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Download HV Testing 1200V High Side Driver Application – Lessons Learned
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Transcript
HV Testing 1200V High Side Driver Application – Lessons Learned In this paper, the author will describe the various challenges associated with testing a 1000V+ High Side Driver. The unique advantages of the ETS floating resource architecture will be highlighted as a convenient and simple solution for making (normally difficult) high voltage measurements. Circuits for high voltage timing measurements, DUT and resource protection circuits, and approaches to “multisiting” the solution will be discussed. The author will also show specific circuits, techniques, and actual test data. Download Presentation Teradyne Users Group Conference
