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Large-Signal Network Analysis
Technology
to help the R&D Customer
Large-Signal Network Analysis Tools and Techniques
Page 1
Agenda
 Introduction
 Large-Signal
 The
Network Analysis
Large-Signal Network Analyzer
 Calibration
 The
core of the LSNA Technology
 Examples
 A typical
 Next
LSNA measurement session
steps in LSNA Technology
 Wrap-up
Large-Signal Network Analysis Tools and Techniques
Page 2
Design Challenge
“Customers are demanding more capabilities/performance from their devices.”

Designers are looking for better methods of characterizing their components
PA
Designer
I
LO
0
Phase
Splitter
90
Process
Engineer
Rx/Tx
Module
Q
Matched Transistors
Transistors
S
Modeling
Designer
I/Q Modulator
Mixer
PA Module
Demands translate to greater design complexities

More complex modulation schemes

Higher power efficiency requirements

Improved linearity
Large-Signal Network Analysis Tools and Techniques
IC
Designer
System
Designer
MCPA
Page 3
Why can’t I predict device behavior
To be successful in this environment, it is essential to fully characterize
and understand device behavior
 Need
more realistic test conditions
 Devices
that operate in large-signal environments
can’t be characterized with linear tools
Existing tools are insufficient
 Network
analyzers only characterize small-signals (linear) behavior
accurately
 Signal
analyzers evaluate properties of signals interacting with the test
device, they do not analyze the interactions of analyzer with the test
device
Large-Signal Network Analysis Tools and Techniques
Page 4
Amplifier Measurements
AM-PM
ACPR
Gain
Device Under
Test
Large-Signal Network Analysis Tools and Techniques
Page 5
ACPR of an MCPA
Build two MCPAs, one passes the other does not
 Do
you know what to fix?
PASS
FAIL
 ACPR
and other measurement data only represent symptoms of the
problem
 No
insight is provided as to the cause of the problem
Large-Signal Network Analysis Tools and Techniques
Page 6
Existing Measurements and Limitations
DUT
Freq. (GHz)
Z1
DUT
Z2
Spectral re-growth, IMD, ACPR

Characterizes signals caused by nonlinear behavior of components - in the frequency
domain
EVM

Compares deviation of modulated signal from ideal - in the time domain
Limitations

Characterizes signals resulting from interaction DUT - measurement system, device
performance is not isolated

Results will change when environment changes

Different sources and analyzers can produce different results

Characterizing just the DUT requires perfectly matched conditions
Large-Signal Network Analysis Tools and Techniques
Page 7
Existing Measurements and Limitations con’t
DUT
Freq. (GHz)
Z1
DUT
Z2
AM-AM and AM-PM

Characterizes changes in output power and phase with changes in input
power
 Starts defining the transfer function of the nonlinear behavior
Limitations

DUT performance is still not isolated from the rest of the system

Results will change with changes in the environment

Results also depend on type of test signal regardless of matched conditions
Large-Signal Network Analysis Tools and Techniques
Page 8
Existing Measurements and Limitations con’t
VNA, SA
or Pwr Mtr.
VNA, SA
or Pwr Mtr.
x
x
Load Pull

DUT
Load
Tuner(s)
(L )
x
x
Traditional: Characterizes applied impedances and powers at fundamental frequency


Source
Tuner
(S )
Measures incident, reflected and transmitted power as a function of S and L
Harmonic: Characterizes applied impedances and powers at fundamental and harmonics

Provides more complete information than traditional load pull. Harmonic termination has large
impact on performance
Limitations

Information is still missing, the DUT is not completely characterized

Does not allow to apply PA design theory (waveform engineering)

Measurements do not uniquely define a particular test state

May identify multiple local minimums as opposed to a optimal (global) minimum
Large-Signal Network Analysis Tools and Techniques
Page 9
Existing Measurements and Limitations con’t
Modulated S-parameters

Attempt to use known concepts in new situations
Hot S22

Characterizes the interaction of the DUT with the load under large - signal drive

Depends on the chosen configuration
Limitations


Modulated S-parameters do not have a scientific basis

Superposition principles do not apply for nonlinear behavior

Results will vary with the test conditions when device is nonlinear
Hot S22 is still missing critical information for complete nonlinear characterization

