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Product Folder Sample & Buy Support & Community Tools & Software Technical Documents TAS5630B SLES217D – NOVEMBER 2010 – REVISED MARCH 2015 TAS5630B 300-W Stereo and 400-W Mono PurePath™ HD Analog-Input Power Stage 1 Features 3 Description • The TAS5630B device is a high-performance analoginput class-D amplifier with integrated closed-loop feedback technology (known as PurePath HD technology) with the ability to drive up to 300 W (1) stereo into 4-Ω to 8-Ω speakers from a single 50-V supply. 1 • • • • • • PurePath™ HD Enabled Integrated Feedback Provides: – Signal Bandwidth up to 80 kHz for HighFrequency Content From HD Sources – Ultralow 0.03% THD at 1 W into 4 Ω – Flat THD at All Frequencies for Natural Sound – 80-dB PSRR (BTL, No Input Signal) – > 100-dB (A-weighted) SNR – Click- and Pop-Free Start-up Multiple Configurations Possible on the Same PCB With Stuffing Options: – Mono Parallel Bridge-Tied Load (PBTL) – Stereo Bridge-Tied Load (BTL) – 2.1 Single-Ended Stereo Pair and BTL Subwoofer – Quad Single-Ended Outputs Total Output Power at 10% THD+N – 400 W in Mono PBTL Configuration – 300 W per Channel in Stereo BTL Configuration – 145 W per Channel in Quad Single-Ended Configuration High-Efficiency Power Stage (> 88%) With 60-mΩ Output MOSFETs Two Thermally Enhanced Package Options: – PHD (64-Pin QFP) – DKD (44-Pin PSOP3) Self-Protection Design (Including Undervoltage, Overtemperature, Clipping, and Short-Circuit Protection) With Error Reporting EMI Compliant When Used With Recommended System Design PurePath HD technology enables traditional ABamplifier performance (< 0.03% THD) levels while providing the power efficiency of traditional class-D amplifiers. Unlike traditional class-D amplifiers, the distortion curve does not increase until the output levels move into clipping. PurePath HD technology enables lower idle losses, making the device even more efficient. When coupled with TI’s class-G power-supply reference design for TAS563x, industry-leading levels of efficiency can be achieved. Device Information(1) PART NUMBER TAS5630B Mini Combo System AV Receivers DVD Receivers Active Speakers BODY SIZE (NOM) HSSOP (44) 15.90 mm × 11.00 mm HTQFP (64) 14.00 mm × 14.00 mm (1) For all available packages, see the orderable addendum at the end of the data sheet. Typical TAS5630B Application Block Diagram 3 ´ OPA1632 ♫♪ TM ANALOG AUDIO INPUT PurePath HD TAS5630B (2.1 Configuration) ♫♪ ♫♪ ±15 V 12 V 25 V–50 V TM PurePath HD Class-G Power Supply Ref. Design 2 Applications • • • • PACKAGE 110 VAC ® 240 VAC (1) Achievable output power levels are dependent on the thermal configuration of the target application. A high-performance thermal interface material between the exposed package heat slug and the heat sink should be used to achieve high output power levels. 1 An IMPORTANT NOTICE at the end of this data sheet addresses availability, warranty, changes, use in safety-critical applications, intellectual property matters and other important disclaimers. PRODUCTION DATA. TAS5630B SLES217D – NOVEMBER 2010 – REVISED MARCH 2015 www.ti.com Table of Contents 1 2 3 4 5 6 Features .................................................................. Applications ........................................................... Description ............................................................. Revision History..................................................... Pin Configuration and Functions ......................... Specifications......................................................... 6.1 6.2 6.3 6.4 6.5 6.6 6.7 6.8 6.9 7 1 1 1 2 4 7 Absolute Maximum Ratings ...................................... 7 ESD Ratings.............................................................. 7 Recommended Operating Conditions....................... 7 Thermal Information .................................................. 8 Electrical Characteristics........................................... 8 Audio Characteristics (BTL) .................................... 10 Audio Specification (Single-Ended Output) ............ 10 Audio Specification (PBTL) .................................... 11 Typical Characteristics ............................................ 11 Detailed Description ............................................ 14 7.1 7.2 7.3 7.4 8 Overview ................................................................. Functional Block Diagram ....................................... Feature Description................................................. Device Functional Modes........................................ 14 14 15 18 Application and Implementation ........................ 19 8.1 Application Information............................................ 19 8.2 Typical Application .................................................. 20 9 Power Supply Recommendations...................... 27 10 Layout................................................................... 27 10.1 Layout Guidelines ................................................. 27 10.2 Layout Example .................................................... 28 11 Device and Documentation Support ................. 30 11.1 Trademarks ........................................................... 30 11.2 Electrostatic Discharge Caution ............................ 30 11.3 Glossary ................................................................ 30 12 Mechanical, Packaging, and Orderable Information ........................................................... 30 4 Revision History Changes from Revision C (September 2012) to Revision D Page • Added Pin Configuration and Functions section, ESD Ratings table, Feature Description section, Device Functional Modes, Application and Implementation section, Power Supply Recommendations section, Layout section, Device and Documentation Support section, and Mechanical, Packaging, and Orderable Information section .............................. 1 • Changed Thermal Information table data. .............................................................................................................................. 8 Changes from Revision B (November 2011) to Revision C Page • Changed Analog comparator reference node, VI_CM Vlaues From: MIN = 1.5 TYP = 1.75 MAX = 1.9 To: MIN = 1.75 TYP = 2 MAX = 2.15 ...................................................................................................................................................... 8 • Changed ANALOG INPUTS - VIN TYP value From 3.5 to 5 VPP............................................................................................ 8 • Changed the VIH and VIL Test Conditions From: INPUT_X, M1, M2, M3, RESET To: M1, M2, M3, RESET ........................ 9 • Deleted - RL = 2 Ω, 1% THD+N, unclipped output signal From PO in the Audio Specification (PBTL) table....................... 11 Changes from Revision A (November 2011) to Revision B Page • Changed the RINT_PU parameters from /OTW1 to VREG, /OTW2 to VREG, /SD to VREG to /OTW, /OTW1, /OTW2, /CLIP, READY, /SD to VRE.................................................................................................................................................... 9 • Added text to the PHD Package section. ............................................................................................................................. 17 • Added text to the DKD Package section .............................................................................................................................. 17 Changes from Original (November 2010) to Revision A Page • Changed Title From: 600-W MONO To: 400-W MONO......................................................................................................... 1 • Changed Feature From: 600 W per Channel in Mono PBTL Configuration To: 400 W per Channel in Mono PBTL Configuration .......................................................................................................................................................................... 1 • Changed the Pin One Location Package image .................................................................................................................... 5 • Changed RL(PBTL) Load Impedance Min value From: 1.6 Ω To: 2.4 Ω, and Typ value From 2 To: 3 Ω ............................. 7 • Added footnotes to the ROC table ......................................................................................................................................... 7 • Added ROCP information to the ROC Table ............................................................................................................................ 8 2 Submit Documentation Feedback Copyright © 2010–2015, Texas Instruments Incorporated Product Folder Links: TAS5630B TAS5630B www.ti.com SLES217D – NOVEMBER 2010 – REVISED MARCH 2015 • Changed the IOC Typical Value From: 19 A To: 15 A............................................................................................................. 9 • Deleted - RL = 2 Ω, 10%, THD+N, clipped input signal From PO in the Audio Specification (PBTL) table.......................... 