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Quasi-Static Capacitance-Voltage measurement setup for organic thin-film transistors Bachelor project: Capacitance-Voltage (C-V) measurement is a technique for characterizing semiconductor materials and devices. C-V measurements can reveal dielectric thickness, dielectric charges, contamination from mobile ions and interface trap density. C-V measurement can be performed in different ways such as using a LCR meter or using a DC ramp, called Quasi-Static (QS). The objective of this internship is to develop an automated QSCV measurement setup and to assess the results by comparing with LCR-CV at different frequencies. This could then be implemented as a new feature into the automated transistor measurement platform. Timeframe: 4 months Knowledge/Skills required: Labview programming, Electronics, Electrical measurement. CSEM responsibles: Dr. Zbigniew Szamel ([email protected]) and Dr. Wolfgang Tschanun ([email protected])
