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FUNCTIONAL BLOCK DIAGRAM 5 4 7 6 VDD4A 3 VDD3A VGG12A 2 VGG34A Gain: 14 dB typical Noise figure: 5 dB typical Input return loss (S11): 15 dB typical Output return loss (S22): 20 dB typical Output power for 1 dB compression (P1dB): 14 dBm typical Saturated output power (PSAT): 18 dBm typical Output third-order intercept (IP3): 21 dBm typical Supply voltage: 3 V at 120 mA 50 Ω matched input/output Die size: 1.9 mm × 1.9 mm × 0.05 mm VDD2A FEATURES VDD1A RFOUT 8 ADL7003 APPLICATIONS 13 12 11 VDD4B VDD3B 10 9 Figure 1. GENERAL DESCRIPTION The ADL7003 is a gallium arsenide (GaAs), pseudomorphic high electron mobility transistor (pHEMT), monolithic microwave integrated circuit (MMIC), balanced low noise amplifier that operates from 50 GHz to 95 GHz. In the lower band of 50 GHz to 70 GHz, the ADL7003 provides 14 dB (typical) of gain, 21 dBm output IP3, and 12 dBm of output power for 1 dB gain compression. In the upper band of 70 GHz Rev. 0 to 90 GHz, the ADL7003 provides 15 dB (typical) of gain, 21 dBm output IP3, and 14 dBm of output power for1 dB gain compression. The ADL7003 requires 120 mA from a 3 V supply. The ADL7003 amplifier inputs/outputs are internally matched to 50 Ω, facilitating integration into multichip modules (MCMs). All data is taken with the chip connected via one 0.076 mm (3 mil) ribbon bond of 0.076 mm (3 mil) minimal length. Document Feedback Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other rights of third parties that may result from its use. Specifications subject to change without notice. No license is granted by implication or otherwise under any patent or patent rights of Analog Devices. Trademarks and registered trademarks are the property of their respective owners. One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A. Tel: 781.329.4700 ©2017 Analog Devices, Inc. All rights reserved. Technical Support www.analog.com 15691-001 14 VGG34B RFIN VGG12B 1 VDD1B Test instrumentation Military and space Telecommunications infrastructure VDD2B Data Sheet 50 GHz to 95 GHz, GaAs, pHEMT, MMIC, Wideband Low Noise Amplifier ADL7003 ADL7003 Data Sheet TABLE OF CONTENTS Features........................................................................................... 1 Pin Configuration and Function Descriptions............................ 6 Applications ................................................................................... 1 Interface Schematic ................................................................... 7 Functional Block Diagram............................................................ 1 Typical Performance Characteristics............................................ 8 General Description ...................................................................... 1 Theory of Operation.................................................................... 13 Revision History ............................................................................ 2 Applications Information............................................................ 14 Specifications ................................................................................. 3 Mounting and Bonding Techniques for Millimeterwave GaAs MMICs ..................................................................................... 