The missing data mayor may not impact measurement results
Large-Signal Network Analysis Tools and Techniques
Page 10
Insufficient Modeling Tools
Ideal:
Model
Simulate
Build
Meas
Measurements
correlate with simulations
In a linear environment, S-Parameters are an excellent example
The real world for non-linear characterization:
ACPR
Model
Simulate
Build
Meas
=
S-P
Power
Insufficient
models
Incomplete information
Poor correlation between measurements and simulations
Large-Signal Network Analysis Tools and Techniques
Page 11
Results
 Cut-and-try
 Design
engineering (designers “imagineer” fixes)
verification consumes 2/3rds of development time
 Time-to-market
 Unpredictable
delays
design processes
 Time consuming
tuning and measurement requirements
Large-Signal Network Analysis Tools and Techniques
Page 12
How can Agilent help?
 Large
- Signal Network Analysis is a breakthrough new technology
that provides unprecedented insight into transistor, component and
system behavior using the same concepts across this complete
spectrum
 Through
a small dedicated team Agilent is ready to work closely with
early-adopter customers in different markets to create successes in
their R&D environment through this technology
Large-Signal Network Analysis Tools and Techniques
Page 13
Agenda
 Introduction
 Large-Signal
 The
Network Analysis
Large-Signal Network Analyzer
 Calibration
 The
core of the LSNA Technology
 Examples
 A typical
 Next
LSNA measurement session
steps in LSNA Technology
 Wrap-up
Large-Signal Network Analysis Tools and Techniques
Page 14
Large - Signal Network Analyzer (LSNA)
Technology
 Goals
complete characterization of a device, component and system under
large - signal periodic stimulus at its ports. LSNA technology is
presently limited to devices that maintain periodicity in their response
 deriving nonlinear component characteristics which are invariant for the
used equiment and test signals

 Foundation:
Large-signal Network Analysis
Large-Signal Network Analysis Tools and Techniques
Page 15
Small-Signal Network Analysis
 Small-Signal
Linear Behavior
 Test signal : simple, typically a sine wave
 Superposition principle to analyze behavior in realistic conditions

 Network

Transistor, RFIC, Basestation Amplifier, Communication system
 Analysis

Complete component characterization : S - parameters
(within measurement bandwidth)
Large-Signal Network Analysis Tools and Techniques
Page 16
Large-Signal Network Analysis


Large-Signal

Refers to potential nonlinear behavior

Nonlinear behavior -> Superposition is not valid

Requirement: Put a DUT in realistic large-signal operating conditions
Network


Transistor, RFIC, Basestation Amplifier, Communication system
Analysis

Characterize completely and accurately the DUT behavior for a given type of stimulus

Analyze the network behavior using these measurements
Large-Signal Network Analysis Tools and Techniques
Page 17
Large-Signal Network Analysis: Overview
Measurement System
Realistic
Stimulus
Realistic
Stimulus
v1 a1
i1 b1

Representation Domain

Transistor
RFIC
System
a2 v2
b2 i2
Physical Quantity Sets

Analysis

Frequency (f)

Travelling Waves (A, B)
f (v1 , v2 , i1 , i2 , t | f )  0

Time (t)

Voltage/Current (V, I)

Freq - time
g (v1 , v2 , i1 , i2 , t | f )  0
(envelope)
Large-Signal Network Analysis Tools and Techniques
Page 18
Practical Limitations of LSNA for Large-Signal
Network Analysis
 Large-Signal
Network analysis will be performed using periodic stimuli
one - tone and harmonics
 periodic modulation and harmonics

