Lec03 - nptel
... refracted ray grazes along the media interface. This angle of incidence is called the critical angle of incidence (θc) of medium 2 with respect to medium 1. One should note here that critical angle is media-relative. That means, the same optically denser medium may have different critical angles wit ...
... refracted ray grazes along the media interface. This angle of incidence is called the critical angle of incidence (θc) of medium 2 with respect to medium 1. One should note here that critical angle is media-relative. That means, the same optically denser medium may have different critical angles wit ...
Sisay M THESIS - Addis Ababa University Institutional Repository
... Moiré deflectometry is a simple technique for optical testing of phase objects and specular surfaces, based on the moiré effect. The method provides mapping of ray deflections caused by either a phase object or reflection from a surface. From this information the index-of-refraction field of the ph ...
... Moiré deflectometry is a simple technique for optical testing of phase objects and specular surfaces, based on the moiré effect. The method provides mapping of ray deflections caused by either a phase object or reflection from a surface. From this information the index-of-refraction field of the ph ...
IOSR Journal of Applied Physics (IOSR-JAP)
... One way of label-free sensing is by using optical techniques, where in general an optical waveguide confines an electromagnetic wave in such a way that it can interact with a test sample. The electromagnetic wave may be a traveling or a standing wave, depending on the sensor configuration, but in bo ...
... One way of label-free sensing is by using optical techniques, where in general an optical waveguide confines an electromagnetic wave in such a way that it can interact with a test sample. The electromagnetic wave may be a traveling or a standing wave, depending on the sensor configuration, but in bo ...
Fabrication of concave silicon micro-mirrors
... After irradiation, the photoresist was removed with Nano StripTM (Cyantek Inc) and the wafer electrochemically etched at 70mA/cm2 for different periods depending on the dimensions of the annuli. For example, a concave mirror/cylinder with a diameter of D = 100µm, has a central aperture diameter of C ...
... After irradiation, the photoresist was removed with Nano StripTM (Cyantek Inc) and the wafer electrochemically etched at 70mA/cm2 for different periods depending on the dimensions of the annuli. For example, a concave mirror/cylinder with a diameter of D = 100µm, has a central aperture diameter of C ...
Investigation of the Optical Properties of YAG:Ce Phosphor
... In a phosphor-converted white LED package, the backward yellow light will return to the phosphor layer after being reflected from the different components within the LED package. In this case, it is not known what will happen to the yellow light when it strikes the phosphor medium. To the best of ou ...
... In a phosphor-converted white LED package, the backward yellow light will return to the phosphor layer after being reflected from the different components within the LED package. In this case, it is not known what will happen to the yellow light when it strikes the phosphor medium. To the best of ou ...
GPS General Particle Source
... In the GLISUR model this is indicated by the value of polish; when it is <1, then a random point is generated in a sphere of radius (1-polish), and the corresponding vector is added to the normal. The value 0 means maximum roughness with effective plane of reflection distributed as cos(a). ...
... In the GLISUR model this is indicated by the value of polish; when it is <1, then a random point is generated in a sphere of radius (1-polish), and the corresponding vector is added to the normal. The value 0 means maximum roughness with effective plane of reflection distributed as cos(a). ...
The Equation of Number the Total Internal of Reflection Angles
... close to the axis and at various angles, allowing efficient coupling of light into the fiber .However, this high numerical aperture increases the amount of dispersion as rays at different angles have different path length and therefore take different times to traverse the fiber.In graded – index fib ...
... close to the axis and at various angles, allowing efficient coupling of light into the fiber .However, this high numerical aperture increases the amount of dispersion as rays at different angles have different path length and therefore take different times to traverse the fiber.In graded – index fib ...
Chapter 5. Mouse and Tackball
... and B quadrature signals. As shown in Figure 0-3 Optical encoder with quadrature outputs, the optomechanical system consists of a light source, usually a light emitting diode (LED), a photodetector, and the optointerrupter, which is connected to the rotating shaft of the mouse. The interrupter has a ...
... and B quadrature signals. As shown in Figure 0-3 Optical encoder with quadrature outputs, the optomechanical system consists of a light source, usually a light emitting diode (LED), a photodetector, and the optointerrupter, which is connected to the rotating shaft of the mouse. The interrupter has a ...
Other photon-lithographies
... • The photon density must be approximately one million times required to generate the same number of one photon absorptions. • The focal point of mode-locked pulsed lasers (very high peak power) can have such ...
... • The photon density must be approximately one million times required to generate the same number of one photon absorptions. • The focal point of mode-locked pulsed lasers (very high peak power) can have such ...
History of Fiber Optics
... that would ultimately solve the problem of optical transmission, although it was a long time before it was adapted for communications. It depended on the phenomenon of total internal reflection, which can confine light in a material surrounded by other materials with lower refractive index, such as ...
... that would ultimately solve the problem of optical transmission, although it was a long time before it was adapted for communications. It depended on the phenomenon of total internal reflection, which can confine light in a material surrounded by other materials with lower refractive index, such as ...
Measuring and Modelling Light Scattering in Paper
... To be able to accurately determine the reflectance characteristics of an object is of great importance in many fields. Apart from determining color and appearance attributes of objects, the information can also be used for such diverse purposes as restoration and conservation of art and for detectio ...
... To be able to accurately determine the reflectance characteristics of an object is of great importance in many fields. Apart from determining color and appearance attributes of objects, the information can also be used for such diverse purposes as restoration and conservation of art and for detectio ...
