buffer. If
the comparison is not true, the key remains in the buffer
for use by other JMPK test steps. The key buffer can
be cleared by entering a JMPK range of 255.
From (-) Point
Not used
To (+) Point
Not used
Low Limit
Not used
High Limit
Not used
Set Error Counters, Control Error-Based TRY Blocks
This test type allows you to:
•
Set the jump error counter that is used with JMPE test type. This can be used to reset the
value to 0 or to set a defined higher value for subsequent JMPE decisions.
•
Clear the system error count. This is displayed on the Test Screen and in the test results
report.
•
Clear the jump error count, clear the system error count, and all steps are set to skipped
(using the CLEAR ALL title).
•
Specify the end and number of attempts in a TRY block.
This test type can be used when testing for errors in repetitive tests using the same test
program or to reset the counter between PCBs on multi-PCB panels.
Note that unlike the error count displayed in the upper section of the test display, the jump
error counter counts all failures that occur, even if the test step is subsequently repeated and
passes. If a test title of RESET is used, the jump error counter is set to the value of the system
error counter. This can be helpful if you have been resetting the counter and then need to find
out how many total errors have occurred since the test program began executing. If a test title
of SET is used, the system error counter is set to the value of the jump error counter. If a test
title of CLEAR ALL is used, then both the system error count and jump error count are set to
zero and all test results in the test program are set to skipped. This is useful at the start of main
program loops with a different UUT tested for each loop execution.
If the title begins with TRY then this step specifies the end of a TRY block. This TRY block
is repeated up to the number of times specified in the range as long as one or more jump errors
have occurred since the matching "LABEL TRY" step was executed.
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Test Descriptions
Transfer of Control Test Types
Parameter
Description
Test Type
ERROR
Title
Normally not used, but if the title is RESET, the JMPE
error count is set to the value of the system error count.
If the title is SET, the system error count is set to the
value of the jump error count (see JMPE). If the title is
CLEAR ALL both the system error count and the jump
error count are set to zero and all steps are set to
skipped. If the title begins with TRY then this step
specifies the end of a TRY block.
Range
The error count used for JMPE or the maximum number
of TRY block attempts.
From (-) Point
Not used
To (+) Point
Not used
Low Limit
Not used
High Limit
Not used
Jump Based on Number of Errors
If the total number of errors encountered up until the time of execution exceeds the specified
number, the System performs the jump. Otherwise, the System performs the next test step.
Also, see the ERROR and MEMI test types for manipulation of the error count.
Parameter
Description
Test Type
JMPE
Title
Destination label
Range
Number of errors. If the total number of errors
encountered during execution of the test program
exceed the specified number, a jump occurs.
From (-) Point
Not used
To (+) Point
Not used
Low Limit
Not used
High Limit
Not used
Jump Based on Zener Measurement
The System measures the zener diode junction and if the test passes, a jump to the specified
destination occurs. No results are logged. With the exception of the test type and title, all the
fields are the same as the ZENER test type.
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Parameter
Description
Test Type
JMPZ
Title
Destination label
Range
Same as ZENER test type
From (-) Point
Most negative polarity test point for measurement
To (+) Point
Most positive polarity test point for measurement
Low Limit
Low test limit in volts
High Limit
High test limit in volts
Jump Based on Self-test
The System performs a self-test (see STST test type on page 22-94), and if the test passes, a
jump to the specified destination occurs. No results are logged.
The menu selection Measure > Step Analysis F6 in the edit window provides an easy to
use, fill-in the form method, to select these settings.
Parameter
Description
Test Type
JSTST
Title
Destination label
Range
Same as STST test type
From (-) Point
Not used
To (+) Point
Not used
Low Limit
Not used
High Limit
Same as STST test type
Jump Based on Fixture Identification
The System performs a fixture ID test (see FIXID test type on page 22-91 ), and if the test
passes, a jump to the specified destination occurs. No results are logged.
Selecting F6 (Step Analysis) from the JFXID test type in the test program editor allows you to
easily and interactively determine the wiring patterns for the fixture ID.
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Test Descriptions
Transfer of Control Test Types
Parameter
Description
Test Type
JFXID
Title
Pass destination label
Range
Sum of the following:
0 - Normal
16 - Set pass if expected fixture ID is not equal to measured fixture ID
32 - Copy measured fixture ID into integer memory (MEMI)
From (-) Point
The first test point is used as the reference point against which
connections to the test point interval are measured. This interval begins
at the test point number immediately following the From (-) Point.
To (+) Point
The last test point in the test point interval.
Low Limit
Not used
High Limit
Expected Fixture ID
Call a Subroutine
Control transfers to another test step, then resumes to the next test step when a RETurn is
executed. CALLs can be nested up to 16 deep.
Parameter
Description
Test Type
CALL
Title
Destination Label
Range
Not used
From (-) Point
Not used
To (+) Point
Not used
Low Limit
Not used
High Limit
Not used
Return from Subroutine
Control transfers to the test step immediately following the last CALL test type that was
executed.
Parameter
Description
Test Type
RET
Title
Not used
Range
Not used
From (-) Point
Not used
To (+) Point
Not used
Low Limit
Not used
High Limit
Not used
Load and Run a Test Program
Causes the System to load a specified test program into memory and begin execution at the
first test step.
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Model TR-8 Instruction Manual
When a RUN test step is executed, the test program presently in memory is overwritten. Also,
any results information from the present test program is lost. If you want to save any test
results from the present test program execution before doing the RUN, you may use the
RPRTS test type.
The memory locations are not reset during the RUN execution and consequently can be used to
transfer information from one test program to the next.
Parameter
Description
Test Type
RUN
Title
Name of test program to load and run. If the title is @M, use
the contents of the memory string as the test program name.
Range
Not used
From (-) Point
Not used
To (+) Point
Not used
Low Limit
Not used
High Limit
Not used
Load and Run a Test Sub-Program
Causes the System to load a specified test program into memory and begin execution at the
first test step. When a RUNT test step is executed, the test program file presently in memory is
overwritten with the RUNT test program. The present test program and its accumulated
results information are saved. When a RETT test step in the RUNT test program is
encountered, the results from the RUNT test program are saved, and the original test program
and its results are restored. The pass/fail status and location of any PCB panels from the main
test program are available from the RUNT test program.
The memory locations are not reset during the RUNT execution and consequently can be used
to transfer information from one test program to the next. Up to 10,000 lines of additional
results and up to 16 test programs can be connected together with the use of RUNT range 2
commands from a single test program (one main program plus up to 15 sub-programs executed
with the RUNT using range 2). A main program can have any number of RUNT with range 0
or 1 test steps. Nesting of RUNT test steps is not allowed.
Parameter
Description
Test Type
RUNT
Title
Name Of Sub-Program To Execute. If the title is @M, use
the contents of the memory string as the test program name.
Range
Extent of Result Reporting For Called Program
0 = No individual test step results saved from called test
program, only its pass/fail status is returned
1 = Return only Pass (Fail Only if Called Program
Non-Existent)
2 = All results of called test program saved.
From (-) Point
Not used
To (+) Point
Not used
Low Limit
Not used
High Limit
Not used
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Test Descriptions
Message Test Types
Return from Test Sub-Program
Control transfers to the test step immediately following the last RunT test type that was
executed.
Parameter
Description
Test Type
RETT
Title
Not used
Range
Not used
From (-) Point
Not used
To (+) Point
Not used
Low Limit
Not used
High Limit
Not used
Message Test Types
Message Test Types
Overview
The following test types allow you to display messages to the operator during test time.
Messages are shown in the message area of the test screen.
A short display message (up to twelve characters) can be displayed directly by the DISPL test
type. The message displayed is contained in the title field of the test step.
Longer messages are displayed with the DISP test type which references displays by a message
number. These displays are defined by selecting 'Step Analysis' after selecting the DISP test
type in the Edit screen. Up to 36 messages can be defined in a test program with each used
more than once if desired. When a message is defined, it is displayed beginning at the
specified column and row of the message area of the display. Allowable rows are 1 through 8
and allowable columns are 1 through 78.
Messages can contain a special code {MEAS}. When the System encounters the {MEAS}, it
inserts the measured value for the closest step above this step that generated a result. This
feature can be used for displaying a measured value as the operator makes an adjustment on
the UUT.
•
Display a Short Message to the Operator on page 22-66
•
Display a Message to the Operator on page 22-66
•
Erase an Operator Message on page 22-66
•
Display a Picture Image on page 22-67
•
Wait for a Key to Be Pressed on page 22-68
•
PCB Number Being Tested on page 22-69
•
Enhanced Display Attributes using SCRN Test Type on page 22-69
•
SCRN Test Type Table on page 22-70
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Test Descriptions
Message Test Types
Model TR-8 Instruction Manual
Display a Short Message to the Operator
Display a message contained in the test step's test title to the operator.
Parameter
Description
Test Type
DISPL
Title
Text of message to display
Range
Not used
From (-) Point
Beginning column to display the message on. If this
is greater than 78, the message is not displayed.
To (+) Point
Line to display the message on. If this is greater than
8, the message is not displayed.
