Download ODVA Conformance SIG Test Procedure For Physical Layer, Media

Open DeviceNet Vendor Association
Test Procedure for Physical Layer,
Indicators and Switches
Revision: B4
3/3/2000
Revision History
Version #/
Revision #
Date
Revision Description
B4
B4
2/18/00
2/28/00
Major rewrite of revision B3
Based on comments from Matt Kuzel, deleted 5.4.1
since it was already incorporated in 5.4.2.
Renumbered 5.4.2 to 5.4.1 and renamed to
Resistance and Capacitance: CAN_H to CAN_L.
Corrected wording in 5.5.1. Edit Appendix A to
reflect changes in 5.4.1. Added Appendix B.
Revision B4
3/3/2000
ii
Editor
Doug Stanton
Doug Stanton
Acknowledgments
The editor wishes to thank those who contributed to the development of this document. These contributors
include members of the Conformance SIG, Physical Layer SIG and ODVA laboratories.
Revision B4
3/3/2000
iii
Test Procedure For Physical Layer, Indicators and Switches
1
2
3
4
TABLE OF CONTENTS
Page No.
5
TEST PROCEDURE FOR PHYSICAL LAYER, INDICATORS AND SWITCHES .................................. I
6
1.
INTRODUCTION ............................................................................................................................. 1
7
8
9
10
2.
REFERENCES, REQUIRED DOCUMENTS AND DEFINITIONS ............................................... 1
2.1 References.......................................................................................................................................... 1
2.2 Required Documents.......................................................................................................................... 1
2.3 Definitions ......................................................................................................................................... 1
11
3.
EQUIPMENT .................................................................................................................................... 2
12
13
14
15
4.
SETUP ............................................................................................................................................... 3
4.1 Test Configuration ............................................................................................................................. 3
4.2 PC-Based Applications ...................................................................................................................... 6
4.3 Conformance Test Results ................................................................................................................. 6
16
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
33
34
35
36
37
38
39
40
41
42
43
44
5.
TESTS................................................................................................................................................ 7
5.1 Connector Style ................................................................................................................................. 7
5.2 Indicators ........................................................................................................................................... 7
5.2.1 Module Status LED .................................................................................................................... 7
5.2.2 Network Status LED .................................................................................................................. 7
5.2.3 Combined Module/Network Status LED ................................................................................... 8
5.3 Switches ............................................................................................................................................. 9
5.3.1 MAC ID Switch Style ................................................................................................................ 9
5.3.2 MAC ID Switch Mounting Location and Access ...................................................................... 9
5.3.3 MAC ID Hardware Verification ................................................................................................ 9
5.4 Isolation / Impedance ......................................................................................................................... 9
5.4.1 Resistance and Capacitance: CAN_H To CAN_L) ................................................................... 9
5.5 Power ................................................................................................................................................. 10
5.5.1 Physical Layer Power Sense Verification .................................................................................. 10
5.5.2 Minimum Operating Voltage ..................................................................................................... 10
5.5.3 Power Consumption For DeviceNet Voltage Range (advise only, not pass/fail) ...................... 10
5.5.4 Inrush Current (advise only, not pass/fail) ................................................................................. 11
5.5.5 CAN_H And CAN_L Recessive Level Voltages ...................................................................... 11
5.5.6 CAN_H And CAN_L Dominant Level Voltages ...................................................................... 13
5.5.7 Differential Voltage Reading ..................................................................................................... 14
5.6 CAN Timing ...................................................................................................................................... 15
5.6.1 Bit Timing Measurements .......................................................................................................... 15
5.6.2 ACK Delay Measurement .......................................................................................................... 16
5.6.3 ACK Delay Example.................................................................................................................. 19
5.7 Wiring ................................................................................................................................................ 20
5.7.1 DeviceNet Mis-Wiring .............................................................................................................. 20
Revision B4
2/28/2000
Test Procedure for Physical Layer Indicators and Switches
45
46
47
48
49
50
51
52
53
54
55
56
57
58
59
60
61
62
63
64
65
66
67
68
69
70
LIST OF FIGURES
Figure 4-1 Test Configuration ........................................................................................................................ 3
Figure 4-2 Capacitance Measurement Fixture ................................................................................................ 4
Figure 4-3 Sample Inrush Current Circuit ...................................................................................................... 5
Figure 5-1 Recessive Bit levels ...................................................................................................................... 12
Figure 5-2 Dominant Bit levels....................................................................................................................... 13
Figure 5-3 Differential Level .......................................................................................................................... 14
Figure 5-4 Bit Timing ..................................................................................................................................... 16
Figure 5-5 Delay Overview............................................................................................................................. 17
Figure 5-7 Delay Close-Up ............................................................................................................................. 18
Figure 5-8 ACK Delay .................................................................................................................................... 19
LIST OF TABLES
Table 3-1: Test Equipment ............................................................................................................................. 2
Table 5-1 Bit Timing Values .......................................................................................................................... 15
Table 5-2 Mis-Wiring DeviceNet Connector Table ....................................................................................... 21
Revision B4
3/3/2000
2
Test Procedure For Physical Layer, Indicators and Switches
71
1. INTRODUCTION
72
73
74
75
76
This document provides a procedure for verifying the conformance of a DeviceNet device to physical layer
media, indicators and switch requirements set forth in the ODVA DeviceNet Specification. Used in
conjunction with other ODVA tests, the device manufacturer gains a higher level of confidence that the device
can be integrated into a DeviceNet network.