14 50 GHz to 70 GHz Frequency Range ....................................... 3 70 GHz to 90 GHz Frequency Range ....................................... 3 90 GHz to 95 GHz Frequency Range ....................................... 4 Absolute Maximum Ratings ......................................................... 5 Thermal Resistance ................................................................... 5 Typical Application Circuit..................................................... 16 Assembly Diagram................................................................... 17 Outline Dimensions .................................................................... 18 Ordering Guide........................................................................ 18 ESD Caution............................................................................... 5 REVISION HISTORY 4/2017—Revision 0: Initial Version Rev. 0 | Page 2 of 18 Data Sheet ADL7003 SPECIFICATIONS 50 GHz TO 70 GHz FREQUENCY RANGE TDIE BOTTOM = 25°C; VDD = VDD1A = VDD2A = VDD3A = VDD4A = 3 V; IDQ = IDQ1A + IDQ2A + IDQ3A + IDQ4A = 120 mA, unless otherwise noted. Adjust VGG = VGG12A = VGG34A from −1.5 V to 0 V to achieve the desired IDQ. Typical VGG = −0.5 V for IDQ = 120 mA. Table 1. Parameter FREQUENCY RANGE GAIN Gain Variation over Temperature NOISE FIGURE RETURN LOSS Input Output OUTPUT Output Power for 1 dB Compression Saturated Output Power Output Third-Order Intercept INPUT Input Third-Order Intercept SUPPLY Current Voltage Symbol Min 50 14 0.02 Unit GHz dB dB/°C 5 dB S11 S22 15 20 dB dB P1dB PSAT OIP3 12 16 21 dBm dBm dBm IIP3 7 dBm POUT/tone = 0 dBm with 1 MHz tone spacing mA V Adjust VGG to achieve IDQ = 120 mA typical IDQ VDD 2 Typ 120 3 Max 70 180 4 Test Conditions/Comments Output power (POUT)/tone = 0 dBm with 1 MHz tone spacing 70 GHz TO 90 GHz FREQUENCY RANGE TDIE BOTTOM = 25°C; VDD = VDD1A = VDD2A = VDD3A = VDD4A = 3 V; IDQ = IDQ1A + IDQ2A + IDQ3A + IDQ4A = 120 mA, unless otherwise noted. Adjust VGG = VGG12A = VGG34A from −1.5 V to 0 V to achieve the desired IDQ. Typical VGG = −0.5 V for IDQ = 120 mA. Table 2. Parameter FREQUENCY RANGE GAIN Gain Variation over Temperature NOISE FIGURE RETURN LOSS Input Output OUTPUT Output Power for 1 dB Compression Saturated Output Power Output Third-Order Intercept INPUT Input Third-Order Intercept SUPPLY Current Voltage Symbol Min 70 13 Typ 15 0.02 5.5 Max 90 6.5 Unit GHz dB dB/°C dB Test Conditions/Comments S11 S22 15 15 dB dB P1dB PSAT OIP3 14 18 21 dBm dBm dBm POUT/tone = 0 dBm with 1 MHz tone spacing IIP3 6 dBm POUT/tone = 0 dBm with 1 MHz tone spacing mA V Adjust VGG to achieve IDQ = 120 mA typical IDQ VDD 2 120 3 180 4 Rev. 0 | Page 3 of 18 ADL7003 Data Sheet 90 GHz TO 95 GHz FREQUENCY RANGE TDIE BOTTOM = 25°C; VDD = VDD1A = VDD2A = VDD3A = VDD4A = 3 V; IDQ = IDQ1A + IDQ2A + IDQ3A + IDQ4A = 120 mA, unless otherwise noted. Adjust VGG = VGG12A = VGG34A from −1.5 V to 0 V to achieve the desired IDQ. Typical VGG = −0.5 V for IDQ = 120 mA. Table 3. Parameter FREQUENCY RANGE GAIN Gain Variation over Temperature RETURN LOSS Input Output SUPPLY Current Voltage Symbol Min 90 S11 S22 IDQ VDD 2 Typ 11 0.02 Unit GHz dB dB/°C 15 15 dB dB 120 3 Max 95 180 4 Rev. 0 | Page 4 of 18 mA V Test Conditions/Comments Adjust VGG to achieve IDQ = 120 mA typical Data Sheet