Low Limit
Not used
High Limit
Not used
Display a Message to the Operator
Display a specified message number to the operator. See Display Messages on page 9-34
and Display Attributes on page 22-69 for additional information.
Parameter
Description
Test Type
DISP
Title
Not used
Range
Message number to present
From (-) Point
Not used
To (+) Point
Not used
Low Limit
Not used
High Limit
Not used
Erase an Operator Message
Erase the message area of the display from the beginning location of the specified message to
the end of the line.
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Parameter
Description
Test Type
DISPE
Title
Not used
Range
Message number to erase. If zero is entered,
the System erases the entire display area.
From (-) Point
Not used
To (+) Point
Not used
Low Limit
Not used
High Limit
Not used
Test Descriptions
Message Test Types
Display Picture Image
The Picture test step is used to display an image to the operator. The Picture test step requires
the optional Board Viewer software to display the image. If you do not have the optional
Board Viewer software, contact CheckSum on page 1-2. The range setting determines the
image and type of action performed. Several types of images are supported, for example, the
board image (photo of the assembly), board outline, schematic, or probe map.
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Parameter
Description
Test Type
PICT
Title
See Range description for use
Range
1 = Display assembly view specified by the image type
and page number. The image type is specified in the
Low Limit and the page number (begin with one) is
specified in the High Limit. Image types include:
board/PCB image (type=0), board outline (1), schematic
(2), probe map (3), setup screen (4), external image (5),
or user-defined (6). If the test program uses subprograms containing different images of the same type
then the Title needs to specify the test program name. If
the Title is blank then the image type and page number
of the current test file are referenced.
2 = Zoom. Percent change is in the Low Limit.
3 = Scroll. Percent movement left/right and up/down are
in the Low and High Limits, respectively.
4 = Scroll to component. Component is named in the
Title. Current PCB number also used if panelized.
5 = Enable/disable highlighting (used e.g. for adjustment
loops) Low Limit = 0 to disable or = 1 to enable.
6 = Clear all highlights (e.g. during looping programs and
by ERROR CLEAR ALL).
7 = Display highlights at end of the test or as the test
runs. Set Low Limit =0 to highlight only at end of the test.
Set Low Limit =1 to highlight during testing.
8 = Display Board Viewer "always" or "mutually
exclusive" with the Test Screen. Set Low Limit = 0 for
mutually exclusive, or = 1 for concurrently.
9 = Set the highlight strategy. If the Low Limit bit 0 is 1
highlight Failed components. If the Low Limit bit 1 is 1,
highlight Passed components. If the Low Limit bit 2 is 1,
highlight Adjustment components.
10= Mark the component specified in the Title as Failed,
Passed, Adjustment, or Default. Set the Low Limit = 0 for
default appearance, = 1 to highlight as Failed, = 2 to
highlight as Passed, or = 4 to highlight as Adjustment.
11= Terminate Board Viewer
12= Release present image from memory
13= Display image found in a file specified in the Title.
The supported image file formats are BMP, JPG, PNG,
PCX, TIFF, and WMF.
14= Display previous image
15= If the previous test Failed and bit 0 of the Low Limit
is 1, mark the component specified in the Test Title to
Failed. If the previous test Passed and bit 1 of the Low
Limit is 1, mark the component specified in the Test Title
to Passed.
From (-) Point
Not used
To (+) Point
Not used
Low Limit
See Range description
High Limit
See Range description
Wait for a Key to Be Pressed
The System waits until the specified key is pressed, then continues to the next test step.
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Message Test Types
Parameter
Description
Test Type
WAITK
Title
Not used
Range
Decimal ASCII value of key. For example, 65 is A and 48 is 0. The F1-F10 key values
are 131-140. If 0 is specified, the System waits for any alpha-numeric or function key to
be pressed (Windows blocks some keys from the software). If a lower-case key is
pressed on the keyboard, it is converted to upper case before making the comparison.
From (-) Point
Not used
To (+) Point
Not used
Low Limit
Not used
High Limit
Not used
PCB Number Being Tested
Used with multi-PCB panels to specify to the operator which PCB is being tested. Test results
also contain the PCB number to show which PCB results are being listed. See the section of
this manual describing Multi-PCB Panels for complete detail.
Parameter
Description
Test Type
PCB
Title
Typically not used, but if it is specified as SKIP FAIL, the System will advance to the next
PCB statement in the test program if there have been any failures for this PCB during the
test. SKIP FAIL can be used, for example, to skip over functional tests of a PCB if the
MDA tests have failed.
Range
Which PCB is being tested. Valid values are 0-99. Normally PCB 1 is the first PCB,
followed by the others in sequential order. The value of 0 can be used for common test
steps used by all PCBs so that these test steps will be executed, even if the PCB
previously assigned has been skipped by the operator.
From (-) Point
Not used
To (+) Point
Not used
Low Limit
Not used
High Limit
Not used
Enhanced Display Attributes using SCRN Test Type
The SCRN test step on page 22-70 allows manipulation of display attributes (i.e. text color
and background color), in the user display area (area controlled e.g. by DISP, DISPE, and
DISPL test types). It also writes and reads user display area screen to and from files. There are
six different operations that can be applied simultaneously with a single test step:
•
Get Display Attribute: Copy the display attribute value for a specified row/column
location (From Point / Low Limit, respectively) into the integer memory (see MEMI on
page 22-75).
•
Set Display Attribute: Set the display attribute of the specified area according to the
specified display attribute value.
•
Save Screen: Save the message and display attribute of the specified area to an ASCII file
whose name is specified in the test step Title. Note: This file can later be modified
separately.
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Message Test Types
Model TR-8 Instruction Manual
•
Load Screen: Load the message and display attribute of the specified area from an ASCII
file whose name is specified in the test step Title.
•
Refresh User Display Area: Redraw the user display area.
•
Refresh Measurement Display Area: Redraw the measurement display area. This is the
area above and below the user display area.
The Refresh Measurement Display and Refresh User Display Area will be useful when
messages other than display messages have been printed on the screen and it is necessary to
restore the previous user messages.
The coordinates of a specified area are defined by the From/To Points and High/Low Limits.
The corresponding values of the operations are listed in the following SCRN Range table,
along with the list of display attribute values. After values for each display attribute and
operation are determined, those values are added to get the final range value. Examples on
how to specify the range are given at the end of the following section and in the Screen and
Display Attribute Manipulation on page 19-4 test program example.
SCRN Test Type Table
Parameter
Description
Test Type
SCRN
Title
filename, used when a save or load screen operation is specified
Range
color attribute and operation set up, see SCRN Test Range Table
From (-) Point
starting row
To (+) Point
ending row
Low Limit
starting column
High Limit
ending column
SCRN Test Range Table
Toolbar Note
In the edit test program window, after you have entered the SCRN test step,
use the F6 'Step Analysis' key to open a dialog box to setup all the attributes
of this command. Using the mouse, you can move and size the area in the
bottom section of this window.
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Test Descriptions
Message Test Types
Parameter
Value
Description
Text Color
0
Yellow (default)
1
Blue
2
Green
3
Cyan
Text Background
4
Red
5
Purple
6
Brown
7
White
8
Gray
9
Light Blue
10
Light Green
11
Light Cyan
12
Light Red
13
Magenta
14
Black
15
Light White
0
Blue (default)
16
Black
32
Green
48
Cyan
64
Red
80
Magenta
96
Brown
112
White
Operation
256
Get Display Attribute
(can be masked
512
Set Display Attribute
together)
1024
Refresh Measurement Display Area
2048
Refresh User Display Area
4096
Save Screen
8192
Load Screen
(If load file is invalid, there will be no effect.)
Note
The operations are executed in the above order, from top to bottom
sequentially (if specified). This SCRN test step is related to all test steps
that show messages on the user display area e.g.: DISP, DISPL, DISPE,
MEMS, MEMI, MEMR (range = 5).
Examples:
•
Set Display Attribute with cyan text and black background.
Range = 512 (set attribute) + 3 (cyan text) + 16 (black background)
= 531
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Test Descriptions
User-Defined Tests
•
Model TR-8 Instruction Manual
Refresh the Measurement and User Display Area
Range = 1024 (refresh measurement display) + 2048 (refresh user display area)
= 3072
See also SCRN example program on page 19-4.
User-Defined Tests
User-Defined Tests
Overview
•
Generate Test Result below
•
Execute User-Written Routine below
Generate Test Result
Place a pass or fail into the test results. This can be used with conditional jumps to generate
and record a passed or failed result.
If the range is 2, the System searches upward through the test program and finds the last
measured value from an analog test type (or its equivalent JMP command). This becomes the
measured value for the step and it is compared against the high and Low Limits to generate a
pass or fail result. This can be used after an adjustment loop to generate a pass or fail result
based on the JMPx measurement the last time through the loop.
Parameter
Description
Test Type
EVAL
Title
Descriptive title (e.g., Gain)
Range
0 for Pass
1 for Fail
2 for compare against High/Low Limits
4 for same as 2, but use present memory-real value as
measured value
From (-) Point
Not used
To (+) Point
Not used
Low Limit
Not used unless the range is 2 or 4
High Limit
Not used unless the range is 2 or 4
Execute User-Written Routine
Execute routine written by user. The called routine can be written in any language that
generates a .EXE or .COM file. During test program execution, the specified routine is loaded
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Test Descriptions
User-Defined Tests
into memory with the MDA software, then executed. Once it has completed operation, control
is resumed with the MDA software. If the DOS error level is non-zero upon return, the test
fails. If it is zero, the test passes.
