Survey
* Your assessment is very important for improving the work of artificial intelligence, which forms the content of this project
* Your assessment is very important for improving the work of artificial intelligence, which forms the content of this project
NGD18N45CLB Ignition IGBT 18 Amps, 450 Volts N−Channel DPAK This Logic Level Insulated Gate Bipolar Transistor (IGBT) features monolithic circuitry integrating ESD and Over−Voltage clamped protection for use in inductive coil drivers applications. Primary uses include Ignition, Direct Fuel Injection, or wherever high voltage and high current switching is required. http://onsemi.com 18 AMPS 450 VOLTS VCE(on) 3 2.1 V @ IC = 10 A, VGE . 4.5 V Features • • • • • • • • • Ideal for Coil−on−Plug Applications DPAK Package Offers Smaller Footprint for Increased Board Space Gate−Emitter ESD Protection Temperature Compensated Gate−Collector Voltage Clamp Limits Stress Applied to Load Low Threshold Voltage Interfaces Power Loads to Logic or Microprocessor Devices Low Saturation Voltage High Pulsed Current Capability Emitter Ballasting for Short−Circuit Capability This is a Pb−Free Device MAXIMUM RATINGS (TJ = 25°C unless otherwise noted) Symbol Value Unit Collector−Emitter Voltage VCES 500 VDC Collector−Gate Voltage VCER 500 VDC Gate−Emitter Voltage VGE 18 VDC IC 18 50 ADC AAC Rating Collector Current−Continuous @ TC = 25°C − Pulsed ESD (Human Body Model) R = 1500 Ω, C = 100 pF ESD ESD (Machine Model) R = 0 Ω, C = 200 pF ESD 400 V PD 115 0.77 Watts W/°C TJ, Tstg −55 to +175 °C Total Power Dissipation @ TC = 25°C Derate above 25°C Operating and Storage Temperature Range C RG G RGE E 4 1 2 3 MARKING DIAGRAM 1 Gate 2 Collector kV 8.0 Stresses exceeding Maximum Ratings may damage the device. Maximum Ratings are stress ratings only. Functional operation above the Recommended Operating Conditions is not implied. Extended exposure to stresses above the Recommended Operating Conditions may affect device reliability. DPAK CASE 369C STYLE 7 YWW G18 N45BG 4 Collector 3 Emitter G18N45B Y WW G = Device Code = Year = Work Week = Pb−Free Device ORDERING INFORMATION Device NGD18N45CLBT4G Package Shipping† DPAK 2500/Tape & Reel (Pb−Free) †For information on tape and reel specifications, including part orientation and tape sizes, please refer to our Tape and Reel Packaging Specification Brochure, BRD8011/D. © Semiconductor Components Industries, LLC, 2012 September, 2012 − Rev. 0 1 Publication Order Number: NGD18N45CLB/D NGD18N45CLB UNCLAMPED COLLECTOR−TO−EMITTER AVALANCHE CHARACTERISTICS (Note 2) Symbol Characteristic Single Pulse Collector−to−Emitter Avalanche Energy VCC = 50 V, VGE = 5.0 V, Pk IL = 26.0 A, L = 1.0 mH, Starting TJ = 25°C VCC = 50 V, VGE = 5.0 V, Pk IL = 10.0 A, L = 8.4 mH, Starting