77
2. REFERENCES, REQUIRED DOCUMENTS AND DEFINITIONS
78
NOTE: References shall be the latest publications as of the release date on the cover of this document.
79
2.1 References
80
81
ODVA DeviceNet Specification, Vols. I and II
ISO 11898
82
2.2 Required Documents
83
84
85
Vendor shall provide documentation indicating that HIPOT tests were performed and that the
isolation barrier was not violated at a level of 500 VDC test voltage. See Section 5.4 for details.
Vendor shall provide a complete and accurate Statement of Conformance.
86
2.3 Definitions
87
88
89
Sole Occupant: The only device on the network that can generate a CAN ACK
DUT: Device Under Test
Revision B4
2/28/2000
Test Procedure for Physical Layer Indicators and Switches
90
91
92
93
94
95
96
3. EQUIPMENT
Table 3-1: Test Equipment lists the equipment that will be required to perform testing. Equivalent equipment
may be substituted.
Table 3-1: Test Equipment
97
Qty
1
1
2
1
1
2
1
2
1
1
2
4
1
1
1
98
99
100
101
102
103
104
105
106
107
108
109
110
111
Description
Variable Power Supply Adjustable, 0-30 VDC @ 0-3 Amps, 115 VAC, 60 Hz
DeviceNet Power Supply Interface (V+/V-/GND To Female Mini Connector)
DeviceNet Splitter
Trunk (Mini) Terminating Resistor
Drop (Micro) Terminating Resistor
DeviceNet Interface Card and associated PC Application
Two Channel Digital Oscilloscope 100MHz, 2GS/s
Oscilloscope Probes
Inrush Current Circuit – SCR1: S6065J, R1: 750 ohms, R2: 1K ohms, R3: 100 K ohms,
C1:10,000 microFarads, SW1: normally open, push button, Current Probe: Pearson
Model 110 or equivalent
DeviceNet Breakout Terminal (Optional)
Digital Multimeter (DMM)
Drop Cables 1.5 m (Thin)
Trunk Cable 1.5 m (Thin)
1 MHz signal generator
Parts for
Figure 4-2 Capacitance Measurement Fixture
300 Feet Trunk Cable (Thick)
1The
power supply interface consists of the positive and negative voltage terminals of the supply
connected to the V+ and V- lines of a DeviceNet connector. The negative voltage terminal shall be
connected to the ground terminal of the power supply and to the drain line of the DeviceNet connector.
The ground terminal of the power supply shall be connected to earth ground. The pin order of the
DeviceNet connector is defined in the DeviceNet Specification.
2
The DeviceNet breakout terminal shall be constructed to allow the connection of probes from
measurement devices and permit the connection of DeviceNet cables as illustrated in Figure 4-1 .
4
300 feet of test cable consists of a thick cable with field-wireable DeviceNet connectors as needed.
Revision B4
3/3/2000
2
Notes
Note1
Figure 4-3 Sample Inrush
Current Circuit
Note2
Note4
Test Procedure for Physical Layer Indicators and Switches
112
113
4. SETUP
114
115
116
NOTE: Should the DUT require field connections in order to perform the tests, the device manufacturer is
responsible for providing the appropriate equipment or simulators. The vendor is responsible for providing
documentation to illustrate that the simulator is an accurate representation of the field application.
117
118
119
120
4.1 Test Configuration
The Test Configuration is illustrated in Figure 4-1 Test Configuration
121
122
123
124
125
126
127
128
129
130
131
132
133
134
135
136
137
138
139
140
141
Figure 4-1 Test Configuration
During the course of testing, the PCs and the DUT will be attached or removed as required. When the inrush
current test is performed, the drop cable from the DeviceNet splitter to the breakout terminal will be replaced
with the inrush current cable. When the DUT is connected to the network, electrical measurements will be
obtained via the Breakout Terminal. For the device isolation tests, the DUT is disconnected from the network,
and all electrical measurements will be obtained from the connector on the DUT.
