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EEL6935 Advanced MEMS (Spring 2005) Instructor: Dr. Huikai Xie Lecture 15 RF MEMS (3) Agenda: Ê Ê S-Parameters Mechanical Modeling of RF MEMS Devices – Dynamic Analysis Ê Electromagnetic Modeling Most figures and data in this lecture, unless cited otherwise, were taken from RF MEMS Theory, Design and Technology by G. Rebeiz. EEL6935 Advanced MEMS 2005 H. Xie 3/14/2005 1 S-Parameters Y and Z parameter models use input and output voltage and current signals. Scattering Parameters, or Sparameters have inputs and outputs expressed in power. a is assigned to incident values while b indicates reflected values. S-parameters are transmission and reflection coefficients. Transmission coefficients are referred to as gains and attenuations Reflection coefficients are related to voltage standing wave ratios (VSWRs) and Impedances. EEL6935 Advanced MEMS 2005 H. Xie 2 S-Parameters S21 a1 S11 b1 S22 b2 b1 = S11a1 + S12 a2 a2 b2 = S 21a1 + S 22 a2 S12 EEL6935 Advanced MEMS 2005 H. Xie 3 S-Parameters S21 a1 b1 S11 S22 b2 a2 S12 reflection coefficient Γ = S11 EEL6935 Advanced MEMS 2005 H. Xie Smith Chart 4 Dynamic Analysis of MEMS Switches Damping Switching time Release time EEL6935 Advanced MEMS 2005 H. Xie 5 Damping Gas Fundamentals λ = Mean-free path 1 2π N σ 2 N is the number density of gas. σ: gas molecule’s diameter. λ0=0.07-0.09µm for most gases at STP (standard temperature and pressure, i.e., P0=101 kPa at room temperature). For a gas at a pressure Pa, the mean free path can be obtained by λa = P0 λ0 Pa For example, if Pa = 1 mtorr = 7.5 Pa, then λa = 1mm, which is much greater than the gaps of MEMS devices. EEL6935 Advanced MEMS 2005 H. Xie 6 Damping Gas Fundamentals Kn = Knudsen Number λ where g: air gap. g Knudsen number is a measure of the viscosity of the gas. The smaller the Knudsen number, the more viscous the gas or fluid is. Coefficient of viscosity µ = 1.2566 × 10 −6 110.33 T 1 + T −1 kg/m ⋅ s T is in Kelvin and this equation is for ideal and quasi-ideal gases. At STP, µ = 1.845 ×10-5 kg/(m·s). Viscosity changes with Knudsen number. Veijola et al derived the dependence: µ µe = EEL6935 Advanced MEMS 1 + 9.638 K n1.159 2005 H. Xie 7 Damping Gas Fundamentals Squeeze Number σ (ω ) = 12 µel 2 ω Pa g 2 where ω is the applied mechanical frequency. l: the characteristic length. For a circular membrane, l is the radius. For a rectangle, l is the shortest dimension. Squeeze-film damping Æ b Gas compression Æ spring force Æ ka At low frequencies ka ≈ 0. b = 3 µ A2 2π g 03 b ka At high frequencies (i.e., high squeeze number), ka Æ PaA/g High squeeze number will increase the effective stiffness and thus the resonance frequency. EEL6935 Advanced MEMS 2005 H. Xie 8 Damping Quality Factor at Atmospheric Pressure Fixed-fixed beam Cantilever Beam Qcant = Eρt2 µ ( wl ) 2 Q ff = g 03 where w and l are the width and length of the cantilever. Eρt2 µ ( wl / 2 ) 2 g 03 Given l=300um, w=60um, t=1um and g0=3um Æ Q=1.0 At very low pressures, µÆ0. The damping coefficient is limited by anchor loss, internal friction loss and thermoelastic dissipation (TED). Damping Variation Versus Gap Height 2 x Qe = Q 1.1 − g 0 3/ 2 (1 + 9.638K ) 1.159 n Q is small-displacement quality factor at g=g0. Derived by Sadd and Siffler (Trans. ASME, pp.1366-1370, Nov. 1975) 2005 H. Xie EEL6935 Advanced MEMS 9 Nonlinear Dynamic Analysis Switching time Equation of Motion mx + bx + kx + k s x3 = Fe + Fc where Fe = ε 0 AV 2 1 2 ( g 0 + td / ε r − x ) 2 dC dV V = Vs − C +V R dt dt Fc = C1 A ( g0 − x ) 3 Attractive van der Waals force − C2 A ( g0 − x ) 10 C1 and C2 strongly depends on surface materials and conditions. In this analysis, C1=10-80Nm; C2=10-75Nm8 Repulsive nuclear contact force Chan et al, IEEE MTT-S Digest, 1997 EEL6935 