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Low Power Design in CMOS Digital Integrated Circuits Low Power Design © Prentice Hall 1995 Why worry about power? -- Heat Dissipation microprocessor power dissipation source : arpa-esto DEC 21164 Digital Integrated Circuits Low Power Design © Prentice Hall 1995 Evolution in Power Dissipation Digital Integrated Circuits Low Power Design © Prentice Hall 1995 BATTERY (40+ lbs) Nominal Capacity (Watt-hours / lb) Why worry about power — Portability 50 Rechargable Lithium 40 Ni-Metal Hydride 30 20 Nickel-Cadium 10 0 65 70 75 80 85 90 95 Year Multimedia Terminals Laptop Computers Expected Battery Lifetime increase over next 5 years: 30-40% Digital Cellular Telephony Digital Integrated Circuits Low Power Design © Prentice Hall 1995 Where Does Power Go in CMOS? • Dynamic Power Consumption Charging and Discharging Capacitors • Short Circuit Currents Short Circuit Path between Supply Rails during Switching •Leakage Leaking diodes and transistors Digital Integrated Circuits Low Power Design © Prentice Hall 1995 Dynamic Power Consumption Vdd Vin V out CL E n e r g y / t r a n s i t i o n = C L * V d d2 Power = Energy/transition * f = C L * V dd 2 * f Not a function of transistor sizes! Need to reduce C L , V dd , and f to reduce power. Digital Integrated Circuits Low Power Design © Prentice Hall 1995 Dynamic Power Consumption - Revisited Power = Energy/transition * transition rate = CL * Vdd 2 * f0→ 1 = CL * Vdd2 * P0→ 1* f = CEFF * Vdd2 * f Power Dissipation is Data Dependent Function of Switching Activity CEFF = Effective Capacitance = CL * P 0→ 1 Digital Integrated Circuits Low Power Design © Prentice Hall 1995 Power Consumption is Data Dependent Example: Static 2 Input NOR Gate Assume: P(A=1) = 1/2 P(B=1) = 1/2 Then: P(Out=1) = 1/4 P(0→ 1) = P(Out=0).P(Out=1) = 3/4 × 1/4 = 3/16 CEFF = 3/16 * CL Digital Integrated Circuits Low Power Design © Prentice Hall 1995 Transition Probabilities for Basic Gates Digital Integrated Circuits Low Power Design © Prentice Hall 1995 Transition Probability of 2-input NOR Gate Digital Integrated Circuits Low Power Design © Prentice Hall 1995 Problem: Reconvergent Fanout A X B Z Reconvergence P(Z=1) = P(B=1) . P(X=1 | B=1) Becomes complex and intractable real fast Digital Integrated Circuits Low Power Design © Prentice Hall 1995 How about Dynamic Circuits? VDD φ Mp Out In1 In2 In3 PDN φ Me Power is Only Dissipated when Out=0! CEFF = P(Out=0).CL Digital Integrated Circuits Low Power Design © Prentice Hall 1995 4-input NAND Gate Example: Dynamic 2 Input NOR Gate Assume: P(A=1) = 1/2 P(B=1) = 1/2 Then: P(Out=0) = 3/4 CEFF = 3/4 * CL Switching Activity Is Always Higher in Dynamic Circuits Digital Integrated Circuits Low Power Design © Prentice Hall 1995 Transition Probabilities for Dynamic Gates Switching Activity for Precharged Dynamic Gates P0→ 1 = P0 Digital Integrated Circuits Low Power Design © Prentice Hall 1995 Glitching in Static CMOS also called: dynamic hazards X A B Z C ABC 101 000 X Z U nit Delay Observe: No glitching in dynamic circuits Digital Integrated Circuits Low Power Design © Prentice Hall 1995 Example 1: Chain of NOR Gates out1 out2 out3 out4 out5 1 ... 6.0 V (Volt) 4.0 out2 2.0 0.0 0 Digital Integrated Circuits out1 1 out4 out3 out6 out5 t (nsec) out8 out7 2 Low Power Design 3 © Prentice Hall 1995 Example 2: Adder Circuit Add0 Cin Add1 Sum Output Voltage, Volts S0 Add2 Add14 S2 S14 S1 4.0 Add15 S15 4 S15 6 2.0 3 S10 Cin 5 S1 2 0.0 0 5 10 Time, ns Digital Integrated Circuits Low Power Design © Prentice Hall 1995 How to Cope with Glitching? 