ADL7003 ABSOLUTE MAXIMUM RATINGS THERMAL RESISTANCE Table 4. Parameter Drain Bias Voltage (VDD) Gate Bias Voltage (VGG ) Radio Frequency (RF) Input Power (RFIN) Continuous Power Dissipation (PDISS), at TDIE BOTTOM = 85°C (Derate 15.00 mW/°C Above 85°C) Rating 4.5 V −2 V to 0 V dc 15 dBm 1.350 W θJA is specified for the worst-case conditions, that is, a device soldered in a circuit board for surface-mount packages. Storage Temperature Range (Ambient) Operating Temperature Range (Die Bottom) ESD Sensitivity Human Body Model (HBM) Channel Temperature to Maintain 1 Million Hour MTTF Nominal Channel Temperature at TDIE BOTTOM = 85°C, VDD = 3 V −65°C to +150°C −55°C to +85°C Class 1A 250 V ESD CAUTION Table 5. Thermal Resistance Package Type C-14-5 175°C 110°C Stresses at or above those listed under Absolute Maximum Ratings may cause permanent damage to the product. This is a stress rating only; functional operation of the product at these or any other conditions above those indicated in the operational section of this specification is not implied. Operation beyond the maximum operating conditions for extended periods may affect product reliability. Rev. 0 | Page 5 of 18 θJC 66.70 Unit °C/W ADL7003 Data Sheet 3 4 5 6 VDD1A VDD2A VGG34A VDD3A 7 VDD4A 2 VGG12A PIN CONFIGURATION AND FUNCTION DESCRIPTIONS RFOUT 8 ADL7003 TOP VIEW (Not to Scale) VDD2B VGG34B VDD3B VDD4B 14 13 12 11 10 9 15691-002 VDD1B RFIN VGG12B 1 Figure 2. Pad Configuration Table 6. Pad Function Descriptions Pad No. 1 2 9, 10 Mnemonic RFIN VGG 12A VDD1A, VDD2A VGG 34A VDD3A, VDD4A RFOUT VDD4B, VDD3B 11 VGG 34B 12, 13 VDD2B, VDD1B 14 VGG 12B Die Bottom GND 3, 4 5 6, 7 8 Description RF Input. This pad is ac-coupled and matched to 50 Ω. See Figure 3 for the interface schematic. Gate Control Pad for the First and Second Stage Amplifiers. See Figure 4 for the interface schematic. Drain Bias Voltage Pads for the First and Second Stage Amplifiers. External bypass capacitors of 120 pF, 0.1 µF, and 4.7 µF are required. Connect these pads to a 3 V supply. See Figure 5 for the interface schematic. Gate Control Pad for the Third and Fourth Stage Amplifiers. See Figure 4 for the interface schematic. Drain Bias Voltage Pads for the Third and Fourth Stage Amplifiers. External bypass capacitors of 120 pF, 0.1 µF, and 4.7 µF are required. Connect these pads to a 3 V supply. See Figure 5 for the interface schematic. RF Output. This pad is ac-coupled and matched to 50 Ω. See Figure 9 for the interface schematic. Drain Bias Voltage Pads for the Fourth and Third Stage Alternative Bias Configuration. External bypass capacitors of 120 pF, 0.1 µF, and 4.7 µF are required. See Figure 7 for the interface schematic. Gate Control Pad for the Third and Fourth Stage Alternative Bias Configuration. Coupling capacitors are required. See Figure 8 for the interface schematic. Drain Bias Voltage Pads for the Second and First Stage Alternative Bias Configuration. External bypass capacitors of 120 pF, 0.1 µF, and 4.7 µF are required. See Figure 7 for the interface schematic. Gate Control Pad for the First and Second Stage Alternative Bias Configuration. Coupling capacitors are required. See Figure 8 for the interface schematic. Ground. Die bottom must be connected to RF/dc ground. See Figure 6 for the interface schematic. Rev. 0 | Page 6 of 18 Data Sheet ADL7003 15691-003 INTERFACE SCHEMATIC VDD1B TO VDD4B 15691-007 RFIN Figure 3. RFIN Interface Schematic VGG12A, VGG34A 15691-008 15691-004 Figure 7. VDD 1B to VDD 4B Interface Schematic VGG12B, VGG34B Figure 4. VGG12A, VGG34A Interface Schematic Figure 8. VGG12B, VGG34B Interface Schematic RFOUT GND Figure 9. RFOUT Interface Schematic 15691-006 Figure 5. VDD 1A to VDD 4A Interface Schematic 15691-009 15691-005 VDD1A TO VDD4A Figure 6. GND Interface Schematic Rev. 0 | Page 7 of 18 ADL7003 Data Sheet TYPICAL PERFORMANCE CHARACTERISTICS 20 20 15 18 10 16 S11 S21 S22 14 12 GAIN (dB) –10 10 8 –15 6 –20 4 –25 2 –30 40 45 50 55 60 65 70 75 80 85 90 95 100 FREQUENCY (GHz) 2.0V 2.7V 3.0V 3.3V 4.0V 0 50 55 70 75 80 85 90 95 Figure 13. Gain vs. Frequency for Various VDD Values 0 20 +85°C +25°C –55°C –2 18 –4 INPUT RETURN LOSS (dB) 16 14 12 10 8 6 4 60 –14 –16 –18 –20 65 70 75 80 85 90 95 FREQUENCY (GHz) –26 50 Figure 11. Gain vs. Frequency for Various Temperatures 55 60 65 70 75 80 85 90 95 FREQUENCY (GHz) 15691-011 55 –12 –24 15691-013 0 50 –8 –10 –22 +85°C +25°C –55°C 2 –6 Figure 14. Input Return Loss vs. Frequency at Various Temperatures 20 0 100mA 120mA 140mA 160mA 180mA –2 18 –4 INPUT RETURN LOSS (dB) 16 14 12 10 8 6 100mA 120mA 140mA 160mA 180mA 2 0 50 55 60 65 70 75 80 85 90 FREQUENCY (GHz) –8 –10 –12 –14 –16 –18 –20 –22 –24 95 15691-020 4 –6 Figure 12. Gain vs. Frequency for Various I DQ Values –26 50 55 60 65 70 75 80 85 90 95 FREQUENCY (GHz) Figure 15. Input Return Loss vs. Frequency for Various I DQ Values Rev. 0 | Page 8 of 18 15691-018 GAIN (dB) 65 FREQUENCY (GHz) Figure 10. Broadband Gain and Return Loss vs. Frequency GAIN (dB) 60 15691-027 0 –5 15691-010 RESPONSE (dB) 5 Data Sheet ADL7003 0 0 2.0V 2.7V 3.0V 3.3V 4.0V –6 –4 –8 –10 –12 –14 –16 –18 –20 –22 –8 –10 –12 –14 –16 –18 –20 –22 –24 –26 50 –26 50 55 60 65 70 75 80 85 90 95 15691-028 –24 FREQUENCY (GHz) 55 60 65 70 75 80 85 90 95 FREQUENCY (GHz) Figure 16. Input Return Loss vs. Frequency for Various VDD Values Figure 19. Output Return Loss vs. Frequency for Various VDD Values 0 10 +85°C +25°C –55°C –2 –4 +85°C +25°C –55°C 9 8 –6 –8 NOISE FIGURE (dB) OUTPUT RETURN LOSS (dB) –6 15691-031 INPUT RETURN LOSS (dB) –4 2.0V 2.7V 3.0V 3.3V 4.0V –2 OUTPUT RETURN LOSS (dB) –2 –10 –12 –14 –16 –18 –20 7 6 5 4 3 2 –22 55 60 65 70 75 80 85 90 95 FREQUENCY (GHz) 0 50 15691-014 70 75 80 90 7 6 –8 –10 –12 –14 –16 –18 5 4 3 2 –20 –22 100mA 120mA 140mA 160mA 180mA 1 55 60 65 70 75 80 FREQUENCY (GHz) 85 90 95 15691-021 –24 –26 50 85 8 100mA 120mA 140mA 160mA 180mA NOISE FIGURE (dB) OUTPUT RETURN LOSS (dB) –6 65 Figure 20. Noise Figure vs. Frequency at Various Temperatures 0 –4 60 FREQUENCY (GHz) Figure 17. Output Return Loss vs. Frequency for Various Temperatures –2 55 Figure 18. Output Return Loss vs. Frequency for Various I DQ Values 0 50 55 60 65 70 75 80 85 90 FREQUENCY (GHz) Figure 21. Noise Figure vs. Frequency for Various I DQ Values Rev. 0 | Page 9 of 18 15691-022 –26 50 15691-012 1 –24 ADL7003 Data Sheet 10 20 2.0V 2.7V 3.0V 3.3V 4.0V 9 18 16 7 5 4 12 10 8 3 6 2 4 1 2 0 50 55 60 65 70 75 80 85 90 FREQUENCY (GHz) 0 50 60 65 70 75 80 85 90 Figure 25. P1dB vs. Frequency for Various VDD Values 20 20 +85°C +25°C –55°C 18 16 14 14 12 12 PSAT (dBm) 16 10 8 10 8 6 6 4 4 2 2 55 60 65 70 75 80 85 90 