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Open DeviceNet Vendor Association Test Procedure for Physical Layer, Indicators and Switches Revision: B4 3/3/2000 Revision History Version #/ Revision # Date Revision Description B4 B4 2/18/00 2/28/00 Major rewrite of revision B3 Based on comments from Matt Kuzel, deleted 5.4.1 since it was already incorporated in 5.4.2. Renumbered 5.4.2 to 5.4.1 and renamed to Resistance and Capacitance: CAN_H to CAN_L. Corrected wording in 5.5.1. Edit Appendix A to reflect changes in 5.4.1. Added Appendix B. Revision B4 3/3/2000 ii Editor Doug Stanton Doug Stanton Acknowledgments The editor wishes to thank those who contributed to the development of this document. These contributors include members of the Conformance SIG, Physical Layer SIG and ODVA laboratories. Revision B4 3/3/2000 iii Test Procedure For Physical Layer, Indicators and Switches 1 2 3 4 TABLE OF CONTENTS Page No. 5 TEST PROCEDURE FOR PHYSICAL LAYER, INDICATORS AND SWITCHES .................................. I 6 1. INTRODUCTION ............................................................................................................................. 1 7 8 9 10 2. REFERENCES, REQUIRED DOCUMENTS AND DEFINITIONS ............................................... 1 2.1 References.......................................................................................................................................... 1 2.2 Required Documents.......................................................................................................................... 1 2.3 Definitions ......................................................................................................................................... 1 11 3. EQUIPMENT .................................................................................................................................... 2 12 13 14 15 4. SETUP ............................................................................................................................................... 3 4.1 Test Configuration ............................................................................................................................. 3 4.2 PC-Based Applications ...................................................................................................................... 6 4.3 Conformance Test Results ................................................................................................................. 6 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 5. TESTS................................................................................................................................................ 7 5.1 Connector Style ................................................................................................................................. 7 5.2 Indicators ........................................................................................................................................... 7 5.2.1 Module Status LED .................................................................................................................... 7 5.2.2 Network Status LED .................................................................................................................. 7 5.2.3 Combined Module/Network Status LED ................................................................................... 8 5.3 Switches ............................................................................................................................................. 9 5.3.1 MAC ID Switch Style ................................................................................................................ 9 5.3.2 MAC ID Switch Mounting Location and Access ...................................................................... 9 5.3.3 MAC ID Hardware Verification ................................................................................................ 9 5.4 Isolation / Impedance ......................................................................................................................... 9 5.4.1 Resistance and Capacitance: CAN_H To CAN_L) ................................................................... 9 5.5 Power ................................................................................................................................................. 10 5.5.1 Physical Layer Power Sense Verification .................................................................................. 10 5.5.2 Minimum Operating Voltage ..................................................................................................... 10 5.5.3 Power Consumption For DeviceNet Voltage Range (advise only, not pass/fail) ...................... 