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Transcript
A 1-V, 10-MHz Clock-Rate, 13-Bit CMOS
Modulator Using
Unity-Gain-Reset Opamps
Mustafa Keskin, Un-Ku Moon, and Gábor C. Temes
Department of Electrical and Computer Engineering,
Oregon State University
Corvallis, OR 97331-3211
[email protected]
Abstract
C
C2
A low-voltage
modulator, incorporating unitygain-reset opamps, is described. Due to the feedback
structure, the opamps do not need to be switched off during operation, and hence can be clocked at a very high
rate. A test chip, realized in a 0.35- m CMOS process and
clocked at 10.24 MHz, provided a dynamic range (DR) of
80 dB and a signal-to-noise+distortion-ratio (SNDR) of
78 dB for a 20-kHz signal bandwidth, and DR = 74 dB
and SNDR = 70 dB for a 50-kHz BW.
C1
1.
Introduction
Fine-linewidth low-voltage CMOS technologies make
possible fast and low-power operation for digital circuitry;
however, they introduce problems for the designers of analog circuits [1]. One difficulty involves the operation of
floating switches required in switched-capacitor (SC) cirbecomes compacuits. If the dc supply range
rable to (or is less than) the sum of the magnitudes of the
, these floating switches can
threshold voltages
no longer be turned on for midrange signals [2]. Boosted
or bootstrapped clock signals can overcome this problem
[3], but they may stress and damage the gate oxide [4].
Low-threshold switches can also be used [5], but they require special fabrication technology which may be expensive, and tend to lead to increased leakage currents.
The commonly used technique for realizing lowvoltage (LV) SC circuits in standard CMOS technology
uses switched opamps (SOs) [6], [7]. An SC integrator
using a SO is shown in Fig. 1. It does not have any floating switches, and hence can use low (e.g., 1 V) supply
voltage. However, since the opamp needs to be turned off
and then on again in every clock cycle, the settling time of
the resulting transients limits the speed of the operation.
An alternative to the SO technique was proposed by
us earlier [8]. It utilizes opamps whose output is reset to
their input during one of the clock phases, and hence will
be called reset opamps (ROs). The opamps remain in their
active voltage regions at all times, and hence the turn-on
and turn-off transients are avoided, making fast operation
possible. Details of the various circuit techniques which
can be used to implement RO stages were described in [8].
Φ2
Vout
Vin
Φ2
Φ1
Φ1
Φ2
!#"$&%('!) *,+.-/"/0.132465!7849;:/*"<=5/*2>%
This paper describes a LV (1.05-1.2 V) high-speed
modulator using RO stages. It was fabricated in a standard
0.35- m CMOS process, could be clocked over 10 MHz,
and achieved 13-bit performance over the audio frequency
range. Over a 50-kHz signal band, it gave a 12.5-bit conversion accuracy.
2. Modulator architecture
Fig. 2 illustrates the block diagram of the modulator.
Since the RO integrators used introduce half clock period
delays, matching delays were introduced into the feedback
paths. These were realized in the digital domain, using
half-delay RS flip-flops.
IN
+
-
Σ
-1/2
z
1 - z -1
1/2
+
-
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OUT
z
1 - z -1
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-1/2
-1/2
z
z
3. The RO integrator and the input buffer
IJH
GFH
Fig. 3 shows the basic RO integrator. While
is
high, the input capacitor
is charged to the input voltage
, and the opamp output is reset to
(more precisely, to
, to keep the output devices in saturation). When the next
rises, the output voltage of the
preceding RO is reset, causing the charge in
to enter
. Hence,
changes by an increment which is a linear function of
. All switches in the stage operate at
K.L ONP
QR
IUS
KVXW/
K.L
GTS
M
IJH
ZY\[ , and hence they all can be realized by single
NMOS transistors.
