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FDP032N08B_F102
N-Channel PowerTrench® MOSFET
80V, 211A, 3.3mΩ
Features
Description
• RDS(on) = 2.85mΩ (Typ.)@ VGS = 10V, ID = 50A
• Low reverse recovery charge, Qrr
This N-Channel MOSFET is produced using Fairchild
Semiconductor’s advanced PowerTrench® process that has
been especially tailored to minimize the on-state resistance and
yet maintain superior switching performance.
• Soft reverse recovery body diode
Application
• Enables highly efficiency in synchronous rectification
• Synchronous Rectification for ATX / Server / Telecom PSU
• Fast Switching Speed
• Battery Charger and Battery Protection circuit
• 100% UIL Tested
• DC motor drives and Uninterruptible Power Supplies
• RoHS Compliant
• Micro Solar Inverter
• Low FOM RDS(on)*QG
D
G
G
TO-220
D
S
S
MOSFET Maximum Ratings TC = 25oC unless otherwise noted*
Symbol
VDSS
Drain to Source Voltage
Parameter
VGSS
Gate to Source Voltage
Drain Current
ID
IDM
Drain Current
EAS
Single Pulsed Avalanche Energy
dv/dt
Peak Diode Recovery dv/dt
Units
V
±20
V
- Continuous (TC = 25oC, Silicon Limited)
211*
- Continuous (TC = 100oC, Silicon Limited)
149*
- Continuous (TC = 25oC, Package Limited)
120
- Pulsed
(Note 1)
844
A
(Note 2)
649
mJ
6.0
V/ns
(Note 3)
A
(TC = 25oC)
263
W
- Derate above 25oC
1.75
W/oC
PD
Power Dissipation
TJ, TSTG
Operating and Storage Temperature Range
Maximum Lead Temperature for Soldering Purpose,
1/8” from Case for 5 Seconds
TL
FDP032N08B_F102
80
-55 to +175
o
C
300
o
C
* Package limitation current is 120A.
Thermal Characteristics
Symbol
Parameter
FDP032N08B_F102
RθJC
Thermal Resistance, Junction to Case, Max
0.57
RθJA
Thermal Resistance, Junction to Ambient, Max
62.5
Units
oC/W
www.BDTIC.com/FAIRCHILD
©2012 Fairchild Semiconductor Corporation
FDP032N08B_F102 Rev.C0
1
www.fairchildsemi.com
FDP032N08B_F102 Channel PowerTrench® MOSFET
October 2012
Device Marking
FDP032N08B
Device
FDP032N08B_F102
Package
TO-220
Description
F102: Trimmed Leads
Quantity
50
Electrical Characteristics TC = 25oC unless otherwise noted
Symbol
Parameter
Test Conditions
Min.
Typ.
Max.
Units
80
-
-
V
-
0.04
-
V/oC
μA
Off Characteristics
BVDSS
ΔBVDSS
ΔTJ
Drain to Source Breakdown Voltage
Breakdown Voltage Temperature
Coefficient
ID = 250μA, VGS = 0V
IDSS
Zero Gate Voltage Drain Current
VDS = 64V, VGS = 0V
-
-
1
VDS = 64V, TC = 150oC
-
-
500
IGSS
Gate to Body Leakage Current
VGS = ±20V, VDS = 0V
-
-
±100
2.5
-
4.5
V
-
2.85
3.3
mΩ
-
168
-
S
-
8245
10965
pF
-
1250
1660
pF
-
28
-
pF
-
2337
-
pF
-
111
144
nC
-
44
-
nC
-
23
-
nC
(Note 4)
-
5.6
-
V
(Note 5)
-
98.2
-
nC
-
114
-
nC
-
38
86
ns
-
44
97
ns
-
71
152
ns
-
31
72
ns
-
2.3
-
Ω
ID = 250μA, Referenced to
25oC
nA
On Characteristics
VGS(th)
RDS(on)
Gate Threshold Voltage
VGS = VDS, ID = 250μA
Static Drain to Source On Resistance
gFS
Forward Transconductance
VGS = 10V, ID = 100A
VDS = 10V, ID = 100A
Dynamic Characteristics
Ciss
Input Capacitance
Coss
Output Capacitance
Crss
Reverse Transfer Capacitance
Coss(er)
Energy Related Output Capacitance
Qg(tot)
Total Gate Charge at 10V
VDS = 40V, VGS = 0V
f = 1MHz
VDS = 40V, VGS = 0V
VDS = 40V, ID = 100A
VGS = 10V
Qgs
Gate to Source Gate Charge
Qgd
Gate to Drain “Miller” Charge
Vplateau
Gate Plateau Volatge
Qsync
Total Gate Charge Sync.