A second PC is optional and may be used for diagnostics.
A description of the DeviceNet Interface for the power supply, breakout terminal, and inrush current cable are
provided in the footnotes for Table 3-1: Test Equipment.
Revision B4
3/3/2000
3
Test Procedure for Physical Layer Indicators and Switches
142
143
144
145
146
147
For performing the capacitance test in Resistance and Capacitance: CAN_H To CAN_L the following items
are needed. These will be the only things, along with the power supply, attached to the DUT for this test.
 1 MHz signal generator with 50 Ohm sinusoidal outputs capable of 5v p-p signals
 Fixture with transformer (balun) - Mini-circuits T2.5-6T, North Hills 0302BB, or equivalent for
converting from 50 Ohms single ended to 120 Ohms differential.
Fixture
To Generator
10 K Ohms
CAN_H
120
Vi
Vo
Ohms
CAN_L
To DUT
10 K Ohms
V+
V+
V-
V-
To
supply
Note: reference scope signals to V-
148
149
150
151
152
Figure 4-2 Capacitance Measurement Fixture
Revision B4
3/3/2000
4
Test Procedure for Physical Layer Indicators and Switches
153
154
For performing the Inrush Current test, Section 5.5.4, the following circuit is needed.
+
24 Volt
Power
Source
Oscilloscope
R1
750
-
SCR1
S6065J
C1
10,000 uF.
Current Probe
Pearson Model 110
SW1
+
R3
100k
Device
Under
Test
Output
R2 1k
-
155
156
157
158
159
160
161
162
163
164
165
166
167
168
169
Figure 4-3 Sample Inrush Current Circuit
Revision B4
3/3/2000
5
Test Procedure for Physical Layer Indicators and Switches
170
171
172
173
174
175
176
177
4.2 PC-Based Applications
178
179
180
4.3 Conformance Test Results
The majority of the tests in this document require execution of one or more of the following applications on
the PCs shown in Figure 4-1 :
1. DeviceNet network configuration tool. The function of the DeviceNet network configuration tool is to
configure device parameters. For example data rate and node address can be configured using this type of
tool.
2. DeviceNet master. The DeviceNet master provides mechanisms for establishing connections to devices
and producing and consuming data over these connections.
Appendix A provides a template for recording data gathered during the course of the conformance testing.
This appendix should be reviewed in order to become familiar with the results to be recorded.
181
Revision B4
3/3/2000
6
Test Procedure for Physical Layer Indicators and Switches
182
5. TESTS
183
184
185
186
5.1 Connector Style
187
188
189
190
191
192
5.2 Indicators
193
194
5.2.1 Module Status LED
The DUT contains a red/green indicator for the device status.
195
196
197
198
199
200
201
202
203
5.2.1.1 Indicator Operation
This following behavior should be observed.
a) Attach the DUT to the network as the sole occupant.
b) Verify that the Module Status indicator flashes green for approximately 0.25 seconds then flashes
red for approximately 0.25 seconds, at some point during the execution of the power-up self-test
procedures.
c) After all power-up self-tests have been successfully completed, verify that the Module Status
indicator illuminates either flashing green at an approximate 0.5 second flash rate if
commissioning is needed or solid green if the device is ready.
204
205
5.2.2 Network Status LED
The DUT contains a red/green indicator for the network communication status.
206
207
208
209
210
211
212
213
5.2.2.1 Indicator Operation: Solitary Node Power-Up Test
This following behavior should be observed.
a) Attach the DUT to the network as the sole occupant.
b) Verify that the Network Status indicator flashes green for approximately 0.25 seconds then
flashes red for approximately 0.25 seconds, at some point during the execution of the power-up
self-test procedures.
c) After all power-up self-tests have been successfully completed, verify that the Network Status
indicator turns off.
214
215
216
217
218
219
220
221
5.2.2.2 Indicator Operation: Occupied Network Node Power-Up Test
This following behavior should be observed.
a) Execute the DeviceNet master application and configure the DeviceNet master to MACID zero
and Bit Rate for DUT’s maximum supported bit rate.
b) Set the DUT to MACID 63 and Bit Rate to the maximum supported and attach the DUT to the
network.
c) After all power-up self-tests have been successfully completed, verify that the Network Status
indicator flashes green.
a) Verify that the connector used matches that defined in the Statement of Conformance.
b) Verify the presence of gold coloring on the pins of the DeviceNet connector.
c) Verify that the DeviceNet connector is male-type connector.