10 5.5.4 Inrush Current (advise only, not pass/fail) ................................................................................. 11 5.5.5 CAN_H And CAN_L Recessive Level Voltages ...................................................................... 11 5.5.6 CAN_H And CAN_L Dominant Level Voltages ...................................................................... 13 5.5.7 Differential Voltage Reading ..................................................................................................... 14 5.6 CAN Timing ...................................................................................................................................... 15 5.6.1 Bit Timing Measurements .......................................................................................................... 15 5.6.2 ACK Delay Measurement .......................................................................................................... 16 5.6.3 ACK Delay Example.................................................................................................................. 19 5.7 Wiring ................................................................................................................................................ 20 5.7.1 DeviceNet Mis-Wiring .............................................................................................................. 20 Revision B4 2/28/2000 Test Procedure for Physical Layer Indicators and Switches 45 46 47 48 49 50 51 52 53 54 55 56 57 58 59 60 61 62 63 64 65 66 67 68 69 70 LIST OF FIGURES Figure 4-1 Test Configuration ........................................................................................................................ 3 Figure 4-2 Capacitance Measurement Fixture ................................................................................................ 4 Figure 4-3 Sample Inrush Current Circuit ...................................................................................................... 5 Figure 5-1 Recessive Bit levels ...................................................................................................................... 12 Figure 5-2 Dominant Bit levels....................................................................................................................... 13 Figure 5-3 Differential Level .......................................................................................................................... 14 Figure 5-4 Bit Timing ..................................................................................................................................... 16 Figure 5-5 Delay Overview............................................................................................................................. 17 Figure 5-7 Delay Close-Up ............................................................................................................................. 18 Figure 5-8 ACK Delay .................................................................................................................................... 19 LIST OF TABLES Table 3-1: Test Equipment ............................................................................................................................. 2 Table 5-1 Bit Timing Values .......................................................................................................................... 15 Table 5-2 Mis-Wiring DeviceNet Connector Table ....................................................................................... 21 Revision B4 3/3/2000 2 Test Procedure For Physical Layer, Indicators and Switches 71 1. INTRODUCTION 72 73 74 75 76 This document provides a procedure for verifying the conformance of a DeviceNet device to physical layer media, indicators and switch requirements set forth in the ODVA DeviceNet Specification. Used in conjunction with other ODVA tests, the device manufacturer gains a higher level of confidence that the device can be integrated into a DeviceNet network. 77 2. REFERENCES, REQUIRED DOCUMENTS AND DEFINITIONS 78 NOTE: References shall be the latest publications as of the release date on the cover of this document. 79 2.1 References 80 81 ODVA DeviceNet Specification, Vols. I and II ISO 11898 82 2.2 Required Documents 83 84 85 Vendor shall provide documentation indicating that HIPOT tests were performed and that the isolation barrier was not violated at a level of 500 VDC test voltage. See Section 5.4 for details. Vendor shall provide a complete and accurate Statement of Conformance. 