VDS = 0V, ID = 50A
Qoss
Output Charge
VDS = 40V, VGS = 0V
Switching Characteristics
td(on)
Turn-On Delay Time
tr
Turn-On Rise Time
td(off)
Turn-Off Delay Time
tf
Turn-Off Fall Time
ESR
Equivalent Series Resistance (G-S)
VDD = 40V, ID = 100A
VGS = 10V, RGEN = 4.7Ω
(Note 4)
f = 1MHz
Drain-Source Diode Characteristics
IS
Maximum Continuous Drain to Source Diode Forward Current
-
-
211*
A
ISM
Maximum Pulsed Drain to Source Diode Forward Current
-
-
844
A
VSD
Drain to Source Diode Forward Voltage
VGS = 0V, ISD = 100A
-
-
1.3
V
trr
Reverse Recovery Time
75
-
ns
Qrr
Reverse Recovery Charge
VGS = 0V, VDD=40V, ISD = 100A
dIF/dt = 100A/μs
-
102
-
nC
Notes:
1. Repetitive Rating: Pulse width limited by maximum junction temperature
2. L = 3mH, IAS = 20.8A, Starting TJ = 25°C
3. ISD ≤ 100A, di/dt ≤ 200A/μs, VDD ≤ BVDSS, Starting TJ = 25°C
4. Essentially Independent of Operating Temperature Typical Characteristics
5. See the test circuit in page 8
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FDP032N08B_F102 Rev.C0
2
www.fairchildsemi.com
FDP032N08B_F102 N-Channel PowerTrench® MOSFET
Package Marking and Ordering Information
Figure 1. On-Region Characteristics
Figure 2. Transfer Characteristics
400
400
100
ID, Drain Current[A]
ID, Drain Current[A]
100
10
VGS = 15.0V
10.0V
8.0V
7.0V
6.5V
6.0V
5.5V
5.0V
*Notes:
1. 250μs Pulse Test
o
2. TC = 25 C
1
0.1
o
25 C
10
o
o
175 C
-55 C
1
1
VDS, Drain-Source Voltage[V]
10
2
Figure 3. On-Resistance Variation vs.
Drain Current and Gate Voltage
3
4
5
6
VGS, Gate-Source Voltage[V]
7
Figure 4. Body Diode Forward Voltage
Variation vs. Source Current
and Temperature
500
IS, Reverse Drain Current [A]
4.0
RDS(ON) [mΩ],
Drain-Source On-Resistance
*Notes:
1. VDS = 10V
2. 250μs Pulse Test
3.5
VGS = 10V
3.0
2.5
VGS = 20V
100
o
175 C
o
25 C
10
*Notes:
1. VGS = 0V
2. 250μs Pulse Test
o
*Note: TC = 25 C
2.0
0
90
180
270
ID, Drain Current [A]
360
1
0.3
450
0.6
0.9
1.2
VSD, Body Diode Forward Voltage [V]
1.5
Figure 5. Capacitance Characteristics
Figure 6. Gate Charge Characteristics
10000
10
VGS, Gate-Source Voltage [V]
Capacitances [pF]
Ciss
1000
Coss
100
*Note:
1. VGS = 0V
2. f = 1MHz
Ciss = Cgs + Cgd (Cds = shorted)
Coss = Cds + Cgd
Crss = Cgd
10
0.1
1
10
VDS, Drain-Source Voltage [V]
VDS = 16V
VDS = 40V
VDS = 64V
8
6
4
2
Crss
*Note: ID = 100A
0
80
0
20
40
60
80
100
Qg, Total Gate Charge [nC]
120
www.BDTIC.com/FAIRCHILD
FDP032N08B_F102 Rev.C0
3
www.fairchildsemi.com
FDP032N08B_F102 N-Channel PowerTrench® MOSFET
Typical Performance Characteristics
Figure 7. Breakdown Voltage Variation
vs. Temperature
Figure 8. On-Resistance Variation
vs. Temperature
2.0
RDS(on), [Normalized]
Drain-Source On-Resistance
BVDSS, [Normalized]
Drain-Source Breakdown Voltage
1.10
1.05
1.00
0.95
*Notes:
1. VGS = 0V
2. ID = 250μA
0.90
-80
-40
0
40
80
120 160
o
TJ, Junction Temperature [ C]
1.6
1.4
1.2
1.0
0
40
80
120 160
o
TJ, Junction Temperature [ C]
200
240
100μs
10
1ms
Operation in This Area
is Limited by R DS(on)
1
200
ID, Drain Current [A]
100
10ms
100ms
DC
SINGLE PULSE
o
TC = 25 C
0.1
160
VGS = 10V
120
80
o
40
TJ = 175 C
o
o
RθJC = 0.57 C/W
RθJC = 0.57 C/W
0
25
0.01
1
10
VDS, Drain-Source Voltage [V]
100
Figure 11. Eoss vs. Drain to Source Voltage
50
75
100
125
150
o
TC, Case Temperature [ C]
175
Figure 12. Unclamped Inductive
Switching Capability
100
5
IAS, AVALANCHE CURRENT (A)
4
EOSS, [μJ]
-40
Figure 10. Maximum Drain Current
1000
3
2
1
0
*Notes:
1. VGS = 10V
2. ID = 100A
0.8
0.6
-80
200
Figure 9. Maximum Safe Operating Area
vs. Case Temperature
ID, Drain Current [A]
1.8
0
15
30
45
60
75
VDS, Drain to Source Voltage [V]
TJ = 25 oC
10
1
0.001
90
TJ = 150 oC
0.01
0.1
1
10
100
500
tAV, TIME IN AVALANCHE (ms)
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FDP032N08B_F102 Rev.C0
4
www.fairchildsemi.com
FDP032N08B_F102 N-Channel PowerTrench® MOSFET
Typical Performance Characteristics (Continued)
FDP032N08B_F102 N-Channel PowerTrench® MOSFET
Typical Performance Characteristics (Continued)
Figure 13. Transient Thermal Response Curve
Thermal Response [ZθJC]
1
0.5
0.2
PDM
0.1
0.1
t1
*Notes:
0.05
o
0.02
0.01
1. ZθJC(t) = 0.57 C/W Max.
2. Duty Factor, D= t1/t2
3. TJM - TC = PDM * ZθJC(t)
Single pulse
0.001
-5
10
t2
-4
10
-3
-2
10
10
Rectangular Pulse Duration [sec]
-1
10
1
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FDP032N08B_F102 Rev.C0
5
www.fairchildsemi.com
FDP032N08B_F102 N-Channel PowerTrench® MOSFET
Gate Charge Test Circuit & Waveform
D
G
S
Resistive Switching Test Circuit & Waveforms
Unclamped Inductive Switching Test Circuit & Waveforms
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FDP032N08B_F102 Rev.C0
6
www.fairchildsemi.com
FDP032N08B_F102 N-Channel PowerTrench® MOSFET
Peak Diode Recovery dv/dt Test Circuit & Waveforms
DUT
+
VDS
_
I SD
L
Driver
RG
VGS
VGS
( Driver )
Same Type
as DUT
VDD
• dv/dt controlled by RG
• ISD controlled by pulse period
Gate Pulse Width
D = -------------------------Gate Pulse Period
10V
IFM , Body Diode Forward Current
I SD
( DUT )
di/dt
IRM
Body Diode Reverse Current
VDS
( DUT )
Body Diode Recovery dv/dt
VDD
VSD
Body Diode
Forward Voltage Drop
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FDP032N08B_F102 Rev.C0
7
www.fairchildsemi.com
FDP032N08B_F102 N-Channel PowerTrench® MOSFET
Total Gate Charge Qsync. Test Circuit & Waveforms
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FDP032N08B_F102 Rev. C0
8
www.fairchildsemi.com
FDP032N08B_F102 N-Channel PowerTrench® MOSFET
Mechanical Dimensions
TO-220
(F102: Trimmed Leads)
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FDP032N08B_F102 Rev.C0
9
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tm
*Trademarks of System General Corporation, used under license by Fairchild Semiconductor.
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PRODUCT OR CIRCUIT DESCRIBED HEREIN; NEITHER DOES IT CONVEY ANY LICENSE UNDER ITS PATENT RIGHTS, NOR THE RIGHTS OF OTHERS.
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intended for surgical implant into the body or (b) support or sustain life,
and (c) whose failure to perform when properly used in accordance with
instructions for use provided in the labeling, can be reasonably
expected to result in a significant injury of the user.
2.
A critical component in any component of a life support, device, or
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Definition of Terms
Datasheet Identification
Product Status
Definition
Advance Information
Formative / In Design
Datasheet contains the design specifications for product development. Specifications
may change in any manner without notice.
Preliminary
First Production
Datasheet contains preliminary data; supplementary data will be published at a later
date. Fairchild Semiconductor reserves the right to make changes at any time without
notice to improve design.
No Identification Needed
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Datasheet contains final specifications. Fairchild Semiconductor reserves the right to
make changes at any time without notice to improve the design.
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Datasheet contains specifications on a product that is discontinued by Fairchild
Semiconductor. The datasheet is for reference information only.
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Rev. I61
FDP032N08B_F102 Rev. C0
10
www.fairchildsemi.com
FDP032N08B_F102 N-Channel PowerTrench® MOSFET
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The following includes registered and unregistered trademarks and service marks, owned by Fairchild Semiconductor and/or its global subsidiaries, and is not
intended to be an exhaustive list of all such trademarks.
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PowerTrench®
The Power Franchise®
®
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Solutions for Your Success™
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