Verify the LEDs supported match those defined in the Statement of Conformance and meet the applicable
specifications. For autobaud-capable devices, a transmitting node should be set on the network to
generate messages and not interact with the node. If module status LED is implemented then section 5.2.1
must be performed; if network status LED is implemented then section 5.2.2 must be performed; if
combined module/status LED is implemented then section 5.2.3 must be performed.
Revision B4
3/3/2000
7
Test Procedure for Physical Layer Indicators and Switches
222
223
224
225
226
227
228
5.2.2.3 Indicator Operation: CAN_H To CAN_L Short
a) Attach the DUT to the network as the sole occupant.
b) Cycle power to the DUT and apply 24VDC.
c) Short CAN_H to CAN_L. This simulates a continuous recessive level on the CAN bus (or BusOff).
d) Verify that the Network Status indicator illuminates solid red, indicating that the CAN transceiver
in the DUT has detected a Bus-Off condition.
229
230
231
232
233
234
5.2.2.4 Indicator Operation: CAN_H To V- Short
a) Attach the DUT to the network as the sole occupant.
b) Cycle power to the DUT and apply 24VDC.
c) Short CAN_H to V-. This simulates a continuous dominant level on the CAN bus.
d) Verify that the Network Status indicator illuminates solid red, indicating that the CAN transceiver
in the DUT has detected a Bus-Off condition.
235
236
5.2.3 Combined Module/Network Status LED
The DUT contains a bicolor, red/green indicator for device and communication status.
237
238
239
240
241
242
243
244
245
5.2.3.1 Indicator Operation: Solitary Node Power-Up Test
This following behavior should be observed.
a) Attach the DUT to the network as the sole occupant.
b) Cycle power to the DUT and apply 24VDC to the Network.
c) Verify that the Combined Module/Network Status indicator flashes green for approximately 0.25
seconds then flashes red for approximately 0.25 seconds, at some point during the execution of
the power-up self-test procedures.
d) After all power-up self-tests have been successfully completed, verify that the Combined
Module/Network Status indicator is off.
246
247
248
249
250
251
5.2.3.2 Indicator Operation: Occupied Network Node Power-Up Test
a) Execute the DeviceNet master application and configure the DeviceNet master to MACID zero
and Bit Rate to the maximum supported.
b) Set the DUT to MACID 63 and Bit Rate maximum supported and attach the DUT to the network.
c) After all power-up self-tests have been successfully completed, verify that the Combined
Module/Network Status indicator flashes green.
252
253
254
255
256
257
5.2.3.3 Indicator Operation: CAN_H To CAN_L Short
a) Attach the DUT to the network as the sole occupant.
b) Cycle power to the DUT and apply 24VDC.
c) Short CAN_H to CAN_L. This simulates a continuous recessive level on the CAN bus.
d) Verify that the Combined Module/Network Status indicator illuminates solid red, indicating that
the CAN transceiver in the DUT has detected a Bus-Off condition.
258
259
260
261
262
263
5.2.3.4 Indicator Operation: CAN_H To V- Short
a) Attach the DUT to the network as the sole occupant applying external power, if necessary
b) Cycle power to the DUT and apply 24VDC.
c) Short CAN_H to V-. This simulates a continuous dominant level on the CAN bus.
d) Verify that the Combined Module/Network Status indicator illuminates solid red, indicating that
the CAN transceiver in the DUT has detected a Bus-Off condition.
Revision B4
3/3/2000
8
Test Procedure for Physical Layer Indicators and Switches
264
5.3 Switches
265
266
Verify that the switches present are specified in the Statement of Conformance. If “DIP Switch” or “other” is
selected, the following should be inspected.
267
268
269
5.3.1 MAC ID Switch Style
If rotary, thumb-wheel, or push-wheel switches are used, then verify that the switch is labeled in decimal
format.
270
271
5.3.2 MAC ID Switch Mounting Location and Access
Verify that the Most Significant Digit (MSD) switch is set to the left or top of the product.
272
273
274
275
276
277
278
5.3.3 MAC ID Hardware Verification
a) Set the DUT to MACID zero and Baud Rate to maximum supported and attach the DUT to the
network.
b) Verify presence of the DUT on the network at the appropriate MACID.
c) Repeat the previous steps using node address settings of 8, 11, 22, 33, 44, 55, and 63 for rotary
switches or address settings of 01h, 02h, 04h, 08h, 10h, 20h and 3Fh for DIP switches.
279
5.4 Isolation / Impedance
280
281
282
283
284
285
286
287
288
289
290
291
292
293
294
295
296
297
298
299
300
301
302
303
304
305
Tests in section 5.4 apply only to devices that 1) implement a metallic chassis that is not isolated from earth
ground or 2) have field wiring. Where 'field wiring' is defined as any user accessible electrical connection
other than DeviceNet connections. Voltage levels are nominal plus/minus 10%.