 The
devices under test maintain periodicity in their response
Large-Signal Network Analysis Tools and Techniques
Page 19
Continuos Wave Signal
All voltages and currents or waves are represented by a
fundamental and harmonics (including DC)
X1
X0
X2
X4
X3
Freq. (GHz)
Freq. (GHz)
DC 1 2
DC 1 2
4
3
4
3
Z1
DUT
Z2
Freq. (GHz)
DC 1 2
3
4
Complex Fourier
coefficients Xh of
waveforms
Freq. (GHz)
DC 1 2 3
Large-Signal Network Analysis Tools and Techniques
4
Freq. (GHz)
DC 1 2
3
4
Page 20
Amplitude and Phase Modulation of Continuos
Wave Signal
Phase
X1(t)
Amplitude
X0(t)
X2(t)
X4(t)
Phasor
Freq. (GHz)
Freq. (GHz)
Modulation
time
DC 1 2
4
3
time
DC 1 2
4
3
X3(t)
Slow change (MHz)
Z1
DUT
Fast change (GHz)
Z2
Freq. (GHz)
time
DC 1 2
3
4
Complex Fourier
coefficients Xh(t) of
waveforms
Freq. (GHz)
time
Large-Signal Network Analysis Tools and Techniques
DC 1 2 3
4
Freq. (GHz)
time
DC 1 2
3
4
Page 21
Periodic Modulated Signals
Phase
X1i
Amplitude
X0i
X2i X
3i
Phasor
Periodic
Modulation
Freq. (GHz)
Freq. (GHz)
DC
1
2
1
DC
3
3
2
Z1
DUT
Z2
Freq. (GHz)
DC 1 2
3
4
Complex Fourier
coefficients Xhm of
waveforms
Freq. (GHz)
DC
Large-Signal Network Analysis Tools and Techniques
1
2
3
Freq. (GHz)
DC
1
2
3
Page 22
Waves (A, B) versus Current/Voltage (V, I)
V  Zc I
A
2
V  AB
V  Zc I
B
2
AB
I
Zc
Typically
Zc  50 
“From device to system level”
Large-Signal Network Analysis Tools and Techniques
Page 23
Small-Signal Network Analysis: S-parameters
Measurement System
a1
b1
Transistor
RFIC
System
50 50
Measurement System
a2
b2
a1
b1

with i representi ng different experiment s
Large-Signal Network Analysis Tools and Techniques
a2
b2
Experiment 2
Experiment 1
a1i , b1i , a2i , b2i
Transistor
RFIC
System
Analysis
b1  S11a1  S12a2
b2  S 21a1  S 22a2
Page 24
Large-Signal Network Analysis
Measurement System
Realistic
Stimulus
Realistic
Stimulus
v1 a1
i1 b1
Transistor
RFIC
System
a2 v2
b2 i2
Different Experiments

