Metrology of integrated waveguide devices and systems
... A more complicated CMOS based, integrated waveguide optical system for on-chip clock distribution provided an environment for further NSOM studies [3]. The chip contains a series of waveguide straight sections, splitters, and bends in the form of an H-tree as illustrated in Fig. 5(b) to deliver an o ...
... A more complicated CMOS based, integrated waveguide optical system for on-chip clock distribution provided an environment for further NSOM studies [3]. The chip contains a series of waveguide straight sections, splitters, and bends in the form of an H-tree as illustrated in Fig. 5(b) to deliver an o ...
Advanced Applications
... effect to create a signal suitable for laser locking. A Rubidium or Potassium vapor cell is placed in a weak longitudinal magnetic field. Laser light travels through a Glan-Taylor Polarizer prior to entering the vapor cell, thereby ensuring that the input is linearly polarized. Due to the presence o ...
... effect to create a signal suitable for laser locking. A Rubidium or Potassium vapor cell is placed in a weak longitudinal magnetic field. Laser light travels through a Glan-Taylor Polarizer prior to entering the vapor cell, thereby ensuring that the input is linearly polarized. Due to the presence o ...
Preparation of ultrathin free-standing targets for „e,2e
... With the help of a telescope, the test sample is replaced by the real target so that it occupies the previously found beam mark position. By placing a normal light source behind the thin film, one can also observe the color of the film during the thinning process. The Cu film we prepared has a dark ...
... With the help of a telescope, the test sample is replaced by the real target so that it occupies the previously found beam mark position. By placing a normal light source behind the thin film, one can also observe the color of the film during the thinning process. The Cu film we prepared has a dark ...
Synthesis and characterization of MCM
... materials have been interested as drug storage and release hosts due to their unique surface and textural properties, including stable mesostructure, tunable pore size, and easily modified surface features for sitespecific delivery[3]. First successful report on the mesoporous materials (M41 S) by M ...
... materials have been interested as drug storage and release hosts due to their unique surface and textural properties, including stable mesostructure, tunable pore size, and easily modified surface features for sitespecific delivery[3]. First successful report on the mesoporous materials (M41 S) by M ...
Undergraduate Admissions & College of Engineering
... ULSI = ultra large scale integration (~106 - 109 components) GSI = giga-scale integration (> 109 components) ...
... ULSI = ultra large scale integration (~106 - 109 components) GSI = giga-scale integration (> 109 components) ...
Transversal ultrasonic probe
... Ultrasonic testing of solid materials may require probing very small areas of a material. This can be done by coupling flat ultrasonic shear wave transducers to conical tips1. In many cases implying simultaneous detection of shear and longitudinal components, it can be very difficult to detect selec ...
... Ultrasonic testing of solid materials may require probing very small areas of a material. This can be done by coupling flat ultrasonic shear wave transducers to conical tips1. In many cases implying simultaneous detection of shear and longitudinal components, it can be very difficult to detect selec ...
Fermi surface topology and de Hass-van Alphen orbits in PuIn $ _
... commensurate AFM order obeying the discrete translational invariance in the crystal. Figure 1(b) shows the top view of the magnetic unit cell accommodating the commensurate AFM order. The side view is shown in Fig. 1(c). Therefore, the lattices can be considered as a tetragonal Bravais lattice decor ...
... commensurate AFM order obeying the discrete translational invariance in the crystal. Figure 1(b) shows the top view of the magnetic unit cell accommodating the commensurate AFM order. The side view is shown in Fig. 1(c). Therefore, the lattices can be considered as a tetragonal Bravais lattice decor ...
X-ray Diffraction
... x-ray can be calculated based on the sample. Any deviation from this calculation in the data can be used to obtain density profiles of the thin film (source http://www.ptb.de/). ...
... x-ray can be calculated based on the sample. Any deviation from this calculation in the data can be used to obtain density profiles of the thin film (source http://www.ptb.de/). ...
TEM Image Contrast
... Takai, J. Elec. Microscopy 41 (1992) 116. (a) image (b) method to measure local curvature: tilt the beam by angle α and measure image shift distance L. Radius of curvature = L/α ...
... Takai, J. Elec. Microscopy 41 (1992) 116. (a) image (b) method to measure local curvature: tilt the beam by angle α and measure image shift distance L. Radius of curvature = L/α ...