Vendor shall provide documentation indicating that HIPOT tests were performed and that the isolation barrier
was not violated at a level of 500 VDC test voltage. HIPOT tests shall be performed by the vendor in
accordance with the following criteria and should be documented in Appendix B.
1) For a device with a metallic chassis that potentially has a connection to earth ground, connect all 5
DeviceNet signal lines to a single node. Designate this 1st node as node A. Designate the metallic chassis as
node B. For this test the chassis will be isolated. Develop 500 VDC between nodes A & B. Use UL approved
HYPOT test equipment. Reverse polarity of nodes A & B and repeat test.
2) For a device with field wiring connect all 5 DeviceNet signal lines to a single node. Designate this 1st
node as node A. Connect all field wiring inputs together. Designate this 2nd node as node B. Develop 500
VDC between nodes A & B. Use UL approved HYPOT test equipment. Reverse Polarity of nodes A & B and
repeat test.
5.4.1 Resistance and Capacitance: CAN_H To CAN_L)
a) Attach the fixture and signal generator as shown in
Figure 4-2 Capacitance Measurement Fixture .
b) Test both with the device not powered and with the device powered and not transmitting
c) Set the generator to produce a 100 KHz sinusoid at about 5 volts p-p differential measured at Vi.
Verify that the level is constant (+/- 2%) from 100 to 1000 KHz.
d) Measure Vo (p-p differential) with the generator set to 100 KHz.
Revision B4
3/3/2000
9
Test Procedure for Physical Layer Indicators and Switches
306
307
308
309
310
311
312
313
314
315
316
317
318
319
320
321
322
323
e) Vo should be greater than Vi/2 volts. This verifies that the differential input resistance is greater than
20 K Ohms.
f) Calculate the ratio Vo/Vi and record in Appendix A, (pass>=0.5). Set the frequency of the signal to
fc, calculated from the recorded voltage ratio as follows:
1/fc = Vo/Vi * 2 * PI * 20E3 * 35E-12
or,
fc = 1/[(Vo/Vi)* 4.4E-6]
g) Once the generator is set to this frequency, again measure Vo.
h) Vo should be greater than 0.707 times the previous value of Vo. This verifies that the differential
input capacitance is less than 25 pF. (Use of 35 pF in the above calculation allows for 10 pF in the
fixture.)
i) For example, if Vi is measured as 5.0 +/- 0.1 volt from 100 to 1000 KHz, and Vo is measured as 3.22
volts at 100 KHz, then the DUT passes the input resistance requirement since Vo is greater than half
of Vi. The ratio Vo/Vi is then 0.644, and fc = 353 KHz. After setting the generator to 353 KHz, Vo
is measured to be 2.36 volts. Since this level is greater than 0.707 * 3.22 = 2.28, the DUT passes the
capacitance requirement. Calculate the ration, New Vo / Old Vo, and record in Appendix A, (pass >=
0.707.
324
5.5 Power
325
326
327
328
329
330
331
5.5.1 Physical Layer Power Sense Verification
This test can only be performed on devices that are not powered by the DeviceNet network, otherwise skip
this test.
a) With DeviceNet power off, power up DUT and wait normal power initialization time for DUT,
b) Reapply DeviceNet power to the DUT.
c) Verify that the DUT’s Module Status LED becomes solid green and that it communicates with no
additional manual intervention.
332
333
334
335
336
337
338
339
340
5.5.2 Minimum Operating Voltage
a) Set the voltage level of the network power supply to 25 VDC and adjust the current limit to
maximum.
b) Set the DUT to MACID 63 and Bit Rate to the maximum supported and attach the DUT to the
network.
c) Initiate communication from the master to the DUT.
d) Decrease the voltage to 11 Volts.
e) Verify that the DUT is still allocated to the master.
f) Log measurement in Appendix A
341
342
343
344
345
346
347
348
349
350
351
5.5.3 Power Consumption For DeviceNet Voltage Range (advise only, not pass/fail)
a) Adjust the power supply current limit to maximum and set the voltage level of the power supply to 11
VDC
b) Connect the voltmeter across the V+ and V- connections on the breakout terminal.
c) Connect the current meter in series with the V+ input on the breakout terminal
d) Attach the DUT as the sole occupant.
e) Measure and record the actual voltage.
f) Measure and record the DUT current draw.
g) Compute (P=VI) and record the DUT power consumption. Add this value to the vendor supplied
value for the network powered field connection power value.
Revision B4
3/3/2000
10
Test Procedure for Physical Layer Indicators and Switches
352
353
354
h) Log measurement in Appendix A
i) Repeat steps (f), (g) and (h) for 17 & 25 VDC.