Analysis
a1i , b1i , a2i , b2i
f (v1 , v2 , i1 , i2 , t | f )  0
with i representi ng different experiment s
g (v1 , v2 , i1 , i2 , t | f )  0
Large-Signal Network Analysis Tools and Techniques
Page 25
Agenda
 Introduction
 Large-Signal
 The
Network Analysis
Large-Signal Network Analyzer
 Calibration
 The
core of the LSNA Technology
 Examples
 A typical
 Next
LSNA measurement session
steps in LSNA Technology
 Wrap-up
Large-Signal Network Analysis Tools and Techniques
Page 26
Vector Network Analyzer Measurement
A
C
T
I
V
E
C
H
A
N
N
E
L
E
N
T
R
Y
@
7
8
9n
C
H
1C
H
2
R
E
S
P
O
N
S
E
M
4
5
6
S
C
A
L
E
M
E
A
S
F
O
R
M
A
T
R
E
F
k
1
2
3
m
D
I
S
P
L
A
Y
A
V
G
C
A
L
K
R
M
K
RM
F
C
T
N
Response
E
N
T
R
Y
O
F
F
R
L
T
S
O
U
T
C
E
N
T
E
RS
P
A
N
H
P
I
B
S
T
A
T
U
S
Acquisition
P
R
O
B
E
P
O
W
E
R
F
U
S
E
D
P
O
R
T
1
P
O
R
T
2
T
R
A
N
S
R
E
V
R
E
F
L
R
E
V
+
2
6
d
B
m
R
F
3
0
V
D
C
M
A
X
P
O
R
T
S
1
&
2
A
V
O
I
D
S
T
A
T
I
C
D
I
S
H
C
A
R
G
E
Stimulus
Reference
Planes
x
1
I
N
S
A
V
E
S
E
Q
C
O
P
Y
R
E
C
A
L
L
T
R
A
N
S
F
W
D
R
E
F
L
F
W
D
50 Ohm
S-parameters
Linear Theory
Large-Signal Network Analysis Tools and Techniques
-
R
C
H
A
N
N
E
L
U
S
E
R
S
Y
S
T
E
M
L
O
C
A
L
P
R
E
S
E
T
M
E
N
U
3
0
K
H
z
3
G
H
z
7
5
3
D
H8
N
E
T
W
O
R
K
A
N
A
L
Y
Z
E
R
Calibration
0.
I
N
S
T
R
U
M
E
N
T
S
T
A
T
E
S
T
I
M
U
L
U
S
T
O
P
S
T
A
R
TS
Page 27
Large-Signal Network Analyzer
Response
Acquisition
Stimulus
Modulation
Source
Calibration
Reference
Planes
50 Ohm
or
tuner
Complete Spectrum
Waveforms
Harmonics and Periodic Modulation
Large-Signal Network Analysis Tools and Techniques
Page 28
LSNA System Block Diagram
Separates incident and
reflected waves into
four meas. channels
Source
Converts carrier,
harmonics
and modulation
to IF bandwidth
•RF bandwidth: 600 Mhz - 20 GHz
•max RF power: 10 Watt
•Modulation bandwidth
•Needs periodic modulation
Sampling Converter
On wafer
Connectorized
Filter
Test
Set
DUT
Filter
Data-Acquisition
Filter
PC
Filter
Cal Kit
10 MHz IF
LO
Power Std
Phase Std
E1430 - based
4 MHz IF
2nd
Source Or Tuner
Calibration Standards
Large-Signal Network Analysis Tools and Techniques
Page 29
Harmonic Sampling - Signal Class: CW
IF Bandwidth: 4 MHz
LP
fLO=19.98 MHz = (1GHz-1MHz)/50
RF
50 fLO
100 fLO
1
150 fLO
2
3
IF
Cutt Off IF
1
Large-Signal Network Analysis Tools and Techniques
Freq. (GHz)
2
3
Freq. (MHz)
Page 30
Harmonic Sampling - Signal Class: Periodic
Modulation
LP
fLO=19.98 MHz = (1GHz-1MHz)/50
RF
50 fLO
100 fLO
1
150 fLO
2
3
IF
IF Bandwidth: 4 MHz
1
Large-Signal Network Analysis Tools and Techniques
2
3
Freq. (MHz)
Page 31
Harmonic Sampling - Signal Class: Periodic Broadband Modulation
Adapted sampling process
LP
8 MHz
BW
BW
RF
150 fLO
1
IF
2
3
Freq. (GHz)
BW
Freq. (MHz)
BW of Periodic Broadband Modulation = 2* BW IF data acquisition
Large-Signal Network Analysis Tools and Techniques
Page 32
Agenda
 Introduction
 Large-Signal
 The
Network Analysis
Large-Signal Network Analyzer
 Calibration
 The
core of the LSNA Technology
 Examples
 A typical
 Next
LSNA measurement session
steps in LSNA Technology
 Wrap-up
Large-Signal Network Analysis Tools and Techniques
Page 33
LSNA Calibration
Response
F0=1GHz
Stimulus
Modulation
Source
a2DUT
DUT
1
b2DUT
Calibration
a1DUT 
 1 1 0
 DUT 
 
0
b
1
 1   K 1
a2DUT 
 0 0 2
 DUT 

b
0 0 2
 2 
Absolute magnitude
and phase error term
Large-Signal Network Analysis Tools and Techniques
b2m
a1DUT
b
Actual waves at DUT
freq
a1m b1m a2m
Acquisition
Reference
Planes
0  a1m 
 
0  b1m 
 2  a2m 
 m 
 2  b2 
50 Ohm
or
tuner
Measured waves
7 relative error terms
same as a VNA
Page 34
Relative Calibration: Load-Open-Short
K
Acquisition
 1 1 0
 
0
1
 1
 0 0 2

0 0 2
0
0 
2 

2 
{f0, 2 f0, …, n f0}
50 Ohm
Load
Open
Short
50 Ohm
{f0, 2 f0, …, n f0}
Acquisition
F0=1GHz
50 Ohm
Thru
50 Ohm
Calibration for fundamental and Harmonics
Large-Signal Network Analysis Tools and Techniques
Page 35
Power Calibration
K
freq
Amplitude
{f0, 2 f0, …, n f0}
 1 1 0
 