0 F1 0 1 F2 0 0 2 F3 0 0 F1 1 F3 0 0 F2 1 Equalize Lengths of Timing Paths Through Design Digital Integrated Circuits Low Power Design © Prentice Hall 1995 Short Circuit Currents Vdd Vin Vout CL I VDD (mA) 0.15 0.10 0.05 0.0 Digital Integrated Circuits 1.0 2.0 3.0 Vin (V) 4.0 5.0 Low Power Design © Prentice Hall 1995 Impact of rise/fall times on short-circuit currents VDD VDD ISC ≈0 Vin ISC ≈IMAX Vout CL CL Large capacitive load Digital Integrated Circuits Vout Vin Small capacitive load Low Power Design © Prentice Hall 1995 Short-circuit energy as a function of slope ratio ∆E / E 8 7 6 5 4 3 2 1 0 VDD = 5 V W/L| P = 7.2 µm/1.2 µm W/L| N = 2.4µ m/1.2µm VDD = 3.3 V 0 1 2 3 4 5 r The power dissipation due to short circuit currents is minimized by matching the rise/fall times of the input and output signals. Digital Integrated Circuits Low Power Design © Prentice Hall 1995 Static Power Consumption Vdd Istat V out V in=5V CL Pstat = P(In=1) .Vdd . Istat •Dominates over dynamic consumption •Not a function of switching frequency Digital Integrated Circuits Low Power Design © Prentice Hall 1995 Leakage Vdd Vout Drain Junction Leakage Sub-Threshold Current Sub-Threshold Current Dominant Factor Digital Integrated Circuits Low Power Design © Prentice Hall 1995 Sub-Threshold in MOS √ ID VT =0.2 VT =0.6 VGS Lower Bound on Threshold to Prevent Leakage Digital Integrated Circuits Low Power Design © Prentice Hall 1995 Power Analysis in SPICE V DD i DD + - Circuit Under Test Pav k i DD C R Equivalent Circuit for Measuring Power in SPICE Digital Integrated Circuits Low Power Design © Prentice Hall 1995 Design for Worst Case V DD VDD 1 A 1 F 2 CL 4 C 4 2 A B B 2 D B F 2 A A D 2 1 B 2C 2 Here it is assumed that Rp = Rn Digital Integrated Circuits Low Power Design © Prentice Hall 1995 NORMALIZED POWER-DELAY PRODUCT Reducing Vdd 1.5 P x td = E t = CL * Vdd 2 1.00 0.70 0.50 0.30 0.20 quadratic dependence 0.15 E(Vdd=2) E(Vdd=5) 0.1 2 (CL) * (2) = 2 (CL) * (5) 51 stage ring oscillator 0.07 E(Vdd=2) ≈0.16 E(Vdd =5) 0.05 8-bit adder 0.03 1 2 5 Vdd (volts) Strong function of voltage (V 2 dependence). Relatively independent of logic function and style. Power Delay Product Improves with lowering VDD. Digital Integrated Circuits Low Power Design © Prentice Hall 1995 Lower Vdd Increases Delay 7.50 7.00 multiplier 2.0µ m technology clock generator NORMALIZ ED DELAY 6.50 6.00 5.50 5.00 Td CL * V dd = I I ~ (V dd - V t)2 4.50 4.00 3.50 ring oscillator 3.00 Td(Vdd=2) 2.50 2.00 1.50 1.00 microcoded DSP chip Td(Vdd=5) adder adder (SPICE) 2.00 4.00 V dd (volts) (2) * (5 - 0.7)2 = (5) * (2 - 0.7)2 ≈ 4 6.00 Relatively independent of logic function and style. Digital Integrated Circuits Low Power Design © Prentice Hall 1995 Lowering the Threshold Delay I 2V t Vdd D Vt = 0 Vt = 0.2 V GS Reduces the Speed Loss, But Increases Leakage Interesting Design Approach: DESIGN FOR PLeakage == PDynamic Digital Integrated Circuits Low Power Design © Prentice Hall 1995 Transistor Sizing for Power Minimization Lower Capacitance Higher Voltage Small W/L’s Large W/L’s Higher Capacitance Lower Voltage Larger sized devices are useful only when interconnect dominated. Minimum sized devices are usually optimal for low-power. Digital Integrated Circuits Low Power Design © Prentice Hall 1995 Transistor Sizing for Fixed Throughput Cg = W/L CMIN I ∝ W/L CMIN CMIN = Minimum sized gate (W/L=1) W /L after sizing CP = Cwiring + CDF α = CP / (K CMIN) HIGH PERFORMANCE W/L >> C P / (K CMIN) LOW POWER W/L = 2 CP / (K CMIN) (if CP ≥ K CMIN ) ELSE W/L = 1 NORMALIZED ENERGY 10 7 α=0 5 4 3 α = 0.5 2 1.5 α=1 adder 1.0 0.7 α = 1.5 α=2 0.5 1 3 10 W/L Digital Integrated Circuits Low Power Design © Prentice Hall 1995 Reducing Effective Capacitance Local bus architecture Global bus architecture Shared Resources incur Switching Overhead Digital Integrated Circuits Low Power Design © Prentice Hall 1995 Summary • Power Dissipation is becoming Prime Design Constraint • Low Power Design requires Optimization at all Levels • Sources of Power Dissipation are well characterized • Low Power Design requires operation at lowest possible voltage and clock speed Digital Integrated Circuits Low Power Design © Prentice Hall 1995