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Topic Code: Perpendicular Spin Orbit Torque Magnetic Random Access Memories Jean-Pierre Nozières2, Gilles Gaudin1,2, Marc Drouard1,2, Ioan-Mihai Miron1, Olivier Boulle1, M. Cubukcu1, C. Hamelin1, N. Mikuszeit1, T. Brächer1, N. Lamard3, M.-C Cyrille3, L. Buda-Prejbeanu1, K. Garello4, P. Gambardella4, J. Langer5, B. Ocker5, 1 SPINTEC, CEA-INAC/CNRS/Univ. Grenoble Alpes, 38054 Grenoble, France, Grenoble, France. 2 Antaïos, F-38000, Grenoble, France, 3 CEA Leti, F-38000, Grenoble, France 4 Department of Materials, ETH Zurich, Hönggerbergring 64, CH-8093 Zürich, Switzerland 5 Singulus Technologies, Hanauer Landstr, 103, 63796, Kahl am Main, Germany [email protected] Abstract: Spin-Orbit Torque memory technology offers the promise of SRAM-speed with Flash non-volatility, e.g. the capability to preserve data when power is turned off. There remains however a number of roadblocks to be removed before the technology can be deemed to be ready for industrialization. We review here the latest developments of SOT materials for magnetic field-free fast switching in perpendicular SOT bit cells. Advanced processors require large amounts of memory to save programs and data on-the-fly. There is however a huge latency gap between the processor, clocked at multi-GHz, and the main working memory (aka. DRAM), which operates at 100s of MHZ at best. The result is a a complex memory hierarchy, involving multiple levels of memory cache (aka. SRAM) and a complex data management. A memory technology that would be fast enough to be embedded within the processor core, yet dense enough to offer increased on-chip capacity would be a major step forward. If such can memory can have the added benefit of being non-volatile to retain data when the power is turned off, then it is becoming close to the holy grail of memory technology. Recently, we have proposed a novel memory concept, named Spin-Orbit Torque Magnetic Random Access Memory (SOT-MRAM) [1,2,3], that combines the advantages of MRAM as an emerging non-volatile memory technology, with a writing speed in the deep sub-ns regime [4], compatible with the processor multi-GHz frequency. Besides, unlike existing current MRAM technologies, there is no write current (e.g. voltage stress) flowing through the memory cell itself, resulting in a truly infinite endurance. Moreover, read and write can now be separately optimized to achieve higher read speed, improved reliability and greater process margins. Finally, with a similar core technology (materials, process) as the recently developed STT-MRAM, one can expect an easy path to industrialization. Bit-cell level proof of concept was performed using state-of-the-art magnetic tunnel junctions using (magnetically) perpendicular Ta/FeCoB/MgO materials stack [3]. The basic write (e.g. switching) and read (e.g. signal detection through Tunnel Magneto-Resistance signal) operations have therein been demonstrated in 100nm magnetic dots with current pulse width down to 50ns. We then demonstrated that deterministic bipolar switching can be achieved using sub-500ps current pulses, with a linear scaling of the critical current Ic on pulse width p as 1/p [4]. Micromagnetic simulations show that the reversal process is governed by a nucleation / propagation process, with domain nucleation at the edge of the dot. Fast switching of perpendicularly magnetized bit cells, however, implies the presence of a static in-plane magnetic field, in order to break the symmetry between the final up (logic “1”) and down (logic “0”) states. Getting rid of this external magnetic field is a prerequisite for memory applications. Several alternative have been proposed to trigger fast switching in the absence of an external magnetic field, amongst which using non symmetric shapes of the magnetic dot. Preliminary studies have shown that such approach is indeed extremely efficient, yet final refinements will be required in order to match product implementation constraints. Provided that solutions for field-less switching can be implemented in “real” devices, SOT MRAM will be king for applications where speed and endurance are key, such as cache memories in high end Micro Processor Units, from processor cores in PC and servers, to advanced System-On-Chip in mobile applications (tablets, cell phones, ...), replacing SRAM at a lower cost (e.g. silicon area) with the added value of non-volatility (e.g. zero standby power). [1] G. Gaudin, I. M. Miron, P. Gambardella, and A. Schuhl, Patents US12/899,072; US12/899,091; US12/959,980 [2] I. M. Miron et al. , Nature 476, 189-193 (2011). [3] M. Cubukcu et al., Appl. Phys. Lett. 104, 042406 (2014) [4] K. Garello et al., Appl. Phys. Lett. 105, 212402 (2014)