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Rp
M7p
Gnd
Vinp
M11n
Rn
Gnd
Vinn
Vdd
M1n M2n
Vdd
M6p
M8p
M9n
M5n
M7n
M2p M1p
Vdd
C2
Cn
Vdd
M6n
M8n
Voutp
Voutn
M12p
Vdd
Φ1
M5p
M4p
M3p
M12n
M4n
M3n
Vdd
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eOf.S
Note that (as mentioned above) the integrator introduces a half-period (
) delay between its input and output signals, and hence adjacent stages must be operated
with complementary clock phases.
The input integrator is a special case, since its input
capacitor is not connected to the output of a RO. Ref. [10]
describes an input stage which can be used to feed the first
integrator of the filter. The circuit used by us is shown in
Fig. 4. It is similar to the buffers described in Refs. [10],
[11]. It is basically a track-and-reset (T/R) circuit used as
an input-sampling switch. During , it samples the input
signal and provides the inverted input signal to the input
capacitor of the first stage. During , the opamp is in
unity-gain-reset configuration, providing
to the first
stage.
Gg
Gh
Vinput
Φ1
¡¢
¢A£¤
Level-Shifter
Common-Mode Feedback Circuit
Φ2
Vref
Φ1
Cdc
Previous Stage
Ccm
Φ1
Ci
Φ2 Vref
Φ2
Φ1
Vref
Ccm
Ccm
Voutn
Voutp
Voutp
Voutput
Cs
Vref
Φ1
Ci
Vref
Ccm
Φ1
Cdc
Φ2
Ccm
Voutp
Voutn
Ccm
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Φ2
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Common-Mode Feedback Circuit
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ˆ
Level-Shifter
Low-voltage opamp
The opamp used is shown in Fig. 5 [12]. It has a
pseudo-differential structure, chosen to ease the implementation of the common-mode feedback (CMFB) circuit. Each half contains a PMOS differential pair and an
NMOS inverter output stage, with an RC compensating
branch between them. The input stage uses a LV current
mirror [7].
The minimum supply voltage needed for linear operation is given by
RpTLqYmrts!uwv.x VXyz |{ S V,y~}
Voutn
Φ2
Ci
Φ1
Ci
Φ2
Φ1
Φ2
Φ2
Φ1 Vref
Cs
Φ1
4.
Slew Rate
100 V/ s
A charge-domain dc level shifter is required to maintain the appropriate input and output common-mode voltages for the opamps. With a CM level of
at the
opamp output, the CM at the next opamp input must be
set to ground.
Φ1
Vdd
Tsettling
20 ns
Vref
1.2V
0.6V
0V
Φ2
R
PM
70
5. Level shifting and CMFB circuits.
R
0V
-0.6V
-1.2V
Ÿ
fu
170 MHz
(1)
The main performance parameters of the opamp with a
load of 3.5 pF are summarized in Table 1.
¡°X±b²³
¡°X±b²´
The SC dc level shifter and CMFB circuit [9] used are
shown in Fig. 6. The output voltages
and
are averaged and used to inject a correction charge into
the virtual grounds, so as to obtain an output CM voltage
equal to
.
¡¢
¢/£¤
6. The comparator and the DAC feedback
branch
The low-voltage comparator used is shown in Fig. 7. It
requires dc level shifters at the inputs to set the input CM
to ground. The reset switches ground both latch outputs,
since floating reset switches cannot be used. The simulated transition speed of the comparator was 12 ns.
Vdd
Vdd
Vdd
8. Layout and floor plan
M8
M7
Vdd
I
M10
Fig. 10 shows the die photo of the prototype IC, realized in a 0.35 m double-poly triple-metal CMOS technology. The digital and analog circuitries are separated,
with the opamps located at maximum distance from the
digital stages. Well and substrate guard strips and rings
were also used to shield the sensitive analog elements
from substrate noise. By using static switches, it was
possible to allow operation using either the input stage of
Fig. 4 or a floating input transmission gate at the frontend. This allowed operation even if the actual threshold
voltages of the fabricated chip were different from the
simulated values. The total chip area (excluding the input buffer) was 0.41 mm .
