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... York, Albany, NY, USA Improving spatial resolution has been a major goal of scanning electron microscope (SEM) development since the first commercial instrument was introduced in the mid-1960s. An area of particular interest to modern users is Low Voltage SEM or LV-SEM (< 5 KeV). LV-SEM offers a mor ...
... York, Albany, NY, USA Improving spatial resolution has been a major goal of scanning electron microscope (SEM) development since the first commercial instrument was introduced in the mid-1960s. An area of particular interest to modern users is Low Voltage SEM or LV-SEM (< 5 KeV). LV-SEM offers a mor ...
O 28: Plasmonics and Nanooptics IV: Light
... Circular dichroism is a phenomenon that describes the extinction difference in chiral objects when excited by left and right-handed circular polarized light. While the circular dichroism of single biomolecules is rather low, the signal can be enhanced by several orders of magnitude using artificial, ...
... Circular dichroism is a phenomenon that describes the extinction difference in chiral objects when excited by left and right-handed circular polarized light. While the circular dichroism of single biomolecules is rather low, the signal can be enhanced by several orders of magnitude using artificial, ...
Chapter 1 - Liceo Crespi
... Snell’s law and the refraction of light For light that travels from a medium with refractive index n1 into a medium with refractive index n2 – the incident ray, refracted ray, and normal to the interface between the materials all lie in the same plane – the angle of incidence θ1 is related to the a ...
... Snell’s law and the refraction of light For light that travels from a medium with refractive index n1 into a medium with refractive index n2 – the incident ray, refracted ray, and normal to the interface between the materials all lie in the same plane – the angle of incidence θ1 is related to the a ...
Optical Computers (Erin Raphael, 2006)
... Change in voltage changes absorption properties in quantum well layers. Stackable Small size Low power Easily made Compatible with standard fabrication techniques for current logic gates. ...
... Change in voltage changes absorption properties in quantum well layers. Stackable Small size Low power Easily made Compatible with standard fabrication techniques for current logic gates. ...
Direct index of refraction measurement at extreme
... The absorptive part β(ω) of the refractive index at EUV wavelengths is well-tabulated by photoabsorption measurements. However, the real (dispersive) part of the refractive index δ(ω) at EUV wavelengths is less accurately known. Interferometry, which can provide independent measurements of δ and β, ...
... The absorptive part β(ω) of the refractive index at EUV wavelengths is well-tabulated by photoabsorption measurements. However, the real (dispersive) part of the refractive index δ(ω) at EUV wavelengths is less accurately known. Interferometry, which can provide independent measurements of δ and β, ...
Optical Microscopy and 4 Pi Microscopy
... decreases with increasing magnification • Resolving capability depends on wavelength of optical light (400 – 700 nm), objective lens, and sample itself. ...
... decreases with increasing magnification • Resolving capability depends on wavelength of optical light (400 – 700 nm), objective lens, and sample itself. ...
Applications(2)
... • The intensity of the reflected light vs. incident angle will have a minimum that corresponds to the resonant frequency. From the location and magnitude of this minimum the concentration of the analyte can be determined.” Surface plasmon resonance sensors using optical grating • In this technique, ...
... • The intensity of the reflected light vs. incident angle will have a minimum that corresponds to the resonant frequency. From the location and magnitude of this minimum the concentration of the analyte can be determined.” Surface plasmon resonance sensors using optical grating • In this technique, ...
Wide-field extended-resolution fluorescence
... The concept of a perfect lens realized with negative refractive index materials was recently proposed [1]. Surface plasmon resonance (SPR) – resonant energy transfer from incident photons to electron density oscillations along a metal-dielectric interface – helps to enhance weak evanescent waves, w ...
... The concept of a perfect lens realized with negative refractive index materials was recently proposed [1]. Surface plasmon resonance (SPR) – resonant energy transfer from incident photons to electron density oscillations along a metal-dielectric interface – helps to enhance weak evanescent waves, w ...
ULTRAFAST MEASUREMENT OF THE OPTICAL
... The experimental arrangement for USI is shown schematically in Fig. 1. The thin film targets were mounted on a computer-controlled x-y translation stage. The target was rastered about 4 laser diameters between experiments so that each laserdriven shock would propagate into undisturbed material. Expe ...
... The experimental arrangement for USI is shown schematically in Fig. 1. The thin film targets were mounted on a computer-controlled x-y translation stage. The target was rastered about 4 laser diameters between experiments so that each laserdriven shock would propagate into undisturbed material. Expe ...
Palladium Ultra Thin Layer Profiles Evaluation by Evanescent Light
... DELI is an optical evanescent waves microscopy technique based on capturing the light extracted by nano layers deposited on a substrate which also serves as a waveguide [2,3]. The DELI technique used in this investigation is a far field optical microscopy measurement technique developed to achieve a ...
... DELI is an optical evanescent waves microscopy technique based on capturing the light extracted by nano layers deposited on a substrate which also serves as a waveguide [2,3]. The DELI technique used in this investigation is a far field optical microscopy measurement technique developed to achieve a ...
Novel methods used to test large flat mirrors
... for meter-class mirrors, the CP process becomes less feasible because the tool diameter of a CP machine must be three times larger than the parts being produced. Overcoming these challenges will enable the manufacture of high-precision large flat mirrors for space-based and astronomical applications ...
... for meter-class mirrors, the CP process becomes less feasible because the tool diameter of a CP machine must be three times larger than the parts being produced. Overcoming these challenges will enable the manufacture of high-precision large flat mirrors for space-based and astronomical applications ...
From a flat mirror, designer light — Harvard School of Engineering
... who was co-principal investigator for this work. "The reflected beam can bounce backward instead of forward. You can create negative refraction. There is a new angle of total internal reflection." Moreover, the frequency (color), amplitude (brightness), and polarization of the light can also be cont ...
... who was co-principal investigator for this work. "The reflected beam can bounce backward instead of forward. You can create negative refraction. There is a new angle of total internal reflection." Moreover, the frequency (color), amplitude (brightness), and polarization of the light can also be cont ...
ECE 463/626: Optoelectronics Instructor: Prof. H. Grebel, Rm 302
... Course Description: The course addresses electronic and optical devices on the micron and nano-scales. Nano-scale optoelectronic devices (optical devices controlled by electronics and electronic devices controlled by optics) find themselves in the forefront of communication and sensing systems. Trad ...
... Course Description: The course addresses electronic and optical devices on the micron and nano-scales. Nano-scale optoelectronic devices (optical devices controlled by electronics and electronic devices controlled by optics) find themselves in the forefront of communication and sensing systems. Trad ...
Optical Coherence Tomography
... involving integrated devices. Various methods were developed for the non-invasive measurement of refractive index, extinction coefficient and film thickness [7–10]. OCT-based techniques for material characterization were also proposed [11–13], as they offer the capability to characterize thick layer ...
... involving integrated devices. Various methods were developed for the non-invasive measurement of refractive index, extinction coefficient and film thickness [7–10]. OCT-based techniques for material characterization were also proposed [11–13], as they offer the capability to characterize thick layer ...