11 • Replaced the TYPICAL CHARACTERISTICS, PBTL CONFIGURATION graphs ............................................................... 12 • Added section - Click and Pop in SE-Mode ......................................................................................................................... 18 • Added section - PBTL Overload and Short Circuit ............................................................................................................... 18 • Replaced the PACKAGE HEAT DISSIPATION RATINGS table with the THERMAL INFORMATION table....................... 18 Submit Documentation Feedback Copyright © 2010–2015, Texas Instruments Incorporated Product Folder Links: TAS5630B 3 TAS5630B SLES217D – NOVEMBER 2010 – REVISED MARCH 2015 www.ti.com 5 Pin Configuration and Functions DKD Package 44 Pins HSSOP Top View AGND VREG INPUT_C INPUT_D FREQ_ADJ OSC_IO+ OSC_IOSD OTW READY M1 M2 M3 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 44 43 42 41 40 39 38 37 36 35 34 33 32 31 30 29 28 27 26 25 24 23 44 pins PACKAGE (TOP VIEW) PSU_REF VDD OC_ADJ RESET C_STARTUP INPUT_A INPUT_B VI_CM GND GVDD_AB BST_A PVDD_A PVDD_A OUT_A OUT_A GND_A GND_B OUT_B PVDD_B BST_B BST_C PVDD_C OUT_C GND_C GND_D OUT_D OUT_D PVDD_D PVDD_D BST_D GVDD_CD 64-pins QFP package 48 47 46 45 44 43 42 41 40 39 38 37 36 35 34 33 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 GND_A GND_B GND_B OUT_B OUT_B PVDD_B PVDD_B BST_B BST_C PVDD_C PVDD_C OUT_C OUT_C GND_C GND_C GND_D OTW2 CLIP READY M1 M2 M3 GND GND GVDD_C GVDD_D BST_D OUT_D OUT_D PVDD_D PVDD_D GND_D OC_ADJ RESET C_STARTUP INPUT_A INPUT_B VI_CM GND AGND VREG INPUT_C INPUT_D FREQ_ADJ OSC_IO+ OSC_IOSD OTW1 64 63 62 61 60 59 58 57 56 55 54 53 52 51 50 49 VDD PSU_REF NC NC NC NC GND GND GVDD_B GVDD_A BST_A OUT_A OUT_A PVDD_A PVDD_A GND_A PHD Package 64 Pins HTQFP Top View 4 Submit Documentation Feedback Copyright © 2010–2015, Texas Instruments Incorporated Product Folder Links: TAS5630B TAS5630B www.ti.com SLES217D – NOVEMBER 2010 – REVISED MARCH 2015 Electrical Pin 1 Pin 1 Marker White Dot Figure 1. Pin One Location PHD Package Pin Functions PIN NAME FUNCTION (1) DESCRIPTION HTQFP HSSOP AGND 8 10 P Analog ground BST_A 54 43 P HS bootstrap supply (BST), external 0.033-μF capacitor to OUT_A required. BST_B 41 34 P HS bootstrap supply (BST), external 0.033-μF capacitor to OUT_B required. BST_C 40 33 P HS bootstrap supply (BST), external 0.033-μF capacitor to OUT_C required. BST_D 27 24 P HS bootstrap supply (BST), external 0.033-μF capacitor to OUT_D required. CLIP 18 — O Clipping warning; open drain; active-low C_STARTUP 3 5 O Start-up ramp requires a charging capacitor of 4.7 nF to AGND in BTL mode FREQ_ADJ 12 14 I PWM frame-rate-programming pin requires resistor to AGND 7, 23, 24, 57, 58 9 P Ground GND_A 48, 49 38 P Power ground for half-bridge A GND_B 46, 47 37 P Power ground for half-bridge B GND_C 34, 35 30 P Power ground for half-bridge C GND_D 32, 33 29 P Power ground for half-bridge D GVDD_A 55 — P Gate-drive voltage supply requires 0.1-μF capacitor to GND_A GVDD_B 56 — P Gate drive voltage supply requires 0.1-μF capacitor to GND_B GVDD_C 25 — P Gate drive voltage supply requires 0.1-μF capacitor to GND_C GVDD_D 26 — P Gate drive voltage supply requires 0.1-μF capacitor to GND_D GVDD_AB — 44 P Gate drive voltage supply requires 0.22-μF capacitor to GND_A/GND_B GVDD_CD — 23 P Gate drive voltage supply requires 0.22-μF capacitor to GND_C/GND_D INPUT_A 4 6 I Input signal for half-bridge A INPUT_B 5 7 I Input signal for half-bridge B INPUT_C 10 12 I Input signal for half-bridge C INPUT_D 11 13 I Input signal for half-bridge D M1 20 20 I Mode selection M2 21 21 I Mode selection M3 22 22 I Mode selection NC 59–62 – — GND (1) No connect; pins may be grounded. I = Input, O = Output, P = Power Submit Documentation Feedback Copyright © 2010–2015, Texas Instruments Incorporated Product Folder Links: TAS5630B 5 TAS5630B SLES217D – NOVEMBER 2010 – REVISED MARCH 2015 www.ti.com Pin Functions (continued) PIN NAME FUNCTION (1) DESCRIPTION HTQFP HSSOP OC_ADJ 1 3 O Analog overcurrent-programming pin requires resistor to AGND. 64-pin package (PHD) = 22 kΩ. 44-pin PSOP3 (DKD) = 24 kΩ OSC_IO+ 13 15 I/O Oscillator master/slave output/input OSC_IO– 14 16 I/O Oscillator master/slave output/input OTW — 18 O Overtemperature warning signal, open-drain, active-low OTW1 16 — O Overtemperature warning signal, open-drain, active-low OTW2 17 — O Overtemperature warning signal, open-drain, active-low OUT_A 52, 53 39, 40 O Output, half-bridge A OUT_B 44, 45 36 O Output, half-bridge B OUT_C 36, 37 31 O Output, half-bridge C OUT_D 28, 29 27, 28 O Output, half-bridge D 63 1 P PSU reference requires close decoupling of 330 pF to AGND. PVDD_A 50, 51 41, 42 P Power-supply input for half-bridge A requires close decoupling of 0.01-μF capacitor in parallel with 2.2-μF capacitor to GND_A. PVDD_B 42, 43 35 P Power-supply input for half-bridge B requires close decoupling of 0.01-μF capacitor in parallel with 2.2-μF capacitor to GND_B. PVDD_C 38, 39 32 P Power-supply input for half-bridge C requires close decoupling of 0.0- μF capacitor in parallel with 2.2-μF capacitor to GND_C. PVDD_D 30, 31 25, 26 P Power-supply input for half-bridge D requires close decoupling of 0.01-μF capacitor in parallel with 2.2-μF capacitor to GND_D. READY 19 19 O Normal operation; open-drain; active-high RESET 2 4 I Device reset input; active-low SD 15 17 O Shutdown signal, open-drain, active-low VDD 64 2 P Power supply for digital voltage regulator requires a 10-μF capacitor in parallel with a 0.1-μF capacitor to GND for decoupling. VI_CM 6 8 O Analog comparator reference node requires close decoupling of 1 nF to AGND. VREG 9 11 P Regulator supply filter pin requires 0.1-μF capacitor to AGND. PSU_REF 6 Submit Documentation Feedback Copyright © 2010–2015, Texas Instruments Incorporated Product Folder Links: TAS5630B TAS5630B www.ti.com SLES217D – NOVEMBER 2010 – REVISED MARCH 2015 6 Specifications 6.1 Absolute Maximum Ratings over operating free-air temperature range unless otherwise noted (1) MIN MAX UNIT VDD to AGND –0.3 13.2 V GVDD to AGND –0.3 13.2 V PVDD_X to GND_X (2) –0.3 69 V OUT_X to GND_X (2) –0.3 69 V BST_X to GND_X (2) –0.3 82.2 V BST_X to GVDD_X (2) –0.3 69 V VREG to AGND –0.3 4.2 V GND_X to GND –0.3 0.3 V GND_X to AGND –0.3 0.3 V OC_ADJ, M1, M2, M3, OSC_IO+, OSC_IO–, FREQ_ADJ, VI_CM, C_STARTUP, PSU_REF to AGND –0.3 4.2 V INPUT_X –0.3 7 V RESET, SD, OTW1, OTW2, CLIP, READY to AGND –0.3 7 V 9 mA 0 150 °C –40 150 °C Continuous sink current (SD, OTW1, OTW2, CLIP, READY) Operating junction temperature, TJ Storage temperature, Tstg (1) (2) Stresses beyond those listed under Absolute Maximum Ratings may cause permanent damage to the device. These are stress ratings only, and functional operation of the device at these or any other conditions beyond those indicated under Recommended Operating Conditions is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. These voltages represents the dc voltage + peak ac waveform measured at the terminal of the device in all conditions. 6.2 ESD Ratings VALUE V(ESD) (1) (2) Electrostatic discharge Human body model (HBM), per ANSI/ESDA/JEDEC JS-001 (1) ±2000 Charged-device model (CDM), per JEDEC specification JESD22C101 (2) ±500 UNIT V JEDEC document JEP155 states that 500-V HBM allows safe manufacturing with a standard ESD control process. JEDEC document JEP157 states that 250-V CDM allows safe manufacturing with a standard ESD control process. 6.3 Recommended Operating Conditions over operating free-air temperature range (unless otherwise noted) MIN NOM MAX UNIT PVDD_x Half-bridge supply DC supply voltage 25 50 52.5 V GVDD_x Supply for logic regulators and gate-drive circuitry DC supply voltage 10.8 12 13.2 V VDD Digital regulator supply voltage DC supply voltage 10.8 12 13.2 V 3.5 4 1.8 2 2.4 3 7 10 7 15 7 10 Nominal 385 400 415 AM1 315 333 350 AM2 260 300 335 RL(BTL) RL(SE) (2) RL(PBTL) Load impedance Output filter according to schematics in the application information section (1) (2) LOUTPUT(BTL) LOUTPUT(SE) (2) LOUTPUT(PBTL) Output filter inductance (1) Minimum output inductance at IOC (2) PWM frame rate selectable for AM interference avoidance; 1% resistor tolerance. fPWM Nominal; master mode RFREQ_ADJ (1) (2) PWM frame-rate-programming resistor Ω μH 9.9 10 10.1 AM1; master mode 19.8 20 20.2 AM2; master mode 29.7 30 30.3 kHz kΩ Values are for actual measured impedance over all combinations of tolerance, current and temperature and not simply the component rating. See additional details for SE and PBTL in System Design Considerations. Submit Documentation Feedback Copyright © 2010–2015, Texas Instruments Incorporated Product Folder Links: TAS5630B 7 TAS5630B SLES217D – NOVEMBER 2010 – REVISED MARCH 2015 www.ti.com Recommended Operating Conditions (continued) over operating free-air temperature range (unless otherwise noted) MIN Voltage on FREQ_ADJ pin for slave mode operation VFREQ_ADJ Overcurrent-protection-programming resistor, cycle-by-cycle mode ROCP Overcurrent-protection-programming resistor, latching mode TJ NOM Slave mode MAX UNIT 3.3 V 64-pin QFP package (PHD) 22 33 44-Pin PSOP3 package (DKD) 24 33 PHD or DKD 47 68 0 125 Junction temperature kΩ °C 6.4 Thermal Information TAS5630B THERMAL METRIC (1) PHD (HTQFP) DKD (HSSOP) 64 PINS 44 PINS RθJA Junction-to-ambient thermal resistance 8.6 8.8 RθJC(top) Junction-to-case (top) thermal resistance 0.3 0.4 RθJB Junction-to-board thermal resistance 2.1 3.0 ψJT Junction-to-top characterization parameter 0.4 0.4 ψJB Junction-to-board characterization parameter 2.1 3.0 (1) UNIT °C/W For more information about traditional and new thermal metrics, see the IC Package Thermal Metrics application report (SPRA953). 