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QUANTITIES, TERMINOLOGY, AND SYMBOLS IN
QUANTITIES, TERMINOLOGY, AND SYMBOLS IN

... rotational excitation, electronic excitation, concentration change, photoinduced volume change, creation of electric field (charge creation), clustering, and so on. Absorption changes induced by some of these effects also contribute to the signal. The effect that directly modifies the absorbance or ...
z - at www.arxiv.org.
z - at www.arxiv.org.

... Many other details of the OV trajectories find their counterparts in behaviour of the curves in figures 3, 4. Generally, the spiral motion is characterized by monotonic growth of ; however, regions of the “backward” evolution of the azimuth are present in figures 4(c)–(f) that are associated with t ...
optical properties of biaxial minerals
optical properties of biaxial minerals

... light rays vibrating perpendicular to each other have equal velocities, and have same RI’s, hence biaxial. RVS OF BIAXIAL CRYSTALS RVS is very complex double surface in 3-D (FIG. 7.1); so sections to this surface are studied initially. In biaxial crystals that belong to orthorhombic, monoclinic and ...
Assessment of optical systems by means of point
Assessment of optical systems by means of point

... of the wavelength of the light. Interferometric methods are mostly used for this purpose. Although the achievable precision is very high, these methods need refined and delicate optical set-ups and, in practice, special laser sources to achieve sufficient signal-to-noise ratio. When a measurement at ...
Light Microscopy
Light Microscopy

... “Confocal microscopy,” and “Recent microscopy techniques.” Wide-field microscopy relates to the ordinary, classic microscope. The name derives from the fact that the entire field of view in the microscope is uniformly illuminated, and can be viewed through eyepieces or photographed using a camera. I ...
An introduction to medical imaging with coherent terahertz
An introduction to medical imaging with coherent terahertz

... materials more sensitively than previous spectroscopic methods in this range (Grischkowsky et al 1990, Kindt and Schmuttenmaer 1996, van Exter and Grischkowsky 2001). The technique can be extended to terahertz pulsed imaging (TPI), which can be used in either transmission or reflection geometries. T ...
OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS (G02F takes
OPTICAL ELEMENTS, SYSTEMS, OR APPARATUS (G02F takes

to Thin Section Microscopy - Mineralogical Society of America
to Thin Section Microscopy - Mineralogical Society of America

... Preface The microscopic investigation of materials such as minerals, rocks, ores, technical and other synthetic products in transmitted and reflected light remains one of the classic, and to this day indispensable, mineralogical methods of analysis. Polarized-light microscopy provides a nondestructi ...
Optical interference component irradiances."
Optical interference component irradiances."

... Exact Duplicate of BS without the silver coating. Therefore, the difference in OPL is actual path length difference. 4) An additional phase term is present in the OM2 arm, due to an internal reflection in the BS, whereas the OM1 wave has an external reflection at the BS. Therefore 2dcosθm = mλ0 ⇒ Co ...
Fiber optic Fabry-Perot interferometer for
Fiber optic Fabry-Perot interferometer for

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PDF - Grueber Lab
PDF - Grueber Lab

... thin sheet of light, and acquire images of the illuminated plane using an orthogonally aligned second objective3-5. The sample is then translated relative to this co-aligned plane to form a 3D volumetric image. This dual-objective geometry, and the need for side-on illumination and physical translat ...
Nanosphere Lithography: Effect of Substrate on the Localized
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Theory of optical pulse propagation, dispersive and nonlinear effects
Theory of optical pulse propagation, dispersive and nonlinear effects

... In reality, the nonlinear medium is also dispersive and dispersion broadens the pulse temporally during the buildup of the nonlinear phase shift. For a positive dispersion, k2 > 0, this effect smoothens the structure in Fig. IV-37 and linearises the temporal chirp, leading thereby to a better qualit ...
Gradient Index Optics at DARPA - Institute for Defense Analyses
Gradient Index Optics at DARPA - Institute for Defense Analyses

... Defense Analyses (IDA) to assemble a summary of work on gradient index optics completed under funding from the Agency. The purpose was to archive the efforts, motivation, and accomplishments that the Agency supported and to provide a reference for any future programs that explore this new area of op ...
All-optical signal processing based on self
All-optical signal processing based on self

... In this contribution, we review our recent progress on the alloptical control of the state-of-polarization of light in optical fibers upon propagation in a system called Omnipolarizer. More precisely, in this device we exploit the unexpected capability of light to self-organize its own state-of-pola ...
MEMS mirrors - Hamamatsu Photonics
MEMS mirrors - Hamamatsu Photonics

... the drive current reaches its absolute maximum rating. The drive current must not be increased to its absolute maximum rating. The magnitude of the drive current must be observed carefully so that the maximum optical deflection angle is not exceeded. Particularly in high-speed operation, even when t ...
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Pulsed photoacoustic techniques and glucose determination in