FREQUENCY (GHz) 0 50 15691-015 0 50 +85°C +25°C –55°C 55 60 65 70 75 80 85 90 FREQUENCY (GHz) Figure 23. Output P1dB vs. Frequency at Various Temperatures 15691-016 18 Figure 26. P SAT vs. Frequency at Various Temperatures 20 18 18 16 16 14 14 PSAT (dBm) 20 12 10 8 12 10 8 6 6 100mA 120mA 140mA 160mA 180mA 2 0 50 55 60 100mA 120mA 140mA 160mA 180mA 4 2 65 70 75 80 85 FREQUENCY (GHz) 90 15691-025 4 Figure 24. P1dB vs. Frequency for Various I DQ Values 0 50 55 60 65 70 75 80 85 90 FREQUENCY (GHz) Figure 27. P SAT vs. Frequency at Various I DQ Values Rev. 0 | Page 10 of 18 95 15691-023 OUTPUT P1dB (dB) 55 FREQUENCY (GHz) Figure 22. Noise Figure vs. Frequency for Various VDD Values P1dB (dBm) 2.0V 2.7V 3.0V 3.3V 4.0V 15691-032 P1dB (dBm) 14 6 15691-029 NOISE FIGURE (dB) 8 Data Sheet ADL7003 12 20 11 18 10 16 9 12 10 8 6 0 50 55 6 5 4 2.0V 2.7V 3.0V 3.3V 4.0V 2 1 60 65 70 75 80 85 90 FREQUENCY (GHz) 0 50 15691-030 2 7 3 2.0V 2.7V 3.0V 3.3V 4.0V 4 8 55 60 65 70 75 80 85 90 FREQUENCY (GHz) Figure 28. P SAT vs. Frequency for Various VDD Values 15691-033 INPUT IP3 (dBm) PSAT (dBm) 14 Figure 31. IIP3 vs. Frequency for Various VDD Values 26 12 11 24 10 22 8 OUTPUT IP3 (dB) 7 6 5 4 18 16 14 2 +85°C +25°C –55°C 0 50 55 60 65 70 75 80 85 90 FREQUENCY (GHz) 10 50 10 60 65 70 75 80 88 90 Figure 32. OIP3 vs. Frequency at Various Temperatures 26 100mA 120mA 140mA 160mA 180mA 11 55 FREQUENCY (GHz) Figure 29. IIP3 vs. Frequency at Various Temperatures 12 +85°C +25°C –55°C 12 15691-019 1 15691-017 3 24 9 OUTPUT IP3 (dBm) 22 8 7 6 5 4 3 20 18 16 14 100mA 120mA 140mA 160mA 180mA 2 12 1 0 50 55 60 65 70 75 80 85 FREQUENCY (GHz) 90 15691-024 INPUT IP3 (dBm) 20 Figure 30. IIP3 vs. Frequency for Various I DQ Values 10 50 55 60 65 70 75 80 85 FREQUENCY (GHz) Figure 33. OIP3 vs. Frequency for Various I DQ Values Rev. 0 | Page 11 of 18 90 15691-026 INPUT IP3 (dB) 9 ADL7003 Data Sheet 26 300 280 DRAIN SUPPLY CURRENT (mA) 24 20 18 16 2.0V 2.7V 3.0V 3.3V 4.0V 12 55 60 65 70 75 80 85 90 200 180 70GHz 75GHz 80GHz 85GHz 160 140 100 –15 –12 –9 –6 –3 0 3 6 9 12 15 RF INPUT POWER (dBm) Figure 34. OIP3 vs. Frequency for Various VDD Values Figure 36. Drain Supply Current (I DD ) vs. RF Input Power 0.30 450 70GHz 75GHz 80GHz 85GHz 400 DRAIN SUPPLY CURRENT (mA) 0.25 0.20 0.15 0.10 0.05 0 –0.05 350 300 250 200 150 2.0V 2.7V 3.0V 3.3V 4.0V 100 50 –12 –9 –6 –3 0 3 6 9 12 RF INPUT POWER (dBm) Figure 35. Gate Supply Current (I DD ) vs. RF Input Power 15 0 –2.0 15691-035 GATE SUPPLY CURRENT (mA) 220 120 FREQUENCY (GHz) –0.10 –15 240 –1.8 –1.6 –1.4 –1.2 –1.0 –0.8 –0.6 GATE SUPPLY VOLTAGE (V) –0.4 –0.2 0 15691-050 10 50 260 15691-036 14 15691-034 OUTPUT IP3 (dBm) 22 Figure 37. Drain Supply Current (I DQ) vs. Gate Supply Voltage (VGG) Rev. 0 | Page 12 of 18 Data Sheet THEORY OF OPERATION ADL7003 The architecture of the ADL7003 low noise amplifier is shown in Figure 38. The ADL7003 uses two cascaded four-stage amplifiers operating in quadrature between two 90° hybrids. This balanced amplifier approach forms an amplifier with a combined gain of 14 dB and a saturated output power (PSAT) of 18 dBm. The 90° hybrids ensure that the input and output return losses are greater than or equal to 15 dB. See the application circuit shown in Figure 41 for further details on biasing the various blocks. RFOUT 15691-037 RFIN