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Transcript
US008835204B2
(12) United States Patent
sm et a].
(54)
METHOD FOR MANUFACTURING
(52)
Sep. 16, 2014
vs. C].
MULTI-DIMENSIONAL TARGET
WAVEGUIDE GRATING AND VOLUME
GRATING WITH MICRO-STRUCTURE
CPC .......... .. H01S 5/2031 (2013.01); G021; 5/1057
QUASI-PHASE-MATCHING
USPC
(2013.01); G021; 5/1023 (2013.01); G021;
6/1225 (2013.01)
(58)
438/32;438/31;385/27;385/37;
Field of Classi?cation Search
USPC ........... .. 438/32, 31; 385/27, 37, 15; 359/578,
Chen, Nanjing (CN)
359/579; 708/400
See application ?le for complete search history.
(73) Assignee: Nanjing University, Nanjing (CN)
Notice:
................. ..
385/15; 359/578; 359/579; 708/400
(75) Inventors: Yuechun Shi, Nanjing (CN); Xiangfei
(*)
US 8,835,204 B2
(10) Patent N0.:
(45) Date of Patent:
Subject to any disclaimer, the term of this
patent is extended or adjusted under 35
(56)
References Cited
U.S. PATENT DOCUMENTS
U.S.C. 154(b) by 0 days.
5,852,688 A *
12/1998
Brinkman et a1. ............ .. 385/16
(21) Appl. No.:
13/977,718
6,067,391
A
*
5/2000
Land
6,285,813
B1*
9/2001
Schultz et al.
(22)
PCT Filed:
Dec. 30, 2011
6,640,034 B1* 10/2003 Charlton et al.
(86)
PCT No.:
PCT/CN2011/085067
§ 371 (0X1)’
(2), (4) Date:
Jun. 30, 2013
6,393,172 B1*
7,454,103
(87)
. . . ..
385/27
. . . ..
385/37
5/2002 Brinkman et a1. .
11/2008
Parriaux
. . . . . . . . . . . . .
2005/0033787 A1*
2/2005 Stepanov et al.
2008/0069497 A1*
3/2008
CN
CN
CN
CN
PCT Pub. Date: Jul. 12, 2012
2004100075305
2004100091670
101924326
102147492
Tissot et al.
385/16
385/122
. . . ..
385/37
708/400
.... .. 385/37
Nov. 7, 2013
A
A
A
A
1/2005
2/2005
12/2010
8/2011
OTHER PUBLICATIONS
Prior Publication Data
US 2013/0295703 A1
.....
FOREIGN PATENT DOCUMENTS
PCT Pub. No.: WO2012/092828
(65)
B2*
. . . . . . . . . . . . . . . . . .
Yating Zhou et al. Equivalent A-/4 Phase Shift to Improve the Single
Longitudinal Mode Property of Asymmetric Sampled Bragg Grating
(30)
Foreign Application Priority Data
Jan. 6, 2011
(51)
(CN) ........................ .. 2011 1 0001786
Int. Cl.
Greiner, Dmitri IaZikov, and Thomas W. Mossberg, Optical add-drop
multiplexers based on the antisymmetric waveguide Bragg grating,
(2006.01)
(2006.01)
(2006.01)
(2006.01)
(2006.01)
(2006.01)
(2006.01)
(2006.01)
H01L 21/00
G021; 6/26
G021; 6/42
G021; 6/34
G021; 27/00
G021; 5/10
H01S 5/20
G021; 6/122
Semiconductor Laser. Microwave Photonics, 2010 IEEE Topical
Meeting. pp. 89-92, ISBN 978-1-4244-7825-5.
Xu Mai, Research Progress on Waveguide Gratings for integrated
Optics “Chinese Journal of Luminescence ”,2005, 26 (4) ; 415-425.
Jose M. Castro, David F. Geraghty, Seppo Honkanen, Christoph M.
Applied Optics, 2006,45(6); 1236-1243.
Ming Li,Yaming Wu, Jiangyi Yang, and Hongchang Qu, Return loss
reduction of integrated grating-assisted optical Add/Drop multi
plexer by control the re?ective spectrum, Journal of lightwave tech
nology , 2005, 23(3): 1403-1409.
Jose M. Castro, David F. Geraghty, Demonstration of mode conver
sion using anti-symmetric waveguide Bragg gratings, Optics
Express, 2005, 13(11): 4180-4184.
WAVE vector ummampm
Phase matching condition is
satisfied
Wveacvtoer
ofstWveahcvteodr
Wave vector of the target
equivalent grating
Incident light
US 8,835,204 B2
Page 2
Yitang Dai, Xiangfei Chen, Li Xia, Yejin Zhang, and ShiZhong Xie,
(57)
ABSTRACT
Sampled Bragg grating with desired response in one channel by use
of reconstruction algorithm and equivalent chirp, Optics Letters,
2004, 29(12): 1333-1335.