6.5 Electrical Characteristics PVDD_X = 50 V, GVDD_X = 12 V, VDD = 12 V, TC (Case temperature) = 75°C, fS = 400 kHz, unless otherwise specified. PARAMETER TEST CONDITIONS MIN TYP MAX UNIT INTERNAL VOLTAGE REGULATOR AND CURRENT CONSUMPTION VREG Voltage regulator, only used as reference node, VREG VI_CM Analog comparator reference node, VI_CM IVDD VDD supply current IGVDD_X GVDD_x gate-supply current per half-bridge IPVDD_X Half-bridge supply current VDD = 12 V 3 3.3 3.6 V 1.75 2 2.15 V Operating, 50% duty cycle 22.5 Idle, reset mode 22.5 50% duty cycle 12.5 Reset mode mA mA 1.5 50% duty cycle with recommended output filter 13.3 mA Reset mode, No switching 870 μA 33 kΩ 5 VPP ANALOG INPUTS RIN Input resistance VIN Maximum input voltage with symmetrical output swing READY = HIGH IIN Maximum input current 342 μA G Voltage gain (VOUT/VIN) 23 dB OSCILLATOR Nominal, master mode fOSC_IO+ AM1, master mode FPWM × 10 AM2, master mode VIH High level input voltage VIL Low level input voltage 8 3.85 4 3.15 3.33 4.15 3.5 2.6 3 3.35 1.86 V 1.45 Submit Documentation Feedback MHz V Copyright © 2010–2015, Texas Instruments Incorporated Product Folder Links: TAS5630B TAS5630B www.ti.com SLES217D – NOVEMBER 2010 – REVISED MARCH 2015 Electrical Characteristics (continued) PVDD_X = 50 V, GVDD_X = 12 V, VDD = 12 V, TC (Case temperature) = 75°C, fS = 400 kHz, unless otherwise specified. PARAMETER TEST CONDITIONS MIN TYP MAX UNIT OUTPUT-STAGE MOSFETs RDS(on) Drain-to-source resistance, low side (LS) Drain-to-source resistance, high side (HS) TJ = 25°C, excludes metallization resistance, GVDD = 12 V 60 100 60 100 mΩ I/O PROTECTION Undervoltage protection limit, GVDD_x and VDD Vuvp,G Vuvp,hyst (1) 9.5 V 0.6 V (1) Overtemperature warning 1 95 100 105 °C OTW2 (1) Overtemperature warning 2 115 125 135 °C OTWhyst (1) Temperature drop needed below OTW temperature for OTW to be inactive after OTW event OTW1 OTE (1) 25 Overtemperature error 145 155 OTE-OTW differential 30 OTEhyst (1) A reset must occur for SD to be released following an OTE event. 25 OLPC Overload protection counter °C 165 °C °C fPWM = 400 kHz 2.6 Resistor – programmable, nominal peak current in 1-Ω load, 64-pin QFP package (PHD) ROCP = 22 kΩ 15 Resistor – programmable, nominal peak current in 1-Ω load, 44-pin PSOP3 package (DKD), ROCP = 24 kΩ 15 Overcurrent limit protection, latched Resistor – programmable, nominal peak current in 1-Ω load, ROCP = 47 kΩ 15 IOCT Overcurrent response time Time from switching transition to flip-state induced by overcurrent 150 ns IPD Internal pulldown resistor at output of each half-bridge Connected when RESET is active to provide bootstrap charge. Not used in SE mode 3 mA Overcurrent limit protection IOC ms A STATIC DIGITAL SPECIFICATIONS VIH High-level input voltage VIL Low-level input voltage Ilkg Input leakage current M1, M2, M3, RESET 2 V 0.8 V 100 μA kΩ OTW/SHUTDOWN (SD) RINT_PU Internal pullup resistance, OTW, OTW1, OTW2, CLIP, READY, SD to VREG VOH High-level output voltage VOL Low-level output voltage IO = 4 mA FANOUT Device fanout OTW, OTW1, OTW2, SD, CLIP, READY No external pullup (1) Internal pullup resistor External pullup of 4.7 kΩ to 5 V 20 26 32 3 3.3 3.6 4.5 V 5 200 30 500 mV devices Specified by design. Submit Documentation Feedback Copyright © 2010–2015, Texas Instruments Incorporated Product Folder Links: TAS5630B 9 TAS5630B SLES217D – NOVEMBER 2010 – REVISED MARCH 2015 www.ti.com 6.6 Audio Characteristics (BTL) PCB and system configuration are in accordance with recommended guidelines. Audio frequency = 1 kHz, PVDD_X = 50 V, GVDD_X = 12 V, RL = 4 Ω, fS = 400 kHz, ROC = 22 kΩ, TC = 75°C; output filter: LDEM = 7 μH, CDEM = 680 nF, MODE = 010, unless otherwise noted. PARAMETER PO TEST CONDITIONS Power output per channel MIN TYP MAX RL = 4 Ω, 10% THD+N, clipped output signal 300 RL = 6 Ω, 10% THD+N, clipped output signal 210 RL = 8 Ω, 10% THD+N, clipped output signal 160 RL = 4 Ω, 1% THD+N, unclipped output signal 240 RL = 6 Ω, 1% THD+N, unclipped output signal 160 RL = 8 Ω, 1% THD+N, unclipped output signal UNIT W 125 THD+N Total harmonic distortion + noise 1W Vn Output integrated noise A-weighted, AES17 filter, input capacitor grounded |VOS| Output offset voltage Inputs ac-coupled to AGND SNR Signal-to-noise ratio (1) A-weighted, AES17 filter 100 dB DNR Dynamic range A-weighted, AES17 filter 100 dB 2.7 W Pidle (1) (2) Power dissipation due to idle losses (IPVDD_X) 0.03% 20 PO = 0, four channels switching μV 270 (2) 50 mV SNR is calculated relative to 1% THD+N output level. Actual system idle losses also are affected by core losses of output inductors. 6.7 Audio Specification (Single-Ended Output) PCB and system configuration are in accordance with recommended guidelines. Audio frequency = 1kHz, PVDD_X = 50 V, GVDD_X = 12 V, RL = 4 Ω, fS = 400 kHz, ROC = 22 kΩ, TC = 75°C; output filter: LDEM = 15 μH, CDEM = 470 μF, MODE = 100, unless otherwise noted. PARAMETER PO Power output per channel TEST CONDITIONS MIN TYP MAX RL = 2 Ω, 10% THD+N, clipped output signal 145 RL = 3 Ω, 10% THD+N, clipped output signal 100 RL = 4 Ω, 10% THD+N, clipped output signal 75 RL = 2 Ω, 1% THD+N, unclipped output signal 110 RL = 3 Ω, 1% THD+N, unclipped output signal 75 RL = 4 Ω, 1% THD+N, unclipped output signal UNIT W 55 THD+N Total harmonic distortion + noise 1W Vn Output integrated noise A-weighted, AES17 filter, input capacitor grounded 340 μV SNR Signal-to-noise ratio (1) A-weighted, AES17 filter 93 dB DNR Dynamic range A-weighted, AES17 filter 93 dB Pidle Power dissipation due to idle losses (IPVDD_X) PO = 0, four channels switching (2) 2 W (1) (2) 10 0.07% SNR is calculated relative to 1% THD+N output level. Actual system idle losses are affected by core losses of output inductors. Submit Documentation Feedback Copyright © 2010–2015, Texas Instruments Incorporated Product Folder Links: TAS5630B TAS5630B www.ti.com SLES217D – NOVEMBER 2010 – REVISED MARCH 2015 6.8 Audio Specification (PBTL) PCB and system configuration are in accordance with recommended guidelines. Audio frequency = 1 kHz, PVDD_X = 50 V, GVDD_X = 12 V, RL = 3 Ω, fS = 400 kHz, ROC = 22 kΩ, TC = 75°C; output filter: LDEM = 7 μH, CDEM = 1.5 μF, MODE = 101-10, unless otherwise noted. PARAMETER TEST CONDITIONS MIN TYP MAX RL = 3 Ω, 10% THD+N, clipped output signal 400 RL = 4 Ω, 10% THD+N, clipped output signal 300 RL = 3 Ω, 1% THD+N, unclipped output signal 310 UNIT PO Power output per channel THD+N Total harmonic distortion + noise 1W Vn Output integrated noise A-weighted 260 μV SNR Signal to noise ratio (1) A-weighted 100 dB DNR Dynamic range A-weighted 100 dB Pidle Power dissipation due to idle losses (IPVDD_X) PO = 0, four channels switching (2) 2.7 W RL = 4 Ω, 1% THD+N, unclipped output signal (1) (2) W 230 0.05% SNR is calculated relative to 1% THD-N output level. Actual system idle losses are affected by core losses of output inductors. 