XRD - Shodhganga
... data of XRD patterns of different crystals have been compiled and stored in large database so that an experimental sample can be compared to a standard on order to identify ...
... data of XRD patterns of different crystals have been compiled and stored in large database so that an experimental sample can be compared to a standard on order to identify ...
Advanced Microscopy
... depending on the phase shift and the form of the the wave plate, different focal intensity patterns are obtained ...
... depending on the phase shift and the form of the the wave plate, different focal intensity patterns are obtained ...
Super-resolution Microscopy
... spaced point sources are imaged at different times. That is, imagine two PSFs that cannot be otherwise distinguished but each is observed at a different time (Fig. 3D). This methodology of “sequential” imaging at different times forms the basis of the most recent and successful superresolution micro ...
... spaced point sources are imaged at different times. That is, imagine two PSFs that cannot be otherwise distinguished but each is observed at a different time (Fig. 3D). This methodology of “sequential” imaging at different times forms the basis of the most recent and successful superresolution micro ...
Induced nanoscale deformations in polymers using atomic
... simulation of the problem indicates that the screening factor value k ⬇ 0.9 produces an electric field inside a polymer film of the order of 108 – 109 V m−1,17 well below the electric breakdown threshold. Equation (9) presents an averaged field instead of Ein共r兲 or Eout共r兲 excluding self-action.13 T ...
... simulation of the problem indicates that the screening factor value k ⬇ 0.9 produces an electric field inside a polymer film of the order of 108 – 109 V m−1,17 well below the electric breakdown threshold. Equation (9) presents an averaged field instead of Ein共r兲 or Eout共r兲 excluding self-action.13 T ...
Spin Density Functional Based Search for Half
... that have the special properties mentioned above. For an initial study one should consider only the simplest case of two magnetic ions whose spins (S) are antiparallel. In this case the moments will be distinct in shape and extent (different spin densities) but will cancel precisely in each cell due ...
... that have the special properties mentioned above. For an initial study one should consider only the simplest case of two magnetic ions whose spins (S) are antiparallel. In this case the moments will be distinct in shape and extent (different spin densities) but will cancel precisely in each cell due ...
A Scanning Tunneling Microscopy (STM)
... their self-assembled monolayers, cleaning the gold surface and preparing the immersion solutions (0.1−1.0 mM in ethanol), learning basic concepts about surface preparation and properties. During imaging, they are encouraged to examine all aspects of the surfaces at various length scales. At larger s ...
... their self-assembled monolayers, cleaning the gold surface and preparing the immersion solutions (0.1−1.0 mM in ethanol), learning basic concepts about surface preparation and properties. During imaging, they are encouraged to examine all aspects of the surfaces at various length scales. At larger s ...
Microscopy Overview
... source is usually used. In critical illumination, the source is focused on to the object by a condenser lens. The disadvantage of this approach is that variations in emission of the source are imaged directly into the image. Cheaper microscopes avoid this problem by using a diffuser. Better microsco ...
... source is usually used. In critical illumination, the source is focused on to the object by a condenser lens. The disadvantage of this approach is that variations in emission of the source are imaged directly into the image. Cheaper microscopes avoid this problem by using a diffuser. Better microsco ...
Controlling surface statistical properties using bias voltage: Atomic
... Co layers was done at various negative bias voltages ranging from zero to -80 V at the same sputtering conditions. The schematic details about the way of exerting the bias voltage to the Si substrate can be found in [11]. In order to analyze the deposited samples, we have used atomic force microscop ...
... Co layers was done at various negative bias voltages ranging from zero to -80 V at the same sputtering conditions. The schematic details about the way of exerting the bias voltage to the Si substrate can be found in [11]. In order to analyze the deposited samples, we have used atomic force microscop ...
A negative permeability material at red light
... and reflected fields should be available either from optical experiments or simulations [1,2]. In addition, along with its effective n and η , the layer can be characterized by its effective permittivity ε = ε ′ + ιε ′′ and permeability μ = μ ′ + ιμ ′′ , defined as ε = n η , and μ = n η . The values ...
... and reflected fields should be available either from optical experiments or simulations [1,2]. In addition, along with its effective n and η , the layer can be characterized by its effective permittivity ε = ε ′ + ιε ′′ and permeability μ = μ ′ + ιμ ′′ , defined as ε = n η , and μ = n η . The values ...