Yitang Dai and Xiangfei Chen, DFB semiconductor lasers based on
reconstruction-equivalent-chirp
technologyOptics
Express,
2007,15(5) : 2348-2353.
Jingsi Li,Huan Wang, Xiangfei Chen, Zuowei Yin, Yuechun Shi,
Yanqing Lu, Yitang Dai and Hongliang Zhu, Experimental demon
A method for manufacturing a multi-dimensional target
waveguide grating and volume grating with micro-structure
quasi-phase-matching. An ordinary waveguide grating is
used as a seed grating, and on this basis, a two-dimensional or
three-dimensional sampling structure modulated with a
refractive index, that is, a sampling grating, is formed. The
stration of distributed feedback semiconductor lasers based on recon
sampling grating comprises multiple shadow gratings, and
struction-equivalent-chirp technology. Optics Express, 2009, 17(7) :
one of the shadow gratings is selected as a target equivalent
5240-5245.
grating. A sampled grating comprises Fourier components in
Jingsi Li, Xiangfei Chen, NingZhou, etc, Monolithically integrated
many orders, that is, shadow gratings, a corresponding grat
ing wave vector is [Formula 1], and the grating pro?le of all
the shadow gratings changes with the sampling structure
30-wavelength DFB laser array, Proc.of SPIE-OSA-IEEE, 2009,
SPIE 7631, 763104.
J .A. Armstrong, N. Bloembergen, J .Ducuing, and P.S.Pershan. Inter
actions between light waves in a nonlinear dielectric, Physical
review, 1962, 127(6) : 1918-1939.
Shi-ning Zhu, Yong-yuan Zhu, Nai-ben Ming, Quasi-Phase-Matched
third-harmonic generation in a quasi-periodic optical superlattice,
Science, 1997, 278 (843).
The ?rst of?ce action for corresponding Chinese application CN
2011101048752, dated Nov. 30, 2011.
* cited by examiner
Primary Examiner * Evan Pert
[Formula 2]. In a case where a seed grating wave vector
[Formula 3] and a required two-dimensional or three-dimen
sional grating wave vector do not match, a certain Fourier
periodic structure component of the Fourier components of
the sampling structure is used to compensate for the wave
vector mismatch. The manufacturing method may be applied
to design and manufacture a multi-dimensional target
waveguide grating and volume grating for any grating pro?le,
and may simplify the grating manufacturing process and also
make possible a variety of grating-based photon devices.
Assistant Examiner * Gustavo Ramallo
(74) Attorney, Agent, or Firm * Treasure 1P Group
13 Claims, 13 Drawing Sheets
US. Patent
Sep.16,2014
Sheet10f13
US 8,835,204 B2
wave vactor of the sampling
strunture’s Faurim subgrating
m5>2 ;>
U
Seed grating
a
w
FIG. 1
US. Patent
Sep. 16, 2014
Sheet 2 0f 13
US 8,835,204 B2
Phase matching condition is
satisfied
1:
cu
cu
0:
cu
.C
u|-l
5
e
o
l
8
o\
x,
. ‘0
a?
> m
v
a“
“‘* a:
a,
m C
<6
i“ Q"
a.
,Q
E m
J
i
Wavs vest-m? cf the target
i»
s 33* 539
v9.
*2?
Q in 4:»
0
' l.
?
‘1",
w "
f '
squivaient grating
Incident light
FIG. 2
if:
3i"
'
'
i
'1?
2*?
é"
Q
US. Patent
Sep. 16, 2014
Sheet 3 0f 13
US 8,835,204 B2
Samgiing
straautrez
Samgiing
strumtrei
'
FIG. 3
¢
incident ?ghts
US. Patent
Sep. 16, 2014
Sheet 4 0f 13
US 8,835,204 B2
%.
Chirped. seed
A: :3
v
A
A 21 A “
FIG. 4
gmii?g
US. Patent
Sep. 16, 2014
Sheet 5 0f 13
US 8,835,204 B2
LM
"x, iwn {i pimw
giaiff in 3am?!ng
,l
1
FIG. 5
structure.
US. Patent
Sep.16,2014
Sheet60f13
+
3$2%;
FIG. 6
US 8,835,204 B2
US. Patent
Sep.16,2014
Imammw58%Z?mm:.ma9w.
