Download Introduction to IC Testing

Introduction to IC Testing
Testing Goals :
.Improve the reliability
.Save money in manufacturing
Types of Tests
(1) By testing purpose
. Characterization
. Production
. Burn –in
. Incoming inspection
(2) By manufacturing level
.wafer-in-process : on-line monitor
.wafer
: circuit probe (C.P.)
. Package
: final test (F.T.)
(3) By testing item
. Functional
. DC parameter
. AC parameter
(4) By process technology
. TTL
. NMOS
. CMOS
. BiCOMS
. GaAs
. Others
(5) By device type
. Digital : uP ,Gate array,ASIC
. Memory : Sram, Dram, Rom
. Analog : Power IC
. Mixed-Mode : ADC,DAC,Telcom
. Others : CCD ,LCD,
Test Items
(1) Functional test
. Truth table
. Algorithmic pattern generation
(2) DC parametric test
.Open and shorts
.Output drive/sink current (IOH,IOL)
. Leakage
. Power current
. Standby current
. Threshold levels( VIH,VIL)
(3) AC parametric test
. Propagation delays
. Setup and hold times
. functional speed
. Rise and fall times
. Jitter
Terms that Apply to the DUT
Input pin : A device pin that acts as a buffer
between external signals and the
internal logic of device
Output pin : A device pin that acts as a buffer
between the internal logic of a device
and the external signals
Tri-State : A device pin that acts as an output
pin but has the added capability of
turning off going to a high impedance
state
Power pin : A device pin that is connected to a
power supply or ground
Terms that Apply to the Test System
PE card : Circuit used to supply input
signals to the DUT and receive
output signals from the DUT
Drivers
: Circuit on the PE card which
supply logic 0 and logic 1 levels to
the DUT
Comparators : The circuitry located on the PE
card which sense the logic 0 and
logic 1 levels from the DUT
Signal
Format
PMU
DPS
: The wave shape of an input signal
supplied by the PE card driver
circuitry
: The Precision Measurement Unit
Which can ,
Force current measure voltage
Force voltage measure current
: The Device Power Supply
Which can ,
Force current measure voltage
Force voltage measure current
Supply voltage and current to the
Negative current
Source current
: Current flow from the DUT
into the tester
: When an output pin is in the
logic 1 state,it can supply
current from the DUT to the
tester
Positive current : Current flow from the tester
Sink current
: When an output pin is in the
logic o state,it can accept current
from the tester through the
device to the ground
Test Cycle : The time duration of one test
vector execution . The test cycle
is based on the operating
freqency of the DUT .
100ns=1/10MHZ ( SSE. L5710)
Tester Channel : Circuitry on the PE card
which applies and/or
process voltage,current and
timing for one DUT pin
Terms that Apply to Test parameters
VCC : The supply voltage of a TTL device
ICC : The current consumed by the circuitry of a
TTL device
VDD : The supply voltage of a MOS device
IDD : The current consumed by the circuitry of a
MOS device
IIH : Input Leakage High is the maximum
amount of current that is allowed to flow
into an input pin when a high voltage value
is forced onto the pin
IIL : Input Leakage Low is the maximum
amount of current that is allowed to flow
out of an input pin when a low voltage
value is forced onto the pin
VOH :
Voltage Out High is the voltage value
produced by an output when given an
logic 1
VOL :
Voltage Out Low is the voltage value
produced by an output when given an
logic 0
IOH :
Current Out High is the amount of current
that an output must source when driving a
logic 1
IOL :
Current Out Low is the amount of current
that an output must sink when driving a
logic 0
Actual Device Input Circuit ( IIL , IIH)
VDD
VDD
IIL leakage path
IIL
DUT
P MOS
INPUT
VSS
PIN
VDD
R ( ~ M ohm)
VSS
VDD
N MOS
IIH
R ( ~ M ohm)
IIH leakage path
VSS= 0V
Actual Device Output Circuit ( VOL /IOL)
VDD
VDD
SPEC.