Grain contrast_published - Chalmers University of Technology
... to be aware of the strengths and weaknesses of each technique. In this work, the grain contrast imaging is performed with secondary electrons, backscattered electrons, forward scattered electrons, transmitted electrons in the scanning electron microscope, and with secondary electrons in the focused ...
... to be aware of the strengths and weaknesses of each technique. In this work, the grain contrast imaging is performed with secondary electrons, backscattered electrons, forward scattered electrons, transmitted electrons in the scanning electron microscope, and with secondary electrons in the focused ...
Aalborg Universitet Transfer function and near-field detection of evanescent waves
... geometry of the refractive index profile is depicted in Fig. 5. The core and cladding indices of the fiber are 1.459 and 1.457, respectively; the core diameter is 4 m, and, to increase computation speed, a reduced cladding diameter of 20 m was chosen. The opening angles were varied from 10° to 70° ...
... geometry of the refractive index profile is depicted in Fig. 5. The core and cladding indices of the fiber are 1.459 and 1.457, respectively; the core diameter is 4 m, and, to increase computation speed, a reduced cladding diameter of 20 m was chosen. The opening angles were varied from 10° to 70° ...
Direct Imaging of Transient Interference in a Optical Microscopy
... NSOM is used to directly measure the evanescent field on the upper surface of the waveguide. The NSOM technique has been frequently used for optical waveguide characterization in light propagation properties, spatial modes profile, and guided modes interference [2]–[5]. NSOM measurements reported he ...
... NSOM is used to directly measure the evanescent field on the upper surface of the waveguide. The NSOM technique has been frequently used for optical waveguide characterization in light propagation properties, spatial modes profile, and guided modes interference [2]–[5]. NSOM measurements reported he ...
Three-dimensional imaging by optical sectioning in the aberration
... The motivation behind three-dimensional imaging in the electron microscope is to fully understand the three-dimensional structure of materials that determines their chemical, physical and electronic properties. At present, the most common technique for three-dimensional imaging is electron tomograph ...
... The motivation behind three-dimensional imaging in the electron microscope is to fully understand the three-dimensional structure of materials that determines their chemical, physical and electronic properties. At present, the most common technique for three-dimensional imaging is electron tomograph ...
Characterization of Nano Materials using Electron Microscopy
... evaporation. Conductive materials in current use for specimen coating include gold, gold/palladium alloy, platinum, osmium, iridium, tungsten, chromium and graphite [5]. Coating prevents the accumulation of static electric charge on the specimen during electron irradiation. An alternative to coating ...
... evaporation. Conductive materials in current use for specimen coating include gold, gold/palladium alloy, platinum, osmium, iridium, tungsten, chromium and graphite [5]. Coating prevents the accumulation of static electric charge on the specimen during electron irradiation. An alternative to coating ...
Novel 3-D microscopy techniques - Purdue University Cytometry
... Effect of increased incident power on generation of signal. Samples of acidfucsin-stained monkey kidney were imaged at a depth of 60 µm into the sample by confocal (550 µW of 532-nm light) and by multiphoton (12 mW of 1047-nm light) microscopy. Laser intensities were adjusted to produce the same mea ...
... Effect of increased incident power on generation of signal. Samples of acidfucsin-stained monkey kidney were imaged at a depth of 60 µm into the sample by confocal (550 µW of 532-nm light) and by multiphoton (12 mW of 1047-nm light) microscopy. Laser intensities were adjusted to produce the same mea ...
A crystal cleavage mechanism for UHV STM.
... semiconductors crystals to prepare the samples. Moreover the position of the sample front surface (relative to the knife) edge is fixed during sample installation. Therefore a geometry size of cleaving crystals is of no importance and restricted only by the size of vice clamp and the spring force. O ...
... semiconductors crystals to prepare the samples. Moreover the position of the sample front surface (relative to the knife) edge is fixed during sample installation. Therefore a geometry size of cleaving crystals is of no importance and restricted only by the size of vice clamp and the spring force. O ...
Atomic force microscopy
Atomic-force microscopy (AFM) or scanning-force microscopy (SFM) is a very high-resolution type of Scanning probe microscopy (SPM), with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.