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FL7733 EVT1 System Verification Report Oct.29.2013 Power Conversion Korea Inki-Park Company Confidential Schematics[8.4W] LF1/ 10mH L MOV1 /470 CF1 /47nF BD1 /MB6S CF2 /47nF C1 /68nF N F1 1A/250V NS Co1 /470uF DS1 /RS1M R2 /30kΩ D2 /1N4003 C3 /10nF C2 /10uF U1/ FL7733 EVT0 C5 /2.2uF 8 HV VDD 4 6 COMI Gate 2 VS 5 7 NC 3 GND NA Q1/ FQU5N60C R6 /10Ω CS 1 R5 /30kΩ Rcs1 2.0Ω Company Confidential Cy1 2.2nF R4 /200kΩ Rcomp /220Ω 2 + CS1 /20nF NP R1 /30kΩ Do1 /ES3D T1 RS1 RS2 /100kΩ /100kΩ Rcs2 1.5Ω C4 /5pF Co2 /NC Ro1 /20kΩ Transformer[8.4W] Transformer Core : RM6 Inductance of Primary side : 1mH 5 4 RM6 (PC47) NP1(1à2) 2 NS+ NA(5à3) 3 1 Top View NP2 NS NS- NP1 6 5 NS + àNS - 3 NP1(6 à1) 6 NA 1 2 No Winding Pin(S → F) Wire Turns Winding Method 1 NP1 6 à1 0.20φ 54Ts Solenoid winding 2 3 Insulation : Polyester Tape t = 0.025mm, 2Layers NS 4 5 8 3 0.25φ (TIW) 30Ts Solenoid winding Insulation : Polyester Tape t = 0.025mm, 2Layers NA 6 7 NS + à NS- 5à 3 0.16φ 20Ts Solenoid winding Insulation : Polyester Tape t = 0.025mm, 2Layers NP2 1à2 0.20φ 27Ts Insulation : Polyester Tape t = 0.025mm, 6Layers Company Confidential Solenoid winding 1. Protection 1) SCP 2) SRSP 3) SROP 4) ODSP 5) VS OVP 4 Company Confidential SCP Concept VDD 10/19V LED short VIN + 8 HV VCS + 200ms SS Timer SCP is disabled for initial 14 ms 4 VDD VDD 16V/ 7.75V 14ms Timer 0.2V 19V VDD ON S/H SCP 5 VS 10V VDD OFF 200ms JFET regulation 0.3V Gate 14ms VS voltage at gate-off is close to zero when LED load is shorted. SCP is disabled for the initial 14 ms once VDD is higher than UVLO. 200ms JFET regulation enlarges AR time during SCP. 5 Company Confidential 14ms SCP Test Results Test condition: CCOMI[2.2uF], CVDD[10uF]. Vin[90Vac] Vin[265Vac] Ch1[VGATE],,Ch2[VIN], Ch3[VVS], Ch4[IOUT] SCP de-bounce cycle is 4 and operated well. 6 Company Confidential SCP Test Results Test condition: , Rstr[30k], CCOMI[1.0uF], CVDD[10uF]. EVT0 EVT1 TSCP.bnk:14ms -->OK VJFET.HL : 19V TSCP.bnk:16ms Ch1[VDD],,Ch2[VIN], Ch3[VGATE], Ch4[IOUT] TSCP.bnk of EVT1 was larger than EVT0. JFET regulation is operated well. 7 Company Confidential VJFET.LL : 13V Ch1[VGATE],,Ch2[VIN], Ch3[VDD], Ch4[IOUT] Current-mode SRSP Concept TVCS-BNK Gate Vcs TVCS BNK Current Mirror 1 Normal RS 0.1V VIN . DET NA Vcs Blanking Time Ivs VIN.DET RS Short SRSP Rvs1 5 Low Ivs VS Shut Down Rvs2 First GATE signal TVCS-BNK Vcs Gate 5 CS RS 0.1V Vcs Normal RS 0.1V SRSP RS Short High Ivs Current-mode SRSP protects the condition that sensing resistor is short before VDD-ON. Vin level is be detected by Ivs and TVCS-BNK is inversely proportional to Vin level. Once VCS is maintained under 0.1V for TVCS-BNK, SRSP is triggered. Current-mode SRSP is monitored only for first switching cycle. 8 Company Confidential Current-mode SRSP Test Results Test condition: CCOMI[2.2uF], CVDD[10uF]. Vin[265Vac] Vin[90Vac] TonSRSP: 4.2us VJFET.HL : 19V VJFET.LL : 13V Vin[265Vac] TonSRSP: 1.9us Ch1[VDD],,Ch2[VIN], Ch3[VCS], Ch4[IOUT] SRSP is operated well. JFET regulation is operated well. 9 Company Confidential Voltage-mode SRSP Concept Sensing resistor short VIN.DET VIN.DET.PK Current Mirror 4R 6R VIN.DET.PK 60% VIN.DET.PK VIN.DET peak detection SRSP enabled area NA Ivs VIN.DET Rvs1 VCS 5 VS Rvs2 Shut Down Vcs 0.1V 5 CS RS 0.1V Gate Voltage-mode SRSP protects the condition that sensing resistor is short after VDD-ON. SRSP monitoring is enabled when Vin is higher than 60% of peak Vin. Once VCS is maintained under 0.1V for SRSP monitoring time, SRSP is triggered. 