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Digital IC-Design Chapter 5 The CMOS Inverter Goal With This Chapter Analyze Fundamental Parameters A general understanding of the inverter behavior is useful to understand more complex functions Outline Noise Reliability P f Performance Power Consumption Digital IC-Design Fundamental parameters for digital gates Robustness Noise - “unwanted variations of voltages and currents in logical g nodes” Classical noise such as thermal and flicker noise are not critical in digital design Noise sources in digital circuits are Capacitive coupling Inductive coupling Power and ground noise 1 Capacitive and Inductive Coupling V CCoupling V I Mutual Inductance Power and Ground Noise A voltage or a current change may influence th signal the i l on a parallel ll l wire, especially when: Long wires Sub micron tech. Many metal layers I Definitions VDD RWire VDD ISwitch V Conclusion: The world is not digital. We need to know the limitations A big problem on large synchronously clocked chips On chip decoupling capacitors p helps p (≈ 1/10 of the switched C) DC Operation Voltage Transfer Characteristic (VTC) VIN 5 VOUT Switching Threshold VM when VIN = VOUT 4 VOUT DC Operation Noise Margins Fan OUT - Fan IN VOH 3 Vout = VIN VM 2 Logical “1” at VOH Logical “0” at VOL 1 VOL 1 2 3 4 Balanced if VM = VDD/2 5 VIN 2 Analog versus Digital Signals VOH, VOL = nominal output t t voltage lt VOUT 5 VOH 4 3 Slope = -1 2 Analog versus Digital Signals Nominal Output Levels VOH VIH, VIL = acceptable input voltage Accepteble Input Levels NMH VOL 2 VIL 3 4 VOL VIN VIH Undefined Region 1 1 The noise margins are defined as the difference between VOH/VOL and VIH/VIL NML NML = VIL - VOL O NMH = VOH - VIH VIL VIH The Ideal Gate Fan-In and Fan-Out VOUT Fan-in = M Fan-in = The number of inputs to the gate Fan-out = N Fan-out = The number of gates that loads the gate Rin=∞ Rout=0 Noise Margin=VDD/2 Gain = ∞ VIN 3 Dynamic Definitions A Real Gate NML = VIL - VOL = 0.75 - 0.50 = 0.25V 5 Propagation delay Rise and fall time Power consumption NMH = VOH - VIH = 3.50 - 2.25 = 1.25V 4 VOUT VOH 3 VM = 1.75V VDD VIL VM 2 VIH 1 VOL GND 1 2 3 4 5 VIN Delay Definitions Ring Oscillator – minimum tp V1 VIN V2 V3 V4 V5 Odd # of inverters 50% tpHL tpLH VOUT t 90% 50% t pHL + t pLH 2 V1 “De-facto Standard” for performance V2 V3 V2 10% tf tp = tr Fan-out = 1 V5 t 2 N tp t 4 Ring Oscillator Power Dissipation Two measures are important Peak power (Sets wire dimensions) Do tp = 100ps mean 10 GHz chip? Good Custom Design ≈ 1/10 Synthesized design ≈ 1/50 - 1/100 Why? Low load V1 V2 V3 Ppeak = VDD × iDD max V4 Short Wires Fan-out = 1 Low complexity