... The effect of glucose on blood optical scattering was studied by a picosecond pulsed laser together with a streak camera. A photoacoustic apparatus comprising a pulsed laser diode and a piezoelectric transducer was built and applied to measure glucose concentration in water and scattering media. Mor ...
Plasmonic metamaterials Review Kan Yao and Yongmin Liu*
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... Engineering the dispersion of SPPs provides an alternative approach to realize negative refraction and NIMs. For instance, there are two bound-SPP modes in a twodimensional (2D) metal-dielectric-metal (MDM) slab waveguide, which originate from the coupling and hybridization of the SPP mode at each i ...
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... measureing method with a precition of 0.01 µm is, however, difficult because it is normally monitored through a lens system that degrades the precision in position. Here, we focus on the relation between NFP and far field pattern (FFP) using Fourier transformation. FFP is the angle component of the ...
Experimental and Theoretical Studies in Optical Coherence Theory
Experimental and Theoretical Studies in Optical Coherence Theory

Experimental study of scattering from characterized random surfaces
Experimental study of scattering from characterized random surfaces

Orbital angular momentum: origins
Orbital angular momentum: origins

... of quantization, give an angular momentum to energy ratio of �/ω for a helically phased wave, and σ/ω for a circularly polarized wave, where σ = ±1 for right- and left-handed polarized light, respectively [3]. Assuming that the energy of each photon is h̄ω, this gives the simple expressions for orbi ...
Nanomechanical Motion Transducers for Miniaturized
Nanomechanical Motion Transducers for Miniaturized

... torsional structures—and the linear dimensions of the device as well as the device material. The stress field within the structure, either intrinsic or induced externally, also affects f r and γ, and can thus be used for tuning [25–27]. 1.2. Operation and Transducers The operation and applications o ...
Appendix D – Raman Spectra
Appendix D – Raman Spectra

... wavelength of 785 nm, there were two peaks visible in the RBM range (100-400 cm-1) and were quite visible in the spectrum. The D-peak (1300-1400 cm-1) was somewhat visible, although more difficult to detect because of its wide shape and because of the noisy baseline. The G-peak was sharp and visible ...
Nanomechanical Motion Transducers for Miniaturized
Nanomechanical Motion Transducers for Miniaturized

... torsional structures—and the linear dimensions of the device as well as the device material. The stress field within the structure, either intrinsic or induced externally, also affects f r and γ, and can thus be used for tuning [25–27]. 1.2. Operation and Transducers The operation and applications o ...
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Ellipsometry

Ellipsometry is an optical technique for investigating the dielectric properties (complex refractive index or dielectric function) of thin films. Ellipsometry can be used to characterize composition, roughness, thickness (depth), crystalline nature, doping concentration, electrical conductivity and other material properties. It is very sensitive to the change in the optical response of incident radiation that interacts with the material being investigated.Typically, the measured signal is the change in polarization as the incident radiation (in a known state) interacts with the material structure of interest (reflected, absorbed, scattered, or transmitted). The polarization change is quantified by the amplitude ratio, Ψ, and the phase difference, Δ (defined below). Because the signal depends on the thickness as well as the materials properties, ellipsometry can be a universal tool for contact free determination of thickness and optical constants of films of all kinds.This technique has found applications in many different fields, from semiconductor physics to microelectronics and biology, from basic research to industrial applications. Ellipsometry is a very sensitive measurement technique and provides unequaled capabilities for thin film metrology. As an optical technique, spectroscopic ellipsometry is non-destructive and contactless. Because the incident radiation can be focused, small sample sizes can be imaged and desired characteristics can be mapped over a larger area (m^2).The one weakness of ellipsometry is the need to model the data. Entire courses are taught in the modeling of the raw data. Models can be physically based on energy transitions or simply free parameters used to fit the data.Upon the analysis of the change of polarization of light, ellipsometry can yield information about layers that are thinner than the wavelength of the probing light itself, even down to a single atomic layer. Ellipsometry can probe the complex refractive index or dielectric function tensor, which gives access to fundamental physical parameters like those listed above. It is commonly used to characterize film thickness for single layers or complex multilayer stacks ranging from a few angstroms or tenths of a nanometer to several micrometers with an excellent accuracy.The name ""ellipsometry"" stems from the fact that Elliptical polarization of light is used. The term ""spectroscopic"" relates to the fact that the information gained is a function of the light's wavelength or energy (spectra). The technique has been known at least since 1888 by the work of Paul Drude, (the term ""ellipsometry"" being first used probably in 1945 ) and has many applications today. A spectroscopic ellipsometer can be found in most thin film analytical labs. Ellipsometry is also becoming more interesting to researchers in other disciplines such as biology and medicine. These areas pose new challenges to the technique, such as measurements on unstable liquid surfaces and microscopic imaging.
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