10 Company Confidential Voltage-mode SRSP Test Results Test condition: CCOMI[2.2uF], CVDD[10uF]. Vin[90Vac] a Vin[265Vac] b A B Rcs Short SRSP Trigger SRSP Trigger Rcs Short a A Vin: a<b Vcs: a>b Vcs < 0.1V Vcs < 0.1V B b Vin: 83V[≈130V *0.6] Ch1[VDD],,Ch2[VGATE], Ch3[VCS], Ch4[IOUT] Voltage mode SRSP is operated well 11 Company Confidential Vin: a<b Vcs: a>b Vin: 248V[≈368V *0.6] SROP Test Results Test condition: CCOMI[2.2uF], CVDD[10uF]. 1.0us/div 100ms/div Ch1[VGATE],,Ch2[VDD], Ch3[VCS], Ch4[IOUT] SROP is operated well. JFET regulation is operated well. 12 Company Confidential OCP[ODSP] Test Results Test condition: Vin[265Vac], CCOMI[2.2uF], CVDD[10uF]. Csn[20nF], Rsn[100k] 1.0us/div 100ms/div VJFET.HL : 19V VJFET.LL : 13V Ch1[VGATE],,Ch2[VCS], Ch3[VIN], Ch4[IOUT] OCP is triggered with just one pulse. JFET regulation is operated well. 13 Company Confidential OVP – VDD and VS Test Results Test condition: CCOMI[2.2uF], CVDD[10uF]. VDD OVP VS OVP LED Open LED Open VDD: 24.8V VDD: 17.3V VVS: 3.1V VVS: 1.56V Ch1[VGATE],,Ch2[VDD], Ch3[VVS], Ch4[IOUT] After LED opened, VDD OVP is triggered at 24.8V. VS OVP is also triggered at 3.1V after LED opened. 14 Company Confidential OVP – VDD and VS Test Results Test condition: CCOMI[2.2uF], CVDD[10uF]. VJFET.HL : 19V VJFET.LL : 13V Ch1[VGATE],,Ch2[VDD], Ch3[VVS], Ch4[IOUT] JFET regulation is operated well. 15 Company Confidential 2. System 1) CC 2) THD/PF 3) Overshoot 4) Startup 16 Company Confidential CC 1. Test results Test condition: RVS1[200k], RVS2[30k], COUT[470uF], CCOMI[2.2uF] Rcomp[200Ω] Rcomp[220Ω] ±1.05% ±0.59% 265Vac[50Hz] 230Vac[50Hz] 180Vac[50Hz] 140Vac[60Hz] 120Vac[60Hz] 90Vac[60Hz] Rcomp[200Ω] ±1.02% ±0.88% ±1.18% ±1.19% ±1.04% ±1.19% Rcomp[220Ω] ±1.78% ±1.48% ±1.33% ±1.34% ±1.19% ±1.49% 17 Company Confidential CC 1. Test results Test condition: RVS1[200k], RVS2[30k], COUT[470uF], CCOMI[2.2uF] EVT0 EVT1 ±0.59% ±0.6% Load regulation of EVT1 is having different pattern a little from EVT0. 18 Company Confidential THD and PF 1. Test results Test condition: CCOMI[2.2uF] Vin[90Vac] Vin[265Vac] Ch3[VIN], Ch4[IIN] Samples #01 #02 19 Io [mA] 90Vac 265Vac 336 339 334 335 PF 90Vac 0.997 0.997 Company Confidential 265Vac 0.904 0.901 THD[%] 90Vac 265Vac 3.65 7.73 3.53 7.96 Overshoot Concept 18ms SS counter + 13ms counter VDD = VDD_ON 4 VDD 16V/ 7.75V VIN Ivs NA 1.1V Rvs1 VCOMI .M VCOMI Modulator VCOMI .M 1 Ivs. pk IVS peak Detector VCOMI 5 1 Ivs. pk 265Vac VS Rvs2 6 1.1 V 13ms COMI 18 ms Startup Time Vin level is detected by Ivs and VCOMI is charged by VCOMI modulator output. VCOMI modulator output is inversely proportional to Vin level. Therefore, VCOMI is adjusted close to steady state level during softstart time. 20 90Vac Company Confidential Overshoot – 8.4W Test Results Test condition: CCOMI[2.2uF], CVDD[10uF], CVDD[470uF], Lm[1mH]. Vin[277Vac] Vin[90Vac] VCOMI_INT.CLP: 2.1V VCOMI_INT.CLP: 1.1V Vin[265Vac] VCOMI_INT.CLP: 1.5V Ch1[VDD],, Ch2[VIN], Ch3[VCOMI], Ch4[IOUT] VCOMI clamped at startup is inverse proportional to Vin level and operated well. à There are no overshoot even fast On & OFF of AC power. 21 Company Confidential Startup time Test Results Test condition: Vin[90Vac], COUT[470uF], CCOMI[2.2uF], Lm[1mH] Rstr: 30kΩ 178ms Ch1[VDD],, Ch2[VIN], Ch3[VOUT], Ch4[IOUT] Startup time can meet 0.2s. 22 Company Confidential Follow us on Twitter @ twitter.com/fairchildSemi View product and company videos, listen to podcasts and comment on our blog @ www.fairchildsemi.com/engineeringconnections Visit us on Facebook @ www.facebook.com/FairchildSemiconductor 23