M12
in+
out+
M1
reset
M11
M5
in-
M6
M4
M3
M2
outreset
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M13
Fig. 8 shows the circuit diagram of the DAC feedback
branches. Its switches operate at ground or
. The CM
of the DAC signal is cancelled by the level shifter circuits
at the opamp inputs.
g
Vdd
Φ1
To Virtual Ground
of Integrator
from Output
of RS FlipFlop
Digital Circuits
Cref
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Clock lines
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7.
Switches
The overall circuit diagram
Track/
Reset
The circuit of the modulator (with the CMFB circuits
and input buffers omitted for clarity) is shown in Fig. 9.
The element values (scaled for optimum dynamic range)
are given in Table 2.
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Cs1
Cdac
Cdc1
Ci1
2 pF
2 pF
1 pF
8 pF
Cs2
Cdac2
Cdc2
Ci2
0.8 pF
0.4 pF
0.12 pf
1.6 pF
Vref
Φ2
Vref
Φ2
Φ1_p
Vref
Φ1
Cdc1
Φ2 Ci1
Φ1
for Testing
Φ1
Cs1
Vinp
Vinn
Φ1
Φ1
Φ2
Φ1
Φ 2_p
Vref
Φ2
Cs1
Φ1 Ci2
Φ2
Cs2
Φ2 Vref
Φ1
Φ 2_p
Φ 2_p
Csc
Φ2
Φ1
Φ2
Φ1_n
Φ1_n
Vref
Cs2
Ci1
Φ1
Φ2
Vref
Φ1
Φ1
Cdc2
Vref
Φ2
Cdac2
Φ2
Φ1_p
Φ2
Φ 2_n
Φ 2_n
Ci2
Φreset
Φ2
Csc
Φ1
Φ1
S Q
S Q
R Q
R Q
Φ2
Φ1
Vref
Φ1
Cdcc
Φ 2_n
Φ 2_n
Φ2
Φ2
Φ1_n
Φ1_n
Φ2
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Φ2
Φ1
Φ1_p
Φ2
Φ2
Vref
Cdac1
Cdcc
Φ2
Φ2
Cdc1
Φ1
Vref
Cdc2
Vref
Φ1
9. Test results
Φ1
Φ1 Vref
Φ2
Φ2
0.4 pF
0.4 pF
Φ 2_p
Cdac2
Integrators
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Vref
Φ1_p
Cdac1
Csc
Cdcc
First and Second
Comparator
Φ1
Φ1
Φ1
The fabricated chip was tested with a 10.24 MHz clock
signal and with varying (1.05 to 1.2 V) supply voltages.
Table 3 gives a summary of the measured results. For audio band (0 to 20 kHz) operation, a true 13-bit accuracy
resulted; extending the input frequency range to 0-50 kHz,
ENOB = 12.5 bits was obtained. The chip remained operational, but at ENOB = 10.5 bits, down to 0.95 V supply
voltage. The SDNR and SNR curves for a 2.5 kHz input
sine wave are shown in Fig. 11.
The typical measured spectrum of the digital output
stream is illustrated in Fig. 12. No harmonics were detected.
There was a variation of the threshold voltages from
the simulation models to the actual chips. While the models assumed
0.55 V and
0.55 V, in the
chips
ranged from 0.486 V to 0.563 V, and
from 0.422 V to 0.486 V. In the low-threshold chips, the
floating input switch could be turned on; in the others, the
|{/
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|{dM(ÂY
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80
70
60
11. Acknowledgments
SNR 20kHz
SNDR 20kHz
SNR 50kHz
SNDR 50kHz
The authors are grateful to José Silva, Robert Batten,
Tetsuya Kajita, and Greg Barnes for their assistance during the design and fabrication of the prototype. Additionaly, we are thankful to AMI Semiconductor for fabricating the test chip. This work was supported by the NSF
Center for Design of Analog-Digital Integrated Circuits
(CDADIC).
[dB]
50
40
30
20
10
0
−10
−100
12. References
−80
−60
−40
Vin/Vref [dB]
−20
0
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-/"c,"/+d2:A01a2=0&".