Optical Components and Devices for Next-Generation
... Forty-Gb/s optical modulators require an electrical-to-optical (E/O) bandwidth of over 30 GHz. However, there is a tradeoff between the E/O bandwidth and drive voltage, both of which depend on the parameters of the CPW electrodes. Conventionally, CPW electrodes with a narrow gap and short interactio ...
... Forty-Gb/s optical modulators require an electrical-to-optical (E/O) bandwidth of over 30 GHz. However, there is a tradeoff between the E/O bandwidth and drive voltage, both of which depend on the parameters of the CPW electrodes. Conventionally, CPW electrodes with a narrow gap and short interactio ...
the Quantifying Scatter PDF
... Scatter from discrete features, such as particles and pits, which do not completely fill the illuminated spot, must be treated differently. This is because changes in spot size, with no corresponding change in total incident power, will change the incident intensity (watts/unit area) at the feature ...
... Scatter from discrete features, such as particles and pits, which do not completely fill the illuminated spot, must be treated differently. This is because changes in spot size, with no corresponding change in total incident power, will change the incident intensity (watts/unit area) at the feature ...
375_Lo.pdf
... polarized control into the system. Hee et al. [6] had proposed a polarization-sensitive OCDR system that adds the capabilities of controlling the polarization state of light incident upon the sample and measuring the reflectivity of the light returning in particular polarization states. Up to the pr ...
... polarized control into the system. Hee et al. [6] had proposed a polarization-sensitive OCDR system that adds the capabilities of controlling the polarization state of light incident upon the sample and measuring the reflectivity of the light returning in particular polarization states. Up to the pr ...
The measurement of rough surface topography using coherence
... The purpose of this guide is to describe good practice for the measurement and characterisation of rough surface topography using coherence scanning interferometry (commonly referred to as vertical scanning white light interferometry). This guide is aimed at users of coherence scanning interferometr ...
... The purpose of this guide is to describe good practice for the measurement and characterisation of rough surface topography using coherence scanning interferometry (commonly referred to as vertical scanning white light interferometry). This guide is aimed at users of coherence scanning interferometr ...
Unit 1.6 Optical Switching - DIT School of Electronics and
... Optical spectral monitoring receives a small optically tapped portion of the aggregated WDM signal, separates the tapped signal into its individual wavelengths, and monitors each channel’s optical spectra for wavelength accuracy, optical power levels, and optical crosstalk. OSM usually wraps softwar ...
... Optical spectral monitoring receives a small optically tapped portion of the aggregated WDM signal, separates the tapped signal into its individual wavelengths, and monitors each channel’s optical spectra for wavelength accuracy, optical power levels, and optical crosstalk. OSM usually wraps softwar ...
Imaging and Non-imaging System Modeling in ASAP
... General system performance requirements dictate the optical configuration from concept to first-order to final design. There are many different and sometimes industry-specific performance requirements for systems using imaging and illumination systems. The primary optical performance requirements fo ...
... General system performance requirements dictate the optical configuration from concept to first-order to final design. There are many different and sometimes industry-specific performance requirements for systems using imaging and illumination systems. The primary optical performance requirements fo ...
Post-print of: J. Mater. Chem. , 2010, 20, 6408
... of these two latter multilayers present a well controlled tortuosity and are quite homogenous in thickness and optical properties along the whole sample surface (i.e., 2.5 × 2.5 cm2). As a consequence of the periodic variation of the refractive index in the direction perpendicular to the substrate, ...
... of these two latter multilayers present a well controlled tortuosity and are quite homogenous in thickness and optical properties along the whole sample surface (i.e., 2.5 × 2.5 cm2). As a consequence of the periodic variation of the refractive index in the direction perpendicular to the substrate, ...
PDF
... multiple interference orders were generated in the far field due to the antenna spacing being larger than a half wavelength. While it is generally desirable to emit just a single order, multiple OAM beams can be used, for example, to simultaneously trap and rotate multiple particles in optical micro ...
... multiple interference orders were generated in the far field due to the antenna spacing being larger than a half wavelength. While it is generally desirable to emit just a single order, multiple OAM beams can be used, for example, to simultaneously trap and rotate multiple particles in optical micro ...
PDF
... Phase profiles are imprinted on the wavefront of a collimated beam from a continuous wave ytterbium-doped fiber laser (IPG Photonics, λ = 1064 nm) using an electronically addressed, reflective SLM (P512-1064, Boulder Nonlinear Systems). The SLM is operated in a phaseonly mode which controls the phas ...
... Phase profiles are imprinted on the wavefront of a collimated beam from a continuous wave ytterbium-doped fiber laser (IPG Photonics, λ = 1064 nm) using an electronically addressed, reflective SLM (P512-1064, Boulder Nonlinear Systems). The SLM is operated in a phaseonly mode which controls the phas ...
ray optics and optical instruments
... We have derived here the mirror equation, Eq. (9.7), and the magnification formula, Eq. (9.9), for the case of real, inverted image formed by a concave mirror. With the proper use of sign convention, these are, in fact, valid for all the cases of reflection by a spherical mirror (concave or convex) ...
... We have derived here the mirror equation, Eq. (9.7), and the magnification formula, Eq. (9.9), for the case of real, inverted image formed by a concave mirror. With the proper use of sign convention, these are, in fact, valid for all the cases of reflection by a spherical mirror (concave or convex) ...