Download Built-In Test Software for Deformable Mirror High Voltage Drivers

Built-In Test Software for Deformable Mirror High Voltage Drivers
Jianwei Zhou
Home Institution: University of Hawaii at Manoa
CfAO Akaimai Internship 2008
Subaru Telescope
Mentor: Stephen Colley
Funding provided by the Center for Adaptive Optics through its
National Science Foundation Science and Technology Center grant
(#AST-987683)
Today’s Presentation
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Project Intro
Problems Encountered
Approaches
Project Overview
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Design Built-In Test (BIT) software for
deformable mirror high voltage driver in the
Subaru LGSAO system.
Measurements performed by BIT circuitry
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Input Voltages
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Output Voltages
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Power Supply Voltages
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Board Temperature
Deformable Mirror (DM)
HV Driver Subsystem
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The HV driver subsystem in the Subaru LGSAO system
consist of 10 HV Amplifier boards
High Voltage Amplifier Board
Built-In Test Circuit
Main components:
Analog Multiplexer (Mux)
Analog-To-Digital Converter
Microcontroller (PIC 16F877)
Temperature Sensor
Mux
A/D
Converter
BIT
Circuit
Microcontroller
Temperature
Sensor
Host
Computer
Built-In Test Software
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Program Language use: C
Step 1: Program in C
Step 2: Compile to Assembly language by PICC STD.
Pros and cons
 C is easier and much shorter than assembly language
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Programming requires the knowledge of microcontroller
Problem Encountered
I: understand the circuit
II: Microcontroller
C compiler
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Not compactable with certain computer
system
Unidentified bug ( Insert of leading 0)
Special setting
Development tool
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In-circuit Debugger
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MPLAB-IDE
Communication
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Communication between the chips on the
built-in test circuit
Communication between the microcontroller
and host computer ( I2C)
Approaches
Review the knowledge learnt in school
( programming, digital design, circuit
analysis)
 Search on Internet
 Read the data sheet of the device
 Get help from mentor
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Question