Sheet70f13
,7
v
M
W,if
A,»
7
w
/
i,
ff,
./
\
FIG. 7
,\
US 8,835,204 B2
US. Patent
Sep. 16, 2014
Sheet 8 0f 13
US 8,835,204 B2
Re?ected.
with
W. anglal
getqrauiv entg
\
‘Re?eeted
with
angieZ
HM!
incident ?ght
FIG. 8
US. Patent
Sep. 16, 2014
g3%ang “bEMwa
Sheet 9 0f 13
US 8,835,204 B2
US. Patent
Sep. 16, 2014
Sheet 10 0f 13
(c)Phase matching condition
Wave water of m target
a-quivaimt garati?g
imam sigh:
FIG. 9c
US 8,835,204 B2
US. Patent
Sep. 16, 2014
Sheet 11 0f 13
Z1.1m;
FIG. 9d
US 8,835,204 B2
US. Patent
Sep. 16, 2014
Sheet120f13
3.»5?%
FIG. 10
US 8,835,204 B2
US. Patent
Sep. 16, 2014
Sheet 13 0f 13
US 8,835,204 B2
US 8,835,204 B2
1
2
METHOD FOR MANUFACTURING
MULTI-DIMENSIONAL TARGET
WAVEGUIDE GRATING AND VOLUME
GRATING WITH MICRO-STRUCTURE
[4] are achieved. In actual design, it is necessary to achieve
different functions of the waveguide grating in a single pho
tonic chip, which means different grating pro?les have to be
written individually for different functions. In particular, in
QUASI-PHASE-MATCHING
order to achieve different grating directions, cycles, phase
CROSS REFERENCE TO RELATED
APPLICATION
This application is a National Phase application of, and
claims priority to, PCT Application No. PCT/CN2011/
10
consuming properties of E-Beam lithography have increased
the dif?culty and cost of fabrication and limited its large-scale
085067, ?led on Dec. 30, 2011, entitled “METHOD FOR
implementation.
MANUFACTURING MULTI-DIMENSIONAL TARGET
WAVEGUIDE GRATING AND VOLUME GRATING
In order to solve this practical problem, Chen Xiangfei et al
?rst proposed an effective solution to simplify the fabrication
WITH MICRO-STRUCTURE QUASI-PHASE-MATCH
ING”, which claimed priority to Chinese Application No
2011100017865, ?led on Jan. 6, 201 1. Both the PCT Appli
cation and Chinese Application are incorporated herein by
of ?ber gratings, and they called it “Reconstruction-Equiva
lent-Chirp (REC) technology” [5-6]. With this technology,
we can fabricate a nano-scale grating structure with micron
reference in their entireties.
20
TECHNICAL FIELD
This invention belongs to the ?eld of optoelectronic tech
nology involving ?ber-optic communications, photonic inte
gration, photoelectric sensing as well as other optoelectronic
information processing technologies. The main idea of the
25
invention is to propose the micro-structure of quasi-phase
matching technology (i.e. MS-QPM) with which we can
equivalently realize any target grating structure for the two
dimensional planar waveguide Bragg grating or three-dimen
scale precision. This method has also been successfully
applied to the design and fabrication of the distributed feed
back (DFB) semiconductor laser and the DFB laser array
[7-9], which provides an effective solution for high perfor
mance of semiconductor laser array in photonic integration.
In order to further solve the monolithic integration problem of
different waveguide gratings with complex structure in the
planar photonic integration and to lower the fabrication costs,
based on the previous research of the applicants of this inven
tion, the applicants propose a micro-structure quasi-phase
matching (MS-QPM) technology. This technology not only
30
sional volume grating using the sampling structure. Based on
this design idea, the applicants also propose a variety of new
provides a new method of design and fabrication of the
waveguide grating with two or three dimensions, but also
gives some novel grating structure and corresponding optical
properties of waveguide gratings or volume gratings. For
photonic devices such as new wavelength division multi
plexer or ?lter without retro -re?ection, tilted waveguide grat
ing, DFB semiconductor lasers with suppressed 0th channel
based on the reconstruction equivalent chirp technology as
well as directional coupler and power splitters.