0
1
 1
 0 0 2

0 0 2
Acquisition
Power Meter
50 Ohm
{f0, 2 f0, …, n f0}
F0=1GHz
Large-Signal Network Analysis Tools and Techniques
Page 36
0
0 
2 

2 
Phase Calibration
K
freq
Phase
{f0, 2 f0, …, n f0}
 1 1 0
 
0
1
 1
 0 0 2

0 0 2
Acquisition
f0
50 Ohm
...
Reference Impulse Generator 50 Ohm
f0
F0=1GHz
Large-Signal Network Analysis Tools and Techniques
Page 37
0
0 
2 

2 
Measurement Traceability
Relative Cal
Phase Cal
Power Cal
Agilent Nose-to-Nose Standard
National Standards
(NIST)
Large-Signal Network Analysis Tools and Techniques
Page 38
Agenda
 Introduction
 Large-Signal
 The
Network Analysis
Large-Signal Network Analyzer
 Calibration
 The
core of the LSNA Technology
 Examples
 A typical
 Next
LSNA measurement session
steps in LSNA Technology
 Wrap-up
Large-Signal Network Analysis Tools and Techniques
Page 39
The heart of the Large-Signal Network Analysis

This hardware is the core that will be used to work with the customer in providing
LSNA technology

Combines capabilities of a vector network analyzer, sampling scope and ESGVSA.

