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NCU Electrical Engineering Electronic Design Automation Laboratory 2017/5/6 National Central University Department of Electrical Engineering Electronic Design Automation Laboratory High-Level Power/Noise Estimation of VLSI Designs 劉建男 助理教授 Prof. Chien-Nan (Jimmy) Liu 國立中央大學 電機工程學系 Dept. of EE, National Central Univ. Email: [email protected] TEL: 03-4227151 ext:34534 http://www.ee.ncu.edu.tw/~jimmy Chien-Nan Liu NCU Electrical Engineering Electronic Design Automation Laboratory Who am I ??? Education: 1996/9-2001/5: MS & PHD of National Chiao Tung Univ, Taiwan (advisor: Prof. Jing-Yang Jou) 1992/9-1996/6: BS of Dept. of EE, NCTU, Taiwan Join Dept. of EE, Nat’l Central Univ. after graduate (from 2001/8) Group members: 9 Ph.D, 11 master Research interests: VLSI/CAD on 2017/5/6 Functional verification Verification of system-level integration Behavioral modeling of digital/analog circuits High-level power/current modeling Chien-Nan Liu NCU Electrical Engineering Electronic Design Automation Laboratory What is CAD ? CAD = Computer-Aided Design Exist everywhere in the whole design flow EDA = Electronic Design Automation CAD for electronic industry Typically, more than 50% design time is elapsed on running CAD tools CAD research falls between design (hardware) and programming (software) Require knowledge from both parts Methodology (thinking) + program (implementation) 2017/5/6 Chien-Nan Liu NCU Electrical Engineering Electronic Design Automation Laboratory 2017/5/6 Outline Introduction High-Level Power Modeling High-Level Current Waveform Modeling Conclusion Chien-Nan Liu 1000 Transistors (MT) NCU Electrical Engineering Electronic Design Automation Laboratory Moore’s Law in Microprocessors 2X growth in 1.96 years! 100 10 486 1 386 286 0.1 0.01 P6 Pentium® proc 8086 8080 8008 4004 8085 0.001 1970 1980 1990 Year 2000 2010 Transistors on Lead Microprocessors double every 2 years Source: Courtesy, Intel 2017/5/6 Chien-Nan Liu 4004 386 NCU Electrical Engineering Electronic Design Automation Laboratory Chien-Nan Liu 2017/5/6 The Dies of Intel CPUs Pentium Pro NCU Electrical Engineering Electronic Design Automation Laboratory Trends of VLSI Design Reference : www.doulos.com 2017/5/6 Chien-Nan Liu NCU Electrical Engineering Electronic Design Automation Laboratory 2017/5/6 What is SoC? System-on-Chip An IC that integrates the major functional elements of a complete end-product into a single chip Chien-Nan Liu NCU Electrical Engineering Electronic Design Automation Laboratory Scanner on a Chip National Semiconductor IEEE Spectrum Jan. 1999, p.57 2017/5/6 Chien-Nan Liu NCU Electrical Engineering Electronic Design Automation Laboratory Chien-Nan Liu 2017/5/6 Design Methodology Transition 10000 Power Density (W/cm2) NCU Electrical Engineering Electronic Design Automation Laboratory Power Density 1000 100 Rocket Nozzle Nuclear Reactor 8086 Hot Plate 10 4004 P6 8008 8085 Pentium® proc 386 286 486 8080 1 1970 1980 1990 2000 2010 Year Power density is getting higher and higher !! Source: Courtesy, Intel 2017/5/6 Chien-Nan Liu NCU Electrical Engineering Electronic Design Automation Laboratory Why Power Estimation ? Design space has been moved from 2-D (Area/Delay) to 3-D (Area-Delay-Power) Objectives Verify the power dissipation requirements Can be used during the circuit, logic and high-level synthesis to make trade-off between power and other design parameters • Area, performance, noise margin, … Power estimation tools are essential Exploit the