TJ = 25°C VCC = 50 V, VGE = 5.0 V, Pk IL = 15.4 A, L = 2.0 mH, Starting TJ = 150°C VCC = 50 V, VGE = 5.0 V, Pk IL = 5.7 A, L = 15.2 mH, Starting TJ = 150°C Value EAS Unit mJ 338 420 237 247 MAXIMUM SHORT−CIRCUIT TIMES Short Circuit Withstand Time – Test 1 (See Figure 17, 3 Pulses with 10 ms Period, Ta = 105°C) tsc1−1 1000 mS Short Circuit Withstand Time – Test 1 (See Figure 17, 3 Pulses with 10 ms Period, Ta = 150°C) tsc1−2 800 mS Short Circuit Withstand Time – Test 2 (See Figure 18, 3 Pulses with 10 ms Period, Ta = 105°C) tsc2−1 5 ms Short Circuit Withstand Time – Test 2 (See Figure 18, 3 Pulses with 10 ms Period, Ta = 150°C) tsc2-2 1 ms RθJC 1.3 °C/W RθJA 95 °C/W TL 275 °C THERMAL CHARACTERISTICS Thermal Resistance, Junction to Case Thermal Resistance, Junction to Ambient DPAK (Note 1) Maximum Lead Temperature for Soldering Purposes, 1/8″ from case for 5 seconds ELECTRICAL CHARACTERISTICS Characteristic Symbol Test Conditions Temperature Min Typ Max Unit IC = 2.0 mA TJ = −40°C to 150°C 430 455 470 VDC IC = 10 mA TJ = −40°C to 150°C 440 475 500 TJ = 25°C − 0.5 20 TJ = 150°C − 75 250 TJ = −40°C − 0.2 10 TJ = 25°C − − 2.0 TJ = 25°C − 0.7 1.0 TJ = 150°C − 12 25 TJ = −40°C − 0.1 1.0 TJ = 25°C 24 27 30 TJ = 150°C 26 29 33 TJ = −40°C 23 26 29 IG = 5.0 mA TJ = −40°C to 150°C 11 13 15 VDC VGE = 10 V TJ = −40°C to 150°C 384 590 700 mADC OFF CHARACTERISTICS (Note 2) Collector−Emitter Clamp Voltage Zero Gate Voltage Collector Current BVCES ICES VCE = 350 V, VGE = 0 V VCE = 15 V, VGE = 0 V Reverse Collector−Emitter Leakage Current IECS VCE = −24 V Reverse Collector−Emitter Clamp Voltage BVCES(R) IC = −75 mA Gate−Emitter Clamp Voltage Gate−Emitter Leakage Current BVGES IGES mADC mA VDC Gate Resistor RG − TJ = −40°C to 150°C − 70 − Ω Gate Emitter Resistor RGE − TJ = −40°C to 150°C 10 16 26 kΩ 1. When surface mounted to an FR4 board using the minimum recommended pad size. http://onsemi.com 2 NGD18N45CLB ELECTRICAL CHARACTERISTICS (continued) Characteristic Symbol Test Conditions Temperature Min Typ Max Unit VDC ON CHARACTERISTICS (Note 2) Gate Threshold Voltage Collector−to−Emitter On−Voltage Threshold Temperature Coefficient (Negative) Forward Transconductance TJ = 25°C 1.1 1.56 1.9 IC = 1.0 mA, VGE = VCE TJ = 150°C 0.75 1.08 1.4 TJ = −40°C 1.2 1.75 2.1 IC = 7 A, VGE = 4.5 V TJ = −40°C to 150°C 1.10 1.84 2.30 IC = 7 A, VGE = 4.0 V TJ = −40°C to 150°C 1.15 1.89 2.35 IC = 7 A, VGE = 3.7 V TJ = −40°C to 150°C 1.20 1.93 2.50 IC = 10 A, VGE = 4.5 V TJ = −40°C to 150°C 1.45 2.07 2.65 IC = 10 A, VGE = 4.0 V TJ = −40°C to 150°C 1.50 2.13 2.80 IC = 10 A, VGE = 3.7 V TJ = −40°C to 150°C 1.55 2.19 2.85 IC = 10 mA, VGE = 4.5 V TJ = −40°C to 150°C − 0.65 1.00 − − − − 3.5 − mV/°C gfs VCE = 5.0 V, IC = 6.0 A TJ = −40°C to 150°C 6.0 14 25 Mhos 400 780 1000 