Download HV Testing 1200V High Side Driver Application – Lessons Learned

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Transcript
HV Testing 1200V High Side Driver Application – Lessons Learned
In this paper, the author will describe the various challenges associated with testing a 1000V+ High Side
Driver. The unique advantages of the ETS floating resource architecture will be highlighted as a convenient and
simple solution for making (normally difficult) high voltage measurements. Circuits for high voltage timing
measurements, DUT and resource protection circuits, and approaches to “multisiting” the solution will be
discussed. The author will also show specific circuits, techniques, and actual test data.
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