86 2.3 Definitions 87 88 89 Sole Occupant: The only device on the network that can generate a CAN ACK DUT: Device Under Test Revision B4 2/28/2000 Test Procedure for Physical Layer Indicators and Switches 90 91 92 93 94 95 96 3. EQUIPMENT Table 3-1: Test Equipment lists the equipment that will be required to perform testing. Equivalent equipment may be substituted. Table 3-1: Test Equipment 97 Qty 1 1 2 1 1 2 1 2 1 1 2 4 1 1 1 98 99 100 101 102 103 104 105 106 107 108 109 110 111 Description Variable Power Supply Adjustable, 0-30 VDC @ 0-3 Amps, 115 VAC, 60 Hz DeviceNet Power Supply Interface (V+/V-/GND To Female Mini Connector) DeviceNet Splitter Trunk (Mini) Terminating Resistor Drop (Micro) Terminating Resistor DeviceNet Interface Card and associated PC Application Two Channel Digital Oscilloscope 100MHz, 2GS/s Oscilloscope Probes Inrush Current Circuit – SCR1: S6065J, R1: 750 ohms, R2: 1K ohms, R3: 100 K ohms, C1:10,000 microFarads, SW1: normally open, push button, Current Probe: Pearson Model 110 or equivalent DeviceNet Breakout Terminal (Optional) Digital Multimeter (DMM) Drop Cables 1.5 m (Thin) Trunk Cable 1.5 m (Thin) 1 MHz signal generator Parts for Figure 4-2 Capacitance Measurement Fixture 300 Feet Trunk Cable (Thick) 1The power supply interface consists of the positive and negative voltage terminals of the supply connected to the V+ and V- lines of a DeviceNet connector. The negative voltage terminal shall be connected to the ground terminal of the power supply and to the drain line of the DeviceNet connector. The ground terminal of the power supply shall be connected to earth ground. The pin order of the DeviceNet connector is defined in the DeviceNet Specification. 2 The DeviceNet breakout terminal shall be constructed to allow the connection of probes from measurement devices and permit the connection of DeviceNet cables as illustrated in Figure 4-1 . 4 300 feet of test cable consists of a thick cable with field-wireable DeviceNet connectors as needed. Revision B4 3/3/2000 2 Notes Note1 Figure 4-3 Sample Inrush Current Circuit Note2 Note4 Test Procedure for Physical Layer Indicators and Switches 112 113 4. SETUP 114 115 116 NOTE: Should the DUT require field connections in order to perform the tests, the device manufacturer is responsible for providing the appropriate equipment or simulators. The vendor is responsible for providing documentation to illustrate that the simulator is an accurate representation of the field application. 117 118 119 120 4.1 Test Configuration The Test Configuration is illustrated in Figure 4-1 Test Configuration 121 122 123 124 125 126 127 128 129 130 131 132 133 134 135 136 137 138 139 140 141 Figure 4-1 Test Configuration During the course of testing, the PCs and the DUT will be attached or removed as required. When the inrush current test is performed, the drop cable from the DeviceNet splitter to the breakout terminal will be replaced with the inrush current cable. When the DUT is connected to the network, electrical measurements will be obtained via the Breakout Terminal. For the device isolation tests, the DUT is disconnected from the network, and all electrical measurements will be obtained from the connector on the DUT. A second PC is optional and may be used for diagnostics. A description of the DeviceNet Interface for the power supply, breakout terminal, and inrush current cable are provided in the footnotes for Table 3-1: Test Equipment. Revision B4 3/3/2000 3 Test Procedure for Physical Layer Indicators and Switches 142 143 144 145 146 147 For performing the capacitance test in Resistance and Capacitance: CAN_H To CAN_L the following items are needed. These will be the only things, along with the power supply, attached to the DUT for this test. 1 MHz signal generator with 50 Ohm sinusoidal outputs capable of 5v p-p signals Fixture with transformer (balun) - Mini-circuits T2.5-6T, North Hills 0302BB, or equivalent for converting from 50 Ohms single ended to 120 Ohms differential. Fixture To Generator 10 K Ohms CAN_H 120 Vi Vo Ohms CAN_L To DUT 10 K Ohms V+ V+ V- V- To supply Note: reference scope signals to V- 148 149 150 151 152 Figure 4-2 Capacitance Measurement Fixture Revision B4 3/3/2000 4 Test Procedure for Physical Layer Indicators and Switches 153 154 For performing the Inrush Current test, Section 5.5.4, the following circuit is needed. + 24 Volt Power Source Oscilloscope R1 750 - SCR1 S6065J C1 10,000 uF. Current Probe Pearson Model 110 SW1 + R3 100k Device Under Test Output R2 1k - 155 156 157 158 159 160 161 162 163 164 165 166 167 168 169 Figure 4-3 Sample Inrush Current Circuit Revision B4 3/3/2000 5 Test Procedure for Physical Layer Indicators and Switches 170 171 172 173 174 175 176 177 4.2 PC-Based Applications 178 179 180 4.3 Conformance Test Results The majority of the tests in this document require execution of one or more of the following applications on the PCs shown in Figure 4-1 : 1. DeviceNet network configuration tool. The function of the DeviceNet network configuration tool is to configure device parameters. For example data rate and node address can be configured using this type of tool. 2. DeviceNet master. The DeviceNet master provides mechanisms for establishing connections to devices and producing and consuming data over these connections. Appendix A provides a template for recording data gathered during the course of the conformance testing. This appendix should be reviewed in order to become familiar with the results to be recorded. 