If the System reports a DOS error 8, the EXECed program is too large to fit into the available
RAM memory. Exec first looks in the current directory for the .EXE or .COM file. If it isn't
found here it searches through the directory locations in the DOS PATH environment variable.
Only if the file is not in any of these locations does the System report a DOS error 2.
The test title describes the program name to EXEC. It can also specify command line
parameters to pass to the program. The up arrow (^) specifies to send whatever in the title
follows as a parameter. You can also include in the title: @i to pass the value of the memory
integer, @s to pass the value of the memory string, @b to pass the value of the batch string,
@c to pass the value of the compare string, @d# to pass the value of the #th display string, @r
to pass the value of the memory real, @n to pass the step number being executed at the time of
the call, @u# to pass the value of the #th UUT ID string, @t# to pass the iteration value of a
TRY block, and @ps# to pass a PCB skip bitmap or @psf# to pass a PCB skip-fail bitmap.
The # in @t# specifies the TRY block number (see MEMI 42 for details). The # in @ps# and
@psf# specifies a group of 16 PCBs; 1 specifies the map for PCBs 1 through 16, 2 specifies
the map for PCBs 17-32, etc. For @ps#, a bit is set if and only if the PCB is not skipped. For
@psf#, a bit is set if and only if a PCB neither is skipped nor has failed any tests.
If the first test title field is a string variable parameter, instead of a file name, then EXEC uses
the first field of that string as the file name. A file name may include a path. Any fields that
follow the file name obtained from a string variable are prepended to any other title field
parameters and sent as command line parameters to the executable file.
Parameter
Description
Test Type
EXEC
Title
Name of routine to execute. If the name has an up-arrow (^), the data
following the up-arrow is passed to the exec'ed routine as a parameter string.
If no extension (e.g., .EXE or .COM) is specified, the System adds on, as a
default, .EXE. See text above for more detail about passable parameters.
Range
Not used
From (-) Point
Not used
To (+) Point
Valid entries are 0,1,8, 32 plus optionally 2 or 4:
0 = normal execution
1 = do not generate or report results
2 = load DOS exit code from executed program into the integer
memory variable (see MEMI)
4 = load DOS error code from executed program the integer
memory variable (see MEMI)
8 = run executable routine and continue without waiting for it to terminate
32 = perform CheckSum custom handshaking, used with CheckSum
supplied utilities.
Low Limit
Not used
High Limit
Not used
Note:
Most user written executables run via EXEC are console mode Windows programs. Windows
uses PIF files to control how such programs are executed. This includes whether a DOS
22-73
Test Descriptions
Memory Manipulation Test Types
Model TR-8 Instruction Manual
window is displayed during execution, the size of any such window and whether any window
will automatically close on exit.
Sequential EXECution of an executable causes Visual MDA to wait for closure of any window
displayed for program execution. You can set up a PIF file for a specific executable by setting
its program tab properties under Win 9X or by creating a PIF file using the PIF editor under
Win 3.1. Under Win 9X the "close on exit" check box and "Run" window size choice are the
most important properties. Under Win 3.1 the analogous settings are the "Close Window on
exit" check box and "Display usage".
Under Windows 9X you also can set the default behavior for any console mode executable
which lacks its own PIF file by setting up a _default.pif file in the Windows directory.
The following describes how to create a default program information file (PIF) for MS-DOSbased programs. A default PIF file for MS-DOS-based programs is used for those MS-DOSbased programs that are not shipped with their own PIF files, and are started by clicking Run
on the Start menu. To create a default PIF file for MS-DOS-based programs, follow these
steps:
1. Open the Windows folder.
2. On the File menu, point to New, then click Shortcut.
3. In the Command Line box, type "command.com" (without quotation marks), then click
Next.
4. In the "Select a name for the shortcut" box, type "_DEFAULT" (without quotation marks),
then click Finish.
5. Use the right mouse button to click the new _DEFAULT.PIF file, then click Properties on
the menu that appears.
6. Set the properties you want for the _DEFAULT.PIF file, then click OK.
7. Restart Windows 9X.
Memory Manipulation Test Types
Memory Manipulation Test Types
Overview
The memory manipulation test types (MEMI on page 22-75, MEMR on page 22-78, MEMS
on page 22-80) allow use of the System's memory to assign, keep track of, manipulate, and use
variables within a test program.
There are three types of memory variables: integer, real (floating point), and string:
1. Integers are whole numbers ranging from plus to minus 32,767.
2. Real variables can include a fractional part and can range from plus to minus 10E37.
3. String variables can include any normal ASCII characters. There are several string
variables:
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–
Memory String (memory string)
–
Compare String (compare string)
–
–
UUT Serial Number String
Assembly Name String
–
Batch ID String
–
Test Title String
–
–
Batch Report Special String
Test Report Special String
–
User Name String
–
Part ID String
–
System ID String (read only)
Test Descriptions
Memory Manipulation Test Types
The memory string can be up to 128 characters long. The Compare String variable (referred to
as the "compare string" in the MEMS test type) can be used to make pass/fail comparisons
against the memory string variable. The UUT Serial Number String is an array of 321 strings
(accessible using MEMS 33). There is one Test Title String for each test step. The User Name
String and the Part ID String are not used by the System software (128 character swap
location).
The "Batch ID String" is only cleared between batches. As such, you can use it to solicit input
about the batch as a whole (e.g., batch number, UUT configuration), then not ask the operator
again until a new batch has started. You can do this by checking to see if the batch memory
string is empty, and if so, asking the operator to enter it.
These steps allow entry or assignment of the memory contents, pass/fail test generation based
on the value of the memory contents, fundamental math and manipulation of the memory
contents, transfer of control based on the contents of memory, or display of the variable.
These test steps can be used to form a counter, to control program execution based on operator
entry, or as an alternate way to generate test results based on operator entry.
•
Memory Manipulation (Integer) below
•
Memory Manipulation (Real) on page 22-78
•
Memory Manipulation (String) on page 22-80
Memory Manipulation (Integer)
Allow manipulation of the number in the integer memory variable.
22-75
Test Descriptions
Memory Manipulation Test Types
Model TR-8 Instruction Manual
Parameter
Description
Test Type
MEMI
Title
Description of the test step, or label of the jump destination for jumps based on the
memory number (used when range is 20 - 23).
Range
Type of operation to perform on the integer memory:
1 = Copy the value of the Low Limit of this test step into the integer memory.
2 = Perform a pass/fail test based on the value of the integer memory as compared
to the test step High and Low Limits.
3 = Copy the keyboard entry into the integer memory. The entry cursor is positioned
in the column/row of the display as indicated by the Low/High Limits respectively.
4 = Same as 3, but accept one character only with no [Enter] key required.
5 = Display the value of the integer memory at the column/row of the display as
indicated by the Low/High Limits respectively.
6 = Write the value of the integer memory to a file named in the test title.
7 = Set the value of the integer memory from a file named in the test title.
8 = Perform a logical shift-left operation on the integer memory by the number of bits
specified by the value in the Low Limit.
9 = Perform a logical shift-right operation on the integer memory by the number of
bits specified by the value in the Low Limit.
10 = Add the value in Low Limit to the integer memory. To subtract, use a negative
number for the value.
11 = Multiply the integer memory by the value in the Low Limit. To divide, use a value
between 1 and 0 (also see range 24).
12 = Perform a logical 'and' operation on the integer memory with the value in the Low
Limit.
13 = Perform a logical 'or' operation on the integer memory with the value in the Low
Limit.
14 = Perform a logical 'not' operation on the integer memory.
15 = Copy the contents of the integer memory into the sequence counter used by the
RPRTS test type.
16 = Copy the contents of the integer memory into the High Limit of the next test step.
This can be used, for example, to set the output for a DIGO command.
17 = Copy the contents of the integer memory into the real memory variable.
18 = Read the specified test program data into the integer memory. The Low Limit is
the step number of the test program. If the Low Limit is between 1001 and 2000
then the step number is the amount above 1000 forwards from the current step. If
the Low Limit is above 2000 then the step number is the amount above 2000
backwards from the current step. The High Limit indicates the data of that step
number to read:
1 = From Point, 2 = To Point, 3 = Test Range, 4 = Low Limit, 5 = High Limit,
6 = Measured, 7 = Nominal
19 = Write the value in integer memory into the specified test program location. The
Low Limit is the step number of the test program to write to. If the Low Limit is
between 1001 and 2000 then the step number is the amount above 1000 forwards
from the current step. If the Low Limit is above 2000 then the step number is the
amount above 2000 backwards from the current step. The High Limit indicates the
data of that step number to write:
1 = From Point, 2 = To Point, 3 = Test Range, 4 = Low Limit, 5 = High Limit,
6 = Measured, 7 = Nominal
20 = Jump to the label in the Test Title if the value of the integer memory is greater
than or equal to the Low Limit and less than or equal to the High Limit.
