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Transcript
Voltage Controlled Ring Oscillator with Wide Tuning Range
and Fast Voltage Swing
Nicodimus Retdian, Shigetaka Takagi
∗
†
Nobuo Fujii
Tokyo Institute of Technology
2-12-1 Oookayama, Meguro
Tokyo, Japan
Tokyo Institute of Technology
2-12-1 Oookayama, Meguro
Tokyo, Japan
nico, [email protected]
[email protected]
ABSTRACT
A new design of a voltage controlled ring oscillator is proposed. The proposed design allows an implementation of a
low frequency ring oscillator using relatively small devices
and less stages. A voltage controlled ring oscillator with
tuning range from 40Hz to 380MHz is achieved using the
proposed method. In addition, the proposed circuit enables
the output voltage to swing faster than the conventional
one.
in f-v characteristic occurs at high oscillation frequencies
(large bias currents).
This paper proposes a new design method of a ring oscillator
based VCO. Section 2 will describe the conventional voltage
controlled ring oscillator. It will be then followed by the
basic idea and implementation of the proposed circuit in
section 3. Finally, simulation results and conclusions will be
given in sections 4 and 5 respectively.
Keywords
2. CONVENTIONAL CIRCUIT
ring oscillator, voltage controlled oscillator, inverter
A conventional voltage controlled ring oscillator circuit is
shown in Fig.1 where N is an odd number and shows the
number of inverter stages. Assume that the gate to source
parasitic capacitances CG s of the NMOS and PMOS transistors are equal as is shown in Fig.2. Here the frequency of
the oscillation can be found as
1. INTRODUCTION
A voltage controlled oscillator (VCO) is one of the important
basic building blocks in analog and digital circuits [1],[2],[3].
For example, a VCO is the main building block in phase
locked loop (PLL) and clock generator circuits. There are
so many different implementations of VCOs. One of them
is the ring oscillator based VCO, which is commonly used
in the clock generation.
The conventional ring oscillator based VCO uses variable
bias currents to control its oscillation frequency. However,
when the bias current is quite small, the voltage swing of
the VCO will become slower (longer rise/fall time). That is
not desirable in some applications. In addition, increasing
bias current will make the voltage headrooms of the current
source MOS transistors become narrow. Thus, a saturation
∗The authors are with the Dept. of Communications and
Integrated Systems, Graduate School of Sciences and Engineerings, Tokyo Institute of Technology.
†The author is with the Dept. of Physical Electronics, Graduate School of Sciences and Engineerings, Tokyo Institute of
Technology.
fosc =
1
2N τ
(1)
where τ is the delay of one inverter stage. Using Fig.2, the
delay of each inverter stage will be given by
Z
Vosc
=
τ
=
Ictrl
dt
CG
Vosc CG
Ictrl
(2)
(3)
where Vosc is the oscillation amplitude. Substituting (3) into
(1) will give
fosc =
Ictrl
.
2N Vosc CG
(4)
Here the oscillation frequency is determined by the current
Ictrl , the number of stages N , the amplitude Vosc and the
parasitic capacitance CG . For a given number of stages, the
oscillation frequency can be controlled by varying control
current or amplitude only since CG is a fixed parameter.
Control scheme by varying the current is commonly used.
Equation (4) gives an illustration that the oscillation frequency can be theoretically tuned for a wide range by changing the value of control current. However, it will not work
properly for a very small current since it is difficult to keep
matching between the values of the upper and lower control
currents when they are too small. In addition, the small
bias current will make the voltage swing slow.
VDD
Ictrl
Ictrl
Ictrl
N
Figure 3: Proposed voltage controlled ring oscillator.
Ictrl
Ictrl
oscillation frequency can be found as
Ictrl
VSS
fosc
N
Figure 1: Conventional voltage controlled ring oscillator.
VDD
Ictrl
CG
CG
GM
.
2N CG (1 + GM RV )
(7)
Equation (7) shows that the oscillation frequency depends
on the values of transconductance GM , resistance RV and
capacitance CG . However, GM and CG are device parameters and assumed to be constant. As a conclusion, the oscillation frequency can be controlled by changing the value of
RV . Theoretically, choosing a big value for RV will enable
the implementation of a ring oscillator with a low oscillation
frequency using small size devices and less stages.
Ictrl
IN
Ictrl
=
Ictrl
IN
OUT
OUT
Figure 4: Inverter circuit.
VSS
Figure 2: Delay approximation.
1/GM
RV
RV
VOUT
3. PROPOSED CIRCUIT
CG
VDD
CG
3.1 Basic Circuit
The proposed circuit scheme is shown in Fig.3. Here a variable resistor RV is added at the input terminal of each inverter. The inverter itself is made from PMOS and NMOS
transistors as is shown in Fig.4. The delay of each stage τp
can be calculated from Fig.5. Since the MOS transistors in
each inverter can be assumed as switches, it can be replaced
by a resistance 1/GM as is shown in Fig.5. If the transconductances GM s and parasitic capacitances CG s of NMOS
and PMOS transistors are equal, the delay of each inverter
stage τp then will be approximately
τp =
CG (1 + GM RV )
.
GM
(5)
For a very large RV such that GM RV 1, the delay will
be determined by the time constant of RV CG regardless of
the value of GM . Assuming RV = 0 will give
CG
,
τp =
GM
(6)
which is a delay for a simple inverter stage. Finally, the
Figure 5: Delay approximation.