Provides complete waveform analysis capabilities

CW/Multi-tones with harmonics

0.6 to 20 GHz frequency coverage

8MHz usable IF BW

10 W power handling capability
Large-Signal Network Analysis Tools and Techniques
Page 40
Agenda
 Introduction
 Large-Signal
 The
Network Analysis
Large-Signal Network Analyzer
 Calibration
 The
core of the LSNA Technology
 Examples
 A typical
 Next
LSNA measurement session
steps in LSNA Technology
 Wrap-up
Large-Signal Network Analysis Tools and Techniques
Page 41
Examples
 Transistor
reliability
 Transistor
model verification (ICCAP / ADS)
 Transistor
model tuning
 PA design
using waveform engineering
 System
level characterization
 Scattering
functions
 Memory
effect
 Dynamic
bias
Large-Signal Network Analysis Tools and Techniques
Page 42
Gate - Drain Breakdown Current
Time (ns)
º TELEMIC / KUL
º transistor provided by David Root, Agilent Technologies - MWTC
Large-Signal Network Analysis Tools and Techniques
Page 43
Forward Gate Conductance
Time (ns)
º TELEMIC / KUL
º transistor provided by David Root, Agilent Technologies - MWTC
Large-Signal Network Analysis Tools and Techniques
Page 44
Examples
 Transistor
reliability
 Transistor
model verification (ICCAP / ADS)
 Transistor
model tuning
 PA design
using waveform engineering
 System
level characterization
 Scattering
functions
 Memory
effect
 Dynamic
bias
Large-Signal Network Analysis Tools and Techniques
Page 45
Use of LSNA measurements in ICCAP
 model verification, optimisation (and
extraction)
sweep of Power
Vgs
Vds Freq
ICCAP specific input
ADS netlist. Used, a.o., to impose the
measured impedance to the output of
the transistor in simulation
Large-Signal Network Analysis Tools and Techniques
Page 46
Transistor De-embedding
Gate current / mA
Equivalent circuit of the
RF test-structure,
including the DUT and
layout parasitics
before
de-embedding
after
2
1
0
-
1
-
2
-
3
0 Network Analysis
0.5 Tools and Techniques
1
Large-Signal
Time/period
1.5
2
Page 47
Input capacitance behaviour
Vds,dc=0.3 V
Vgs,dc=0.9 V
Vds,dc=1.8 V
Input loci turn clockwise, conform i=C*dv/dt
Large-Signal Network Analysis Tools and Techniques
Page 48
Dynamic loadline & transfer characteristic
Vds,dc=0.9 V
Large-Signal Network Analysis Tools and Techniques
Vgs,dc=0.3 V
Page 49
LSNA identifies modeling problem : extrapolation
example SiGe HBT
1.2
1.7
1.1
1.6
v2mts_de
v2sts
v1mts_de
v1sts
1.0
0.9
0.8
1.5
1.4
0.7
1.3
0.6
0.5
1.2
0
100
200
300
400
500
600
700
800
900
0
100
200
300
500
time, psec
0.002
0.008
0.001
0.006
i2mts_de
i2sts
i1mts_de
i1sts
time, psec
400
0.000
-0.001
-0.002
600
700
800
900
meas.
simul.
0.004
0.002
0.000
-0.003
-0.002
0
100
200
300
400
500
600
time, psec
700
800
900
0
100
200
300
400
500
600
700
800
time, psec
SiGe HBT (model parameters extracted using DC measurements up to 1V)
Vbe= 0.9 V; Vce=1.5 V; Pin= - 6 dBm; f0= 2.4 GHz
Large-Signal Network Analysis Tools and Techniques
Page 50
900
LSNA identifies modeling problem : extrapolation
example SiGe HBT
0.025
0.025
0.020
0.020
0.015
0.015
0.010
0.010
i2.i
DCmeas1..Ice
SiGe HBT - DC characteristics
0.005
0.005
0.000
0.000
-0.005
-0.005
-0.010
-0.010
-0.015
-0.015
0.0
0.2
0.4
0.6
0.8
1.0
1.2
1.4
VbDC
Measurement
1.6
0.0
0.2
0.4
0.6
0.8
1.0
1.2
1.4
1.6
VbDC
Simulation
Alcatel Microelectronics and the Alcatel SEL
Stuttgart Research Center teams are acknowledged
for providing these data.
Large-Signal Network Analysis Tools and Techniques
Page 51
Examples
 Transistor
reliability
 Transistor
model verification (ICCAP / ADS)
 Transistor
model tuning
 PA design
using waveform engineering
 System