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Test Descriptions
Memory Manipulation Test Types
21 = Jump to the label in the Test Title if the value of the integer memory is less than
or equal to the High Limit.
22 = Jump to the label in the Test Title if the value of the integer memory is greater
than or equal to the Low Limit.
23 = Jump to the label in the Test Title if the value of the integer memory is less than
the Low Limit or greater than the High Limit.
24 = Divide the integer memory by the integer part of the Low Limit.
25 = Set the integer memory to the step number of the last failed step or to zero if no
failures.
26 = Set the integer memory to the current jump error count.
27 = Set the integer memory to the current system error count.
28 = Set the integer memory to the length of the memory string variable.
29 = Add the ASCII value of the character in the Low Limit location of the memory
string to the integer memory and subtract the High Limit from the integer
memory.
30 = Swap the integer memory and the total number of assemblies tested in this batch.
31 = Swap the integer memory and the total number of assemblies that have failed in
this batch.
32 = Load integer memory with the eight bit keypad mask value.
33 = Load the keypad mask value with the lower eight bits in integer memory,
see the Operator KeyPad Installation and Usage on page 4-4 for keypad mask bit
information.
34 = Append the value of the integer memory as a line at the end of the file named in
the Test Title.
35 = Open the file named in the Test Title, read the data on the line that is specified by
the Low Limit, and set the integer memory to the value on that line. If there is a
read error or if the line doesn't contain a valid integer representation, then the
integer memory is unchanged and a fail beep is emitted.
36 = Set keypad LEDs according to the two least significant integer memory bits. A
value of 0 clears the LEDs, 1 turns on the TESTING LED, 2 turns on the PASS
LED, 3 turns on the FAIL LED.
37 = Set the integer memory to the starting IO address configured for the specified
module. For modules with a Board Select Address, such as the DIG-1 module, the
integer memory is set to the Board Select Address. The module type is specified
by the Low Limit:
0 = System Module, 1 = MPX/TR-8-1 Module, 2 = FUNC-2/TR-6,
3 = TR-6-1, 4 = DIG-1/G-80, 5 = RM-1, 6 = GPIB, 7 = PWR-2/TR-8-PWR,
8 = SMT-2/TR-8-SMT, 9 = TR-8-SMT-CAP
Where multiple boards can be configured, such as MPX Modules, TR-6-1, DIG-1,
SMT, then the High Limit specifies the board index, starting at 1 for the first
module. If the Low Limit is 1000, the integer memory is set to the Base Address
for the modules with a Board Select Address.
38 = Controls the Measurement 'Warnings' and 'Errors' messages setup based on the
high limit bits 0 and 1, respectively, using the low limit. If the low limit is 1, then the
current setup is saved before the selected setup is changed. If the low limit is 0,
then the current setup is not saved before the selected setup is changed. If the
low limit is 2, the previous saved setup is restored. For example, if the low limit is 0
and high limit is 2 then the 'Warnings' messages are disabled and the 'Errors'
messages are enabled (the setup prior to this step is not stored).
40 = Sets the integer memory to the current number of errors for the currently tested
PCB if the Low Limit is less than or equal to -1. Otherwise, it is set to the number
of errors for the PCB number (0 to 320) specified in the Low Limit.
41 = Sets the number of errors of the currently tested PCB to the High Limit value if the
Low Limit is less than or equal to -1. Otherwise, the number of errors for the PCB
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Model TR-8 Instruction Manual
number (0 to 320) specified in the Low Limit is set to the High Limit value.
42 = Sets the integer memory to the iteration number of the specified TRY block. A
TRY block is defined by the LABEL TRY and ERROR TRY test steps. The Low
Limit specifies the TRY block number. The outermost TRY block is number 1 and
the block numbers increment with nesting depth. There can be up to 5 nested
TRY blocks.
43 = Sets the integer memory to 1 if the test program test sequence was terminated
before completing, or to 0 otherwise.
44 = Sets the integer memory to 1 if current testing is a Failures Only ReTest, or to 0
otherwise.
45 = Swap the integer memory and the test Environment setting for Max Errors limit
value.
46 = Sets the integer memory to 1 if current testing is a repeat test (e.g., F2 ReTest or
Failures Only ReTest) of the assembly, or to 0 if it is an F1 Test.
47 = Sets the integer memory to 1 if the file named in the Test Title exists, or to 0
otherwise.
From (-) Point
Not used
To (+) Point
Not used
Low Limit
See range assignment for usage
High Limit
See range assignment for usage
Memory Manipulation (Real)
Allow manipulation of the real memory (floating point) variable.
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Test Descriptions
Memory Manipulation Test Types
Parameter
Description
Test Type
MEMR
Title
Description of the test step, or label of the jump destination for jumps based on the
memory number (used when range is 20-23).
Range
Type of operation to perform on the real memory:
1 = Copy the value of the Low Limit of this test step into the real memory.
2 = Perform a pass/fail test based on value of the real memory as compared to the
test step High and Low Limits.
3 = Copy the keyboard entry into the real memory. The entry cursor is positioned in
the column/row of the display as indicated by the Low/High Limits respectively.
4 = Same as 3, but accept one character only with no [Enter] key required.
5 = Display the real memory value at the column/row of the display as indicated by the
Low/High Limits respectively.
6 = Write the value of the real memory to a file named in the Test Title.
7 = Set the value of the real memory from a file named in the Test Title.
10 = Add the value in the Low Limit to the real memory. To subtract, use a negative
number for the value.
11 = Multiply the real memory by the value in Low Limit. To divide, use a value
between 1 and 0 (also see range 24).
16 = Copy the contents of the measured value from the last test step into real memory.
This can be used, for example, to obtain a measured value, then make calculations
based on the outcome.
17 = Copy the contents of the real memory into the integer memory. If the value is
greater than 32,767, transfer the number -1 as an error indication.
18 = Read the specified test program data and load it into the real memory. The Low
Limit is the step number of the test program. If the Low Limit is between 1001 and
2000 then the step number is the amount above 1000 forwards from the current
step. If the Low Limit is above 2000 then the step number is the amount above
2000 backwards from the current step. The High Limit indicates the data of that
step number to read:
1 = From Point, 2 = To Point, 3 = Test Range, 4 = Low Limit, 5 = High Limit,
6 = Measured, 7 = Nominal
19 = Write the value in real memory into the specified test program location. The Low
Limit is the step number of the test program to write to. If the Low Limit is between
1001 and 2000 then the step number is the amount above 1000 forwards from the
current step. If the Low Limit is above 2000 then the step number is the amount
above 2000 backwards from the current step. The High Limit indicates the data of
that step number to write:
1 = From Point, 2 = To Point, 3 = Test Range, 4 = Low Limit, 5 = High Limit,
6 = Measured, 7 = Nominal
20 = Jump to the label in the Test Title if the value of real memory is greater than or
equal to the Low Limit and less than or equal to the High Limit.
21 = Jump to the label in the Test Title if the value of real memory is less than or equal
to the High Limit.
22 = Jump to the label in the Test Title if the value of real memory is greater than or
equal to the Low Limit.
23 = Jump to the label in the Test Title if the value of real memory is less than the Low
Limit or greater than the High Limit.
24 = Divide the real memory by the Low Limit.
26 = Copy the current time (in seconds past midnight) into the time memory.
27 = Copy the current time (in seconds past midnight) into the real memory.
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28 = Wait until the number of seconds specified in the Low Limit has past since the time
memory has been saved (see range 26), then continue to the next test step.
29 = Compute the amount of time (in seconds) since the time memory has been saved
(see range 26) and place the result in the real memory.
30 = Swap the contents of the real memory and the time memory.
31 = Sets the real memory to the measured value of the closest lower-numbered,
unskipped, test step that generates a pass/fail result. For example, jumps (e.g.,
JMPR) do not generate pass/fail results.
32 = Convert the real memory into the memory string having a maximum string width
specified by the Low Limit value and having the number of digits to the right of the
decimal point specified by the High Limit. The High Limit must be less than or
equal to the Low Limit amount.
33 = Append the value of the real memory as a line at the end of the file named in the
Test Title.
35 = Open the file named in the Test Title, read the data on the line that is specified by
the Low Limit, and set the real memory to the value on that line.
36 = Sets the real memory value to -1 if the selected PCB has not yet been tested, set
to 0 if tested and so far passing, or set to 1 if it has already failed. The PCB
selection is specified by the Low Limit if the Low Limit value is between 1 and 320.
Otherwise, the PCB selection is the current PCB.
From (-) Point
Not used
To (+) Point
Not used
Low Limit
See range assignment for usage
High Limit
See range assignment for usage
Memory Manipulation (String)
Allow manipulation of the characters in the memory string and other strings.
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Test Descriptions
Memory Manipulation Test Types
Parameter
Description
Test Type
MEMS
Title
Description of the test step, or as described below.
Range
Type of operation to perform on the memory string variable:
1 = Copy the character string in the Title of this test step to the memory string.
2 = Perform a pass/fail test based on the memory string being equal to the compare
string (Pass) or not equal (Fail).