6.9 Typical Characteristics 6.9.1 BTL Configuration 340 10 THD+N − Total Harmonic Distortion + Noise − % 4Ω 6Ω 8Ω 4Ω 6Ω 8Ω 320 300 280 260 PO − Output Power − W 1 0.1 240 220 200 180 160 140 120 100 80 60 40 0.01 0.005 20m 100m 1 10 100 0 400 PO − Output Power − W 4Ω 6Ω 8Ω 200 Efficiency − % PO − Output Power − W 220 180 160 140 120 100 80 60 40 20 TC = 75°C 25 30 35 40 PVDD − Supply Voltage − V 35 40 PVDD − Supply Voltage − V 45 50 G001 240 0 30 Figure 3. Output Power vs Supply Voltage 300 260 25 G001 Figure 2. Total Harmonic + Noise vs Output Power 280 TC = 75°C THD+N at 10% 20 TC = 75°C 45 50 G001 Figure 4. Unclipped Output Power vs Supply Voltage 100 95 90 85 80 75 70 65 60 55 50 45 40 35 30 25 20 15 10 5 0 4Ω 6Ω 8Ω 0 100 TC = 25°C THD+N at 10% 200 300 400 500 2 Channel Output Power − W 600 700 G001 Figure 5. System Efficiency vs Output Power Submit Documentation Feedback Copyright © 2010–2015, Texas Instruments Incorporated Product Folder Links: TAS5630B 11 TAS5630B SLES217D – NOVEMBER 2010 – REVISED MARCH 2015 www.ti.com 100 95 90 85 80 75 70 65 60 55 50 45 40 35 30 25 20 15 10 5 0 340 4Ω 6Ω 8Ω 320 300 280 260 PO − Output Power − W Power Loss − W BTL Configuration (continued) 240 220 200 180 160 140 120 100 80 60 0 100 200 300 400 500 2 Channel Output Power − W 600 4Ω 6Ω 8Ω 40 TC = 25°C THD+N at 10% 20 0 −10 700 0 10 THD+N at 10% 20 30 40 50 60 70 80 90 100 110 TC − Case Temperature − °C G001 Figure 6. System Power Loss vs Output Power G001 Figure 7. Output Power vs Case Temperature 0 TC = 75°C VREF = 35.36 V Sample Rate = 48kHz FFT Size = 16384 −10 −20 −30 4Ω Noise Amplitude − dB −40 −50 −60 −70 −80 −90 −100 −110 −120 −130 −140 −150 −160 0 2k 4k 6k 8k 10k 12k 14k 16k 18k 20k 22k f − Frequency − Hz G001 Figure 8. Noise Amplitude vs Frequency 6.9.2 SE Configuration 1 Channel Driven 170 2Ω 3Ω 4Ω 150 140 130 1 0.1 120 110 100 90 80 70 60 50 40 30 20 0.01 0.005 20m 100m 1 10 PO − Output Power − W TC = 75°C THD+N at 10% 10 TC = 75°C 0 100 200 G001 Figure 9. Total Harmonic Distortion + Noise vs Output Power 12 2Ω 3Ω 4Ω 160 PO − Output Power − W THD+N − Total Harmonic Distortion + Noise − % 10 25 30 35 40 PVDD − Supply Voltage − V 45 50 G001 Figure 10. Output Power vs Supply Voltage Submit Documentation Feedback Copyright © 2010–2015, Texas Instruments Incorporated Product Folder Links: TAS5630B TAS5630B www.ti.com SLES217D – NOVEMBER 2010 – REVISED MARCH 2015 SE Configuration (continued) 180 170 160 150 140 PO − Output Power − W 130 120 110 100 90 80 70 60 50 40 30 2Ω 3Ω 4Ω 20 10 0 −10 0 10 THD+N at 10% 20 30 40 50 60 70 80 90 100 110 TC − Case Temperature − °C G001 Figure 11. Output Power vs Case Temperature 6.9.3 PBTL Configuration 500 3Ω 4Ω 6Ω 8Ω 3Ω 4Ω 6Ω 8Ω 450 400 1 PO − Output Power − W THD+N − Total Harmonic Distortion + Noise − % 10 0.1 350 300 250 200 150 100 50 0.01 TC = 75°C THD+N at 10% TC = 75°C 0.005 20m 100m 1 10 100 0 700 PO − Output Power − W 25 30 G001 35 40 PVDD − Supply Voltage − V 45 50 G001 Figure 12. Total Harmonic Distortion + Noise vs Output Power Figure 13. Output Power vs Supply Voltage 500 450 PO − Output Power − W 400 350 300 250 200 150 100 3Ω 4Ω 6Ω 8Ω 50 0 −10 0 10 THD+N at 10% 20 30 40 50 60 70 80 90 100 110 TC − Case Temperature − °C G001 Figure 14. Output Power vs Case Temperature Submit Documentation Feedback Copyright © 2010–2015, Texas Instruments Incorporated Product Folder Links: TAS5630B 13 TAS5630B SLES217D – NOVEMBER 2010 – REVISED MARCH 2015 www.ti.com 7 Detailed Description 7.1 Overview TAS5630B is an analog input, audio PWM (class-D) amplifier. The output of the TAS5630B can be configured for single-ended, bridge-tied load (BTL) or parallel BTL (PBTL) output. It requires two rails for power supply, PVDD and 12 V (GVDD and VDD). The following functional block diagram shows interconnections of internal supplies, control logic, gate drives and power amplifiers. Detailed schematic can be viewed in TAS5630B EVM User's Guide (SLAU287). 7.2 Functional Block Diagram /CLIP READY /OTW1 /OTW2 /SD PROTECTION & I/O LOGIC M1 M2 M3 /RESET C_STARTUP VDD POWER-UP RESET UVP VREG VREG AGND TEMP SENSE STARTUP CONTROL GVDD_A GVDD _C GVDD_B OVER-LOAD PROTECTION GND GVDD_D CURRENT SENSE CB3C OC_ADJ OSC_SYNC_IO+ OSC_SYNC_IO- 4 OSCILLATOR PPSC FREQ_ADJ 4 4 PVDD_X OUT_X GND_X GVDD_A PWM ACTIVITY DETECTOR 4 PSU_REF BST_A PVDD_A PVDD_X PSU_FF VI_CM GND PWM RECEIVER CONTROL TIMING CONTROL GATE-DRIVE OUT_A GND_A GVDD_B INPUT_A ANALOG LOOP FILTER BST_B + PVDD_B + INPUT_D ANALOG LOOP FILTER - + ANALOG COMPARATOR MUX INPUT_C ANALOG LOOP FILTER ANALOG INPUT MUX INPUT_B PWM RECEIVER CONTROL TIMING CONTROL GATE-DRIVE GND_B GVDD_C BST_C PVDD_C PWM RECEIVER CONTROL TIMING CONTROL GATE-DRIVE + ANALOG LOOP FILTER OUT_B OUT_C GND_C - GVDD_D BST_D PVDD_D PWM RECEIVER CONTROL TIMING CONTROL GATE-DRIVE OUT_D GND_D 14 Submit Documentation Feedback Copyright © 2010–2015, Texas Instruments Incorporated Product Folder Links: TAS5630B TAS5630B www.ti.com SLES217D – NOVEMBER 2010 – REVISED MARCH 2015 7.3 Feature Description 7.3.1 Power Supplies To facilitate system design, the TAS5630B needs only a 12-V supply in addition to the (typical) 50-V power-stage supply. An internal voltage regulator provides suitable voltage levels for the digital and low-voltage analog circuitry. Additionally, all circuitry requiring a floating voltage supply, for example, the high-side gate drive, is accommodated by built-in bootstrap circuitry requiring only an external capacitor for each half-bridge. To provide outstanding electrical and acoustical characteristics, the PWM signal path, including gate drive and output stage, is designed as identical, independent half-bridges. For this reason, each half-bridge has separate gate drive supply pins (GVDD_X), bootstrap pins (BST_X), and power-stage supply pins (PVDD_X). Furthermore, an additional pin (VDD) is provided as supply for all common circuits. Although supplied from the same 12-V source, it is highly recommended to separate GVDD_A, GVDD_B, GVDD_C, GVDD_D, and VDD on the printed-circuit board (PCB) by RC filters (see Typical Application for details). These RC filters provide the recommended high-frequency isolation. Special attention should be paid to placing all decoupling capacitors as close to their associated pins as possible. In general, inductance between the power supply pins and decoupling capacitors must be avoided. (See SLAU287 for additional information.) For a properly functioning bootstrap circuit, a small ceramic capacitor must be connected from each bootstrap pin (BST_X) to the power-stage output pin (OUT_X). When the power-stage output is low, the bootstrap capacitor is charged through an internal diode connected between the gate-drive power-supply pin (GVDD_X) and the bootstrap pin. When the power-stage output is high, the bootstrap capacitor potential is shifted above the output potential and thus provides a suitable voltage supply for the high-side gate driver. In an application with PWM switching frequencies in the range from 300 kHz to 400 kHz, it is recommended to use 33-nF ceramic capacitors, size 0603 or 0805, for the bootstrap supply. These 33-nF capacitors ensure sufficient energy storage, even during minimal PWM duty cycles, to keep the high-side power stage FET (LDMOS) fully turned on during the remaining part of the PWM cycle. Special attention should be paid to the power-stage power supply; this includes component selection, PCB placement, and routing. As indicated, each half-bridge has independent power-stage supply pins (PVDD_X). For optimal electrical performance, EMI compliance, and system reliability, it is important that each PVDD_X pin is decoupled with a 2.2-μF ceramic capacitor placed as close as possible to each supply pin. It is recommended to follow the PCB layout of the TAS5630B reference design. For additional information on recommended power supply and required components, see Typical Application. The 12-V supply should be from a low-noise, low-output-impedance voltage regulator. Likewise, the 50-V powerstage supply is assumed to have low output impedance and low noise. The power-supply sequence is not critical as facilitated by the internal power-on-reset circuit. Moreover, the TAS5630B is fully protected against erroneous power-stage turnon due to parasitic gate charging. Thus, voltage-supply ramp rates (dV/dt) are non-critical within the specified range (see Recommended Operating Conditions). 7.3.2 System Power-Up and Power-Down Sequence 7.3.2.1 Powering Up The TAS5630B does not require a power-up sequence. The outputs of the H-bridges remain in a highimpedance state until the gate-drive supply voltage (GVDD_X) and VDD voltage are above the undervoltage protection (UVP) voltage threshold (see Electrical Characteristics). Although not specifically required, it is recommended to hold RESET in a low state while powering up the device. This allows an internal circuit to charge the external bootstrap capacitors by enabling a weak pulldown of the half-bridge output. 7.3.2.2 Powering Down The TAS5630B does not require a power-down sequence. The device remains fully operational as long as the gate-drive supply (GVDD_X) voltage and VDD voltage are above the undervoltage protection (UVP) voltage threshold (see Electrical Characteristics). Although not specifically required, it is a good practice to hold RESET low during power down, thus preventing audible artifacts including pops or clicks. 