Survey
* Your assessment is very important for improving the work of artificial intelligence, which forms the content of this project
* Your assessment is very important for improving the work of artificial intelligence, which forms the content of this project
Digitally Controlled Converter with Dynamic Change of Control Law and Power Throughput Carsten Nesgaard Michael A. E. Andersen Nils Nielsen Technical University of Denmark in collaboration with 1 Outline • Power system specifications • The microcontroller • Control algorithm and efficiency • Analytical redundancy concept • Reliability • Experimental verification • Further work • Conclusion 2 Power system specifications • Simple buck topology with measurements of input voltage, input current, output voltage and output current • Microcontroller for converter control and thermal monitoring 12V Input Power switch 5V Output Filter 1AMAX Duty-cycle Temp Input current Input voltage Output current PIC16F877 microcontroller Output voltage 3 The microcontroller 8-bit RISC PIC16F877 microcontroller from Microchip Core features: Uses: 8K 14-bit word flash memory 256 E2PROM data memory Algorithm and look-up table 10-bit PWM module 8 channel 10-bit A/D converter Converter control Single cycle operations 20 MHz clock frequency Execution speed 4 Control algorithm and efficiency • Simple buck topology with measurements of : Input voltage Input current Output voltage Output current • Thermal monitoring • PWM control law for power throughput above 1.85 W • PS control law for power throughput below 1.85 W • Look-up table control when operated within specifications 5 Control algorithm and efficiency Software data flow diagram: System init Measure input voltage Main Interrupt routine responsible for correct converter control Main loop responsible for temperature measurement, calculation of correct control law and type of calculation method (look-up or real-time) Interrupt routine ADC interrupt Converter control in 'real-time' Within spec. If n=100 measure temperature Outside spec. Shut-down converter Request sample Within spec. Sample Timer interrupt Outside spec. Measure VOUT, VIN, IOUT, IIN and calculate power Control law Converter failed Outside spec. Check temperature and deduce converter state Within spec. Converter OK Change in control law 6 Analytical redundancy concept Analytical redundancy is the concept of deducing a set of variables able to accurately describe the actual system behavior Examples: • Converter efficiency is related to system temperature • Output voltage is related to the inductor current Result: • Continuous converter operation (at a deteriorated level) 7 Analytical redundancy concept Case temperature vs. output current 160 TSense 140 Temperature 120 No heatsink 100 80 60 40 20 0 0 0,2 0,4 0,6 0,8 1 1,2 Output current In the event of a fault in PWM mode: The above graph is used to determine converter state h Minimizing the risk of shutting down a wellfunctioning converter 8 Analytical redundancy concept The system is only partially fault tolerant due to: • • Resilience towards faults described by the mathematical system Single converter system – one path from input to output Further improves in system reliability require hardware redundancy Example: Single transistor Increased reliability Increased cost Increased complexity Transistor array 9 Analytical redundancy concept Further advantages of analytical redundancy: • Fault indicator in hardware redundant systems Continuously comparing theoretical system constraints with actual system behavior Enables the system to respond intelligently to unusual system behavior Increasing the overall system fault resilience 10 Reliability Temperature distribution used for reliability assessment: TSurface - 10°C TSurface - 30°C TSurface Printed circuit board 1 resistor 4 diodes 2 capacitors 5 resistors 1 IC 1 inductor 1 diode 4 capacitors 1 resistor 1 MOSFET 8 resistors 3 transistors 4 capacitors Probability of survival as a function of time: R(t) e- t Reliability data found in MIL-217 (assumes a constant failure rate) 11 Reliability Failure rates for the two configurations: Failure rate ( ) 10000 Analog configuration 8000 Digital configuration 6000 4000 Failure rate in FIT 2000 20 40 60 80 100 120 Temperature From a reliability point of view: At temperatures below 120C an analog controller is preferable At temperatures above 120C a digital controller is preferable 12 Reliability Survivability R(t) for 10,000 hours: R(t) R(t) 1.0 0.990 0.8 0.985 0.6 0.980 0.4 0.975 0.2 0.970 60 20 40 60 60 80 100 Temperature 70 80 90 Temperature 0.965 120 Analog configuration Digital configuration The digital configuration is 36 times more likely to fail within 10,000 hours than its analog counterpart. 13 Experimental verification Converter efficiency: 82 80 Efficiency 78 The arrows indicate direction of change in control law 76 74 72 70 0,25 0,3 0,35 Output current 0,4 0,45 The hysteresis loop prevents oscillatory converter behavior when operated close to the optimum point of transition. 14 Experimental verification Gate-Source voltage Output voltage PWM: PS: 15 Experimental verification Inductor current Input voltage PWM: PS: 16 Further work • Graph theoretical approach is used for thorough system analysis • Columns identify the lines interconnecting the individual blocks • Line arrows indicate direction of power or data flow 1 2 Q L 6 Vin T 5 D C 4 I 7 9 PWM 8 1 2 3 4 5 6 7 8 9 1 0 Q 0 0 0 Q 0 0 0 2 0 0 L 0 0 Q I 0 0 3 0 0 0 0 0 V 0 4 0 D C 0 0 0 0 0 0 5 0 Q 0 0 0 Q 0 0 0 6 0 0 0 0 0 0 0 0 T 7 0 0 0 0 P 0 0 0 0 8 0 0 0 0 P 0 0 0 0 9 0 0 0 0 P 0 0 0 0 3 V Block level buck converter VOUT C 0 17 Conclusion A buck converter controlled by a low-cost PIC microcontroller has been presented. The system use analytical redundancy, change in control law and thermal monitoring for increased reliability. Also, an introduction to the proposed techniques has been given supported by calculations concerning the pros and cons of the individual techniques. Finally, a set of measurements has verified that the algorithm is indeed capable of performing the required tasks within the timing limitations of the microcontroller. 18