3.2 Circuit Implementation
The proposed method is implemented in the circuit shown
in Fig.6. Here the variable resistance is implemented using
PMOS and NMOS transistors. Both types are required to
enable the full swing between power supplies. The overall
circuit is shown in Fig.7. Here the resistances of the MOS
transistors are controlled by their gate voltage. Choosing
a proper MOS transistor sizes will guarantee the matching
between transistors.
4. SIMULATION RESULTS
The simulation is performed using level 28, 0.6µm CMOS
process parameters. Circuits used in the simulation are
three-stage voltage controlled ring oscillators shown in Figs.8
and 9. The W/L ratios of the MOS transistors are shown
in Table 1. The power supply VDD for both circuits is 3V.
VDD
VP
M1
IN
M1
M1
M1
M2
M2
M2
M3
M3
M3
M4
M4
M4
OUT
Ictrl
VN
Ictrl
Figure 6: Circuit implementation of the inverter circuit.
M4
VP
OUT
Figure 8: Conventional three stages voltage controlled ring oscillator.
VN
Figure 7: Circuit implementation of the proposed
voltage controlled ring oscillator.
4.1 Transient Characteristics
Both transient simulation results of the conventional and
the proposed circuits are shown in Fig.10. The oscillation
frequency for both of them are set to 370MHz. The control
current Ictrl of the conventional circuit is 134µA while the
control voltage Vctrl of the proposed circuit is 3V.
Next, Fig.11 shows the transient simulation result of the proposed circuit when the control voltage is 1V. The oscillation
frequency is 6MHz. The control current of the conventional
circuit is 1.415µA for the same oscillation frequency. Here
the proposed circuit has a faster voltage swing than the conventional one for both high and low oscillation frequency. In
case of fosc = 6MHz, the rise/fall time (10% ∼ 90% of voltage swing) for the conventional and the proposed circuits are
32.1ns and 4.3ns respectively. Here the rise/fall time of the
proposed circuit is roughly 1/8 of the conventional circuit
for oscillation frequency of 6MHz.
Figure 12 shows the simulation result of the current dissipation of the proposed circuit for fosc = 6MHz. Here the
proposed circuit dissipates a large current in the transition of
the output voltage of each inverter. As a result, the proposed
circuit has a faster voltage swing than the conventional one.
4.2 F-V Characteristic
Simulation result of the f-v characteristic of the proposed
voltage controlled ring oscillator is shown in Fig.13. The
oscillation frequency for control voltage of 0.4V and 3V are
40Hz and 380MHz respectively. Here a frequency tuning
range from tens of hertz to hundreds of megahertz is obtained. In addition implementation of low frequency oscillator using small size devices is also possible.
Table 1: NMOS transistors W/L ratios
W/L[µm/µm]
W/L[µm/µm]
M1
3/0.6 Ma
9/0.6
M2
9/0.6 Mb
4.5/1.2
M3
4.5/1.2 Msp
3/0.6
M4
1.5/1.2 Msn
1.5/1.2
5. CONCLUSIONS
A new design of ring oscillator based VCO is proposed. The
proposed design allows implementation of a voltage controlled ring oscillator with wide tuning range and fast voltage swing. Simulation results show that the rise/fall time
of the proposed circuit is 1/8 of the conventional one for
oscillation frequency of 6MHz. The proposed circuit also
achieves a tuning range from 40Hz to 380MHz for control
voltage between 0.4V to 3V. Furthermore, the maximum
oscillation frequency of the proposed circuit depends on the
device sizes. Furthermore, the proposed circuit is applicable
for a lower supply voltage because of its simple structure.
Figure 13 shows that the proposed circuit has a linear in dB
charactertistic for control voltages less than 1V. This is because the MOST resistors are in the weak inversion region.
For control voltages bigger then 1V, the MOST resistors are
in the linear region and the oscillation frequency is increased
by 20MHz for 0.1V increment of control voltage. The experimental chip is still under development.
6. REFERENCES
[1] A.Hajimiri and T.H.Lee. The Design of Low Noise
Oscillators. Kluwer Academic Publishers, 1999.
[2] A.Rezayee and K.Martin. A three-stage coupled ring
oscillator with quadrature outputs. In Proceedings of
Int. Symp. on Circuits and Systems. IEEE, 2001.
[3] D.A.Johns and K.Martin. Analog Integrated
CircuitDesign. John Wiley and Sons, New York, 1997.
VDD
Vctrl
Msp
Ma
Msp
Ma
Msp
Ma
3
OUT
Msn
Mb
Vctrl
Figure 9: Proposed three stages voltage controlled
ring oscillator.
IVDD
2
100
1
Currents [uA]
Msn
Mb
Voltages [V]
Msn
Mb
0
proposed
3
0
VOUT
Voltages [V]
Time [s]
2
Figure 12: Current dissipation(fosc =6MHz).
1
0
conventional
344n 345n 346n 347n 348n 349n 350n 351n 352n 353n 354n
Time [s]
Figure 10: Transient characteristic(fosc =370MHz).
8
proposed
3
Voltages [V]
Frequency [Hz]
10
6
10
4
10
2
2
10
1
0.5
1
2
3
Vctrl [V]
0
Figure 13: F-V characteristic simulation results of
the proposed circuit.
conventional
41.3u
41.4u
41.5u
41.6u
41.7u
Time [s]
Figure 11: Transient characteristic(fosc =6MHz).