3 = Copy the keyboard entry into the memory string. The entry cursor is positioned in
the column/row of the display as indicated by the Low/High Limits respectively.
4 = Same as 3, but accept one character only with no [Enter] key required.
5 = Display the memory string at the column/row of the display as indicated by the
Low/High Limits respectively.
6 = Write the memory string to a file named in the Test Title.
7 = Set the memory string from the contents of a file named in the Test Title.
9 = Add the string in the Test Title to the beginning of the memory string.
10 = Add the string in the Test Title to the end of the memory string.
11 = Make the memory string upper case.
12 = Convert the memory string to a sub-string starting at the Low Limit character
number and being High Limit characters long.
13 = Transfer the memory string to the UUT Serial Number of the test results.
14 = Copy the Assembly Name into the memory string.
15 = Swap the contents of the memory string and the compare string.
16 = Convert the memory string to an integer variable and put the result into the
integer memory. If there is an error, convert it to -1.
17 = Convert the memory string to a real variable and put the result into the real
memory. If there is an error, convert it to -1.
.
18 = Swap the contents of the Batch ID string with the contents of the memory string.
19 = Copy the contents of the Batch ID string to the memory string.
20 = Jump to the label in the Test Title if the memory string is the same as the
compare string.
21 = Jump to the label in the Test Title if the memory string is not the same as the
compare string.
22 = Jump to the label in the Test Title if the memory string is less than the compare
string (when compared on an ASCII basis).
24 = Copy the Test Title of the specified test program step into the memory string. The
Low Limit specifies the step number of the test program. If the Low Limit is
between 1001 and 2000 then the step number is the amount above 1000 forwards
from the current step. If the Low Limit is above 2000 then the step number is the
amount above 2000 backwards from the current step.
25 = Copy the memory string into the specified test program Test Title. The Low Limit
specifies the step number of the test program. If the Low Limit is between 1001
and 2000 then the step number is the amount above 1000 forwards from the
current step. If the Low Limit is above 2000 then the step number is the amount
above 2000 backwards from the current step.
26 = Swap the memory string with the User Name string. It can be used as a spare
memory location.
27 = Swap the memory string with Part ID string. It can be used as a spare memory
location.
28 = Append to the end of the memory string the character whose ASCII value equals
22-81
Test Descriptions
Memory Manipulation Test Types
Model TR-8 Instruction Manual
the integer memory value plus that in the test step High Limit.
29 = Copy the UUT Serial Number string into the memory string.
30 = Copy the memory string into the Batch Report Special string.
31 = Copy the memory string into the Test Report Special string.
32 = Write the contents of the memory string to the end of the file named in the Test
Title.
33 = Swap the memory string with the UUT Serial Number string identified by the
Low Limit index. A Low Limit value of 0 accesses the UUT Serial Number string
for one UUT Serial Number string per panel. For multiple UUT Serial Numbers
per panel, the Low Limit value equal to the PCB number accesses the UUT Serial
Number string for that PCB.
.
34 = Add the Test Title of the test step identified in the Low Limit to the beginning of the
memory string. If the Low Limit is between 1001 and 2000 then the step is the
amount above 1000 forwards from the current step. If the Low Limit is above 2000
then the step number is the amount above 2000 backwards from the current step.
35 = Open the file name specified in the Test Title, read the data from the line that is
specified by the Low Limit, and set the memory string to the data on that line.
36 = Append the Test Title of the test step identified in the Low Limit to the end of the
memory string. If the Low Limit is between 1001 and 2000 then the step is the
amount above 1000 forwards from the current step. If the Low Limit is above 2000
then the step number is the amount above 2000 backwards from the current step.
37 = Get a message line from User Display into memory string (row line = Low Limit).
38 = Get a line of Display Attributes from User Display into memory string (row line =
Low Limit).
39 = Write a line of Display Attributes from memory string to User Display Area (row
line = Low Limit).
40 = Write the memory string into the specified test program Test Title in the same
manner as MEMS 25. In addition, any Test Title changes for JMP or LABEL
operations are recognized by the system software.
41 = Set the memory string to the current date in YYYYMMDD format.
42 = Copy the System ID string into the memory string.
43 = Set the memory string to the test system software type:
"TR-8", "Analyst ft", or "Analyst mc" (not including the quotes)
44 = Set the memory string to the name of the currently executing test program.
45 = Set the memory string to the name of the calling program if the currently
executing test program was called with a RUNT or to an empty string otherwise.
46 = Deletes the file specified in the memory string. The memory string may include
a path preceding the file name.
47 = Set the memory string to the operator Display Message specified by the number
in the Low Limit.
From (-) Point
Not used
To (+) Point
Not used
Low Limit
See range assignment for usage
High Limit
See range assignment for usage
22-82
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Test Descriptions
General Purpose Interface (GPIB) Bus I/O
General Purpose Interface (GPIB) Bus I/O
General Purpose Interface Bus (GPIB) I/O
Overview
Allows control of external instrumentation connected via the IEEE-488 interface. Use of this
capability requires installation of the optional Model GPIB interface that is available from
CheckSum. This interface installs into an extra slot in your PC.
The Model GPIB can be used for most common IEEE-488 operations by use of the GPIB test
step. However, if you have special needs, such as processing waveform or binary data, you
can write a program in a common language, such as C or PASCAL, then call it with the EXEC
test type. Information can be passed back and forth with files written to the hard-disk or a
ram-disk. In addition, data can be passed to the EXECed program as a command line
parameter. Since the GPIB provided by CheckSum is provided with a toolkit, and since a
device driver is not necessary, it is not extremely difficult to do your own specialized routines.
In general, when using the GPIB test type, you will specify the address of the instrument on
the bus. This is uniquely set for each instrument on the bus (don't use 21 since that is the
system controller address). For reads and writes, the transferred data can be up to 255
characters long. For detailed information about what occurs during GPIB commands, refer to
the manual that comes with the Model GPIB. The commands available from the CheckSum
software are almost one-for-one implementations of the commands described therein.
When writing information to the bus, you can choose from sending the information in the test
title (the To (+) Point is 0 in this case), sending the information in a display line (just like the
data used for the DISP test type - the To (+) Point is 1 in this case), sending information from a
disk file (the To (+) Point is 37 in this case and the test title contains the name of the file to
open and read), or you can directly send the contents of a memory variable (the To (+) Point is
38, 39, and 40 for the memory string (MEMS), real memory (MEMR), and integer memory
(MEMI) respectively).
When reading information from the bus, you can specify that the returned information goes
into a memory location (the To (+) Point is 0, 1, and 2 for the real memory (MEMR), memory
string (MEMS), and integer memory (MEMI) respectively), or to send the data to a disk file
(the To (+) Point is 3 in this case and the test title contains the name of the file to create and
write to).
GPIB Test Type parameters:
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Test Descriptions
General Purpose Interface (GPIB) Bus I/O
Model TR-8 Instruction Manual
Input from GPIB Device (i.e. enter)
Parameter
Description
Range
0
From (-) Point
Device address
To (+) Point
0 = Input a number into the real memory (see MEMR)
1 = Input a string into the memory string (see MEMS)
2 = Input an integer into the integer memory (see MEMI)
3 = Input data and write the data into the file named in the Title
Output to GPIB Device (i.e. output)
Parameter
Description
Range
1
From (-) Point
Device address
To (+) Point
0 = Output the data from the Title
1-36 = Output the data from the Operator DISPLAY area
37 = Output the data from the file named in the Title
38 = Output the data from the memory string (see MEMS)
39 = Output the data from the real memory (see MEMR)
40 = Output the data from the integer memory (see MEMI)
Abort (i.e. abort)
Parameter
Description
Range
2
Device Clear (i.e. devclr)
Parameter
Description
Range
3
From (-) Point
>0 = Selected device clear
0 = Full bus device clear
Set Bus Terminators (i.e. eol)
Parameter
Description
Range
4
From (-) Point
Device address
Title
a,b,c,d, where:
a = Output termination
0 = EOL / EOI
1 = EOI (End Or Identify)
2 = EOL (End-Of-Line)
b = EOL string
c = Input termination (like a)
d = Input termination character
I/F Init (i.e. init)
Parameter
22-84
Description
Model TR-8 Instruction Manual
Test Descriptions
General Purpose Interface (GPIB) Bus I/O
Range
5
From (-) Point
GPIB address [21]
To (+) Point
total of [0]:
32768 background DMA
16384 block DMA
4096 fast
32 non-system controller
16 IRQ 2
17 IRQ 3
19 IRQ 5
21 IRQ 7
1 DMA 1
2 DMA 2
3 DMA 3
Local Lockout (i.e. llo)
Parameter
Description
Range
6
From (-) Point
Device address
Remote (i.e. remote)
Parameter
Description
Range
7
From (-) Point
Device address
User Command (i.e. send)
Parameter
Description
Range
8
To (+) Point
0 = Send the data from the Title
1-36 = Send the data from the Operator DISPLAY area
37 = Send the data from the file named in the Title
Serial Poll (i.e. spoll)
Parameter
Description
Range
9
From (-) Point
Device address
Puts the serial poll result into the integer memory (MEMI)
Status (i.e. status)
Parameter
Description
Range
10
To (+) Point
8 = Error number
9 = Byte count
Puts the result into the integer memory (MEMI)
Timeout (i.e. timeout)
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Test Descriptions
RS232 Serial Interface I/O
Model TR-8 Instruction Manual
Parameter
Description
Range
11
To (+) Point
>0 = Depends on microprocessor
0 = Disable
Trigger (i.e. trig)
Parameter
Description
Range
12
From (-) Point
Device address
RS232 Serial Interface I/O
RS232 Serial Interface I/O
Overview
Allows communication with serial port devices.