7.3.3 Error Reporting The SD, OTW, OTW1, and OTW2 pins are active-low, open-drain outputs. Their function is for protection-mode signaling to a PWM controller or other system-control device. Submit Documentation Feedback Copyright © 2010–2015, Texas Instruments Incorporated Product Folder Links: TAS5630B 15 TAS5630B SLES217D – NOVEMBER 2010 – REVISED MARCH 2015 www.ti.com Feature Description (continued) Any fault resulting in device shutdown is signaled by the SD pin going low. Likewise, OTW and OTW2 go low when the device junction temperature exceeds 125°C and OTW1 goes low when the junction temperature exceeds 100°C (see Table 1). Table 1. Error Reporting SD OTW1 OTW2, OTW 0 0 0 Overtemperature (OTE) or overload (OLP) or undervoltage (UVP) 0 0 1 Overload (OLP) or undervoltage (UVP). Junction temperature higher than 100°C (overtemperature warning) 0 1 1 Overload (OLP) or undervoltage (UVP) 1 0 0 Junction temperature higher than 125°C (overtemperature warning) 1 0 1 Junction temperature higher than 100°C (overtemperature warning) 1 1 1 Junction temperature lower than 100°C and no OLP or UVP faults (normal operation) DESCRIPTION Note that asserting either RESET low forces the SD signal high, independent of faults being present. TI recommends monitoring the OTW signal using the system microcontroller and responding to an overtemperature warning signal by, for example, turning down the volume to prevent further heating of the device resulting in device shutdown (OTE). To reduce external component count, an internal pullup resistor to 3.3 V is provided on both SD and OTW outputs. Level compliance for 5-V logic can be obtained by adding external pullup resistors to 5 V (see Electrical Characteristics for further specifications). 7.3.4 Device Protection System The TAS5630B contains advanced protection circuitry carefully designed to facilitate system integration and ease of use, as well as to safeguard the device from permanent failure due to a wide range of fault conditions such as short circuits, overload, overtemperature, and undervoltage. The TAS5630B responds to a fault by immediately setting the power stage in a high-impedance (Hi-Z) state and asserting the SD pin low. In situations other than overload and overtemperature error (OTE), the device automatically recovers when the fault condition has been removed, that is, the supply voltage has increased. The device functions on errors, as shown in the following table. Table 2. Device Protection System BTL Mode Local error in A B C D PBTL Mode Turns Off or in A+B C+D Local error in Turns Off or in A B C SE Mode Local error in Turns Off or in A A+B+C+D D B C D A+B C+D Bootstrap UVP does not shut down according to the table; it shuts down the respective half-bridge. 16 Submit Documentation Feedback Copyright © 2010–2015, Texas Instruments Incorporated Product Folder Links: TAS5630B TAS5630B www.ti.com SLES217D – NOVEMBER 2010 – REVISED MARCH 2015 7.3.5 Pin-to-Pin Short-Circuit Protection (PPSC) The PPSC detection system protects the device from permanent damage if a power output pin (OUT_X) is shorted to GND_X or PVDD_X. For comparison, the OC protection system detects an overcurrent after the demodulation filter, whereas PPSC detects shorts directly at the pin before the filter. PPSC detection is performed at startup, that is, when VDD is supplied; consequently, a short to either GND_X or PVDD_X after system startup does not activate the PPSC detection system. When PPSC detection is activated by a short on the output, all half-bridges are kept in a Hi-Z state until the short is removed; the device then continues the startup sequence and starts switching. The detection is controlled globally by a two-step sequence. The first step ensures that there are no shorts from OUT_X to GND_X; the second step tests that there are no shorts from OUT_X to PVDD_X. The total duration of this process is roughly proportional to the capacitance of the output LC filter. The typical duration is <15 ms/μF. While the PPSC detection is in progress, SD is kept low, and the device does not react to changes applied to the RESET pins. If no shorts are present the PPSC detection passes, and SD is released, a device reset does not start a new PPSC detection. PPSC detection is enabled in BTL and PBTL output configurations; the detection is not performed in SE mode. To make sure the PPSC detection system is not tripped, it is recommended not to insert resistive load between OUT_X and GND_X or PVDD_X. 7.3.6 Overtemperature Protection The two different package options have individual overtemperature protection schemes. PHD Package: The TAS5630B PHD package option has a three-level temperature-protection system that asserts an active-low warning signal (OTW1) when the device junction temperature exceeds 100°C (typical), (OTW2) when the device junction temperature exceeds 125°C (typical) and, if the device junction temperature exceeds 155°C (typical), the device is put into thermal shutdown, resulting in all half-bridge outputs being set in the high-impedance (Hi-Z) state and SD being asserted low. OTE is latched in this case. To clear the OTE latch, RESET must be asserted. Thereafter, the device resumes normal operation. For highest reliability, the RESET should not be asserted until OTW1 has cleared. DKD Package: The TAS5630B DKD package option has a two-level temperature-protection system that asserts an active-low warning signal (OTW) when the device junction temperature exceeds 125°C (typical) and, if the device junction temperature exceeds 155°C (typical), the device is put into thermal shutdown, resulting in all half-bridge outputs being set in the high-impedance (Hi-Z) state and SD being asserted low. OTE is latched in this case. To clear the OTE latch, RESET must be asserted. It is recommended to wait until OTW has cleared before asserting RESET. Thereafter, the device resumes normal operation. 7.3.7 Undervoltage Protection (UVP) and Power-On Reset (POR) The UVP and POR circuits of the TAS5630B fully protect the device in any power-up/down and brownout situation. While powering up, the POR circuit resets the overload circuit (OLP) and ensures that all circuits are fully operational when the GVDD_X and VDD supply voltages reach the levels stated in Electrical Characteristics. Although GVDD_X and VDD are independently monitored, a supply voltage drop below the UVP threshold on any VDD or GVDD_X pin results in all half-bridge outputs immediately being set in the highimpedance (Hi-Z) state and SD being asserted low. The device automatically resumes operation when all supply voltages have increased above the UVP threshold. 7.3.8 Device Reset When RESET is asserted low, all power-stage FETs in the four half-bridges are forced into a high-impedance (Hi-Z) state. In BTL modes, to accommodate bootstrap charging prior to switching start, asserting the reset input low enables weak pulldown of the half-bridge outputs. In the SE mode, the output is forced into a high-impedance state when asserting the reset input low. Asserting reset input low removes any fault information to be signaled on the SD output; that is, SD is forced high. A rising-edge transition on reset input allows the device to resume operation after an overload fault. To ensure thermal reliability, the rising edge of reset must occur no sooner than 4 ms after the falling edge of SD. Submit Documentation Feedback Copyright © 2010–2015, Texas Instruments Incorporated Product Folder Links: TAS5630B 17 TAS5630B SLES217D – NOVEMBER 2010 – REVISED MARCH 2015 www.ti.com 7.3.9 Click and Pop in SE-Mode The BTL startup has low click and pop due to the trimmed output dc offset, see Audio Characteristics (BTL). The startup of the BTL+2 x SE system (Figure 21) or 4xSE (Figure 20) is more difficult to get click and pop free, than the pure BTL solution; therefore, evaluating the resulting click and pop before designing in the device is recommended. 7.3.10 PBTL Overload and Short Circuit The TAS5630B has extensive overload and short circuit protection. In BTL and SE mode, it is fully protected against speaker terminal overloads, terminal-to-terminal short circuit, and short circuit to GND or PVDD. The protection works by limiting the current, by flipping the state of the output MOSFETs; thereby, ramping currents down in the inductor. This only works when the inductor is NOT saturated, the recommended minimum inductor values are listed in Recommended Operating Conditions. In BTL mode, the short circuit currents can reach more than 15 A, so when connecting the device in PBTL mode (Mono), the currents double – that is more than 30 A, and with these high currents, the protection system will limit PBTL speaker overloads, terminal-to-terminal shorts, and terminal-to-GND shorts. PBTL mode short circuit to PVDD is not recommended. 7.3.11 Oscillator The oscillator frequency can be trimmed by external control of the FREQ_ADJ pin. To reduce interference problems while using a radio receiver tuned within the AM band, the switching frequency can be changed from nominal to lower values. These values should be chosen such that the nominal and the lower-value switching frequencies together result in the fewest cases of interference throughout the AM band, and can be selected by the value of the FREQ_ADJ resistor connected to AGND in master mode. For slave-mode operation, turn off the oscillator by pulling the FREQ_ADJ pin to VREG. This configures the OSC_I/O pins as inputs, which must be slaved from an external clock. 