Signal Bandwidth
Sampling Frequency
Max. Diff. Input
Dynamic Range
Peak SNR
Peak SNDR
Power Consumption
Supply Voltage
Chip Core Area
Technology
20 kHz
10.24 MHz
1.2 Vpp
80 dB
78.6 dB
77.8 dB
5.6 mW
1.05 V
0.41 mm
0.35 m
g
50 kHz
10.24 MHz
1.2 Vpp
74 dB
70.6 dB
70.4 dB
5.6 mW
1.05 V
0.41 mm
0.41 mm
g
g
0
Magnitude (dB)
−20
[1] Edgar Sánchez-Sinencio and Andreas G. Andreou, LowVoltage/Low-Power Integrated Circuits and Systems, IEEE
Press, NJ 1999
[2] M. Steyaert, V. Peluso, J. Bastos, W. Sansen, “Custom analog low power design: The problem of low voltage and mismatch,” IEEE Custom Integrated Circuits Conference, 1997,
pp. 285-292.
ÏkÐ
[3] J. Grilo, E. MacRobbie, R. Halim, Gabor C. Temes, “1.8 V,
modulator for voice applications,”
94 dB dynamic range
Proc. ISSCC, Feb. 1996, pp. 230-231.
[4] “The national technology roadmap for semiconductors,”
Semiconductor Industry Assoc., Tech. Rep., 1997
[5] T. Atachi, A. Ishinawa, A. Barlow, and K. Taksuka, “A 1.4 V
switched capacitor filter,” Proc. CICC, May 1990, pp.8.2.18.2.4
ÏÃÐ
Ñ
[6] V. Peluso, M. Steyaert, and W. Sansen, “A 1.5 V 100 W
modulator with 12-bit dynamic range using the
switched-opamp technique,” IEEE J. Solid-State Circuits,
vol. 32, pp. 943-952, July 1997.
[7] V. Peluso, P. Vancorenland, A. Marques, M. Steyaert, and
W. Sansen, “A 900 mW low-power A/D with 77 dB dynamic
range,” IEEE J. Solid-State Circuits, vol. 33, pp. 1887-1896,
Dec. 1998.
−40
−60
[8] E. Bidari, M. Keskin, F. Maloberti, U. Moon, J. Steensgard, and G. C. Temes, “Low-voltage switched-capacitor
circuits,” Proc. IEEE Int. Symp. Circuits Syst., Florida, May
1999, vol. II, pp. 49-52.
−80
−100
−120
3
4
5
6
i !"Ì$/?%Í^O-/"žcd4."/+
*
a&7Î2.»Æ*
-/"¶0i *,5!E~2b*
4!b*P¼. *
c,*
"/5!79%
10
10
10
10
Frequency (Hz)
input buffer had to be used. The performance did not vary
significantly between the two modes of operation.
10.
Conclusions
A low-voltage and fast delta-sigma ADC was designed
and fabricated. It uses unity-gain-reset opamps, which do
not require the turning on and off associated with switched
opamps. The test results indicate that this circuit technique is suitable for high-speed high-accuracy operation
with 1 V or lower supply voltages.
[9] L. Wu, M. Keskin, U. Moon, and G. C. Temes, “Efficient
common-mode feedback circuits for pseudo-differential
switched-capacitor stages,” Proc. IEEE Int. Symp. Circuits
Syst., Geneva, May 2000, vol. V, pp. 445-448.
[10] A. Baschirotto, R. Castello and G. P. Montagna, “Active series switch for switch-opamp circuits,” Electron. Lett., vol.
34, pp. 1365-1366, July 1998.
[11] M. Ishikawa and T. Tsukahara, “An 8-bit 50-MHz CMOS
subranging A/D converter with pipelined wide-band S/H,”
IEEE J. of Solid-State Circuits, vol. 23, pp. 1309-1315, Dec.
1988.
[12] A. Baschirotto, “A 40 MHz CMOS sample & hold operating at 1.2 V,” ESSCIRC, 1998