355
5.5.4 Inrush Current (advise only, not pass/fail)
356
357
358
359
360
361
362
363
364
365
366
367
368
369
370
371
Refer to Figure 4-3 Sample Inrush Current Circuit for the following steps.
372
373
374
375
376
377
378
379
380
381
382
5.5.5 CAN_H And CAN_L Recessive Level Voltages
a) Attach the DUT as the sole occupant.
a) Attach channel one of the scope to CAN_H with the ground reference attached to V-.
b) Attach channel two of the scope to CAN_L with the ground reference attached to V-.
Test Setup:
1. Connect the DUT’s V+ and V- to the circuits respective Device Under Test Output.
2. Connect the Current Probe to a digital oscilloscope to measure the In-Rush Current Pulse.
3. Set up the scope to measure the voltage produced by the current probe from the probe
manufacturer instructions.
4. Set up the scope horizontal sweep to 1 milli second. This may require further adjustment
depending on the duration of the DUT ‘s In-Rush Current pulse.
5. Set the scope trigger to single sweep.
6. Apply 24 volts to the 24 volt input to the circuit.
Test Procedure:
1. Momentarily close SW1.
2. Measure and record the amplitude and duration of the In-Rush Current Pulse.
3. Log measurement in Appendix A
4. If a retest is required, wait 2 minutes before repeating steps 1 and 2.
c) Measure and record, in Appendix A, the recessive CAN_H voltage.
d) Measure and record, in Appendix A, the recessive CAN_L voltage.
e) Verify that the recessive voltage level for both CAN_H and CAN_L is between 2.0 VDC and 3.6
VDC.
Revision B4
3/3/2000
11
Test Procedure for Physical Layer Indicators and Switches
383
384
385
386
387
388
Figure 5-1 Recessive Bit levels
Example of one recessive bit length at 500KBPS, 2.00 microseconds off-time
Revision B4
3/3/2000
12
Test Procedure for Physical Layer Indicators and Switches
389
390
391
392
393
394
395
396
397
5.5.6 CAN_H And CAN_L Dominant Level Voltages
a) Attach the DUT as the sole occupant.
b) Attach channel one of the scope to CAN_H with the ground reference attached to V-.
c) Attach channel two of the scope to CAN_L with the ground reference attached to V-.
d) Measure and record, in Appendix A, the dominant CAN_H voltage.
e) Measure and record, in Appendix A, the dominant CAN_L voltage.
f) Verify that the dominant voltage level for CAN_H is between 2.75 VDC and 5.1 VDC
g) Verify that the dominant voltage level for CAN_L is between 0.5 VDC and 2.86 VDC
398
399
400
401
402
403
Figure 5-2 Dominant Bit levels
Example of one dominant bit length at 500KBPS
2.00 microseconds on-time
Revision B4
3/3/2000
13
Test Procedure for Physical Layer Indicators and Switches
404
405
406
407
408
409
410
411
412
413
5.5.7 Differential Voltage Reading
a) Attach the DUT as the sole occupant.
b) Attach channel one of the scope to CAN_H with the ground reference attached to V-.
c) Attach channel two of the scope to CAN_L with the ground reference attached to V-.
d) Subtract channel two from channel one on the scope to view the differential waveform, CAN_H CAN_L.
e) Measure and record, in Appendix A, the differential voltage, CAN_H - CAN_L.
f) Verify that the differential voltage is 2.0 Vp-p (nominal) and 1.5 Vp-p (minimum). (between 1.5 and 3.0
spec)
414
415
416
417
418
Figure 5-3 Differential Level
Example of how to use the cursors to determine P-P voltage of differential waveform
dY = 2.17 Volts
419
Revision B4
3/3/2000
14
Test Procedure for Physical Layer Indicators and Switches
420
5.6 CAN Timing
421
422
423
424
425
426
5.6.1 Bit Timing Measurements
Bit timings for DeviceNet are to be tested to be within 1% of the expected time. The DeviceNet
Specification requires a data rate tolerance of 1000 parts per million (0.1%). This test does not verify crystal
accuracy (0.1%), but verifies that proper CAN bit timing parameters are in use by using a 1% limit.
If the DUT supports autobaud capability, the procedure in 5.6.1.2 should be followed. If the DUT does not
support autobaud capability, the procedure in 5.6.1.1 should be followed.
427
428
429
430
431
5.6.1.1
a)
b)
c)
d)
432
433
434
435
436
437
438
439
5.6.1.2
a)
b)
c)
Fixed Baud Rate Devices
Attach the DUT to the network as the sole occupant
Monitor the DUP MAC sent by the DUT.