IOL(MIN) =8.0MA
VOL(MAX)= 0.4V
R= E/I
OFF
E=VOL-VSS
R=0.4(V)/8(MA)
R=50 OHM(MAX)
Control
OFF
VOL
DUT
(1)
Output
IOL
Pin
ON
R
ON
IOL
VSS= 0V
E
The device output pins must sink at least a specified
IOL(MIN) =8.0MA
amount of current and stay in the correct logic state
VOL(MAX)= 0.4V
VDD
VDD
SPEC.
R= E/I
E=VOL-VSS
R=0.4(V)/8(MA)
R=50 OHM(MAX)
OFF
Control
OFF
When IOL= 8MA
0.40.320.48 VOL
DUT
(1)
Output
ON
Pin
50 40 60
E
ON
IOL
R
VSS= 0V
Actual Device Output Circuit ( VOH /IOH)
VDD(4.75V)
VDD
IOH
IOH
R
Control
(0)
ON
ON
E
VOH
DUT
Output
SPEC.
Pin
IOH(MIN) =-5.2MA
VOH(MAX)= 2.4V
OFF
OFF
R= E/I
E=VDD-VOH=4.75-2.4=2.35
VSS= 0V
R=2.35(V)/5.2(MA)
R=452 OHM(MAX)
Device Fanout Capability
TTL Output Spec
VOH=2.4V at-2.6mA
VOL=0.4V at 24.0mA
VOH =2.4V
2.6MA /150uA = 17.3 -->
17
VOL = 0.4 V
24 MA /0.8 MA= 30
TTL Output Spec
IIL=0.8mA at 0.4V
IIH=150A at 2.4V
Open Drain/Source Outputs
OPEN DRAIN : output can only drive low - they only sink current
OPEN SOURCE : output can only drive high - they only source current
VDD
D
G
VDD
External
Resistor
VDD
D
P MOS
Open Drain
Output
S
G
S
N MOS
Open Drain
Open Source
Output
Standard CMOS Cell
External
Resistor
Open Source
How to test a open drain device
VOH (2v)
IOL(~ 1uA)
VDD
D
G
External VOL(1v)
Resistor
D
Open Drain
Output
S
VCM(4V)
X
G
IOH
S
Gate X
1
0v
(L)
0
VCM(4V) (H)
How to test a open Source device
VDD
D
G
VDD
IOL
S
VCM(0.5V)
X
D
G
Open Source
Output
S
VOH (2v)
External
Resistor
VOL(1v)
IOH(~ 1uA)
Gate
X
0
VDD
1
VCM(0.5V)(L)
(H)
L5710 Pin Electronics Block Diagram
VIH
TO DUT
DCL
F_Ctrl
D_Ctrl
PMU
VIL
VOH
IOL
Cmp_Hi
L_Ctrl
IOH
VCM
Cmp_Lo
VOL
Truth table
pattern
A
B
/* AB */
0
1
1
0
* 0H *;
* 1L *;
Connect to DPS
VOH
VIH
VCC
7404
CMP_H
0/1
010101
A
B
HLHLHL
CMP_L
ON/OFF
GND
VIL
VOL
Connect to GND
A
TPDhl:Hi to Lo Propagation delay
B
TPDhl
TPDlh
TPDlh:Lo to Hi Propagation delay
VDD
(a) set up time
CLK
(b) hold time
DATA
DATA
OUT
IN
100 ns
2.0 V
(a)
CLK
(b)
0.8 V
2.0 V
DATA IN
DATA OUT
Valid Data in
0.8 V
2.4 V
0.4 V
T0
T0
0
T0
100ns 200ns
T0
T0
300ns
400ns
2.0 V
DATA IN
DATA IN
0.8 V
2.0 V
1
0
0
1
CLK
H
DATA OUT
Output strobe
L
L
0.8 V
2.0 V
0.8 V
L 2.4 V
0.4 V