shifts, chirps and even arbitrary structures in the same chip,
the traditional low-cost holographic exposure is almost
impossible to actualize. Therefore, more advanced nano-fab
rication technology, such as electron beam (E-Beam) lithog
raphy, is often utilized. However, the high cost and time
instance, we can change the grating period and even rotate the
35
grating directions equivalently and simultaneously by sam
pling in the same seed grating. The REC technology is a
special one-dimensional case of the micro-structure of quasi
phase matching (MS-QPM) [5]. The mathematical expres
sion of this technology shares some similarities with the
BACKGROUND
40
famous quasi-phase matching (QPM) described in non-linear
With the advancement of computer network technology,
the demand for information is increasing exponentially. Over
the past decade, the fast development of Internet and the
optical materials [10,11], and therefore it can be considered
as a new discovery and development of quasi-phase matching
technology. In summary, this technology can achieve arbi
accompanying huge requirement for information transmis
sion not only call for a more advanced ?ber communication
trary shape of two or three-dimensional gratings by changing
the large-scale sampling structure while keeping the seed
system, but also demands the development of advanced ?ber
communication technology. This is especially true for optical
two or three-dimensional grating structure can be achieved as
grating period unchanged. Any of the physical achievable of
long as the two or three dimensional gratings design is used
by sampling structure with micrometer scale and uniform
communication devices. This new demand requires new theo
ries and cost-effective devices to support the further develop
ment of optical networks. Fortunately, the photonic integra
tion circuits (PICs) technology developed in recent years
50
conforms to the development of times and is opening a new
era of optical networks. PICs technology is considered to be
the cutting-edge and the most promising technology of opti
cal communications. In the SiliconValley of the United States
seed grating. With this structure we can achieve a variety of
optical properties of the waveguide grating or volume grating
55
with the ?ne grating structures. We only need to change the
sampling structure while keep the seed grating uniform. The
sampling structure size is normally a few micrometers, the
implementation of this method only requires a standard holo
graphic exposure technique with conventional photolithogra
of America, In?nera Corporation has realized the integration
of a large number of complex optoelectronic integrated
devices with indium phosphide and other materials, lowering
phy technique. This greatly eases fabrication process and
the cost of optical communication while increasing its capac
idea of two or three-dimensional sampled grating structures
ity. In the ?eld of passive optical devices, Bragg grating
substantially improves productivity and product quality. The
60
waveguide shows an excellent property of wavelength selec
tivity and has been used in a variety of optical communication
devices and photonic integrated devices, such as planar inte
can be used to design new photonic devices, such as wave
length division multiplexer, which until now are array
waveguide grating (AWG) and multimode interference
wavelengths waveguide grating assisted components
(MMI) in the mainstream market. These existing devices
have high requirement for waveguide accuracy, aside from
relatively large size. Based on this two-dimensional sampling
structure, combined with Bragg grating re?ection principle,
(OADM) [2-3], tilted waveguide grating mode converter, etc.
we can make a new compact wavelength division multiplexer.
grated Bragg grating waveguide ?lter [1] with which multi
plexer/demultiplexer or ?lter of light signal with different
65
US 8,835,204 B2
4
3
coe?icient, n denotes the nth Fourier order and
describes all the Fourier components of the sampled
In addition, some other photonic devices such as ?lter without
retrore?ection, DFB semiconductor lasers with suppressed
0th channel resonance based on the Reconstruction-Equiva
grating, i.e. the ghost gratings or sub-gratings.
lent-Chirp technology, directional coupler and power splitters
According to Eq.(3), there are a series of ghost gratins
of any angle, optical waveguide mode converter, any other
photonic devices based on waveguide grating and the volume
All
in the
ofsampled
these ghost
grating
gratings
with their
can be
wave-vector
changed with the
grating, can be achieved. We believe this method can open a
new avenue and bring a new dawn to the design of planar
sampling structure S[?]. And nth order wave-vector
of the ghost grating FA?) corresponds to the sum
mation of the wave-vectors of the seed grating Koand
photonic integration and other relative photonic devices.
The main idea of this invention is to propose the micro
structure of quasi-phase matching technology. Based on this
technology, the target waveguide grating or volume
waveguide grating with any grating shape and the corre
sponding photonic devices can be achieved by two or three
dimensional sampling structures using a uniform grating.
of the nth order sampling structure’ s Fourier sub-grat
ing 654?). According to equation (3), the wave
vector of the target equivalent grating) TgN (Y) can be
expressed as,
SUMMARY OF THE INVENTION
If the wave-vector of the target equivalent grating T<>N(
A method to fabricate a multi-dimensional target
waveguide and volume grating. Any kind of two or three
~>
20
dimensional (2D or 3D) target grating with arbitrary grating
.
~>
r ) equals to the wave-vector of the target grating k d
structure can be realized if it is physically realizable. The
(Y), that is, YN (Y) :Yd (Y). Y, (Y) is the wave
common waveguide Bragg grating or volume grating is used
vector of the seed grating, 65A, (Y) is the wave-vector
as the seed grating. Its period can be uniform and varies from
50 nm to 1000 nm. The 2D or 3D sampled grating is then
formed with refractive-index-modulated sampling structure.
of the target sampling structure’ s Fourier sub-grating,
25
Among the multiple ghost gratings or sub-gratings in the
sampled grating structure, one is selected as the target equiva
lent grating.The wave-vector of the seed grating is KO(?), the
wave-vector of the light is Kand the wave vector difference
30
vector of the seed grating F0 (Y) mismatches the
expressed as
AnS(Y):5[Y]-An(Y)
(2)
ied, then the arbitrary target grating structure can be
equivalently realized. In other words, when the wave
wave-vector of the required 2D or 3D target grating ,
one of the Fourier sub-gratings in the sampling struc
ture i.e., the wave-vector of the target sampling struc
between light and the seed grating is Algwhich can be
AY:Y-FO(Y)
(1)
The refractive index modulation of the sampled grating
with arbitrary sampling structure and uniform seed grat
ing can be expressed as,
TgN (Y) can be changed with the sampling structure:
By changing the periodic distribution of the sampling
structure S[?], the wave-vector 65A, (Y) can be var
35
ture’ s Fourier sub-grating 65A, (Y) is used to compen
sate this mismatch. Therefore, an additional target
sampling structure’s Fourier sub-grating is employed
40
here to keep the phase difference equals to zero during
the optical transmission process, and the following
phase match is also satis?ed.