Power-Delay Product V5 Average power (Battery and cooling) T V Pav = DD ∫ iDD (t ) dt T 0 Digital IC-Design PDP = t p × Pav ( J ) The CMOS Inverter Energy per operation Energy per switching event 5 Inverters The CMOS Inverter VDD On-chip resistors are large St ti power consumption Static ti VOL ≠ 0 Large tpLH GND VDD + Lower static power consumption ti + VOH = VDD; VOL = 0 + tpLH = tpHL If properly designed + Low Impedance connection to ground and VDD Extra process step Static power consumption VOL ≠ 0 Large tpLH VDD GND The CMOS Inverter GND - More fab. stages - Lower hole mobility The CMOS Inverter VDD VDD Wider PMOS to compensate for lower mobility Shared power and ground Cascaded Abuted cells GND VDD In VDD VDD VDD Out GND GND In Out GND In Out GND In Out GND 6 CMOS Inverter - Model VDD Req-p CMOS Static Behavior Complementary i.e. output y a low impedance p have always connection to GND or VDD Load characteristics VTC Switching threshold Noise margin g VOH = VDD CL VOL = 0 Req-n VM = f(Req-n, Req-p) VM = VDD/2 if Req-n = Req-p Load Lines Inverter Load Characteristics The VTC can be determined graphically N-channel ID P-channel IDn = -IDp ID VDS ID VGS=5V - IDp IDn VGS=5V Vin=0V VGS=4V Vin=1V VGS=4V VGS=3V Vin=2V VGS=3V VGS=5V Vin = VDD-V VGSp VGS=-3V VDS VGS=4V VGS=-4V VGS=3V VGS=-3V Vout = VDD-VDSp VDS VGS=-4V VGS=-5V VGS=-5V Vin = VDD-VGSp Vout = VDD-VDSp VDS 7 Inverter Load Characteristics Vin=0V I Vin=0V Region: Linear - Saturation Vin=5V 5 VOUT N sat P lin N off P lin I Vin=5V Vin=1V Vin=4V 4 Vin=2V Vin=1V Vin=4V Vin=2V Vin=3V VM Vin=3V N sat P sat 1 VTC graphically extracted from the l d li load lines VOH= VDD 4 High noise margin 3 NMH=VOH-VIH ≈ 5-2.9 = 2.1V NML =VIL-VOL ≈ 2.1-0 = 2.1V VM= VDD/2 2 Vin=2V Vout N lin P sat 1 2 N lin P off 3 4 VIN 5 Switching Threshold CMOS Inverter VTC 5 Vin=3V 2 Vin=2V Vout VOUT 3 Vin=3V VM Long Channel Transistors Both transistors are saturated k kn (VM − VTn ) 2 = −(− p (VM − VDD − VTp ) 2 ) ⇒ 2 2 kp VM − VTn = − (−VM + VDD + VTp ) ⇒ kn VM + r × VM = VTn + r × (VDD + VTp ) ⇒ 1 VOL= 0 1 2 3 4 VIN 5 ⇒ VM = VTn + r (VDD + VTp ) 1+ r with r = −k p kn 8 Switching Threshold VM = r (VDD + VTp ) + VTn with r = 1+ r −k p Long Channel Transistors kn (VTn = -VTp = 0.5 V) Switching Threshold VM = r (VDD + VTp ) + VTn 1+ r with r = −k p kn 5 5 VM 5 4 4 3 3 2 2 1 1 1 2 4 6 0.1 8 kp/kn10 4 Moderate deviation from kp/kn = 1 gives only small changes in VM VM VM 0.32 1 3.2 kp/kn10 3 2 Wp = 2Wn common to t save area, since the change in VM is small 1 0.1 0.32 1 3.2 kp/kn10 Wp≈3Wn Simulated VTC: Short Channel Switching Threshold: Example Inverter with W/L = 0.6 μ / 0.35 μ VTn = 0.50, kn = 300 μ, r= −k p kn = 