potential to reduce power by design techniques • An analysis of the expected power dissipation of a particular design alternative has to be made Identify other power related design problems • Reliability, Hot spot detection, Electromigration, Voltage drops, Package selection 2017/5/6 Chien-Nan Liu NCU Electrical Engineering Electronic Design Automation Laboratory 2017/5/6 Noise Problems Must be checked for signal integrity (SI) problems before manufacturing Noise from crosstalk: victim aggressor victim delay increase IR-drop is also an serious problem due to large peak current I , Vdd, actual ↓ Chien-Nan Liu setup violations NCU Electrical Engineering Electronic Design Automation Laboratory 2017/5/6 SSN (Simultaneous Switch Noise) When logic gates turn on at the same time, power supply can generate large currents that introduce SSN. The SSN estimation can be divided into two parts, current waveform and pad model. current CVDD LVDD CL CVSS Chien-Nan Liu LVSS Potential for Power Savings NCU Electrical Engineering Electronic Design Automation Laboratory More Impacts at Higher Levels 400% 50% 20% Behavioral RTL Gate 10% Switch Accuracy of Power Estimation 2017/5/6 Chien-Nan Liu NCU Electrical Engineering Electronic Design Automation Laboratory Target SOC Analysis Platform circuit netlist noise/power aware cell library 2017/5/6 cell noise model input vectors Macro / IP database macro noise model full chip power & noise analysis platform cell power model macro power model power noise Chien-Nan Liu NCU Electrical Engineering Electronic Design Automation Laboratory 2017/5/6 Bottom-Up Power & Current Model Estimated Power Consumption & Current Waveform High-Level (Behavior, RTL) logic synthesis power model current model Gate-Level physical synthesis simulation Transistor-Level Chien-Nan Liu Model Characterization Real Power Consumption & Current Waveform NCU Electrical Engineering Electronic Design Automation Laboratory 2017/5/6 Outline Introduction High-Level Power Modeling Traditional Power Modeling Our Neural Power Model High-Level Current Waveform Modeling Conclusion Chien-Nan Liu NCU Electrical Engineering Electronic Design Automation Laboratory Power Dissipation Leakage power Static dissipation due to leakage current Typically a smaller value compared to other power dissipation Getting larger and larger in deep-submicron process Short-circuit power Due to the short-circuit current when both PMOS and NMOS are open during transition Typically a smaller value compared to dynamic power Dynamic power VDD Charge and discharge of a load capacitor Usually the major part of total power consumption Vin • Energy per switch 1 2 E CVDD 2 2017/5/6 Vout GND Chien-Nan Liu NCU Electrical Engineering Electronic Design Automation Laboratory Traditional Power Modeling (1/2) Look-Up Table (LUT) is the most popular method Straight-forward idea Easy to use Number of possible input transitions for an n-input combinational circuit is 22n Impractical to stored the whole input transitions in a table Solution • Use probability measurements liked P(xi), D(xi), etc. … P: signal probability D: transition density 2017/5/6 Chien-Nan Liu NCU Electrical Engineering Electronic Design Automation Laboratory Traditional Power Modeling (2/2) Some approaches use equations instead of LUT Power = C1*Pin+C2*Din+C3*Dout+C4*Pin*Din+ … Use linear regression to find out the parameters that form the equation Less data to be recorded than LUT Hard to use only a single equation to describe the irregular power distribution curve To improve