pF VCC = 25 V, VGE = 0 V f = 1.0 MHz TJ = −40°C to 150°C 50 72 100 4.0 6 10 VGE(th) VCE(on) V DYNAMIC CHARACTERISTICS (Note 2) Input Capacitance CISS Output Capacitance COSS Transfer Capacitance CRSS SWITCHING CHARACTERISTICS (Note 2) Turn−Off Delay Time Fall Time Turn−On Delay Time Rise Time td(off) VCC = 300 V, VGE = 5 V RG = 1.0 kΩ, RL = 46 Ω, TJ = 25°C 1.0 2.9 12 tf VCC = 300 V, VGE = 5 V RG = 1.0 kΩ, RL = 46 Ω, TJ = 25°C 1.0 2.5 7.0 td(on) VCC = 14 V, VGE = 5 V RG = 1.0 kΩ, RL = 1 Ω TJ = 25°C 0.1 0.42 1.4 tr VCC = 14 V, VGE = 5 V RG = 1.0 kΩ, RL = 1 Ω TJ = 25°C 1.0 2.5 9.0 mSec mSec 2. Electrical Characteristics at temperature other than 25°C, Dynamic and Switching characteristics are not subject to production testing. http://onsemi.com 3 NGD18N45CLB TYPICAL ELECTRICAL CHARACTERISTICS (unless otherwise noted) 60 50 5V 40 4.5 V TJ = 25°C 30 4V 3.5 V 20 3V 10 0 2.5 V 0 1 2 4 3 5 6 7 4.5 V 40 TJ = −40°C 3.5 V 20 3V 10 2.5 V 0 3 4 6 5 7 5V TJ = 150°C 30 4.5 V 4V 20 3.5 V 3V 10 2.5 V 1 2 3 4 5 6 7 50 VCE = 10 V 45 TJ = −40°C 35 30 TJ = 25°C 25 20 15 10 5 0 8 0 3.0 IC = 15 A 2.5 IC = 10 A 2.0 IC = 5 A 1.5 1.0 0.5 VGE = 5 V −25 0 25 50 75 100 2 3 4 5 6 7 8 Figure 4. Transfer Characteristics VCE, COLLECTOR TO EMITTER VOLTAGE (V) 3.5 1 VGE, GATE TO EMITTER VOLTAGE (V) IC = 20 A IC = 25 A TJ = 150°C 40 Figure 3. Output Characteristics 4.0 8 55 VCE, COLLECTOR TO EMITTER VOLTAGE (V) VCE, COLLECTOR TO EMITTER VOLTAGE (V) 2 1 Figure 2. Output Characteristics 40 0 −50 4V 30 Figure 1. Output Characteristics VGE = 10 V 0 5V VCE, COLLECTOR TO EMITTER VOLTAGE (V) 50 0 50 0 8 VGE = 10 V VCE, COLLECTOR TO EMITTER VOLTAGE (V) 60 IC, COLLECTOR CURRENT (A) IC, COLLECTOR CURRENT (A) VGE = 10 V IC, COLLECTOR CURRENT (A) IC, COLLECTOR CURRENT (A) 60 125 150 3.5 TJ = 25°C 3.0 IC = 15 A 2.5 IC = 10 A 2.0 IC = 5 A 1.5 1.0 0.5 0 4 TJ, JUNCTION TEMPERATURE (°C) 5 6 7 8 9 VGE, GATE TO EMITTER VOLTAGE (V) Figure 5. Collector−to−Emitter Saturation Voltage vs. Junction Temperature Figure 6. Collector−to−Emitter Voltage vs. Gate−to−Emitter Voltage http://onsemi.com 4 10 10000 3.5 IC = 15 A 2.5 IC = 10 A 2.0 1000 Ciss 100 Coss 10 Crss C, CAPACITANCE (pF) 3.0 TJ = 150°C IC = 5 A 1.5 1.0 0.5 4 5 6 7 8 9 10 0 20 40 60 80 100 120 140 160 180 200 VGE, GATE TO EMITTER VOLTAGE (V) VCE, COLLECTOR TO EMITTER VOLTAGE (V) Figure 7. Collector−to−Emitter Voltage vs. Gate−to−Emitter Voltage Figure 8. Capacitance Variation 100 2.0 1.8 1.6 1.4 1.2 1.0 0.8 0.6 0.4 25°C 150°C 10 0.2 0 −50 −30 −10 10 30 50 70 90 1 110 130 150 10 1 TJ, JUNCTION TEMPERATURE (°C) L, INDUCTANCE (mH) Figure 9. Gate Threshold Voltage vs. Junction Temperature Figure 10. Minimum Open Secondary Latch Current vs. Inductance 12 100 10 SWITCHING TIME (ms) IL, LATCH CURRENT (A) 1 0 0 IL, LATCH CURRENT (A) VGE(th), GATE THRESHOLD VOLTAGE (V) VCE, COLLECTOR TO EMITTER VOLTAGE (V) NGD18N45CLB 25°C 150°C 10 8 VCC = 300 V VGE = 5.0 V RG = 1000 Ω IC = 10 A L = 300 mH tf 6 td(off) 4 2 1 1 0 −50 −30 −10 10 10 30 50 70 90 110 130 150 L, INDUCTANCE (mH) TEMPERATURE (°C) Figure 11. Typical Open Secondary Latch Current vs. Inductance Figure 12. Inductive Switching Fall Time vs. Temperature http://onsemi.com 5 NGD18N45CLB 100 DC COLLECTOR CURRENT (A) COLLECTOR CURRENT (A) 100 10 100 ms 1 ms 1 10 ms 100 ms 0.1 0.01 10 100 100 ms 0.1 1000 100 ms 1 1 ms 10 ms 10 100 1000 COLLECTOR−EMITTER VOLTAGE (V) COLLECTOR−EMITTER VOLTAGE (V) Figure 13. Single Pulse Safe Operating Area (Mounted on an Infinite Heatsink at TA = 255C) Figure 14. Single Pulse Safe Operating Area (Mounted on an Infinite Heatsink at TA = 1255C) 100 100 COLLECTOR CURRENT (A) t1 = 1 ms, D = 0.05 COLLECTOR CURRENT (A) 1 0.01 1 t1 = 2 ms, D = 0.10 10 t1 = 3 ms, D = 0.30 1 0.1 0.01 10 DC 1 10 100 t1 = 1 ms, D = 0.05 t1 = 3 ms, D = 0.30 1 0.1 0.01 1000 t1 = 2 ms, D = 0.10 10 1 10 100 1000 COLLECTOR−EMITTER VOLTAGE (V) COLLECTOR−EMITTER VOLTAGE (V) Figure 15. Pulse Train Safe Operating Area (Mounted on an Infinite Heatsink at TC = 255C) Figure 16. Pulse Train Safe Operating Area (Mounted on an Infinite Heatsink at TC = 1255C) VBATT = 16 V VBATT = 16 V RL = 0.1 W RL = 0.1 W L = 10 mH L = 10 mH 5.0 V 0V 5.0 V 0V VIN RG = 1 kW tsc1 VIN RG = 1 kW tsc2 RS = 33 mW Figure 17. Circuit Configuration for Short Circuit Test #1 Figure 18. Circuit Configuration for Short Circuit Test #2 http://onsemi.com 6 NGD18N45CLB 100 R(t), TRANSIENT THERMAL RESISTANCE (°C/W) Duty Cycle = 0.5 0.2 10 0.1 0.05 0.02 1 0.01 0.1 0.01 D CURVES APPLY FOR POWER PULSE TRAIN SHOWN READ TIME AT t1 P(pk) Single Pulse t1 0.001 t2 DUTY CYCLE, D = t1/t2 0.0001 0.00001 0.0001 0.001 0.01 TJ(pk) − TA = P(pk) RqJA(t) RqJC X R(t) for t ≤ 0.2 s 0.1 t,TIME (S) Figure 19. Transient Thermal Resistance (Non−normalized Junction−to−Ambient mounted on minimum pad area) http://onsemi.com 7 1 NGD18N45CLB PACKAGE DIMENSIONS DPAK CASE 369C ISSUE C −T− NOTES: 1. DIMENSIONING AND TOLERANCING PER ANSI Y14.5M, 1982. 2. CONTROLLING DIMENSION: INCH. C B V SEATING PLANE E R 4 Z A S 1 2 3 U K F J L H D G 2 PL 0.13 (0.005) M T DIM A B C D E F G H J K L R S U V Z INCHES MIN MAX 0.235 0.245 0.250 0.265 0.086 0.094 0.027 0.035 0.018 0.023 0.037 0.045 0.180 BSC 0.034 0.040 0.018 0.023 0.102 0.114 0.090 BSC 0.180 0.215 0.025 0.040 0.020 −−− 0.035 0.050 0.155 −−− STYLE 7: PIN 1. 2. 3. 