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LF198/LF298/LF398, LF198A/LF398A Monolithic Sample-and-Hold Circuits LF198/LF298/LF398, LF198A/LF398A
LF198/LF298/LF398, LF198A/LF398A Monolithic Sample-and-Hold Circuits LF198/LF298/LF398, LF198A/LF398A

... capacitor has an additional lag due to the 300Ω series resistor on the chip. This means that at the moment the “hold” command arrives, the hold capacitor voltage may be somewhat different than the actual analog input. The effect of these delays is opposite to the effect created by delays in the logi ...
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... (50 ppm/°C), thin-film resistors, and 12 pairs of NMOS currentsteering switches, see Figure 19. These switches steer binarily weighted currents into either IOUT or GND; this yields a constant current in each ladder leg, regardless of digital input code. This constant current results in a constant in ...
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... capacitor has an additional lag due to the 300Ω series resistor on the chip. This means that at the moment the “hold” command arrives, the hold capacitor voltage may be somewhat different than the actual analog input. The effect of these delays is opposite to the effect created by delays in the logi ...
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... grounded oscilloscope to make floating measurements. In addition to the safety benefits, the use of these probes can improve measurement quality. Differential probes provide balanced measurement input capacitance so any point in the circuit can be safely probed with either lead. Differential probes ...
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Integrating ADC



An integrating ADC is a type of analog-to-digital converter that converts an unknown input voltage into a digital representation through the use of an integrator. In its most basic implementation, the unknown input voltage is applied to the input of the integrator and allowed to ramp for a fixed time period (the run-up period). Then a known reference voltage of opposite polarity is applied to the integrator and is allowed to ramp until the integrator output returns to zero (the run-down period). The input voltage is computed as a function of the reference voltage, the constant run-up time period, and the measured run-down time period. The run-down time measurement is usually made in units of the converter's clock, so longer integration times allow for higher resolutions. Likewise, the speed of the converter can be improved by sacrificing resolution.Converters of this type can achieve high resolution, but often do so at the expense of speed. For this reason, these converters are not found in audio or signal processing applications. Their use is typically limited to digital voltmeters and other instruments requiring highly accurate measurements.
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