The RS232 test type allows flexible input and output of data to the controller's COM ports 1
through 4. Data strings of up to 255 characters can be transferred. When sending data, the
data transmission can have an optional preamble and/or postamble string of up to 32
characters.
As alternatives to use of the RS232 test type, you can write a .EXE or .COM file and call it
with the EXEC test type, or you can use the MEMS test type with a file name designating a
serial port (e.g., COM1). However, these alternatives are generally not as flexible as the
RS232 test type.
When writing information to the port, you can choose between sending the information from
the Test Title (the To (+) Point is 0 in this case), sending the information from a display line
(just like the data used for the DISP test type - the To (+) Point is between 1 and 36 in this
case), sending information from a disk file (the To (+) Point is 37 in this case and the Test
Title contains the name of the file to open and read), or you can directly send the contents of a
memory variable (the To (+) Point is 38, 39, and 40 for the memory string (MEMS), real
memory (MEMR), and integer memory (MEMI) respectively).
When reading information from the port, you can specify that the returned information goes
into a memory location (the To (+) Point is 0, 1, and 2 for the real memory, memory string,
and integer memory respectively), or to send the data to a disk file (the To (+) Point is 3 in this
case and the test title contains the name of the file to create and write to).
A cable with the following wiring can be used between two computers:
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RS232 Serial Interface I/O
RS-232 Cable Connections
Computer to Computer
1
2
3
4
1
6
2
7
3
8
4
9
5
DB9
(female)
5
6
7
8
9
1
2
3
4
5
6
7
8
9
=
=
=
=
=
=
=
=
=
Carrier Detect
Receive Data
Transmit Data
Data Terminal Ready
System Ground
Data Set Ready
Request to Send
Clear to Send
Ring Indicator
DB9
(female)
RS232 Test Type parameters:
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Input from RS232 Device
Parameter
Description
Range
0
From (-) Point
Device address of desired COM port (e.g., 1 for COM1)
To (+) Point
0 = Input a number into the real memory (see MEMR)
(destination of data read)
1 = Input a string into the memory string (see MEMS)
2 = Input an integer into the integer memory (see MEMI)
3 = Input data and write the data to the file named in the Title
Output to RS232 Device
Parameter
Description
Range
1
From (-) Point
Device address of desired COM port (e.g., 1 for COM1)
To (+) Point
0 = Output data from the Title
(source of data sent)
1-36 = Output data from the Operator DISPLAY area
37 = Output data from the file named in the Title
38 = Output data from the memory string (see MEMS)
39 = Output data from the real memory (see MEMR)
40 = Output data from the integer memory (see MEMI)
Device Clear
Parameter
Description
Range
3
From (-) Point
>0 = Clear status for COM port number (e.g.,1 for COM1)
0 = Clear status for all COM ports
Set Communication Parameters
Parameter
Description
Range
4
From (-) Point
Device address of desired COM port (e.g., 1 for COM1)
To (+) Point
Parameter Initialized:
0 = Setup the UART communication parameters. The baud
rate, data length, parity, and stop bit length are respectively
defined by comma separated values, for example
9600,8,N,1. The parity is specified by a single character
and the other values by numeric values. The allowed baud
rate is from 50 to 115200. The data length is from 5 to 8.
Parity can be specified as N for none, E for even, O for
odd, M for mark, or S for space. The stop bit length can be
1 or 2 bits.
1 = Setup the optional transmission preamble. The default is
no preamble. A non-null preamble is specified by a
sequence of decimal values for the ASCII characters in the
preamble. Each decimal value consists of the pound sign
(#) followed by a decimal number in the range from 0 to
127. An empty string sets the preamble to null.
2 = Setup the end of transmission postamble. The default is
carriage return, line feed (#13#10). A non-null postamble is
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specified by a sequence of decimal values for the ASCII
characters in the postamble. Each decimal value consists
of the pound sign (#) followed by a decimal number in the
range from 0 to 127. An empty input string sets the
postamble to null.
Status
Parameter
Description
Range
10
From (-) Point
0 = Show an error status bit if set for any COM port
Puts the result into the integer memory (see MEMI)
>0 = Read status for this COM port number (e.g., 1 for COM1)
Timeout
Parameter
Description
Range
11
From (-) Point
Device address of desired COM port (e.g., 1 for COM1)
To (+) Point
0 = Disable I/O timeouts
>0 = Number of 0.1 second increments to wait before timing
out when a transmission should be active, but is not. The
default timeout is 10 seconds.
Miscellaneous Tests
Miscellaneous Tests
Overview
The topics in this category are as follows:
•
Turn Fixture Vacuum On and Off on page 22-90
•
Fixture Control on page 22-90
•
Fixture Identification on page 22-91
•
Control Relays on page 22-92
•
Self-test Module on page 22-94
•
BreakPoint on page 22-95
•
Fixture-Check on page 22-96
•
Print Test Results on page 22-97
•
Sound the PC's Beeper on page 22-99
•
Set Test Conditions on page 22-99
•
Put a Remark in the Test Program on page 22-100
•
Conditional Test Report Output on page 22-100
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Turn Fixture Vacuum On and Off
Turns vacuum on and off to the test fixture. Note: This test type has been superseded by the
more general, FIXCT test type (see Fixture Control below).
The fixture can be built with a fixture-down switch, typically consisting of two spring probes
that touch a common target when the fixture is engaged. If this is the case, you can specify
that the System waits for this switch to become true (low resistance) before continuing.
Otherwise, you can specify a wait time before the system continues after applying vacuum.
This test-type controls one of two fixture control bits available from the Model TR-8 System
Module. The main control (Fixture 1) is available via an RCA jack on the back panel. The
second control (Fixture 2) is available at the D-Sub-25 back panel connector. Vacuum-on is a
low output and vacuum-off is a high output.
The menu selection Measure > Step Analysis F6 in the editor provides an easy to use, push
button method, to setup this test step.
Parameter
Description
Test Type
VACUM
Title
Not used except as an optional comment field.
Range
0 - Remove vacuum from fixture
1 - Apply vacuum to fixture via Fixture 1 control
2 - Apply vacuum to fixture via Fixture 2 control
3 - Apply vacuum to fixture by activating both Fixture 1
and Fixture 2 controls
From (-) Point
First test point connected to fixture-down switch.
To (+) Point
Second test point connected to fixture-down switch.
Low Limit
Time, in mSec, to wait after applying vacuum but before continuing with next
test step.
If a fixture-down switch is used, the delay time to wait after the fixture-down
switch is activated.
High Limit
Maximum resistance (in ohms) before considering the fixture-down switch to
be closed. If zero, do not measure the fixture-down switch.
Fixture Control
Engages and Disengages CheckSum Pneumatic and Vacuum Fixturing Systems.
The FIXCT command allows the test program to control the automated pneumatic or vacuum
fixturing systems. It can interact with the CheckSum DM-1 Discharge System for automatic
detection and discharge of voltages on the unit under test.
Note
When the DM-1 is used, always use range bit 8 for engage and disengage.
For example, set the FixCT range code to 9 to engage fixture 1 and set the
FixCt range code to 8 to disengage the fixture. If the range code is set to 0
to disengage the fixture, the DM-1 will not discharge the UUT placed on
the fixture.
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Like the VACUM test type, the FIXCT test type controls the fixture using the two signals
called Fixture 1 and Fixture 2 available on the 25 pin connector and phono jack (top
connector, Fixture 1 control signal) of the TR-8 System Module back-panel, see the Wiring
Diagram section.
The FIXCT test type uses Digital I/O Bits 1, 2 and 3 for Fixture 1 and Digital I/O bits 4, 5 and
6 for Fixture 2 when used with a DM-1 Discharge System. You should be careful that this
does not conflict with other custom use of these bits. A custom cable is required when using
Fixture 2 control in conjunction with a DM-1.
The menu selection Measure > Step Analysis F6 in the editor provides an easy to use, push
button method, to setup this test step.
Parameter
Test Type
Description
FIXCT
Title
Optional Comment Field
Range
Sum of the following:
0 - Disengage Fixture 1 and Fixture 2
1-
Engage Fixture 1
2-
Engage Fixture 2
8-
When combined with range 0, this controls the DM-1 for Fixture 1 to isolate the
MDA points from the UUT and place it in discharge mode.
When combined with range 1, this controls the DM-1 for Fixture 1 to isolate the
MDA test points from the UUT, wait for the UUT voltage to be a safe low level,
and then connect the MDA test points to the UUT.
16 -
When combined with range 2, this entry controls the DM-1 for Fixture 2, similar
to range 8 described above.