Here S[?]is the sampling structure and An(?) is the
refractive index modulation depth of the seed grating ;
According to Eq.(3), the phase of the sampled grating is
Ydenotes the space vector. Based on the Fourier
analysis, equation (2) can be further expressed as,
45
also a function of space. Specially the phase of the
uniform ghost grating can be expressed as,
expvfin-YiexpW'O-Y»
(6)
If there is a phase shift in the sampling structure, and the
50
shift value is A? , a phase shift will also exist in the
sampling structure’s Fourier sub-grating. The corre
sponding phase of the ghost grating can be described
as,
exp U6..-<Y+AY'>1expo<K’O-Y>>IeXpU6..-<Y>1expo<
Here j denotes an imaginary number, 65,4?) is the
55
wave-vector of the nth order Fourier component of the
.
‘>
.
sampling structure; KO ( r ) is the wave-vector of the
seed grating and it can be further expressed as
60
7307))6XPUE’M'A7')
(7)
The corresponding phase shift of the ghost-grating
has a magnitude of exp?asnAf').
For a uniform seed grating, G’sn-AY':¢. So a phase shift
¢is introduced in the nth order ghost grating of the
sampled grating.
(7)
is the period of the seed grating and Y0 denotes the
direction of the seed grating. Cn(?) is the Fourier
65
The refractive-index modulation, which corresponds to the
Fourier coe?icient Cn(?), can also be changed with the
pattern or shape in one sampling period, such as the duty
cycle. In the 2D case, the refractive-index modulation
can also be equivalently changed by this method. The
US 8,835,204 B2
6
5
suitable shape in one sampling period to get the largest
corresponding refractive index modulation intensity is 0.2 or
larger. The stopband of the transmission light is up to 40 nm
refractive-index modulation intensity can be obtained
from the Fourier analysis.
The characteristic of the MS-QPM technology as
described in claim 1: the target equivalent grating with arbi
trary structures, such as the tilted/arc grating or chirped/phase
based on Reconstruction-equivalent-chirp (REC) technology
shifted grating is realized by the MS-QPM technology, as
with the suppressed 0th order resonance can be fabricated.
long as the grating structure is physically realizable. There are
a series of Fourier components, which are called ghost grat
The period of the seed grating keeps uniform but tilted with an
included angle (2° to 1 5° ) between the direction of the wave
ings, with their wave-vectors Of kn (f) in the sampled grat
vector KO(?) and the axial direction of the waveguide work
ing as resonant cavity. Correspondingly, the designed sam
pling structure is also tilted with some tilted angle, Therefore,
according to Eq.(4), the direction of the target equivalent
grating’s wave-vector kN (F) Will be rotated to be parallel to
the axial direction of the resonant cavity. When designing, the
Fourier order N is usually equal to :1. The speci?c tilted
angle of the seed grating wave-vector k0 (Y) can be deter
mined according to the effect on the suppression of Oth order
or even wider, which can cover one whole optical communi
cation window.
In the present invention, the DFB semiconductor laser
ing structure. According to Eq.(4) and (5), in order to obtain
a speci?c target equivalent grating, i.e., the ghost grating with
a certain Fourier order, the corresponding sampling structure,
i.e., sampling period distribution, should be designed via
compo sing the grating wave-vectors. Furthermore, according
to Eq.(4), to change the direction of the grating, the target
equivalent grating with arbitrary directions or arc pro?les can
be realized by changing the direction of the wave-vector of
sampling structure’s Fourier sub-grating
In addi
20
tion, to realize the multiple-dimension phase shifted grating,
only the phase shift in the sampling structure is required
according to Eq.(5)-(7). In contrast, to realize the chirped
grating, the sampling period and direction of the sampling
structure are needed to be changed in space. For the fabrica
25
tion process, the period of the uniform seed grating is usually
in the order of several hundred nanometers, thus it facilitates
the fabrication process via the traditional holographic expo
sure by interference method, or by means of the near ?eld
holographic exposure. In contrast, the scale of the sampling
structure is usually in the order of several micrometers, which
is also very straightforward to be fabricated using the com
mon photolithography technology.