the accuracy, they may Increase the order of the power equations Increase the number of power equations Become more and more complex in large designs 2017/5/6 Chien-Nan Liu NCU Electrical Engineering Electronic Design Automation Laboratory Challenges in Sequential Circuits Strong correlations often exist in the input sequence Temporal correlation: relationship between consecutive vectors Internal state “unknown” problem Existing method : Solve Chapman-Kolmogorov equations 2017/5/6 Compute the state probabilities in steady state Take a probability distribution over the states of the Markov chain at time t and compute the probability distribution at time t+1 • Not real enough !! Chien-Nan Liu NCU Electrical Engineering Electronic Design Automation Laboratory Our Key Ideas Use neural network concept instead of LUT Learn the relationship between input/output signal statistics and corresponding power Fit the non-linear power curves more easily Recurrent neural networks (RNNs) Elman neural network with internal feedback path Can handle temporal correlations of sequential circuits Low complexity, high accuracy 2017/5/6 Can be extended to large designs Chien-Nan Liu Mathematical model Simulate the biological neural network Composed of weights (W) and bias (b) matrices Neuron (神經元) 神經樹 神經核 神經軸 神經節 P1 P2 w1,1 Applications: n Σ P3 … … NCU Electrical Engineering Electronic Design Automation Laboratory Neural Network (NN) w1,R b PR Classification, clustering, pattern recognition, non-linear systems modeling, etc. 2017/5/6 Chien-Nan Liu f y=f(Wp+b) y NCU Electrical Engineering Electronic Design Automation Laboratory The Operation of NN Learning Phase Recalling Phase Input (Training Input) Input Neural Network Neural Network W Expected Output (Training Target) Error Function Output 2017/5/6 Chien-Nan Liu NCU Electrical Engineering Electronic Design Automation Laboratory Proposed Construction Flow Building network Parameter Selection Input Sequence Setting Hidden Neuron Number Transistor-level simulation Generation Statistic Analysis Training Sets T Building Neural Network No Functional Simulation Training Neural Network (1 iteration) Yes Iteration > Limit? No Network training ? Yes DONE 2017/5/6 Satisfy Error Requirement Chien-Nan Liu Training set generation NCU Electrical Engineering Electronic Design Automation Laboratory Input Data Type An example of the signal transition statistics Input vectors MSB Corresponding output vectors LSB Timei 0 0 0 1 1 1 0 1 0 1 Timei+1 1 0 1 0 1 0 1 0 1 1 TI00 1/10 TI01 4/10 TI10 3/10 TI11 2/10 TI00=0.1, TI01=0.4, TI10=0.3, TI11=0.2 TI TO 2017/5/6 MSB LSB Timei 0 1 0 1 1 0 1 1 0 0 Timei+1 0 1 1 0 1 1 0 1 1 1 TO00 1/10 TO01 4/10 TO10 2/10 TO11 3/10 TO00=0.1, TO01=0.4, TO10=0.2, TO11=0.3 0.1 0.4 0.3 0.2 0.1 0.4 0.2 0.3 Estimated power consumption Chien-Nan Liu NCU Electrical Engineering Electronic Design Automation Laboratory Power Estimation with Trained NN For a test sequence with m pattern-pair 2017/5/6 Transition Analysis Input Patterns / Expected Outputs Trained Neural Network Signal Transition Vectors 1/m Average Power Accumulated Outputs Chien-Nan Liu NCU Electrical Engineering Electronic Design Automation Laboratory Experiments Setup Circuits ISCAS’89 benchmark + one real design (*FMP) 0.35um cell library Golden simulation results PowerMill Neural network implementation Use built-in functions of MATLAB Run on Intel P-IV 2.4GHz with 1G RAM *FMP: Forward Matrices Processor 2017/5/6 Chien-Nan Liu NCU Electrical Engineering Electronic Design Automation