103μ = 0.59 300μ Balanced 0.25μm inverter VTp = - 0.65, kp = -103 μ 2.5 2 VDD = 3V 1+ r 0.59 (3 − 0.65) + 0.5 = 1.18 V 1 + 0.59 out = V VM = (V) 1.5 r (VDD + VTp ) + VTn 1 0.5 GND 0 0 0.5 1 1.5 2 2.5 V (V) in 9 VTC: Short Channel Wp Lp = 0.375 0.25 VTC: Short Channel 0.25 Minimum sized 0.25μm transistors ID (mA) Wn 0.375 = Ln 0.25 0.25 ID (mA) VGS = 2.5 25 VIN = 2.5 0.20 0 25 0.25 ID (mA) 0.20 VGS = 2.5 0.20 VIN = 1.875 VGS = 1.875 0.15 VGS = 1.875 0.15 0.10 VIN = 0 0.10 0.10 VGS = 1.25 0 VGS = -0.625 0.05 VGS = 1.25 PMOS 0.05 0 VGS = 1.0 10 VGS = -1.25 VGS = 0.625 VGS = -0.625 VGS = 1.0 VGS = -1.25 VIN = 1.0 10 VIN = 1.25 -0.05 NMOS VIN = 1.25 VIN = 0.625 VGS = 0.625 VGS = -2.5 -0.10 -2.5 -2.0 -1.5 VGS = -1.5 VGS = -1.875 -1.0 -0.5 0 0.5 VIN = 1.875 0 VDS (V) 1.0 1.5 2.0 VIN = 1.0 10 VIN = 0.625 0.5 1.0 VGS = -2.5 -0.10 -2.5 -2.0 -1.5 VGS = -1.875 -1.0 -0.5 0 0.5 VDS (V) 1.0 1.5 2.0 2.0 2.5 VOUT (V) 2.5 -0.05 VGS = -1.5 1.5 Move the PMOS part to the first quadrant 2.5 VTC: Short Channel - Graphically Switching Threshold: Short Channel 0.25 Vout (V) ID (mA) VIN = 2.5 Vout (V) 2.5 2.5 0.20 20 2.0 VTC The threshold VM is when VIN=VOUT 2.0 1.5 VIN = 1.875 1.5 1.0 0.10 VIN = 0 0.5 VIN = 1.25 VIN = 0.625 VIN = 1.0 VIN = 1.25 VIN = 1.875 0 VM =1 V 1.0 VIN = 1.0 VIN = 0.625 0.5 1.0 1.5 2.0 VOUT (V) 2.5 0.5 0 0.5 1.0 1.5 2.0 2.5 Vin (V) 0 0.5 1.0 1.5 2.0 2.5 Vin (V) 10 Switching Threshold: Short Channel Both NMOS and PMOS are velocity saturated kn ((VM −VTn )VDSATn − 2 2 VDSATp VDSATn ) = k p ((VDD −VM + VTp )VDSATp + ) 2 2 VM = V ⎞ VDSATn ⎛ + r ⎜VDD +VTp + DSATp ⎟ 2 2 ⎠ ⎝ 1+ r Minimum transistor dimensions VDSATn = 0.63; VDSATp = −1; VTn = 0.43; VTp = −0.4; 0.375 0.375 kn = ×115 = 172.5; k p = × (−30) = −45 0.25 0.25 r= Solving VM yields VTn + Example 0.25 μm technology where r = k p VDSATp k p VDSATp kn VDSATn VTn + VM = kn VDSATn Example 0.25 μm technology IF VDD >> VDSAT and VT V ⎛ ⎞ V VTn + DSATn + r ⎜VDD + VTp + DSATp ⎟ 2 2 ⎠ r VDD 0.41× 2.5 ⎝ ≈ = = 0.73 V VM = 1+ r 1+ r 1+ 0.41 = Parameters from the inside back cover in the book −45× (−1) = 0.41 172.5× 0.63 V ⎞ VDSATn ⎛ + r ⎜VDD +VTp + DSATp ⎟ 0.43 + 0.63 + 0.41⎛⎜ 2.5 − 0.4 − 1 ⎞⎟ 2 2 ⎠ 2 2⎠ ⎝ ⎝ = = 1.0 V 1+ r 1+ 0.41 Balancing the inverter It is desirable to have VM around VDD/2 2 kn' W V Wn V 2 ((VM −VTn )VDSATn − DSATn ) = k p' p ((VDD −VM + VTp )VDSATp + DSATp ) Ln 2 Lp 2 Assuming Ln = Lp yields VDD not high enough in this case VDSATn2 ) 2 = V 2 Wn k p' ((VDD −VM +VTp )VDSATp + DSATp ) 2 Wp kn' ((VM −VTn )VDSATn − 11 Balancing the inverter Balancing the inverter 1.8 Example using the same data 1.7 1.6 2 To be balanced, The PMOS should be 3.5 times wider than the NMOS M 1.4 V (V) VDSATn 