In the present invention, the characteristics of the MS
QPM technology as applied to fabricate the WDM multi
plexer/demultiplexer based on the waveguide grating or the
volume grating are the two methods to design the multiplexer/
demultiplexer. The ?rst method is the cascade sampling struc
30
of the corresponding wave-vector. So the target equivalent
grating in each section of the sampled grating diffracts a light
beam with certain frequency (Bragg wavelength), while the
seed grating keeps uniform. The second method is adopting
sampling period is also uniform but there is a tilted angle
between the wave-vector of the target sampling structure’s
35
target equivalent grating kN (f) and the axial direction of the
waveguide according to Eq.(4). This tilted angle is usually
40
trary coupling direction, can be fabricated based on the MS
QPM technology. The sampling structures are different in
45
gratings with different directions in different sections of the
waveguide will re?ect incident light with a speci?c wave
length along different directions. Each of the re?ective direc
50
tions can be designed on purpose. The detailed parameters
can be calculated according to Eq.(4). Therefore, the direc
tional coupler can be realized. If the refractive-index modu
lation is properly designed, the sampled grating only re?ects
re?ected in the same direction and couple into one single
a portion of the incident light power. Then, the power divider
55
can be obtained.
The refractive-index modulation intensity is usually designed
multiplexer/demultiplexer devices are determined by the
number of the channels. Usually, the sampling period of the
multiplexer/demultiplexer grating varies from 0.5 to 20 pm
from 0.001 to 0.2. The larger refractive-index modulation
intensity of the target equivalent grating will lead to a higher
60
In the present invention, Bragg grating ?lter can be fabri
diffractive e?iciency.
In the present invention, the arbitrary volume grating ?lter
and volume grating based photonic device can be fabricated
based on the MS-QPM technology, The seed grating keeps
uniform and the sampling structure can be realized by photo
cated based on the MS-QPM technology. If there are two
equivalent rcphase shifts inserted in the 1/4 and 3/ 4 positions
of the target equivalent grating, a narrow pass-band will be
established in the middle of the stopband. The equivalent
rcphase shift can be realized by Eq. (5) to (7). Usually the
cavity length varies from about 50.0 pm to 5000.0 pm, the
different sections of the waveguide for the power divider or
the directional coupler. The corresponding target equivalent
other hand, the lights with different frequencies (wave
lengths) propagating in given directions and positions, will be
for a two-dimensional waveguide.
designed to be from 2° to 15°.
In the present invention, the power divider with arbitrary
power division ratio, and the directional coupler with arbi
directions. Hence, the demultiplexer can be achieved. On the
waveguide, following the Bragg diffraction conditions. So the
multiplexer can be realized. The total cavity length of the
Fourier sub-grating USA, (T) and the seed grating. Hence,
there will be a tilted angle between the wave-vector of the
the sampled grating with chirped seed gating. The seed grat
ing is chirped and the sampling structure keeps uniform.
Therefore, by the aid of different target equivalent gratings in
different sections of the sampled grating, the light with dif
ferent frequencies (wavelengths) will be re?ected in different
parameters of the seed grating and the sampling structure can
be determined according to Eq.(4). The period of the sam
pling structure usually varies from 0.5 to 20 pm. The larger
title angle will lead to a better suppression effect. When the
tilted angle is larger than 10° , the light resonance of the Oth
order channel can be fully suppressed.
In the present invention, the tilted waveguide grating can be
fabricated with the following characteristic: The uniform
seed grating is used and the direction of the wave-vector k0
(F) is designed according to the actual requirement. The
ture which consists of several sections in the two dimensional
waveguide grating. Each section is of the particular sampling
structure including particular sampling period and direction
channel’ s resonance. Usually the tilted angle is from 2° to 15°
, which enables a good suppression. The detailed designing
mask using the common photolithography method. The sam
65
pling structure can be designed according to the equations
from Eq.(3) to Eq.(7). Therefore, the required target grating
structure can be realized by the target equivalent grating.
US 8,835,204 B2
8
7
In the present invention, the waveguide grating based pho
effective refractive index of 1.455. The thickness of the
core layer is 2 pm. The wave-vector of the seed grating
tonic device with ?ne grating structure can be fabricated
based on the MS-QPM technology. The uniform seed grating
can be fabricated by holographic exposure. The required tar
get equivalent grating can be obtained by designing the sam
pling structure according to the equations from Eq.(3) to
Eq.(7). The sampled grating can be realized by the common
k0 (Y) is parallel to the +Z direction with the period of
485 nm. The incident light with the wavelength of
1545 .5 nm and the beam width of 30 um propagate along
the +Z direction. There is a diffractive beam with the
diffractive ef?ciency of about 50% propagating along
photolithography method. Therefore, various waveguide
the designed direction with an angle of 15.740 between
the direction of re?ective direction and the -Z axial
direction, while the rest 50% propagates along +Z direc
grating based photonic devices can be easily realized.
In the present invention, the photonic integrated circuits
with DFB semiconductor laser array based on REC technol
tion, the corresponding refractive index modulation
intensity is about 0.001. The sampling pattern is square
wave with the duty cycle of 0.5. The included angle is
ogy, the waveguide grating ?lters, coupler and multiplexer/
demultiplexer can be monolithically integrated on the same
chip, All the devices listed above can share the same seed
50° between the wave-vector of the sampling structure
grating, while the sampling structure can be designed sepa
rately according to the equations Eq. (3) to Eq.(7). Conse
quently, the whole sampling structure can be fabricated on the
same mask. Therefore, the whole sampled grating on that chip
can be realized at the same time to achieve the monolithic
integration of different photonic elements.