Laboratory Experimental Results (1/3) # of input pins # of output pins gate count Neurons in Hidden Layer |W| Construction time (s) S344 9 11 160 9 91 119 S349 9 11 161 10 101 907.5 S386 7 7 159 7 71 447.9 S641 35 24 379 9 91 839.6 S713 35 23 393 10 101 168.8 S1196 14 14 529 10 101 1028.5 S1238 14 14 508 7 71 451.3 S1423 17 5 657 10 101 919.7 S1488 8 19 653 7 71 457.2 S1494 8 19 647 8 81 542.5 FMP 144 104 8,200 10 101 906.75 8.8 89.2 617.2 Average 2017/5/6 Chien-Nan Liu NCU Electrical Engineering Electronic Design Automation Laboratory Experimental Results (2/3) 3D-LUT Power Model Neural-Based Power Model Max Avg Std Max Avg Std S344 -100 13.62 23.8 -3.7 1.2 1.03 S349 -13.09 3.62 3.46 4.63 1.11 0.87 S386 -29.44 4.74 5.82 -33.2 9.09 6.4 S641 -7.72 1.22 1.42 -11.8 4.2 3.3 S713 -9.02 1.34 1.62 7.36 2.62 2.17 S1196 -11.19 2.05 2.27 -13.8 4.2 3.19 S1238 -10.85 2.28 2.37 -13.6 4.81 3.91 S1423 -19.26 2.42 3.36 -19.1 6.44 5.29 S1488 -70.99 12.14 16.58 -31.6 9.34 6.79 S1494 -81.09 18.13 21.28 9.04 1.92 1.47 FMP 6.35 1.17 1.55 -7.26 1.87 1.46 Average 32.64 5.7 7.59 14.1 4.25 3.26 length of test sequences: 500 pattern-pair 2017/5/6 Chien-Nan Liu NCU Electrical Engineering Electronic Design Automation Laboratory 2017/5/6 Experimental Results (3/3) Table-Based max. Err: 32.64% avg. Err: 5.70% Std: 7.59% Neural-Based max. Err: 14.10% avg. Err: 4.25% Std: 3.26% length of test sequences: 1,000 pattern-pairs Smaller variation for different cases (std: standard variation) Smaller size than look-up table Competitive accuracy on average Chien-Nan Liu NCU Electrical Engineering Electronic Design Automation Laboratory Compared to LUT Memory Overhead LUT based • ex: 10*10*10/2 entries (In 3-D table, interval size=0.1 of each dimension) NN based • Only have to store 2 matrixes. (< 100 floating point numbers) Construction Time LUT based • Need a lot of time to build the table NN based • In our experiment, it only cost less than 30 min. to build our model. (ISCAS’89) 2017/5/6 Chien-Nan Liu NCU Electrical Engineering Electronic Design Automation Laboratory 2017/5/6 Summary: Power Estimation We propose a novel power model for sequential circuits Use the learning capability of neural networks Can be used at behavior level (only need input/output info.) Can be extended to large circuits with low complexity High efficiency and accuracy even for short sequences References: Wen-Tsan Hsieh, Chih-Chieh Shiue, and Chien-Nan Jimmy Liu, “A Novel Approach for High-Level Power Modeling of Sequential Circuits Using Recurrent Neural Networks”, IEEE International Symposium on Circuit and Systems (EI), pp. 3591-3594, May 2005. Wen-Tsan Hsieh, Chih-Chieh Shiue, and Chien-Nan Jimmy Liu, “Efficient Power Modeling Approach of Sequential Circuits Using Recurrent Neural Networks”, IEE Proceedings - Computers and Digital Techniques (SCI, EI), vol. 153, no. 2, pp. 78-86, March 2006. Chien-Nan Liu NCU Electrical Engineering Electronic Design Automation Laboratory 2017/5/6 Outline Introduction High-Level Power Modeling High-Level Current Waveform Modeling Gate-level current waveform estimation using existing information Macro-level current waveform estimation using neural network Conclusion Chien-Nan Liu NCU Electrical Engineering Electronic Design Automation Laboratory 2017/5/6 Existing Waveform Estimation Tool Timing unit is user defined Max power is depend on timing unit (E=P*t) Limited by the library file format (.LIB) Not suitable to calculate Pmax Chien-Nan Liu NCU Electrical Engineering Electronic Design Automation Laboratory 