181 Revision B4 3/3/2000 6 Test Procedure for Physical Layer Indicators and Switches 182 5. TESTS 183 184 185 186 5.1 Connector Style 187 188 189 190 191 192 5.2 Indicators 193 194 5.2.1 Module Status LED The DUT contains a red/green indicator for the device status. 195 196 197 198 199 200 201 202 203 5.2.1.1 Indicator Operation This following behavior should be observed. a) Attach the DUT to the network as the sole occupant. b) Verify that the Module Status indicator flashes green for approximately 0.25 seconds then flashes red for approximately 0.25 seconds, at some point during the execution of the power-up self-test procedures. c) After all power-up self-tests have been successfully completed, verify that the Module Status indicator illuminates either flashing green at an approximate 0.5 second flash rate if commissioning is needed or solid green if the device is ready. 204 205 5.2.2 Network Status LED The DUT contains a red/green indicator for the network communication status. 206 207 208 209 210 211 212 213 5.2.2.1 Indicator Operation: Solitary Node Power-Up Test This following behavior should be observed. a) Attach the DUT to the network as the sole occupant. b) Verify that the Network Status indicator flashes green for approximately 0.25 seconds then flashes red for approximately 0.25 seconds, at some point during the execution of the power-up self-test procedures. c) After all power-up self-tests have been successfully completed, verify that the Network Status indicator turns off. 214 215 216 217 218 219 220 221 5.2.2.2 Indicator Operation: Occupied Network Node Power-Up Test This following behavior should be observed. a) Execute the DeviceNet master application and configure the DeviceNet master to MACID zero and Bit Rate for DUT’s maximum supported bit rate. b) Set the DUT to MACID 63 and Bit Rate to the maximum supported and attach the DUT to the network. c) After all power-up self-tests have been successfully completed, verify that the Network Status indicator flashes green. a) Verify that the connector used matches that defined in the Statement of Conformance. b) Verify the presence of gold coloring on the pins of the DeviceNet connector. c) Verify that the DeviceNet connector is male-type connector. Verify the LEDs supported match those defined in the Statement of Conformance and meet the applicable specifications. For autobaud-capable devices, a transmitting node should be set on the network to generate messages and not interact with the node. If module status LED is implemented then section 5.2.1 must be performed; if network status LED is implemented then section 5.2.2 must be performed; if combined module/status LED is implemented then section 5.2.3 must be performed. Revision B4 3/3/2000 7 Test Procedure for Physical Layer Indicators and Switches 222 223 224 225 226 227 228 5.2.2.3 Indicator Operation: CAN_H To CAN_L Short a) Attach the DUT to the network as the sole occupant. b) Cycle power to the DUT and apply 24VDC. c) Short CAN_H to CAN_L. This simulates a continuous recessive level on the CAN bus (or BusOff). d) Verify that the Network Status indicator illuminates solid red, indicating that the CAN transceiver in the DUT has detected a Bus-Off condition. 229 230 231 232 233 234 5.2.2.4 Indicator Operation: CAN_H To V- Short a) Attach the DUT to the network as the sole occupant. b) Cycle power to the DUT and apply 24VDC. c) Short CAN_H to V-. This simulates a continuous dominant level on the CAN bus. d) Verify that the Network Status indicator illuminates solid red, indicating that the CAN transceiver in the DUT has detected a Bus-Off condition. 235 236 5.2.3 Combined Module/Network Status LED The DUT contains a bicolor, red/green indicator for device and communication status. 237 238 239 240 241 242 243 244 245 5.2.3.1 Indicator Operation: Solitary Node Power-Up Test This following behavior should be observed. a) Attach the DUT to the network as the sole occupant. b) Cycle power to the DUT and apply 24VDC to the Network. c) Verify that the Combined Module/Network Status indicator flashes green for approximately 0.25 seconds then flashes red for approximately 0.25 seconds, at some point during the execution of the power-up self-test procedures. d) After all power-up self-tests have been successfully completed, verify that the Combined Module/Network Status indicator is off. 246 247 248 249 250 251 5.2.3.2 Indicator Operation: Occupied Network Node Power-Up Test a) Execute the DeviceNet master application and configure the DeviceNet master to MACID zero and Bit Rate to the maximum supported. b) Set the DUT to MACID 63 and Bit Rate maximum supported and attach the DUT to the network. c) After all power-up self-tests have been successfully completed, verify that the Combined Module/Network Status indicator flashes green. 