Advanced MEMS 2005 H. Xie 10 Nonlinear Dynamic Analysis Parameters of the MEMS Beam for this analysis Table 3.1 EEL6935 Advanced MEMS 2005 H. Xie 11 Switching Time Switching time of fixed-fixed beams Matlab/Simulink can be used to obtain the transient response Resonance frequencies: • Al beam: 106 kHz • Au beam: 39.5 kHz Applied voltage: Vs = 1.4 Vp • Constant voltage • Displacement-dependent damping factor • Higher Q makes switching faster, but little effect above Q=2 EEL6935 Advanced MEMS 2005 H. Xie 12 Switching Time Switching time varying with applied voltage • Au beam; Resonance frequency: f0 = 39.5 kHz • Each cycle: 25 µs; Q = 1 • For Q > 2 (Acceleration-limited), switch time ts ≈ 0.58 (Vp/Vs)/f0 • For Q < 0.5 (Damping-limited), ts ≈ 0.36~1.0 (Vp/Vs)2 /(Qf0) EEL6935 Advanced MEMS 2005 H. Xie 13 Release Time • Release response can be obtained by setting Fe=0 in the nonlinear dynamic equation. • The bridge oscillates if Q>1 • For best release response, Q≈1 • Variable damping has greater effect • Au beam • Resonance frequency: f0 = 39.5 kHz • Each cycle: 25 µs EEL6935 Advanced MEMS 2005 H. Xie 14 Electromagnetic Modeling Capacitive Shunt Switches Ê Circuit model Ê Current distribution Ê Series Resistance Ê Loss EEL6935 Advanced MEMS 2005 H. Xie 15 Capacitive Shunt Switches Top view Cross-sectional View Ground Signal l G: 50-100 µm W: 50-100 µm L: 250-400 µm w: 25-180 µm g: 1.5-5 µm Ground Coplanar Waveguide EEL6935 Advanced MEMS 2005 H. Xie 16 Capacitive Shunt Switches Current Distribution Up-state Position Down-state Position • No RF current on the middle portion of the bridge • RF current is carried only at the edge of the t-line • RF current is concentrated on the bridge edge over the CPW gap. • Changing the bridge width does not affect the current distribution. • For down-state position, only one edge of the bridge carries the current. This edge is a short circuit to the incoming wave. EEL6935 Advanced MEMS 2005 H. Xie 17 Capacitive Shunt Switches Circuit Model Shunt Impedance 1/ jωC for f f 0 1 = Rs Z s = Rs + jω L + for f = f 0 jω C jω L for f f 0 • • • • LC Resonant Frequency f0 = 1 2π LC C = Cu or Cd depending on the switch position. Typically, f0,u ~300GHz and f0,d ~50GHz. For up-state position, the switch can be modeled as a shunt capacitance to ground. The inductance plays important role for the down-state position. EEL6935 Advanced MEMS 2005 H. Xie 18 Capacitive Shunt Switches Circuit Model Series Resistance Rs1: 0.01~0.1Ω α: t-line loss, 0.2-2dB/cm (or 0.17-1.7 Np/m) • If the bridge thickness is smaller than two skin depths, the switch resistance is constant with frequency. • For thick MEMS bridges, the switch resistance changes as (f)1/2 with frequency. Inductance L: 1-100 pH Switches with meander suspensions for small spring constants have large inductance. Simulators: IE3D, Sonnet, HFSS EEL6935 Advanced MEMS 2005 H. Xie 19 Capacitive Shunt Switches Loss 2 Loss = 1 − S11 − S 21 Loss = 2 I s2 Rs Power loss in MEMS Bridge = Power incident on MEMS switch V + 2 / Z 0 Loss ( dB ) = 10 log (1 − Loss ) EEL6935 Advanced MEMS 2005 H. Xie 20 Capacitive Shunt Switches Loss Up-state Position: Zs >> Z0 Loss = Rs Z 0 Zs Total Loss 2 = ω 2 Cu2 Rs Z 0 Lossu ( dB ) = α l (dB ) + ω 2 Cu2 Rs Z 0 (dB ) (~0.05 dB) Down-state Position: Zs << Z0 4 Rs Z 0 Loss = Z0 Total Loss EEL6935 Advanced MEMS 2 ≈ 4 Rs Z0 Lossd ( dB ) = α l (dB ) + 4 Rs (dB ) Z0 (~0.15 dB) 2005 H. Xie 21 Summary Introduction to S-Parameters Mean-free path at STP: 0.07 µm Knudsen number < 0.1 Æ Viscous Switching time Nonlinear equation of motion Matlab/Simulink can be used to obtain transient response Increasing drive voltages decreases switching time Higher Q Æ faster switching Release time High Q leads to oscillation Optimal Q ≅ 1 EEL6935 Advanced MEMS 2005 H. Xie 22