Figure 38. ADL7003 Architecture Rev. 0 | Page 13 of 18 ADL7003 Data Sheet APPLICATIONS INFORMATION The ADL7003 is a GaAs, pHEMT, MMIC power amplifier. Capacitive bypassing is required for VDD1A through VDD4A and VDD1B through VDD4B (see Figure 41). VGG12A is the gate bias pad for the first two gain stages. VGG34A is the gate bias pad for the second two gain stages. Apply a gate bias voltage to VGG12A and VGG34A, and use capacitive bypassing as shown in Figure 41. All measurements for this device were taken using the typical application circuit (see Figure 41) and configured as shown in the assembly diagram (Figure 42). The following is the recommended bias sequence during power-up: Connect to ground. Set the gate bias voltage to −1.5 V. Set all the drain bias voltages, VDD = 3 V. Increase the gate bias voltage to achieve a quiescent current, IDD = 120 mA. Apply the RF signal. L9301 MATCHING STUB/BOND PAD SHUNT CAPACITANCE = 15fF RFIN The following is the recommended bias sequence during power-down: 1. 2. 3. 4. 50Ω TRANSMISSION LINE Turn off the RF signal. Decrease the gate bias voltage to −1.5 V to achieve IDD = 0 mA (approximately). Decrease all of the drain bias voltages to 0 V. Increase the gate bias voltage to 0 V. PCB BOARD 3mil GAP MMIC Figure 39. High Frequency Input Wideband Matching Table 7. Power Selection Table1 IDQ (mA)2 100 120 140 160 180 1 2 Gain (dB) 12 13 14 15 16 P1dB (dBm) 10 12 13 14 15 OIP3 (dBm) 20 21 22 22.5 23 3mil GOLD RIBBON 15691-051 5. Place microstrip substrates as close to the die as possible to minimize ribbon bond length. Typical die to substrate spacing is 0.076 mm to 0.152 mm (3 mil to 6 mil). To ensure wideband matching, a 15fF capacitive stub is recommended on the PCB board before the ribbon bond. PDISS (mW) 300 360 420 480 540 VGG (V) −0.52 −0.49 −0.44 −0.40 −0.36 L9301 MATCHING STUB/BOND PAD SHUNT CAPACITANCE = 15fF RFOUT Data taken at nominal bias conditions; V DD = 3 V, TA = 25°C. Adjust V GG12A and V GG24A from −1.5 V to 0 V to achieve the desired drain current. The VDD = 3 V and IDD = 120 mA bias conditions are recommended to optimize overall performance. Unless otherwise noted, the data shown was taken using the recommended bias condition. Operation of the ADL7003 at different bias conditions may provide performance that differs from what is shown in Figure 41. Biasing the ADL7003 for higher drain current typically results in higher P1dB, output IP3, and gain but at the expense of increased power consumption (see Table 7). MOUNTING AND BONDING TECHNIQUES FOR MILLIMETERWAVE GaAs MMICS 3mil GOLD RIBBON 50Ω TRANSMISSION LINE PCB BOARD 3mil GAP MMIC 15691-052 1. 2. 3. 4. Microstrip, 50 Ω transmission lines on 0.127 mm (5 mil) thick alumina, thin film substrates are recommended for bringing the radio frequency to and from the chip. Raise the die 0.075 mm (3 mil) to ensure that the surface of the die is coplanar with the surface of the substrate. Figure 40. High Frequency Output Wideband Matching Place microstrip substrates as close to the die as possible to minimize bond wire length. Typical die to substrate spacing is 0.076 mm to 0.152 mm (3 mil to 6 mil). Attach the die directly to the ground plane with conductive epoxy (see the Handling Precautions section, the Mounting section, and the Wire Bonding section). Rev. 