252 253 254 255 256 257 5.2.3.3 Indicator Operation: CAN_H To CAN_L Short a) Attach the DUT to the network as the sole occupant. b) Cycle power to the DUT and apply 24VDC. c) Short CAN_H to CAN_L. This simulates a continuous recessive level on the CAN bus. d) Verify that the Combined Module/Network Status indicator illuminates solid red, indicating that the CAN transceiver in the DUT has detected a Bus-Off condition. 258 259 260 261 262 263 5.2.3.4 Indicator Operation: CAN_H To V- Short a) Attach the DUT to the network as the sole occupant applying external power, if necessary b) Cycle power to the DUT and apply 24VDC. c) Short CAN_H to V-. This simulates a continuous dominant level on the CAN bus. d) Verify that the Combined Module/Network Status indicator illuminates solid red, indicating that the CAN transceiver in the DUT has detected a Bus-Off condition. Revision B4 3/3/2000 8 Test Procedure for Physical Layer Indicators and Switches 264 5.3 Switches 265 266 Verify that the switches present are specified in the Statement of Conformance. If “DIP Switch” or “other” is selected, the following should be inspected. 267 268 269 5.3.1 MAC ID Switch Style If rotary, thumb-wheel, or push-wheel switches are used, then verify that the switch is labeled in decimal format. 270 271 5.3.2 MAC ID Switch Mounting Location and Access Verify that the Most Significant Digit (MSD) switch is set to the left or top of the product. 272 273 274 275 276 277 278 5.3.3 MAC ID Hardware Verification a) Set the DUT to MACID zero and Baud Rate to maximum supported and attach the DUT to the network. b) Verify presence of the DUT on the network at the appropriate MACID. c) Repeat the previous steps using node address settings of 8, 11, 22, 33, 44, 55, and 63 for rotary switches or address settings of 01h, 02h, 04h, 08h, 10h, 20h and 3Fh for DIP switches. 279 5.4 Isolation / Impedance 280 281 282 283 284 285 286 287 288 289 290 291 292 293 294 295 296 297 298 299 300 301 302 303 304 305 Tests in section 5.4 apply only to devices that 1) implement a metallic chassis that is not isolated from earth ground or 2) have field wiring. Where 'field wiring' is defined as any user accessible electrical connection other than DeviceNet connections. Voltage levels are nominal plus/minus 10%. Vendor shall provide documentation indicating that HIPOT tests were performed and that the isolation barrier was not violated at a level of 500 VDC test voltage. HIPOT tests shall be performed by the vendor in accordance with the following criteria and should be documented in Appendix B. 1) For a device with a metallic chassis that potentially has a connection to earth ground, connect all 5 DeviceNet signal lines to a single node. Designate this 1st node as node A. Designate the metallic chassis as node B. For this test the chassis will be isolated. Develop 500 VDC between nodes A & B. Use UL approved HYPOT test equipment. Reverse polarity of nodes A & B and repeat test. 2) For a device with field wiring connect all 5 DeviceNet signal lines to a single node. Designate this 1st node as node A. Connect all field wiring inputs together. Designate this 2nd node as node B. Develop 500 VDC between nodes A & B. Use UL approved HYPOT test equipment. Reverse Polarity of nodes A & B and repeat test. 5.4.1 Resistance and Capacitance: CAN_H To CAN_L) a) Attach the fixture and signal generator as shown in Figure 4-2 Capacitance Measurement Fixture . b) Test both with the device not powered and with the device powered and not transmitting c) Set the generator to produce a 100 KHz sinusoid at about 5 volts p-p differential measured at Vi. Verify that the level is constant (+/- 2%) from 100 to 1000 KHz. d) Measure Vo (p-p differential) with the generator set to 100 KHz. Revision B4 3/3/2000 9 Test Procedure for Physical Layer Indicators and Switches 306 307 308 309 310 311 312 313 314 315 316 317 318 319 320 321 322 323 e) Vo should be greater than Vi/2 volts. This verifies that the differential input resistance is greater than 20 K Ohms. f) Calculate the ratio Vo/Vi and record in Appendix A, (pass>=0.5). Set the frequency of the signal to fc, calculated from the recorded voltage ratio as follows: 1/fc = Vo/Vi * 2 * PI * 20E3 * 35E-12 or, fc = 1/[(Vo/Vi)* 4.4E-6] g) Once the generator is set to this frequency, again measure Vo. h) Vo should be greater than 0.707 times the previous value of Vo. This verifies that the differential input capacitance is less than 25 pF. (Use of 35 pF in the above calculation allows for 10 pF in the fixture.) i) For example, if Vi is measured as 5.0 +/- 0.1 volt from 100 to 1000 KHz, and Vo is measured as 3.22 volts at 100 KHz, then the DUT passes the input resistance requirement since Vo is greater than half of Vi. The ratio Vo/Vi is then 0.644, and fc = 353 KHz. After setting the generator to 353 KHz, Vo is measured to be 2.36 volts. Since this level is greater than 0.707 * 3.22 = 2.28, the DUT passes the capacitance requirement. Calculate the ration, New Vo / Old Vo, and record in Appendix A, (pass >= 0.707. 