2017/5/6 .LIB Format The most popular library format Single input / single output pair 2D table (input transition time, output load) rise time , fall time , propagation delay rise power, fall power ttran index_1 ("0.0500, 0.1000, 0.4000, 0.9000, 1.4000, 2.0000, 3.0000"); index_2 ("0.00180, 0.09000, 0.18000, 0.45000, 0.81000, 1.17000, 1.53000"); values ( \ CL "0.0315, 0.2730, 0.5264, 1.2880, 2.3030, 3.3180, 4.3330", \ "0.0445, 0.2744, 0.5264, 1.2880, 2.3030, 3.3180, 4.3330", \ "0.1103, 0.3311, 0.5567, 1.2900, 2.3030, 3.3180, 4.3330", \ "0.2074, 0.4773, 0.6792, 1.3530, 2.3210, 3.3200, 4.3330", \ "0.2974, 0.6122, 0.8277, 1.4580, 2.3860, 3.3560, 4.3460", \ "0.4021, 0.7646, 1.0000, 1.6130, 2.4980, 3.4370, 4.4030", "0.5770, 1.0020, 1.2660, 1.9040, 2.7340, 3.6260, 4.5550"); Chien-Nan Liu NCU Electrical Engineering Electronic Design Automation Laboratory 2017/5/6 Our Key Ideas Assume triangular waveforms for basic gates Most of the current waveforms are similar to a triangle. A reasonable assumption that simplifies the current waveform problems. Use existing .lib information Advanced library format for current waveform is not standardized and not supported by many tools. Use some simple calculation to generate the current waveform from existing timing and power information stored in .lib files. Do not require additional circuit characterization efforts. Easier to be integrated with current EDA tools. Chien-Nan Liu NCU Electrical Engineering Electronic Design Automation Laboratory Triangular Waveform Base: Is+Ic_internal T0 is start time of current waveform. T2 is end time of current waveform. Position: T1 is position of maximum current happened. CL Height: Imax is value of maximum current. T0 Base? T1 Imax Height? 2017/5/6 Ic_load T2 t Position? I Chien-Nan Liu NCU Electrical Engineering Electronic Design Automation Laboratory Voltage Waveform Rebuild Use piece-wise-linear voltage waveform to simplify the voltage waveform tr:Rise time(ns) : output 10%vdd ~ output 90%vdd tf:Fall time(ns) : output 90%vdd ~ output 10%vdd td:Delay time(ns) : input 50%vdd ~ output 50%vdd tin:Input transition time(ns) : input 0%vdd~input 100%vdd 5 tr 8 vin ttran 2 2017/5/6 5 tr 8 vout ttran 2 Chien-Nan Liu ½tr = 50% ~ 90% T(50%~100%) = ½tr*5/4 =5/8tr NCU Electrical Engineering Electronic Design Automation Laboratory Definition of Base Width (Rise) T0 = -{(VDD/2−vt)/VDD}×Tin (PMOS turn on) T(vt to ½Vdd), where Tin is 0 to Vdd T2=td + (5/8)tr (CL charge to vdd) Delay Time + Time of (Vout=50%~100) td (5/8)tr Vin VDD-Vt (1/2)VDD 0 T0 T2 t The transition point of logic simulation (½Vdd) i 2017/5/6 Vout Chien-Nan Liu NCU Electrical Engineering Electronic Design Automation Laboratory Definition of Position (Rise) VSD > VSG – Vt VDG =< Vt When Vout(Vd) – Vin(Vg) = Vt You got it !! vdd vdd vdd 5 [t (td tr )] ( t ) vt 8 2 ttran (5/4)tr Equation of Vout vin t Equation of Vin vout Vt Pmos C Nmos Vin L S vdd-vt td-(5/8)tr 2017/5/6 L S Vout vt vt Chien-Nan Liu C vt Imax NCU Electrical Engineering Electronic Design Automation Laboratory 2017/5/6 Definition of Height (Rise) T Q Ipeak Is+Ic_internal Energy Q Ipeak Q P I avgV V .lib store T P T Qint V rise Ic_load CL rise_ power Total charge = Qint + CL vdd 1 T I peak 2 Internal Output energy loading Known Chien-Nan Liu NCU Electrical Engineering Electronic Design Automation Laboratory Experimental Result - clkinvx3 Input transition time = 0.9ns ; Output loading = 0.18pF 2017/5/6 (Rise) HSPICE Our method Chien-Nan Liu NCU Electrical Engineering Electronic Design Automation