7.4 Device Functional Modes Table 3. Mode Selection Pins MODE PINS ANALOG INPUT OUTPUT CONFIGURATION 0 Differential 2 × BTL AD mode 1 — — Reserved 1 0 Differential 2 × BTL BD mode 0 1 1 Differential singleended 1 × BTL +2 ×SE 1 0 0 Single-ended 4 × SE M3 M2 M1 0 0 0 0 0 DESCRIPTION BD mode, BTL differential AD mode INPUT_C 1 (1) 18 0 1 1 1 0 1 1 1 Differential 1 × PBTL (1) INPUT_D (1) 0 0 AD mode 1 0 BD mode Reserved INPUT_C and D are used to select between a subset of AD and BD mode operations in PBTL mode (1=VREG and 0=AGND). Submit Documentation Feedback Copyright © 2010–2015, Texas Instruments Incorporated Product Folder Links: TAS5630B TAS5630B www.ti.com SLES217D – NOVEMBER 2010 – REVISED MARCH 2015 8 Application and Implementation NOTE Information in the following applications sections is not part of the TI component specification, and TI does not warrant its accuracy or completeness. TI’s customers are responsible for determining suitability of components for their purposes. Customers should validate and test their design implementation to confirm system functionality. 8.1 Application Information 8.1.1 PCB Material Recommendation TI recommends FR-4 2-oz. (70-μm) glass epoxy material for use with the TAS5630B. The use of this material can provide for higher power output, improved thermal performance, and better EMI margin (due to lower PCB trace resistance). 8.1.2 PVDD Capacitor Recommendation The large capacitors used in conjunction with each full bridge are referred to as the PVDD capacitors. These capacitors should be selected for proper voltage margin and adequate capacitance to support the power requirements. In practice, with a well-designed system power supply, 1000 μF, 63-V supports more applications. The PVDD capacitors should be the low-ESR type, because they are used in a circuit associated with high-speed switching. 8.1.3 Decoupling Capacitor Recommendations To design an amplifier that has robust performance, passes regulatory requirements, and exhibits good audio performance, quality decoupling capacitors should be used. In practice, X7R should be used in this application. The voltage of the decoupling capacitors should be selected in accordance with good design practices. Temperature, ripple current, and voltage overshoot must be considered. This fact is particularly true in the selection of the 2.2-μF capacitor that is placed on the power supply to each half-bridge. The decoupling capacitor must withstand the voltage overshoot of the PWM switching, the heat generated by the amplifier during high power output, and the ripple current created by high power output. A minimum voltage rating of 63 V is required for use with a 50-V power supply. 8.1.4 System Design Considerations A rising-edge transition on the reset input allows the device to execute the startup sequence and starts switching. Apply audio only when the state of READY is high; that starts and stops the amplifier without having audible artifacts that are heard in the output transducers. If an overcurrent protection event is introduced, the READY signal goes low; hence, filtering is needed if the signal is intended for audio muting in non-microcontroller systems. The CLIP signal indicates that the output is approaching clipping. The signal can be used either to activate a volume decrease or to signal an intelligent power supply to increase the rail voltage from low to high for optimum efficiency. The device inverts the audio signal from input to output. The VREG pin is not recommended to be used as a voltage source for external circuitry. Submit Documentation Feedback Copyright © 2010–2015, Texas Instruments Incorporated Product Folder Links: TAS5630B 19 TAS5630B SLES217D – NOVEMBER 2010 – REVISED MARCH 2015 www.ti.com 8.2 Typical Application The following schematics and PCB layouts illustrate best practices used for the TAS5630B. 8.2.1 Typical Application Schematic Input DC Blocking Caps ANALOG_IN_A ANALOG_IN_B OSC_IO- VI_CM /CLIP C_STARTUP OSC_IO+ READY /RESET /SD Oscillator Synchronization /OTW1, /OTW2, /OTW (2) PSU_REF Caps for External Filtering & Startup/Stop System microcontroller or Analog circuitry BST_A BST_B OUT_A INPUT_A Input H-Bridge 1 INPUT_B Output H-Bridge 1 2 OUT_B 2 Hardwire PWM Frame Rate Adjust & Master/Slave Mode Input DC Blocking Caps ANALOG_IN_C ANALOG_IN_D FREQ_ADJ nd OUT_C Output H-Bridge 2 Input H-Bridge 2 INPUT_D 2 OUT_D 8 PVDD 12V PVDD Power Supply Decoupling SYSTEM Power Supplies GND 8 2 Order L-C Output Filter for each H-Bridge BST_D OC_ADJ VREG VDD BST_C AGND M3 GND M2 GND_A, B, C, D PVDD_A, B, C, D M1 GVDD_A, B, C, D 2 50V nd 2 Order L-C Output Filter for each H-Bridge 2-CHANNEL H -BRIDGE BTL MODE INPUT_C Hardwire Mode Control Bootstrap Caps Bootstrap Caps 4 GVDD, VDD, & VREG Power Supply Decoupling Hardwire OverCurrent Limit GND GVDD (12V)/VDD (12V) VAC Figure 15. Typical Application Schematic 8.2.1.1 Design Requirements This device can be configured for BTL, PBTL, or SE mode. Each mode will require a different output configuration. 8.2.1.2 Detailed Design Procedure • Pin 1 – Overcurrent adjust resistor can be between 24 kΩ to 68 kΩ depending on the application. The lower resistance corresponds to the higher over-current protection level. • Pin 2 – RESET pin when asserted, it keeps outputs Hi-Z and no PWM switching. This pin can be controlled by a microprocessor. • Pin 3 – Start-up ramp capacitor should be 4.7 nF for BTL and PBTL configurations, and 10 nF for SE configuration. • Pins 4, 5, 10, 11 – Differential pair inputs AB and CD. A DC blocking capacitor of 10 µF and an RC of 100 Ω and 100 pF should be placed on each analog input. • Pin 6 – Analog comparator reference node requires close decoupling capacitor of 1 nF to ground. • Pin 7, 8, 23, 24, 57, 58 – Ground pins are connected to board ground. • Pin 9 – Regulator supply filter pin requires 0.1 uF to AGND. • Pin 12 – Frequency adjust resistor is discussed in Oscillator. 20 Submit Documentation Feedback Copyright © 2010–2015, Texas Instruments Incorporated Product Folder Links: TAS5630B TAS5630B www.ti.com SLES217D – NOVEMBER 2010 – REVISED MARCH 2015 Typical Application (continued) • • • • • • • • • • • • Pin 13, 14 – Oscillator input/output. When frequency adjust pin is pulled up to VREG, the oscillator pins are configured as inputs. Pin 15 – Shutdown pin can be monitored by a microcontroller through GPIO pin. System can decide to assert reset or power down. See Error Reporting. Pin 16, 17 – There are two overtemperature warning pins for PHD package. They have two different levels of warning. OTW1 is lower temperature level warning than OTW2. They can be monitored by a microcontroller through GPIO pins. System can decide to turn on fan, lower output power or shutdown. See Error Reporting. Pin 18 – Output clip indicator can be monitored by a microcontroller through a GPIO pin. System can decide to lower the volume. Pin 19 – Ready pin can be used to signal the system that the device is up and running. Pin 20-22 – Mode pins set the input and output configurations. See Table 2 for configuration setting of these pins. Pin 25, 26, 55, 56 – Gate drive power pins provide gate voltage for half-bridges. Each needs a 3.3-Ω isolation resistor and a 0.1-uF decoupling capacitor. Pins 27, 40, 41, 54 – Bootstrap pins for half-bridges A, B, C, D. Connect 33 nF from this pin to corresponding output pins. Pins 28, 29, 36, 37, 44, 45, 53, 54 – Output pins from half-bridges A, B, C, D. Connect appropriate bootstrap capacitors to the output pins. For PWM filtering, each output mode is used with different LC configuration. Pins 30, 31, 38, 39, 42, 43, 50, 51 – Power supply pins to half-bridges A, B, C, D. Each PVDD_X has decoupling capacitor connecting to the appropriate GND_X pin. Pins 32, 33, 34, 35, 46, 47, 48, 49 – Connect decoupling capacitors of each power input pin to power supply ground pins. Connect these pins to board ground. Pins 59-62 – Connect “No connect” pins to board ground. There is no internal connection to these pins. 8.2.1.3 Application Curves 340 4Ω 6Ω 8Ω 4Ω 6Ω 8Ω 320 300 280 260 1 PO − Output Power − W THD+N − Total Harmonic Distortion + Noise − % 10 0.1 240 220 200 180 160 140 120 100 80 60 40 0.01 100m 1 10 PO − Output Power − W 100 TC = 75°C THD+N at 10% 20 TC = 75°C 0.005 20m 0 400 G001 Figure 16. Total Harmonic + Noise vs Output Power 25 30 35 40 PVDD − Supply Voltage − V 45 50 G001 Figure 17. Output Power vs Supply Voltage Submit Documentation Feedback Copyright © 2010–2015, Texas Instruments Incorporated Product Folder Links: TAS5630B 21 TAS5630B SLES217D – NOVEMBER 2010 – REVISED MARCH 2015 www.ti.com 8.2.2 Typical Differential-Input BTL Application With BD Modulation Filters BTL output and differential