324 5.5 Power 325 326 327 328 329 330 331 5.5.1 Physical Layer Power Sense Verification This test can only be performed on devices that are not powered by the DeviceNet network, otherwise skip this test. a) With DeviceNet power off, power up DUT and wait normal power initialization time for DUT, b) Reapply DeviceNet power to the DUT. c) Verify that the DUT’s Module Status LED becomes solid green and that it communicates with no additional manual intervention. 332 333 334 335 336 337 338 339 340 5.5.2 Minimum Operating Voltage a) Set the voltage level of the network power supply to 25 VDC and adjust the current limit to maximum. b) Set the DUT to MACID 63 and Bit Rate to the maximum supported and attach the DUT to the network. c) Initiate communication from the master to the DUT. d) Decrease the voltage to 11 Volts. e) Verify that the DUT is still allocated to the master. f) Log measurement in Appendix A 341 342 343 344 345 346 347 348 349 350 351 5.5.3 Power Consumption For DeviceNet Voltage Range (advise only, not pass/fail) a) Adjust the power supply current limit to maximum and set the voltage level of the power supply to 11 VDC b) Connect the voltmeter across the V+ and V- connections on the breakout terminal. c) Connect the current meter in series with the V+ input on the breakout terminal d) Attach the DUT as the sole occupant. e) Measure and record the actual voltage. f) Measure and record the DUT current draw. g) Compute (P=VI) and record the DUT power consumption. Add this value to the vendor supplied value for the network powered field connection power value. Revision B4 3/3/2000 10 Test Procedure for Physical Layer Indicators and Switches 352 353 354 h) Log measurement in Appendix A i) Repeat steps (f), (g) and (h) for 17 & 25 VDC. 355 5.5.4 Inrush Current (advise only, not pass/fail) 356 357 358 359 360 361 362 363 364 365 366 367 368 369 370 371 Refer to Figure 4-3 Sample Inrush Current Circuit for the following steps. 372 373 374 375 376 377 378 379 380 381 382 5.5.5 CAN_H And CAN_L Recessive Level Voltages a) Attach the DUT as the sole occupant. a) Attach channel one of the scope to CAN_H with the ground reference attached to V-. b) Attach channel two of the scope to CAN_L with the ground reference attached to V-. Test Setup: 1. Connect the DUT’s V+ and V- to the circuits respective Device Under Test Output. 2. Connect the Current Probe to a digital oscilloscope to measure the In-Rush Current Pulse. 3. Set up the scope to measure the voltage produced by the current probe from the probe manufacturer instructions. 4. Set up the scope horizontal sweep to 1 milli second. This may require further adjustment depending on the duration of the DUT ‘s In-Rush Current pulse. 5. Set the scope trigger to single sweep. 6. Apply 24 volts to the 24 volt input to the circuit. Test Procedure: 1. Momentarily close SW1. 2. Measure and record the amplitude and duration of the In-Rush Current Pulse. 3. Log measurement in Appendix A 4. If a retest is required, wait 2 minutes before repeating steps 1 and 2. c) Measure and record, in Appendix A, the recessive CAN_H voltage. d) Measure and record, in Appendix A, the recessive CAN_L voltage. e) Verify that the recessive voltage level for both CAN_H and CAN_L is between 2.0 VDC and 3.6 VDC. Revision B4 3/3/2000 11 Test Procedure for Physical Layer Indicators and Switches 383 384 385 386 387 388 Figure 5-1 Recessive Bit levels Example of one recessive bit length at 500KBPS, 2.00 microseconds off-time Revision B4 3/3/2000 12 Test Procedure for Physical Layer Indicators and Switches 389 390 391 392 393 394 395 396 397 5.5.6 CAN_H And CAN_L Dominant Level Voltages a) Attach the DUT as the sole occupant. b) Attach channel one of the scope to CAN_H with the ground reference attached to V-. c) Attach channel two of the scope to CAN_L with the ground reference attached to V-. d) Measure and record, in Appendix A, the dominant CAN_H voltage. e) Measure and record, in Appendix A, the dominant CAN_L voltage. f) Verify that the dominant voltage level for CAN_H is between 2.75 VDC and 5.1 VDC g) Verify that the dominant voltage level for CAN_L is between 0.5 VDC and 2.86 VDC 398 399 400 401 402 403 Figure 5-2 Dominant Bit levels Example of one dominant bit length at 500KBPS 2.00 microseconds on-time Revision B4 3/3/2000 13 Test Procedure for Physical