Measure a bit time. Verify that the results fall in the range specified in Table 5-1 Bit Timing Values.
Repeat steps for 250 k and 500 k baud, if supported.
Auto-bauding Devices
Connect the DUT to a network that has a PC cable of generating a request.
Generate a request for the DUT at the first baud rate in Table 5-1 Bit Timing Values.
Measure the bit time of the response from the DUT. Verify that the results fall in the range specified
in Table 5-1 Bit Timing Values.
d) Repeat steps b and c for 250 k and 500 k baud.
Table 5-1 Bit Timing Values
Baud Rate
(Kbps)
125
250
500
Bit Time (us)
Typical
8.000
4.000
2.000
Minimum
7.92
3.96
1.98
440
Revision B4
3/3/2000
15
Maximum
8.08
4.04
2.02
Test Procedure for Physical Layer Indicators and Switches
441
442
443
Figure 5-4 Bit Timing
444
445
446
Example of a typical CAN transmission waveform
Poll I/O message transmission
Group 2, MAC ID 0, MSG ID 5, Data [none]
447
448
449
450
451
452
453
454
455
456
457
458
459
460
461
462
463
5.6.2 ACK Delay Measurement
The following measurement was taken to illustrate how ACK delay can be measured
Setup:
a) CAN-H & CAN-L were monitored via the BREAKOUT TERMINAL shown in Figure 4-1 .
b) The length of DeviceNet cable from the DUT to the BREAKOUT TERMINAL was less than 3 feet.
c) The data is collected while periodic data is transmitted. The tester may choose a DeviceNet data
response that minimizes the N bit times away from the last non-ACK transition. .
Procedure:
a) Send a DUP MAC request or some other explicit message such that the DUT will consistently answer
with the same response at 125 KBAUD.
b) Determine the theoretical 0 delay ACK position assuming N bits (shown by the dashed cursor in
Figure 5-5 Delay Overview) and the measure the actual delay.
c) Repeat for all supported baud rates.
d) Verify that the nominal delay is less than 250ns plus CAN controller delay.
e) Measure the time between when ACK would occur with 0 delay and the time when ACK actually
occurs. Measure the ACK delay of the request, not of the response. Any valid CAN message is
acceptable. It is not necessary for a DeviceNet response to occur, just a CAN ACK.
Revision B4
3/3/2000
16
Test Procedure for Physical Layer Indicators and Switches
464
465
466
467
468
469
Figure 5-5 Delay Overview
In Figure 5-5 Delay Overview Figure 5-5 Delay Overview, the dashed vertical cursor is set N bit times away
from the last non-ACK transition, 3.2 divisions @ 1.25 Sec/div (3.2 * 1.25 Sec = 4 Sec: 2 bits times at
500 K). This is the time of 0 (zero) ACK delay. The solid vertical cursor is set at the occurrence of the actual
ACK.
Revision B4
3/3/2000
17
Test Procedure for Physical Layer Indicators and Switches
470
471
Zoom Image of Transceiver Propagation Delay Measurement
472
Figure 5-6 Delay Close-Up
473
474
475
476
Figure 5-6 Delay Close-Up shows a “zoomed in” version of Figure 5-5 Delay Overview Figure 5-5 Delay
Overview. Here, the actual measurement of the ACK delay (measured as the delta between the two cursors) is
185 nSec.
Revision B4
3/3/2000
18
Test Procedure for Physical Layer Indicators and Switches
477
478
479
480
5.6.3 ACK Delay Example
The maximum latency (or delay) allowed from a CAN transmitter and receiver is 120 ns and 130 ns,
respectively. With delays, this can cause a delay in a CAN ACK. Adding the delay in the CAN controller 62.5 nS - the maximum delay should be less than 312.5 nS.
Receive = 130 nS
62.5 nS
Xcr
Transmit = 120 nS
481
482
483
484
485
486
487
488
489
490
491
CAN
Controller
Figure 5-7 ACK Delay
Nominal Bit Width
125 K bps - 8 uS
250 K bps - 4 uS
500 K bps - 2 uS
492
493
494
Revision B4
3/3/2000
19
Test Procedure for Physical Layer Indicators and Switches
495
496
5.7 Wiring
497
498
499
500
501
502
503
504
505
506
507
508
509
510
511
512
513
514
515
516
517
518
519
520
521
522
523
524
525
526
527
528
529
530
531
532
533
534
535
536
537
538
539
540
541
542
5.7.1 DeviceNet Mis-Wiring
WARNING: Permanent device damage may occur during this test.
CAUTION: Shock, fume, and flying debris hazard.
This test must be performed by personnel using eye and breathing protection.