In the present invention, 8-channel WDM Multiplexer/
Demultiplexer based on the multiple sections (layers)
20
sampled grating structure can be fabricated. The core of the
two-dimensional planar waveguide is made of Ge:Si02 with
the effective refractive index equal to 1.455. The refractive
index modulation of the seed grating is 0.006. The width of
the device is 40 um along X direction. The length of each
section is 100 pm. The total length of the device is 1200 um
25
and that of the seed grating.
In the present invention, the DFB semiconductor laser
based on the Reconstruction-Equivalent-Chirp technology
with suppressed 0” channel can be fabricated. The effective
refractive index is 3.1. The cavity length is 400 pm. The width
of the ridge waveguide is 2 pm. The period of the seed grating
is 238 nm. The sampling period is 3 pm. The angle between
the wave-vector @SA, (Y) and the axial direction of the
waveguide is 53.67°. The angle between the seed grating
wave-vector k0 (Y) and the axial direction of the laser
waveguide is 3.67° Both ofthe angle of GSA, (Y) and k0 (Y)
with the axial direction of waveguide are clockwise or anti
clockwise. The direction of the wave-vector of —lst order
along Z axis. The direction of the wave-vector k0 (Y) of the
seed grating is parallel to the +Z direction with the grating
target equivalent grating is parallel to the waveguide axial
period of 500 nm. The channel spacing is 2 nm and the
operating wavelength is from 1544 nm to 1558 nm. The
sponding Bragg wavelength is 1551 .71nm.
direction and its grating period is 250.27 nm, and the corre
DESCRIPTION OF THE INVENTION
incident polychromatic light is also parallel to the +Z direc
tion. The detailed design parameters are listed in the follow
ing Table. 1.
Table.l. the channel wavelength/ sampling period/ The
35
fabricate the two dimensional (2-D) planar waveguide grating
and the three dimensional (3-D) volume grating with complex
included angle between wave-vector 65A, (Y) of the
sampling structure and the wave-vector of the seed grat
ing/the Corresponding re?ective angle between the —Z
grating corrugation pro?le. The arbitrary grating corrugation
40
direction.
Included angle
between the
Included angle
Re?ective
Channel
Sampling
betweenGSN )
Light and —Z
wavelength
period
andK O (7')
direction
55°
56°
56°
57°
58°
58°
58°
58°
ll.95°
12.7l°
l3.42°
l4.36°
l5.90°
l6.44°
l7.00°
l7.62°
1544
1546
1548
1550
1552
1554
1556
1558
nm
nm
nm
nm
nm
nm
nm
nm
4.20
4.00
3.85
3 60
3 30
3 20
310
3.00
pm
pm
pm
pm
pm
pm
pm
pm
45
cess and lowers the cost of production for the various photo
nic devices.
The description of the present invention are as follows:
The main characteristic of the invention is to use uniform
as the seed grating with grating period between 50 nm and
1000 nm. Then the sampling structure further modulates the
50
seed grating’s index corrugation to form the sampled grating
structure. This sampled grating with speci?c sampling struc
ture can equivalently realize the arbitrary 2-D or 3-D grating
structure. Based on the Fourier series analysis, such a
sampled grating contains a series of Fourier components.
55
Each of these Fourier components can also be considered as
a grating which is called ghost grating or sub-grating. If one
of these ghost gratings is selected to perform a speci?c func
grating. As the wave-vector of the seed grating and the
incident light are all parallel to the +Z direction, all of
appear to be of mirror symmetry regarding to +Z direc
tion.
A directional coupler with power division ratio of 0.5 can
be fabricated: The width of the device is 30 um along the
X axis and the length of the device is 50 um along the Z
axis. The material of the core layer is Ge:SiO2 with the
pro?le can also be equivalently achieved by designing the
sampling structure and the seed grating with relatively small
grating period. This technology simpli?es the fabrication pro
grating period and uniform grating index modulation strength
Here, the +1“ ghost grating works as the target equivalent
these included angles can be either clockwise or coun
terclockwise. The sampling structures of these two cases
This invention proposes a technology named the micro
structure quasi-phase-matching. This technology is used to
tion, this ghost grating is called the target equivalent grating.
60
When the wave-vector of the seed grating is described as KO
(Y), the wave-vector difference Ak between the light k and
the seed grating can be expressed as,
65
When a light beam hit on a grating based device (either two
or three dimensional), strong coupling will happen if some
certain condition is satis?ed. This condition is usually called
US 8,835,204 B2
10
the phase matching condition. Speci?cally, it can be written
changed accordingly. According to Equ. (4), the wave-vector
as AF:T<’-KO(Y):0. If it is satis?ed, the light will have the
largest diffractive ef?ciency. This phenomenon is also called
the Bragg diffraction.
of the target equivalent grating
can also be changed.