Layer Indicators and Switches 404 405 406 407 408 409 410 411 412 413 5.5.7 Differential Voltage Reading a) Attach the DUT as the sole occupant. b) Attach channel one of the scope to CAN_H with the ground reference attached to V-. c) Attach channel two of the scope to CAN_L with the ground reference attached to V-. d) Subtract channel two from channel one on the scope to view the differential waveform, CAN_H CAN_L. e) Measure and record, in Appendix A, the differential voltage, CAN_H - CAN_L. f) Verify that the differential voltage is 2.0 Vp-p (nominal) and 1.5 Vp-p (minimum). (between 1.5 and 3.0 spec) 414 415 416 417 418 Figure 5-3 Differential Level Example of how to use the cursors to determine P-P voltage of differential waveform dY = 2.17 Volts 419 Revision B4 3/3/2000 14 Test Procedure for Physical Layer Indicators and Switches 420 5.6 CAN Timing 421 422 423 424 425 426 5.6.1 Bit Timing Measurements Bit timings for DeviceNet are to be tested to be within 1% of the expected time. The DeviceNet Specification requires a data rate tolerance of 1000 parts per million (0.1%). This test does not verify crystal accuracy (0.1%), but verifies that proper CAN bit timing parameters are in use by using a 1% limit. If the DUT supports autobaud capability, the procedure in 5.6.1.2 should be followed. If the DUT does not support autobaud capability, the procedure in 5.6.1.1 should be followed. 427 428 429 430 431 5.6.1.1 a) b) c) d) 432 433 434 435 436 437 438 439 5.6.1.2 a) b) c) Fixed Baud Rate Devices Attach the DUT to the network as the sole occupant Monitor the DUP MAC sent by the DUT. Measure a bit time. Verify that the results fall in the range specified in Table 5-1 Bit Timing Values. Repeat steps for 250 k and 500 k baud, if supported. Auto-bauding Devices Connect the DUT to a network that has a PC cable of generating a request. Generate a request for the DUT at the first baud rate in Table 5-1 Bit Timing Values. Measure the bit time of the response from the DUT. Verify that the results fall in the range specified in Table 5-1 Bit Timing Values. d) Repeat steps b and c for 250 k and 500 k baud. Table 5-1 Bit Timing Values Baud Rate (Kbps) 125 250 500 Bit Time (us) Typical 8.000 4.000 2.000 Minimum 7.92 3.96 1.98 440 Revision B4 3/3/2000 15 Maximum 8.08 4.04 2.02 Test Procedure for Physical Layer Indicators and Switches 441 442 443 Figure 5-4 Bit Timing 444 445 446 Example of a typical CAN transmission waveform Poll I/O message transmission Group 2, MAC ID 0, MSG ID 5, Data [none] 447 448 449 450 451 452 453 454 455 456 457 458 459 460 461 462 463 5.6.2 ACK Delay Measurement The following measurement was taken to illustrate how ACK delay can be measured Setup: a) CAN-H & CAN-L were monitored via the BREAKOUT TERMINAL shown in Figure 4-1 . b) The length of DeviceNet cable from the DUT to the BREAKOUT TERMINAL was less than 3 feet. c) The data is collected while periodic data is transmitted. The tester may choose a DeviceNet data response that minimizes the N bit times away from the last non-ACK transition. . Procedure: a) Send a DUP MAC request or some other explicit message such that the DUT will consistently answer with the same response at 125 KBAUD. b) Determine the theoretical 0 delay ACK position assuming N bits (shown by the dashed cursor in Figure 5-5 Delay Overview) and the measure the actual delay. c) Repeat for all supported baud rates. d) Verify that the nominal delay is less than 250ns plus CAN controller delay. e) Measure the time between when ACK would occur with 0 delay and the time when ACK actually occurs. Measure the ACK delay of the request, not of the response. Any valid CAN message is acceptable. It is not necessary for a DeviceNet response to occur, just a CAN ACK. Revision B4 3/3/2000 16 Test Procedure for Physical Layer Indicators and Switches 464 465 466 467 468 469 Figure 5-5 Delay Overview In Figure 5-5 Delay Overview Figure 5-5 Delay Overview, the dashed vertical cursor is set N bit times away from the last non-ACK transition, 3.2 divisions @ 1.25 Sec/div (3.2 * 1.25 Sec = 4 Sec: 2 bits times at 500 K). This is the time of 0 (zero) ACK delay. The solid vertical cursor is set at the occurrence of the actual ACK. Revision B4 3/3/2000 17 Test Procedure for Physical Layer Indicators and Switches 470 471 Zoom Image of Transceiver Propagation Delay Measurement 472 Figure 5-6 Delay Close-Up 473 474 475 476 Figure 5-6 Delay Close-Up shows a “zoomed in” version of Figure 5-5 Delay Overview Figure 5-5 Delay Overview. Here, the actual measurement of the ACK delay (measured as the delta between the two cursors) is 185 nSec. Revision B4 3/3/2000 18 Test Procedure for Physical Layer Indicators and Switches 477 478 479 480 5.6.3 ACK Delay Example The maximum latency (or delay) allowed from a CAN transmitter and receiver is 120 ns and 130 ns, respectively. With