input configuration is a typical audio class-D (PWM) amplifier. With differential input, the output can be configured for BTL application with BD modulation. The configuration below can also be used with AD modulation. BD modulation gives better channel separation and PSSR performance. GVDD/VDD (+12V) PVDD R30 C64 1000uF 3.3R R31 3.3R C26 100nF C25 10uF C40 33nF L10 7uH GND C23 /SD 50 51 49 GND_A PVDD_A 53 52 OUT_A PVDD_A 55 56 57 58 54 BST_A OUT_A GVDD_A GVDD_B GND 60 62 59 NC GND NC NC 63 GND_C /SD GND_C /OTW1 GND_D C71 1nF C51 680nF 47 46 GND L11 7uH R71 3.3R 45 44 43 OUT_LEFT_P C61 2.2uF C41 33nF 42 PVDD 41 C68 47uF 63V 1000uF C66 1000uF C65 40 C69 2.2uF GND 38 37 R74 3.3R GND C78 10nF 39 C62 2.2uF GND GND GND GND C42 33nF GND OUT_RIGHT_M 36 7uH L12 35 R72 3.3R 34 GND C52 680nF 33 C72 1nF C76 10nF - GND_D OSC_IO- PVDD_D OSC_IO- GND C75 10nF 48 GND C77 10nF 32 OSC_IO+ OUT_C 31 16 OUT_C OSC_IO+ PVDD_D 15 FREQ_ADJ OUT_D 14 PVDD_C 30 13 PVDD_C INPUT_D 29 10uF 12 BST_C INPUT_C OUT_D R21 10k GND TAS5630BPHD VREG BST_D 11 R_RIGHT_N C17 100R 100pF 10 28 100nF 27 R13 9 GND BST_B GVDD_D C16 GND C15 100pF GVDD_C 100R PVDD_B U10 AGND 26 R12 IN_RIGHT_P GND GND C14 10uF GND 25 7 8 VREG 24 1nF C22 GND C13 100pF M3 100R PVDD_B VI_CM 23 10uF OUT_B INPUT_B 22 6 GND M2 C21 R11 OUT_B INPUT_A M1 5 C12 IN_LEFT_N GND_B 21 4 GND_B C_STARTUP READY 4.7nF /RESET 20 3 19 10uF NC 64 VDD 2 GND C11 100R 100pF GND_A /CLIP 22.0k C20 R10 C74 10nF + OC_ADJ /OTW2 1 18 C10 IN_LEFT_P C70 1nF C50 680nF GND GND R20 GND 17 C18 100pF PSU_REF R19 47k 61 GND 330pF /RESET 100R OUT_LEFT_M R70 3.3R C60 2.2uF GND GND VREG R18 GND C31 100nF C30 100nF + GND /OTW1 C53 680nF C63 2.2uF /OTW2 /CLIP C73 1nF R73 3.3R L13 7uH GND OUT_RIGHT_P READY VREG PVDD C67 1000uF C43 33nF R32 GND 3.3R R33 GND GVDD/VDD (+12V) 3.3R C33 100nF C32 100nF GND GND Figure 18. Typical Differential-Input BTL Application With BD Modulation Filters 22 Submit Documentation Feedback Copyright © 2010–2015, Texas Instruments Incorporated Product Folder Links: TAS5630B TAS5630B www.ti.com SLES217D – NOVEMBER 2010 – REVISED MARCH 2015 8.2.3 Typical Differential (2N) PBTL Application With BD Modulation Filters When there is a need for more power in an audio system, PBTL is a good choice for this application. Paralleling the output after the inductors is recommended. In this configuration, the device can be driven with higher current (lower load impedance). Figure 19 shows the component and pin connections. 3.3R GVDD (+12V) VDD (+12V) 3.3R PVDD 100nF 100nF 100nF 10uF 10nF 100V 2.2uF 100V 1 2 3 4 50 51 52 53 54 55 56 49 GND_A PVDD_A PVDD_A OUT_A OUT_A BST_A GVDD_A 57 58 GND GVDD_B 60 61 62 59 NC GND NC 44 43 PVDD_B VREG AGND BST_B TAS5630BPHD VREG BST_C 10 INPUT_C PVDD_C 11 INPUT_D PVDD_C 12 1uF 250V 33nF 1nF 100V 10nF 100V 1nF 100V 10nF 100V - 41 40 + GND 39 38 37 2.2uF 100V GND 1uF 250V 33nF 7uH 3.3R 36 35 OUT_LEFT_P 34 GND 33 1000uF 63V 32 31 30 29 28 26 27 25 24 /OTW2 17 2.2uF 100V 42 GND_D GND_D PVDD_D GND_C /OTW1 PVDD_D /SD 16 OUT_D 15 OUT_D GND_C BST_D OSC_IO- 14 GVDD_D OUT_C GVDD_C OUT_C OSC_IO+ 13 GND GND FREQ_ADJ GND GND 10k NC OUT_B PVDD_B 9 GND 3.3R GND 8 7uH GND 45 VI_CM GND OUT_LEFT_M 46 INPUT_B M3 VREG 47 6 7 GND 48 5 23 100nF OUT_B 22 GND GND GND_B INPUT_A M2 1nF C_STARTUP M1 100pF GND_B 21 GND 10uF GND GND GND_A 20 100R IN_N GND 1000uF 63V /RESET READY GND GND OC_ADJ /CLIP 4.7nF 100pF 19 GND 10uF 18 100R IN_P 63 64 22.0k NC VDD 100pF PSU_REF 330pF GND GND GND GND 47k 2.2uF 100V GND GND GND GND /RESET 47uF 63V 1000uF 63V VREG 100R 3.3R 7uH 33nF OSC_IO+ OSC_IO- GND 2.2uF 100V PVDD /SD GND /OTW1 GND 7uH VREG 1000uF 63V /OTW2 /CLIP 33nF 3.3R READY 3.3R GND GVDD (+12V) 100nF 100nF GND GND Figure 19. Typical Differential (2N) PBTL Application With BD Modulation Filters Submit Documentation Feedback Copyright © 2010–2015, Texas Instruments Incorporated Product Folder Links: TAS5630B 23 TAS5630B SLES217D – NOVEMBER 2010 – REVISED MARCH 2015 www.ti.com 8.2.4 Typical SE Application Single-ended output configuration is often used for cost effective systems. This device can be configured to drive four independent channels with four different inputs. The delivered power is not as much as BTL configuration. The advantage is that the component count for four channels is the same as two BTL channels. The schematic in this section shows the component and pin connections. 3.3R VDD (+12V) 3.3R 10uF GVDD (+12V) 100nF 100nF 100nF 33nF 15uH A GND GND GND GND VREG PVDD 2.2uF 1 10nF 2 3 GND 100R 4 GND 5 IN_B 6 10uF 100pF 1nF 7 GND 100nF 100R VREG 8 GND GND 9 IN_C GND 10uF 10 100pF 11 10k 12 100R GND 13 GND IN_D 14 10uF 100pF 15 16 49 GND GND_A 52 51 55 54 50 PVDD_A OUT_A OUT_A PVDD_A GND GND NC NC NC NC GVDD_A 22.0k GND 100pF GVDD_B GND 100R IN_A 10uF PSU_REF VDD 100pF BST_A 58 57 56 61 60 59 64 63 330pF 62 /RESET 53 GND GND 47k 100R OC_ADJ GND_A /RESET GND_B C_STARTUP GND_B INPUT_A OUT_B INPUT_B OUT_B VI_CM PVDD_B GND PVDD_B TAS5630BPHD AGND BST_B VREG BST_C INPUT_C PVDD_C INPUT_D PVDD_C FREQ_ADJ OUT_C OSC_IO+ OUT_C OSC_IO- GND_C /SD GND_C /OTW1 GND_D 48 47 46 GND 15uH 45 B 44 2.2uF 43 33nF 42 PVDD 41 3.3R 47uF 63V 40 2.2uF 39 10nF 38 2.2uF 37 33nF 15uH GND GND 36 GND C 35 34 GND 33 GND_D 32 PVDD_D PVDD_D OUT_D 29 30 31 BST_D OUT_D GVDD_D 26 28 27 GND GVDD_C GND 23 24 25 M1 M3 M2 20 21 22 /CLIP /OTW2 17 18 19 OSC_IO+ READY GND OSC_IO2.2uF /SD PVDD GND /OTW1 VREG 15uH /OTW2 D 33nF /CLIP GND 3.3R READY GVDD (+12V) 3.3R 100nF 100nF 10nF 100V 3.3R 100nF 100V R_COMP 10k PVDD R_COMP 50V 49V 48V <48V 147kW 165kW 187kW 191kW + 100nF 100V 1% 10k 470uF 50V 10k 470uF 50V 10k - 470nF 250V + 100nF 100V 1% GND OUT_A_P 10k 470uF 50V 100nF 100V R_COMP PVDD GND 1% 3.3R GND 100V 10nF OUT_B_P 1% 3.3R GND 100V 10nF GND 10nF 100V 3.3R 100nF 100V R_COMP 10k PVDD 470uF 50V 10k GND 3.3R 470uF 50V 10k 1% 1% + GND 100nF 100V R_COMP 10k PVDD 470uF 50V 10k 470uF 50V 10k 1% - 470nF 250V + 100nF 100V GND OUT_C_P 3.3R GND 100V 10nF GND OUT_D_M D - 470nF 250V 100nF 100V GND 10nF 100V OUT_C_M C GND OUT_B_M B - 470nF 250V 10k 470uF 50V PVDD 3.3R OUT_A_M A 10nF 100V GND GND GND 1% OUT_D_P 3.3R GND GND 100V 10nF GND Figure 20. Typical SE Application 24 Submit Documentation Feedback Copyright © 2010–2015, Texas Instruments Incorporated Product Folder Links: TAS5630B TAS5630B www.ti.com SLES217D – NOVEMBER 2010 – REVISED MARCH 2015 8.2.5 Typical 2.1 System Differential-Input BTL and Unbalanced-Input SE Application One of the attractive features of this device is that it can be configured for mixed BTL and SE outputs. One BTL plus two SE channels make up a 2.1 audio system. While the SE channels are used to drive the front end and right speakers, the BTL channel can deliver higher power and is used to drive a subwoofer. Figure 21 shows the component and pin connections. GVDD (+12V) PVDD 3.3R 1000uF 63V VDD (+12V) 3.3R 10uF GND 100nF 100nF 100nF 33nF 7uH OUT_CENTER_M GND GND GND GND VREG 3.3R 2.2uF 100V 49 52 51 50 55 54 53 58 57 56 61 60 59 64 63 330pF 62 /RESET 1 GND 10uF 2 100pF 3 GND 100R 4 GND 5 IN_CENTER_N 6 10uF 100pF 1nF GND 7 100nF VREG 8 GND 100R GND 9 IN_LEFT GND 10uF 10 100pF 11 10k 100R GND 12 13 GND IN_RIGHT 14 10uF 100pF 15 16 OC_ADJ GND_A GND_B C_STARTUP GND_B OUT_B 45 GND VREG 44 43 41 BST_C 40 PVDD_C PVDD_C FREQ_ADJ OUT_C OSC_IO+ OUT_C OSC_IO- GND_C /SD GND_C /OTW1 GND_D 2.2uF 100V 33nF 42 BST_B INPUT_C 7uH OUT_CENTER_P OUT_B INPUT_D PVDD 3.3R 37 2.2uF 100V 33nF GND GND GND GND OUT_LEFT_M 35 GND 33 100nF 100V R_COMP 34 10k PVDD 470uF 50V 10k 1% 470uF 50V 10k 1% - 470nF 250V + 100nF 100V GND OUT_LEFT_P 3.3R GND GND 3.3R GND 15uH 36 GND 2.2uF 100V VREG /SD 10nF 100V 10nF 100V 39 38 GND_D PVDD_D 2.2uF 100V 32 31 OUT_D PVDD_D OUT_D 29 30 28 GVDD_C BST_D GVDD_D 26 27 25 M3 GND GND 23 24 22 READY M2 M1 20 21 /CLIP /OTW2 17 18 19 OSC_IO+ 47uF 63V 1000uF 63V GND OSC_IO- GND 3.3R GND PVDD_B PVDD_B TAS5630BPHD 10nF 100V 680nF 250V 48 INPUT_A AGND 1nF 100V 47 46 INPUT_B 10nF 100V + GND /RESET VI_CM 1nF 100V GND GND_A PVDD_A OUT_A OUT_A PVDD_A BST_A GVDD_B NC GND GND NC NC GVDD_A 22.0k 10nF NC VDD GND 100R PSU_REF 100pF IN_CENTER_P 680nF 250V GND GND 47k 100R 100V 10nF 10nF 100V GND /OTW1 15uH /OTW2 3.3R GND OUT_RIGHT_M 33nF /CLIP 3.3R READY 100nF 100V R_COMP 3.3R 10k PVDD 100nF 100nF GND GND 470uF 50V 10k 1% 470uF 50V 10k 1% GND - 470nF 250V + 100nF 100V GND OUT_RIGHT_P 3.3R GND 100V 10nF PVDD GVDD (+12V) Figure 21. Typical 2.1 System Differential-Input BTL and Unbalanced-Input SE Application Submit Documentation Feedback Copyright © 2010–2015, Texas Instruments Incorporated Product Folder Links: TAS5630B 25 TAS5630B SLES217D – NOVEMBER 2010 – REVISED MARCH 2015 www.ti.com 8.2.6 Typical Differential-Input BTL Application With BD Modulation Filters, DKD Package This is the same application as described in Typical Differential-Input BTL Application With BD Modulation Filters with PHD package. For DKD package an external heatsink is required to dissipate excess heat. In this