0 | Page 14 of 18 Data Sheet ADL7003 Handling Precautions To avoid permanent damage, follow these storage, cleanliness, static sensitivity, transient, and general handling precautions: • • • • • Place all bare die in either waffle or gel-based ESD protective containers and then seal the die in an ESD protective bag for shipment. After the sealed ESD protective bag is opened, store all die in a dry nitrogen environment. Handle the chips in a clean environment. Do not attempt to clean the chip using liquid cleaning systems. Follow ESD precautions to protect against ESD strikes. While bias is applied, suppress instrument and bias supply transients. Use shielded signal and bias cables to minimize inductive pickup. Handle the chip along the edges with a vacuum collet or with a sharp pair of bent tweezers. The surface of the chip may have fragile air bridges and must not be touched with vacuum collet, tweezers, or fingers. Mounting Before epoxy die is attached, apply a minimum amount of epoxy to the mounting surface so that a thin epoxy fillet is observed around the perimeter of the chip after it is placed into position. Cure the epoxy per the schedule of the manufacturer. Wire Bonding RF bonds made with 0.003 in. × 0.0005 in. gold ribbon are recommended for the RF ports. These bonds must be thermosonically bonded with a force of 40 g to 60 g. DC bonds of 0.001 in. (0.025 mm) diameter, thermosonically bonded, are recommended. Create ball bonds with a force of 40 g to 50 g and wedge bonds with a force of 18 g to 22 g. Create all bonds with a nominal stage temperature of 150°C. Apply a minimum amount of ultrasonic energy to achieve reliable bonds. Keep all bonds as short as possible, less than 12 mil (0.31 mm). Alternatively, short (≤3 mil) RF bonds made with two 1-mil wires can be used. Rev. 0 | Page 15 of 18 Data Sheet ADL7003 TYPICAL APPLICATION CIRCUIT The drain and gate voltages can be applied to either the north or the south side of the circuit. VDD1A TO VDD4A VGG12A TO VGG34A 4.7µF 4.7µF 0.1µF 0.1µF 120pF 120pF 2 120pF 120pF 4 3 5 VDD2A 120pF 6 120pF 7 VGG34A VDD4A VDD1A VGG12A VDD3A 8 RFOUT ADL7003 RFIN 1 RFIN RFOUT VDD4B VDD3B VGG12B VDD1B VGG34B VDD2B 14 13 120pF 120pF 0.1µF 0.1µF 4.7µF 4.7µF 12 11 120pF 10 120pF 9 120pF 120pF NC NO DC BIAS APPLIED Figure 41. Typical Application Circuit Rev. 0 | Page 16 of 18 15691-053 NC Data Sheet ADL7003 15691-055 ASSEMBLY DIAGRAM Figure 42. Assembly Diagram Rev. 0 | Page 17 of 18 ADL7003 Data Sheet OUTLINE DIMENSIONS 1.90 SQ 0.201 0.05 0.150 0.150 0.150 0.150 0.150 0.150 0.150 0.150 0.150 0.150 0.088 0.117 2 3 4 5 6 7 0.076 × 0.076 *AIRBRIDGE AREA (Pads 2-7, 9-14) 0.125 8 0.125 0.086 × 0.051 (Pads 1 & 8) 0.125 0.081 × 0.097 1 0.125 1.016 0.637 13 12 11 10 9 SIDE VIEW 0.088 0.208 0.207 *This die utilizes fragile air bridges. Any pickup tools used must not contact this area. 04-26-2017-A 14 Figure 43. 14-Pad Bare Die [CHIP] (C-14-5) Dimensions shown in millimeter ORDERING GUIDE Model ADL7003CHIPS ADL7003CHIPS-SX Temperature Range −55°C to +85°C −55°C to +85°C Package Description 14-Pad Bare Die [CHIP] 14-Pad Bare Die [CHIP] ©2017 Analog Devices, Inc. All rights reserved. Trademarks and registered trademarks are the property of their respective owners. D15691-0-4/17(0) Rev. 0 | Page 18 of 18 Package Option C-14-5 C-14-5