delays, this can cause a delay in a CAN ACK. Adding the delay in the CAN controller 62.5 nS - the maximum delay should be less than 312.5 nS. Receive = 130 nS 62.5 nS Xcr Transmit = 120 nS 481 482 483 484 485 486 487 488 489 490 491 CAN Controller Figure 5-7 ACK Delay Nominal Bit Width 125 K bps - 8 uS 250 K bps - 4 uS 500 K bps - 2 uS 492 493 494 Revision B4 3/3/2000 19 Test Procedure for Physical Layer Indicators and Switches 495 496 5.7 Wiring 497 498 499 500 501 502 503 504 505 506 507 508 509 510 511 512 513 514 515 516 517 518 519 520 521 522 523 524 525 526 527 528 529 530 531 532 533 534 535 536 537 538 539 540 541 542 5.7.1 DeviceNet Mis-Wiring WARNING: Permanent device damage may occur during this test. CAUTION: Shock, fume, and flying debris hazard. This test must be performed by personnel using eye and breathing protection. All connections must be made with the circuit completely de-energized. Power can only be applied after the person making the connection is well away from the device under test. IMPORTANT: Should catastrophic failure occur, remove all power immediately. Mis-Wiring Procedure per Table 5-2 Mis-Wiring DeviceNet Connector Table. Use 18 VDC max. Equipment Required: 1. DC power supply; variable output; set to 18 VDC; 2. Red and Black single conductor wire; AWG 20; Length to be determined by test setup. This procedure verifies that mis-wiring the leads does not damage the DUT. a) Referring to Table 5-2 Mis-Wiring DeviceNet Connector Table, perform all steps in specified order. b) Connect the DUT DeviceNet connector to the DC power supply as per step 1 in Table 5-2. (Detail: This step indicates that the black wire is connected to the power supply ground and the DUT DeviceNet connector ground. Also, the red wire is connected to the power supply output and the DUT DeviceNet connector CAN_L terminal.). c) Apply power for 60 seconds. d) Turn off the DUT power. e) Remove the wiring on the DUT DeviceNet. f) If this step was the last step in Table 5-2, go to i. g) Connect the DUT DeviceNet connector to the DC power supply as per the next step in Table 5-2. h) Go to c. i) Verify that no obvious damage has occurred to the DUT by visual inspection (no damage, smoke, etc.) j) Redo test 5.4.1 Resistance: CAN_L To CAN_H to verify CAN transceiver health. k) If the CAN transceiver appears to be healthy, go to l, else DUT has been damaged by mis-wiring, stop test, the DUT has failed l) Connect the DUT to the test network as normal. m) Verify that the unit communicates as normal. n) If no communication after the mis-wiring test, the DUT has failed the mis-wiring test. Revision B4 3/3/2000 20 Test Procedure for Physical Layer Indicators and Switches 543 Table 5-2 Mis-Wiring DeviceNet Connector Table 544 Step 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 545 546 547 548 Black Bk Bk Bk R R R R DeviceNet Connector Blue Bare White Red R R R Bk Bk R Bk R Bk R Bk R Bk Bk R Bk R Bk R Bk R Bk Bk R Bk R Bk R Bk R Bk Definitions: R = DeviceNet red lead or +18VDC power Bk = DeviceNet black lead or +18 VDC ground 549 Revision B4 3/3/2000 21 Test Procedure for Physical Layer Indicators and Switches 550 551 552 553 554 555 556 557 558 559 560 561 562 563 564 565 566 567 568 569 570 APPENDIX A. CONFORMANCE TEST DATA TESTER IDENTIFICATION Tested By ________________________________________ Date ________________________________________ DEVICE IDENTIFICATION Identity Object Attributes: Vendor ID _________________________________ Device Type _________________________________ CAN TRANSCEIVER IDENTIFICATION Manufacturer ________________________________________ Model ________________________________________ ISOLATION / IMPEDANCE MEASUREMENTS Section Parameter Being Measured 5.4.1 CAN_H to CAN_L Resistance Ratio Powered Un-powered 5.4.1 Units _________ _________ CAN_H to CAN_L Capacitance Ratio Powered Un-powered 571 572 Measured Value _________ _________ POWER MEASUREMENTS Section Parameter Being Measured 5.5.2 Minimum Operating Voltage V 5.5.3 Actual Voltage (app. 11 VDC) Current Draw @ 11 VDC Power Consumption @ 11 VDC V A W Actual Voltage (app. 17 VDC) Current Draw @ 17 VDC Power Consumption @ 17 VDC V A W Actual Voltage (app. 25 VDC) Current Draw @ 25 VDC Power Consumption @ 25 VDC V A W Maximum In-rush Current Duration of Current Spike A sec 5.5.4 Revision B4 3/3/2000 Measured Value 22 Units Test Procedure for Physical Layer Indicators and Switches 5.5.5 Recessive Level CAN_H Voltage Recessive Level CAN_L Voltage V V 5.5.6 Dominant Level CAN_H Voltage Dominant Level CAN_L Voltage V V 5.5.7 CAN_H/CAN_L Differential Voltage V 573 574 Revision B4 3/3/2000 23 Test Procedure for Physical Layer Indicators and Switches 575 576 APPENDIX B. HIPOT TEST DATA 577 Describe the HIPOT tests performed on the product. Illustrate lab setup and voltages. Revision B4 3/3/2000 24