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Lecture 3 OUTLINE • Semiconductor Basics (cont’d) – Carrier drift and diffusion • PN Junction Diodes – Electrostatics – Capacitance Reading: Chapter 2.1-2.2 EE105 Fall 2011 Lecture 3, Slide 1 Prof. Salahuddin, UC Berkeley Recap: Drift Current • Drift current is proportional to the carrier velocity and carrier concentration: Total current Jp,drift= Q/t Q= total charge contained in the volume shown to the right t= time taken by Q to cross the volume Q=qp(in cm3)X Volume=qpAL=qpAvht Hole current per unit area (i.e. current density) Jp,drift = q p vh EE105 Fall 2011 Lecture 3, Slide 2 Prof. Salahuddin, UC Berkeley Recap: Conductivity and Resistivity • In a semiconductor, both electrons and holes conduct current: J p ,drift qp p E J n ,drift qn( n E ) J tot,drift J p ,drift J n ,drift qp p E qn n E J tot,drift q( p p n n ) E E • The conductivity of a semiconductor is qp p qn n – Unit: mho/cm • The resistivity of a semiconductor is – Unit: ohm-cm EE105 Fall 2011 Lecture 3, Slide 3 1 Prof. Salahuddin, UC Berkeley Electrical Resistance I V + _ W t homogeneously doped sample L V L Resistance R I Wt (Unit: ohms) where is the resistivity EE105 Fall 2011 Lecture 3, Slide 4 Prof. Salahuddin, UC Berkeley Resistivity Example EE105 Fall 2011 Lecture 3, Slide 5 Prof. Salahuddin, UC Berkeley A Second Mechanism of Current Flow is Diffusion EE105 Fall 2011 Lecture 3, Slide 6 Prof. Salahuddin, UC Berkeley Carrier Diffusion • Due to thermally induced random motion, mobile particles tend to move from a region of high concentration to a region of low concentration. – Analogy: ink droplet in water EE105 Fall 2011 Lecture 3, Slide 7 Prof. Salahuddin, UC Berkeley Carrier Diffusion • Current flow due to mobile charge diffusion is proportional to the carrier concentration gradient. – The proportionality constant is the diffusion constant. dp J p qD p dx Notation: Dp hole diffusion constant (cm2/s) Dn electron diffusion constant (cm2/s) EE105 Fall 2011 Lecture 3, Slide 8 Prof. Salahuddin, UC Berkeley Diffusion Examples • Linear concentration profile constant diffusion current • Non-linear concentration profile varying diffusion current x p N 1 L p N exp dp J p ,diff qD p dx N qD p L EE105 Fall 2011 J p ,diff Lecture 3, Slide 9 x Ld dp qD p dx qD p N x exp Ld Ld Prof. Salahuddin, UC Berkeley Diffusion Current • Diffusion current within a semiconductor consists of hole and electron components: dp dn J p ,diff qD p J n ,diff qDn dx dx dn dp J tot,diff q ( Dn Dp ) dx dx • The total current flowing in a semiconductor is the sum of drift current and diffusion current: J tot J p ,drift J n ,drift J p ,diff J n ,diff EE105 Fall 2011 Lecture 3, Slide 10 Prof. Salahuddin, UC Berkeley The Einstein Relation • The characteristic constants for drift and diffusion are related: D kT q kT • Note that 26mV at room temperature (300K) q – This is often referred to as the “thermal voltage”. EE105 Fall 2011 Lecture 3, Slide 11 Prof. Salahuddin, UC Berkeley The PN Junction Diode • When a P-type semiconductor region and an N-type semiconductor region are in contact, a PN junction diode is formed. VD – + ID EE105 Fall 2011 Lecture 3, Slide 12 Prof. Salahuddin, UC Berkeley Diode Operating Regions • In order to understand the operation of a diode, it is necessary to study its behavior in three operation regions: equilibrium, reverse bias, and forward bias. VD = 0 EE105 Fall 2011 VD < 0 Lecture 3, Slide 13 VD > 0 Prof. Salahuddin, UC Berkeley Carrier Diffusion across the Junction • Because of the differences in hole and electron concentrations on each side of the junction, carriers diffuse across the junction: Notation: nn electron concentration on N-type side (cm-3) pn hole concentration on N-type side (cm-3) pp hole concentration on P-type side (cm-3) np electron concentration on P-type side (cm-3) EE105 Fall 2011 Lecture 3, Slide 14 Prof. Salahuddin, UC Berkeley Depletion Region • As conduction electrons and holes diffuse across the junction, they leave behind ionized dopants. Thus, a region that is depleted of mobile carriers is formed. – The charge density in the depletion region is not zero. – The carriers which diffuse across the junction recombine with majority carriers, i.e. they are annihilated. quasiquasineutral neutral region width=Wdep region EE105 Fall 2011 Lecture 3, Slide 15 Prof. Salahuddin, UC Berkeley Some Important Relations dE dx dV E dx Energy=-qV EE105 Fall 2011 Lecture 3, Slide 16 Prof. Salahuddin, UC Berkeley The Depletion Approximation Because charge density ≠ 0 in the depletion region, a large E-field exists in this region: In the depletion region on the N side: dE qN D dx si si E (x) si x b In the depletion region on the P side: qND a -b -qNA qN D x dE qN A dx si si E qN A si a x aN A bN D EE105 Fall 2011 Lecture 3, Slide 17 Prof. Salahuddin, UC Berkeley Carrier Drift across the Junction EE105 Fall 2011 Lecture 3, Slide 18 Prof. Salahuddin, UC Berkeley PN Junction in Equilibrium • In equilibrium, the drift and diffusion components of current are balanced; therefore the net current flowing across the junction is zero. J p ,drift J p ,diff J n,drift J n,diff J tot J p ,drift J n,drift J p ,diff J n,diff 0 EE105 Fall 2011 Lecture 3, Slide 19 Prof. Salahuddin, UC Berkeley Built-in Potential, V0 • Because there is a large electric field in the depletion region, there is a significant potential drop across this region: dp qp p E qDp dx p pp x2 dV D p x1 dV dp p p D p dx dx pn dp p Dp p p kT N V (x 2 ) V (x1 ) ln ln 2 A p pn q n i /N D kT N A N D V0 ln 2 q ni EE105 Fall 2011 Lecture 3, Slide 20 (Unit: Volts) Prof. Salahuddin, UC Berkeley Built-In Potential Example • Estimate the built-in potential for PN junction below. – Note that EE105 Fall 2011 kT ln( 10) 26mV 2.3 60mV q N P ND = 1018 cm-3 NA = 1015 cm-3 Lecture 3, Slide 21 Prof. Salahuddin, UC Berkeley PN Junction under Forward Bias • A forward bias decreases the potential drop across the junction. As a result, the magnitude of the electric field decreases and the width of the depletion region narrows. (x) qND a -b -qNA x ID V(x) V0 -b EE105 Fall 2011 0 a x Lecture 3, Slide 22 Prof. Salahuddin, UC Berkeley