4-
When combined with ranges 1 or 2, and 8 or 16, this disables warning
messages if the DM-1 switch is set to Bypass.
From (-) Point
First test point connected to the fixture-down switch.
To (+) Point
Second test point connected to the fixture-down switch.
Low Limit
Time, in mSec, to wait after engaging the fixture, if appropriate verifies the fixture-down
switch is closed (see High Limit) before continuing to the next step.
High Limit
Maximum resistance (in ohms) before considering the fixture-down switch to be closed. If
zero, do not measure the fixture-down switch.
Fixture Identification
This test type checks the identity (ID) of a fixture. With use of this capability, you can be
assured that you have the proper fixture installed on the tester at the beginning of the test. The
Fixture ID is encoded in the test fixture as a pattern of jumper wires on a specified range of test
points.
The first test point (specified in the ‘From’ test point column) is the reference test point.
Jumpers from this point to the following test points (up to the ‘To’ test point column) set a
series of 1’s (jumper installed) or 0’s (no jumper installed) that are put together to form a
fixture ID number. The least significant bit is the first one following the reference test point.
The test point range must be for normal solid-state test points.
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The jumpers are measured (using the 200Ω DCI range), and if the measured number is
different than the nominal value, a message is presented to the operator to install the proper
fixture, after which the operator can continue or end the test. Note: if you are using a TR-72000 press, the FixCt command must come first to engage the fixture interface.
For example, you might specify the range of points from 1 to 7 for your fixture ID. This will
give you a range of up to 63 fixtures. If you connect a jumper wire from points one to two, the
fixture will have an ID of 1. If you add a wire from points one to four, the Fixture ID will
become five.
Selecting F6 (Step Analysis) from the FIXID test type in the test program editor allows you to
easily and interactively determine the wiring patterns for the fixture ID. Also see Jump Based
on Fixture ID (JFXID test step on page 22-62).
Parameter
Description
Test Type
FIXID
Title
Optional Comment Field
Range
Sum of the following:
0 - Normal
8 - Measure fixture ID, do not set Pass/Fail
16 - Set Pass if the expected fixture ID is not equal to the measured fixture ID
32 - Copy measured fixture ID into integer memory (MEMI)
64 - Display system warning message if this test step fails
From (-) Point
The first test point is used as the reference point against which connections
to the test point interval are measured. This interval begins at the test point
number immediately following the From (-) Point.
To (+) Point
The last test point in the test point interval.
Low Limit
Not used
High Limit
Expected Fixture ID
Control Relays
Control relays on the Model TR-8-PWR/PWR-2, Model TR-6, FUNC-2, and TR-6-1 Modules.
Controls the four undedicated form-C relays (Relay 1 - 4) available at the Model TR-6, FUNC2, and TR-8-PWR/PWR-2 back panels. These can be used to switch external signals, apply
power directly (up to 1A) or to control other higher-power relays. Each time a test program is
started, these relays are reset which connects the relay common (COM) terminal to the relay
normally-closed (NC) terminal. Note that all four undedicated relays are programmed (either
set or reset as specified) each time that this command is executed. This command can also
enable or disable the power and ground outputs of the TR-8-PWR/PWR-2 or FUNC-2 Module.
Each Model TR-6-1 MPX module contains four undedicated relays connected to a back panel
header on the MPX module. These can also be controlled with this test type.
This test type can also be used to override automated control of the Model TR-6, FUNC-2, and
TR-6-1 test point relays. If a range of 7-10 is specified, the High Limit controls one of the test
point relays on the TR-6/FUNC-2 and TR-6-1 by either connecting or disconnecting it with the
high or low relay bus. When this occurs, it also puts the System into a mode that stops these
relays from being disconnected between tests, and as a consequence, allow you to do special
switching (such as bussing together several test points). There is both a high bus and low bus
on the relay channels that can separately be controlled and connected. When in relay override
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mode, if you make a measurement to a test point on the relay bus, the relays from the
measurement are also not disconnected, and you must disconnected them explicitly with this
command if connected. The System disconnects all the relays and goes back into normal mode
when a range of 11 is executed, and at the end of the test program execution.
Note
Use extreme caution when overriding the standard TR-6 or FUNC-2 relay
test point switching since in this mode you could damage the UUT or test
system.
The menu selection Measure > Step Analysis F6 in the edit window provides an easy to
use, fill-in the form method, to select these settings.
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Parameters
Description
Test Type
RELAY
Title
Normally not used
Range
Close relays on specified module:
0=
TR-6 or FUNC-2 System Module
1=
First TR-6-1 MPX Module
2=
Next TR-6-1 MPX Module
3-6 = Next TR-6-1 MPX Module(s)
7=
Connect a relay test point to the TR-6 or
FUNC-2 high-bus
8=
Disconnect a relay test point from the TR-6 or
FUNC-2 high-bus
9=
Connect a relay test point to the TR-6 or
FUNC-2 low-bus
10 = Disconnect a relay test point from the TR-6 or
FUNC-2 low-bus
11 = Disconnect all high/low relays from the TR-6 or
FUNC-2 buses and go back to normal switching mode
12 = TR-8-PWR/PWR-2 Module
From (-) Point
Not used
To (+) Point
Not used
Low Limit
Not used
High Limit
If the range is 0, sum of the following:
1 = Relay 1 closed (relay COM connected to relay NO)
2 = Relay 2 closed
4 = Relay 3 closed
8 = Relay 4 closed
32 = +5V Output Enabled (on FUNC-2)
64 = -12V Output Enabled (on FUNC-2)
128 = +12V Output Enabled (on FUNC-2)
If the range is 1-6, sum of the following:
1 = Relay 1 closed (relay COM connected to relay NO)
2 = Relay 2 closed
4 = Relay 3 closed
8 = Relay 4 closed
If the range is 7-10, the TR-6 or FUNC-2 test point number
(1601-1616, 1651-1950)
If the range is 12 (TR-8-PWR/PWR-2), sum of the following:
1 = Relay 1 closed (relay COM connected to relay NO)
2 = Relay 2 closed
4 = Relay 3 closed
8 = Relay 4 closed
16 = Ground Output Enabled
32 = +5V Output Enabled
64 = -12V Output Enabled
128 = +12V Output Enabled
Self-test Module
Performs system self-test of various modules. This test type can be used to measure the fuses
on the Model TR-8-PWR/PWR-2 Module.
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System self-test of the TR-8-PWR/PWR-2 Module checks to see if the fuses on the Module
have blown. You can also insert a check in the program for this purpose. The STST (for SelfTest) test type can also used for this purpose. This test type generates a pass or fail based on
the status of the +12V, +5V, or -12V fuses. In the default case, it will fail if any of these fuses
are blown. If you wish to only test the status of one or two fuses, you can mask out the subtests not desired. Also see the Jump Based on Self-test JSTST on page 22-62 test type.
The menu selection Measure > Step Analysis F6 in the edit window provides an easy to
use, fill-in the form method, to select these settings. Following is the syntax of the STST test
type:
Parameters
Description
Test Type
STST
Title
Normally not used
Range
Module to check self-test status of:
4 = DIG-1 Module
8 = TR-8-PWR/PWR-2 Module
10 = HP-1 Module
Add 16384 to the range to obtain results without Pass/Fail indication
From (-) Point
Not used
To (+) Point
Not used
Low Limit
Not used
High Limit
Mask bit. Sum of the following bits. For each bit set, ignore that self-test:
If Range = 4 (DIG-1)
1 = test for module presence
2 = test fuse
4 = test digital I/O
8 = offset for second MPX module
If Range = 8 (TR-8-PWR/PWR-2)
1 = +5V fuse
2 = - 12V fuse
4 = +12V fuse
If Range = 10 (HP-1)
1 = test for module presence
2 = test for fixture open
4 = test for fixture closed
8 = offset for second MPX module
BreakPoint
The breakpoint (BrkPt) test type opens a window with a snapshot of the current state of system
variables and hardware settings during test step execution from either the Edit or Test screens.
It is used as a debugging tool during test program development. The values and settings are
only displayed and can not be changed in this window. The system variables include variables
set via the MEM and FLAGS commands. The system hardware includes the DIG I/O
resources, RELAY connections, and sourcing via Analog Source types.
The breakpoint window has several tabs to display the various pages of information. At the
right corner of each tab page is a selection button. Click on the button to make it become the
selected tab page. A black dot will indicate the selection. The selected tab page will be
displayed when the breakpoint test step is executed. Clicking on any tab shows the contents of
that page.
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Note that the Test Point Sources screen (ranges 500 through 510) contains a Find Next button
which automatically displays the next source from the Source list that has any test point
connections.
Parameters
Description
Test Type
BRKPT
Title
Optional comment field
Range
100 – Displays System Variables
200 – Displays System Flags
300 – Displays state of DIG I/O bytes
400 – Displays state of TR-6/FUNC-2 Relays
401 – Displays Test Point connections to Two Wire bus
402 – Displays state of PWR Relays
404 – Displays current strategy for connection MPX test points to
the Solid State Bus
405 – Displays board connections to Relay Bus
500 – Displays test points sourced by DCV 3 source
501 – Displays test points sourced by DCV 4 source
504 – Displays test points connected by RELAY ranges 7 & 9
507 – Displays test points sourced by DCV 1 source
508 – Displays test points sourced by DCV 2 source
509 – Displays test points sourced by SQRV source
510 – Displays test points sourced by SINEV source
From (-) Point
Not used
To (+) Point
Not used
Low Limit
Not used
High Limit
Not used
Fixture-Check
Tests connection of UUT to the fixture.