package, the PCB space is not a limiting factor for dissipating excess heat. R34 GVDD (+12V) 1.5R C87 100nF C38 100nF PVDD 1000uF 63V VDD (+12V) GND C35 100nF C44 10uF GND 7uH OUT_LEFT_M GND GND 3.3R C86 VREG 680nF 250V GND 330pF R44 47k R13 U12 1 /RESET C78 100pF 100R 2 R14 3 GND 24k C45 R45 4 GND IN_LEFT_P 10uF 100R 4.7nF C82 100pF 100R 1nF C79 100pF C42 VREG GND R53 10uF 100R R60 GND_A VI_CM GND_B GND OUT_B 10 AGND 11 VREG 14 10k IN_RIGHT_N 100R C81 100pF BST_B INPUT_C BST_C INPUT_D PVDD_C FREQ_ADJ OUT_C OSC_IO+ GND_C 16 OSC_IO- GND_D /SD OUT_D 17 18 19 /OTW READY OUT_D PVDD_D 20 M1 PVDD_D 21 M2 BST_D M3 GVDD_CD VREG OSC_IO+ PVDD_B TAS5630BDKD 15 GND 10uF PVDD_A INPUT_B 13 R20 PVDD_A /RESET OUT_A 12 C80 100pF OC_ADJ OUT_A 100nF IN_RIGHT_P 43 INPUT_A 9 GND GND BST_A VDD C_STARTUP 8 GND 10uF 44 6 7 IN_LEFT_N GVDD_AB 5 C85 R54 PSU_REF 22 42 1nF 100V 10nF 100V 1nF 100V 10nF 100V - C33 + 33nF GND 41 680nF 250V C83 2.2uF 40 GND 3.3R 39 7uH 38 OUT_LEFT_P 37 GND 36 PVDD 35 34 C41 33nF C90 2.2uF C37 33nF C91 2.2uF 63V 33 32 1000uF 1000uF 63V 2.2uF 100V 10nF 100V GND GND GND GND 31 3.3R 47uF 63V GND GND 7uH 30 OUT_RIGHT_M 29 28 GND C34 2.2uF 27 26 3.3R 680nF 250V 25 1nF 100V 10nF 100V 1nF 100V 10nF 100V - 24 23 OSC_IO- 33nF C88 + GND GND GND /SD 680nF 250V /OTW 3.3R READY 7uH OUT_RIGHT_P PVDD 1.5R 1000uF 63V R31 100nF C89 100nF C84 GND GVDD (+12V) GND Figure 22. Typical Differential-Input BTL Application With BD Modulation Filters, DKD Package 26 Submit Documentation Feedback Copyright © 2010–2015, Texas Instruments Incorporated Product Folder Links: TAS5630B TAS5630B www.ti.com SLES217D – NOVEMBER 2010 – REVISED MARCH 2015 9 Power Supply Recommendations Absolute Maximum Ratings discusses most of the requirements on TAS5630B power supply. There are a few more important guidelines that should be considered. The most important parameters are the absolute maximum rating on PVDD pins, bootstrap pins and output pins. Over stress the device with higher that maximum voltage rating may shorten device lifetime operation and even cause device damage. Be sure that the specifications in section 6 are observed. For best audio performance, low ESR bulk capacitors are recommended. Depending on the application 470-µF capacitor or higher should be used. As always, decoupling capacitors must be placed no more than 1 mm from the power supply pins. If PCB space is not allowed for close decoupling capacitor placement, the decoupling capacitors can be placed on the back side of the device with vias. However, it still needs to be right below the pins. 10 Layout 10.1 Layout Guidelines Use an unbroken ground plane to have a good low-impedance and -inductance return path to the power supply for power and audio signals. PCB layout, audio performance and EMI are linked closely together. The circuit contains high, fast-switching currents; therefore, care must be taken to prevent damaging voltage spikes. Routing of the audio input should be kept short and together with the accompanying audio-source ground. A local ground area underneath the device is important to keep solid to minimize ground bounce. It is always good practice to follow the EVM layout as a guideline. Netlist for this printed circuit board is generated from the schematic in Figure 18. Submit Documentation Feedback Copyright © 2010–2015, Texas Instruments Incorporated Product Folder Links: TAS5630B 27 TAS5630B SLES217D – NOVEMBER 2010 – REVISED MARCH 2015 www.ti.com 10.2 Layout Example Note T1: PVDD bulk decoupling capacitors C60–C64 should be as close as possible to the PVDD_X and GND_X pins; the heat sink sets the distance. Wide traces should be routed on the top layer with direct connection to the pins and without going through vias. No vias or traces should be blocking the current path. Note T2: Close decoupling of PVDD with low impedance X7R ceramic capacitors is placed under the heat sink and close to the pins. This is valid for C60, C61, C62, and C63. Note T3: Heat sink must have a good connection to PCB ground. Note T4: Output filter capacitors must be linear in the applied voltage range, preferably metal film types. Figure 23. Printed Circuit Board – Top Layer 28 Submit Documentation Feedback Copyright © 2010–2015, Texas Instruments Incorporated Product Folder Links: TAS5630B TAS5630B www.ti.com SLES217D – NOVEMBER 2010 – REVISED MARCH 2015 Layout Example (continued) Note B1: It is important to have a direct-low impedance return path for high current back to the power supply. Keep impedance low from top to bottom side of PCB through a lot of ground vias. Note B2: Bootstrap low-impedance X7R ceramic capacitors placed on bottom side provide a short, low-inductance current loop. Note B3: Return currents from bulk capacitors and output filter capacitors Figure 24. Printed Circuit Board – Bottom Layer Submit Documentation Feedback Copyright © 2010–2015, Texas Instruments Incorporated Product Folder Links: TAS5630B 29 TAS5630B SLES217D – NOVEMBER 2010 – REVISED MARCH 2015 www.ti.com 11 Device and Documentation Support 11.1 Trademarks PurePath is a trademark of Texas Instruments. All other trademarks are the property of their respective owners. 11.2 Electrostatic Discharge Caution These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam during storage or handling to prevent electrostatic damage to the MOS gates. 11.3 Glossary SLYZ022 — TI Glossary. This glossary lists and explains terms, acronyms, and definitions. 12 Mechanical, Packaging, and Orderable Information The following pages include mechanical, packaging, and orderable information. This information is the most current data available for the designated devices. This data is subject to change without notice and revision of this document. For browser-based versions of this data sheet, refer to the left-hand navigation. 30 Submit Documentation Feedback Copyright © 2010–2015, Texas Instruments Incorporated Product Folder Links: TAS5630B PACKAGE MATERIALS INFORMATION www.ti.com 2-Oct-2014 TAPE AND REEL INFORMATION *All dimensions are nominal Device Package Package Pins Type Drawing SPQ Reel Reel A0 Diameter Width (mm) (mm) W1 (mm) TAS5630BDKDR HSSOP DKD 44 500 330.0 24.4 TAS5630BPHDR HTQFP PHD 64 1000 330.0 24.4 Pack Materials-Page 1 B0 (mm) K0 (mm) P1 (mm) W Pin1 (mm) Quadrant 14.7 16.4 4.0 20.0 24.0 Q1 17.0 17.0 1.5 20.0 24.0 Q2 PACKAGE MATERIALS INFORMATION www.ti.com 2-Oct-2014 *All dimensions are nominal Device Package Type Package Drawing Pins SPQ Length (mm) Width (mm) Height (mm) TAS5630BDKDR HSSOP DKD TAS5630BPHDR HTQFP PHD 44 500 367.0 367.0 45.0 64 1000 367.0 367.0 45.0 Pack Materials-Page 2 PACKAGE OUTLINE DKD0044A PowerPAD TM SSOP - 3.6 mm max height SCALE 1.000 PLASTIC SMALL OUTLINE C SEATING PLANE 14.5 TYP 13.9 A 0.1 C PIN 1 ID AREA 42X 0.65 44 1 EXPOSED THERMAL PAD 12.7 12.6 16.0 15.8 NOTE 3 2X 13.65 22 23 44X (2.95) 0.38 0.25 0.12 C A B 5.9 5.8 B 11.1 10.9 NOTE 4 (0.15) EXPOSED THERMAL PAD 3.6 3.1 (0.28) TYP SEE DETAIL A 0.35 GAGE PLANE 0 -8 0.3 0.1 1.1 0.8 DETAIL A TYPICAL 4218846/A 07/2016 PowerPAD is a trademark of Texas Instruments. NOTES: 1. All linear dimensions are in millimeters. Any dimensions in parenthesis are for reference only. Dimensioning and tolerancing per ASME Y14.5M. 2. This drawing is subject to change without notice. 3. This dimension does not include mold flash, protrusions, or gate burrs. Mold flash, protrusions, or gate burrs shall not exceed 0.15 mm per side. 4. The exposed thermal pad is designed to be attached to an external heatsink. www.ti.com EXAMPLE BOARD LAYOUT DKD0044A PowerPAD TM SSOP - 3.6 mm max height PLASTIC SMALL OUTLINE 44X (2) SEE DETAILS SYMM 1 44 44X (0.45) 42X (0.65) SYMM (R0.05) TYP 22 23 (13.2) LAND PATTERN EXAMPLE SCALE:6X SOLDER MASK OPENING METAL METAL UNDER SOLDER MASK SOLDER MASK OPENING 0.05 MAX AROUND 0.05 MIN AROUND NON SOLDER MASK DEFINED SOLDER MASK DEFINED SOLDER MASK DETAILS NOT TO SCALE 4218846/A 07/2016 NOTES: (continued) 5. Publication IPC-7351 may have alternate designs. 6. Solder mask tolerances between and around signal pads can vary based on board fabrication site. www.ti.com EXAMPLE STENCIL DESIGN DKD0044A PowerPAD TM SSOP - 3.6 mm max height PLASTIC SMALL OUTLINE 44X (2) 1 SYMM 44 44X (0.45) 42X (0.65) SYMM (R0.05) TYP 23 22 (13.2) SOLDER PASTE EXAMPLE BASED ON 0.125 MM THICK STENCIL SCALE:6X 4218846/A 07/2016 NOTES: (continued) 7. Laser cutting apertures with trapezoidal walls and rounded corners may offer better paste release. IPC-7525 may have alternate design recommendations. 8. Board assembly site may have different recommendations for stencil design. www.ti.com IMPORTANT NOTICE Texas Instruments Incorporated (TI) reserves the right to make corrections, enhancements, improvements and other changes to its semiconductor products and services per JESD46, latest issue, and to discontinue any product or service per JESD48, latest issue. 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