0.63 ) 115× ((1.25 − 0.43) × 0.63 − ) Wp 2 2 = 3.5 = = 2 −1 V Wn −k p' ((VDD +VM −VTp )VDSATp + DSATp ) −30 × (−2.5 +1.25 − (−0.4) − ) 2 2 kn' ((VM −VTn )VDSATn − 15 1.5 2 1.3 1.2 1.1 1 0.9 0 0.8 8 10 2 0 10 W p /W For the minimal NMOS with Wn=0.375 μm, the corresponding PMOS has Wp=1.3 μm Determining VIH and VIL VIH and VIL when the slope is -1 ⇒ 2 V out (V) 1.5 1 ∂VOUT = −1 ∂Vin g= 0.5 0 0 0.5 1 1.5 V (V) in 2 2.5 VM is rather insensitive to changes in the device ratio A ratio decrease from 3.5 to 2 yields VM = 1.13 V which often is acceptable Saves area Determining VIH and VIL A reasonable approximation is to use the gain (g) around VM 2.5 1 n ΔVOUT ΔVin Vout (V) A simplified piecewise linear VTC p VIL 2.5 2.0 g= 1.5 VM 1.0 ΔVOUT ΔVin 0.5 VIH 0 0.5 1.0 1.5 2.0 2.5 Vin (V) 12 Determining VIH and VIL g= Vout (V) VIL 2.5 g= VDD −VM VIL −VM VIL = VM + 2.0 VDD-VM ΔVOUT ΔVin The Inverter Gain (g) g =− VDD −VM g Derived at page 189 1 knVDSATn + k pVDSATp 1+ r ≈− VDSAT I D (VM ) λn − λp (VM −VTn − DSATn )(λn − λp ) 2 0 -2 1.5 Note that the gain is very y sensitive to the channel-length modulation -4 VM -6 VM-VIL g= 0.5 VIH 0 0.5 1.0 1.5 2.0 2.5 Vin (V) VM VM −VIH V VIH = VM − M g VDD −VM g V VIH = VM − M g 2.0 VDD-VM 1.5 VM 1.0 NMH = VDD −VIH ; VM-VIL -12 -14 -16 -18 0 0.5 1 1.5 2 2.5 V (V) Example (Minimum sized transistors) VIL = VM + VIL 2.5 -8 8 -10 in Noise Margins Vout (V) gain 1.0 0.5 g ≈− Vout (V) VIL 2.5 2.0 VDD-VM =− 1.5 NML = VIL VM 1.0 = −34.6 VIH 0.5 1.0 1.5 1 + 0.41 = 0.63 (1 − 0.43 − )(0.06 + 0.1) 2 VM-VIL 0.5 0 1+ r = V (VM −VTn − DSATn )(λn − λp ) 2 VIH 2.0 2.5 Vin (V) 0 0.5 1.0 1.5 2.0 2.5 Vin (V) 13 Example (Minimum size transistors) CMOS Dynamic Behavior VDD −VM 2.5 −1 = 1+ = 0.96 V g −34.6 V 1 VIH = VM − M = 1− = 1.03 V g −34.6 VIL = VM + Vout (V) VIL 2.5 2.0 VDD-VM Capacitors Propagation delay Power consumption 1.5 NMH = VDD −VIH = 2.5 − 0.96 = 1.54 V VM 1.0 NML = VIL = 1.03 1 03 V VM-VIL 0.5 VIH 0 0.5 1.0 1.5 2.0 2.5 Vin (V) Inverter Load Slightly to large values due to the approximation Vin Vout CL Capacitance model for propagation d l delay calculations l l ti Inverter Load Cgd = Overlap Capacitance Cdb = Junction Capacitance Cw = Wire Wi Capacitance C i VDD Cg = Overlap & Gate Capacitance VDD Vin i Cgd2 d2 Cdb2 Voutt Cg44 Cgd1 Cdb1 Cw Cg3 Vout2 t2 Vin Cgd2 Cdb2 Vout Cg4 Cgd1 Cdb1 Cw Cg3 Vout2 14 Cgd - Overlap Capacitance The Miller Effect Assumed to be in Cut-off or Saturation If Cgd is modeled from Vout to GND, the value shall be doubled GND - No Channel Capacitance (at output side) - Only Overlap Capacitance Cgd VDD Vin Cgd2 Cdb2 Vout Cg4 Cgd1 Cdb1 Cw Cg3 ΔV ΔV ΔV Cgd = 2 Cgd0 W Cw - Wire Capacitance Cdb = Keq × C j 0 Neglected on short distances I Increased d importance i t in i new technologies t h l i Depends on grading coefficient Diode area and perimeter VDD Cgd2 Cdb2 Vout Cg4 Cgd1 Cdb1 Cw Cg3 2Cgdd Vout2 Cdb - Junction Capacitance Vin ΔV Vout2 VDD Vin Cgd2 Cdb2 Vout Cg4 Cgd1 Cdb1 Cw Cg3 Vout2 15 Channel Capacitance Region Cut off Linear Saturation Cg - Gate Capacitance Cg C gs C gd C OX WL eff 0 0 Overlap – Cgs (Not Cgd) Ch l – WLCox Channel 0 (1/2)C OX WL eff (1/2)C OX WL eff 0 (2/3)C OX WL eff 0 VDD Cut off: No channel Linear: Channel Saturation: ⇒ CG = CGB ⇒ Divide channel in two parts Vin ≈ 2/3 Channel connected to source Expression Cgdd 2Cgd0 d0W Cdb Keq(ACj+PCjsw) Cg Cgs0W+CoxWL Cw Cdb2 Vout Cg4 Cgd1 Cdb1 Cw Cg3 Vout2 Inverter - Transient Response Inverter Load Model Capacitor Cgd2 - t Vout = (1- e RC )V ; VDD Model Vin 0.1VDD = (1 − e Req-p − t10 RC )VDD tr = t90 - t10 ⇔ 0.9 = e − t10 RC ⇔ t10 = − RC ln(0.9) CL Vout t90 = − RC ln(0.1) CL Area + Fringe g Cap. p Req-n tr = t90 − t10 = (− ln(0.1) l ( ) + ln(0.9)) l ( )) RC = tr = 2.2 RC The values differ for n- and p-channel The values differ for L to H / H to L t pHL = t50 = − ln(0.5) RC = t pHL = 0.69 RC Se table 5-2 16 Req in Short Channel Transistors Req -n = Req -n Digital IC-Design Chapter 5 Rn (VOUT =VDD ) + Rn (VOUT =VDD / 2) = 2 ⎡VDS ⎤ ⎡ VDS ⎤ + ⎢ ⎥ ⎢ ⎥ ⎣ I D ⎦ (VOUT =VDD ) ⎣ I D ⎦ (VOUT =VDD / 2) = 2 Req in Short Channel Transistors Cont. Req in Short Channel Transistors Graphical Method I D (mA) The CMOS Inverter VGS = 2 V 0 15 0.15 I D VDD / 2 = 145 μ A; Graphical Method I D VDD = 153 μ A; I D VDD = 153 μ A I D VDD / 2 = 145 μ A 0.1 In Velocity Saturation 05 0.5 Req -n VDS (V) 0 0 0.63 V 1 2 Req -n ⎡VDS ⎤ ⎡V ⎤ + ⎢ DS ⎥ ⎢I ⎥ ⎣ D ⎦ (VOUT =VDD ) ⎣ I D ⎦ (VOUT =VDD / 2) = = 2 2 1 + −6 145 ×10−6 = 10 kΩ = 153 × 10 2 17 Req in Short Channel Transistors Req for Short Channel NMOS I D (mA) Find IDSAT Model Based Method 0.15 VGS = 2 V 0.1 VDD ⎛ ⎞ ⎟ 3 VDD ⎛ 5 VDD 1⎜ ⎞ 2 Req = ⎜ 1 − λV + ≈ VDD ⎟ 4 I DSAT ⎜⎝ 6 DD ⎟⎠ 2 ⎜ I DSAT (1 + λVDD ) I )⎟ DSAT (1 + λ 2 ⎠ ⎝ with ⎛ V2 ⎞ I DSAT = k ⎜ (VDD − VT )VDSAT − DSAT ⎟ ⎜ 2 ⎟⎠ ⎝ In Velocity Saturation Req in Short Channel Transistors I DSAT = 136 μ A; λ =0.06 V VDD ⎛ ⎞ ⎟ 3 VDD VDD 1⎜ 2 + ≈ Req = ⎜ VDD ⎟ 4 I DSAT 2 ⎜ I DSAT (1 + λVDD ) I ⎟ + (1 ) λ DSAT ⎝ 2 ⎠ VDSAT = 0.63 V; kn' = 115 mA/V 2 W = 0.375 μ m; = 0.25 μ m I DSAT VDS (V) 0 0 1 0.63 V ⎛ V2 ⎞ ⎜⎜ (VDD − VT )VDSAT − DSAT ⎟⎟ = 2 ⎠ ⎝ W =k L ' n I DSAT = 115 I DSAT 0.5 2 IDSAT = ID when VDS = 0 (extrapolated) 0.375 ⎛ 0.63 ⎞ ⎜ (2 − 0.43)0.63 − ⎟ = 136 μ A 0.25 ⎝ 2 ⎠ 2 Inverter - Transient Response VDD ⎛ 5 ⎞ ⎜1 − λVDD ⎟ ⎝ 6 ⎠ 2 ⎛ ⎞ ⎟ 3 1⎜ 2 2 ⎛ 5 ⎞ 2 Req = ⎜ + 0 06 × 2 ⎟ ⎟≈ ⎜1 − 