4. MILLIMETERS MIN MAX 5.97 6.22 6.35 6.73 2.19 2.38 0.69 0.88 0.46 0.58 0.94 1.14 4.58 BSC 0.87 1.01 0.46 0.58 2.60 2.89 2.29 BSC 4.57 5.45 0.63 1.01 0.51 −−− 0.89 1.27 3.93 −−− GATE COLLECTOR EMITTER COLLECTOR ON Semiconductor and are registered trademarks of Semiconductor Components Industries, LLC (SCILLC). SCILLC owns the rights to a number of patents, trademarks, copyrights, trade secrets, and other intellectual property. A listing of SCILLC’s product/patent coverage may be accessed at www.onsemi.com/site/pdf/Patent−Marking.pdf. SCILLC reserves the right to make changes without further notice to any products herein. SCILLC makes no warranty, representation or guarantee regarding the suitability of its products for any particular purpose, nor does SCILLC assume any liability arising out of the application or use of any product or circuit, and specifically disclaims any and all liability, including without limitation special, consequential or incidental damages. “Typical” parameters which may be provided in SCILLC data sheets and/or specifications can and do vary in different applications and actual performance may vary over time. All operating parameters, including “Typicals” must be validated for each customer application by customer’s technical experts. SCILLC does not convey any license under its patent rights nor the rights of others. SCILLC products are not designed, intended, or authorized for use as components in systems intended for surgical implant into the body, or other applications intended to support or sustain life, or for any other application in which the failure of the SCILLC product could create a situation where personal injury or death may occur. Should Buyer purchase or use SCILLC products for any such unintended or unauthorized application, Buyer shall indemnify and hold SCILLC and its officers, employees, subsidiaries, affiliates, and distributors harmless against all claims, costs, damages, and expenses, and reasonable attorney fees arising out of, directly or indirectly, any claim of personal injury or death associated with such unintended or unauthorized use, even if such claim alleges that SCILLC was negligent regarding the design or manufacture of the part. SCILLC is an Equal Opportunity/Affirmative Action Employer. This literature is subject to all applicable copyright laws and is not for resale in any manner. PUBLICATION ORDERING INFORMATION LITERATURE FULFILLMENT: Literature Distribution Center for ON Semiconductor P.O. Box 5163, Denver, Colorado 80217 USA Phone: 303−675−2175 or 800−344−3860 Toll Free USA/Canada Fax: 303−675−2176 or 800−344−3867 Toll Free USA/Canada Email: [email protected] N. American Technical Support: 800−282−9855 Toll Free USA/Canada Europe, Middle East and Africa Technical Support: Phone: 421 33 790 2910 Japan Customer Focus Center Phone: 81−3−5817−1050 http://onsemi.com 8 ON Semiconductor Website: www.onsemi.com Order Literature: http://www.onsemi.com/orderlit For additional information, please contact your local Sales Representative NGD18N45CLB/D