level characterization
 Scattering
functions
 Memory
effect
 Dynamic
bias
Large-Signal Network Analysis Tools and Techniques
Page 52
Empirical Model Tuning
Parameter Boundaries
GaAs pseudomorphic HEMT
gate l=0.2 um w=100 um
MODEL TO BE OPTIMIZED
“Chalmers Model”
generators apply LSNA measured waveforms
“Power swept measurements under mismatched conditions”
º Dominique Schreurs, IMEC & KUL-TELEMIC
Large-Signal Network Analysis Tools and Techniques
Page 53
Using the Built-in Optimizer
During OPTIMIZATION
Voltage - Current State Space
voltage
current
gate
drain
Time domain waveforms
Large-Signal Network Analysis Tools and Techniques
gate
drain
Frequency domain
Page 54
Verification of the Optimized Model
AFTER OPTIMIZATION
Voltage - Current State Space
voltage
current
gate
drain
Time domain waveforms
Large-Signal Network Analysis Tools and Techniques
gate
drain
Frequency domain
Page 55
Examples
 Transistor
reliability
 Transistor
model verification (ICCAP / ADS)
 Transistor
model tuning
 PA design
using waveform engineering
 System
level characterization
 Scattering
functions
 Memory
effect
 Dynamic
bias
Large-Signal Network Analysis Tools and Techniques
Page 56
Waveform Engineering Block Diagram
Source
f0
Filter
Filter
DUT
Test
Set
Filter
Filter
Data-Acquisition
Sampling Converter
PC
LO
f0
3f0
IRCOM Setup
2f0
Large-Signal Network Analysis Tools and Techniques
Page 57
Example - Measured Waveforms
MesFET Class F
f0=1.8 GHz
Ids0=7 mA
Vds0= 6 V
PAE50%
Waveform
Engineering
Z(f0)=130+j73 
Z(2f0)=1-j2.8 
Z(3f0)=20-j97 
PAE=84%
º IRCOM / Limoges
Large-Signal Network Analysis Tools and Techniques
Page 58
Example - Performance Improvement
Derived Information from the V/I waveforms (swept input power at different terminations)
Z(f0)=123+j72 
Z(2f0)=50 
Z(3f0)=50 
PAE74%
Z(f0)=123+j72 
Z(2f0)=2 - j 4.0 
Z(3f0)=50 
PAE74%
Z(f0)=123+j72 
Z(2f0)=2 - j 4.0 
Z(3f0)=21-96 
PAE84%
º IRCOM / Limoges
Large-Signal Network Analysis Tools and Techniques
Page 59
Examples
 Transistor
reliability
 Transistor
model verification (ICCAP / ADS)
 Transistor
model tuning
 PA design
using waveform engineering
 System
level characterization
 Scattering
functions
 Memory
effect
 Dynamic
bias
Large-Signal Network Analysis Tools and Techniques
Page 60
RFIC Amplifier Characterization using periodic modulation
a1
Modulation
Source
E1
f0 = 1.9 GHz
Evaluation Board
A1 shows spectral regrowth
• Spectral regrowth on b1
combined with measurement
system mismatch
• Nonlinear pulling on source
a1
5 dB
E1
Large-Signal Network Analysis Tools and Techniques
Page 61
Transmission Characteristics Carrier Modulation
A1
B2
Carrier Modulation
Harmonic Distortion
Compression
Carrier Modulation
3rd harmonic
Modulation
Large-Signal Network Analysis Tools and Techniques
Page 62
Reflection Characteristics
Carrier Modulation
A1
B1
Carrier Modulation
Harmonic Distortion
Expansion
Carrier Modulation
2nd harmonic
Modulation
3rd harmonic
Modulation
Large-Signal Network Analysis Tools and Techniques
Page 63
Examples
 Transistor
reliability
 Transistor
model verification (ICCAP / ADS)
 Transistor
model tuning
 PA design
using waveform engineering
 System
level characterization
 Scattering
functions
 Memory
effect
 Dynamic
bias
Large-Signal Network Analysis Tools and Techniques
Page 64
Scattering Functions provide device understanding and
enable CAE coupling
Tuners and active injection at harmonics
@ fundamental frequency
@ higher harmonics
Large-Signal Network Analysis Tools and Techniques
Page 65
Nonlinear behaviour and Scattering Functions
Functions of a11
*
bph  Fph  a11  Gph 21  a21  H ph 21  a21

