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Built-In Test Software for Deformable Mirror High Voltage Drivers Jianwei Zhou Home Institution: University of Hawaii at Manoa CfAO Akaimai Internship 2008 Subaru Telescope Mentor: Stephen Colley Funding provided by the Center for Adaptive Optics through its National Science Foundation Science and Technology Center grant (#AST-987683) Today’s Presentation Project Intro Problems Encountered Approaches Project Overview Design Built-In Test (BIT) software for deformable mirror high voltage driver in the Subaru LGSAO system. Measurements performed by BIT circuitry Input Voltages Output Voltages Power Supply Voltages Board Temperature Deformable Mirror (DM) HV Driver Subsystem The HV driver subsystem in the Subaru LGSAO system consist of 10 HV Amplifier boards High Voltage Amplifier Board Built-In Test Circuit Main components: Analog Multiplexer (Mux) Analog-To-Digital Converter Microcontroller (PIC 16F877) Temperature Sensor Mux A/D Converter BIT Circuit Microcontroller Temperature Sensor Host Computer Built-In Test Software Program Language use: C Step 1: Program in C Step 2: Compile to Assembly language by PICC STD. Pros and cons C is easier and much shorter than assembly language Programming requires the knowledge of microcontroller Problem Encountered I: understand the circuit II: Microcontroller C compiler Not compactable with certain computer system Unidentified bug ( Insert of leading 0) Special setting Development tool In-circuit Debugger MPLAB-IDE Communication Communication between the chips on the built-in test circuit Communication between the microcontroller and host computer ( I2C) Approaches Review the knowledge learnt in school ( programming, digital design, circuit analysis) Search on Internet Read the data sheet of the device Get help from mentor Question