0.06 2 ⎜ 136 ×10−6 (1 + 0.06 × 2) 136 × 10−6 (1 + 0.06 × 2 ) ⎟ 4 136 × 10−6 ⎝ 6 ⎠ 2 ⎠ ⎝ Req = 10.0 kΩ ≈ 9.9 kΩ VDD = 2 V; VT = 0.43 V; Req-p CL = 2 fF ; Req − n = 10 k Ω tr = 2.2 RC = 2.2 × 10 × 103 × 2 × 10−15 = 44 ps CL Req-n t pHL = 0.69 0 69 RC = 0.69 0 69 × 10 × 103 × 2 × 10−15 = 14 ps (1 % error) 18 Inverter - Propagation Delay Propagation Delay (page 202) Long Channel Q = C × ΔU = CL (VOH - VOL ) / 2 = CLVDD / 2 Transistors Q = I ×t = t pHL = kn k (VGS - VT ) 2 × t pHL = n (VDD - VT ) 2 × t pHL 2 2 CLVDD CL ≈ 2 kn (VDD - VT ) knVDD t pHL = 0.69 = 0.52 C 1 1 tp = L ( + ) 2VDD kn k p V CL Short Channel Transistors What Ratio Should be Chosen? Short-channel Transistors -11 t pLH t pHL β= Fan-Out = 1 4.5 tp t (sec) p V CL 3.5 3 1.5 2 2.5 3 3.5 4 4.5 Wp Wn Fan-Out = 1 β=3.5 balance the inverter (VM=VDD/2) t p (s)4 1 VDSATn ) 2 Ideal Vin (Step) Propagation Delay Simulation x 10 CLVDD CL Ideal Vin (Step) 5 3 CLVDD = 4 I DSAT knVDSATn (VDD − VTn − V Short Channel Transistors 5 β β = Wp/Wn β=2 (or 2.4) for equal delays (tpLH=tpHL) V However, β=2 might be acceptable (VM≈0.45 VDD) Wp Wn CL A ratio around 2 is close to optimum 19 Effect of Input Rise Time tpHL [ns] tpHL Increase linearly with the input rise time trise Note the gain 0 35 0.35 Digital IC-Design Driving a Large Fan-out 0.30 0.25 t pHL ( actual ) = t 2pHL ( step ) + tr2 4 0.20 0.15 0.2 0.4 0.6 0.8 1.0 trise [ns] Inverter Chain In Driving a Large Fan-Out Typical examples: Out Busses CL Driving a large capacitance Clock network Control wires (e.g. set and reset signals) If CL is given: - How many stages are needed to minimize the delay? - How to size the inverters? Memories (driving many storage cells) VDD Worst case: Off chip signals CL 20 Inverter with Load (External only) Inverter with Internal Load Delay Delay Req Cint Cext Req Cext Load (Cext) External Load tp = 0.69 Req Cext Internal (intrinsic) load is neglected Not the case in modern technologies Device Sizing (W scaled with S) 3.8 x 10 (for fixed load) 3.4 External load capacitances dominate 3.2 p Self-loading if Cint dominate Should be avoided Driving Large Capacitances Cint = Intrinsic capacitance Req -11 3.6 t (sec) tp = 0.69 Req (Cint + Cext) Cext = Extrinsic capacitance Req = Resistance in channel Cint = Cdb+Cgd Cext = Cw + Cg 3 Self-loading effect: Intrinsic capacitances dominate ((W is to wide compared to the load) 2.8 2.6 2.4 2.2 2 2 4 6 8 S 10 12 14 Cw = Wire capacitance Req VDD Cg = Gate C in next stage Req Req Cint Cext 21 Scaling to Increase Driving Capability Req Scaling W with a factor S: Cint = S × Ciref Cint = Cdb+Cgd Req = Req Rref Scaling to increase driving capability Delay RC-model t p = 0.69 Req (Cint + Cext ) = 0.69 Req Cint (1 + Scaling with a factor S t p = 0.69 S Rref S S Ciref (1 + Cext C ) = t p 0 (1 + ext ) S Ciref S Ciref VDD tp0 = intrinsic delay Req Req Cint Independent of S Cext Scaling Example (page 206) Scaling Example (page 206) t p 0 = 19.3 ps; Cext = 3.15 fF ; Ciref = 3.0 fF t p = t p0 Cext ) Cint t p = 19.3 × (1 + C 1 (1 + ext ) = 19.3 (1 + ) ps S Ciref 1.05 × S tp (ps) 1 ) 1.05 × S ps S =5, Substantial improvement 40 S >10, ”No more gain” 30 Ciref Cext 20 10 S 0 5 10 15 22 Sizing a Chain of Inverters Sizing a Chain of Inverters γ = Capacitive proportionality γ= factor for each inverter - Technology Dependent - Independent of the size (W) - Close to 1 in Submicron 1 Cg,1 Cg,2 f= Cg, j N Cint,2 Cg,N 1 Cint,N Cg,N+1= CL Sizing a Chain of Inverters Cg,1 2 f= Cint,1 Cg,2 Cint,2 Cg , j +1 f= Cg , j Total Delay: t p , j = t p 0 (1 + 1 Cg,1 Cext , j Cint , j ) = t p 0 (1 + 2 Cint,1 Cg,2 C g , j +1 γ Cg , j ) = t p 0 (1 + fj γ ) N Cint,2 Cg,N t p = t p0 Cg,N+1= CL Cg,1 fj N ∑ (1 + γ Cg,N Cg ,2 Cg ,1 2 Cint,1 Cg,2 = Cg ,3 Cg ,2 = Cint,N Cg,N+1= CL Known Cg , j Cg , j −1 = Cg , j +1 Cg , j = CL Cg , N If each stage is scaled with the same factor f ) j =1 1 Cint,N Cg , j N Sizing a Chain of Inverters Cint, j = γ Cg, j Cg , j +1 f = The loading capacitive ratio in two following stages The in- and output capacitive ratio 2 Cint,1 Cint, j N Cint,2 Cg,N Cint,N Cg,N+1= CL 23 Sizing a Chain of Inverters f= Sizing a Chain of Inverters Cg ,2 C f =N L =NF Cg ,1 Cg ,1 f2= Known Cg ,3 t p = t p0 Cg ,1 ∑ (1 + j =1 fj γ ) = N × t p 0 (1 + F γ )= γ (F = overall effective fan- out) 1 2 f =e N 1 Cint,1 Cg,2 Cint,2 Cg,N Cint,N Sizing a Chain of Inverters γ f =e (1+ ) f 2 (1+ ) f N Cg,N+1= CL Cg,1 Cint,1 Cg,2 Cint,2 Cg,N Cint,N Has no closed form solution so u o except p for o γ=00 Normalized delay f= 1 Cint,1 Cg,2 Common Practice Around 4 2 N Cint,2 Cg,N Cg , j 6 Otherwise: f is solved numerically 2 Cg , j +1 Too many stages tp t popt 4 f =e Cg,N+1= CL Sizing a Chain of Inverters γ=0 when intrinsic capacitance is neglected Cg,1 N Optimum is found by setting the derivative to 0 C fN= L =F Cg ,1 Cg,1 N f =NF Cint,N Cg,N+1= CL f 1 2 3 4 for f = e 1 (1+ ) f 5 24 Buffer Design Inverter Chain 1 f tp Common practice: 1 64 65 Optimum fan-out around f=4 2 8 18 64 3 4 15 64 4 2.8 15.3 64 1 8 1 4 16 2.8 8 1 N 64 22.6 Digital IC-Design 1 4 16 I In O t Out CL Dynamic Power Consumption VDD Charge Power Consumption Energy charged in a capacitor EC = C V2 CV2 = L DD 2 2 Energy EC is also discharged, i.e. 2 Etot = CL VDD Discharge Power consumption 2 P = f CL VDD 25 Dynamic Power Consumption VDD Charge Note: The power is dissipated in the transistor