Fixture-check allows you to determine if fixture connections from the Test System to the UUT
(typically via spring probes) are making good contact. This is performed by measuring the
resistance of each point to all other points and ensuring that the result is below a specified
resistance threshold.
The name and point number of any pins not meeting the desired criteria are displayed to the
operator. The operator can take corrective action and then repeat the fixture-check to see if
problems are still present, or continue to the next step of the test program. If errors occur, the
System erases the message area of the testing display before and after presentation of the
errors.
Programming and use of fixture-check is described in more detail in the section Fixture-Check
Data on page 8-18.
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Parameter
Description
Test Type
FIXCH
Title
Not used except as an optional comment
field.
Range
If any test points fail the FIXCH test:
0 = Halt and display a list of failing test
points (Halt on Fail setting is ignored)
1 = If Halt on Fail is enabled, then halt and
display a list of failing test points
From (-) Point
Not used
To (+) Point
Not used
Low Limit
Not used
High Limit
Not used
Test Descriptions
Miscellaneous Tests
Print Test Results
Allows the System to print a test results report from within a test program. The report is
printed in the same format as configured for test results report specified in the Configure
System > Environment > Configure Reporting > Test Results screen. This function can be
used, for example, if a number of similar assemblies are tested repetitively in a loop without
exiting the test execution between assemblies. (See also the ERROR test type CLEAR ALL
option for initializing the loop results before testing an assembly.) This test step also allows
the system to programmatically change the SPC log data path or report data path and
reconfigure automatic test reporting. Early versions of Model TR-8/6 software used an
alternate reporting test type (REPRT) that was more limited in scope and is not recommended
for new test programs.
For example, to print test result failures to a COM1 printer only when there are test failures use
RPRTS range 10 with a test title of COM1. If you want the report to also include results from
test steps that pass and output results to the default test report device (specified in the
Configure System > Environment > Configure Reporting > Automatic Reports screen) then use
a range of 74 and a blank title. To log to the SPC file "summary only" information, use a
range of 36. To log to the SPC file "summary and failure" information, use a range of 164. To
log to the SPC file "summary, failure and passing" information, use a range of 228.
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Parameter
Description
Test Type
RPRTS
Title
Output device. For example: LPT1, COM1, @WP, or a file name.
Using @WP specifies that the report be sent to the default
Windows printer. If the title contains @S then the contents of the
memory string variable (see MEMS) are used to specify the file
name.
Range
Sum of the following:
1 = Include a sequence number in the test report to
describe which assembly of the batch is being
reported on. The sequence number starts over each
time the test program is restarted.
2
=
4
=
Print results report to file named in test title or to
the default test report output device if the title is blank.
Print results to SPC log.
8
=
Print report only if the jump error count is greater than 0.
16 =
Clear out all test results after report(s).
32 = Report summary information. (For SPC only)
64 = Report on test steps which pass.
128 = Report on test steps which fail. (For SPC only)
256 = Set SPC data path or Report data path to the
memory string value, see From (-) Point note below.
512 = Set Automatic Reporting Configuration, see
To (+) Point note below.
1024 = Print Batch Report to the output device named in the
test title or to the default batch report device if
the test title is blank.
2048 = Update the Run Time failure statistics with the current
test results, see From (-) Point note below.
4096 = Print SPC Production Report to the output device
named in the test title or to the default batch report
device if the test title is blank.
8192 = Print SPC Pareto Report to the output device
named in the test title or to the default batch report
device if the test title is blank.
From (-) Point
Used By Range = 256
0 = update SPC data path from memory string value
1 = update Report data path from memory string value
Used By Range = 2048
0 = decrement the test results (allows retest results to be stored)
1 = increment the test results
To (+) Point
Used By Range = 512
1 = automatic report on failed assemblies
2 = automatic report on passed and failed assemblies
4 = automatic report of failed results data only (all results
otherwise)
Low Limit
Not used
High Limit
Not used
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Sound the PC's Beeper
Sounds the PC's beeper with either a single tone beep or the warble-like beep used during
failures.
Parameter
Description
Test Type
BEEP
Title
Not used
Range
0 is normal beep. 1 is warble-like beep.
From (-) Point
Not used
To (+) Point
Not used
Low Limit
Not used
High Limit
Not used
Set Test Conditions
Turn testing conditions on or off during test execution.
The internal calibration (FLAGS 16384) can be used to force a self-calibration cycle of the
TR-8 System Module internal voltage references. Self-calibration also occurs automatically
each time the MDA software is started. When a test program is executing and a FLAGS 16384
is encountered, and it has been over an hour since the last internal calibration, a new selfcalibration (requiring about two seconds) will occur. Internal calibration can lead to better
accuracy if the tester is operated for long periods of time (e.g., over a day) without restarting
the software (and hence forcing an internal calibration) or when the system is operated in
greatly fluctuating temperatures.
The menu selection Measure > Step Analysis F6 in the editor provides an easy to use, push
button method, to setup this test step.
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Parameter
Description
Test Type
FLAGS
Title
Not used
Range
1=
2=
4=
8=
16 =
32 =
48 =
64 =
80 =
96 =
do not halt on fail
halt on failure
allow only a single connection to a TR-6 or
FUNC-2 source (disconnect source before
making a new connection to the same source)
allow multiple TR-6 or FUNC-2 sources
(opposite of 4)
restore halt on fail to the default value
do not single step
single step
restore single step to the default value
enable 10 volt clamp to ground on solid-state
multiplexer* test points (default setting).
enable 12 volt clamp to ground on solid-state
multiplexer* test points.
16384 = perform internal system calibration
* Note: Applies to Analyst mc, MPX-2, and MPX-3
modules.
From (-) Point
Not used
To (+) Point
Not used
Low Limit
Not used
High Limit
Not used
Put a Remark in the Test Program
Allows a test program remark for the purpose of test program documentation. The test step is
ignored for all purposes other than being displayed or printed with the test program.
Parameter
Description
Test Type
REM
Title
Remarks for test program documentation
Range
Not used
From (-) Point
Not used
To (+) Point
Not used
Low Limit
Not used
High Limit
Not used
Conditional Test Report Output
This test type allows you to put a string of characters in the test results report based on whether
the previous test passed or failed. For example, this can be used to provide hints, to the person
repairing the assembly, based on the failures that have occurred.
Use a range code of 0 if you would like to output the text in the test title of the test step into the
test results file. Use a range code of 1-36 if you want to output the text from one of the
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operator display messages, or 1000 if you would like to output the contents of the memory
string.
You can output the string of data beginning at a specified column of the test report. The
column number is placed in the 'From (-) Point' field.
The Low Limit column specifies the condition that will cause the string to be included in the
results. If the Low Limit is 1, the string is output only if the last test passed. If the Low Limit
is 2, the string is output on a failed last test. If the Low Limit is 3, it is output in any case. The
case of always can be used as a way to put a variable string in the results.
An alternate use of the RSLTS test-type is to turn on and off reporting of test steps during
program execution. For example, you may want to turn off detailed step reporting during part
of the program if you are encapsulating a test. For this use of the RSLT test-type, use a range
value of 2000, and place the reporting mode that you want to invoke in the Low Limit (1 =
report on passing tests, 2 = reporting on failing tests, 3 = reporting on all tests, 4 = reporting on
skipped tests). In this mode, you can use a range of 2001 to temporarily set a mode, then a
range of 2002 to return to the previous mode of results reporting.
For example, to output the text from the test title of this test step to column 5 of the test results,
only if the previous step failed, use a range of 0, From (-) Point of 5, and a Low Limit of 2.
For purposes of pass/fail status, the closest previous test step that generates test results is used.
Steps such as REMarks and LABELs are ignored.
Parameter
Description
Test Type
RSLTS
Title
If the range is 0 and the reporting condition is true (see Low Limit), this step's
Title is printed in the test results report.
Range
Source of text string to place in the test report if the reporting condition is true:
0 = Use Comment from the Test Title
1-36 = Use Comment from the Display Messages string of the same index
1000 = Use Memory String for comment
Output reporting control of subsequent test steps:
2000 = Report on any of the subsequent steps if, and only if, they have
results matching outcomes specified in the Low Limit.
2001 = Same as 2000 but in addition remember the current reporting strategy.
2002 = Restore the results reporting strategy to what it was before the last
use of RSLTS 2001.
From (-) Point
Specifies the starting column location of the comment in the test report (applies if
the range is below 2000).
To (+) Point
Not used
Low Limit
Specifies the test result condition reported on. The sum of any of the following:
1 = test steps which have passed
2 = test steps which have failed
4 = test steps which have been skipped
High Limit
Not used
22-101
Test Descriptions
Miscellaneous Tests
22-102
Model TR-8 Instruction Manual