All connections must be made with the circuit completely de-energized.
Power can only be applied after the person making the connection is well away
from the device under test.
IMPORTANT: Should catastrophic failure occur, remove all power immediately.
Mis-Wiring Procedure per Table 5-2 Mis-Wiring DeviceNet Connector Table. Use 18 VDC max.
Equipment Required:
1. DC power supply; variable output; set to 18 VDC;
2. Red and Black single conductor wire; AWG 20; Length to be determined by test setup.
This procedure verifies that mis-wiring the leads does not damage the DUT.
a) Referring to Table 5-2 Mis-Wiring DeviceNet Connector Table, perform all steps in specified order.
b) Connect the DUT DeviceNet connector to the DC power supply as per step 1 in Table 5-2.
(Detail: This step indicates that the black wire is connected to the power supply ground and the DUT
DeviceNet connector ground. Also, the red wire is connected to the power supply output and the DUT
DeviceNet connector CAN_L terminal.).
c) Apply power for 60 seconds.
d) Turn off the DUT power.
e) Remove the wiring on the DUT DeviceNet.
f) If this step was the last step in Table 5-2, go to i.
g) Connect the DUT DeviceNet connector to the DC power supply as per the next step in Table 5-2.
h) Go to c.
i) Verify that no obvious damage has occurred to the DUT by visual inspection (no damage, smoke, etc.)
j) Redo test 5.4.1 Resistance: CAN_L To CAN_H to verify CAN transceiver health.
k) If the CAN transceiver appears to be healthy, go to l, else DUT has been damaged by mis-wiring,
stop test, the DUT has failed
l) Connect the DUT to the test network as normal.
m) Verify that the unit communicates as normal.
n) If no communication after the mis-wiring test, the DUT has failed the mis-wiring test.
Revision B4
3/3/2000
20
Test Procedure for Physical Layer Indicators and Switches
543
Table 5-2 Mis-Wiring DeviceNet Connector Table
544
Step
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
545
546
547
548
Black
Bk
Bk
Bk
R
R
R
R
DeviceNet Connector
Blue
Bare
White
Red
R
R
R
Bk
Bk
R
Bk
R
Bk
R
Bk
R
Bk
Bk
R
Bk
R
Bk
R
Bk
R
Bk
Bk
R
Bk
R
Bk
R
Bk
R
Bk
Definitions:
R = DeviceNet red lead or +18VDC power
Bk = DeviceNet black lead or +18 VDC ground
549
Revision B4
3/3/2000
21
Test Procedure for Physical Layer Indicators and Switches
550
551
552
553
554
555
556
557
558
559
560
561
562
563
564
565
566
567
568
569
570
APPENDIX A. CONFORMANCE TEST DATA
TESTER IDENTIFICATION
Tested By
________________________________________
Date
________________________________________
DEVICE IDENTIFICATION
Identity Object Attributes:
Vendor ID
_________________________________
Device Type
_________________________________
CAN TRANSCEIVER IDENTIFICATION
Manufacturer
________________________________________
Model
________________________________________
ISOLATION / IMPEDANCE MEASUREMENTS
Section
Parameter Being Measured
5.4.1
CAN_H to CAN_L Resistance
Ratio
Powered
Un-powered
5.4.1
Units
_________
_________
CAN_H to CAN_L Capacitance
Ratio
Powered
Un-powered
571
572
Measured Value
_________
_________
POWER MEASUREMENTS
Section
Parameter Being Measured
5.5.2
Minimum Operating Voltage
V
5.5.3
Actual Voltage (app. 11 VDC)
Current Draw @ 11 VDC
Power Consumption @ 11 VDC
V
A
W
Actual Voltage (app. 17 VDC)
Current Draw @ 17 VDC
Power Consumption @ 17 VDC
V
A
W
Actual Voltage (app. 25 VDC)
Current Draw @ 25 VDC
Power Consumption @ 25 VDC
V
A
W
Maximum In-rush Current
Duration of Current Spike
A
sec
5.5.4
Revision B4
3/3/2000
Measured Value
22
Units
Test Procedure for Physical Layer Indicators and Switches
5.5.5
Recessive Level CAN_H Voltage
Recessive Level CAN_L Voltage
V
V
5.5.6
Dominant Level CAN_H Voltage
Dominant Level CAN_L Voltage
V
V
5.5.7
CAN_H/CAN_L Differential Voltage
V
573
574
Revision B4
3/3/2000
23
Test Procedure for Physical Layer Indicators and Switches
575
576
APPENDIX B. HIPOT TEST DATA
577
Describe the HIPOT tests performed on the product. Illustrate lab setup and voltages.
Revision B4
3/3/2000
24