(and independent bias settings)
 G
i 1,2
j 2 ,...,N
*

a

H

a
phij
ij
phij
ij 
Index of: Port & harmonic
Note: a’s and b’s are phase normalized quantities !!
As shown before: for small-signal levels (linear) this reduces to (fundamental at port 2)
b21nn  S21  a11nn  S22  a21nn
Large-Signal Network Analysis Tools and Techniques
Page 66
Scattering functions
variation versus input power
H 2121
F21
20
100
G2121
10
- 20
- 15
- 10
-5
50
5
- 10
G2121
- 20
- 20
F21
- 15
- 10
-5
5
- 50
- 30
- 40
H 2121
- 100
- 50
Large-Signal Network Analysis Tools and Techniques
Page 67
Generated reflection coefficients at port 2 at f0
Generated ’s
21
(a)
’s for verification meas.
Large-Signal Network Analysis Tools and Techniques
Page 68
Time domain waveforms
measured and simulated b-waves
0.2
b1 t 
6
b2 t 
4
0.1
2
200
400
600
800
1000
200
400
600
800
-2
- 0.1
-4
- 0.2
-6
Large-Signal Network Analysis Tools and Techniques
Page 69
1000
Application of CDMA-like signal
Output power versus input power; CW
HL HL
red , CDMA
lines
25
20
15
10
5
- 25
- 20
- 15
Large-Signal Network Analysis Tools and Techniques
- 10
-5
5
Page 70
Frequency domain
b21
20
40
60
80
100
120
140
- 20
- 40
- 60
fc=2.45 GHz, f  50 kHz, modulation BW  1.45 MHz
red=measured, blue=model
Large-Signal Network Analysis Tools and Techniques
Page 71
Examples
 Transistor
reliability
 Transistor
model verification (ICCAP / ADS)
 Transistor
model tuning
 PA design
using waveform engineering
 System
level characterization
 Scattering
functions
 Memory
effect
 Dynamic
bias
Large-Signal Network Analysis Tools and Techniques
Page 72
Time domain
Memory effects !
b2m t 
6
5
4
3
2
250
300
350
400
450
500
b2m t   f a1 t ,a1' t ,,a2 t ,a2' t ,
Large-Signal Network Analysis Tools and Techniques
Page 73
Memory effects
DUT behaviour under 2-Tone excitation
Modulation frequency = 20 kHz
Modulation frequency = 620 kHz
26
26
24
24
22
22
20
20
18
18
16
16
14
14
-8
-6
-4
-2
0
Large-Signal Network Analysis Tools and Techniques
2
4
-8
-6
-4
-2
0
2
Page 74
4
Examples
 Transistor
reliability
 Transistor
model verification (ICCAP / ADS)
 Transistor
model tuning
 PA design
using waveform engineering
 System
level characterization
 Scattering
functions
 Memory
effect
 Dynamic
bias
Large-Signal Network Analysis Tools and Techniques
Page 75
What is “Dynamic Bias Behaviour”?
Output Current
Input Voltage
V1
DC
1
Freq.
(GHz)
I2
DC
1
2
Freq.
(GHz)
Dynamic Bias Behaviour
Frequency Domain:
Generation of Low Frequency Intermodulation Products
Time Domain:
“Beating” of the Bias
Large-Signal Network Analysis Tools and Techniques
Page 76
Dynamic Bias: Measurement Principle
Bias 1
Supply
Current
Probe
Computer
Dynamic Bias
Data Acquisition
Bias 2
Supply
Current
Probe
RF Data Acquisition
TUNER
Large-Signal Network Analysis Tools and Techniques
Page 77
“MultiLine TRL”
RFIC Example in Time Domain
Input Voltage Waveform
(V)
0.5
0
-0.5
-1
-1.5
-2
0
0.2
0.4
0.6
0.8
1
1.2
Normalized Time
Output Current Waveform (without Dynamic Bias)
(mA)
60
40
20
0
0
0.2
0.4
0.6
0.8
1
1.2
Normalized Time
Large-Signal Network Analysis Tools and Techniques
Page 78
Adding Measured Dynamic Bias
Dynamic Bias Current Waveform
(mA)
45
40
35
30
25
0
0.2
0.4
0.6
0.8
1
1.2
Normalized Time
Output Current Waveform (including Dynamic Bias)
0
(mA)
0.2
0.4
0.6
0.8
1
1.2
0
20
40
60
Normalized Time
Large-Signal Network Analysis Tools and Techniques
Page 79
Agenda
 Introduction
 Large-Signal
 The
Network Analysis
Large-Signal Network Analyzer
 Calibration
 The
core of the LSNA Technology
 Examples
 A typical
 Next
LSNA measurement session
steps in LSNA Technology
 Wrap-up
Large-Signal Network Analysis Tools and Techniques
Page 80
LSNA possible next steps driven by customer
needs
 Extending
 Increase
power capability
 Extending
 Offer
modulation BW (3G)
frequency range (50 GHz and beyond …)
pulsed measurements to isolate the thermal effects
 Complete
dynamic bias testing capabilities to characterize the
effects of modulation on bias
 Add
impedance tuning measurements to determine the impact
of differing impedance conditions
 Use
of LSNA technology in high speed digital applications
Large-Signal Network Analysis Tools and Techniques
Page 81
Example: Extending Power Capability
Acquisition
Stimulus
?
Modulation
Source
Calibration
Adapt test - set
Proper absolute calibration
Measurement science
Agilent NMDG
Large-Signal Network Analysis Tools and Techniques
Reference
Planes
Pre-matching
Proper calibration elements
On - board DC bias
Tuners
3rd party
Page 82
Agenda
 Introduction
 Large-Signal
 The
Network Analysis
Large-Signal Network Analyzer
 Calibration
 The
core of the LSNA Technology
 Examples
 A typical
 Next
LSNA measurement session
steps in LSNA Technology
 Wrap-up
Large-Signal Network Analysis Tools and Techniques
Page 83
Wrap-up
 Large-Signal
Network Analysis Technology is breakthrough
technology to characterize nonlinear behavior from transistor to
system
 The
technlogy is targeted toward research and design experts. It
requires a strong background in RF or Microwave theory to be
successful.
 Agilent
NMDG is assigned to make the technology a success with
early-adopter key customers
 More
information at :
“http://wirelesscentral.tm.agilent.com/wirelesscentral/cgibin/epsg.cgi”

If you think the LSNA technology can help you, please contact
[email protected]
Large-Signal Network Analysis Tools and Techniques
Page 84