Laboratory Experiment (C17) ISCAS85:c17 Observe @ 24ns~26ns ttran=0.1ns A A B 1 CL=0.0076pF 1 1 1 E A C 2 0 4 1 out1 5 D E 3 E out2 6 CL=0.0006pF ttran=0.4ns VDD Waveform=Combine the current waveform from each gate 2017/5/6 Chien-Nan Liu 25ns~26.2ns C1 7 Po w e r Su p p ly Cu rre n t Wa v e fo rm 5.00E-05 0.00E+00 25.024 -5.00E-05 25.312 25.6 25.888 26.176 -1.00E-04 -1.50E-04 Current NCU Electrical Engineering Electronic Design Automation Laboratory Experimental Result (C17) Our Method -2.00E-04 Hspice -2.50E-04 -3.00E-04 -3.50E-04 -4.00E-04 -4.50E-04 2017/5/6 Time Chien-Nan Liu NCU Electrical Engineering Electronic Design Automation Laboratory Automation Flow Verilog Netlist Construct Netlist Structure Input Transition Time Output Loading Initial Input and Output Situation Value Changed Dump Generate Triangle Waveform (Base Position Height) .lib information Plot Waveform Waveform (.out) 2017/5/6 Chien-Nan Liu SPICE Our Method NCU Electrical Engineering Electronic Design Automation Laboratory Chien-Nan Liu 2017/5/6 SPICE vs Our Method Case: C432 NCU Electrical Engineering Electronic Design Automation Laboratory Experimental Results Er(imax) Er(pos) Corr C17 17.2786% 5ps 0.9584 C432 14.2248% 7.8776ps 0.9681 C499 7.1979% 2.9184ps 0.9889 C880 5.9526% 9.7755ps 0.9878 C1355 8.8771% 7.8163ps 0.9837 C1908 5.4637% 5.3673ps 0.9930 Er(imax): Peak Value Error Percentage Er(pos): Peak Value Position Error Corr: Correlation 2017/5/6 Chien-Nan Liu NCU Electrical Engineering Electronic Design Automation Laboratory 2017/5/6 Summary of Gate-Level Method Develop an analytic approach for current waveform estimation Focus on gate-level simulation first Using existing library information Can improve current EDA tool Chien-Nan Liu NCU Electrical Engineering Electronic Design Automation Laboratory 2017/5/6 Outline Introduction High-Level Power Modeling High-Level Current Waveform Modeling Gate-level current waveform estimation using existing information Macro-level current waveform estimation using neural network Conclusion Chien-Nan Liu NCU Electrical Engineering Electronic Design Automation Laboratory Motivation Gate-level power/current estimation is the primary approach in existing tools For block-based designs (e.g. protected IP), you may not have the internal information, like the gate-level netlist Only functional information (inputs/outputs) is available We target to provide a high-level model that only need “Inputs/Outputs” to estimate the current waveform Internal circuit information is only required at the characterization process Providing such current waveform model and functional model will not explore the internal info. to customers Suitable for IP protection 2017/5/6 Chien-Nan Liu NCU Electrical Engineering Electronic Design Automation Laboratory Existing High-Level Method (1/2) Transform the current waveform from time domain to frequency domain by DCT (discrete cosine transform) Regression Four parameters: • • • • Decay factor D(k) Amplitude A Frequency ω DC value I(0) Bodapati, S.; Najm, F.N.;” High-Level current macro model for logic blocks”, Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on Vol. 25, Issue 5, pp.837 – 855, May 2006. Partition input vector pairs to several groups by hamming distance Construct a model for each group Drawback Choose template by logic block and hamming distance (not precise) Too many models for a circuit (how much is enough?) Lack of delay information (not accurate) 2017/5/6 Chien-Nan Liu NCU Electrical Engineering Electronic Design Automation Laboratory