To carefully pre-design the sampling structure, the target
equivalent grating can be same as the target grating. There
fore, the arbitrary grating pro?le can be realized equivalently
only by changing the sampling pattern under a certain seed
Usually, the index corrugation of the seed grating can be
expressed as An(?):1/2An eprKO~?)+c.c. The correspond
grating. In other words, we use one of the Fourier components
of the sampling structure to compensate the wave-vector dif
ing sampled grating with arbitrary sampling structure can be
expressed as,
ference between the seed grating wave-vector KO(?) and the
target grating wave-vector KAY) when KO(?) and KAY) is
not equal. In general, this method is similar to the Quasi
Here, S[?] describes the sampling structure, An(?) is the
phase-matching technology of the nonlinear optics for high
amplitude of the index modulation of the seed grating, Y
denotes the spatial vector. If the Fourier analysis is applied
here, the Eq. (2) can be further expressed as
order harmonic generation. In the nonlinear medium, an addi
tional periodic structure is provided to compensate the wave
vector mismatch between the incident fundmental and the
output high order harmonic light frequency. This transforma
tion can contribute an additional momentum to satisfy the
(3)
necessary of momentum conservation. By contrast, the
20
"Iiee
Micro-structure Quasi-phase-matching technology has the
similar physical picture and mathematical expression that can
be expressed as follows:
"Iiee
A?:T<’d-FO<?>-@SN<Y>:O
(5)
25
Here, Kd can be usually expressed as KdIFre—Tgm.
Furthermore, according to Eq. (3), the phase of the sampled
Here j denotes imaginary unit, 39‘?) are the wave-vec
tors of the nth Fourier components of the sampling structure.
These Fourier components are called sampling structure’s
grating is also a function of the space. For a certain ghost
grating, the phase change can be expressed as
Fourier sub-grating. KO(?) is the grating wave-vector of the
seed grating and can be written as
30
Assuming there is a phase shift in the sampling structure,
and the value of the shift is AY', the phase of the sampled
(7)
35
grating will be,
is the period of the seed grating. 30 denotes the direction of
the seed grating. C” is the Fourier coef?cients of each Fourier
Then, a phase shift is easily introduced into the ghost
component. n denotes the order of the Fourier components.
Therefore, nth order of the ghost gratings is characterized by
wave-vector
Obviously, all of these ghost gratings
can be manipulated by changing the sampling structure S[?].
This is because KAY) is only composed by seed grating’s
40
wave-vector KO(?) and the wave-vector of sampling struc
ture’s Fourier sub-grating 654?). For a certain order of the
Fourier components of the sampled grating, i.e. nIN, the
wave-vector transformation relation according to Eq. (3) can
45
be expressed as
50
grating. The corresponding phase shift is exp?asnAf'). For
example, if the seed grating is uniform and G’s” AY'Iq), a
phase shift value 4) is then introduced in the nth order ghost
grating.
The index modulation strength of the target equivalent
grating can be changed by changing the sampling structure
shape in one sampling period such as the duty cycle. In the
case of 2-D, we can continuously change the duty cycle of
sampling structure along the grating, the equivalent apodiza
tion can be realized. The relation between the index modula
tion of a certain sub-grating and the duty cycle can be deter
mined by the Fourier analysis.
Let KM?) be equal to Kd(?) of our desired grating or
target grating, i.e. KMYFKAY), then KN (Y) can be called
55
as target equivalent grating wave-vector. Then, we call 65A,
(Y) target sampling structure’s Fourier sub-grating wave
vector. Kdis the wave-vector of the target grating correspond
ing to the speci?c grating corrugation that we select to per
form a speci?c function. The target equivalent grating is
When an optical signal is actually transmitted and pro
cessed, this optical signal has a certain bandwidth instead of
a single frequency. That means this optical signal has a certain
wavelength within a certain bandwidth. So the corresponding
grating structures should be designed according to the pro
cess of the realistic optical signal to obtain the largest ef?
ciency. For an actual optical signal, the speci?c grating is
60
called as the target grating if we can get the best ef?ciency of
denoted by KN (Y) and can be easily manipulated by chang
single process. The wave-vector of the target grating is called
as the wave-vector of the target grating K
ing the sampling structure S[?]. The detailed wave-vector
grating. The period of the target grating is usually in the
transform procedure can be summarized as follows:
We ?rst change the sampling pattern or sampling structure
S[?] on purpose. Then, the wave-vector 352%?) can be
In most of the cases, the target grating is not a uniform
65
magnitude of a few hundreds of nanometers. Nanotechnology
is needed to fabricate this grating. Meanwhile, the wave
length space of two channels of signals is usually smaller than