resistance, Req Current Spikes – Direct Path Edp = VDD Pdp = I peak × tr tr × t f 2 2 + VDD I peak × t f 2 = tr × t f 2 Current peak when both Nand PMOS are open VDD I peak VDD I peak f However: the power consumption is independent of the value of Req VDD-VT VT Discharge P = CL VDD2 f Static Power Consumption Ileakage increases with decreasing VT 0 Dynamic vs. Static Power The dynamic and static power is about equal in the 65 nm Technology Pstat =Ileakage × VDD Drain leakage to bulk & drain-source subthreshold current 100 Normalized power VDD Ipeak N open P open Dynamic power 1 65 nm 0.01 0.0001 0.0000001 1990 Source: ITRS Static power 2000 2010 Year 2020 26 Digital IC-Design Power-Delay Product Helps to measure the quality of different circuit topologies Power Delay Product (PDP) Power-Delay Product Energy per switching event For static CMOS 2 2 PDP = P × t p = CL × VDD × f max × t p = CL × VDD × 2 CL × VDD 2 2t p = 2 CL × VDD 2 (J ) Independent of operating frequency Some Examples - Cascaded Inverters Compensated to Decrease tpLH Minimal Design Energy per switching event PDP = P × t p = tp If we lower the supply, the PDP will be reduced, but also the performance VDD 15 kΩ 30 kΩ In Out 2 fF Out Energy and performance EDP = P × t p2 = 2 CL × VDD ×tp 2 Some claims that EDP is a better measure since it includes the delay 10 kΩ 10 kΩ GND 1 fF + 2 fF 1 fF + 3 fF Req − n = 10 k Ω; Req − p = 30 k Ω; Req − n = 10 k Ω; Req −Comp = 15 k Ω; CMin = 4 fF CComp = 6 fF 27 Propagation Delay Power Consumption at Max Speed Req − n = 10 k Ω; Req − p = 30 k Ω; Req − Comp = 15 k Ω; CMin = 4 fF ; CComp = 6 fF ; VDD = 2 V CMin = 4 fF ; Not much faster but more symmetric t pHL − Min = 0.69 × CMin × Req − n = 28 ps t pLH − Min = 0.69 × CMin × Req − p = 83 ps t p − Min = t pHL − Min + t pLH − Min 2 t pHL − Comp = 0.69 × CComp × Req − n = 41 ps = 55 ps t pHL −Comp + t pLH −Comp t pLH − Comp = 0.69 × CComp × Req − Comp = 62 ps t p −Comp = 2 = 52 ps f Max − Min = CComp = 6 fF ; 1 = 9.1 9 1 GHz GH ; 2t p VDD = 2 V f Max − Comp = 2 2 PMin = CMin × VDD × f Max − Min = CL × VDD × 1 = 99.7 7 GH GHz 2t p 1 = 140 μW 2t p − Min 2 2 × f Max − Comp = CL × VDD × PComp = CComp × VDD Compensating gives higher power consumption 1 = 230 μW 2t p − Comp VDD In Out In Out VDD In Out In Out GND Total Power Consumption and PDP Power-Delay Product 2 2 PDP = P × t p = CL × VDD × f max × t p = CL × VDD × PDPComp tp 2t p = 2 CL × VDD 2 (J ) Compensating gives higher energy per switching event 2 CMin × VDD = 8 fJ 2 2 CComp × VDD = = 12 fJ 2 PDPMin = VDD In Out In GND Out Ptot = Pdyn + Pdp + Pstat = 2 = CLVDD f + tr + t f 2 VDD I peak f 2 CL × VDD PDP = P × t p = 2 + I leakageVDD (J ) GND 28