Existing High-Level Method (2/2) Same hamming distance can cause different results. Hamming Distance cannot separate different kinds waveforms very well due to different internal delays hd=4 ※ Hamming Distance (hd) = number of changed inputs 2017/5/6 Chien-Nan Liu hd=4 NCU Electrical Engineering Electronic Design Automation Laboratory Our Key Ideas Levelize The arrival time of each gate will become more similar in a level Can consider the delay information May be easier to model the relationship between input transition status and current waveform Level 1 0 0 1 0 1 0 0 2017/5/6 Chien-Nan Liu Level 2 2 2 Level 3 NCU Electrical Engineering Electronic Design Automation Laboratory Neural Network Training We still use Neural Network to build our model Step 1: LILO model of each level Training input: Encoded primary input Training target: Each level LILO Step 2: VDD model of each level Training input: Each level LILO and previous level LI Training target: Each level current waveform Primy Input 1 Primy Input 2 Primy Input 3 LILO Model of Each Level 2017/5/6 LILO’ LILO’ LILO’ 1 2 3 VDD’ VDD’ VDD’ VDD Waveform VDD Model of Each Level Chien-Nan Liu Why LILO Model ?? We want to use only “Primy Input” to estimate the transition status of each internal level NCU Electrical Engineering Electronic Design Automation Laboratory Construction Flow Verilog Code of Circuit Levelize Input Pattern Generation Getting Current Waveform by SPICE Simulation Getting Value of Each Node by Verilog Simulation Dumping Current Waveform Merging Input and Output Training DONE !! 2017/5/6 Chien-Nan Liu NCU Electrical Engineering Electronic Design Automation Laboratory Waveform Comparison (1/2) c880 2017/5/6 Level 1 Level 2 Level 3 Level 4 Level 5 Level 6 Chien-Nan Liu NCU Electrical Engineering Electronic Design Automation Laboratory 2017/5/6 Waveform Comparison (2/2) Combine all waveforms from each level !! c880 Total Vdd Waveform Chien-Nan Liu NCU Electrical Engineering Electronic Design Automation Laboratory Chien-Nan Liu 2017/5/6 Waveforms with Different Shapes NCU Electrical Engineering Electronic Design Automation Laboratory Experimental Results c17 4bits Adder cu c432 c880 #I 5 8 14 36 60 #O 2 5 11 7 26 #cell 6 21 52 86 306 #Level 3 4 4 5 6 #train 724 3000 5000 5000 5000 #test 724 12000 20000 20000 20000 ep,avg (%) 10.62 19.84 16.84 18.85 23.88 ep,std(%) 7.79 15.79 11.87 14.69 17.90 et,avg(%) 2.49 3.77 3.93 4.48 2.39 et,std(%) 4.39 4.37 3.75 7.25 7.57 edi/dt,avg (%) 18.57 29.58 20.71 23.56 26.91 edi/dt,std (%) 13.61 23.06 15.43 23.31 27.94 Corravg 0.98 0.92 0.96 0.90 0.93 avg : average e : error std : standard deviation p : peak 2017/5/6 Chien-Nan Liu t : where peak occur Corr : correlation NCU Electrical Engineering Electronic Design Automation Laboratory 2017/5/6 Summary of Macro-Level Method We propose a high level current model Used at high-level (only require input/output info.) • Convenient to use • Efficient computation • Feasible for IP protection Constructed by neural network Only a single model for one logic block Can estimate the waveforms with different shapes Chien-Nan Liu NCU Electrical Engineering Electronic Design Automation Laboratory 2017/5/6 Conclusions 工欲善其事 必先利其器 !! SoC is really a big challenge for IC designers Power and Noise are two major challenges Doing the things earlier can have higher impacts More powerful tools are essential to solve those difficult design problems EDA – Where Electronics Begins Welcome to join MOE CAD contest http://www.ee.ncu.edu.tw/~cad_contest Chien-Nan Liu